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TWI380009B - Optical inspection apparatus and method - Google Patents

Optical inspection apparatus and method Download PDF

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Publication number
TWI380009B
TWI380009B TW97123415A TW97123415A TWI380009B TW I380009 B TWI380009 B TW I380009B TW 97123415 A TW97123415 A TW 97123415A TW 97123415 A TW97123415 A TW 97123415A TW I380009 B TWI380009 B TW I380009B
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TW
Taiwan
Prior art keywords
light
filter
image
tested
wavelength
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TW97123415A
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Chinese (zh)
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TW201000874A (en
Inventor
Jen Ming Chang
Mau Hsiung Hsu
Tan Sze-Yeong
Yu His Lee
Jia Lin Shen
Jui Yu Lin
Original Assignee
Delta Electronics Inc
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Priority to TW97123415A priority Critical patent/TWI380009B/en
Publication of TW201000874A publication Critical patent/TW201000874A/en
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Publication of TWI380009B publication Critical patent/TWI380009B/en

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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

1380009 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種光學檢測設備與方法,特別是用於彩 色渡光片色不均瑕疲檢測的光學檢測設備與方法。 【先前技術】 彩色濾光片顏色不均的現象,是在同一光源且相同底色之1380009 IX. Description of the Invention: [Technical Field] The present invention relates to an optical detecting apparatus and method, and more particularly to an optical detecting apparatus and method for color unevenness detection of color unevenness. [Prior Art] The phenomenon that the color filters are uneven in color is in the same light source and the same background color

10 1510 15

20 畫面下職覺較到不同程度之顏色差異而造成,其發生原因 很廣泛’其中最主要原因為彩色滤光片的塗布不良因而造成 光線折射角度不同,因此不同視角對於顏色的響應也就不同。 目前業界對於色;f均之檢測仍f遍採取人卫抽檢的方 法’其存在有下列缺點: 1·品質掌控不易:由於其採用人1抽檢方式無法逐一 檢測,且須於不同角度财㈣度麵下由人以視覺感覺判 ^不僅相不同人觸而影響結果,且崎方式容易出現大 I漏檢後方能查知。 2. 祕歷t法進行崎製程分析:先前技魅法有效紀錄瑕 =寺徵與㈣’瑕_特徵與製程之間的關聯性也I法有效收 集’對於製程改善毫無助益。 :由於塗布不均,所以須 測片對於不同波長的光也 3·目前檢測機台漏檢率偏高 於特殊角度方能檢測,且不同顏色待 會有不同的反應。 因此’需要-套良好的基板色不均 基板色不均瑕纖撕和效益,以改善 5 < S ) 1380009 # l · * 520 The picture is caused by different color differences, and the causes are very wide. The most important reason is that the color filter is poorly coated and the light refraction angle is different. Therefore, different angles of view respond differently to color. . At present, the industry's detection of color; f is still a method of taking people's health sampling test's existence has the following shortcomings: 1. Quality control is not easy: due to its use of people 1 sampling method can not be detected one by one, and must be in different angles of wealth (four) degrees Under the face, it is judged by the visual sense of the person that not only the different people touch the result, but also the Saki method is easy to see the big I missed the inspection. 2. The secret t-method is used for the analysis of the process: the previous effective record of the enchantment method = the sign of the temple and the (4) '瑕 _ characteristics and the relationship between the process and the effective collection of the I method' is not helpful for the process improvement. : Due to uneven coating, it is necessary to measure the light for different wavelengths. 3. At present, the detection rate of the inspection machine is higher than the special angle to detect, and different colors will have different reactions. Therefore, 'requires-set of good substrate color unevenness, substrate color unevenness, fiber tearing and benefits to improve 5 < S ) 1380009 # l · * 5

術的種種缺失,職是之故,申請人乃經悉心試驗與研究,並一 本鍥而不捨之精神,終構思出本案「光學檢測設備與方法」, 以下為本案之簡要說明。 【發明内容】 本發明之目的在於提供一種光學檢測設備,藉由多視角 之光學檢測及不同波長光線之投射影像,提高基板瑕疵檢測的 精度和效益’並進一步提高製程良率與降低生產成本。 根據本發明的構想’提出一種光學檢測設備,其包括一光 源、一反射元件、以及一影像擷取元件;其中該光源將一光線 投射至一待測物;該反射元件具備至少二個反射面,用以反射 經過該待測物之該光線;以及一影像擷取元件,用以接收經反 射之該光線而形成之一投射影像。 較佳地,本發明所提供之光學檢測設備,其中該反射元件 為一多面稜鏡。 較佳地,本發明所提供之光學檢測設備,其中該反射元件 可被旋轉以反射不同入射角度之光線至該影像揭取元件,該入 射角度之範圍為〇度至180度之間,但不包括〇度與18〇度。 較佳地,本發明所提供之光學檢測設備,其中該光線經過 該待測物方式為透射、折射、反射以上其一或其組合。 較佳地,本發明所提供之光學檢測設備,其更包括一光濾 波元件、-承載元件、—遮罩元件以及—分析單元,其中該光 滤波元件用以取得特定波長棚之人射光線;該承載元件用以 承載該待·;該鮮元件,用以接收_影像娜元件呈一 20 1380009 • L· 特定角度之投射影像’而濾除其它角度之投射影像;該分析單 元用以分析該影像擷取元件所擷取之該投射影像,以取得包括 該待測物的瑕疲資訊。 較佳地’本發明所提供之光學檢測設備,其中該特定角度 5 為90度。 較佳地’本發明所提供之光學檢測設備,其中該光源為一 多角入射光源,用以產生多角度入射該待測物之該光線。 較佳地’本發明所提供之光學檢測設備,其中該待測物可 • 為彩色濾光片、薄膜太陽能板、TFT-LCD、STN-LCD、 10 LTPS-LCD、OLED、PLED、PDP、SED、Flexible Display 及E-paper;而該光線之波長範圍為300至13〇〇奈米之間。 較佳地’本發明所提供之光學檢測設備,其中當該待測物 為一藍色濾光片時’該光線採取之波長為670〜693奈米;該 • 待測物為一紅色濾光片時,該光線採取的波長為460〜493奈 v 15 米,該待測物為一綠色濾光片時,該光線採取的波長為580〜 600奈米’該影像擷取元件更包括一分析單元,用以分析彩色 濾光片之顏色不均資訊。 根據本發明的構想,提出另一種光學檢測設備用以檢測一 渡光片之顏色不均資訊,其包括一光源以及一影像擷取元件, 20 其中該光源將一光線投射至該濾光片;該影像擷取元件接收經 過該濾光片之該光線並依該光線之一波長區段以產生一影 像’其中:當該濾光片為一藍色濾光片時,該波長區段為波長 670〜693奈米;該濾光片為一紅色濾光片時,該波長區段為 波長460〜493奈米;該濾光片為一綠色濾光片時,該波長區 7 段為波長580〜600奈米。 較佳地’本發明所提供之光學檢測設備,其中該光線經過 該濾光片為透射、折射、反射以上其一或其組合。 較佳地’本發明所提供之光學檢測設備,其中該光源為一 夕角入射光源’用以產生多角度入射該待測物之該光線,該光 學檢測設備更包括一光濾波元件、一反射元件、一承載元件、 一分析單元、一顯示單元與一儲存單元,其中該光濾波元件用 以取得該光線之特定波長區段;該反射元件具備至少二個反射 面,用以反射經過該濾光片之該光線;該承載元件可承載該濾 光片;該遮罩元件可取得與該光線與該影像擷取元件呈一特定 角度之部分’而據除其它角度之部分;該分析單元分析該影像 擷取兀件_取之該影像’以取得包括該濾光片的顏色不均之 瑕疲資訊,其+亦運料紐量技術,用以提高基板色不均瑕 疫檢測的精度和效益;該齡單元可齡該影賴取元件所操 取之影像’雜存單元可贿所娜之縣與分析的結果。 、較佳地’本發明所提供之光學檢測設備,其中該反射元件 為-多面稜鏡’且旋轉該反射元件以反射不同入射角度之該光 線至該影像榻取元件。 較佳地本發明所提供之光學檢測設備,其中該特定角度 為90度。 較佳地’本發明所提供之光學檢測設備,其巾:當該滤光 片為-藍色;*光片時’該影像係、由該光線經該藍色濾光片透射 後產生’當該光片為—紅色遽光片時,該影像係由該光線經 該紅色遽光竭射後產生;鶴光片為一綠色濾光片時 ,該影 8 1380009 • t 、The lack of skills, the job is the reason, the applicant is carefully tested and researched, and a spirit of perseverance, finally conceived the case "optical testing equipment and methods", the following is a brief description of the case. SUMMARY OF THE INVENTION An object of the present invention is to provide an optical detecting apparatus which can improve the accuracy and benefit of substrate defect detection by optical detection of multiple viewing angles and projected images of light of different wavelengths, and further improve process yield and reduce production cost. According to the concept of the present invention, an optical detecting apparatus includes a light source, a reflective element, and an image capturing element; wherein the light source projects a light to a test object; the reflective element has at least two reflective surfaces For reflecting the light passing through the object to be tested; and an image capturing component for receiving the reflected light to form a projected image. Preferably, the optical detecting device of the present invention, wherein the reflecting member is a multi-faceted file. Preferably, the optical detecting apparatus provided by the present invention, wherein the reflective element is rotatable to reflect light of different incident angles to the image extracting element, the incident angle ranges from 〇 to 180 degrees, but not Includes twist and 18 degrees. Preferably, the optical detecting device provided by the present invention, wherein the light passes through the object to be tested in the form of transmission, refraction, reflection, or a combination thereof. Preferably, the optical detecting device provided by the present invention further includes an optical filter component, a carrier component, a mask component, and an analysis unit, wherein the optical filter component is used to obtain a human light beam of a specific wavelength shed; The carrying component is configured to carry the standby component; the fresh component is configured to receive a projected image of a 20 1380009 • L· specific angle and filter out the projected image of other angles; the analyzing unit is configured to analyze the image The image captures the projected image captured by the component to obtain the fatigue information including the object to be tested. Preferably, the optical detecting apparatus provided by the present invention, wherein the specific angle 5 is 90 degrees. Preferably, the optical detecting device provided by the present invention, wherein the light source is a multi-angle incident light source for generating the light incident on the object to be tested at multiple angles. Preferably, the optical detecting device provided by the present invention, wherein the object to be tested can be a color filter, a thin film solar panel, a TFT-LCD, an STN-LCD, a 10 LTPS-LCD, an OLED, a PLED, a PDP, or a SED , Flexible Display and E-paper; and the wavelength of the light is between 300 and 13 nanometers. Preferably, the optical detecting device provided by the present invention, wherein when the object to be tested is a blue filter, the wavelength of the light is 670 to 693 nm; and the object to be tested is a red filter. When the film is taken, the wavelength of the light is 460~493 奈 v 15 meters, and when the object to be tested is a green filter, the wavelength of the light is 580~600 nm. The image capturing component further includes an analysis. Unit for analyzing the color unevenness information of the color filter. According to the concept of the present invention, another optical detecting device is proposed for detecting color unevenness information of a light-passing sheet, comprising a light source and an image capturing component, wherein the light source projects a light to the filter; The image capturing component receives the light passing through the filter and generates an image according to a wavelength segment of the light. Where: when the filter is a blue filter, the wavelength segment is a wavelength 670~693 nm; when the filter is a red filter, the wavelength segment is a wavelength of 460 to 493 nm; when the filter is a green filter, the wavelength region 7 is a wavelength of 580 ~ 600 nm. Preferably, the optical detecting apparatus provided by the present invention, wherein the light passes through the filter for transmission, refraction, reflection, or a combination thereof. Preferably, the optical detecting device provided by the present invention, wherein the light source is an incident light source for generating an incident light of the object to be tested at a plurality of angles, the optical detecting device further comprising an optical filter component and a reflection An element, a carrier element, an analysis unit, a display unit and a storage unit, wherein the optical filter element is configured to obtain a specific wavelength section of the light; the reflective element has at least two reflective surfaces for reflecting through the filter The light beam of the light sheet; the carrier element can carry the filter; the mask element can obtain a portion of the light and the image capturing element at a specific angle, and the other angles are excluded; the analysis unit analyzes The image capture component _take the image to obtain the information of the color unevenness including the color of the filter, and the + material is also used to increase the accuracy of the substrate color unevenness detection and Benefits; the age of the unit can be taken from the image taken by the component 'missing unit can bribe the county and the results of the analysis. Preferably, the optical detecting apparatus of the present invention, wherein the reflecting element is a multi-faceted cymbal and rotating the reflecting element to reflect the light of different incident angles to the image taking element. Preferably, the optical detecting apparatus of the present invention, wherein the specific angle is 90 degrees. Preferably, the optical detecting device provided by the present invention has a towel: when the filter is - blue; * when the light is transmitted, the image is transmitted through the blue filter to generate 'when When the light sheet is a red light sheet, the image is generated by the light being exhausted by the red light; when the light sheet is a green filter, the image is 8 1380009 • t ,

10 15 20 像則係由該絲輯該綠色#光片反射後產生。 根據本發明的構想,提出—種光學檢測方法,其包括以下 ^驟:⑷投射—光線至—待測物;(b)以—多反射面元件 反射該㈣制物之該親,並取得—投㈣像;以 分析該投射影像。 ) 較佳地,本發明所提供之絲檢财法,其巾步驟 包括:以够反射面元件之―第—反射面反射該祕,以取得 [第-角度經過該待測物之—第—部分的該光線所形成之 二第-投射影像;卩-第—旋轉角旋轉該多反射面元件,以該 第-反射面反射該光線,以取得以H度經過該第—部分 之該光線彡狀-第二投射雜;移_制物—固定距 離;以大於該第-旋轉角之—第二旋轉角旋轉該多反射面元 件,以該纽射面元件之—第二反射面反射該光線,以取得以 該第-角度經過該待測物之—第二部分的該光線所形成之一 第三投射影像;以及結合該第—投射影像與該第三投射影像。 較佳地’本發明所提供之光學檢測方法,其中該光線係以 該透射、卿、反射以上其―或其組合之方式_該待測物。 較佳地,本發明所提供之光學檢測方法,其中該待測物為 一濾光片,且該光線之波長範圍為460至693奈米之間,其中: 當該濾光月為一藍色濾光片時,該光線採取之波長為67〇〜693 奈米,且該投射影像為該光線透射該藍色濾光片而產生;當該 濾光片為一紅色濾光片時,該光線採取之波長為 460〜493奈 米,且該投射影像為該光線透射該紅色濾光片而產生;當該濾 光片為一綠色濾光片時,該光線採取之波長為58〇〜6〇()奈 9 1380009 • · .. 5 10 1510 15 20 The image is produced by reflecting the green #光片. According to the concept of the present invention, an optical detecting method is proposed, which comprises the following steps: (4) projecting a light to a test object; (b) reflecting the parent of the (4) object with a multi-reflecting surface element, and obtaining - Cast (four) image; to analyze the projected image. Preferably, in the wire inspection method provided by the present invention, the towel step comprises: reflecting the secret by the "first" reflection surface of the reflective surface element to obtain [the first angle passes through the object to be tested - the first a portion of the second projected image formed by the light; the first-rotation angle rotates the multi-reflecting surface element, and the light is reflected by the first reflecting surface to obtain the light passing through the first portion at H degree Shape-second projection miscellaneous; shifting-object-fixing distance; rotating the multi-reflecting surface element at a second rotation angle greater than the first-rotation angle, reflecting the light with the second reflecting surface of the neo-surface element And obtaining a third projected image formed by the light passing through the second portion of the object to be tested at the first angle; and combining the first projected image and the third projected image. Preferably, the optical detection method provided by the present invention, wherein the light is in the form of the transmission, the reflection, the reflection, or the combination thereof. Preferably, the optical detection method provided by the present invention, wherein the object to be tested is a filter, and the wavelength of the light is between 460 and 693 nm, wherein: when the filter month is a blue In the case of a filter, the light is taken at a wavelength of 67 〇 to 693 nm, and the projected image is generated by transmitting the light to the blue filter; when the filter is a red filter, the light is The wavelength is 460~493 nm, and the projected image is generated by transmitting the light to the red filter; when the filter is a green filter, the wavelength of the light is 58 〇~6〇 () Nai 9 1380009 • · .. 5 10 15

20 米’且該投射影像為該光線反射該綠色遽光片而產生。 較佳地,本發明所提供之光學檢測方法,其中步驟(c) 包括:判斷該待測物是否具有一瑕疯;判斷該瑕疲所發生的製 程階段;判斷該瑕疵的幾何特徵與發生機率;以及儲存上述判 斷結果。 根據本發明的構想,提出另一種光學檢測方法,其包括以 下步驟.(A)投射-光線至-渡光片;⑻根據該滤光片的 類型取得該絲之-指定波段,其1當韻光片為一藍色滤 光片時,該指定波段為波長670〜693奈米;當該渡光片為二 紅色濾、光片時’該指定波段為波長46G〜493奈米;以及當該 濾光片為-綠色遽光片時,該指定波段為波長58〇〜_奈米; (C)榻取經過該濾、光片之該光線的該指定波段所形成之一投 射影像;以及(D)分析該投射影像。 較佳地,本發騎提供之光學檢測方法,射該光線係以 該透射、浦、反射以上其—或其組合之方式經過誠光片。 較佳地’本發日綺提供之絲檢财法,其中步驟(C) 反射元件反射經過魏光片之該光線;以及旋轉該 取得㈣肖度經職魏#之該緣所形成之 根據本發明的構想,提出又一種光 下步驟: 學檢測方法,其包括以 (A) 投射一光線至一待測物; (B) 以-反射元件反射該光線 過該待敎十物__^=^ 10 < S ) (C) 以一第一旋轉角旋轉該反射元件後,反射該光線以 取得以一第二角度經過該第一部分之該光線所形成之一第二 投射影像; (D) 移動該待測物一固定距離;以及 (E) 以一第二旋轉角旋轉該反射元件後,反射該光線以 取得以該第—角度經過該待測物之-第二部分的該光線所形 成之一第三投射影像。 較佳地,本發明所提供之光學檢測方法,其中更包括:(F) 結合該第一投射影像與該第三投射影像。 較佳地’本㈣所提供之光學檢測方法,其巾該光線係以 該透射、折射、反射以上其—或其組合之方式經過該濾光片, 且該第二旋轉角大於該第一旋轉角。 如别述本發明之光學檢測設備與方法,得藉由下列實施例 及圖示說明,俾得更深入之了解: 【實施方式】 本發月之技術手段將詳細說明如下,相信本發明之目的 =_點,當可由此得一深入且具體之了解,然而下靡 例,、圖讀提供參考與說,並_來對本發明加以限制 首先請參_丨圖,其為本㈣之絲檢測賴之第 =Γ 源、19:、一反射元件18、-承載元件 及一:16、—光紐元件13、—_接收感應元件17 及-衫像擷取元件12。為達光學檢測之目的,—待測物㈣ 置玫於承載元件15上,第一光源191投射一光線un至待測 物U並穿透待測物14,該穿透待測物之光線1〇2經由反射元 件18反射,經反射之光線103並經過一遮罩元件16與一光渡 波元件13後為該陣列接收感應元件17及/或影像擷取元件12 所接收’並產生一影像’再經由分析該影像來取得檢測物14 的瑕疵資訊、或其它材質或表面特徵。其中,該遮罩元件16 係用以篩選與該陣列接收感應元件17及/或影像擷取元件12 呈一特定角度之入射光線104,一般取垂直角度而篩除其它角 度之入射光線;該光濾波元件13則可以依不同之分析目的取 得不同之特定波長範圍之入射光線。 其中’為了達到精密檢測之目的,光源191採一多角入射 光源’可產生多角度入射制寺測物之該光線,反射元件18則 具有多個反射面,例如可旋轉的多面稜鏡或多面凹鏡,在如此 之搭配下,可以達到多角度光線入射待測物與取樣的功能。在 此例中,反射几件18係採一六面棱鏡,然而本領域技術人員 自可視需要採用一四面稜鏡或八面稜鏡。 明參閱第2圖’其為本發明第一實施例中多角度光學入射 與取樣示意圖。在第2圖中,該反射元件18為-六面稜鏡, 由^個凹面鏡所組成,接收—多角人射統所產生之入射光, 該待測物14在承航件上_的向前移動時 ,該反射元件亦 持續的轉動。 田待測物14在承載裝置15上前進—固定距離時,其將觸 發,射το件18鄕六分之—圓周角每當反射元件μ旋轉一 特定小角度(該小角度小於六分之—圓周角)時 ,即發出一取 5 樣訊號給雖_树】2,關動該娜齡树i2褐取經 ^遮罩7G件16並職於—特定之光線人㈣度的條狀影像。 ^ 衫像擷取元件12可分別擷取對應於45度、90 度、135度之光線入射角度下入射該待測物14 (以下 角45度、9〇度、135度)後所形成的影像,第二圖(D)、⑻、 ⑺則分別為對應於45度、9〇度、m度之光線入射角 入射該制物14所取得的影像,由於光線係經過遮罩元^ 10 取叙影像為一種條狀影像,圖中的每一條的條狀影 像即為母一次擷取的結果。 i旋轉元件18於視角45度的情況時,該影像擷取元件 2首取了—筆條狀影像al,其後該旋轉元件π持續旋 ,並在視㈣鱗,該影像齡元件 15 影像M,而後當旋轉元件18旋轉至視角出度時該 ^0件12〇操取了 —筆條狀影像ς卜在旋轉元件π 侧物Μ亦在承載元件上往前移動,當旋轉元件18旋轉六分 之-圓周角後又可回到視角衫度之取樣角度時,該影像掏取 ^件120即可娜對應該待測物14較後方部位的 20 同理’隨著旋轉元件18持續旋轉趨動影賴取元件二 狀’對應該待測物14較後方部位的條 π 徒轉林18再次旋轉六分之-圓周角後又 視角45度,度、135度時,擷取對應該彳 後方部位的另一條狀影像a3、b3、e3。 其後,經由一影像曹έθ 4» r*·.- 重、、且私序,可將相同視角下的一系列條 13 狀影像重組而得到該待測物14 一完整的視角影像,如第二圖 (G)、(H)、(1)為對應視角45度、90度、135度下該待^物 Η整體的透射影像。在第二圖(G)中,影像沾即為在衫度之 光線入射角度下入射待測物14時,所呈現該待測物14整體的 透射影像,其中該影像中所出現的不連續區塊的,即有可能 為欲檢測該待測物的材質或表面特徵,或為一不均佈的瑕 在檢測的同時,該待測物可持續的在承載元件上往前移 動,又可藉由旋轉具多個反射面的反射元件18快速且穩定的 取得各個光線入射角(即視角)的投射影像。在實務上光線入 射該待測物14的人㈣度—般可取約10度至170度間,然理 論上應可實現〇度至18〇度間的入射角度。 ’、 較佳的是,該影像擷取元件12可包括一陣列接收 Π、-影細示單元、—影像分析單元以及—儲存單元^陣 列接收感應器17可視需要而搭配使用-維及/或二維以上的陣 列接收感應器Π,該影像分析單元可分析該陣列接收感應器 17所感應之影像’以取得該制物的各種表面或材質&徵, 例如材質趣色分佈不解贼倾,該·顯示單元可顯示 陣列接收錢器17所接收之影像,俾便於檢測人貝複核或校 正’該儲存單元則可崎存所接收的影像,與上述分析之处 果’俾便概續之統計,並可進—步建立影像與贼資料庫: 所統計之資訊可應用於製程之回饋與改善,提高製程之良率。 以用於分析與記錄所接收之影像,並便於人工直接目視檢 核影像。 此外,依不同檢測目的之需要,該影像擷取元件12所擷 1380009 取之光線並非僅止於該待測物14之透射光,亦可為反射光。 例如,在第1圖中,將一第二光源192配置在該待測物與該影 像擷取元件12相同的一侧’使第二光源丨92所投射出的光線, 可經該待測物反射後,而為該影像擷取元件12所接收。依不 同檢測目的,該第一光源191與第二光源192可獨立的配置, 亦可同時的配置。 同理,依不同檢測目的或待測物之型態,亦可將光源置於 • 待測物的任—側面,而以影像摘取元件12接收該待測物的折 射光或反射光。而以上所述之各種位置之光源,皆可以獨立配 1〇 置或同時配置。同理,該影像類取元件12及遮罩元件16亦可 依不同的檢測目的而為多件組合的配置。 上述之待測物14,可為彩色濾、光片、薄膜太陽能板、 TFT-LCD、STN-LCD、LTPS-LCD、OLED、PLED、PDP、 SED、Flexible Display及E-paper料,而該光學檢測設 '備所測之標的則可檢測上述各種待測物之各種瑕舰象,例如 φ 局。^面結構色不均之瑕疲及線結構色不均之瑕庇,然而本領域 之技術人員依所揭露者,亦可將此一發明概念輕易推及其它光 學檢測領域,自不為上述所列舉者所限制。 此外’上述之承载元件15可為一移動平台及/或一支撐平 2〇台,該乘載元件可為一 Χ·Υ軸縱橫向移動平台、皮帶式平台、 滾輪式平台、氣浮式平台、透明玻璃载台、上下莫空之輸送裝 置以2其-或其組合’但亦不為上述所列舉者所限制。 一请參閱第3圖’其為本發明之光學檢測設備之第二實施例 的不思圖在第3圖令’一光學檢測設傷3包括一第一光源 < S ) 15 138000920 m' and the projected image is produced by the light reflecting the green calender. Preferably, the optical detection method provided by the present invention, wherein the step (c) comprises: determining whether the object to be tested has a madness; determining a process stage in which the fatigue occurs; determining geometric characteristics and probability of occurrence of the flaw ; and store the above judgment results. According to the concept of the present invention, another optical detecting method is proposed, which comprises the following steps: (A) projecting-light to-lighting sheet; (8) obtaining the specified band of the silk according to the type of the filter, When the light sheet is a blue color filter, the specified wavelength band is a wavelength of 670 to 693 nm; when the light passing sheet is a two red filter, the light beam is 'the specified wavelength band is a wavelength of 46 G to 493 nm; and when When the filter is a green calender, the specified wavelength band is a wavelength of 58 〇 to _ nanometer; (C) a projection image formed by the specified wavelength band of the light passing through the filter and the light sheet; and D) Analyze the projected image. Preferably, the optical detection method provided by the present invention transmits the light through the Cheng Guang film in the manner of transmitting, filtering, reflecting, or the like. Preferably, the wire inspection method provided by the present invention, wherein the step (C) reflects the light passing through the Weiguang sheet; and rotates the basis of the acquisition of (4) Xiaodu Jingwei Wei# The inventive concept proposes another sub-lighting step: a learning detection method comprising: projecting a light to (A) to a test object; (B) reflecting the light through the reflective element through the ten object __^= ^ 10 < S ) (C) after rotating the reflective element at a first rotation angle, reflecting the light to obtain a second projected image formed by the light passing through the first portion at a second angle; (D) Moving the object to be tested by a fixed distance; and (E) rotating the reflecting element at a second rotation angle, reflecting the light to obtain the light passing through the second portion of the object to be tested at the first angle One of the third projected images. Preferably, the optical detection method provided by the present invention further includes: (F) combining the first projected image and the third projected image. Preferably, the optical detection method provided by the present invention, wherein the light passes through the filter in a manner of transmitting, refracting, reflecting, or a combination thereof, and the second rotation angle is greater than the first rotation. angle. The optical detection apparatus and method of the present invention will be further understood by the following embodiments and illustrations: [Embodiment] The technical means of this month will be described in detail below, and the purpose of the present invention is believed. =_ point, when you can get an in-depth and specific understanding, but the following examples, drawing to provide reference and say, and _ to limit the invention first, please refer to the _ map, which is the silk detection of (4) The first = Γ source, 19: a reflective element 18, a carrier element and a: 16, a light-emitting element 13, a receiving sensing element 17 and a shirt-like capturing element 12. For the purpose of optical detection, the object to be tested (4) is placed on the carrier element 15, and the first light source 191 projects a light un to the object to be tested U and penetrates the object to be tested 14, which penetrates the light of the object to be tested. The 〇2 is reflected by the reflective element 18, and the reflected light 103 passes through a masking element 16 and a light absorbing element 13 and is received by the array receiving sensing element 17 and/or the image capturing element 12 and generates an image. The image of the detector 14 or other material or surface features is obtained by analyzing the image. The mask element 16 is configured to screen the incident light 104 at a specific angle to the array receiving sensing element 17 and/or the image capturing element 12, and generally adopts a vertical angle to screen out incident light of other angles; The filter element 13 can obtain incident light of different specific wavelength ranges for different analysis purposes. Wherein, in order to achieve the purpose of precision detection, the light source 191 adopts a multi-angle incident light source to generate the light of the multi-angle incident temple object, and the reflective element 18 has a plurality of reflecting surfaces, such as a rotatable multi-faceted or multi-faceted surface. The concave mirror, in this combination, can achieve the function of multi-angle light incident on the object to be tested and sampled. In this example, several 18-piece prisms are reflected, but one skilled in the art would need to use a four-sided or eight-faced raft. Referring to Figure 2, there is shown a schematic diagram of multi-angle optical incidence and sampling in a first embodiment of the present invention. In Fig. 2, the reflective element 18 is a six-sided 稜鏡, consisting of a concave mirror, receiving the incident light generated by the multi-angle man-beam, and the object 14 is forwarded on the carrier. The reflective element also continues to move as it moves. The field to be tested 14 advances on the carrying device 15 - when the distance is fixed, it will trigger, and the τ 件 piece 18 鄕 six points - the circumferential angle is rotated every time the reflecting element μ is rotated by a specific small angle (the small angle is less than six points - At the circumferential angle, a 5-like signal is sent to the _tree 2, and the sage tree i2 is taken to cover the 7G piece 16 and the strip image of the specific light person (four degrees) is used. ^ The image capturing component 12 can respectively capture images formed by the object 14 (45 degrees, 9 degrees, 135 degrees below) corresponding to the incident angle of light of 45 degrees, 90 degrees, and 135 degrees. The second images (D), (8), and (7) are images obtained by entering the workpiece 14 corresponding to the incident angles of light of 45 degrees, 9 degrees, and m degrees, respectively, because the light is passed through the mask element. The image is a strip image, and the strip image of each strip in the figure is the result of the mother's one-time capture. When the rotating element 18 is at a viewing angle of 45 degrees, the image capturing element 2 first takes a pen-like image a1, and then the rotating element π continues to rotate, and in the (four) scale, the image-aged element 15 image M Then, when the rotating member 18 is rotated to the viewing angle, the member 12 is operated - the pen-like image is moved forward on the carrier member on the side of the rotating member π, and the rotating member 18 is rotated six times. After the circumferential angle is back to the sampling angle of the viewing angle, the image captures 120 and can correspond to the 20th portion of the object 14 to be tested. The moving picture depends on the element two-shaped 'corresponding to the strip 14 of the object to be tested 14 π turn the forest 18 and rotate the six-point again - the angle of the circle is 45 degrees, and the angle is 135 degrees. Another image of the part a3, b3, e3. Thereafter, through a image of Cao έ θ 4» r*·.- heavy, and private order, a series of strip 13 images of the same viewing angle can be reconstructed to obtain a complete view image of the object 14 to be tested, such as The two figures (G), (H), and (1) are transmission images of the object to be viewed at 45 degrees, 90 degrees, and 135 degrees. In the second image (G), the image is the transmitted image of the whole object 14 when the object 14 is incident at the incident angle of the light of the shirt, wherein the discontinuous area appears in the image. Block, that is, it may be that the material or surface feature of the object to be tested is to be detected, or a non-uniform flaw is detected, and the object to be tested may be continuously moved forward on the carrying member, and may be borrowed A projected image of each light incident angle (i.e., viewing angle) is quickly and stably obtained by rotating the reflecting element 18 having a plurality of reflecting surfaces. In practice, the person who enters the object to be tested 14 by light (four degrees) can generally take between about 10 degrees and 170 degrees, and theoretically, the angle of incidence between the degree of twist and 18 degrees can be achieved. Preferably, the image capturing component 12 can include an array receiving frame, a shadow display unit, an image analyzing unit, and a storage unit. The array receiving sensor 17 can be used in combination with the need for - and/or The image receiving unit can analyze the image sensed by the array receiving sensor 17 to obtain various surfaces or materials of the workpiece. The display unit can display the image received by the array receiving device 17, and is convenient for detecting the person's review or correcting the 'storage unit, and the image can be received by the storage unit, and the analysis result is as follows. Statistics, and can further establish image and thief database: The statistical information can be applied to the feedback and improvement of the process, and improve the yield of the process. It is used to analyze and record the received images, and it is convenient for manual visual inspection of images. In addition, the light taken by the image capturing component 12 1380009 is not only transmitted by the object 14 but also reflected light. For example, in FIG. 1, a second light source 192 is disposed on the same side of the object to be imaged as the image capturing element 12, so that the light projected by the second light source 92 can pass through the object to be tested. After reflection, it is received by the image capturing component 12. The first light source 191 and the second light source 192 can be independently configured for different detection purposes, or can be configured at the same time. Similarly, depending on the purpose of the test or the type of the object to be tested, the light source may be placed on any side of the object to be tested, and the image picking element 12 receives the deflected light or reflected light of the object to be tested. The light sources in the various locations described above can be independently configured or configured at the same time. Similarly, the image-like component 12 and the mask component 16 can also be configured in multiple pieces for different detection purposes. The above-mentioned test object 14 may be a color filter, a light sheet, a thin film solar panel, a TFT-LCD, an STN-LCD, an LTPS-LCD, an OLED, a PLED, a PDP, an SED, a Flexible Display, and an E-paper, and the optical The detection of the target of the test can detect various kinds of ship images of the above various objects to be tested, such as φ Bureau. ^The structure of the surface is uneven and the structure of the line is uneven. However, those skilled in the art can easily push this invention concept into other optical detection fields, which is not the above. Listed by the enumerator. In addition, the above-mentioned carrier element 15 can be a mobile platform and/or a supporting flat platform, and the carrier element can be a vertical and horizontal moving platform, a belt platform, a roller platform, an air floating platform. The transparent glass stage, the transport device for the upper and lower surfaces is 2, or a combination thereof, but is not limited by the above. Please refer to FIG. 3, which is a second embodiment of the optical detecting device of the present invention. FIG. 3 is an optical detecting and injuring 3 includes a first light source <S) 15 1380009

• * i I 391、一反射元件38、一承載元件35、一 暉列接收感應元… 以及一影像擷取元件32。為達光學檢測之目的,一濾光片34 作為一待測物被置放於承載元件35上,第一光源391投射一 光線至遽光片34並穿透慮光片34,該穿透濾光片之光線經由 反射元件38反射後為該陣列接收感應元件37及/或影像擷取 元件32所接收,並產生一影像,再經由分析該影像來取得滤 10 15 光片34的相關材質或表面特徵,例如彩色渡光片之顏色不均 (MURA)現象。 ,其中,該第一光源391所投射者為包含波長偏至693奈 米間之任-波長區段的光波,辦列接㈣應元件P可為包 括感光搞合元件之-維或二維以上之陣列接收感應器,而接收 各種可見光及/或不可見光之波長光源,亦可完整的接收滤光 片34於各種波長入射光下所呈現之影像,且亦可同時配置多 ί的陣列搬感應器,例如藍㈣光片湖-維陣列接收感應 盗,而綠色與紅色滤如採用二轉列接收感應器。 而依不測目的之需要,該影像摘取元件%所操取之 ^34之透射光,亦可為反射光。例如, ’將一第二光源392配置在該濾、光片與該影像祿取 ^^2相同的-側’使第二光源392所投射出的光線,可經 二元件32所接收。依不同檢 同時的配置。^原391與第二光源392可獨立的配置,亦可 不同遽’對於—縣片之顏色不均檢測, - <色不均切射研波長光源下,生不同的 20 二二右該濾光片34為一藍色濾光片時’採用波長670〜693 二二二!先Γ穿透光的方式照射,其檢測效果最佳;若為 伽波長460〜493奈米之人射光,以反 採用,其檢測效果最佳;若為一綠色據光片時,則 ⑻奈米之人射光’以反射光的方式照射,其 f參《 4圖,其為本發明之光學檢測設備之第三實施例 H圖’在第4圖中,—光學檢測設備4包括—第一光源 、m皮元件⑶、-反射元件48、—承载元件45、 ,列接收感應兀47以及一影像擷取元件42。其中,該第一 = 491所投射出的光線為全波段的光線,而第一光驗元件 3可將絲9中波長至柳奈細外的光波加以滤除, 使照射在一待測遽光片44的入射光波長為46〇至柳夺米之 間的光波區段,經由調整反射元件48之角度,使—維以上 之陣細域應n單47及/或影像娜元件42可接收該光線 以產生-雜。錢再㈣分_影像來取㈣的相 關材質或表面特徵,例如彩色濾光片之顏色不均(MURA)現 象。 而依不同檢測目的之需要,該影像掏取元件42所娜之 光線並非侃蝴44之透縣,亦可狀贼。例如, 在第4圖中’另將-第二光源492及一第二光遽波元件极配 置在該滤光片與該影像掏取元件42相同的—側使第二光源 492與第二光滤波元件432所投射出的特定波段光線,可經該 濾光片44反射後,而為該影像擷取元件42所接收。依不同檢 17 測目的,該第一光源491與第二光源492可獨立的配置,亦可 同時的配置。 請參閱第5圖,其為本發明之光學檢測設備之第四實施例 的示意圖,在第5圖中,一光學檢測設備5包括一第一光源 591、一光濾波元件53、一反射元件58、一承載元件55、一 陣列接收感應元57以及一影像擷取元件52。其中,該第一光 源591所投射出的光線為400奈米以上的光波,其直接照射在 濾光片54上並穿透之,經一反射元件58之角度後,再以該光 遽波元件53將其中波長460至693奈米以外的光波加以濾 除’再由陣列接收感應器元件57及/或影像擷取元件52接收 該經濾波之光線以產生一影像。 而依不同檢測目的之需要,該影像擷取元件52所擷取之 光線並非僅止於該濾光片54之透射光,亦可為反射光。例如, 在第5圖中’將一第二光源592配置在該濾光片與該影像擷取 疋件52相同的一側’使第二光源392所投射出的光線,可經 該濾光片反射後,而為該影像擷取元件52所接收。依不同檢 測目的,該第-光源591與第二光源592可獨立的配置,亦可 同時的配置。 本發明光學檢測設備與方法之第五實施例,可配合第1圖 所表不的絲檢麟備配置示意贿元件符號,分別將其檢 測之取樣步驟詳述如下: 如墙步驟·錢將—光線以多角度投射至—待測物14,例 〜光片或—玻解,該光線經由透射的方式經過該待測物; 步驟二··調整—反射元件18以反射該光線,藉由一遮罩 兀件16的阻隔篩選,一影像擷取元件12可以取得該光線以一 第一穿透角度(以下稱第一視角) 穿透該待測物14之一第_ 區所形成之一第一條狀影像; 步驟三:旋轉該反射元件18 —第一旋轉角度,同樣藉由 =遮罩元件16的阻隔篩選,此時影像擷取元件12可以取得該 光線以一第二穿透角度(以下稱第二視角)穿透該待測物14 之該第-_卿成之—第二條狀影像; 步驟四·該待測物往前移動一固定距離; 10 —步驟五:旋轉該反射树18 —第二旋則度藉由一遮 罩το件16的阻隔筛選,此時影像操取元件12可以取得該光線 以該第-視角穿透該待測物14較後面之第二區的所之一 第三條狀影像; 像驟=i贿再旋轉該反射元件18—第—旋轉角度,影 15 14之^「則可以取得該光線以H㈣透該待測物 14之該第二區的所形成之—第四條狀影像; 20 一,時第-條狀影像與第三條狀影像皆是該待測物14 視^生之投射影像’只是分職賴待測物上的 &,因此結合第-條狀影像與第三條狀影像,即可 1第-視角下較完整的影像。同理,結合第 像盘第• * i I 391, a reflective element 38, a carrier element 35, a receive train receiving element... and an image capture element 32. For the purpose of optical detection, a filter 34 is placed as a test object on the carrier member 35, and the first light source 391 projects a light to the light guide 34 and penetrates the light guide 34. The light of the light sheet is reflected by the reflective element 38 and received by the array receiving sensing element 37 and/or the image capturing element 32, and an image is generated, and then the image is analyzed to obtain the related material of the filter 10 15 or Surface features, such as the color unevenness (MURA) phenomenon of color crossings. Wherein, the first light source 391 is projected to include a light wave having a wavelength-to-693 nm-to-wavelength section, and the (4) component P may be a dimensional or two-dimensional or more comprising a photosensitive element. The array receives the sensor and receives various wavelengths of visible light and/or invisible light, and can also completely receive the image of the filter 34 under the incident light of various wavelengths, and can also configure multiple arrays to move the sensor. For example, the blue (four) light film lake-dimensional array receives the sensor steal, while the green and red filters use the two-column receive sensor. For the purpose of the undesired purpose, the transmitted light of ^34 taken by the image picking component % may also be reflected light. For example, the light source projected by the second light source 392 can be received by the second element 32 by arranging a second light source 392 on the same side of the filter and light sheet as the image. According to different configurations at the same time. ^The original 391 and the second light source 392 can be configured independently, or differently, for the color unevenness detection of the - county film, - < color unevenness under the wavelength light source, the different 20 22 right filter When the light sheet 34 is a blue filter, the wavelength of 670~693 is used to illuminate the light, and the detection effect is best. If the light is 460 to 493 nm, the light is emitted. Inversely, the detection effect is the best; if it is a green light film, then (8) the person of the nanometer emits light by means of reflected light, and the f is "4", which is the first optical inspection device of the present invention. Third Embodiment H FIG. 4 In FIG. 4, the optical detecting apparatus 4 includes a first light source, an m-shell element (3), a reflective element 48, a carrier element 45, a column receiving sensor 47, and an image capturing element. 42. Wherein, the light projected by the first=491 is a full-band light, and the first photo-detecting element 3 can filter the light wave of the wavelength of the wire 9 to the outside of the Liunai, so that the light to be measured is illuminated. The wavelength of the incident light of the slice 44 is from 46 〇 to the optical wave section between the squall and the rice. By adjusting the angle of the reflective element 48, the fine-field of the above-mentioned dimension is required to be n 47 and/or the image element 42 can receive the light. Light to produce - miscellaneous. Money (4) is divided into _ images to take the relevant materials or surface features of (4), such as the color unevenness (MURA) of the color filter. According to the needs of different detection purposes, the light of the image capturing component 42 is not the passer-by of the butterfly 44, but also the thief. For example, in FIG. 4, 'the second light source 492 and the second light chopping element are disposed on the same side of the filter as the image capturing element 42 to make the second light source 492 and the second light The specific band of light projected by the filter element 432 can be reflected by the filter 44 and received by the image capturing element 42. According to the different test, the first light source 491 and the second light source 492 can be independently configured or configured at the same time. Please refer to FIG. 5, which is a schematic diagram of a fourth embodiment of the optical detecting device of the present invention. In FIG. 5, an optical detecting device 5 includes a first light source 591, an optical filter component 53, and a reflective component 58. A carrier component 55, an array receiving sensing element 57 and an image capturing component 52. Wherein, the light projected by the first light source 591 is a light wave of 400 nm or more, which is directly irradiated on the filter 54 and penetrates through the angle of a reflective element 58, and then the optical chopper component 53 filters out light waves having wavelengths other than 460 to 693 nm. The arrayed sensor element 57 and/or image capturing element 52 receives the filtered light to produce an image. For the purpose of different detection purposes, the light captured by the image capturing component 52 is not limited to the transmitted light of the filter 54, but may also be reflected light. For example, in FIG. 5, 'a second light source 592 is disposed on the same side of the filter as the image capturing element 52', and the light projected by the second light source 392 can pass through the filter. After reflection, it is received by the image capturing component 52. The first light source 591 and the second light source 592 can be independently configured for different detection purposes, or can be configured at the same time. The fifth embodiment of the optical detecting apparatus and method of the present invention can be used in conjunction with the configuration of the wire inspection device shown in FIG. 1 to indicate the symbol of the bribe component, and the sampling steps of the detection are detailed as follows: The light is projected at multiple angles to the object to be tested 14, for example, a light sheet or a glass solution, and the light passes through the object to be tested through transmission; Step 2: Adjusting the reflection element 18 to reflect the light by a The screening element of the mask element 16 can obtain a light penetration element 12 that penetrates the first region of the object to be tested 14 by a first penetration angle (hereinafter referred to as a first angle of view). a strip image; Step 3: Rotating the reflective element 18 - the first angle of rotation is also screened by the mask of the mask element 16, at which point the image capturing element 12 can take the light at a second angle of penetration ( The second view is hereinafter referred to as the first image of the object to be tested 14 and the second strip image; step 4: the object to be tested moves forward by a fixed distance; 10 - step 5: rotate the reflection Tree 18 - second rotation degree by a mask το 16 Blocking the screening, at this time, the image manipulation component 12 can obtain the third strip image of the second region of the object to be tested 14 through the first angle of view; The reflective element 18 - the first rotation angle, the shadow 15 14 "" can obtain the light to H (four) through the second region of the object 14 to be formed - the fourth image; 20 - the strip image and the third strip image are both the image of the object to be tested 14 and the projection image of the object to be tested is only associated with the object on the object to be tested, thus combining the first strip image with the third strip image. It can be a complete image at 1st-view angle. Similarly, combined with the first image.

因此,重難驟三m卩可分觀得_撕在H 嶋,科的峨 在上述的過程中,為了不同的檢測目的,該光線亦可以一 19 c S ) ΐ3«υυυν 的方式經過該待測物’而為影像擷取元件12所取 之投射影^待測物於光線在不同反射角度或不同折射角度下 元件18則可為—多反射面或單—反射面的元 該第1旋轉角^^反射面元件’例如為—六面稜鏡時, 又為該/、面稜鏡的六分之一圓周角,即為60 f8=_:轉角度贿f小霞第二_減。當反射元件 有兩一種早^反t面元件’例如一面鏡子時,該第二旋轉角度則 10 15 20 ==即為旋轉一周360度,第二種則是反方向 _等冋於第-旋轉角的角度。 "月 > 考第6圖’其為本發明光學檢測設備與方法六 此—實旋例係以—濾、光片基板作為—待測物以檢 it 基板被置放於一持續移動的承載台上, 田土入步驟61 ),即基板進入檢測區時,即啟動一影像 取樣作業(步驟62),該影像取樣作業之步驟即如上六與 施例所詳述者,接著根據所取得㈣像進行― ^Therefore, the difficulty of the three m卩 can be divided into _ tearing in H 嶋, the 峨 in the above process, for different detection purposes, the light can also pass a 19 c S ) ΐ 3 « υυυ ν The object is measured by the image capturing component 12, and the component 18 can be a multi-reflecting surface or a single-reflecting surface element. The first rotation is performed at different reflection angles or different refraction angles. When the angle ^^ reflecting surface element 'for example is six-sided 稜鏡, it is the one-sixth circumferential angle of the /, face ,, that is, 60 f8 = _: turn angle bribe f Xiaoxia second _ minus. When the reflective element has two kinds of early and reverse t-plane elements, such as a mirror, the second rotation angle is 10 15 20 == is 360 degrees of rotation, and the second is reverse direction _ is equal to the first rotation The angle of the corner. "月> Test Figure 6' is the optical detection device and method of the present invention. The actual rotation method is to filter the optical substrate as the object to be tested to check that the substrate is placed in a continuous movement. On the carrying platform, the soil enters step 61), that is, when the substrate enters the detection area, an image sampling operation is started (step 62), and the steps of the image sampling operation are as described in the above six and the example, and then obtained according to the (4) Like doing - ^

f63),朗斷該基板上是否有—色不均㈣狀H =⑷,當觸基板上有—色不均瑕糾,_斷該色不 均瑕痖所發生的製程階段(步驟⑹、幾何特徵,與職類型, 之後再將猶、判_與結果皆存人資料庫(步驟⑹, 史鱗_斷色不均瑕__與發生機 縱上所述,本發明提供之光學檢測設備及方法,尤適合於 基板顏色不均之_,其她於習知技術具有如下優點: 20 (S ) 1380009 • φ · 1.承載裝置包含移動平台與支撑平台,以不停止方式運 送,可避免因檢測降低生產速度,並此檢測裝置利用本特1可 直接架設於現有輪送設備上,進行基板的全面檢測,同時亦可 運用運動月b里技術,用以提高基板瑕範檢測的精度和效兴。 5 2·搭配反射元件角度的調整,可取得不同視角的投射影 像,尤可有效突顯基板瑕疵與顏色不均的情形,且瑕疲的幾何 資訊將可透過景》像而量化為一判定的指標,配合影像處理元 件,即可快速的進行判識作業。 ’ 3.可將瑕疵之特徵資料建立瑕疵之製程資料庫,對於製 10 程資料之收集與製程之改良皆具極高的參考價值。 換έ之,本發明揭露了一精度、可靠度與穩定性俱佳的 光檢測設備與方法,亦適合於基板之瑕疵檢測,並可依瑕疵檢 測的結果來進行分析,之後及時回饋製程設備,因而可確保產 品之品質控管無疏漏之虞,無論就精簡的生產流程所可能減少 15 _備投=#與生產線空_耗費,或者_實練_測與分 _ 類成效而使產品品質穩定與良率提昇,其所帶來的製程品質提 昇與成本降低等實際經濟效益,皆證實本發雜在顯著的進步 性與產業利用性。 雖然本發明已以數個較佳實施例揭露如上,然其並非用 20 $限定本發日月,任何熟習此技藝者’在不脫離本發明之精神和 犯圍内,當可作些許之更動與潤飾,因此本發明之保護範圍當 視後附之申請專利範圍所界定者為準。 &lt; S ) 21 1380009 【圖式簡單說明】 本發明第一實施例的配置示意圖; 5 本發明第-實施例之多角度光學人射與取樣 本發明第二實施例的配置示意圖; ’ 本發明第三實施例的配置示意圖; 本發明第四實施例的配置示意圖; 本發明第六實施例流程圖。 10 【主要元件符號說明】 卜3、4、5 :光學檢測設備 12、32、42、52 :影像擷取元件 U、53 :光濾波元件 431 :第-光滤波元件 432 :第二光據波元件F63), whether there is a color unevenness (four) shape H = (4) on the substrate, when there is a color unevenness on the touch substrate, _ break the process stage where the color unevenness occurs (step (6), geometry The characteristics, the type of job, and then the essay, the judgment _ and the result are stored in the database (step (6), the history scale _ color unevenness __ and the occurrence of the machine, the optical detection device provided by the present invention The method is particularly suitable for the uneven color of the substrate, and the prior art has the following advantages: 20 (S ) 1380009 • φ · 1. The carrying device comprises a mobile platform and a supporting platform, and can be transported in a non-stop manner, thereby avoiding the cause The detection reduces the production speed, and the detection device can be directly erected on the existing wheeling equipment by using the special device, and the whole substrate can be detected comprehensively, and the technology of the motion month b can also be used to improve the accuracy and effectiveness of the substrate detection. Xing. 5 2· With the adjustment of the angle of the reflective element, the projected image can be obtained from different viewing angles, especially highlighting the situation of unevenness of the substrate and color, and the geometric information of the fatigue can be quantified as a determination through the image of the scene. Indicator The image processing component can quickly perform the identification operation. ' 3. The process data database can be built into the process data database, which has a high reference value for the collection and process improvement of the system. The invention discloses a light detecting device and method with excellent precision, reliability and stability, and is also suitable for detecting defects of a substrate, and can perform analysis according to the result of the detection, and then feedback the processing device in time, thereby Ensure that the quality control of the product is not overlooked, no matter the streamlined production process may reduce 15 _ spare investment = # and production line _ consumption, or _ practice _ measurement and points _ effect to make product quality stability and yield Improvements, the actual economic benefits such as process quality improvement and cost reduction, have confirmed that the present invention is significantly improved in progress and industrial utilization. Although the present invention has been disclosed above in several preferred embodiments, it is not By using 20 $ to limit the date of the present invention, any skilled person will be able to make some changes and refinements without departing from the spirit and scope of the present invention, and thus the present invention The scope of protection is subject to the definition of the patent application scope. <S) 21 1380009 BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic view of a configuration of a first embodiment of the present invention; A schematic diagram of the configuration of the second embodiment of the present invention; a schematic diagram of the configuration of the third embodiment of the present invention; a schematic configuration of the fourth embodiment of the present invention; and a flowchart of the sixth embodiment of the present invention. Bu 3, 4, 5: optical detecting device 12, 32, 42, 52: image capturing element U, 53: optical filter element 431: first optical filter element 432: second optical data element

第一圖 第二圖 第三圖 第四圖 第五圖 第六圖 14、 34、44、54 :待測物 15、 35、45、55 :承載元件 17、37、47、57 :陣列接收感應元件 191、 391、491、591 :第一光源 192、 392、492、592 ·•第二光源 101、102、103、104 :光線 a 卜 a2、a3、bl、b2、b3、d、c2、c3 :條狀影像 a8、b8、c8 :待測物之投射影像 a9、b9、c9 :不連續區塊First picture second picture third figure fourth figure fifth figure sixth figure 14, 34, 44, 54: object to be tested 15, 35, 45, 55: carrier elements 17, 37, 47, 57: array receiving induction Element 191, 391, 491, 591: first light source 192, 392, 492, 592 · second light source 101, 102, 103, 104: light a b a2, a3, bl, b2, b3, d, c2, c3 : strip image a8, b8, c8: projected image of the object to be tested a9, b9, c9: discontinuous block

22 1380009 • φ » 61 :基版載入 62 :影像取樣作業 63 :影像判識作業 64 :判斷是否存在一瑕疵 65 :分析該瑕疵之特徵 66 .存入貧料庫 67 :統計瑕疵類型與機率22 1380009 • φ » 61 : Basic loading 62 : Image sampling operation 63 : Image recognition operation 64 : Judging whether there is a 瑕疵 65 : Analyzing the characteristics of the 66 66 . Depositing in the poor library 67 : Statistics 瑕疵 type and probability

23twenty three

Claims (1)

1380009 十、申請專利範圍: 1. 一種光學檢測設備,包括: 一光源,其可將一光線投射至一待測物; 一反射元件,該反射元件具備至少二個反射面,用以反射 5 經過該待測物之該光線;以及 一影像擷取元件,用以接收經反射之該光線所形成之一投 射影像。 • 2.如申請專利範圍第1項之光學檢測設備,其中該反射元件為一 多面稜鏡。 10 3·如申請專利範圍第1項之光學檢測設備’其中該反射元件可被 旋轉以反射不同入射角度之光線至該影像擷取元件,該入射角度 之範圍為0度至180度之間’但不包括〇度與18〇度。 4.如申請專利範圍第1項之光學檢測設備,其中該光線經過該待 測物方式為透射、折射、反射以上其一或其組合。 ^15 5·如申請專利範圍第1項之光學檢測設備,其更包括: 光渡波元件,用以取得特定波長範圍之入射光線; —承載元件’用以承載該待測物; 一遮罩元件,用以接收與該影像擷取元件呈一特定角度之 投射影像’而濾除其它角度之投射影像;以及 2〇 分析單元,用以分析該影像擷取元件所擷取之該投射影 像’以取得包括該待測物的瑕疵資訊。 6.如申請專利範圍帛5項之光學檢測設備,其中該 90 度。 7 &lt; S ) 24 1380009 * · / « 7. 如申請專利範圍第1項之光學檢測設備,其中該光源為一多角 入射光源,用以產生多角度入射該待測物之該光線。 8. 如申請專利範圍第1項之光學檢測設備,其中該待測物可為彩 色濾光片、薄膜太陽能板、TFT-LCD、STN-LCD、LTPS-LCD、 5 OLED、PLED、PDP、SED、Flexible Display 及 E-paper; 而該光線之波長範圍為300至1300奈米之間。 9. 如申請專利範圍第8項之光學檢測設備,其中:當該待測物為 .一藍色濾光片時,該光線採取之波長為670〜693奈米;該待測 物為一紅色濾光片時,該光線採取的波長為460〜493奈米;該 10 待測物為一綠色濾光片時’該光線採取的波長為580〜600奈米, 該影像擷取元件更包括一分析單元,用以分析彩色濾光片之顏色 不均資訊。 10. —種光學檢測設備,用以檢測一濾光片之顏色不均資訊,其 包括: 15 一光源,其可將一光線投射至該濾光片;以及 &gt; 一影像擷取元件,用以接收經過該濾光片之該光線並依該 光線之一波長區段以產生一影像,其中:當該濾光片為一藍色濾 光片時,該波長區段為波長670〜693奈米;該濾光片為一紅色 濾光片時,該波長區段為波長460〜493奈米;該濾光片為一綠 2〇 色濾光片時’該波長區段為波長580〜600奈米。 11. 如申請專利範圍第1〇項之光學檢測設備,其中該光線經過該 遽光片為透射、折射、反射以上其一或其組合。 12. 如申請專利範圍第1〇項之光學檢測設備,其中該光源為一多 &lt; S ) 25 之該光線,該光學檢1380009 X. Patent application scope: 1. An optical detecting device comprising: a light source for projecting a light to a test object; a reflective element having at least two reflective surfaces for reflecting 5 passes The light of the object to be tested; and an image capturing component for receiving a projected image formed by the reflected light. 2. The optical inspection apparatus of claim 1, wherein the reflective element is a multi-faceted crucible. 10 3. The optical detecting device of claim 1, wherein the reflective element is rotatable to reflect light of different incident angles to the image capturing element, and the incident angle ranges from 0 to 180 degrees. But does not include the twist and 18 degrees. 4. The optical detecting device of claim 1, wherein the light passes through the object to be measured by transmission, refraction, reflection, or a combination thereof. [15] The optical detecting device of claim 1, further comprising: an optical wave wave component for obtaining incident light of a specific wavelength range; a carrier member for carrying the object to be tested; a mask component a projection image for receiving a specific angle with the image capturing component to filter out other angles of the projected image; and a second analysis unit for analyzing the projected image captured by the image capturing component Obtain the information including the object to be tested. 6. For example, the optical inspection device of claim 5, wherein the 90 degree. 7. The optical detecting device of claim 1, wherein the light source is a multi-angle incident light source for generating the light incident on the object to be tested at multiple angles. 8. The optical detecting device of claim 1, wherein the object to be tested is a color filter, a thin film solar panel, a TFT-LCD, an STN-LCD, an LTPS-LCD, a 5 OLED, a PLED, a PDP, and a SED. , Flexible Display and E-paper; and the wavelength of the light range is between 300 and 1300 nm. 9. The optical detecting device of claim 8 wherein: when the object to be tested is a blue filter, the light is taken at a wavelength of 670 to 693 nm; the object to be tested is a red color. When the filter is used, the wavelength of the light is 460 to 493 nm; when the 10 object to be tested is a green filter, the wavelength of the light is 580 to 600 nm, and the image capturing component further includes a An analysis unit for analyzing color unevenness information of the color filter. 10. An optical detecting device for detecting color unevenness information of a filter, comprising: a light source that projects a light onto the filter; and > an image capturing component, Receiving the light passing through the filter and generating an image according to a wavelength segment of the light, wherein: when the filter is a blue filter, the wavelength segment is a wavelength of 670~693 When the filter is a red filter, the wavelength segment is a wavelength of 460 to 493 nm; when the filter is a green 2 color filter, the wavelength segment is a wavelength of 580 to 600. Nano. 11. The optical inspection apparatus of claim 1, wherein the light passes through the calender sheet for transmission, refraction, reflection, or a combination thereof. 12. The optical inspection device of claim 1, wherein the light source is a plurality of &lt;S) 25 of the light, the optical inspection 角入射光源,用以產生多角度入射該待測物 測設備更包括: -光献元件取得該光線之敎波長區段; 一反射元件,該反射耕具備至少二個反射面,用以反射 、、^•過該渡光片之該光線; 一承載元件,用以承載該濾光片; —-遮罩7L件,帛以轉與該光軸該縣擷取元件呈—特 疋角度之部分,而濾、除其它角度之部分; 一分析單元,用以分析該影像擷取元件所擷取之該影像, 以取得包括該濾光片的顏色不均之瑕疵資訊; 一顯示單元,用以顯示該影像;以及 一儲存單元,用以儲存影像與該分析結果。 13. 如申請專利範圍第12項之光學檢測設備,其中該反射元件為 一多面稜鏡’且旋轉該反射元件以反射不同入射角度之該光線至 該影像揭取元件。 14. 如申請專利範圍第12項之光學檢測設備,其中該特定角度為 90度。 15, 如申請專利範圍第1〇項之光學檢測設備,當該濾光片為一藍 色渡光片時’該影像係由該光線經該藍色濾光片透射後產生;當 20該遽光片為一紅色濾光片時,該影像係由該光線經該紅色濾光片 反射後產生;該濾光片為一綠色濾光片時’該影像則係由該光線 經該該綠色濾光片反射後產生。 16. —種光學檢測方法,包括以下步驟: 26 1380009An angle incident light source for generating a multi-angle incident object to be tested further comprises: - a light-emitting element obtaining a wavelength band of the light; a reflective element having at least two reflective surfaces for reflecting, Passing the light of the light-passing sheet; a load-bearing member for carrying the filter; - a cover for the 7-L member, and rotating the optical axis with the optical pickup portion of the county--the angle portion Filtering, in addition to other angles; an analyzing unit for analyzing the image captured by the image capturing component to obtain information including color unevenness of the filter; a display unit for Displaying the image; and a storage unit for storing the image and the analysis result. 13. The optical inspection apparatus of claim 12, wherein the reflective element is a multi-faceted 稜鏡 and the reflective element is rotated to reflect the light at different angles of incidence to the image-receiving element. 14. The optical inspection apparatus of claim 12, wherein the specific angle is 90 degrees. 15. The optical detecting device of claim 1, wherein when the filter is a blue light beam, the image is generated by transmitting the light through the blue filter; When the light sheet is a red color filter, the image is generated by the light being reflected by the red color filter; when the light filter is a green color filter, the image is filtered by the green light through the green filter. Produced after the light sheet is reflected. 16. An optical detection method comprising the following steps: 26 1380009 (A)投射一光線至一待測物; ⑻以-纽射面元件反射經制物之該練 一投射影像;以及 付 (C)分析該投射影像。 17.如申請專利範圍第16項之光學檢測方法,其中步驟⑻包 括. 以該多反射面元件之H射面反賴光線,以取得以 一第一角度經過該待測物之—第—部分的該光線所形成之 10 以 15(A) projecting a light to an object to be tested; (8) reflecting the projected image of the processed object with the -napping element; and (C) analyzing the projected image. 17. The optical detection method of claim 16, wherein the step (8) comprises: displacing the light with the H-plane of the multi-reflecting surface element to obtain a portion-passing portion of the object to be tested at a first angle The light formed by the 10 to 15 第一旋轉角旋轉該多反射面元件,以該第一反射面反 射該光線,棘得m角度經過該第—部分之絲線所 之一第二投射影像; 移動該待測物一固定距離; 以大於該第-旋轉角之—第二旋轉角旋轉該多反射面元 件,以該多反射面元件之-第二反射面反射該級,以取得㈣ 第一角度經過該待測物之-第二部分的該統所形成之一第三 投射影像;以及 20 結合該第一投射影像與該第三投射影像。 ,如申請專利範圍第16項之光學檢測方法,其中該光線係以該 、、折射、反射以上其-或其組合之方式經過該待測物。 19.如申請專利麵第18項之鮮檢測方法,其帽制物為一 遽先片,且該光線之波長範圍為460至693奈米之間,童中·合 該濾光片為-藍色滤光片時,該光線採取之波長為㈣〜柳二 27 1380009 • 4 f * * 米,且該投射影像為該光線透射該藍色滤光片而產生;當該據光 片為一紅色濾光片時,該光線採取之波長為46〇〜493奈米且 該投射影像為該親透射該紅找以而產生;#猶光片為一 綠色遽光片時’該光線採取之波長為58〇〜㈣奈米’且該投射 5影像為該光線反射該綠色遽光片而產生。 20.如申請專利範圍第16項之光學檢測方法,其步驟(c)包括: 判斷該待測物是否具有一瑕疲; .判斷該瑕疵所發生的製程階段特徵; 判斷該瑕疵的幾何特徵與發生機率特徵;以及 10 儲存該瑕疵的特徵。 21. —種光學檢測方法,包括以下步驟: (A)投射一光線至一濾光片;Rotating the multi-reflecting surface element with the first rotation angle, reflecting the light with the first reflecting surface, and obtaining a second projected image of the wire passing through the first portion of the first portion; moving the object to be tested by a fixed distance; Rotating the multi-reflecting surface element with the second rotation angle greater than the first rotation angle, and reflecting the stage with the second reflecting surface of the multi-reflecting surface element to obtain (4) the first angle passing through the object to be tested - the second A portion of the system forms a third projected image; and 20 combines the first projected image with the third projected image. The optical detecting method of claim 16, wherein the light passes through the object to be tested in the form of, the, the refraction, the reflection, or the like. 19. The fresh detection method according to Item 18 of the patent application, wherein the cap is a first piece, and the wavelength of the light is in the range of 460 to 693 nm, and the filter is blue in the child. When the color filter is used, the wavelength of the light is (4) ~ Liu 2 27 1380009 • 4 f * * m, and the projected image is generated by transmitting the light to the blue filter; when the light film is a red When the filter is used, the light is taken at a wavelength of 46 〇 to 493 nm and the projected image is generated by the pro-transmission of the red; when the guillotine is a green enamel sheet, the wavelength of the ray is 58〇~(d) nanometer' and the projected 5 image is generated by the light reflecting the green fluorescent sheet. 20. The optical detection method of claim 16, wherein the step (c) comprises: determining whether the object to be tested has a fatigue; determining a process stage characteristic of the flaw; determining a geometric characteristic of the flaw A probability feature occurs; and 10 stores the characteristics of the defect. 21. An optical detection method comprising the steps of: (A) projecting a light to a filter; (B)根據該濾光片的類型取得該光線之—指定波段,其中: ㈣〜柳光M —藍色觀片時,該指纽段為波長 該指定波段為波長 當該濾光片為一紅色濾光片時, 460〜493奈米;以及 ’該指定波段為波長 定波段所形成之一投 當該濾光片為一綠色濾光片時 580〜600奈米; (C)掏取光片之縣線的該指 射影像;以及 (D)分析該投射影像。 學檢測方法,其中該光線係以該 22.如申請專利範圍第21項之光 28 C S ) 20 丄 • J · * · 透射、折射、反射社其-或其組合之方式經過該滤光片。 扛如申請專利範圍第21項之光學檢測方法其中步驟(c)包 括. 以-反射元件反射經過該濾光片之該光線;以及 5 旋轉該反射元件以取得不同角度經過該該絲片之該光線 所形成之該投射影像。 24. —種光學檢測方法,包括以下步驟: Φ (A)投射一光線至一待測物; (B) 以-反射猶反射該光線,以取得以一第—角度經過該 1〇待測物之-第-部分的該光線所形成之一第一投射影像; (C) 以-第-旋轉舰轉該反射元件後,反射該光線以取得 以-第二角度經過該第-部分之該錢所形成之—第二投射影 - 像; 〜 (D)移動該待測物一固定距離;以及 15 (E)以一第二旋轉角旋轉該反射元件後,反射該光線以取得 Φ 以該第-角度經過該制物之一第二部分的該光線所形成之一 第三投射影像。 25. 如申請專利範圍第24項之光學檢測方法,更包括: (F)結合該第一投射影像與該第三投射影像。 20 26.如申請專利範圍第24項之光學檢測方法,其中該光線係以該 透射、折射、反射以上其一或其組合之方式經過該待測物。 27.如申請專利範圍第24項之光學檢測方法,其中該第二旋#胃 大於該第一旋轉角。 29 1380009 28.如申請專利範圍第24項之光學檢測方法,其中該第二旋轉角 等於該第一旋轉角但方向相反。(B) Obtaining the specified band of the light according to the type of the filter, wherein: (4) ~ Liu Guang M - when the blue film is viewed, the finger segment is the wavelength of the specified band as the wavelength when the filter is one When the red filter is 460~493 nm; and 'the specified band is formed by one of the wavelength bands, when the filter is a green filter, 580~600 nm; (C) Draw light The pointing image of the film county line; and (D) analyzing the projected image. The method of detecting, wherein the light passes through the filter in the manner of the light, the light transmission, the refraction, the reflection, or a combination thereof. For example, in the optical detection method of claim 21, wherein the step (c) comprises: reflecting the light passing through the filter by the reflective element; and 5 rotating the reflective element to obtain a different angle through the wire. The projected image formed by the light. 24. An optical detection method comprising the steps of: Φ (A) projecting a light to a test object; (B) reflecting the light with a reflection to obtain a first angle through the first object to be tested a first projected image formed by the light of the first portion; (C) after the reflective element is rotated by the -first rotating ship, the light is reflected to obtain the money passing through the first portion at a second angle Forming a second projection image-image; ~ (D) moving the object to be tested by a fixed distance; and 15 (E) rotating the reflection element at a second rotation angle, reflecting the light to obtain Φ - a third projected image formed by the light passing through the second portion of one of the articles. 25. The optical detection method of claim 24, further comprising: (F) combining the first projected image with the third projected image. The optical detection method of claim 24, wherein the light passes through the object to be tested in such a manner that one or a combination of the transmission, the refraction, and the reflection. 27. The optical detection method of claim 24, wherein the second rotation # stomach is greater than the first rotation angle. The optical detection method of claim 24, wherein the second rotation angle is equal to the first rotation angle but opposite in direction.
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