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TWI475492B - Method of manufacturing memory card and apparatus thereof - Google Patents

Method of manufacturing memory card and apparatus thereof

Info

Publication number
TWI475492B
TWI475492B TW096133135A TW96133135A TWI475492B TW I475492 B TWI475492 B TW I475492B TW 096133135 A TW096133135 A TW 096133135A TW 96133135 A TW96133135 A TW 96133135A TW I475492 B TWI475492 B TW I475492B
Authority
TW
Taiwan
Prior art keywords
memory card
manufacturing memory
manufacturing
card
memory
Prior art date
Application number
TW096133135A
Other languages
Chinese (zh)
Other versions
TW200912758A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW096133135A priority Critical patent/TWI475492B/en
Publication of TW200912758A publication Critical patent/TW200912758A/en
Application granted granted Critical
Publication of TWI475492B publication Critical patent/TWI475492B/en

Links

TW096133135A 2007-09-05 2007-09-05 Method of manufacturing memory card and apparatus thereof TWI475492B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW096133135A TWI475492B (en) 2007-09-05 2007-09-05 Method of manufacturing memory card and apparatus thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW096133135A TWI475492B (en) 2007-09-05 2007-09-05 Method of manufacturing memory card and apparatus thereof

Publications (2)

Publication Number Publication Date
TW200912758A TW200912758A (en) 2009-03-16
TWI475492B true TWI475492B (en) 2015-03-01

Family

ID=44724998

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096133135A TWI475492B (en) 2007-09-05 2007-09-05 Method of manufacturing memory card and apparatus thereof

Country Status (1)

Country Link
TW (1) TWI475492B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI798536B (en) * 2020-03-03 2023-04-11 慧榮科技股份有限公司 Method and computer program product for analyzing failures on flash data

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020199142A1 (en) * 2001-06-26 2002-12-26 Moshe Gefen Semiconductor programming and testing method and apparatus
US6768324B1 (en) * 1999-11-05 2004-07-27 Fab Solutions, Inc. Semiconductor device tester which measures information related to a structure of a sample in a depth direction
US20070188183A1 (en) * 2005-02-07 2007-08-16 Micky Holtzman Secure memory card with life cycle phases

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6768324B1 (en) * 1999-11-05 2004-07-27 Fab Solutions, Inc. Semiconductor device tester which measures information related to a structure of a sample in a depth direction
US20040207415A1 (en) * 1999-11-05 2004-10-21 Keizo Yamada Semiconductor device tester
US20020199142A1 (en) * 2001-06-26 2002-12-26 Moshe Gefen Semiconductor programming and testing method and apparatus
US20070188183A1 (en) * 2005-02-07 2007-08-16 Micky Holtzman Secure memory card with life cycle phases

Also Published As

Publication number Publication date
TW200912758A (en) 2009-03-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees