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TWI401826B - Light emitting device and method for enhancing light extraction thereof - Google Patents

Light emitting device and method for enhancing light extraction thereof Download PDF

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TWI401826B
TWI401826B TW98142380A TW98142380A TWI401826B TW I401826 B TWI401826 B TW I401826B TW 98142380 A TW98142380 A TW 98142380A TW 98142380 A TW98142380 A TW 98142380A TW I401826 B TWI401826 B TW I401826B
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oxide
layer
light
zno
cylinder
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TW98142380A
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TW201121097A (en
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chang chi Pan
Jean Ching Hwa Chang
Jang Ho Chen
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Walsin Lihwa Corp
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Description

增益出光的發光裝置和其方法Light-emitting device with gain and light and method thereof

本發明關於一種提升發光裝置出光的方法,尤指一種藉由在發光裝置上形成可控制粗化(roughness)氧化層(如氧化鋅層)的方法,以增益發光裝置的出光。The invention relates to a method for improving the light emission of a light-emitting device, in particular to a method for controlling the lightening of a light-emitting device by forming a controllable roughening oxide layer (such as a zinc oxide layer) on the light-emitting device.

自從積體電路(IC)的發展至奈米級(nano-scale),奈米元件的應用漸為盛行,其中尤以短波長的發光裝置,如雷射二極體(Laser Diodes,LDs)和發光二極體(Light Emitting Diodes,LEDs),儼然已成為主流。在短波長發光裝置的發展方面,III-V族化合物半導體係為製造LED最常用的材料。然而,由於新系統材料的發展,II-VI族化合物半導體又重獲重視。實際上,氧化鋅(ZnO)除了具有低成本和易於合成的優點外,其能隙與結晶結構也與氮化鎵相似,所以ZnO的研究遂成為熱門主題,特別是ZnO奈米柱之開發與應用。Since the development of integrated circuits (ICs) to nano-scales, the application of nano-components has become increasingly popular, especially for short-wavelength illuminators such as Laser Diodes (LDs) and Light Emitting Diodes (LEDs) have become mainstream. In the development of short-wavelength light-emitting devices, III-V compound semiconductors are the most commonly used materials for the manufacture of LEDs. However, due to the development of new system materials, II-VI compound semiconductors have received renewed attention. In fact, zinc oxide (ZnO) has the advantages of low cost and easy synthesis, and its energy gap and crystal structure are similar to those of GaN. Therefore, research on ZnO has become a hot topic, especially the development of ZnO nanopillars. application.

ZnO的直接能隙(direct band-gap)為3.37eV,高於其它高直接能隙半導體材料。此外,ZnO具有較高的激發結合能(氮化鎵的激發結合能約為20meV,而ZnO的激發結合能約60meV,遠高於氮化鎵)。因此在室溫下,其發光效率高於其它材料。近幾年來,許多ZnO的研究報告指出其良好發光效率可應用在短波長元件和雷射二極體。既然資料讀取可由紫外線(UV)雷射來改良,ZnO應用於UV雷射源極具潛力。The direct band-gap of ZnO is 3.37 eV, which is higher than other high direct energy gap semiconductor materials. In addition, ZnO has a higher excitation binding energy (the excitation bonding energy of gallium nitride is about 20 meV, and the excitation bonding energy of ZnO is about 60 meV, which is much higher than that of gallium nitride). Therefore, at room temperature, its luminous efficiency is higher than other materials. In recent years, many ZnO research reports indicate that its good luminescence efficiency can be applied to short-wavelength components and laser diodes. Since data reading can be improved by ultraviolet (UV) lasers, ZnO has great potential for UV laser sources.

ZnO的另一主要發展方向為一维(one-dimensional)奈米柱(奈米線)。科學家可成功生成高度對正的奈米柱陣列。藉由光激發螢光(photoluminescence),可自奈米柱激發出UV雷射。UV雷射雖可多方商業化,但如何提升出光以及控制奈米柱光脫逃角(light escape angle)尚有兩個問題待解決。否則,發光效率將大受影響。Another major development direction of ZnO is a one-dimensional nanocolumn (nanowire). Scientists can successfully generate highly aligned arrays of nanopillars. The UV laser can be excited from the nano column by photoluminescence. Although UV lasers can be commercialized in many ways, there are still two problems to be solved in how to enhance the light output and control the light escape angle of the nano column. Otherwise, the luminous efficiency will be greatly affected.

有鑑於上述問題,本發明遂提出解決之道,以增益發光裝置的出光。In view of the above problems, the present invention proposes a solution to gain light emission from a light-emitting device.

有鑑於先前技藝受限於上述問題,本發明之目的為提供一種藉由在發光裝置上形成可控制粗化(roughness)氧化層(如氧化鋅層)的方法,以增益發光裝置的出光。In view of the prior art limitations to the above problems, it is an object of the present invention to provide a method of gaining light output from a light-emitting device by forming a controllable rough oxide layer (e.g., a zinc oxide layer) on the light-emitting device.

根據本案之一觀點,一種提升發光裝置出光的方法,包括以下步驟:a)在發光裝置上提供佈設層;b)在佈設層上設置保護層;c)形成一陣列的孔隙穿透保護層和佈設層;以及d)在佈設層上生成氧化層,具有複數個柱體,各自形成於其中一孔隙。柱體的形狀可藉由調整氣氛的N2 /H2 濃度比、反應溫度和時間來控制,如此可改變柱體的形狀和光脫逃角(light escape angle)。According to one aspect of the present invention, a method for improving light emission from a light emitting device includes the steps of: a) providing a wiring layer on the light emitting device; b) providing a protective layer on the wiring layer; c) forming an array of pore penetrating protective layers and a layer of the layer; and d) an oxide layer formed on the layer, having a plurality of pillars each formed in one of the pores. The shape of the cylinder can be controlled by adjusting the N 2 /H 2 concentration ratio of the atmosphere, the reaction temperature and time, thus changing the shape of the cylinder and the light escape angle.

根據本發明的構想,氧化層包括氧化鋅(ZnO)、二氧化矽(SiO2 )、二氧化鈦(TiO2 )或氧化鋁(Al2 O3 )。。According to the concept of the invention, the oxide layer comprises zinc oxide (ZnO), cerium oxide (SiO 2 ), titanium dioxide (TiO 2 ) or aluminum oxide (Al 2 O 3 ). .

根據本發明的構想,氧化層藉由水熱處理、溶膠凝膠法、電鍍、熱蒸鍍法、化學氣相沈積法(CVD)、或分子束磊晶法(MBE)所形成。In accordance with the teachings of the present invention, the oxide layer is formed by hydrothermal treatment, sol-gel method, electroplating, thermal evaporation, chemical vapor deposition (CVD), or molecular beam epitaxy (MBE).

根據本發明的構想,佈設層包括氧化銦錫(ITO)、鎳/金(Ni/Au)、氧化鎳/金(NiO/Au)、P型氧化鋅(p-ZnO)、或氧化鋅(ZnO)。According to the concept of the present invention, the layout layer includes indium tin oxide (ITO), nickel/gold (Ni/Au), nickel oxide/gold (NiO/Au), P-type zinc oxide (p-ZnO), or zinc oxide (ZnO). ).

根據本發明的構想,保護層包括光阻材料或介電材料。According to the concept of the invention, the protective layer comprises a photoresist material or a dielectric material.

根據本發明的構想,氣氛溫度高於200℃。According to the concept of the invention, the atmosphere temperature is above 200 °C.

根據本發明的構想,氣氛包括氮、氫、或其混合。According to the concept of the invention, the atmosphere comprises nitrogen, hydrogen, or a mixture thereof.

根據本發明的構想,柱體具有奈米結構或微米結構。According to the concept of the invention, the cylinder has a nanostructure or a microstructure.

根據本發明的構想,柱體為六角錐狀或截頭六角錐狀。According to the concept of the invention, the cylinder is hexagonal or truncated hexagonal.

根據本發明的構想,柱體下表面的直徑介於100nm(奈米)與數μm(微米)之間。According to the concept of the invention, the diameter of the lower surface of the cylinder is between 100 nm (nano) and several [mu]m (micrometer).

根據本發明的構想,孔隙係由濕蝕刻製程、乾蝕刻製程、光蝕刻法和曝光顯影製程、雷射切割製程、或電子束寫入製程所形成。In accordance with the teachings of the present invention, the voids are formed by a wet etch process, a dry etch process, a photolithography process and an exposure development process, a laser dicing process, or an electron beam writing process.

依照本發明之另一觀點,一種具有增益出光的發光裝置包括有發光基板;提供於發光基板上的佈設層;形成於佈設層的一陣列的孔隙;設置於具有露出孔隙的佈設層上的保護層;以及形成於佈設層上的氧化層,具有複數個柱體,各自形成於其中一孔隙。柱體的形狀可由調整氣氛N2 /H2 濃度比、反應溫度和時間來控制,如此可改變柱體的形狀和光脫逃角。According to another aspect of the present invention, a light-emitting device having a light-emitting light includes a light-emitting substrate; a wiring layer provided on the light-emitting substrate; an array of pores formed in the wiring layer; and a protection layer disposed on the wiring layer having the exposed pores a layer; and an oxide layer formed on the wiring layer, having a plurality of pillars each formed in one of the pores. The shape of the cylinder can be controlled by adjusting the atmosphere N 2 /H 2 concentration ratio, reaction temperature and time, thus changing the shape of the cylinder and the light escape angle.

根據本發明的構想,氧化層包括氧化鋅(ZnO)、二氧化矽(SiO2 )、二氧化鈦(TiO2 )或氧化鋁(Al2 O3 )。According to the concept of the invention, the oxide layer comprises zinc oxide (ZnO), cerium oxide (SiO 2 ), titanium dioxide (TiO 2 ) or aluminum oxide (Al 2 O 3 ).

根據本發明的構想,氧化層由水熱處理、溶膠凝膠法、電鍍、熱蒸鍍法、化學氣相沈積法(CVD)、或分子束磊晶法(MBE)所形成。According to the concept of the present invention, the oxide layer is formed by hydrothermal treatment, sol-gel method, electroplating, thermal evaporation, chemical vapor deposition (CVD), or molecular beam epitaxy (MBE).

根據本發明的構想,佈設層包括ITO、Ni/Au、NiO/Au、p-ZnO、或ZnO。According to the concept of the invention, the routing layer comprises ITO, Ni/Au, NiO/Au, p-ZnO, or ZnO.

根據本發明的構想,保護層包括光阻材料或介電材料。According to the concept of the invention, the protective layer comprises a photoresist material or a dielectric material.

根據本發明的構想,氣氛溫度高於200℃。According to the concept of the invention, the atmosphere temperature is above 200 °C.

根據本發明的構想,氣氛包括氮、氫、或其混合。According to the concept of the invention, the atmosphere comprises nitrogen, hydrogen, or a mixture thereof.

根據本發明的構想,柱體具有奈米結構或微米結構。According to the concept of the invention, the cylinder has a nanostructure or a microstructure.

根據本發明的構想,柱體為六角錐狀或截頭的六角錐狀。According to the concept of the invention, the cylinder is hexagonal tapered or truncated hexagonal cone.

根據本發明的構想,柱體下表面的直徑介於100nm(奈米)與數μm(微米)之間。According to the concept of the invention, the diameter of the lower surface of the cylinder is between 100 nm (nano) and several [mu]m (micrometer).

根據本發明的構想,孔隙由濕蝕刻製程、乾蝕刻製程、光蝕刻法和曝光顯影製程、雷射切割製程、或電子束寫入製程所形成。In accordance with the teachings of the present invention, the voids are formed by a wet etch process, a dry etch process, a photolithography process and an exposure development process, a laser dicing process, or an electron beam writing process.

本發明將於下列的實施例中更具體的揭露。值得注意的是,下列本發明實施例中之描述僅出於描述與圖式之用,發明本身並不侷限於揭露的型態與式樣。The invention will be more specifically disclosed in the following examples. It should be noted that the following description of the embodiments of the present invention is for the purpose of description and drawings only, and the invention itself is not limited to the disclosed forms and styles.

圖1為本發明較佳實施例的流程圖,繪示增益發光裝置出光的方法,係藉由在發光裝置上形成具有可控制粗化程度(roughness)的氧化層。圖2為本發明的3D立體圖,繪示本發明各元件的相對位置。請參照圖1與圖2。本發明提升發光裝置出光的方法包含以下步驟。首先,發光裝置102提供有形成於其上表面的表層104(如步驟S101所示)。在本實施例中,表層104由P型氮化鎵(p-GaN)所製成。然而,本發明的表層104不限於p-GaN,亦可由p-AlGaN、p-InGaN、p-GaN/InGaN SLs、p-AlGaN/GaN SLs、p-AlInGaN、p-InAlGaN/InAlGaN SLs、n-(In)(Al)GaN、n-InGaN、ITO、p-ZnO、ZnO、Ni/Au、或NiO/Au來製成。換句話說,表層104不限於P型或N型導電型。1 is a flow chart of a preferred embodiment of the present invention, showing a method of emitting light from a gain illuminating device by forming an oxide layer having a controllable roughness on the illuminating device. Figure 2 is a 3D perspective view of the present invention showing the relative positions of the various components of the present invention. Please refer to FIG. 1 and FIG. 2 . The method for improving the light output of the light-emitting device of the present invention comprises the following steps. First, the light-emitting device 102 is provided with a surface layer 104 formed on its upper surface (as shown in step S101). In the present embodiment, the surface layer 104 is made of P-type gallium nitride (p-GaN). However, the surface layer 104 of the present invention is not limited to p-GaN, and may be composed of p-AlGaN, p-InGaN, p-GaN/InGaN SLs, p-AlGaN/GaN SLs, p-AlInGaN, p-InAlGaN/InAlGaN SLs, n- (In) (Al) GaN, n-InGaN, ITO, p-ZnO, ZnO, Ni/Au, or NiO/Au. In other words, the surface layer 104 is not limited to the P-type or N-type conductivity type.

本實施例中的發光裝置102為氮化鎵發光二極體,其能隙(energy band gap)相當於200nm至750nm波長。The light-emitting device 102 in this embodiment is a gallium nitride light-emitting diode whose energy band gap corresponds to a wavelength of 200 nm to 750 nm.

隨後在發光裝置102的表層104上提供佈設層106(如步驟S102)。佈設層106可由氧化銦錫(ITO)、鎳/金(Ni/Au)、氧化鎳/金(NiO/Au)、P型氧化鋅(p-ZnO)、或氧化鋅(ZnO)來製成。A routing layer 106 is then provided on the surface layer 104 of the illumination device 102 (as in step S102). The wiring layer 106 may be made of indium tin oxide (ITO), nickel/gold (Ni/Au), nickel oxide/gold (NiO/Au), P-type zinc oxide (p-ZnO), or zinc oxide (ZnO).

在佈設層106上設置保護層107(如步驟S103)。請參照圖3,其繪示圖2中A-A’截面的剖面圖。藉由濕蝕刻製程、乾蝕刻製程、光蝕刻法和曝光顯影製程、雷射切割製程、或電子束寫入製程,以形成一陣列的孔隙109穿透保護層107和佈設層106(如步驟S104)。當使用光蝕刻製程(photolithographic processes)時,保護層107由光阻材料製成時,而當使用蝕刻製程時,保護層107則由光阻材料或介電材料製成。A protective layer 107 is disposed on the routing layer 106 (step S103). Please refer to FIG. 3, which is a cross-sectional view taken along line A-A' of FIG. 2. The wet etching process, the dry etching process, the photolithography process and the exposure development process, the laser cutting process, or the electron beam writing process are performed to form an array of the voids 109 penetrating the protective layer 107 and the routing layer 106 (step S104). ). When a photolithographic process is used, the protective layer 107 is made of a photoresist material, and when an etching process is used, the protective layer 107 is made of a photoresist material or a dielectric material.

具有複數個柱體108的氧化層生成於佈設層106,柱體108因而形成於其中一孔隙109。保護層107用來將柱體108定位於孔隙109,以及防止柱體108生成於孔隙109之外的地方。An oxide layer having a plurality of pillars 108 is formed in the routing layer 106, and the pillars 108 are thus formed in one of the apertures 109. The protective layer 107 serves to position the cylinder 108 to the aperture 109 and to prevent the cylinder 108 from being generated outside of the aperture 109.

控制氣氛的溫度和濃度可調整柱體108的形狀,如此可改變柱體的光脫逃角(light escape angle),如步驟S105至S106。Controlling the temperature and concentration of the atmosphere can adjust the shape of the cylinder 108 such that the light escape angle of the cylinder can be varied, as in steps S105 through S106.

氧化層可由氧化鋅(ZnO)、二氧化矽(SiO2 )、二氧化鈦(TiO2 )或氧化鋁(Al2 O3 )來製成。在本實施例中,氧化層由ZnO所製成。The oxide layer may be made of zinc oxide (ZnO), cerium oxide (SiO 2 ), titanium dioxide (TiO 2 ) or aluminum oxide (Al 2 O 3 ). In this embodiment, the oxide layer is made of ZnO.

本實施例中,氧化層由水熱處理所形成。首先,包含佈設層的發光裝置分別以丙酮、甲醇、以及去離子水清洗約各5分鐘。發光裝置和佈設層以氮氣噴槍吹乾。接著,ZnO的晶種層形成於佈設層上,以增加附著力。發光裝置、佈設層、以及晶種層(seed layer)統稱為媒介(mediator)。In this embodiment, the oxide layer is formed by hydrothermal treatment. First, the light-emitting device including the wiring layer was washed with acetone, methanol, and deionized water for about 5 minutes each. The illuminating device and the laying layer were blown dry with a nitrogen lance. Next, a seed layer of ZnO is formed on the wiring layer to increase adhesion. The illuminating device, the routing layer, and the seed layer are collectively referred to as a mediator.

ZnO的晶種層係將醋酸鋅(Zn(CH3 COO)2 ‧H2 O,zinc acetate)溶解於乙二醇甲醚(CH3 O(CH2 )2 OH,2-methoxyethanol)配製而成,兩者濃度為0.5M,接著在加熱溫度達65℃時攪拌其混合溶液兩小時,以取得透明膠狀溶液。隨後將透明膠狀溶液旋轉塗佈於佈設層的上表面。接下來,在溫度130℃時,將其上布有透明膠狀溶液的佈設層進行60分鐘的熱退火(thermal annealing),以取得氧化鋅晶種層。在本實施例中,ZnO晶種層作為ZnO粒子來生成ZnO層。The seed layer of ZnO is prepared by dissolving zinc acetate (Zn(CH 3 COO) 2 ‧H 2 O, zinc acetate) in ethylene glycol methyl ether (CH 3 O(CH 2 ) 2 OH, 2-methoxyethanol). The concentration of both was 0.5 M, and then the mixed solution was stirred at a heating temperature of 65 ° C for two hours to obtain a transparent colloidal solution. The transparent colloidal solution is then spin coated onto the upper surface of the laid layer. Next, at a temperature of 130 ° C, the wiring layer on which the transparent colloidal solution was placed was subjected to thermal annealing for 60 minutes to obtain a zinc oxide seed layer. In the present embodiment, the ZnO seed layer is used as a ZnO particle to form a ZnO layer.

晶種層不限於由氧化鋅製成,亦可由金(Au)、銀(Ag)、錫(Sn)、或鈷(Co)製成。氧化層可隨機或依序形成。The seed layer is not limited to being made of zinc oxide, and may be made of gold (Au), silver (Ag), tin (Sn), or cobalt (Co). The oxide layer can be formed randomly or sequentially.

晶種層形成後,將媒介的面朝下,置於純度99.5%的六亞甲四胺(C6 H12 N4 ,HMT,hexamethylenetetramine)與98%的純度的硝酸鋅(Zn(NO3 )2 ‧6H2 O,zinc nitrate hexahydrate)的生長溶液中,兩者濃度為0.5M。之後在烘乾機中以低溫90℃加熱約3小時。加熱後,將之取出以去離子水清洗。如此可獲得具有複數個柱體的氧化鋅層。ZnO柱體的高度、生長速率、尺寸可由調整溫度、濃度和生長時間來控制。After the seed layer is formed, the medium is placed face down, placed in a purity of 99.5% of hexamethylenetetramine (C 6 H 12 N 4 , HMT, hexamethylenetetramine) and 98% pure zinc nitrate (Zn(NO 3 ) In the growth solution of 2 ‧6H 2 O, zinc nitrate hexahydrate), the concentration of both was 0.5M. It was then heated in a dryer at a low temperature of 90 ° C for about 3 hours. After heating, it was taken out and rinsed with deionized water. A zinc oxide layer having a plurality of columns can thus be obtained. The height, growth rate, and size of the ZnO cylinder can be controlled by adjusting the temperature, concentration, and growth time.

進行水熱處理時,ZnO的形成係依據下列分子式:When hydrothermal treatment, the formation of ZnO is based on the following molecular formula:

在上述沉積機制中,一旦鋅離子(zinc ions)和氫氧離子(hydroxide ions)的濃度飽和時,ZnO開始形成於晶種層上。由於原子鍵合(atomic bonding)的異向性,原子依附在核上成長時,會傾向游移至低能處,造成了某一個能量較低的方向堆疊在一特定方向上的非對稱性成長,也因此形成柱/線形陣列結構。In the above deposition mechanism, once the concentrations of zinc ions and hydroxide ions are saturated, ZnO starts to form on the seed layer. Due to the anisotropy of atomic bonding, when atoms grow on the nucleus, they tend to migrate to low energy, causing a certain energy to grow in a direction of asymmetry in a particular direction. Thus a column/linear array structure is formed.

本實施例係採用水熱處理,然本發明不限於使用水熱處理法,亦可採用熱蒸鍍法(thermal evaporation)、溶膠凝膠法(sol-gel method)、化學氣相沈積法(chemical vapor deposition,CVD)、或分子束磊晶法(molecular beam epitaxy,MBE)。This embodiment uses hydrothermal treatment, but the invention is not limited to the use of hydrothermal treatment, but also thermal evaporation, sol-gel method, chemical vapor deposition (chemical vapor deposition) , CVD), or molecular beam epitaxy (MBE).

此外,本實施例雖以旋轉塗佈法(spin coating)來佈設晶種層於GaN基板上,亦可利用浸漬塗佈(dip coating)、蒸鍍(evaporation)、濺射(sputtering)、原子層沉積(atomic layer deposition)、電化學沉積(electrochemical deposition)、脈衝雷射沉積(pulse laser deposition)、金屬有機物化學氣相沉積(metal-organic chemical vapor deposition)、或熱退火(thermal annealing)等方式。Further, in the present embodiment, the seed layer is disposed on the GaN substrate by spin coating, and dip coating, evaporation, sputtering, or atomic layer may be used. Atomic layer deposition, electrochemical deposition, pulse laser deposition, metal-organic chemical vapor deposition, or thermal annealing.

氣氛可包含氮、氫、或其混合。此外,ZnO柱體的可控制粗化的氣氛溫度高於200℃。The atmosphere may comprise nitrogen, hydrogen, or a mixture thereof. In addition, the temperature of the controllable coarsening of the ZnO cylinder is higher than 200 °C.

在上述的氣氛條件下,柱體108可能呈現為六角錐狀或截頭六角錐,其尺寸介於奈米與數微米間。柱體108下表面的直徑介於100nm(奈米)與數μm(微米)之間。Under the above-described atmospheric conditions, the cylinder 108 may appear as a hexagonal pyramid or a truncated hexagonal cone having a size between nanometers and several micrometers. The diameter of the lower surface of the cylinder 108 is between 100 nm (nano) and several μm (micrometer).

請參照圖4,其繪示ZnO層的柱體108形成於佈設層106的孔隙109中。柱體108各自具有六角截面和烏采結構(Wurtzite Structure),如圖5所示。在本發明中呈現為六角圓柱。根據柱體108的結構,光束自發光裝置102朝特定方向發射。Referring to FIG. 4 , the pillar 108 of the ZnO layer is formed in the aperture 109 of the routing layer 106 . The columns 108 each have a hexagonal cross section and a Wurtzite Structure, as shown in FIG. In the present invention, it is presented as a hexagonal cylinder. Depending on the structure of the cylinder 108, the light beam is emitted from the illumination device 102 in a particular direction.

圖6繪示在不同溫度和濃度的環境條件下形成各種形狀的柱體108。舉例來說,圖6A的柱體108為六角錐狀,係在小於圖6C的氣氛氮氫濃度比下所形成,而圖6C的柱體則呈現為截頭六角錐狀。圖6A中的柱體108亦可在溫度高於圖6C的條件下形成。因此,發光裝置的粗化可藉由改變氧化層柱體108的棱錐形狀(銳度)來加以控制。Figure 6 illustrates the formation of columns 108 of various shapes under ambient conditions of varying temperatures and concentrations. For example, the cylinder 108 of FIG. 6A is hexagonal tapered, formed at a ratio of nitrogen to hydrogen concentration less than that of FIG. 6C, and the cylinder of FIG. 6C is shown as a truncated hexagonal pyramid. The column 108 of Figure 6A can also be formed at a temperature above that of Figure 6C. Therefore, the roughening of the light-emitting device can be controlled by changing the pyramid shape (sharpness) of the oxide layer cylinder 108.

請參照圖7與圖8,其繪示六角柱和六角錐各自不同的光徑。與圖7相對照之下,圖8的六角錐顯然會產生折射並增加光脫逃角(light escape angle),因而改變光的方向。因此,發光裝置的出光可大為增益,同時光脫逃角亦可為本發明所控制。Please refer to FIG. 7 and FIG. 8 , which illustrate different optical paths of the hexagonal column and the hexagonal cone. In contrast to Figure 7, the hexagonal cone of Figure 8 apparently produces refraction and increases the light escape angle, thus changing the direction of the light. Therefore, the light output of the light-emitting device can be greatly increased, and the light escape angle can also be controlled by the present invention.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明。反之,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the present invention has been disclosed above by way of example, it is not intended to limit the invention. To the contrary, the scope of the invention is defined by the scope of the appended claims. quasi.

S101~S106...步驟S101~S106. . . step

102...發光裝置102. . . Illuminating device

104...表層104. . . surface layer

106...佈設層106. . . Layout layer

107...保護層107. . . The protective layer

108...柱體108. . . Cylinder

109...孔隙109. . . Porosity

圖1係本發明較佳實施例的流程圖。1 is a flow chart of a preferred embodiment of the present invention.

圖2係本發明的3D立體圖。Figure 2 is a 3D perspective view of the present invention.

圖3係圖2中A-A’截面的剖面圖,以繪示孔隙的形成。Figure 3 is a cross-sectional view taken along line A-A' of Figure 2 to illustrate the formation of voids.

圖4係圖2中A-A’截面的剖面圖,以繪示柱體的形成。Figure 4 is a cross-sectional view taken along line A-A' of Figure 2 to illustrate the formation of the cylinder.

圖5係柱體的放大視圖。Figure 5 is an enlarged view of the cylinder.

圖6繪示在不同環境下形成的柱體結構。Figure 6 illustrates the structure of the cylinder formed in different environments.

圖7繪示六角圓柱狀柱體中的光徑。Figure 7 illustrates the optical path in a hexagonal cylindrical cylinder.

圖8繪示六角錐狀柱體中的光徑。Figure 8 illustrates the optical path in a hexagonal tapered cylinder.

S101~S106...步驟S101~S106. . . step

Claims (19)

一種提升發光裝置出光的方法,包括以下步驟:在發光裝置上提供佈設層;在佈設層上設置保護層;形成一陣列的孔隙穿透保護層和佈設層;以及在佈設層上生成氧化層,具有複數個柱體,各自形成於其中一孔隙;其中柱體的形狀係藉由控制氣氛溫度高於200℃而獲得,其中氣氛包括氮、氫、或其混合。 A method for improving light emission of a light emitting device, comprising the steps of: providing a laying layer on the light emitting device; providing a protective layer on the laying layer; forming an array of pore penetrating protective layer and laying layer; and forming an oxide layer on the laying layer, There are a plurality of cylinders each formed in one of the pores; wherein the shape of the cylinder is obtained by controlling the temperature of the atmosphere to be higher than 200 ° C, wherein the atmosphere includes nitrogen, hydrogen, or a mixture thereof. 如申請專利範圍第1項的方法,其中氧化層包括氧化鋅(ZnO)、二氧化矽(SiO2 )、二氧化鈦(TiO2 )或氧化鋁(Al2 O3 )。The method of claim 1, wherein the oxide layer comprises zinc oxide (ZnO), cerium oxide (SiO 2 ), titanium dioxide (TiO 2 ) or aluminum oxide (Al 2 O 3 ). 如申請專利範圍第1項的方法,其中氧化層藉由水熱處理、溶膠凝膠法、電鍍、熱蒸鍍法、化學氣相沈積法(CVD)、或分子束磊晶法(MBE)所形成。 The method of claim 1, wherein the oxide layer is formed by hydrothermal treatment, sol-gel method, electroplating, thermal evaporation, chemical vapor deposition (CVD), or molecular beam epitaxy (MBE). . 如申請專利範圍第1項的方法,其中佈設層包括氧化銦錫(ITO)、鎳/金(Ni/Au)、氧化鎳/金(NiO/Au)、P型氧化鋅(p-ZnO)、或氧化鋅(ZnO)。 The method of claim 1, wherein the wiring layer comprises indium tin oxide (ITO), nickel/gold (Ni/Au), nickel oxide/gold (NiO/Au), and p-type zinc oxide (p-ZnO). Or zinc oxide (ZnO). 如申請專利範圍第1項的方法,其中保護層包括光阻材料或介電材料。 The method of claim 1, wherein the protective layer comprises a photoresist material or a dielectric material. 如申請專利範圍第1項的方法,其中柱體具有奈米結構或微米結構。 The method of claim 1, wherein the cylinder has a nanostructure or a microstructure. 如申請專利範圍第1項的方法,其中柱體為六角錐狀或截頭六角錐狀。 The method of claim 1, wherein the cylinder has a hexagonal cone shape or a truncated hexagonal cone shape. 如申請專利範圍第1項的方法,其中柱體下表面的直 徑介於100 nm(奈米)與數μm(微米)之間。 The method of claim 1, wherein the lower surface of the cylinder is straight The diameter is between 100 nm (nano) and several μm (micron). 如申請專利範圍第1項的方法,其中孔隙係由濕蝕刻製程、乾蝕刻製程、光蝕刻法和曝光顯影製程、雷射切割製程、或電子束寫入製程所形成。 The method of claim 1, wherein the pores are formed by a wet etching process, a dry etching process, a photolithography process and an exposure development process, a laser cutting process, or an electron beam writing process. 一種具有增益出光的發光裝置,包括:發光基板;提供於發光基板上的佈設層;形成於佈設層的一陣列的孔隙;保護層,設置於具有露出孔隙的佈設層上;以及形成於佈設層上的氧化層,具有複數個柱體,各自形成於其中一孔隙;其中柱體的形狀可為六角錐狀或截頭的六角錐狀。 A light-emitting device having a light-emitting light, comprising: a light-emitting substrate; a wiring layer provided on the light-emitting substrate; an array of pores formed in the wiring layer; a protective layer disposed on the wiring layer having the exposed pores; and being formed on the wiring layer The upper oxide layer has a plurality of pillars each formed in one of the pores; wherein the pillar shape may be a hexagonal cone shape or a truncated hexagonal cone shape. 如申請專利範圍第10項的發光裝置,其中氧化層包括氧化鋅(ZnO)、二氧化矽(SiO2 )、二氧化鈦(TiO2 )或氧化鋁(Al2 O3 )。A light-emitting device according to claim 10, wherein the oxide layer comprises zinc oxide (ZnO), cerium oxide (SiO 2 ), titanium oxide (TiO 2 ) or aluminum oxide (Al 2 O 3 ). 如申請專利範圍第10項的發光裝置,其中氧化層由水熱處理、溶膠凝膠法、電鍍、熱蒸鍍法、化學氣相沈積法(CVD)、或分子束磊晶法(MBE)所形成。 The illuminating device of claim 10, wherein the oxide layer is formed by hydrothermal treatment, sol-gel method, electroplating, thermal evaporation, chemical vapor deposition (CVD), or molecular beam epitaxy (MBE). . 如申請專利範圍第10項的發光裝置,其中佈設層包括氧化銦錫(ITO)、鎳/金(Ni/Au)、氧化鎳/金(NiO/Au)、P型氧化鋅(p-ZnO)、或氧化鋅(ZnO)。 The illuminating device of claim 10, wherein the laying layer comprises indium tin oxide (ITO), nickel/gold (Ni/Au), nickel oxide/gold (NiO/Au), and p-type zinc oxide (p-ZnO). Or zinc oxide (ZnO). 如申請專利範圍第10項的發光裝置,其中保護層包括光阻材料或介電材料。 The illuminating device of claim 10, wherein the protective layer comprises a photoresist material or a dielectric material. 如申請專利範圍第10項的發光裝置,其中氣氛的溫度 高於200℃。 The illuminating device of claim 10, wherein the temperature of the atmosphere Above 200 °C. 如申請專利範圍第10項的發光裝置,其中氣氛包括氮、氫、或其混合。 A light-emitting device according to claim 10, wherein the atmosphere comprises nitrogen, hydrogen, or a mixture thereof. 如申請專利範圍第10項的發光裝置,其中柱體具有奈米結構或微米結構。 The illuminating device of claim 10, wherein the cylinder has a nanostructure or a microstructure. 如申請專利範圍第10項的發光裝置,其中柱體下表面的直徑介於100 nm(奈米)與數μm(微米)之間。 The illuminating device of claim 10, wherein the diameter of the lower surface of the cylinder is between 100 nm (nano) and several μm (micrometer). 如申請專利範圍第10項的發光裝置,其中孔隙由濕蝕刻製程、乾蝕刻製程、光蝕刻法和曝光顯影製程、雷射切割製程、或電子束寫入製程所形成。The illuminating device of claim 10, wherein the void is formed by a wet etching process, a dry etching process, a photolithography process and an exposure development process, a laser cutting process, or an electron beam writing process.
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