TW201904930A - Active ester compound and hardenable composition - Google Patents
Active ester compound and hardenable compositionInfo
- Publication number
- TW201904930A TW201904930A TW107117764A TW107117764A TW201904930A TW 201904930 A TW201904930 A TW 201904930A TW 107117764 A TW107117764 A TW 107117764A TW 107117764 A TW107117764 A TW 107117764A TW 201904930 A TW201904930 A TW 201904930A
- Authority
- TW
- Taiwan
- Prior art keywords
- active ester
- ester compound
- compound
- dihydroxynaphthalene
- curable composition
- Prior art date
Links
- -1 ester compound Chemical class 0.000 title claims abstract description 114
- 239000000203 mixture Substances 0.000 title claims abstract description 42
- 150000004820 halides Chemical class 0.000 claims abstract description 21
- 239000004065 semiconductor Substances 0.000 claims abstract description 18
- 239000002253 acid Substances 0.000 claims abstract description 17
- 239000003566 sealing material Substances 0.000 claims abstract description 15
- 239000000463 material Substances 0.000 claims description 15
- 125000003118 aryl group Chemical group 0.000 claims description 11
- 125000003545 alkoxy group Chemical group 0.000 claims description 9
- 125000005843 halogen group Chemical group 0.000 claims description 9
- 125000001931 aliphatic group Chemical group 0.000 claims description 8
- 125000003710 aryl alkyl group Chemical group 0.000 claims description 7
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- 125000004432 carbon atom Chemical group C* 0.000 claims description 4
- 150000005690 diesters Chemical class 0.000 claims description 4
- 239000004848 polyfunctional curative Substances 0.000 claims description 4
- 125000001624 naphthyl group Chemical group 0.000 claims description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 24
- 239000003822 epoxy resin Substances 0.000 description 16
- 229920000647 polyepoxide Polymers 0.000 description 16
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 15
- 229920005989 resin Polymers 0.000 description 14
- 239000011347 resin Substances 0.000 description 14
- 150000001875 compounds Chemical class 0.000 description 13
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 12
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 12
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- 239000000155 melt Substances 0.000 description 11
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- 238000006243 chemical reaction Methods 0.000 description 10
- IJGRMHOSHXDMSA-UHFFFAOYSA-N nitrogen Substances N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 9
- 239000010410 layer Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 238000002156 mixing Methods 0.000 description 8
- 239000003795 chemical substances by application Substances 0.000 description 7
- 229910052757 nitrogen Inorganic materials 0.000 description 7
- 239000002904 solvent Substances 0.000 description 7
- 238000003756 stirring Methods 0.000 description 7
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- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 6
- 239000004843 novolac epoxy resin Substances 0.000 description 6
- 239000003960 organic solvent Substances 0.000 description 6
- 238000000926 separation method Methods 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 239000003063 flame retardant Substances 0.000 description 5
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- 239000011256 inorganic filler Substances 0.000 description 5
- 229910003475 inorganic filler Inorganic materials 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 4
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 4
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- QQVIHTHCMHWDBS-UHFFFAOYSA-N isophthalic acid Chemical compound OC(=O)C1=CC=CC(C(O)=O)=C1 QQVIHTHCMHWDBS-UHFFFAOYSA-N 0.000 description 4
- NXPPAOGUKPJVDI-UHFFFAOYSA-N naphthalene-1,2-diol Chemical compound C1=CC=CC2=C(O)C(O)=CC=C21 NXPPAOGUKPJVDI-UHFFFAOYSA-N 0.000 description 4
- KJCVRFUGPWSIIH-UHFFFAOYSA-N 1-naphthol Chemical compound C1=CC=C2C(O)=CC=CC2=C1 KJCVRFUGPWSIIH-UHFFFAOYSA-N 0.000 description 3
- 229930185605 Bisphenol Natural products 0.000 description 3
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- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 125000000217 alkyl group Chemical group 0.000 description 3
- 238000007664 blowing Methods 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 230000018044 dehydration Effects 0.000 description 3
- 238000006297 dehydration reaction Methods 0.000 description 3
- 229910001873 dinitrogen Inorganic materials 0.000 description 3
- 150000002148 esters Chemical class 0.000 description 3
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- FZZQNEVOYIYFPF-UHFFFAOYSA-N naphthalene-1,6-diol Chemical compound OC1=CC=CC2=CC(O)=CC=C21 FZZQNEVOYIYFPF-UHFFFAOYSA-N 0.000 description 3
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- 239000011574 phosphorus Substances 0.000 description 3
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 3
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- 125000001424 substituent group Chemical group 0.000 description 3
- JRMUNVKIHCOMHV-UHFFFAOYSA-M tetrabutylammonium bromide Chemical compound [Br-].CCCC[N+](CCCC)(CCCC)CCCC JRMUNVKIHCOMHV-UHFFFAOYSA-M 0.000 description 3
- RNFJDJUURJAICM-UHFFFAOYSA-N 2,2,4,4,6,6-hexaphenoxy-1,3,5-triaza-2$l^{5},4$l^{5},6$l^{5}-triphosphacyclohexa-1,3,5-triene Chemical compound N=1P(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP(OC=2C=CC=CC=2)(OC=2C=CC=CC=2)=NP=1(OC=1C=CC=CC=1)OC1=CC=CC=C1 RNFJDJUURJAICM-UHFFFAOYSA-N 0.000 description 2
- OAYXUHPQHDHDDZ-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethanol Chemical compound CCCCOCCOCCO OAYXUHPQHDHDDZ-UHFFFAOYSA-N 0.000 description 2
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- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 2
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 2
- VHYFNPMBLIVWCW-UHFFFAOYSA-N 4-Dimethylaminopyridine Chemical compound CN(C)C1=CC=NC=C1 VHYFNPMBLIVWCW-UHFFFAOYSA-N 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 2
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 2
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- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 2
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- 239000003054 catalyst Substances 0.000 description 2
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- 238000010438 heat treatment Methods 0.000 description 2
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 2
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- 239000005453 ketone based solvent Substances 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- OENHRRVNRZBNNS-UHFFFAOYSA-N naphthalene-1,8-diol Chemical compound C1=CC(O)=C2C(O)=CC=CC2=C1 OENHRRVNRZBNNS-UHFFFAOYSA-N 0.000 description 2
- DFQICHCWIIJABH-UHFFFAOYSA-N naphthalene-2,7-diol Chemical compound C1=CC(O)=CC2=CC(O)=CC=C21 DFQICHCWIIJABH-UHFFFAOYSA-N 0.000 description 2
- YNPNZTXNASCQKK-UHFFFAOYSA-N phenanthrene Chemical compound C1=CC=C2C3=CC=CC=C3C=CC2=C1 YNPNZTXNASCQKK-UHFFFAOYSA-N 0.000 description 2
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- 230000003014 reinforcing effect Effects 0.000 description 2
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- 150000003512 tertiary amines Chemical class 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- 239000008096 xylene Substances 0.000 description 2
- LNAZSHAWQACDHT-XIYTZBAFSA-N (2r,3r,4s,5r,6s)-4,5-dimethoxy-2-(methoxymethyl)-3-[(2s,3r,4s,5r,6r)-3,4,5-trimethoxy-6-(methoxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6r)-4,5,6-trimethoxy-2-(methoxymethyl)oxan-3-yl]oxyoxane Chemical compound CO[C@@H]1[C@@H](OC)[C@H](OC)[C@@H](COC)O[C@H]1O[C@H]1[C@H](OC)[C@@H](OC)[C@H](O[C@H]2[C@@H]([C@@H](OC)[C@H](OC)O[C@@H]2COC)OC)O[C@@H]1COC LNAZSHAWQACDHT-XIYTZBAFSA-N 0.000 description 1
- MUTGBJKUEZFXGO-OLQVQODUSA-N (3as,7ar)-3a,4,5,6,7,7a-hexahydro-2-benzofuran-1,3-dione Chemical compound C1CCC[C@@H]2C(=O)OC(=O)[C@@H]21 MUTGBJKUEZFXGO-OLQVQODUSA-N 0.000 description 1
- KMOUUZVZFBCRAM-OLQVQODUSA-N (3as,7ar)-3a,4,7,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C=CC[C@@H]2C(=O)OC(=O)[C@@H]21 KMOUUZVZFBCRAM-OLQVQODUSA-N 0.000 description 1
- KOMNUTZXSVSERR-UHFFFAOYSA-N 1,3,5-tris(prop-2-enyl)-1,3,5-triazinane-2,4,6-trione Chemical compound C=CCN1C(=O)N(CC=C)C(=O)N(CC=C)C1=O KOMNUTZXSVSERR-UHFFFAOYSA-N 0.000 description 1
- GRJWOKACBGZOKT-UHFFFAOYSA-N 1,3-bis(chloromethyl)benzene Chemical compound ClCC1=CC=CC(CCl)=C1 GRJWOKACBGZOKT-UHFFFAOYSA-N 0.000 description 1
- FRASJONUBLZVQX-UHFFFAOYSA-N 1,4-dioxonaphthalene Natural products C1=CC=C2C(=O)C=CC(=O)C2=C1 FRASJONUBLZVQX-UHFFFAOYSA-N 0.000 description 1
- BOKGTLAJQHTOKE-UHFFFAOYSA-N 1,5-dihydroxynaphthalene Chemical compound C1=CC=C2C(O)=CC=CC2=C1O BOKGTLAJQHTOKE-UHFFFAOYSA-N 0.000 description 1
- XQUPVDVFXZDTLT-UHFFFAOYSA-N 1-[4-[[4-(2,5-dioxopyrrol-1-yl)phenyl]methyl]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1CC1=CC=C(N2C(C=CC2=O)=O)C=C1 XQUPVDVFXZDTLT-UHFFFAOYSA-N 0.000 description 1
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 1
- LHENQXAPVKABON-UHFFFAOYSA-N 1-methoxypropan-1-ol Chemical compound CCC(O)OC LHENQXAPVKABON-UHFFFAOYSA-N 0.000 description 1
- LNETULKMXZVUST-UHFFFAOYSA-N 1-naphthoic acid Chemical compound C1=CC=C2C(C(=O)O)=CC=CC2=C1 LNETULKMXZVUST-UHFFFAOYSA-N 0.000 description 1
- VILCJCGEZXAXTO-UHFFFAOYSA-N 2,2,2-tetramine Chemical compound NCCNCCNCCN VILCJCGEZXAXTO-UHFFFAOYSA-N 0.000 description 1
- BSYJHYLAMMJNRC-UHFFFAOYSA-N 2,4,4-trimethylpentan-2-ol Chemical compound CC(C)(C)CC(C)(C)O BSYJHYLAMMJNRC-UHFFFAOYSA-N 0.000 description 1
- CYJQCYXRNNCURD-UHFFFAOYSA-N 2,8-dimethyl-1,3,4,4a,5,9b-hexahydropyrido[4,3-b]indole Chemical compound N1C2=CC=C(C)C=C2C2C1CCN(C)C2 CYJQCYXRNNCURD-UHFFFAOYSA-N 0.000 description 1
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- CQOZJDNCADWEKH-UHFFFAOYSA-N 2-[3,3-bis(2-hydroxyphenyl)propyl]phenol Chemical compound OC1=CC=CC=C1CCC(C=1C(=CC=CC=1)O)C1=CC=CC=C1O CQOZJDNCADWEKH-UHFFFAOYSA-N 0.000 description 1
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- ZRIUUUJAJJNDSS-UHFFFAOYSA-N ammonium phosphates Chemical compound [NH4+].[NH4+].[NH4+].[O-]P([O-])([O-])=O ZRIUUUJAJJNDSS-UHFFFAOYSA-N 0.000 description 1
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- 238000009835 boiling Methods 0.000 description 1
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- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
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- PCILLCXFKWDRMK-UHFFFAOYSA-N naphthalene-1,4-diol Chemical compound C1=CC=C2C(O)=CC=C(O)C2=C1 PCILLCXFKWDRMK-UHFFFAOYSA-N 0.000 description 1
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- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07C—ACYCLIC OR CARBOCYCLIC COMPOUNDS
- C07C69/00—Esters of carboxylic acids; Esters of carbonic or haloformic acids
- C07C69/76—Esters of carboxylic acids having a carboxyl group bound to a carbon atom of a six-membered aromatic ring
- C07C69/78—Benzoic acid esters
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/42—Polycarboxylic acids; Anhydrides, halides or low molecular weight esters thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Medicinal Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Polymers & Plastics (AREA)
- Epoxy Resins (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Macromonomer-Based Addition Polymer (AREA)
Abstract
Description
本發明係關於一種高溫條件下之彈性模數低之活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板。 The present invention relates to an active ester compound having a low elastic modulus under high temperature conditions, a curable composition containing the active ester compound, a cured product thereof, a semiconductor sealing material, and a printed wiring board.
於半導體或多層印刷基板等所使用之絕緣材料之技術領域中,伴隨著各種電子構件之薄型化或小型化,要求開發出匹配該等市場動向之新穎樹脂材料。作為對半導體密封材料所要求之性能,為了提高回流焊性而要求高溫條件下之彈性模數低。此外,硬化物之耐熱性或耐吸濕性當然重要,作為訊號之高速化及高頻化對策,重要的是硬化物之介電常數及介電損耗正切值低,就高溫條件下之可靠性而言,重要的是玻璃轉移溫度(Tg)等物性不會變化,作為伴隨著薄型化之翹曲或變形對策,硬化收縮率或線膨脹係數低等亦較重要。 In the technical field of insulating materials used in semiconductors, multilayer printed boards, etc., along with the thinning or miniaturization of various electronic components, it is required to develop novel resin materials that match these market trends. As a performance required for a semiconductor sealing material, a low elastic modulus under high temperature conditions is required to improve reflow solderability. In addition, the heat resistance or moisture absorption resistance of the hardened material is of course important. As a countermeasure against high-speed and high-frequency signals, it is important that the dielectric constant and dielectric loss tangent of the hardened material are low. In other words, it is important that physical properties such as glass transition temperature (Tg) do not change, and as a countermeasure against warpage or deformation accompanying thinning, it is also important to have a low curing shrinkage rate or a linear expansion coefficient.
作為硬化物之耐熱性或介電特性等優異之樹脂材料,已知有使用異酞酸二(1-萘基酯)作為環氧樹脂之硬化劑之技術(參照下述專利文獻1)。專利文獻1所記載之環氧樹脂組成物藉由使用異酞酸二(α-萘基酯)作為環氧樹脂硬化劑,而與使用苯酚酚醛清漆樹脂之類的習知型環氧樹脂硬化劑之情形相比,硬化物之介電常數或介電損耗正切之值確實較低,但硬化物於高溫條件下之彈性模數並未滿足近年來所要求之等級。又,由於熔融黏度高,故而於半導體密封材料等要求熔融黏度低之用途中使用存在限制。 As a resin material excellent in heat resistance and dielectric properties of a cured product, a technique using isophthalic acid bis (1-naphthyl ester) as a curing agent for an epoxy resin is known (see Patent Document 1 below). The epoxy resin composition described in Patent Document 1 uses isophthalic acid bis (α-naphthyl ester) as an epoxy resin hardener, and uses a conventional epoxy resin hardener such as a phenol novolac resin. Compared with the situation, the value of the dielectric constant or dielectric loss tangent of the hardened material is indeed lower, but the elastic modulus of the hardened material under high temperature conditions does not meet the level required in recent years. In addition, since the melt viscosity is high, there is a limit to use in applications requiring low melt viscosity such as a semiconductor sealing material.
[先前技術文獻] [Prior technical literature]
[專利文獻] [Patent Literature]
[專利文獻1]日本特開2003-82063號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2003-82063
因此,本發明所欲解決之課題在於提供一種高溫條件下之彈性模數低之活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板。 Therefore, an object of the present invention is to provide an active ester compound having a low elastic modulus under high temperature conditions, a curable composition containing the active ester compound, a cured product thereof, a semiconductor sealing material, and a printed wiring board.
本發明人等為了解決上述課題經潛心研究後,結果發現為二羥基萘化合物與芳香族單羧酸或其酸鹵化物(acid halide)之二酯化物的活性酯化合物不僅硬化物於高溫條件下之彈性模數低,而且熔融黏度亦低,從而完成本發明。 The present inventors made intensive studies in order to solve the above-mentioned problems, and as a result, they found that the active ester compound, which is a diester of a dihydroxynaphthalene compound and an aromatic monocarboxylic acid or an acid halide thereof, is not only hardened under high temperature conditions The elastic modulus is low and the melt viscosity is also low, thereby completing the present invention.
即,本發明係關於一種活性酯化合物,其係二羥基萘化合物(a1)與芳香族單羧酸或其酸鹵化物(a2)之二酯化物。 That is, this invention relates to an active ester compound which is a diester of a dihydroxy naphthalene compound (a1) and an aromatic monocarboxylic acid or its acid halide (a2).
本發明進而係關於一種硬化性組成物,其含有上述活性酯化合物及硬化劑。 The present invention further relates to a curable composition containing the above active ester compound and a curing agent.
本發明進而係關於一種硬化物,其係上述硬化性組成物之硬化物。 The present invention further relates to a cured product which is a cured product of the above-mentioned curable composition.
本發明進而係關於一種半導體密封材料,其係使用上述硬化性組成物而成。 The present invention further relates to a semiconductor sealing material using the above-mentioned curable composition.
本發明進而係關於一種印刷配線基板,其係使用上述硬化性組成物而成。 The present invention further relates to a printed wiring board using the above-mentioned curable composition.
根據本發明,可提供一種硬化物於高溫條件下之彈性模數低之活性酯化合物、含有其之硬化性組成物、其硬化物、半導體密封材料及印刷配線基板。 According to the present invention, it is possible to provide an active ester compound having a low elastic modulus of a cured product under high temperature conditions, a curable composition containing the cured ester compound, a cured product thereof, a semiconductor sealing material, and a printed wiring board.
圖1係實施例1中所獲得之活性酯化合物(1)之GPC線圖。 FIG. 1 is a GPC chart of the active ester compound (1) obtained in Example 1. FIG.
以下,對本發明詳細地進行說明。 Hereinafter, the present invention will be described in detail.
本發明之活性酯化合物係二羥基萘化合物(a1)與芳香族單羧酸或其酸鹵化物(a2)之二酯化物。 The active ester compound of the present invention is a diester of a dihydroxynaphthalene compound (a1) and an aromatic monocarboxylic acid or an acid halide (a2) thereof.
上述二羥基萘化合物(a1)例如可列舉:二羥基萘、或於二羥基萘之芳香環上具有1個或多個取代基之二羥基萘化合物。上述取代基例如可列舉:脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基等。上述脂肪族烴基可為直鏈型及支鏈型之任一種,結構中亦可具有不飽和鍵。具體而言,可列舉:甲基、乙基、丙基、丁基、戊基、己基等烷基;環己基等環烷基;乙烯基、烯丙基、炔丙基等含不飽和鍵之基等。上述烷氧基可列舉:甲氧基、乙氧基、丙氧基、丁氧基等。上述鹵素原子可列舉:氟原子、氯原子、溴原子等。上述芳基可列舉:苯基、萘基、蒽基、及於該等之芳香核上取代有上述脂肪族烴基或烷氧基、鹵素原子等之結構部位等。上述芳烷基可列舉:苄基、苯基乙基、萘基甲基、萘基乙基、及於該等之芳香核上取代有上述烷基或烷氧基、鹵素原子等之結構部位等。又,上述二羥基萘化合物(a1)中之兩個羥基之取代位置並 無特別限定。作為一例,可列舉:1,2-二羥基萘、1,3-二羥基萘、1,4-二羥基萘、1,5-二羥基萘、1,6-二羥基萘、1,8-二羥基萘、2,3-二羥基萘、2,6-二羥基萘、2,7-二羥基萘、3,4-二羥基萘等。上述二羥基萘化合物(a1)可單獨地使用1種,亦可併用2種以上。 Examples of the dihydroxynaphthalene compound (a1) include a dihydroxynaphthalene compound and a dihydroxynaphthalene compound having one or more substituents on the aromatic ring of the dihydroxynaphthalene. Examples of the substituent include an aliphatic hydrocarbon group, an alkoxy group, a halogen atom, an aryl group, and an aralkyl group. The aliphatic hydrocarbon group may be any of a linear type and a branched type, and may have an unsaturated bond in the structure. Specific examples include: alkyl groups such as methyl, ethyl, propyl, butyl, pentyl, and hexyl; cycloalkyl groups such as cyclohexyl; and unsaturated bonds such as vinyl, allyl, and propargyl Base etc. Examples of the alkoxy group include methoxy, ethoxy, propoxy, and butoxy. Examples of the halogen atom include a fluorine atom, a chlorine atom, and a bromine atom. Examples of the aryl group include a phenyl group, a naphthyl group, an anthryl group, and a structural site in which an aromatic nucleus is substituted with an aliphatic hydrocarbon group, an alkoxy group, a halogen atom, or the like. Examples of the aralkyl group include a benzyl group, a phenylethyl group, a naphthylmethyl group, a naphthylethyl group, and a structural site in which an aromatic nucleus is substituted with the alkyl group, alkoxy group, or halogen atom. . The substitution positions of two hydroxyl groups in the dihydroxynaphthalene compound (a1) are not particularly limited. Examples include 1,2-dihydroxynaphthalene, 1,3-dihydroxynaphthalene, 1,4-dihydroxynaphthalene, 1,5-dihydroxynaphthalene, 1,6-dihydroxynaphthalene, 1,8- Dihydroxynaphthalene, 2,3-dihydroxynaphthalene, 2,6-dihydroxynaphthalene, 2,7-dihydroxynaphthalene, 3,4-dihydroxynaphthalene, and the like. The said dihydroxynaphthalene compound (a1) may be used individually by 1 type, and may use 2 or more types together.
上述二羥基萘化合物(a1)之中,就成為硬化物於高溫條件下之彈性模數低,且硬化性等亦優異之活性酯化合物之方面而言,較佳為1,6-二羥基萘化合物或2,7-二羥基萘化合物。 Among the dihydroxynaphthalene compounds (a1), 1,6-dihydroxynaphthalene is preferred in terms of being an active ester compound having a low modulus of elasticity of the cured product under high temperature conditions and excellent curing properties. Compound or 2,7-dihydroxynaphthalene compound.
上述芳香族單羧酸或其酸鹵化物(a2)可列舉:苯羧酸、萘羧酸、於該等之芳香核上具有1個或多個脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基等取代基之化合物、及該等之酸鹵化物等。該等可單獨地使用1種,亦可併用2種以上。其中,就成為硬化物於高溫條件下之彈性模數低,且硬化性等亦優異之活性酯化合物之方面而言,較佳為苯羧酸或其鹵化物。因此,作為本發明之活性酯化合物之更佳結構,可列舉下述結構式(1)所表示者。 Examples of the aromatic monocarboxylic acid or its acid halide (a2) include benzenecarboxylic acid, naphthalenecarboxylic acid, and one or more aliphatic hydrocarbon groups, alkoxy groups, halogen atoms, Compounds such as substituents such as alkyl, aralkyl, and the like, such as acid halides. These may be used individually by 1 type, and may use 2 or more types together. Among them, benzenecarboxylic acid or a halide thereof is preferred in terms of being an active ester compound having a low modulus of elasticity under high temperature conditions and excellent curing properties. Therefore, as a more preferable structure of the active ester compound of this invention, the thing represented by the following structural formula (1) is mentioned.
(式中,R1分別獨立地為脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基之任一者,可鍵結於形成萘環之任一碳原子;R2分別獨立地為脂肪族烴基、烷氧基、鹵素原子、芳基、芳烷基之任一者,可鍵結於形成苯環之任一碳原子;m為0或1~6之整數,n為0或1~5之整數) (In the formula, R 1 is each independently an aliphatic hydrocarbon group, an alkoxy group, a halogen atom, an aryl group, or an aralkyl group, and may be bonded to any carbon atom forming a naphthalene ring; R 2 is each independently Is any of an aliphatic hydrocarbon group, an alkoxy group, a halogen atom, an aryl group, and an aralkyl group, and may be bonded to any carbon atom forming a benzene ring; m is an integer of 0 or 1 to 6, and n is 0 or (Integer from 1 to 5)
上述二羥基萘化合物(a1)與芳香族單羧酸或其酸鹵化物 (a2)之反應,例如可藉由在鹼觸媒之存在下於40~65℃左右之溫度條件下進行加熱攪拌之方法進行。反應亦可視需要於有機溶劑中進行。又,亦可於反應結束後,視需要藉由水洗或再沈澱等對反應產物進行精製。 The reaction of the dihydroxynaphthalene compound (a1) with the aromatic monocarboxylic acid or its acid halide (a2) can be performed by heating and stirring at a temperature of about 40 to 65 ° C in the presence of an alkali catalyst. Method. The reaction can also be carried out in an organic solvent as necessary. In addition, after the reaction is completed, the reaction product may be purified by washing with water or reprecipitation, if necessary.
上述鹼觸媒例如可列舉:氫氧化鈉、氫氧化鉀、三乙胺、吡啶等。該等可分別單獨地使用,亦可併用2種以上。又,亦可以3.0~30%左右之水溶液之形式使用。其中,較佳為觸媒能力高之氫氧化鈉或氫氧化鉀。 Examples of the alkali catalyst include sodium hydroxide, potassium hydroxide, triethylamine, and pyridine. These can be used individually or in combination of 2 or more types. It can also be used in the form of an aqueous solution of about 3.0 to 30%. Among them, sodium hydroxide or potassium hydroxide having a high catalytic ability is preferable.
上述有機溶劑例如可列舉:丙酮、甲基乙基酮、甲基異丁基酮、環己酮等酮溶劑;乙酸乙酯、乙酸丁酯、乙酸賽璐蘇(cellosolve acetate)、丙二醇一甲醚乙酸酯、卡必醇乙酸酯等乙酸酯溶劑;賽璐蘇、丁基卡必醇等卡必醇溶劑;甲苯、二甲苯等芳香族烴溶劑;二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯啶酮等。該等可分別單獨地使用,亦可以2種以上之混合溶劑之形式使用。 Examples of the organic solvent include ketone solvents such as acetone, methyl ethyl ketone, methyl isobutyl ketone, and cyclohexanone; ethyl acetate, butyl acetate, cellosolve acetate, and propylene glycol monomethyl ether Acetate solvents such as acetate and carbitol acetate; carbitol solvents such as cellulose and butyl carbitol; aromatic hydrocarbon solvents such as toluene and xylene; dimethylformamide and dimethyl Ethylacetamide, N-methylpyrrolidone and the like. These can be used individually or in the form of a mixture of two or more solvents.
關於上述二羥基萘化合物(a1)與芳香族單羧酸或其酸鹵化物(a2)之反應比例,就以高產率獲得目標之活性酯化合物之方面而言,較佳為相對於上述二羥基萘化合物(a1)所具有之羥基之合計1莫耳,上述芳香族單羧酸或其酸鹵化物(a2)成為0.95~1.05莫耳的比例。 Regarding the reaction ratio of the above-mentioned dihydroxynaphthalene compound (a1) to the aromatic monocarboxylic acid or its acid halide (a2), in terms of obtaining a target active ester compound in a high yield, it is preferably relative to the above-mentioned dihydroxy group. The naphthalene compound (a1) has a total of 1 mol of hydroxyl groups, and the aromatic monocarboxylic acid or its acid halide (a2) has a ratio of 0.95 to 1.05 mol.
上述活性酯化合物之熔融黏度較佳為依據ASTM D4287,利用ICI黏度計所測得之150℃之值為0.01~50dPa‧s之範圍,尤佳為0.01~5dPa‧s之範圍。 The melt viscosity of the above active ester compound is preferably in the range of 0.01 to 50 dPa · s, and more preferably in the range of 0.01 to 5 dPa · s, according to ASTM D4287 and measured at 150 ° C by an ICI viscometer.
本發明之硬化性組成物亦可將上述本發明之活性酯化合物與其他活性酯化合物一併含有。作為上述其他活性酯化合物,可列舉:於分子結構中具有1個酚性羥基之化合物與芳香族多羧酸或其酸鹵化物之酯化物;多羥基苯與芳香族單羧酸或其酸鹵化物之酯化物;於分子結構中具有1個酚性羥基之化合物、芳香族多羧酸或其酸鹵化物及於分子結構中具有2個以上之酚性羥基 之化合物之酯化物;芳香族多羧酸或其酸鹵化物、於分子結構中具有2個以上之酚性羥基之化合物及芳香族單羧酸或其酸鹵化物之酯化物等。 The curable composition of the present invention may contain the above-mentioned active ester compound of the present invention together with other active ester compounds. Examples of the other active ester compounds include ester compounds of a compound having one phenolic hydroxyl group and an aromatic polycarboxylic acid or an acid halide thereof in a molecular structure; polyhydroxybenzene and an aromatic monocarboxylic acid or an acid halide thereof. Esters of compounds; compounds with one phenolic hydroxyl group in the molecular structure, aromatic polycarboxylic acids or their acid halides, and esters of compounds with two or more phenolic hydroxyl groups in the molecular structure; A carboxylic acid or an acid halide thereof, a compound having two or more phenolic hydroxyl groups in a molecular structure, an ester of an aromatic monocarboxylic acid or an acid halide thereof, and the like.
於使用上述其他活性酯化合物之情形時,就充分發揮本發明所起到之效果之方面而言,本發明之活性酯化合物相對於本發明之活性酯化合物與其他活性酯化合物之合計之比例,較佳為80質量%以上,更佳為90質量%以上。又,本發明之活性酯化合物與其他活性酯化合物之調配物之熔融黏度較佳為0.01~50dPa‧s之範圍,尤佳為0.01~5dPa‧s之範圍。調配物之熔融黏度係依據ASTM D4287,利用ICI黏度計所測得之於150℃之值。 In the case of using the other active ester compounds described above, in terms of fully exerting the effects of the present invention, the ratio of the active ester compound of the present invention to the total of the active ester compound of the present invention and other active ester compounds, It is preferably 80% by mass or more, and more preferably 90% by mass or more. In addition, the melt viscosity of the formulation of the active ester compound of the present invention and other active ester compounds is preferably in the range of 0.01 to 50 dPa · s, and particularly preferably in the range of 0.01 to 5 dPa · s. The melt viscosity of the formulation is a value at 150 ° C as measured by an ICI viscometer in accordance with ASTM D4287.
本發明之硬化性組成物含有上述之活性酯化合物及硬化劑。上述硬化劑只要為可與上述活性酯化合物反應之化合物即可,並無特別限定,可應用各種化合物。作為硬化劑之一例,例如可列舉環氧樹脂。 The curable composition of the present invention contains the above-mentioned active ester compound and a curing agent. The hardener is not particularly limited as long as it is a compound capable of reacting with the active ester compound, and various compounds can be applied. An example of the curing agent is epoxy resin.
上述環氧樹脂例如可列舉:苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂、萘酚酚醛清漆型環氧樹脂、雙酚酚醛清漆型環氧樹脂、聯苯酚酚醛清漆型環氧樹脂、雙酚型環氧樹脂、聯苯型環氧樹脂、三苯酚甲烷型環氧樹脂、四苯酚乙烷型環氧樹脂、二環戊二烯-苯酚加成反應型環氧樹脂、苯酚芳烷基型環氧樹脂、萘酚芳烷基型環氧樹脂等。 Examples of the epoxy resin include a phenol novolac epoxy resin, a cresol novolac epoxy resin, a naphthol novolac epoxy resin, a bisphenol novolac epoxy resin, and a biphenol novolac epoxy resin. Resin, bisphenol epoxy resin, biphenyl epoxy resin, triphenol methane epoxy resin, tetraphenol ethane epoxy resin, dicyclopentadiene-phenol addition reaction epoxy resin, phenol aromatic Alkyl epoxy resin, naphthol aralkyl epoxy resin and the like.
於本發明之硬化性組成物中,上述活性酯化合物與硬化劑之調配比例並無特別限定,可視所需之硬化物性能等適當進行調整。作為將環氧樹脂用作硬化劑之情形之調配之一例,較佳為相對於硬化性組成物中之環氧基之合計1莫耳,上述活性酯化合物中之官能基之合計成為0.7~1.5莫耳的比例。 In the curable composition of the present invention, the blending ratio of the active ester compound and the curing agent is not particularly limited, and it may be appropriately adjusted depending on the required properties of the cured product and the like. As an example of the case where an epoxy resin is used as a curing agent, it is preferable that the total of the functional groups in the active ester compound is 0.7 to 1.5 with respect to the total of 1 mol of epoxy groups in the curable composition. Mohr's ratio.
本發明之硬化性組成物亦可進而含有其他樹脂成分。其他樹脂成分例如可列舉:二胺基二苯基甲烷、二伸乙基三胺、三伸乙基四胺、二胺基二苯基碸、異佛爾酮二胺、咪唑、BF3-胺錯合物、胍衍生物等胺化合物;二氰二胺(dicyandiamide)、由次亞麻油酸之二聚物與乙二胺合成之聚醯胺樹脂等 醯胺化合物;鄰苯二甲酸酐、偏苯三甲酸酐(trimellitic anhydride)、焦蜜石酸二酐、順丁烯二酸酐、四氫鄰苯二甲酸酐、甲基四氫鄰苯二甲酸酐、甲基耐地酸酐(methylnadic acid anhydride)、六氫鄰苯二甲酸酐、甲基六氫鄰苯二甲酸酐等酸酐;氰酸酯樹脂;雙馬來亞醯胺樹脂;苯并樹脂;苯乙烯-順丁烯二酸酐樹脂;以二烯丙基雙酚或三聚異氰酸三烯丙酯(triallyl isocyanurate)為代表之含烯丙基之樹脂;多磷酸酯或磷酸酯-碳酸酯共聚物等。該等可分別單獨地使用,亦可併用2種以上。該等其他樹脂成分之調配比例並無特別限定,可視所需之硬化物性能等適當進行調整。 The curable composition of the present invention may further contain other resin components. Examples of other resin components include diaminodiphenylmethane, diethylene triamine, triethylene tetramine, diamino diphenylsulfonium, isophorone diamine, imidazole, and BF 3 -amine. Amines such as complexes and guanidine derivatives; diamine compounds such as dicyandiamide, polyamine resins synthesized from the dimer of linolenic acid and ethylenediamine; phthalic anhydride, Trimellitic anhydride, pyromellitic dianhydride, maleic anhydride, tetrahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methylnadic acid anhydride, methylnadic acid anhydride, Hexahydrophthalic anhydride, methylhexahydrophthalic anhydride and other anhydrides; cyanate resins; bismaleimide resins; benzo Resin; styrene-maleic anhydride resin; allyl-containing resin typified by diallyl bisphenol or triallyl isocyanurate; polyphosphate or phosphate- Carbonate copolymers, etc. These can be used individually or in combination of 2 or more types. The blending ratio of these other resin components is not particularly limited, and may be adjusted as appropriate depending on the required properties of the hardened material.
本發明之硬化性組成物亦可視需要含有硬化促進劑、阻燃劑、無機質填充材、矽烷偶合劑、脫模劑、顏料、乳化劑等各種添加劑。 The hardenable composition of the present invention may optionally contain various additives such as a hardening accelerator, a flame retardant, an inorganic filler, a silane coupling agent, a release agent, a pigment, and an emulsifier.
上述硬化促進劑例如可列舉:磷系化合物、三級胺、咪唑化合物、吡啶化合物、有機酸金屬鹽、路易斯酸、胺錯鹽等。其中,就硬化性、耐熱性、電特性、耐濕可靠性等優異之方面而言,磷系化合物中較佳為三苯基膦,三級胺中較佳為1,8-二氮雜雙環-[5.4.0]-十一烯(DBU),咪唑化合物中較佳為2-乙基-4-甲基咪唑,吡啶化合物中較佳為4-二甲胺基吡啶。 Examples of the hardening accelerator include phosphorus-based compounds, tertiary amines, imidazole compounds, pyridine compounds, metal salts of organic acids, Lewis acids, and amine salts. Among them, triphenylphosphine is preferred among phosphorus-based compounds, and 1,8-diazabicyclo is preferred among tertiary amines in terms of excellent hardenability, heat resistance, electrical characteristics, and humidity resistance reliability. -[5.4.0] -undecene (DBU). Among the imidazole compounds, 2-ethyl-4-methylimidazole is preferred, and among the pyridine compounds, 4-dimethylaminopyridine is preferred.
上述阻燃劑例如可列舉:紅磷、磷酸一銨、磷酸二銨、磷酸三銨、多磷酸銨等磷酸銨、磷醯胺等無機磷化合物;磷酸酯化合物、膦酸化合物、次膦酸(phosphinic acid)化合物、氧化膦(phosphine oxide)化合物、磷烷(phosphorane)化合物、有機系含氮磷化合物、9,10-二氫-9-氧雜-10-磷雜菲-10-氧化物、10-(2,5-二羥基苯基)-10H-9-氧雜-10-磷雜菲-10-氧化物、10-(2,7-二羥基萘基)-10H-9-氧雜-10-磷雜菲-10-氧化物等環狀有機磷化合物,及使其與環氧樹脂或酚樹脂等化合物反應所得之衍生物等有機磷化合物;三化合物、三聚氰酸(cyanuric acid)化合物、異三聚氰酸化合物、啡噻等氮系阻燃劑;聚矽氧油、聚矽氧橡膠、聚矽氧樹脂等聚矽氧系阻燃劑;金屬氫氧化物、金屬 氧化物、金屬碳酸鹽化合物、金屬粉、硼化合物、低熔點玻璃等無機阻燃劑等。於使用該等阻燃劑之情形時,較佳為硬化性組成物中0.1~20質量%之範圍。 Examples of the flame retardant include: inorganic phosphorus compounds such as red phosphorus, monoammonium phosphate, diammonium phosphate, triammonium phosphate, and ammonium polyphosphate; and phosphatidamine; phosphoric acid ester compounds, phosphonic acid compounds, and phosphinic acid ( phosphinic acid compound, phosphine oxide compound, phosphorane compound, organic nitrogen-containing phosphorus compound, 9,10-dihydro-9-oxa-10-phosphaphenanthrene-10-oxide, 10- (2,5-dihydroxyphenyl) -10H-9-oxa-10-phosphaphenanthrene-10-oxide, 10- (2,7-dihydroxynaphthyl) -10H-9-oxa Cyclic organic phosphorus compounds such as -10-phosphaphenanthrene-10-oxide, and organic phosphorus compounds such as derivatives obtained by reacting them with compounds such as epoxy resin or phenol resin; Compound, cyanuric acid compound, isocyanuric acid compound, phenanthrene Iso-nitrogen flame retardants; polysiloxane flame retardants such as silicone oil, silicone rubber, and silicone resin; metal hydroxides, metal oxides, metal carbonate compounds, metal powders, boron compounds, Inorganic flame retardants such as low melting glass. When using these flame retardants, the range of 0.1-20 mass% in a curable composition is preferable.
上述無機質填充材係例如於將本發明之硬化性組成物用於半導體密封材料用途之情形時等進行調配。上述無機質填充材例如可列舉:熔融二氧化矽、結晶二氧化矽、氧化鋁、氮化矽、氫氧化鋁等。其中,就能夠更多地調配無機質填充材之方面而言,較佳為上述熔融二氧化矽。上述熔融二氧化矽可使用破碎狀、球狀之任一種,為了提高熔融二氧化矽之調配量,且抑制硬化性組成物之熔融黏度之上升,較佳為主要使用球狀者。為了進一步提高球狀二氧化矽之調配量,較佳適當地調整球狀二氧化矽之粒度分佈。其填充率較佳為以硬化性組成物100質量份中0.5~95質量份之範圍進行調配。 The said inorganic filler is prepared, for example, when the curable composition of this invention is used for a semiconductor sealing material use. Examples of the inorganic filler include fused silica, crystalline silica, alumina, silicon nitride, and aluminum hydroxide. Among these, in terms of being able to prepare more inorganic fillers, the above-mentioned fused silica is preferred. The fused silica may be either crushed or spherical. In order to increase the blending amount of the fused silica and to suppress an increase in the melt viscosity of the hardening composition, it is preferable to use a spherical one. In order to further increase the amount of spherical silica, it is preferable to appropriately adjust the particle size distribution of the spherical silica. The filling ratio is preferably formulated in a range of 0.5 to 95 parts by mass out of 100 parts by mass of the curable composition.
此外,於將本發明之硬化性組成物用於導電膏等用途之情形時,可使用銀粉或銅粉等導電性填充劑。 When the curable composition of the present invention is used for a conductive paste or the like, a conductive filler such as silver powder or copper powder can be used.
如以上所詳細說明,本發明之活性酯化合物及含有其之硬化性組成物具有硬化物於高溫條件下之彈性模數低之特徵。此外,對樹脂材料所要求之其他一般要求性能亦充分高,如向通用有機溶劑之溶解性或耐熱性、耐吸水性、低硬化收縮性、介電特性等亦優異且熔融黏度低等。因此,除印刷配線基板或半導體密封材料、抗蝕劑材料等電子材料用途以外,亦可廣泛地應用於塗料或接著劑、成型品等用途。 As described in detail above, the active ester compound and the curable composition containing the active ester compound of the present invention have a feature that the cured product has a low elastic modulus under high temperature conditions. In addition, other general required properties required for resin materials are also sufficiently high, such as solubility in general organic solvents or heat resistance, water absorption resistance, low hardening shrinkage, dielectric properties, etc., and low melt viscosity. Therefore, in addition to electronic materials such as printed wiring boards, semiconductor sealing materials, and resist materials, they can also be widely used in applications such as paints, adhesives, and molded products.
於將本發明之硬化性組成物用於印刷配線基板用途或增層接著膜用途之情形時,一般較佳為調配有機溶劑並進行稀釋而使用。上述有機溶劑可列舉:甲基乙基酮、丙酮、二甲基甲醯胺、甲基異丁基酮、甲氧基丙醇、環己酮、甲基賽璐蘇、乙基二乙二醇乙酸酯、丙二醇一甲醚乙酸酯等。有機溶劑之種類或調配量可視硬化性組成物之使用環境而適當調整,例如於印刷配線板 用途中,較佳為甲基乙基酮、丙酮、二甲基甲醯胺等沸點為160℃以下之極性溶劑,較佳為以非揮發分成為40~80質量%之比例使用。於增層接著膜用途中,較佳為使用丙酮、甲基乙基酮、環己酮等酮溶劑;乙酸乙酯、乙酸丁酯、乙酸賽璐蘇、丙二醇一甲醚乙酸酯、卡必醇乙酸酯等乙酸酯溶劑;賽璐蘇、丁基卡必醇等卡必醇溶劑;甲苯、二甲苯等芳香族烴溶劑;二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯啶酮等,較佳為以非揮發分成為30~60質量%之比例使用。 When the curable composition of the present invention is used for a printed wiring board application or a build-up adhesive film application, it is generally preferred to use an organic solvent and dilute it. Examples of the organic solvent include methyl ethyl ketone, acetone, dimethylformamide, methyl isobutyl ketone, methoxypropanol, cyclohexanone, methylcellulose, and ethyl diethylene glycol. Acetate, propylene glycol monomethyl ether acetate, and the like. The type or blending amount of the organic solvent can be appropriately adjusted depending on the use environment of the hardenable composition. For example, in printed wiring board applications, it is preferred that the boiling points such as methyl ethyl ketone, acetone, and dimethylformamide are 160 ° C or lower. The polar solvent is preferably used in such a proportion that the non-volatile content becomes 40 to 80% by mass. In the application of the build-up adhesive film, ketone solvents such as acetone, methyl ethyl ketone and cyclohexanone are preferably used; ethyl acetate, butyl acetate, cellulose acetate, propylene glycol monomethyl ether acetate, and carbidine Acetate solvents such as alcohol acetate; carbitol solvents such as cellulose and butylcarbitol; aromatic hydrocarbon solvents such as toluene and xylene; dimethylformamide, dimethylacetamide, N -Methylpyrrolidone and the like are preferably used at a ratio of 30 to 60% by mass of nonvolatile matter.
又,使用本發明之硬化性組成物製造印刷配線基板之方法例如可列舉如下方法:將硬化性組成物含浸於補強基材中,使之硬化而獲得預浸體,將其與銅箔重疊,進行加熱壓接。上述補強基材可列舉:紙、玻璃布、玻璃不織布、聚芳醯胺(aramid)紙、聚芳醯胺布、玻璃氈、玻璃粗紗布等。硬化性組成物之含浸量並無特別限定,通常較佳以預浸體中之樹脂成分成為20~60質量%之方式進行製備。 In addition, the method for producing a printed wiring board using the curable composition of the present invention includes, for example, a method of impregnating a curable composition into a reinforcing base material and curing it to obtain a prepreg, which is overlapped with a copper foil. Perform thermal compression bonding. Examples of the reinforcing substrate include paper, glass cloth, glass nonwoven cloth, aramid paper, polyaramide cloth, glass felt, glass roving cloth, and the like. The impregnation amount of the curable composition is not particularly limited, and it is usually preferred to prepare the resin composition in the prepreg so that the resin content becomes 20 to 60% by mass.
於將本發明之硬化性組成物用於半導體密封材料用途之情形時,一般較佳為調配無機質填充材。半導體密封材料例如可使用擠出機、捏合機、輥等將調配物進行混合而製備。關於使用所獲得之半導體密封材料成型半導體封裝之方法,例如可列舉:使用澆鑄成型或轉移成形機、射出成型機等將該半導體密封材料進行成形,進而於50~200℃之溫度條件下進行2~10小時加熱之方法,藉由此種方法,可獲得作為成形物之半導體裝置。 When the curable composition of the present invention is used for a semiconductor sealing material, it is generally preferred to mix an inorganic filler. The semiconductor sealing material can be prepared by mixing the formulation with an extruder, a kneader, a roll, or the like, for example. The method of forming a semiconductor package using the obtained semiconductor sealing material includes, for example, forming the semiconductor sealing material using a casting or transfer molding machine, an injection molding machine, and the like, and further performing the operation at a temperature of 50 to 200 ° C. 2 A method of heating for ~ 10 hours. By this method, a semiconductor device as a molded article can be obtained.
[實施例] [Example]
繼而,藉由實施例、比較例對本發明具體地進行說明。實施例中之「份」及「%」之記載只要無特別說明,則為質量基準。 Next, the present invention will be specifically described with reference to examples and comparative examples. The descriptions of "part" and "%" in the examples are based on quality unless otherwise specified.
◆熔融黏度測定法 ◆ Determination of melt viscosity
於本案實施例中,活性酯化合物之熔融黏度係依據ASTM D4287,利用ICI 黏度計測定150℃之熔融黏度所得。 In the examples of this case, the melt viscosity of the active ester compound is obtained by measuring the melt viscosity at 150 ° C. using an ICI viscometer in accordance with ASTM D4287.
實施例1 活性酯化合物(1)之製造 Example 1 Production of Active Ester Compound (1)
於安裝有溫度計、滴液漏斗、冷凝管、分餾管、攪拌器之燒瓶中添加1,6-二羥基萘160g及甲苯1100g,一面對系統內於減壓下進行氮氣置換一面進行溶解。繼而,添加苯甲醯氯218g,一面對系統內於減壓下進行氮氣置換一面進行溶解。添加四丁基溴化銨0.6g,一面吹送氮氣,一面將系統內控制為60℃以下,歷時3小時滴加20%氫氧化鈉水溶液420g。滴加結束後,直接繼續攪拌1小時進行反應。反應結束後,靜置反應混合物,進行分液,去除水層。於殘留之有機層中添加水,進行約15分鐘攪拌混合後,靜置混合物,進行分液,去除水層。將該操作反覆進行至水層之pH值成為7後,利用傾析器脫水將水分及甲苯去除,獲得活性酯化合物(1)。活性酯化合物(1)之熔融黏度為0.11dPa‧s。 160 g of 1,6-dihydroxynaphthalene and 1100 g of toluene were added to a flask equipped with a thermometer, a dropping funnel, a condenser tube, a fractionation tube, and a stirrer, and dissolved while being replaced with nitrogen under reduced pressure in the system. Then, 218 g of benzamidine chloride was added, and the solution was dissolved while being replaced with nitrogen under reduced pressure in the system. 0.6 g of tetrabutylammonium bromide was added, and while blowing nitrogen gas, the inside of the system was controlled to 60 ° C. or lower, and 420 g of a 20% sodium hydroxide aqueous solution was added dropwise over 3 hours. After completion of the dropwise addition, the reaction was continued by directly stirring for 1 hour. After the completion of the reaction, the reaction mixture was left to stand for liquid separation, and the aqueous layer was removed. Water was added to the remaining organic layer, and after stirring and mixing for about 15 minutes, the mixture was left to stand for liquid separation to remove the water layer. This operation was repeated until the pH of the aqueous layer became 7, and then water and toluene were removed by dehydration using a decanter to obtain an active ester compound (1). The melt viscosity of the active ester compound (1) was 0.11 dPa · s.
實施例2 活性酯化合物(2)之製造 Example 2 Production of Active Ester Compound (2)
於安裝有溫度計、滴液漏斗、冷凝管、分餾管、攪拌器之燒瓶中添加2,7-二羥基萘160g及甲苯1100g,一面對系統內於減壓下進行氮氣置換一面進行溶解。繼而,添加苯甲醯氯218g,一面對系統內於減壓下進行氮氣置換一面進行溶解。添加四丁基溴化銨0.6g,一面吹送氮氣,一面將系統內控制為60℃以下,歷時3小時滴加20%氫氧化鈉水溶液420g。滴加結束後,直接繼續攪拌1小時進行反應。反應結束後,靜置反應混合物,進行分液,去除水層。於殘留之有機層中添加水,進行約15分鐘攪拌混合後,靜置混合物,進行分液,去除水層。將該操作反覆進行至水層之pH值成為7後,利用傾析器脫水將水分及甲苯去除,獲得活性酯化合物(2)。活性酯化合物(2)之熔融黏度為0.07dPa‧s。 160 g of 2,7-dihydroxynaphthalene and 1100 g of toluene were added to a flask equipped with a thermometer, a dropping funnel, a condenser tube, a fractionation tube, and a stirrer, and dissolved while being replaced with nitrogen under reduced pressure in the system. Then, 218 g of benzamidine chloride was added, and the solution was dissolved while being replaced with nitrogen under reduced pressure in the system. 0.6 g of tetrabutylammonium bromide was added, and while blowing nitrogen gas, the inside of the system was controlled to 60 ° C. or lower, and 420 g of a 20% sodium hydroxide aqueous solution was added dropwise over 3 hours. After completion of the dropwise addition, the reaction was continued by directly stirring for 1 hour. After the completion of the reaction, the reaction mixture was left to stand for liquid separation, and the aqueous layer was removed. Water was added to the remaining organic layer, and after stirring and mixing for about 15 minutes, the mixture was left to stand for liquid separation to remove the water layer. This operation was repeated until the pH of the aqueous layer became 7, and then water and toluene were removed by dehydration using a decanter to obtain an active ester compound (2). The melt viscosity of the active ester compound (2) was 0.07 dPa · s.
比較製造例1 活性酯化合物(1')之製造 Comparative Production Example 1 Production of Active Ester Compound (1 ')
於安裝有溫度計、滴液漏斗、冷凝管、分餾管、攪拌器之燒瓶中添加間苯二甲醯氯202g及甲苯1250g,一面對系統內於減壓下進行氮氣置換一面進行溶 解。繼而,添加1-萘酚288g,一面對系統內於減壓下進行氮氣置換一面進行溶解。添加四丁基溴化銨0.63g,一面吹送氮氣,一面將系統內控制為60℃以下,歷時3小時滴加20%氫氧化鈉水溶液420g。滴加結束後,直接繼續攪拌1小時進行反應。反應結束後,靜置反應混合物,進行分液,去除水層。於殘留之有機層中添加水,進行約15分鐘攪拌混合後,靜置混合物,進行分液,去除水層。將該操作反覆進行至水層之pH值成為7後,利用傾析器脫水將水分及甲苯去除,獲得活性酯化合物(1')。活性酯化合物(1')之熔融黏度為0.65dPa‧s。 In a flask equipped with a thermometer, a dropping funnel, a condenser, a fractionation tube, and a stirrer, 202 g of m-xylylenedichloride and 1,250 g of toluene were added, and the solution was dissolved while being replaced with nitrogen under reduced pressure in the system. Then, 288 g of 1-naphthol was added, and it dissolved while carrying out nitrogen substitution under reduced pressure in the system. 0.63 g of tetrabutylammonium bromide was added, and while blowing nitrogen gas, the inside of the system was controlled to 60 ° C or lower, and 420 g of a 20% sodium hydroxide aqueous solution was added dropwise over 3 hours. After completion of the dropwise addition, the reaction was continued by directly stirring for 1 hour. After the completion of the reaction, the reaction mixture was left to stand for liquid separation, and the aqueous layer was removed. Water was added to the remaining organic layer, and after stirring and mixing for about 15 minutes, the mixture was left to stand for liquid separation to remove the water layer. This operation was repeated until the pH of the water layer became 7, and then water and toluene were removed by dehydration using a decanter to obtain an active ester compound (1 '). The melt viscosity of the active ester compound (1 ') was 0.65 dPa · s.
實施例3、4及比較例1 Examples 3, 4 and Comparative Example 1
以下述表1所示之比例調配各成分以製造硬化性組成物。使硬化性組成物流入至模框中,使用壓製機於175℃之溫度下進行10分鐘成型。自模框中取出成型物,於175℃之溫度下使之硬化5小時而獲得硬化物。對於硬化物,以下述要領進行評價試驗。將結果示於表1。 Each component is blended at the ratio shown in Table 1 below to produce a curable composition. The hardenable composition was put into a mold frame, and was molded at a temperature of 175 ° C for 10 minutes using a press. The molded article was taken out of the mold frame, and was cured at a temperature of 175 ° C for 5 hours to obtain a cured article. The hardened | cured material was evaluated by the following procedure. The results are shown in Table 1.
高溫條件下之儲存彈性模數之測定 Determination of storage elastic modulus under high temperature conditions
自上述硬化物切出5mm×54mm×2.4mm尺寸之試片。針對試片,使用黏彈性測定裝置(Rheometric公司製造之「固體黏彈性測定裝置RSAII」),於矩形張力法、頻率1Hz、升溫溫度3℃/分鐘之條件測定260℃之儲存彈性模數。 A test piece having a size of 5 mm × 54 mm × 2.4 mm was cut out of the hardened material. For the test piece, a viscoelasticity measuring device ("Solid Viscoelasticity Measuring Device RSAII" manufactured by Rheometric Corporation) was used, and the storage elastic modulus at 260 ° C was measured under conditions of a rectangular tension method, a frequency of 1 Hz, and a temperature rise of 3 ° C / min.
高溫條件下之彎曲彈性模數及彎曲變形之測定 Measurement of flexural modulus and flexural deformation under high temperature conditions
自上述硬化物切出25mm×70mm×2.4mm尺寸之試片。針對試片,使用萬能材料試驗機(英斯特朗公司製造之「5582型」),於試驗速度1.0mm/分鐘、試驗溫度260℃之條件下測定彎曲彈性模數及彎曲變形。 A test piece having a size of 25 mm × 70 mm × 2.4 mm was cut out of the hardened material. For the test piece, a universal material testing machine ("5582" manufactured by Instron) was used, and the bending elastic modulus and bending deformation were measured at a test speed of 1.0 mm / min and a test temperature of 260 ° C.
環氧樹脂(*1):甲酚酚醛清漆型環氧樹脂(DIC股份有限公司製造之「N-655-EXP-S」,環氧當量202g/當量) Epoxy resin (* 1): Cresol novolac epoxy resin ("N-655-EXP-S" manufactured by DIC Corporation, epoxy equivalent 202g / equivalent)
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| KR101350997B1 (en) * | 2012-08-21 | 2014-01-14 | 주식회사 신아티앤씨 | Epoxy compound having excellent electrical properities and manufacturing method thereof |
| TWI572665B (en) * | 2012-10-17 | 2017-03-01 | Dainippon Ink & Chemicals | Active ester resin, epoxy resin composition, cured object thereof, prepreg, circuit board and build-up film |
| CN103408510B (en) * | 2013-07-26 | 2015-12-09 | 深圳先进技术研究院 | Containing naphthalene epoxy resin by using liquid crystal compound, its preparation method and composition |
| JP6376395B2 (en) * | 2014-12-05 | 2018-08-22 | Dic株式会社 | Active ester compound, active ester resin, curable composition, cured product thereof, buildup film, semiconductor sealing material, prepreg, circuit board, and method for producing active ester resin |
| TWI685540B (en) * | 2014-12-15 | 2020-02-21 | 日商迪愛生股份有限公司 | Thermosetting resin composition, its cured product, and active ester resin used therefor |
-
2018
- 2018-05-24 TW TW107117764A patent/TWI820025B/en active
- 2018-06-05 WO PCT/JP2018/021499 patent/WO2019003821A1/en not_active Ceased
- 2018-06-05 CN CN201880042844.9A patent/CN110799483B/en active Active
- 2018-06-05 JP JP2019526745A patent/JP7136095B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2019003821A1 (en) | 2020-04-30 |
| CN110799483B (en) | 2023-04-14 |
| CN110799483A (en) | 2020-02-14 |
| JP7136095B2 (en) | 2022-09-13 |
| TWI820025B (en) | 2023-11-01 |
| WO2019003821A1 (en) | 2019-01-03 |
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