TW202041475A - Breaking method and breaking method - Google Patents
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- TW202041475A TW202041475A TW109101195A TW109101195A TW202041475A TW 202041475 A TW202041475 A TW 202041475A TW 109101195 A TW109101195 A TW 109101195A TW 109101195 A TW109101195 A TW 109101195A TW 202041475 A TW202041475 A TW 202041475A
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- 238000000034 method Methods 0.000 title claims abstract description 42
- 239000000758 substrate Substances 0.000 claims abstract description 343
- 239000003566 sealing material Substances 0.000 claims abstract description 40
- 238000003825 pressing Methods 0.000 claims description 16
- 238000000926 separation method Methods 0.000 claims description 11
- 238000012795 verification Methods 0.000 description 59
- 238000011156 evaluation Methods 0.000 description 15
- 238000005336 cracking Methods 0.000 description 10
- 239000000463 material Substances 0.000 description 9
- 230000035515 penetration Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000004973 liquid crystal related substance Substances 0.000 description 5
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 230000035699 permeability Effects 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D1/00—Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor
- B28D1/22—Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising
- B28D1/225—Working stone or stone-like materials, e.g. brick, concrete or glass, not provided for elsewhere; Machines, devices, tools therefor by cutting, e.g. incising for scoring or breaking, e.g. tiles
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/07—Cutting armoured, multi-layered, coated or laminated, glass products
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D7/00—Accessories specially adapted for use with machines or devices of the preceding groups
- B28D7/04—Accessories specially adapted for use with machines or devices of the preceding groups for supporting or holding work or conveying or discharging work
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
- C03B33/023—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
- C03B33/033—Apparatus for opening score lines in glass sheets
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
- C03B33/04—Cutting or splitting in curves, especially for making spectacle lenses
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Abstract
本發明提供一種可沿形成於貼合基板之刻劃線容易且良好地進行分斷之分斷方法、及應用於該分斷方法之裂斷方法。 本發明之分斷方法,係將由第1基板11與第2基板12藉由密封材SL貼合而成之基板10分斷,其包含:於第1基板11之表面11a之與密封材SL相對向之位置形成第1刻劃線L1之步驟;於第2基板12之表面12a之與密封材SL相對向之位置形成第2刻劃線L2之步驟;對包含第1刻劃線L1之區域進行按壓,而使第2垂直裂紋C2沿第2刻劃線L2滲透之步驟;及將由第1刻劃線L1與第2刻劃線L2分隔之基板10之區域沿平行於基板10之方向互相拉離,而沿第1刻劃線L1與第2刻劃線L2將基板10分離之步驟。The present invention provides a breaking method capable of easily and well breaking along a scribe line formed on a bonded substrate, and a breaking method applied to the breaking method. The cutting method of the present invention is to separate the substrate 10 formed by bonding the first substrate 11 and the second substrate 12 with the sealing material SL, and includes: the surface 11a of the first substrate 11 is opposed to the sealing material SL The step of forming the first scribe line L1 toward the position; the step of forming the second scribe line L2 on the surface 12a of the second substrate 12 opposite to the sealing material SL; the area containing the first scribe line L1 Press to make the second vertical crack C2 penetrate along the second scribe line L2; and the area of the substrate 10 separated by the first scribe line L1 and the second scribe line L2 to each other in a direction parallel to the substrate 10 The step of separating the substrate 10 along the first scribe line L1 and the second scribe line L2.
Description
本發明係關於一種形成刻劃線而將貼合基板分斷之分斷方法、及應用於該分斷方法之貼合基板之裂斷方法。The present invention relates to a method for breaking a bonded substrate by forming a scribe line, and a method for breaking the bonded substrate applied to the method.
以往,玻璃基板等脆性材料基板之分斷係藉由於基板之表面形成刻劃線之刻劃步驟、及沿所形成之刻劃線對基板之表面施加既定之力之裂斷步驟而進行。於刻劃步驟中,一邊將刻劃輪壓抵於基板之表面,一邊使其沿既定之線移動。In the past, the breaking of brittle material substrates such as glass substrates was performed by a scribing step in which a scribe line is formed on the surface of the substrate, and a breaking step in which a predetermined force is applied to the surface of the substrate along the formed scribe line. In the scribing step, while pressing the scribing wheel against the surface of the substrate, it moves along a predetermined line.
以下之專利文獻1中記載有一種裂斷方法,其係沿形成於第1基板之表面之第1刻劃線與形成於第2基板之表面之第2刻劃線將由第1基板與第2基板貼合所構成之基板裂斷。形成於第2基板之表面之第2刻劃線係形成於俯視下與第1刻劃線相同之位置。於此裂斷方法中,若朝向第1基板對載置於第1刻劃線上之導桿施加衝擊,則沿第2刻劃線將第2基板裂斷。其後,以第1刻劃線及第2刻劃線為邊界之一側區域之一部分或全部由支承構件支承,又,以第1刻劃線及第2刻劃線為邊界之另一側區域之全部自支承構件之一端突出之方式進行配置。然後,藉由利用裂斷桿按壓該另一側區域,而沿第1刻劃線將第1基板裂斷。
[先前技術文獻]
[專利文獻]The following
[專利文獻1]日本特開2017-013239號公報[Patent Document 1] JP 2017-013239 A
[發明所欲解決之問題][The problem to be solved by the invention]
貼合基板存在於裂斷位置處第1基板與第2基板被密封材貼合之情形。於此種基板中,第1基板及第2基板中刻劃線後形成之基板中,垂直裂紋難以沿刻劃線充分滲透至基板。若於垂直裂紋之滲透不充分之狀態下對基板執行裂斷步驟,則有裂斷後之基板之端緣產生較細之龜裂或破損而導致基板之強度降低之虞。專利文獻1之裂斷方法,裂斷之對象為貼合基板,但並未揭示考慮到垂直裂紋對各基板之滲透狀態之貼合基板之裂斷步驟。又,如專利文獻1般,若藉由自一個方向按壓貼合基板進行裂斷,則存在因基板之端面於裂斷時互相接觸而產生基板之缺損等製品品質降低之可能性。尤其是於製品形狀之至少一部分包含曲線部分之情形時,由於曲線部分中基板之端面彼此接觸,會產生基板之缺損,因此無法採用專利文獻1之裂斷方法。In the bonded substrate, the first substrate and the second substrate may be bonded by the sealing material at the fracture position. In this type of substrate, it is difficult for vertical cracks to fully penetrate the substrate along the scribe line in the substrate formed after the scribe line in the first substrate and the second substrate. If the cracking step is performed on the substrate in a state where the penetration of the vertical cracks is insufficient, the edge of the cracked substrate may produce finer cracks or breakage, which may reduce the strength of the substrate. The cracking method of
有鑒於此課題,本發明之目的在於提供一種可沿形成於貼合基板之刻劃線容易且良好地進行分斷之分斷方法、及應用於該分斷方法之裂斷方法。 [解決課題之手段]In view of this problem, the object of the present invention is to provide a breaking method capable of easily and well breaking along the scribe line formed on the bonded substrate, and a breaking method applied to the breaking method. [Means to solve the problem]
本發明之第1態樣,係關於一種將由第1基板與第2基板藉由密封材貼合而成之基板分斷之分斷方法。本態樣之分斷方法,包含:一邊將刻劃輪壓抵於上述第1基板之表面之與上述密封材相對向之位置、一邊移動上述刻劃輪,而於上述第1基板之表面形成第1刻劃線;一邊將刻劃輪壓抵於上述第2基板之表面之與上述密封材相對向之位置、一邊移動上述刻劃輪,而於上述第2基板之表面形成第2刻劃線;按壓包含形成於上述第1基板之表面之上述第1刻劃線之區域,使垂直裂紋沿上述第2刻劃線滲透至上述第2基板;將由上述第1刻劃線及上述第2刻劃線分隔之上述基板之區域沿平行於上述基板之表面之方向互相拉離,藉此沿上述第1刻劃線及上述第2刻劃線將上述基板分離。The first aspect of the present invention relates to a method for separating a substrate formed by bonding a first substrate and a second substrate through a sealing material. The cutting method of this aspect includes: pressing a scribing wheel against a position on the surface of the first substrate facing the sealing material while moving the scribing wheel to form a first substrate on the surface of the first substrate. 1 Scribe line; while pressing the scribing wheel against the position of the surface of the second substrate facing the sealing material, move the scribing wheel to form a second scribing line on the surface of the second substrate ; Press the area including the first scribing line formed on the surface of the first substrate, so that vertical cracks penetrate into the second substrate along the second scribing line; will be formed by the first scribing line and the second scribing The regions of the substrate separated by the scribe lines are pulled apart from each other in a direction parallel to the surface of the substrate, thereby separating the substrate along the first scribe line and the second scribe line.
關於以密封材將第1基板與第2基板貼合之貼合基板,於先形成刻劃線之基板,垂直裂紋會良好地滲透,於後形成刻劃線之基板,垂直裂紋難以充分滲透。於此方面,藉由上述構成,暫時先於第2基板形成刻劃線後,經由第1基板而對第2基板施加力,藉此垂直裂紋沿後形成之第2刻劃線滲透至第2基板。由此,第2基板成為容易沿第2刻劃線分離之狀態。藉此,可沿第1刻劃線及第2刻劃線將基板容易地分離。Regarding the bonded substrate in which the first substrate and the second substrate are bonded with a sealing material, vertical cracks penetrate well in the substrate where the scribe line is formed first, and the vertical crack is difficult to fully penetrate the substrate where the scribe line is formed later. In this regard, with the above-mentioned structure, once the scribe line is formed on the second substrate, a force is applied to the second substrate through the first substrate, whereby the second scribe line formed after the vertical crack penetrates to the second substrate. Substrate. Thereby, the second substrate is in a state where it can be easily separated along the second scribe line. Thereby, the substrate can be easily separated along the first scribe line and the second scribe line.
又,可預先沿第1刻劃線及第2刻劃線形成較深之垂直裂紋,將由第1刻劃線及第2刻劃線分隔之基板之區域沿平行於基板之表面之方向互相拉離,藉此將基板分離。因此,於分離基板時,不存在基板之端面互相接觸之情況,而無需擔心基板會產生龜裂或破損。因此,不會降低基板之強度,可精加工為高品質之製品。In addition, deeper vertical cracks can be formed along the first scribe line and the second scribe line in advance, and the areas of the substrate separated by the first scribe line and the second scribe line are pulled to each other in a direction parallel to the surface of the substrate So as to separate the substrate. Therefore, when the substrates are separated, there is no situation where the end surfaces of the substrates are in contact with each other, and there is no need to worry about cracks or breakage of the substrates. Therefore, without reducing the strength of the substrate, it can be finished into high-quality products.
於本態樣之分斷方法中,上述第1刻劃線及上述第2刻劃線可形成包含曲線之刻劃線。In the dividing method of this aspect, the first scribe line and the second scribe line may form a scribe line including a curve.
藉由此構成,可使垂直裂紋適當地滲透至第1刻劃線及第2刻劃線之兩者中,因此,即使於第1刻劃線及第2刻劃線包含曲線之情形時,亦可藉由沿第1刻劃線及第2刻劃線將基板拉離而防止基板之端面之接觸,從而將基板順利地分離。由此,上述構成之分斷方法可應用於多種多樣之基板之分斷。With this configuration, vertical cracks can be properly penetrated into both the first scribe line and the second scribe line. Therefore, even when the first scribe line and the second scribe line include a curve, It is also possible to prevent the contact between the end surfaces of the substrate by pulling the substrate away along the first scribe line and the second scribe line, thereby smoothly separating the substrate. Therefore, the breaking method of the above configuration can be applied to the breaking of various substrates.
本態樣之分斷方法,可以如下方式構成:於使垂直裂紋滲透至上述第2基板之步驟中,使彈性構件密接於上述第1刻劃線,而對包含上述第1刻劃線之區域進行按壓。The breaking method of this aspect can be configured as follows: in the step of infiltrating the vertical cracks into the second substrate, the elastic member is in close contact with the first scribe line, and the area including the first scribe line is Press.
藉由此構成,藉由彈性構件密接於沿第1刻劃線之區域,而可對該區域之全部範圍一律賦予按壓力。藉此,可對形成於第2基板之表面之第2刻劃線均勻地施力。由此,於使垂直裂紋滲透至第2基板之步驟中,容易使垂直裂紋沿第2刻劃線滲透至第2基板。藉此,可沿第1刻劃線及第2刻劃線將基板容易地分離。With this configuration, the elastic member is in close contact with the area along the first scribe line, so that the pressing force can be uniformly applied to the entire range of the area. Thereby, it is possible to uniformly apply force to the second scribe line formed on the surface of the second substrate. Thus, in the step of infiltrating the vertical cracks into the second substrate, it is easy to make the vertical cracks penetrate into the second substrate along the second scribe line. Thereby, the substrate can be easily separated along the first scribe line and the second scribe line.
於此情形時,可以如下方式構成:對用以固定上述彈性構件之固定構件施力,而對包含上述第1刻劃線之區域進行按壓。In this case, it may be configured as follows: the fixing member for fixing the elastic member is urged, and the area including the first scribe line is pressed.
藉此,對固定構件賦予之力被全面地賦予至彈性構件,因此,彈性構件均勻地密接於沿第1刻劃線之整個區域。藉此,可將按壓力均勻地賦予至沿第1刻劃線之區域之全部範圍,而對形成於第2基板之表面之第2刻劃線確實且均勻地施力。由此,垂直裂紋更容易沿第2刻劃線滲透至第2基板。藉此,可沿第1刻劃線及第2刻劃線將基板容易地分離。With this, the force applied to the fixing member is fully applied to the elastic member, and therefore, the elastic member is uniformly in close contact with the entire area along the first scribe line. Thereby, the pressing force can be uniformly applied to the entire range of the area along the first scribe line, and the second scribe line formed on the surface of the second substrate can be reliably and uniformly applied. This makes it easier for vertical cracks to penetrate into the second substrate along the second scribe line. Thereby, the substrate can be easily separated along the first scribe line and the second scribe line.
本發明之第2態樣,係關於一種裂斷方法,其係沿形成於第1基板之與密封材相對向之位置之第1刻劃線與於上述第1刻劃線之後形成於第2基板之與上述密封材相對向之位置之第2刻劃線將由上述第1基板與上述第2基板藉由上述密封材貼合而成之基板裂斷。此態樣之裂斷方法,包含:對包含上述第1刻劃線之區域進行按壓,而使垂直裂紋沿上述第2刻劃線滲透至上述第2基板之步驟;及將由上述第1刻劃線及上述第2刻劃線分隔之上述基板之區域沿平行於上述基板之表面之方向互相拉離,藉此沿上述第1刻劃線及上述第2刻劃線將上述基板分離之步驟。The second aspect of the present invention relates to a rupture method, which is formed along a first scribe line formed on the first substrate at a position opposite to the sealing material and formed on the second scribe line after the first scribe line. The second scribe line at the position of the substrate facing the sealing material ruptures the substrate formed by bonding the first substrate and the second substrate with the sealing material. The cracking method of this aspect includes the step of pressing the area including the first scribe line to make the vertical crack penetrate into the second substrate along the second scribe line; and stepping from the first scribe line The area of the substrate separated by the line and the second scribe line is pulled apart in a direction parallel to the surface of the substrate, thereby separating the substrate along the first scribe line and the second scribe line.
依此構成,發揮與第1態樣相同之效果。 [發明之效果]According to this structure, the same effect as the first aspect is exerted. [Effects of Invention]
如以上所述,根據本發明,可提供一種可沿形成於貼合基板之刻劃線容易且良好地進行分斷之分斷方法、及應用於該分斷方法之裂斷方法。As described above, according to the present invention, it is possible to provide a breaking method capable of easily and well breaking along the scribe line formed on the bonded substrate, and a breaking method applied to the breaking method.
本發明之效果或意義,藉由以下所示之實施形態之說明而變得更明確。但以下所示之實施形態僅係實施本發明時之一個例示,本發明並不受以下之實施形態所記載者任何限制。The effect or significance of the present invention will become clearer from the description of the embodiments shown below. However, the embodiment shown below is only an example when implementing the present invention, and the present invention is not limited to what is described in the following embodiment.
以下,參照圖式對本發明之實施形態進行說明。再者,各圖中,為了方便起見而標註互相正交之X軸、Y軸及Z軸。Z軸表示鉛直方向之上方及下方。下文中,上方及下方分別意指Z軸正側及Z軸負側。Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, in each figure, X-axis, Y-axis, and Z-axis orthogonal to each other are marked for convenience. The Z axis represents the vertical direction above and below. Hereinafter, above and below mean the positive side of the Z axis and the negative side of the Z axis, respectively.
本實施形態係關於將由第1基板11與第2基板12貼合而成之貼合基板10分斷之方法。下文中,於本說明書中將「貼合基板10」簡稱為「基板10」。又,於本實施形態中,於無特別說明之情形時,「將基板10分斷」或「將基板10分離」係將第1基板11及第2基板12同時分斷或分離之含義。This embodiment relates to a method of dividing the bonded
首先,對用以於基板10形成刻劃線之刻劃裝置100之構成進行說明。於本實施形態中,首先於第1基板11之表面11a形成第1刻劃線L1後,於第2基板12之表面12a形成第2刻劃線L2。First, the structure of the
圖1係示意性地表示實施形態1之刻劃裝置100之構成之圖。刻劃裝置100,具備移動台101、及刻劃頭120。移動台101與滾珠螺桿102螺合。移動台101以可沿Y軸方向移動之方式由一對導軌103支承。利用馬達之驅動使滾珠螺桿102旋轉,藉此,移動台101沿一對導軌103於Y軸方向移動。FIG. 1 is a diagram schematically showing the structure of the
於移動台101之上表面設置有馬達104。馬達104使位於上部之載置部105於XY平面旋轉並以既定角度將其定位。可藉由馬達104而水平旋轉之載置部105具備未圖示之真空吸附手段。於載置部105上載置之基板10由該真空吸附手段保持於載置部105上。A
刻劃裝置100於載置於載置部105之基板10之上方具備對形成於該基板10之對準標記進行拍攝之兩台相機106。又,以橫跨移動台101與其上部之載置部105之方式於支柱108a、108b架設有橋107。The
於橋107安裝有軌109。軌109與刻劃頭120經由移動部110連接,以藉由移動部110於軌109上滑動移動使得刻劃頭120沿X軸方向移動之方式設置。A
於使用刻劃裝置100於基板10形成刻劃線之情形時,首先將安裝有刻劃輪1之保持具單元130安裝於刻劃頭120之支承部121。When the
其次,刻劃裝置100藉由一對相機106進行基板10之定位。然後,刻劃裝置100使刻劃頭120移動至既定之位置,對刻劃輪1施加既定之荷重,使其與第1基板11之表面11a接觸。其後,刻劃裝置100使刻劃頭120沿X軸方向移動,藉此於第1基板10之表面11a形成第1刻劃線L1。再者,刻劃裝置100視需要轉動載置部105或將其沿Y軸方向移動,以與上述情形同樣之方式形成第1刻劃線L1。Secondly, the
在第2基板12之表面12a形成第2刻劃線L2之情形時,藉由未圖示之反轉機構使基板10反轉,而使基板12之表面12a位於上方。於此狀態下,以與上述同樣之方式利用刻劃輪1於第2基板12之表面12a形成第2刻劃線L2。When the second scribe line L2 is formed on the
於上述實施形態中,示出了刻劃頭120沿X軸方向移動、載置部105沿Y軸方向移動並且旋轉之刻劃裝置100,但刻劃裝置100為刻劃頭120與載置部105相對移動者即可。例如,亦可為將刻劃頭120固定而載置部105沿X軸、Y軸方向移動且旋轉之刻劃裝置100。又,於此情形時,可將相機106固定於刻劃頭120。In the above embodiment, the
本實施形態之基板之分斷方法係由如下步驟構成:利用上述刻劃裝置100形成第1刻劃線L1及第2刻劃線L2後,使第2垂直裂紋C2沿第2刻劃線L2滲透至第2基板12中之步驟;及將基板10沿第1刻劃線L1及第2刻劃線L2分離之步驟。此處,下文將上述「使第2垂直裂紋C2沿第2刻劃線L2滲透至第2基板12中」之動作稱為「預裂斷」。再者,第1垂直裂紋C1及第2垂直裂紋C2係以圖3(b)、(c)圖示。The substrate cutting method of this embodiment is composed of the following steps: after forming the first scribing line L1 and the second scribing line L2 by the
圖2係表示基板10之分斷方法之流程圖。FIG. 2 is a flowchart showing a method of breaking the
基板10之分斷係藉由如下步驟進行:於第1基板11形成第1刻劃線L1之步驟(S11);於第2基板12形成第2刻劃線L2之步驟(S12);對第2基板12進行預裂斷(S13);及將基板10沿第1刻劃線L1及第2刻劃線L2分離之步驟(S14)。其中,步驟S11、S12之形成刻劃線之步驟係利用上述刻劃裝置100進行。The breaking of the
其次,參照圖3(a)~(f)對圖2所示之基板之分斷方法,尤其是圖2之步驟S13、S14之步驟進行詳細說明。Next, referring to FIGS. 3(a) to (f), the method of breaking the substrate shown in FIG. 2, especially the steps S13 and S14 of FIG. 2 will be described in detail.
圖3(a)~(f)係示意性地表示基板10之分斷方法之過程之側視圖。圖3(a)係自Y軸負側觀察刻劃位置附近時之示意圖,圖3(b)~(f)係自X軸負側觀察基板10之刻劃位置附近時之示意圖。3(a) to (f) are side views schematically showing the process of the method of dividing the
圖3(a)~(c)表示形成刻劃線之步驟,此係藉由參照圖1說明之刻劃裝置100進行。圖3(d)表示對第2基板12進行預裂斷之步驟。圖3(e)、(f)表示將基板10分離之步驟。3(a) to (c) show the steps of forming a scribe line, which is performed by the
又,基板10係將第1基板11與第2基板12經由密封材SL貼合而構成。作為此種基板10,例如可列舉於第1基板11形成有彩色濾光片(CF)、於第2基板12形成有薄膜電晶體(TFT)者。於此情形時,由密封材SL、第1基板11、及第2基板12形成液晶注入區域R,於該液晶注入區域R中注入液晶。In addition, the
密封材SL例如可使用由環氧樹脂等樹脂材料構成之接著劑。於密封材SL由紫外線硬化樹脂構成之情形時,在第2基板12之表面塗布有密封材SL之狀態下將第1基板11重疊於第2基板12之上表面,其後,照射紫外線。藉此,密封材SL硬化,第1基板11與第2基板12經由密封材SL而貼合。除此以外,密封材SL亦存在由熱硬化樹脂構成之情形。於此情形時,藉由加熱使得密封材SL硬化,第1基板11與第2基板12經由密封材SL而貼合。密封材SL若硬化,則具有較高之硬度。As the sealing material SL, for example, an adhesive made of a resin material such as epoxy resin can be used. When the sealing material SL is made of ultraviolet curable resin, the
如圖3(a)所示,一邊將刻劃輪1壓抵於第1基板11之表面11a,一邊使刻劃輪1沿X軸正方向移動,從而形成第1刻劃線L1。此時,刻劃輪1被壓抵於密封材SL之正上方之位置,而沿密封材SL於第1基板11之表面11a形成第1刻劃線L1。藉此,如圖3(b)所示,沿第1刻劃線L1於第1基板11形成第1垂直裂紋C1。該第1垂直裂紋C1朝向密封材SL滲透至第1基板11之內部。其滲透度為70~100%,為高滲透。再者,此步驟相當於圖2之步驟S11。As shown in Fig. 3(a), while pressing the
其次,利用未圖示之反轉機構使基板10反轉,而使第2基板12之表面12a位於上方。於此狀態下,如圖3(a)所說明般,一邊將刻劃輪1壓抵於第2基板12之表面12a,一邊使刻劃輪1沿X軸正方向移動,從而形成第2刻劃線L2。藉此,如圖3(c)所示,沿第2刻劃線L2而於第2基板12形成第2垂直裂紋C2。該第2垂直裂紋C2朝向密封材SL滲透至第2基板12之內部。第2基板12中之第2垂直裂紋C2之滲透情況遠低於第1基板11,滲透度為15~30%。再者,此步驟相當於圖2之步驟S12。Next, the
其次,對第2基板12進行預裂斷。具體而言,再度將基板10反轉,如圖3(d)所示,使第1基板11之表面11a位於上方。然後,以覆蓋包含第1刻劃線L1之區域之方式,將固定於固定構件14之彈性構件13載置於第1基板11之表面11a。若藉由衝擊構件15對固定構件14賦予朝向第1基板11之力,則沿第2刻劃線L2形成之第2垂直裂紋C2朝向密封材SL滲透。於圖3(d)中,圈住之部分係藉由衝擊構件15所賦予之力而新滲透至第2基板12之內部之第2垂直裂紋C2。再者,此步驟相當於圖2之步驟S13。Next, the
上述彈性構件13例如為橡膠或樹脂。固定構件14係硬度高於彈性構件13之板狀之構件。衝擊構件15係使用重量較固定構件14更重之構件,以可自遠離固定構件14之位置向固定構件14移動,與固定構件14碰撞而對基板10施力。The
又,於對第2基板12進行預裂斷時,基板10係載置於載置台上。於該載置台與基板10之間配置緩衝材。緩衝材例如係由紙或橡膠構成。In addition, when the
對第2基板12進行預裂斷後,進行基板10之分離。具體而言,如圖3(e)所示,沿第1刻劃線L1及第2刻劃線L2,將基板10沿與第1基板11之表面11a平行之方向互相拉離。藉由拉離進行之分離可用手進行,亦可以機械方式進行。藉此,如圖3(f)所示,基板10之分離結束。再者,此步驟相當於步驟S14。由此,貼合基板10被分斷。After the
<驗證> 本申請案發明人等對使用上述構成之分斷方法之情形時之效果進行了驗證。以下,參照圖4(a)~圖5(d)對該驗證及驗證結果進行說明。<Verification> The inventors of the present application have verified the effect when the above-mentioned structured separation method is used. Hereinafter, the verification and verification results will be described with reference to FIGS. 4(a) to 5(d).
於該驗證中,使用將第1基板41與第2基板42貼合而成之基板40,對沿密封材F由第1基板41與第2基板42形成之刻劃線為曲線之情形進行了驗證。此時,於第1基板41及第2基板42之各者形成有圓形刻劃線及所謂之輔助線H。為了方便說明,將該圓形刻劃線稱為「製品線S」。In this verification, the substrate 40 formed by bonding the
此處,所謂輔助線H係於沿對藉由基板40之分離所獲得之製品之形狀進行規定之製品線S將基板分斷時,為了沿該製品線S順利地分離第1基板41及第2基板42而於製品線S之外側形成之刻劃線。於分離閉合曲線狀之製品時,首先沿輔助線H將貼合基板40拉離而分離。由此自經分離之輔助線H誘導出延長之垂直裂紋,沿製品線S將第1基板41之第1垂直裂紋G1、及第2基板42之第2垂直裂紋G2分斷。由此,容易取出由閉合曲線狀之製品線S規定之製品。Here, the auxiliary line H is used to separate the
再者,此處將形成於第1基板41之輔助線及形成於第2基板42之輔助線均稱為「輔助線H」。「製品線S」亦為同樣。In addition, the auxiliary lines formed on the
[驗證1]
[條件]
於下述條件下利用刻劃輪於貼合基板之表面形成刻劃線。
・貼合基板…第1基板0.2 mm 第2基板0.2 mm
・刻劃線(製品線)之形狀…圓形
・密封材…協立化學產業股份有限公司製造之WORLD ROCK 723K1
厚度 10 μm
・行進荷重…0.06 MPa
・行進速度…30 mm/sec
・刻劃輪…直徑2.0 mm,刀尖之角 115度
槽數 360,槽深度 3 μm
・彈性構件…材質 橡膠
・板構件…重量 45 g,尺寸 50×50 mm
・錘…重量 441 g,直徑48 mm[Verification 1]
[condition]
A scoring wheel was used to form a scoring line on the surface of the bonded substrate under the following conditions.
・Laminated substrate...The first substrate 0.2 mm The second substrate 0.2 mm
・The shape of the marking line (product line)...round
・Sealing material... WORLD ROCK 723K1 manufactured by Xie Li Chemical Industry Co., Ltd.
上述貼合基板40(下文簡稱為基板40)係於第1基板41之表面41a及第2基板42之表面42a分別形成製品線S。然後,如圖4(a)、(b)所示,沿製品線S載置貼附於板構件43之彈性構件44。於此狀態下,藉由自上方使錘45落下,而對第2基板42進行預裂斷。其後,由作業者之手沿製品線S將基板40分離。The above-mentioned bonded substrate 40 (hereinafter referred to as the substrate 40) is formed on the
再者,於本驗證中,上述條件中之板構件43、彈性構件44、及錘45分別相當於參照上述圖3(d)所說明之固定構件14、彈性構件13、及衝擊構件15。Furthermore, in this verification, the
又,於驗證1中,使用形成有如圖4(c)所示之製品線S與輔助線H之第1基板41及第2基板42。進而,如圖4(d)之虛線所示,關於製品線S之Y軸正側之半圓、及與製品線S之切線相接之Y軸正側之輔助線H,對是否可進行基板40之分離進行評價。將圖4(d)之虛線部分別稱為評價對象製品線S1及評價對象輔助線H1。In the
又,於驗證1中,板構件43係使用不透明者。進而,於驗證1中,如圖4(e)所示,彈性構件44僅載置於製品線S,不載置於輔助線H。再者,於圖4(e)中,彈性構件44係以一點鏈線表示。In the
於此狀態下,使錘45自既定之高度落下至板構件43之表面,對第2基板42進行預裂斷。又,此時,於第2基板42下重疊鋪置8張厚度約0.07 mm之無塵紙作為緩衝材,自距板構件43之表面20 mm之高度使錘45落下。In this state, the
然後,對第2基板42進行預裂斷後,沿製品線S將基板40分離。Then, after pre-fracture of the
[驗證1之結果]
第2基板42之預裂斷後,基板40未沿圖4(d)之評價對象製品線S1分離,但沿輔助線H分離後,可實現製品線S之分離。於此情形時,第2基板42之預裂斷後,可將基板40容易地分離。[Result of Verification 1]
After the pre-cracking of the
[驗證2]
[條件]
於驗證2中,將板構件43設為透明者。又,如圖5(a)所示,使輔助線H之形狀不同於驗證1。於此情形時,以圖5(b)之虛線部分作為評價對象製品線S1及評價對象輔助線H1。[Verification 2]
[condition]
In verification 2, the
驗證2亦與驗證1同樣地,彈性構件44僅載置於製品線S,不載置於輔助線H(參照圖4(e))。其他條件與驗證1相同。Verification 2 is also the same as
於此狀態下,藉由使錘45自既定之高度落下至第1基板41之表面41a,而對第2基板42進行預裂斷。此時,於第2基板42下重疊8張厚度約0.07 mm之無塵紙作為緩衝材,自距第1基板41之表面41a為50 mm、40 mm、30 mm、20 mm之各高度使錘45落下。In this state, the
然後,對第2基板42進行預裂斷後,將基板40沿製品線S分離。Then, after pre-fracture of the
[驗證2之結果]
自任何高度使錘45落下而對第2基板42進行預裂斷,基板40均未沿圖5(b)之評價對象製品線S1分離。於此情形時,將第2基板42預裂斷後,將評價對象輔助線H1分離,繼而沿評價對象製品線S1進行基板40之分離,藉此可將基板40分離。[Result of Verification 2]
The
又,任何情形均未產生沿評價對象輔助線H1及評價對象製品線S1形成之垂直裂紋以外之裂紋。In addition, no cracks other than the vertical cracks formed along the evaluation target auxiliary line H1 and the evaluation target product line S1 were generated in any case.
[驗證3]
[條件]
驗證1及驗證2中係將彈性構件44僅載置於製品線S。於驗證3中,於輔助線H亦載置彈性構件44。即,對製品線S與輔助線H進行預裂斷。[Verification 3]
[condition]
In
於此情形時,輔助線H之形狀如圖5(a)所示,為與驗證2相同之輔助線H,如圖5(c)所示,將彈性構件44載置於製品線S及輔助線H。其他條件與驗證1相同。即,板構件43係使用不透明者。又,圖5(c)與圖4(e)同樣,彈性構件44係以一點鏈線表示。In this case, the shape of the auxiliary line H is shown in Figure 5(a), which is the same auxiliary line H as verification 2. As shown in Figure 5(c), the
於此狀態下,藉由使錘45自既定之高度落下至板構件43之表面,對第2基板42進行預裂斷。此時,於第2基板42下重疊8張厚度約0.07 mm之無塵紙作為緩衝材,自距板構件43之表面20 mm、15 mm、10 mm、5 mm之各高度使錘45落下。In this state, the
然後,對第2基板42進行預裂斷後,將基板40沿製品線S分離。Then, after pre-fracture of the
[驗證3之結果]
自任何高度使錘45落下進行預裂斷,均產生自基板40之評價對象輔助線H之一部分偏離之裂紋。此種裂紋無助於基板40之分斷,於基板40之分斷時有使製品部分產生龜裂或破損之虞,因此並非較佳之裂紋。[Result of Verification 3]
If the
[驗證4]
[條件]
於驗證4中,僅於輔助線H載置彈性構件44。即,僅對輔助線H進行預裂斷。[Verification 4]
[condition]
In
於此情形時,輔助線H之形狀如圖5(a)所示,為與驗證2相同之輔助線H,如圖5(d)所示,僅於輔助線H載置彈性構件44。其他條件與驗證1相同。但板構件43使用透明者。In this case, the shape of the auxiliary line H is as shown in FIG. 5(a), which is the same as the auxiliary line H of verification 2. As shown in FIG. 5(d), only the
於此狀態下,於第2基板42下重疊8張厚度約0.07 mm之無塵紙作為緩衝材,自距板構件43之表面5 mm之高度使錘45落下。In this state, 8 sheets of dust-free paper with a thickness of about 0.07 mm are stacked under the
對第2基板42進行預裂斷後,將基板40沿製品線S分離。After the
[驗證4之結果] 自評價對象輔助線H1向製品內部產生裂紋,無法進行基板40之分離。[Result of Verification 4] From the evaluation target auxiliary line H1, cracks are generated inside the product, and the substrate 40 cannot be separated.
[驗證5]
為了提高預裂斷之精度、即第2基板42中第2垂直裂紋G2之滲透,而進行如以下之驗證。[Verification 5]
In order to improve the accuracy of pre-fracture, that is, the penetration of the second vertical crack G2 in the
以感壓紙取代基板40載置於載置台,於感壓紙上載置彈性構件及板構件。此時,使用與驗證2相同之透明之板構件43及彈性構件44。然後,自距板構件43之表面30 mm、20 mm、10 mm之高度使錘45落下。此時,將具有較錘45之直徑大一些之直徑之筒狀且空腔之構件(未圖示)置於板構件43上,使用該筒狀之構件作為錘45之導件。即,使彈性構件之中心與導件之中心一致而配置導件,使錘45於被固定之導件之筒狀構件之內部落下,使錘45與板構件43碰撞。由此將彈性構件44之形狀轉印至感壓紙。Instead of the substrate 40, pressure sensitive paper is placed on the mounting table, and the elastic member and the plate member are placed on the pressure sensitive paper. At this time, the same
[驗證5之結果]
於自高度10 mm使錘45落下之情形時,轉印至感壓紙之彈性構件44之痕跡不均勻。由此認為,於自高度10 mm使錘45落下之情形時,就算使用導件,自彈性構件44施加至基板40之衝擊亦不均勻。[Result of Verification 5]
When the
於自高度20 mm、30 mm使錘45落下之情形時,均勻地形成轉印至感壓紙之彈性構件44之痕跡。認為其原因在於:藉由導件可使錘45確實地與彈性構件44之中心接觸,而可自彈性構件向基板均勻地施加衝擊。When the
[驗證6]
於與驗證1相同之條件下,於第1基板41之表面41a及第2基板42之表面形成製品線S。其後,並不如驗證1~4般對第2基板42進行預裂斷,而進行基板40之分離。[Verification 6]
Under the same conditions as in the
[驗證6之結果]
於評價對象輔助線H1與第1基板41之邊界線處產生被稱為角之殘餘或於製品線之內側產生裂紋而發生基板被破壞等缺陷,而難以將基板40分離。[Result of Verification 6]
At the boundary line between the evaluation target auxiliary line H1 and the
[驗證之彙總]
根據對第2基板42進行預裂斷後進行基板40之分離之驗證1及驗證2、與不對第2基板42進行預裂斷而進行基板40之分離之驗證6的結果,可確認於貼合基板40中,若對第2基板42進行預裂斷,則可沿輔助線H及製品線S將基板40分離。[Summary of Verification]
According to the results of
若將僅對製品線S進行預裂斷之驗證1及驗證2與亦對輔助線H進行預裂斷之驗證3加以比較,則於驗證3中,於基板40之分離時,基板40產生裂紋。由此可確認,適當為不對輔助線H進行預裂斷,而僅對製品線S進行預裂斷。Comparing the
若將僅對製品線S進行預裂斷之驗證1及驗證2與僅對輔助線H進行預裂斷之驗證4加以比較,則於驗證4中,製品線S之內部亦產生裂紋而無法分離。由此可確認,適當為不對輔助線H進行預裂斷,而僅對製品線S進行預裂斷。Comparing
於驗證1與驗證2中,使輔助線H之形狀不同而進行驗證,但兩者均對第2基板42進行預裂斷後,可將基板40分離。因此認為,輔助線H之形狀之不同不太會影響預裂斷。In
若將驗證1與驗證2之結果加以比較,則使用透明之板構件43之驗證2可容易地進行基板40之分離。認為其原因在於:於製品線S上載置彈性構件44時,由於板構件43透明,因此可一邊確認製品線S之位置一邊載置彈性構件44。由此推測,於預裂斷時,若於包含製品線S之區域確實地載置彈性構件44,則可良好地進行預裂斷,而可容易地將基板40分離。If the results of
根據驗證5之結果可確認,於使錘45落下時,若使用導件構件(筒狀之構件),則可使錘45確實地與包含製品線S之區域之中央碰撞。據此認為,藉由導件可提高錘45之碰撞位置之再現性,又,可對基板40均勻地施力,因此第2垂直裂紋G2容易沿著製品線S滲透至第2基板42。According to the result of verification 5, it can be confirmed that when the
<實施形態之效果>
於第1基板11與第2基板12經由密封材SL貼合而成之基板10中,存在後形成刻劃線之基板之第2垂直裂紋C2之滲透較低之情形。於此種狀態下,於對基板10施加既定之力進行裂斷步驟之情形時,有基板10之截面產生龜裂或破損之虞。<Effects of the implementation form>
In the
於此方面,如圖2、及圖3(a)~(e)所示,於上述構成中,於第1基板11之表面11a形成第1刻劃線L1,於第2基板12之表面12a形成第2刻劃線L2後,對第2基板12進行預裂斷。藉此,可使第2基板12產生之第2垂直裂紋C2朝向密封材SL滲透。藉此,第2基板12成為容易沿第2刻劃線L2被分離之狀態。藉此,可沿第1刻劃線L1及第2刻劃線L2將基板10容易地分離。In this regard, as shown in FIGS. 2 and 3(a) to (e), in the above configuration, the first scribe line L1 is formed on the
又,於以上述方式對第2基板12進行預裂斷之情形時,起初於第2基板12產生之第2垂直裂紋C2藉由沿厚度方向伸展而成為更深之垂直裂紋,藉此可將基板10分離。由此,於分離基板10時,無需擔心基板10會產生龜裂或破損。因此,不會降低基板10之強度,可精加工為高品質之製品。In addition, when the
又,如圖3(f)所示,於將基板10分離時,將由第1刻劃線L1及第2刻劃線L2分隔之基板10之區域沿與第1基板11之表面11a平行之方向互相拉離。藉此,不存在分離之截面互相接觸之情況,分斷後之基板10之表面之端部不易產生缺損或破裂。由此,不會降低基板10之強度,可精加工為高品質之製品。Furthermore, as shown in FIG. 3(f), when the
又,即使於第1刻劃線L1及第2刻劃線L2包含曲線之情形時,亦可沿第1刻劃線L1及第2刻劃線L2將基板10順利地分離。Moreover, even when the first scribe line L1 and the second scribe line L2 include curved lines, the
如圖3(d)所示,於對第2基板12進行預裂斷時,使彈性構件13與沿第1刻劃線L1之區域密接。藉此,可利用衝擊構件15對該區域之全部範圍一律賦予按壓力。並且,可對形成於第2基板12之表面12a之第2刻劃線L2均勻地施力。由此,最初沿第2刻劃線L2產生之第2垂直裂紋C2容易滲透至第2基板12。藉此,可沿第1刻劃線L1及第2刻劃線L2將基板10容易地分離。As shown in FIG. 3(d), when the
又,彈性構件13被固定於固定構件14。因此,可自固定構件14對彈性構件13全面地施力,從而彈性構件13均勻地密接於沿第1刻劃線L1之整個區域。藉此,可對沿第1刻劃線L1之區域之全部範圍均勻地賦予按壓力,而對形成於第2基板12之表面之第2刻劃線L2確實且均勻地施力。由此,沿第2刻劃線L2產生之第2垂直裂紋C2更容易地滲透至第2基板12。藉此,可沿第1刻劃線L1及第2刻劃線L2將基板10容易地分離。In addition, the
再者,於上述實施形態中,如圖3(c)所示,於第1基板11之表面11a形成第1刻劃線L1後,將基板10反轉,而於第2基板12之表面12a形成第2刻劃線L2,但不限於此。例如,亦可以如下方式構成:準備2個刻劃輪1,一邊利用其中一個刻劃輪1於第1基板11之表面11a形成第1刻劃線L1,一邊利用另一刻劃輪1於第2基板12之表面12a形成第2刻劃線L2。即,亦可為如同時並行形成第1刻劃線L1與第2刻劃線L2之構成。Furthermore, in the above-mentioned embodiment, as shown in FIG. 3(c), after the first scribe line L1 is formed on the
於此情形時,若較第1基板11側之刻劃輪1落後既定距離移送第2基板12側之刻劃輪1,則亦為於第1基板11之表面11a形成第1刻劃線L1後於第2基板12之表面12a形成第2刻劃線L2,因此第2基板12產生之第2垂直裂紋C2之滲透有可能變淺。因此,於此情形時,亦如上述實施形態般,藉由對第2基板12進行預裂斷,而可沿第1刻劃線L1及第2刻劃線L2將基板10容易且良好地分離。In this case, if the
又,第1刻劃線L1及第2刻劃線L2可僅由直線構成,亦可於其一部分包含曲線。又,由第1刻劃線L1及第2刻劃線L2構成之製品形狀之一部分可於製品側包含凹陷之凹部。In addition, the first scribing line L1 and the second scribing line L2 may be composed of only straight lines, or may include curved lines in a part thereof. In addition, a part of the product shape formed by the first scribe line L1 and the second scribe line L2 may include a recessed portion on the product side.
此外,本發明之實施形態可於申請專利範圍中所示之技術思想之範圍內適當進行各種變更。In addition, the embodiments of the present invention can be appropriately modified in various ways within the scope of the technical idea shown in the scope of the patent application.
1:刻劃輪
10:基板
11:第1基板
11a:第1基板之表面
12:第2基板
12a:第2基板之表面
L1:第1刻劃線
L2:第2刻劃線
13:彈性構件
14:固定構件(板構件)
15:衝擊構件
41:第1基板
41a:表面
42:第2基板
42a:表面
43:板構件
44:彈性構件
45:錘
100:刻劃裝置
101:移動台
102:滾珠螺桿
103:導軌
104:馬達
105:載置部
106:相機
107:橋
108a、108b:支柱
109:軌
110:移動部
120:刻劃頭
121:支承部
130:保持具單元
C1:第1垂直裂紋
C2:第2垂直裂紋
F:密封材
G1:第1垂直裂紋
G2:第2垂直裂紋
H:輔助線
H1:評價對象輔助線
R:液晶注入區域
S:製品線
S1:評價對象製品線
SL:密封材1: Scribe wheel
10: substrate
11: The
[圖1]係示意性地表示實施形態之刻劃裝置之構成之圖。 [圖2]係表示實施形態之分斷方法之流程圖。 [圖3](a)~(f)係示意性地表示實施形態之分斷方法之過程之側視圖。 [圖4](a)~(e)分別為用以對實施形態之分斷方法之驗證進行說明之示意圖。 [圖5](a)~(d)分別為用以對實施形態之分斷方法之驗證進行說明之示意圖。[Fig. 1] A diagram schematically showing the structure of the scribing device of the embodiment. [Figure 2] is a flow chart showing the breaking method of the embodiment. [Figure 3] (a) to (f) are side views schematically showing the process of the breaking method of the embodiment. [Figure 4] (a) ~ (e) are schematic diagrams for explaining the verification of the breaking method of the embodiment. [Figure 5] (a) ~ (d) are schematic diagrams for explaining the verification of the breaking method of the embodiment.
1:刻劃輪 1: Scribe wheel
10:基板 10: substrate
11:第1基板 11: The first substrate
11a:第1基板之表面 11a: Surface of the first substrate
12:第2基板 12: The second substrate
12a:第2基板之表面 12a: The surface of the second substrate
13:彈性構件 13: Elastic member
14:固定構件(板構件) 14: Fixed member (plate member)
15:衝擊構件 15: Impact member
C1:第1垂直裂紋 C1: The first vertical crack
C2:第2垂直裂紋 C2: The second vertical crack
L1:第1刻劃線 L1: The first score line
L2:第2刻劃線 L2: 2nd score line
R:液晶注入區域 R: Liquid crystal injection area
SL:密封材 SL: Sealing material
Claims (5)
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| JP2019014672A JP7228883B2 (en) | 2019-01-30 | 2019-01-30 | Division method and break method |
| JPJP2019-014672 | 2019-01-30 |
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| TW202041475A true TW202041475A (en) | 2020-11-16 |
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| JP2003255362A (en) | 2002-03-05 | 2003-09-10 | Citizen Watch Co Ltd | Cell and its production method and liquid crystal optical element using the cell |
| CN101068666B (en) * | 2004-10-13 | 2011-05-04 | 三星钻石工业株式会社 | Method and apparatus for scribing brittle material board and system for breaking brittle material board |
| CN102344245B (en) * | 2005-07-06 | 2015-10-28 | 三星钻石工业股份有限公司 | The scribble method of scribing wheel for brittle material and this tracing wheel of employing and device, instrument |
| JP4902155B2 (en) | 2005-08-31 | 2012-03-21 | オプトレックス株式会社 | Substrate cutting method |
| JP2009083079A (en) | 2007-10-03 | 2009-04-23 | Seiko Epson Corp | Bonding substrate cutting device and bonding substrate cutting method |
| JP2011088382A (en) * | 2009-10-23 | 2011-05-06 | Mitsuboshi Diamond Industrial Co Ltd | Breaking device and breaking method |
| JP5156085B2 (en) * | 2010-12-13 | 2013-03-06 | 三星ダイヤモンド工業株式会社 | Method for dividing bonded substrates |
| JP2016060684A (en) * | 2014-09-22 | 2016-04-25 | 三星ダイヤモンド工業株式会社 | Substrate parting method and scribing device |
| JP6405968B2 (en) * | 2014-12-10 | 2018-10-17 | 三星ダイヤモンド工業株式会社 | Substrate cutting method and scribing apparatus |
| JP2016121037A (en) * | 2014-12-25 | 2016-07-07 | 三星ダイヤモンド工業株式会社 | Scribe device |
| JP6540272B2 (en) | 2015-06-26 | 2019-07-10 | 三星ダイヤモンド工業株式会社 | Breaking apparatus and breaking method |
| JP6638400B2 (en) * | 2016-01-05 | 2020-01-29 | 三星ダイヤモンド工業株式会社 | Substrate cutting method |
| JP6746130B2 (en) * | 2016-07-26 | 2020-08-26 | 三星ダイヤモンド工業株式会社 | Substrate cutting device and substrate cutting method |
| JP6493512B2 (en) * | 2017-12-29 | 2019-04-03 | 三星ダイヤモンド工業株式会社 | Cutting method and device |
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