[go: up one dir, main page]

TWI373087B - Normal pressure drying device, substrate processing apparatus and substrate processing method - Google Patents

Normal pressure drying device, substrate processing apparatus and substrate processing method

Info

Publication number
TWI373087B
TWI373087B TW097130305A TW97130305A TWI373087B TW I373087 B TWI373087 B TW I373087B TW 097130305 A TW097130305 A TW 097130305A TW 97130305 A TW97130305 A TW 97130305A TW I373087 B TWI373087 B TW I373087B
Authority
TW
Taiwan
Prior art keywords
substrate processing
normal pressure
drying device
pressure drying
processing apparatus
Prior art date
Application number
TW097130305A
Other languages
Chinese (zh)
Other versions
TW200931561A (en
Inventor
Fumihiko Ikeda
Hiroshi Nagata
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200931561A publication Critical patent/TW200931561A/en
Application granted granted Critical
Publication of TWI373087B publication Critical patent/TWI373087B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/67034Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Drying Of Solid Materials (AREA)
  • Materials For Photolithography (AREA)
TW097130305A 2007-09-20 2008-08-08 Normal pressure drying device, substrate processing apparatus and substrate processing method TWI373087B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007243563A JP4384685B2 (en) 2007-09-20 2007-09-20 Normal pressure drying apparatus, substrate processing apparatus, and substrate processing method

Publications (2)

Publication Number Publication Date
TW200931561A TW200931561A (en) 2009-07-16
TWI373087B true TWI373087B (en) 2012-09-21

Family

ID=40611342

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097130305A TWI373087B (en) 2007-09-20 2008-08-08 Normal pressure drying device, substrate processing apparatus and substrate processing method

Country Status (3)

Country Link
JP (1) JP4384685B2 (en)
KR (1) KR20090031271A (en)
TW (1) TWI373087B (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4813583B2 (en) * 2009-07-15 2011-11-09 東京エレクトロン株式会社 Substrate processing equipment
JP4758513B2 (en) * 2009-07-31 2011-08-31 富士フイルム株式会社 Container screening method
JP4805384B2 (en) * 2009-11-12 2011-11-02 東京エレクトロン株式会社 Substrate processing equipment
JP2011124342A (en) * 2009-12-09 2011-06-23 Tokyo Electron Ltd Substrate processing device, substrate processing method, and recording medium recording program for implementing the substrate processing method
JP4967013B2 (en) * 2009-12-11 2012-07-04 東京エレクトロン株式会社 SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND RECORDING MEDIUM RECORDING PROGRAM FOR EXECUTING THE SUBSTRATE PROCESSING METHOD
KR101547458B1 (en) * 2012-12-18 2015-08-26 주식회사 나래나노텍 Improved Heat Treatment Chamber and Method of Substrate, and Heat Treatment Apparatus of Substrate Having the Same
JP7058907B2 (en) * 2017-10-24 2022-04-25 住友重機械工業株式会社 Heat treatment equipment, annealing equipment and heat treatment method
WO2019230462A1 (en) * 2018-05-29 2019-12-05 東京エレクトロン株式会社 Substrate processing method, substrate processing device, and computer-readable recording medium
JP2021536594A (en) * 2018-08-27 2021-12-27 ケーエルエー コーポレイション Vapor as a protective agent in optical systems and life extension devices
US11624904B2 (en) 2019-08-06 2023-04-11 Kla Corporation Vapor as a protectant and lifetime extender in optical systems
CN115479464B (en) * 2021-06-15 2025-08-08 深圳市易天自动化设备股份有限公司 An OLED and substrate post-cleaning air drying device
CN117663721B (en) * 2024-01-31 2024-04-09 河北东海旭日木业有限公司 A multi-layer plate drying machine with turning over, cooling and automatic stacking

Also Published As

Publication number Publication date
JP2009076626A (en) 2009-04-09
JP4384685B2 (en) 2009-12-16
KR20090031271A (en) 2009-03-25
TW200931561A (en) 2009-07-16

Similar Documents

Publication Publication Date Title
TWI373087B (en) Normal pressure drying device, substrate processing apparatus and substrate processing method
EP2195828A4 (en) Exhaust unit, exhaust method using the exhaust unit, and substrate processing apparatus including the exhaust unit
TWI367538B (en) Substrate processing apparatus and substrate processing method
TWI351060B (en) Substrate dryer using supercritical fluid, apparatus including the same, and method for treating substrate
GB2454319C (en) Data processing apparatus and method.
TWI349968B (en) Substrate processing device and substrate processing method thereof
TWI373067B (en) Substrate processing method and substrate processing device
ZA200906966B (en) Method and device for treating liquids, using an electrolytic drying stage
EP2963498B8 (en) Exposure apparatus, exposure method, and device manufacturing method
TWI366869B (en) Substrate treatment method and substrate treatment apparatus
TWI369613B (en) Control device, data processing device and method thereof
EP2458359A4 (en) Semiconductor pressure sensor, pressure sensor device, electronic apparatus, and method for manufacturing semiconductor pressure sensor
IL189372A0 (en) Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
IL194839A0 (en) Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
IL210126A0 (en) Overlay measurement apparatus, lithographic apparatus, and device manufacturing method using such overlay measurement apparatus
IL193061A (en) Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
EP2158564A4 (en) Memory device, electronic device, and host apparatus
IL213627A0 (en) Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
ZA201003523B (en) Data processing device and data processing method
EP2163183A4 (en) Image processing device, image processing program and image processing method
EP1990828A4 (en) Exposure apparatus, exposure method and method for manufacturing device
TWI369329B (en) Substrate transfer apparatus and substrate processing apparatus
EP2195826A4 (en) Substrate processing apparatus
TWI372242B (en) Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
IL189034A0 (en) Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees