TW201325540A - Endoscope integrated with a light source - Google Patents
Endoscope integrated with a light source Download PDFInfo
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- TW201325540A TW201325540A TW100149218A TW100149218A TW201325540A TW 201325540 A TW201325540 A TW 201325540A TW 100149218 A TW100149218 A TW 100149218A TW 100149218 A TW100149218 A TW 100149218A TW 201325540 A TW201325540 A TW 201325540A
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- 238000003384 imaging method Methods 0.000 claims abstract description 29
- 239000000758 substrate Substances 0.000 claims abstract description 25
- 239000004065 semiconductor Substances 0.000 claims description 9
- 230000004888 barrier function Effects 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 8
- 230000003287 optical effect Effects 0.000 claims description 8
- 230000000903 blocking effect Effects 0.000 claims description 2
- 230000000295 complement effect Effects 0.000 claims description 2
- 239000011521 glass Substances 0.000 claims description 2
- 229910044991 metal oxide Inorganic materials 0.000 claims description 2
- 150000004706 metal oxides Chemical class 0.000 claims description 2
- 239000012780 transparent material Substances 0.000 claims description 2
- 230000003667 anti-reflective effect Effects 0.000 claims 1
- 208000015181 infectious disease Diseases 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000013307 optical fiber Substances 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 210000000056 organ Anatomy 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
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Abstract
Description
本發明係有關一種內視鏡,特別是關於一種內視鏡,其遠端部之晶圓級模組整合有半導體光源。The present invention relates to an endoscope, and more particularly to an endoscope in which a wafer level module at a distal end is integrated with a semiconductor light source.
內視鏡為一種可插入人體器官的儀器,用以檢視器官的內部。內視鏡一般包含有軟管;光源,位於內視鏡近端,藉由光纖以傳遞光線;及透鏡系統,位於內視鏡遠端,用以取得影像,再藉由光纖傳送該影像。An endoscope is an instrument that can be inserted into a human organ to view the interior of an organ. The endoscope typically includes a hose; a light source located at the proximal end of the endoscope to transmit light through the optical fiber; and a lens system located at the distal end of the endoscope for capturing images and transmitting the image by optical fiber.
由於內視鏡的尺寸非常小,使得透鏡系統的製造不易,因而提高整體的成本,並造成使用上的不易普及。此外,如果內視鏡未受到適當的清洗,很容易造成感染。考量到成本及感染等因素,單次使用的可拋式內視鏡應可減緩上述的問題。Since the size of the endoscope is very small, the manufacture of the lens system is not easy, thereby increasing the overall cost and making it difficult to spread in use. In addition, if the endoscope is not properly cleaned, it can easily cause infection. Taking into account factors such as cost and infection, single-use disposable mirrors should alleviate the above problems.
鑑於傳統內視鏡價位偏高或者有感染的風險,因此亟需提出一種新穎的內視鏡,用以克服上述問題。In view of the high price of traditional endoscopes or the risk of infection, it is imperative to propose a novel endoscope to overcome the above problems.
鑑於上述,本發明實施例提出一種內視鏡,其遠端部之晶圓級模組整合有半導體光源,用以降低內視鏡的整體成本。本實施例之內視鏡可適用於可拋式應用,以減少感染。In view of the above, an embodiment of the present invention provides an endoscope having a wafer level module at a distal end integrated with a semiconductor light source for reducing the overall cost of the endoscope. The endoscope of this embodiment can be applied to disposable applications to reduce infection.
根據本發明實施例,內視鏡包含基板、晶圓級成像模組、光源、管件及夾持部。晶圓級成像模組及光源結合於基板的第一表面,且管件的遠端連接於基板的第二表面。經結合之基板、晶圓級成像模組及光源則附著於夾持部。According to an embodiment of the invention, the endoscope includes a substrate, a wafer level imaging module, a light source, a tube, and a clamping portion. The wafer level imaging module and the light source are coupled to the first surface of the substrate, and the distal end of the tube is coupled to the second surface of the substrate. The combined substrate, wafer level imaging module and light source are attached to the clamping portion.
第一A圖及第一B圖分別顯示本發明實施例之內視鏡遠端部的上視圖及側視截面圖。內視鏡的遠端部連接於內視鏡的管件10之遠端。The first A diagram and the first B diagram respectively show a top view and a side cross-sectional view of the distal end portion of the endoscope according to the embodiment of the present invention. The distal end of the endoscope is attached to the distal end of the tube 10 of the endoscope.
在本實施例中,遠端部主要包含基板11、晶圓級成像模組(簡稱成像模組)12、光源13及夾持部14。其中,成像模組12及光源13接合於基板11(例如印刷電路板)的第一(上)表面,經結合的基板11、成像模組12及光源13再附著於夾持部(holder)14。In this embodiment, the distal end portion mainly includes a substrate 11 , a wafer level imaging module (abbreviated as an imaging module) 12 , a light source 13 , and a clamping portion 14 . The imaging module 12 and the light source 13 are bonded to the first (upper) surface of the substrate 11 (for example, a printed circuit board), and the bonded substrate 11, the imaging module 12, and the light source 13 are attached to the holder 14 . .
第二圖顯示成像模組12的透視示意圖。在本實施例中,成像模組12包含晶圓級影像感測器121及晶圓級光學元件122。晶圓級影像感測器121面向基板11,其可以為互補金屬氧化半導體(CMOS)影像感測器(CMOS image sensor,簡稱CIS),但不限定於此。晶圓級光學元件122(例如透鏡)遠離基板11,其材質可為玻璃,但不限定於此。晶圓級影像感測器121及晶圓級光學元件122可藉由黏著劑互相黏合。相較於傳統內視鏡,本實施例的內視鏡使用半導體技術以製造內視鏡的成像系統,可實現低成本的大量製造,且可適用於可拋式內視鏡,以避免感染的可能性。晶圓級模組係使用半導體技術以製造小型化之光學元件,例如晶圓級透鏡模組或照相模組。關於晶圓級成像模組12的製造細節可參考相關文獻,例如Wolterink等人所提出的美國專利第7,564,496號,題為“照像裝置,照像裝置的製造方法,晶圓級封裝(Camera device, method of manufacturing a camera device, wafer scale package)”,其內容視為本說明書的一部分。The second figure shows a perspective schematic view of the imaging module 12. In this embodiment, the imaging module 12 includes a wafer level image sensor 121 and a wafer level optical component 122. The wafer level image sensor 121 faces the substrate 11 and may be a complementary metal oxide semiconductor (CMOS) image sensor (CMOS image sensor, CIS for short), but is not limited thereto. The wafer level optical element 122 (for example, a lens) is away from the substrate 11 and may be made of glass, but is not limited thereto. The wafer level image sensor 121 and the wafer level optical element 122 can be bonded to each other by an adhesive. Compared with the conventional endoscope, the endoscope of the present embodiment uses semiconductor technology to manufacture an imaging system of the endoscope, which can realize mass production at a low cost, and can be applied to a disposable endoscope to avoid infection. possibility. Wafer-level modules use semiconductor technology to fabricate miniaturized optical components, such as wafer-level lens modules or camera modules. For details on the fabrication of the wafer-level imaging module 12, reference is made to the related literature, for example, U.S. Patent No. 7,564,496, to the name of the photographic device, the photographic device, and the wafer-level package. , method of manufacturing a camera device, wafer scale package)", the contents of which are considered as part of this specification.
在本實施例中,光源13包含至少一半導體光源(例如發光二極體)圍繞於成像模組12的四周,如第一C圖所示的基板11上視圖,四個發光二極體等距設於基板11的邊緣。在一例子中,發光二極體13及成像模組12藉由回流(reflow)焊接技術而接合於印刷電路板11。經回流之印刷電路板11再附著於夾持部14的內表面。最後,管件10的遠端連接於印刷電路板11的第二(下)表面。In this embodiment, the light source 13 includes at least one semiconductor light source (for example, a light-emitting diode) surrounding the periphery of the imaging module 12, as shown in the first C-picture, the upper side of the substrate 11, and four light-emitting diodes are equidistant. It is provided on the edge of the substrate 11. In one example, the light emitting diode 13 and the imaging module 12 are bonded to the printed circuit board 11 by reflow soldering techniques. The reflowed printed circuit board 11 is then attached to the inner surface of the nip 14. Finally, the distal end of the tubular member 10 is attached to the second (lower) surface of the printed circuit board 11.
在本實施例中,夾持部14包含外壁14A及內光導14B。其中,外壁14A形成夾持部14的外部,一般係使用不透明材質。內光導14B形成夾持部14的內部,一般係使用透明材質,例如塑膠(例如壓克力)。本實施例的內光導14B引導光源13的光線,使其從遠端部的光出口141射出。夾持部14可具有一開孔14C,位於成像模組12上方並與其對準。相較於傳統內視鏡的光源係位於內視鏡的近端,其藉由光纖以傳遞光線於整個管件,本實施例的內視鏡具有較高的光發射效率,且因為省略了光纖因而具有較低成本。本實施例的外壁14A之內側壁140可選擇性塗佈反射材質,可更增進內光導14B的光線傳遞。類似的情形,成像模組12的外側壁也可選擇性塗佈反射材質,以增進內光導14B的光線傳遞。In the present embodiment, the clamping portion 14 includes an outer wall 14A and an inner light guide 14B. Among them, the outer wall 14A forms the outside of the nip 14 and generally uses an opaque material. The inner light guide 14B forms the inside of the nip 14 and is generally made of a transparent material such as plastic (e.g., acrylic). The inner light guide 14B of the present embodiment guides the light of the light source 13 to be emitted from the light exit 141 of the distal end portion. The clamping portion 14 can have an opening 14C located above and aligned with the imaging module 12. Compared with the light source of the conventional endoscope, which is located at the proximal end of the endoscope, which transmits light to the entire tube by the optical fiber, the endoscope of the embodiment has high light emission efficiency, and since the optical fiber is omitted, Has a lower cost. The inner sidewall 140 of the outer wall 14A of the embodiment can be selectively coated with a reflective material to further enhance the light transmission of the inner light guide 14B. In a similar situation, the outer sidewall of the imaging module 12 can also be selectively coated with a reflective material to enhance the light transmission of the inner light guide 14B.
本實施例還可包含屏障14D,位於內光導14B與成像模組12之間,用以阻隔發散光進入成像模組12的晶圓級影像感測器121。本實施例之屏障14D可使用抗反射或黑色材質。The embodiment may further include a barrier 14D between the inner light guide 14B and the imaging module 12 for blocking the diverging light from entering the wafer level image sensor 121 of the imaging module 12. The barrier 14D of this embodiment may use an anti-reflection or black material.
第三A圖及第三B圖分別顯示本發明另一實施例之內視鏡遠端部的上視圖及側視截面圖。本實施例類似於第一B圖的實施例,不同的地方在於,屏障14D面向內光導14B具有傾斜側壁,因而於傾斜側壁於成像模組12的外表面(假設其垂直於基板11)之間形成一導角。藉此,內光導14B靠近光源13處的截面小於光出口141的截面,因而得以增進光發射均勻度。3A and 3B are respectively a top view and a side cross-sectional view showing the distal end portion of the endoscope according to another embodiment of the present invention. This embodiment is similar to the embodiment of Figure B, except that the barrier 14D faces the inner light guide 14B with a sloped side wall, thus between the sloped sidewalls on the outer surface of the imaging module 12 (assuming it is perpendicular to the substrate 11) Form a lead angle. Thereby, the cross section of the inner light guide 14B near the light source 13 is smaller than the cross section of the light exit 141, thereby improving the uniformity of light emission.
以上所述僅為本發明之較佳實施例而已,並非用以限定本發明之申請專利範圍;凡其它未脫離發明所揭示之精神下所完成之等效改變或修飾,均應包含在下述之申請專利範圍內。The above description is only the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention; all other equivalent changes or modifications which are not departing from the spirit of the invention should be included in the following Within the scope of the patent application.
10...管件10. . . Pipe fittings
11...基板11. . . Substrate
12...晶圓級成像模組12. . . Wafer level imaging module
121...晶圓級影像感測器121. . . Wafer level image sensor
122...晶圓級光學元件122. . . Wafer level optical components
13...光源13. . . light source
14...夾持部14. . . Grip
14A...外壁14A. . . Outer wall
14B...內光導14B. . . Inner light guide
14C...開孔14C. . . Opening
14D...屏障14D. . . barrier
140...內側壁140. . . Inner side wall
141...光出口141. . . Light exit
第一A圖及第一B圖分別顯示本發明實施例之內視鏡遠端部的上視圖及側視截面圖。
第一C圖顯示第一B圖的基板上視圖。
第二圖顯示第一B圖之成像模組的透視示意圖。
第三A圖及第三B圖分別顯示本發明另一實施例之內視鏡遠端部的上視圖及側視截面圖。
The first A diagram and the first B diagram respectively show a top view and a side cross-sectional view of the distal end portion of the endoscope according to the embodiment of the present invention.
The first C-picture shows a top view of the substrate of the first B-picture.
The second figure shows a perspective schematic view of the imaging module of Figure B.
3A and 3B are respectively a top view and a side cross-sectional view showing the distal end portion of the endoscope according to another embodiment of the present invention.
10...管件10. . . Pipe fittings
11...基板11. . . Substrate
12...晶圓級成像模組12. . . Wafer level imaging module
13...光源13. . . light source
14...夾持部14. . . Grip
14A...外壁14A. . . Outer wall
14B...內光導14B. . . Inner light guide
14C...開孔14C. . . Opening
14D...屏障14D. . . barrier
140...內側壁140. . . Inner side wall
141...光出口141. . . Light exit
Claims (16)
一基板;
一晶圓級成像模組,結合於該基板的第一表面;
一光源,結合於該基板的第一表面;
一管件,其遠端連接於該基板的第二表面;及
一夾持部,該結合之基板、晶圓級成像模組及光源附著於該夾持部。An endoscope with integrated light source, comprising:
a substrate;
a wafer level imaging module coupled to the first surface of the substrate;
a light source coupled to the first surface of the substrate;
a tube member having a distal end connected to the second surface of the substrate; and a clamping portion, the bonded substrate, the wafer level imaging module and the light source being attached to the clamping portion.
一晶圓級影像感測器;及
一晶圓級光學元件,接合至該晶圓級影像感測器;
其中該晶圓級影像感測器面向該基板,且該晶圓級光學元件遠離該基板。The endoscope of the integrated light source as described in claim 1, wherein the wafer level imaging module comprises:
a wafer level image sensor; and a wafer level optical component bonded to the wafer level image sensor;
The wafer level image sensor faces the substrate, and the wafer level optical component is away from the substrate.
一外壁;及
一內光導,位於該外壁內,該內光導引導該光源的光線,使其從一光出口射出。An endoscope for integrating a light source as described in claim 1, wherein the clamping portion comprises:
An outer wall; and an inner light guide located within the outer wall, the inner light guide directing light from the light source to exit from a light exit.
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| Application Number | Priority Date | Filing Date | Title |
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| TW100149218A TW201325540A (en) | 2011-12-28 | 2011-12-28 | Endoscope integrated with a light source |
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| TW100149218A TW201325540A (en) | 2011-12-28 | 2011-12-28 | Endoscope integrated with a light source |
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| TW201325540A true TW201325540A (en) | 2013-07-01 |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI567957B (en) * | 2014-05-30 | 2017-01-21 | 榮晶生物科技股份有限公司 | Wafer-level camera modules and manufacturing method thereof |
| CN107361734A (en) * | 2017-07-26 | 2017-11-21 | 浙江百安医疗科技有限公司 | Video vaginal speculum with light compensating apparatus |
| TWI730621B (en) * | 2020-02-11 | 2021-06-11 | 晉弘科技股份有限公司 | Image sensor package and endoscope |
| CN115939156A (en) * | 2021-10-04 | 2023-04-07 | 晋弘科技股份有限公司 | Image sensor package and endoscope |
-
2011
- 2011-12-28 TW TW100149218A patent/TW201325540A/en unknown
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI567957B (en) * | 2014-05-30 | 2017-01-21 | 榮晶生物科技股份有限公司 | Wafer-level camera modules and manufacturing method thereof |
| CN107361734A (en) * | 2017-07-26 | 2017-11-21 | 浙江百安医疗科技有限公司 | Video vaginal speculum with light compensating apparatus |
| TWI730621B (en) * | 2020-02-11 | 2021-06-11 | 晉弘科技股份有限公司 | Image sensor package and endoscope |
| CN115939156A (en) * | 2021-10-04 | 2023-04-07 | 晋弘科技股份有限公司 | Image sensor package and endoscope |
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