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TWI349769B - Polari-meter for quantitative stress/strain measurement - Google Patents

Polari-meter for quantitative stress/strain measurement

Info

Publication number
TWI349769B
TWI349769B TW096148224A TW96148224A TWI349769B TW I349769 B TWI349769 B TW I349769B TW 096148224 A TW096148224 A TW 096148224A TW 96148224 A TW96148224 A TW 96148224A TW I349769 B TWI349769 B TW I349769B
Authority
TW
Taiwan
Prior art keywords
polari
meter
strain measurement
quantitative stress
quantitative
Prior art date
Application number
TW096148224A
Other languages
Chinese (zh)
Other versions
TW200928331A (en
Inventor
Jui Chang Lin
Yung Cheng Wang
Hsiang Yu Ho
Original Assignee
Univ Nat Formosa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Nat Formosa filed Critical Univ Nat Formosa
Priority to TW096148224A priority Critical patent/TWI349769B/en
Publication of TW200928331A publication Critical patent/TW200928331A/en
Application granted granted Critical
Publication of TWI349769B publication Critical patent/TWI349769B/en

Links

TW096148224A 2007-12-17 2007-12-17 Polari-meter for quantitative stress/strain measurement TWI349769B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW096148224A TWI349769B (en) 2007-12-17 2007-12-17 Polari-meter for quantitative stress/strain measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW096148224A TWI349769B (en) 2007-12-17 2007-12-17 Polari-meter for quantitative stress/strain measurement

Publications (2)

Publication Number Publication Date
TW200928331A TW200928331A (en) 2009-07-01
TWI349769B true TWI349769B (en) 2011-10-01

Family

ID=44864001

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096148224A TWI349769B (en) 2007-12-17 2007-12-17 Polari-meter for quantitative stress/strain measurement

Country Status (1)

Country Link
TW (1) TWI349769B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103308224A (en) * 2013-05-23 2013-09-18 中国科学院半导体研究所 Semiconductor material micro-area stress test system

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI457550B (en) * 2012-03-16 2014-10-21 Nat Univ Tsing Hua An apparatus for quantifying unknown stress and residual stress of a material and a method thereof
US11408730B2 (en) 2018-11-20 2022-08-09 Industrial Technology Research Institute Stress measuring device and stress measuring method
TWI716183B (en) * 2018-11-20 2021-01-11 財團法人工業技術研究院 Stress measuring device and stress measuring method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103308224A (en) * 2013-05-23 2013-09-18 中国科学院半导体研究所 Semiconductor material micro-area stress test system

Also Published As

Publication number Publication date
TW200928331A (en) 2009-07-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees