TWI399555B - Automatic Detection Method of LCD Panel Defects - Google Patents

Description

LCD panel line defect automatic detection method

The invention relates to a method for automatically detecting a line defect of a liquid crystal panel, which provides a panel which can reduce operating costs, can be applied and tested with different specifications produced by various manufacturers, and can find a damaged side wire connecting region during the testing process. And test methods that avoid damage to the panel to be tested during the test.

A Thin Film Transistor (TFT) driven liquid crystal display panel having an Outer Lead Bounding (OLB), and a side wire connection region is located on both sides of the panel as a Gate Line, and a side wire The connection area is located at both ends of the panel and is called the Source Line.

In the TFT process, there is often a problem of static electricity accumulation. If an electrostatic discharge occurs, the high voltage or high current generated in an instant will cause a decrease in the reliability of the components and the circuit, and even more, cause the components and the circuit to be permanent. Sexual damage. In view of this, the gate line and the source line are electrically connected to a short ring, respectively, to dissipate static electricity located on the TFT, thereby avoiding electrostatic discharge.

However, the above process is only a part of the entire TFT process, and the panel also performs pixel (Pixel) defect testing. The pixel defects can be divided into Point Defect and Line Defect, and each pixel has At least three sub-pixels (Subpixel), the aforementioned point defects and line defects appear at each sub-pixel, and each sub-pixel has a color.

The pixel test method is characterized in that a conductive adhesive is disposed at the edge wire connection region, and then the test current or the test voltage is introduced into the panel through the conductive adhesive, so that the panel produces Normal White, Normal Black or Gray Scale effect, and judge whether the panel is normal by the presence or absence of a point defect or a line defect.

However, if the panel has a line defect, it is impossible to find the corresponding side wire connection area by the position of the line defect in the pixel test mode, so another test method is needed to find the damaged side wire connection area. .

In addition, if the short-circuit ring and the side wire connection area, or the connection between the side wire connection area and the panel is damaged, it cannot be judged by using the pixel test mode.

Furthermore, the TFTs designed by various manufacturers have different positions of the gate lines and the source lines. Therefore, when performing pixel test of TFTs of various designs, it is necessary to adjust according to the specifications of the TFTs, thereby increasing the pixels. The complexity and inconvenience of the test.

In addition, after the conductive adhesive is used for two weeks, it needs to be replaced, which invisibly increases the operating cost.

Secondly, during the use of the conductive adhesive, it is easy to adhere to foreign materials such as glass, metal or dust. When the conductive adhesive covers the side wire connection area, the side wire connection area has a high probability of being damaged, or the opposite side wire. The connection area caused damage, making the panel unable to enter the continuous process.

In view of the above disadvantages, an object of the present invention is to provide a method for automatically detecting a line defect of a liquid crystal panel, which provides a panel capable of detecting different specifications produced by various manufacturers, and can avoid damage to the panel to be tested during the test, and It can reduce operating costs and find damaged side conductor connection areas.

In order to achieve the above object, the technical means of the present invention is to provide a method for automatically detecting a line defect of a liquid crystal panel, the steps of which have:

Start: Enter at least one basic data of the panel to be tested into a test machine.

Load the panel to be tested: Load a panel to be tested into the test machine.

Whether there is a line defect: If the panel to be tested does not have a line defect, the step of recording the operation is performed; if the panel to be tested has a line defect, the next step is performed.

Perform fine positioning: read at least two positioning marks on the panel to be tested, and transmit the information to the testing machine to calculate the angle and position error, and obtain a coordinate value of the panel to be tested.

Confirm the line defect of the panel to be tested: According to the position of the line defect, the information of the line defect is obtained to obtain the line coordinate value of the line.

Data conversion: converting the substrate data, the coordinate value of the panel to be tested and the visual coordinate value of the line missing line to find the position of the wire connection area of the side corresponding to the line defect, and obtain a defect coordinate value.

Determining the defect location: determining that the defect occurs in the first zone, the second zone or the inside of the panel to be tested according to the defect coordinate value.

Whether it is a true defect or a false defect: if it is a false defect, the step of recording the job is performed to perform the next processing process; if it is a true defect, the step of recording the operation is performed to perform the subsequent repair process.

The method for automatically detecting the line defect of the liquid crystal panel of the present invention as described above utilizes the conversion of the coordinate position, and the position of the line defect can be found by the position of the line defect, and the step of judging by the above can be It is determined whether the panel to be tested is to be repaired or can be subjected to a subsequent process, and the present invention has the convenience for panel inspection.

In addition, the present invention does not require the use of conductive adhesive during the process, so there is no problem of improving the operating cost and damaging the test panel.

Furthermore, the present invention enables the present invention to be applied and test panels produced by various manufacturers by inputting information of the test panel to overcome problems arising from panels of different specifications produced by various manufacturers.

The embodiments of the present invention are described below by way of specific embodiments, and those skilled in the art can readily understand other advantages and functions of the present invention from the disclosure of the present disclosure.

Referring to FIG. 1 , the present invention is a method for automatically detecting a line defect of a liquid crystal panel, and the steps thereof have:

Start 10: input the basic data corresponding to the panel 2 to be tested to a test machine. The basic data includes at least the identification code and specifications of the panel 2 to be tested and the layout of the side conductor connection area 20, and the side conductor connection area 20 For the gate line 200 or the source line 201, as shown in FIG. 2, this parameter can be obtained from the manufacturer of the production panel. In this step, a plurality of basic data of the panel 2 to be tested having different specifications may be separately input into the testing machine.

The gate line 200 or the source line 201 is respectively connected with the corresponding side wire connection area 20, and the plurality of side wire connection areas 20 of the same color are electrically connected to the one-point lamp pad 21, the lighting pad 21 and the side wire The connection area 20 is the first area 22 (Region I), and the side wire connection area 20 and the panel 2 to be tested are the second area 23 (Region II), as shown in FIG. 3, wherein the lighting pad The sheet 21 is a short-circuit ring.

Loading the panel to be tested 11: Loading a panel to be tested 2 into the test machine.

Performing the initial positioning 12: According to the above basic information, the lighting pad 21 of the panel 2 to be tested is aligned to the power output of the machine to be tested.

Electrically connected to the lighting pad 13: the power output is electrically connected to the lighting pad 21 to provide a test current or test voltage to the lighting pad 21, and the power output can be a probe or other contact power supply device. One of them.

Whether there is a line defect 14: If the panel 2 to be tested does not have a line defect, the step of recording the job 183 is performed, that is, the test result is recorded in a database; if the panel to be tested 2 has a line defect, the next step is performed.

Perform fine positioning 15: at least one charge-coupled device (CCD) reads at least two positioning marks 24 located on the panel to be tested, and transmits the information to the testing machine to calculate the angle and position. The error is obtained, and a coordinate value of the panel to be tested is obtained.

At least two sides of the panel 2 to be tested respectively have a positioning mark 24, as shown in FIG. 4, the positioning mark 24 can be a triangular mark, a cross mark, a circle mark, a notch or a mark that can be read, in this embodiment The positioning mark 24 is a cross mark, and the positioning mark 24 is located at the upper right and upper left of the panel 2 to be tested.

Confirming the line defect 16 of the panel to be tested: at least one charge coupling device moves to the position of the line defect 25 or adjacent to the line defect 25, and the charge coupling device transmits the image read by it to the testing machine. And displayed on a display screen to obtain the information of the line defect 25, and the line defect visual coordinate value is obtained, as shown in FIG.

Data conversion 17: at least one analog-to-digital converter converts the basic data of the panel 2 to be tested, the panel coordinate value to be tested, and the line defect visual coordinate value to find the wire connection region 20 corresponding to the line defect 25 Or the position of the lamp pad 21, that is, a defect coordinate value is obtained.

Determining the defect location 18: at least one driving device moves the charge coupling device to the first region 22 or the second region 23 of the wire bonding region 20 corresponding to the line defect 25 according to the defect coordinate value to determine that the defect occurs in the first The area 22 or the second area 23 or the inside of the panel 2 to be tested.

Whether it is a true defect or a false defect 180: as shown in FIG. 6, if the defect occurs in the first zone 22, and the defect is one of the electrical open circuit 220 or the electrical short circuit 221, which is a false defect 181, the recording operation is performed. Step 183, and recording the position and defect of the defect into the basic data corresponding to the panel 2 to be tested, so as to facilitate the panel 2 to be processed in the next processing process; if the defect occurs in the second region, as shown in FIG. 23, the defect is one of the electrical open circuit 230 or the electrical short circuit 231, which is a true defect 182, then the step of recording the job 183 is performed, and the position of the defect is recorded in the basic data corresponding to the panel 2 to be tested. In order to facilitate the subsequent repair process, the electrical short circuit 221, 231 may be one of the sub-pixels of the side wire connection region 20 electrically connected to each other or one of the lamp pads 21 electrically connected to each other. If the defect does not occur in the first zone 22 or the second zone 23, it is presumed that the defect occurs inside the panel 2 to be tested, which is a true defect 182, and the step of recording the job 183 is performed, and the position of the defect is recorded to In the basic data corresponding to the panel 2 to be tested, The test panel 2 to perform subsequent repair replication process.

Whether to test another panel to be tested 19: If yes, execute the step of loading the panel to be tested 11 to load the next panel 2 to be tested; if not, end 190.

In summary, in the first step of the present invention, the basic data of one or more panels 2 to be tested can be input, so that the testing machine can simultaneously test panels of various specifications or manufactured by different manufacturers. Make the testing process convenient.

In addition, in the step of electrically connecting the lighting pad 13, the utility model replaces the existing conductive adhesive with a power output, such as a probe or other contact power supply device, so there is no improvement in operating cost or damage test during testing. Panel issues.

Furthermore, the present invention rapidly converts the coordinates by the position of the basic parameters and the position of the line defects, and determines whether the defect is to be repaired or can be followed according to the defect. The process can simplify the process of the inspection panel.

However, the specific embodiments described above are merely used to exemplify the features and functions of the present invention, and are not intended to limit the scope of the present invention, and may be applied without departing from the spirit and scope of the present invention. Equivalent changes and modifications made to the disclosure of the present invention are still covered by the scope of the following claims.

10~190. . . step

2. . . Panel to be tested

20. . . Side wire connection area

200. . . Gate line

201. . . Source line

twenty one. . . Lighting pad

twenty two. . . First district

220. . . Electrical disconnection

221. . . Electrical short circuit

twenty three. . . Second district

230. . . Electrical disconnection

231. . . Electrical short circuit

twenty four. . . Positioning mark

25. . . Line defect

1 is a flow chart of a method for automatically detecting a line defect of a liquid crystal panel of the present invention.

Figure 2 is a schematic diagram of a panel to be tested.

Figure 3 is a schematic diagram of the connection of the panel to be tested and the short-circuit ring.

Figure 4 is a schematic view of a panel to be tested having a positioning mark.

Figure 5 is a schematic diagram showing the line defects displayed on a display screen.

Figure 6 is a schematic diagram of a false defect.

Figure 7 is a schematic diagram of true defects.

10~190. . . step

Claims (10)

A method for automatically detecting a line defect of a liquid crystal panel comprises the following steps: starting: inputting basic information of a panel to be tested into a test machine; loading a panel to be tested: loading a panel to be tested into the machine to be tested; The light connection gasket is electrically connected to the lighting gasket of the panel to be tested to provide a test current or test voltage to the lighting gasket; whether there is a line defect: if the panel to be tested does not have a line defect, And performing the step of recording the operation; if the panel to be tested has a line defect, performing the next step; performing fine positioning: reading at least two positioning marks located on the panel to be tested, and transmitting the information to the testing machine In order to calculate the angle and position error, the coordinate value of the panel to be tested is obtained; the line defect of the panel to be tested is confirmed: according to the position of the defect of the line, the information of the line defect is obtained to obtain the visual line of the line defect Value; data conversion: converting the substrate data, the coordinate value of the panel to be tested and the visual coordinate value of the line missing line to find the position of the wire connection area corresponding to the side of the line defect, and obtain a defect coordinate value; Position: According to the defect coordinate value, it is judged that the defect occurs in the first area, the second area or the inside of the panel to be tested; whether it is a true defect or a false defect: if it is a false defect, the step of recording the operation is performed, For the next processing process; if it is a true defect, the step of recording the job is performed to perform the subsequent repair process. The method for automatically detecting a line defect of a liquid crystal panel according to claim 1, wherein in the initial step, the basic data is a layout code, a specification of the panel to be tested, and a layout of a side wire connection region. The method for automatically detecting a line defect of a liquid crystal panel according to the second aspect of the invention, wherein the step of confirming a line defect of the panel to be tested moves the at least one charge coupling device to the line defect position or adjacent At the line defect location, the charge coupling device transmits the image it reads back to the test machine and displays it on a display screen to obtain information about the line defect. The method for automatically detecting a line defect of a liquid crystal panel according to the third aspect of the invention, wherein the step of loading the panel to be tested and the step of the electrical contact lamp pad further has a step of performing initial positioning, It aligns the lighting pad with the power output of the machine to be tested. The method for automatically detecting a line defect of a liquid crystal panel according to claim 4, wherein at least two sides of the panel to be tested respectively have a positioning mark, and the step of performing fine positioning uses at least one charge coupling device. The positioning mark is read, and the positioning mark is a triangle mark, a cross mark, a circle mark, a notch or a mark that can be read. The method for automatically detecting a line defect of a liquid crystal panel according to claim 5, wherein in the step of converting the data, the basic data, the coordinate value of the panel to be tested is converted by using at least one analog to digital converter system. The visual coordinate value of the line is missing, and the defect coordinate value is obtained. The method for automatically detecting a line defect of a liquid crystal panel according to claim 6, wherein in the step of determining a defect position, at least one driving device is used, and the driving device couples the electric charge according to the defect coordinate value. The device moves to the first zone or the second zone corresponding to the line defect to determine that the defect occurs in the first zone or the second zone; if the defect occurs in the first zone, the location and defect of the defect are recorded to In the basic data corresponding to the panel to be tested, the next processing process is performed; if the defect occurs in the second area, the step of performing the recording operation is performed, and the location of the defect is recorded to the panel to be tested. In the basic data, to perform a subsequent repair process; if the defect does not occur in the first zone or the second zone, the defect occurs inside the panel to be tested, and the location of the defect is recorded to the test The basic data corresponding to the panel is used to perform subsequent repair processes. The method for automatically detecting a line defect of a liquid crystal panel according to claim 7, wherein the step of determining the position of the defect further comprises a step of testing another panel to be tested, and if so, to the panel to be tested. Step; if no, it ends. The method for automatically detecting a line defect of a liquid crystal panel according to Item 8 of the patent application, wherein the side wire connection area is a gate line or a source line, and the side wire connection area is connected with a light pad, the lighting pad Between the connection area of the side wire is a first area, and the boundary between the side wire connection area and the panel to be tested is a second area. The method for automatically detecting a line defect of a liquid crystal panel according to claim 9, wherein the defect is one of an electrical disconnection or an electrical short circuit, wherein the electrical short circuit is each sub-pixel of the side wire connection region One of the electrical connections or the respective lamp pads are electrically connected to each other.