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TWI366661B - Web material inspection system for detecting with a web, web material inspection system for detecting defects on a web, and process for inspecting defects with a web - Google Patents

Web material inspection system for detecting with a web, web material inspection system for detecting defects on a web, and process for inspecting defects with a web

Info

Publication number
TWI366661B
TWI366661B TW094126245A TW94126245A TWI366661B TW I366661 B TWI366661 B TW I366661B TW 094126245 A TW094126245 A TW 094126245A TW 94126245 A TW94126245 A TW 94126245A TW I366661 B TWI366661 B TW I366661B
Authority
TW
Taiwan
Prior art keywords
web
inspection system
detecting
material inspection
defects
Prior art date
Application number
TW094126245A
Other languages
English (en)
Other versions
TW200706827A (en
Inventor
Christopher M Kiraly
Original Assignee
Wintriss Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wintriss Engineering Corp filed Critical Wintriss Engineering Corp
Publication of TW200706827A publication Critical patent/TW200706827A/zh
Application granted granted Critical
Publication of TWI366661B publication Critical patent/TWI366661B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW094126245A 2004-01-22 2005-08-02 Web material inspection system for detecting with a web, web material inspection system for detecting defects on a web, and process for inspecting defects with a web TWI366661B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US53837704P 2004-01-22 2004-01-22
US10/543,576 US7382457B2 (en) 2004-01-22 2005-01-21 Illumination system for material inspection
PCT/US2005/002001 WO2005072265A2 (en) 2004-01-22 2005-01-21 Illumination system for material inspection

Publications (2)

Publication Number Publication Date
TW200706827A TW200706827A (en) 2007-02-16
TWI366661B true TWI366661B (en) 2012-06-21

Family

ID=34825976

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094126245A TWI366661B (en) 2004-01-22 2005-08-02 Web material inspection system for detecting with a web, web material inspection system for detecting defects on a web, and process for inspecting defects with a web

Country Status (4)

Country Link
US (1) US7382457B2 (zh)
EP (1) EP1718954A4 (zh)
TW (1) TWI366661B (zh)
WO (1) WO2005072265A2 (zh)

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KR20120040257A (ko) * 2009-07-31 2012-04-26 쌩-고벵 글래스 프랑스 기판의 결함을 검출하고 분류하기 위한 방법 및 시스템
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KR102050365B1 (ko) * 2013-08-23 2020-01-09 삼성디스플레이 주식회사 유기 발광 표시 장치의 불량 검출 방법 및 유기 발광 표시 장치
DE102015119444B4 (de) * 2015-11-11 2018-01-18 Protechna Herbst Gmbh & Co. Kg Vorrichtung und Verfahren zur Überwachung einer laufenden Warenbahn
US11493454B2 (en) * 2015-11-13 2022-11-08 Cognex Corporation System and method for detecting defects on a specular surface with a vision system
JP6568672B2 (ja) * 2015-11-13 2019-08-28 コグネックス・コーポレイション ビジョンシステムで鏡面上の欠陥を検出するためのシステム及び方法
US10388011B2 (en) * 2016-05-17 2019-08-20 Abb Schweiz Ag Real-time, full web image processing method and system for web manufacturing supervision
WO2018045280A1 (en) * 2016-09-01 2018-03-08 3M Innovative Properties Company Machine direction line film inspection
JP6874441B2 (ja) * 2017-03-16 2021-05-19 コニカミノルタ株式会社 欠陥検査方法、欠陥検査プログラム、および欠陥検査装置
CN107014292A (zh) * 2017-03-22 2017-08-04 安徽江南春包装科技有限公司 一种花纸观测用光焦可调的检测平台及其操作方法
US10529082B2 (en) * 2017-06-20 2020-01-07 Mitutoyo Corporation Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method
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TWI662940B (zh) * 2018-06-01 2019-06-21 廣達電腦股份有限公司 影像擷取裝置
JP7028091B2 (ja) * 2018-07-11 2022-03-02 日本製鉄株式会社 表面欠陥検出装置及び表面欠陥検出方法
JP7219034B2 (ja) * 2018-09-14 2023-02-07 株式会社ミツトヨ 三次元形状測定装置及び三次元形状測定方法
JP7035933B2 (ja) * 2018-09-21 2022-03-15 東芝ライテック株式会社 検知装置
JP7604190B2 (ja) * 2020-11-25 2024-12-23 キヤノン株式会社 検査システム、管理装置、検査方法、プログラム、記録媒体および物品の製造方法
CN113686879A (zh) * 2021-09-09 2021-11-23 杭州利珀科技有限公司 光学薄膜缺陷视觉检测系统及方法
JPWO2023047866A1 (zh) * 2021-09-27 2023-03-30
TR2021016610A2 (tr) * 2021-10-25 2021-11-22 Agteks Oerme Ve Teks Enduestrileri San Ve Tic Ltd Sti Kumaş kali̇te kontrol terti̇bati
CN114384081B (zh) * 2021-12-22 2023-07-28 西安工程大学 纺织布匹缺陷检测装置及其检测方法

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Also Published As

Publication number Publication date
US7382457B2 (en) 2008-06-03
WO2005072265A2 (en) 2005-08-11
EP1718954A4 (en) 2010-08-11
US20070008538A1 (en) 2007-01-11
TW200706827A (en) 2007-02-16
WO2005072265A3 (en) 2005-11-24
EP1718954A2 (en) 2006-11-08

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