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TW201307800A - Method of calibration of a mathematical model of a coordinate measuring machine for the compensation of dynamic errors due to deformation - Google Patents

Method of calibration of a mathematical model of a coordinate measuring machine for the compensation of dynamic errors due to deformation Download PDF

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TW201307800A
TW201307800A TW101124240A TW101124240A TW201307800A TW 201307800 A TW201307800 A TW 201307800A TW 101124240 A TW101124240 A TW 101124240A TW 101124240 A TW101124240 A TW 101124240A TW 201307800 A TW201307800 A TW 201307800A
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probe
deformation
measuring machine
model
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Giampiero Guasco
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Hexagon Metrology Spa
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Abstract

A method of calibration of a mathematical model for the compensation of errors due to dynamic deformation of a measuring machine equipped with a mobile unit able to move a stylus probe in un measuring volume, wherein the model provides, in response to at least one input quantity correlated with a control signal of said drive means (13), a plurality of output quantities comprising at least one component of the measurement error introduced by the deformation and at least one quantity detected by a laser sensor and correlated with the deformation. In the calibration step, the mobile unit is subjected to a movement cycle constituted by small-amplitude oscillations of variable frequency, following the law of sinusoidal motion, keeping the tip of the probe blocked; during the movement cycle, the input and output quantities are sampled and supplied to an algorithm for model identification.

Description

用於因變形而致之動態誤差之補償的座標測量機的數學模型的校準方法 Calibration method for mathematical model of coordinate measuring machine for compensation of dynamic error due to deformation 發明領域 Field of invention

本發明係有關於因變形而致之動態誤差之補償的座標測量機的數學模型的校準方法。 The present invention is directed to a calibration method for a mathematical model of a coordinate measuring machine that compensates for dynamic errors due to deformation.

發明背景 Background of the invention

眾所周知,座標測量機一般地包含三個可沿著一笛卡兒參考系統(Cartesian reference system)之座標軸移動的滑動架並可在測量容積內移動一測量感測器。該機器能夠提供輸出一藉由該測量感測器所探測的工作件之座標,並隨著該等滑動架沿著各別軸之位置變化而加以計算。 As is well known, coordinate measuring machines generally comprise three carriages that are movable along a coordinate axis of a Cartesian reference system and are capable of moving a measurement sensor within the measurement volume. The machine is capable of providing an output of the coordinates of the workpiece detected by the measurement sensor and is calculated as the positions of the carriages vary along the respective axes.

更特定言之,座標測量機包含一底座結構其配備具有一導件係沿著一第一軸運作,例如,一花崗岩或另一材料的一基座或是一圓柱結構,一第一滑動架其可在該基底結構上沿著該第一軸移動,一第二滑動架其係由該第一滑動架承載並可沿著與該第一軸垂直的一第二軸移動以及一第三滑動架其係由該第二滑動架端部承載並可沿著與該第一及第二軸垂直的一第三軸相對於後者移動。該測量感測器係藉由該第三滑動架承載。 More specifically, the coordinate measuring machine includes a base structure equipped with a guide member that operates along a first axis, for example, a base of granite or another material or a cylindrical structure, a first carriage Moving along the first axis on the base structure, a second carriage is carried by the first carriage and movable along a second axis perpendicular to the first axis and a third slide The frame is carried by the second carriage end and is movable relative to the latter along a third axis that is perpendicular to the first and second axes. The measurement sensor is carried by the third carriage.

因此,該第一軸係為水平的;視機器之型式而定,該第二軸可為水平的以及該第三軸係為垂直的,反之亦然。 Thus, the first shaft is horizontal; depending on the type of machine, the second shaft can be horizontal and the third shaft can be vertical, and vice versa.

例如,就橋式或支架式機器而言,該第一滑動架包含一水平交叉構件,其界定該第二滑動架於其上移動的該第 二軸以及該第三滑動架係藉由承載於該第二滑動架上的一垂直可動支柱構成。 For example, in the case of a bridge or scaffolding machine, the first carriage includes a horizontal cross member that defines the portion on which the second carriage moves The two axles and the third carriage are formed by a vertical movable pillar carried on the second carriage.

然而,就水平臂式機器而言,該第一滑動架包含一垂直支柱其界定該第二滑動架所沿著移動的該第二軸以及該第三滑動架係藉由該第二滑動架所承載的一水平移動式水平臂構成。 However, in the case of a horizontal arm machine, the first carriage includes a vertical post that defines the second axis along which the second carriage moves and the third carriage is supported by the second carriage A horizontally movable horizontal arm is carried.

滑動架的移動是藉由使用電動馬達其將驅動力經由合適的運動機構傳送至該等滑動架或,可任擇地,線性電動馬達與該等滑動架本身一體成型而進行。 The movement of the carriage is carried out by using an electric motor to transmit the driving force to the carriages via a suitable motion mechanism or, optionally, the linear electric motor is integrally formed with the carriages themselves.

在越來越短的時間內執行測定週期(measurement cycle)所需之加速度需要高的驅動力,俾以引起由於一動態(慣性)效應的該等機器移動部件的彈性變形。此變形,亦由於該等移動部件之輕量化結構,對於測量準確性係為重要的。 The acceleration required to perform the measurement cycle in a shorter and shorter time requires a high driving force to cause elastic deformation of the moving parts of the machine due to a dynamic (inertia) effect. This deformation is also important for measurement accuracy due to the lightweight structure of the moving parts.

為了保證測量機器的準確性等級,必需評估由於彈性變形所導致的測量誤差並接著加以補償。 In order to ensure the accuracy level of the measuring machine, it is necessary to evaluate the measurement error due to the elastic deformation and then compensate.

US2005/0102118圖示使用雷射以確定並補償在座標測量機由彈性變形所衍生的誤差。一雷射發射器及感測器係佈置在該座標測量機之一可移動元件上,在一參考平面上具有一反射器。藉由位在一側邊上的反射器與位在另一側邊上的放射器及感測器之間相對的移動而執行誤差確定與補償。 US 2005/0102118 illustrates the use of a laser to determine and compensate for errors in the coordinate measuring machine that are derived from elastic deformation. A laser emitter and sensor are disposed on one of the movable elements of the coordinate measuring machine and have a reflector on a reference plane. Error determination and compensation is performed by relative movement between the reflector positioned on one side and the emitter and sensor positioned on the other side.

EP-A-2160565及EP-A-2167912圖示一測量機,其中一雷射感測器係與該機器之一可移動構件結合並提供與該可動單元之動態變形相關聯的數值;該等數值是藉由一數學 模型處理而得以計算及補償由於動態變形的該機器之該等測量誤差。 EP-A-2160565 and EP-A-2167912 illustrate a measuring machine in which a laser sensor is coupled to a movable member of the machine and provides values associated with dynamic deformation of the movable unit; The value is by a mathematics Model processing allows calculation and compensation of such measurement errors of the machine due to dynamic deformation.

於校準步驟中,沿著Y及X軸的位置誤差係直接地藉由,在該參考平面上,安裝一二維位置轉換器,免除機器移動部件的變形以及測量介於藉由該二維位置變換器所探測的該測量之該頭部的位置與由該機器探測的該位置之間的差異。 In the calibration step, the position error along the Y and X axes is directly by mounting a two-dimensional position transducer on the reference plane, excluding deformation of the moving part of the machine and measuring by the two-dimensional position The difference between the position of the head of the measurement detected by the transducer and the position detected by the machine.

至少在橋式機器中,沿著該Z軸的位置誤差,被視為是可忽略的。 At least in bridge machines, positional errors along the Z axis are considered negligible.

發明概要 Summary of invention

本發明之目的在於提供一較簡單且較不昂貴的校準方法,特別地,使能夠避免使用附加的工具,諸如一二維感測器,並且能夠在其之測量方案中搭配該機器執行作業。 It is an object of the present invention to provide a simpler and less expensive calibration method, in particular to enable the avoidance of the use of additional tools, such as a two-dimensional sensor, and to be able to perform work with the machine in its measurement scheme.

前述目的係藉由申請專利範圍第1項之校準方法而達成。 The foregoing object is achieved by the calibration method of claim 1 of the patent application.

圖式簡單說明 Simple illustration

為了對本發明有較佳的瞭解,之後將經由非限定之實例並參考附加圖式說明一些較佳具體實施例,其中:第1圖顯示本發明之一橋式測量機;第2圖係為第1圖之該機器的一前且部分橫截面視圖;第3圖係為第1圖之該機器的一滑動架的一透視及概略視圖,處於一第一動態變形之形式;第4圖係為第3圖之該滑動架的一前及概略視圖,處於 一第二動態變形之形式;第5圖係為使用本發明之該校準方法的該動態變形之一補償方法的一方塊圖;第6圖係為用於實行該補償方法的一模型之一方塊圖;第7圖概略地顯示一測量機與一工具的一探針(stylus);以及第8及9圖顯示與第3圖之該滑動架的一移動週期相關聯的物理量之傾向。 For a better understanding of the present invention, some preferred embodiments will be described by way of non-limiting example and with reference to the accompanying drawings in which: FIG. 1 shows a bridge measuring machine of the present invention; Figure 1 is a front and partial cross-sectional view of the machine; Figure 3 is a perspective and schematic view of a carriage of the machine of Figure 1, in the form of a first dynamic deformation; Figure 4 is the first 3 is a front and a schematic view of the carriage, in a second dynamic deformation form; FIG. 5 is a block diagram of one of the dynamic deformation compensation methods using the calibration method of the present invention; and FIG. 6 is a block diagram of a model for implementing the compensation method Fig. 7 schematically shows a stylus of a measuring machine and a tool; and Figs. 8 and 9 show the tendency of the physical quantity associated with a moving period of the carriage of Fig. 3.

發明之詳細說明 Detailed description of the invention

第1圖顯示一橋式測量機1,其包含一基座5其配備具有一平坦的水平上表面6或參考平面以及一可動單位7。 Figure 1 shows a bridge measuring machine 1 comprising a base 5 equipped with a flat horizontal upper surface 6 or reference plane and a movable unit 7.

該可動單位7包含一位在基座5上沿著該測量容積之一X-Y-Z笛卡兒參考系統的一第一水平軸(Y軸)移動的馬達驅動滑動架8。 The movable unit 7 includes a motor-driven carriage 8 that moves on the base 5 along a first horizontal axis (Y-axis) of the X-Y-Z Cartesian reference system of the measurement volume.

該滑動架8具有一橋式結構以及包含二垂直直立部分8a及8b與一上水平橫越構件8c其係於該等垂直直立部分8a及8b上端部之間延伸。 The carriage 8 has a bridge structure and includes two vertical upright portions 8a and 8b and an upper horizontal traverse member 8c extending between the upper ends of the vertical upright portions 8a and 8b.

位於底部處,鄰近該基座5的縱邊緣,直立部分8a包含一馬達驅動的滑座9在與該Y軸平行的導件11上滑動,並係以一熟知的方式達成。 Located at the bottom, adjacent the longitudinal edge of the base 5, the upright portion 8a includes a motor-driven carriage 9 that slides over the guide 11 parallel to the Y-axis and is accomplished in a well-known manner.

該橫越構件8c承載一滑座10其在導件(未顯示)上沿著與該參考系統之一第二軸(X軸)平行的一軸滑動。 The traverse member 8c carries a carriage 10 that slides on a guide (not shown) along an axis parallel to a second axis (X-axis) of the reference system.

一垂直支柱12,可沿著該參考系統的一第三軸(Z軸)移 動,係安裝在該滑座10上。位於底部處,該垂直支柱12承載一測量感測器3(為已知型式),包含一凸緣30被約束至該支柱12以及一探針31自該凸緣30突出並彈性地加以約束,以一已知方式,讓沿著其本身之軸以及沿著凸緣相互垂直並與該探針之軸垂直的二軸之橫移的可能性較低。該探針31的末端為一球狀尖端32,能夠與待測件相互作用。 a vertical strut 12 movable along a third axis (Z-axis) of the reference system The mechanism is mounted on the carriage 10. Located at the bottom, the vertical strut 12 carries a measurement sensor 3 (in a known version), including a flange 30 constrained to the post 12 and a probe 31 projecting from the flange 30 and resiliently constrained, In a known manner, the likelihood of a traverse of two axes along its own axis and along the flanges perpendicular to each other and perpendicular to the axis of the probe is low. The end of the probe 31 is a spherical tip 32 that is capable of interacting with the member to be tested.

假若該凸緣30係牢牢地固定至該支柱12,則當靜止時,該探針31之該軸係與Z軸平行,以及該探針相關於該凸緣30的三自由度使該尖端32實質上能夠沿著X、Y及Z軸移動。 If the flange 30 is firmly fixed to the post 12, the shaft of the probe 31 is parallel to the Z axis when stationary, and the probe has three degrees of freedom associated with the flange 30. 32 is substantially movable along the X, Y, and Z axes.

可交替地,該凸緣30能夠藉由已知型式且未顯示的具有二轉動軸的一鉸接式裝置或是軸節而安裝在該支柱12上。 Alternatively, the flange 30 can be mounted on the strut 12 by an articulated device or shaft joint having a two-rotation shaft of a known type and not shown.

該滑動架8,滑座10及支柱12係配備各別的馬達13,例如,線性馬達(於第2圖中僅可見到一具),其控制沿著各別座標軸移動。 The carriage 8, the carriage 10 and the struts 12 are provided with respective motors 13, for example, linear motors (only one is visible in Fig. 2), the control of which moves along the respective coordinate axes.

該測量機1係藉由配備具有一動力段14a的一控制單元14加以控制,該動力段提供供電電流IY、IX及IZ至該滑動架8、滑板10及支柱12之各別的電動馬達用於沿著該Y、X及Z軸移動該測量感測器3及因此其之於測量容積內的定位。 The measuring machine 1 is controlled by a control unit 14 having a power section 14a for supplying the supply currents IY, IX and IZ to the respective electric motors of the carriage 8, the slide 10 and the support 12. The measurement sensor 3 and thus its positioning within the measurement volume are moved along the Y, X and Z axes.

該測量機1提供作為輸出-藉由基於已知型式之運算法的軟體-由探測該等滑座沿著各別X、Y及Z軸的位置之於該測量容積中該測量感測器3之位置xa、ya、za。 The measuring machine 1 is provided as an output - by means of a software based on a known type of operation - by measuring the position of the carriages along the respective X, Y and Z axes in the measuring volume of the measuring sensor 3 The position is xa, ya, za.

於上述的操作情況下,該測量感測器3的位置係受與該等測量值xa、ya、za有關的動態位置誤差ex、ey、ez所影響,因為支撐該測量感測器3的該可動單元7之機械結構(主要地為垂直直立部分8a,該橫越構件8c以及介於該直立部分的8a之上端部與橫越構件8c之間的連結區域)經受由於由移動滑座8及10的該等電動馬達所壓下的力量。 In the above operation, the position of the measuring sensor 3 is affected by the dynamic position errors ex, ey, ez associated with the measured values xa, ya, za, because the measuring sensor 3 is supported. The mechanical structure of the movable unit 7 (mainly the vertical upright portion 8a, the traverse member 8c and the joint region between the upper end portion of the upright portion 8a and the traverse member 8c) is subjected to the movement of the slide 8 and The force of 10 of these electric motors.

於第3及4圖中例示該測量機1之該可動單元7的變形。 The deformation of the movable unit 7 of the measuring machine 1 is illustrated in Figs. 3 and 4.

第3圖顯示由該滑動架8沿著y軸移動所導致的變形。此變形主要地包含:●該直立部分8a之彎曲;●橫越構件8c之彎曲;●該直立部分8a環繞該Z軸之扭轉;以及●該橫越構件8c環繞該X軸之扭轉。 Figure 3 shows the deformation caused by the carriage 8 moving along the y-axis. This deformation mainly comprises: • bending of the upright portion 8a; • bending of the traverse member 8c; • twisting of the upright portion 8a around the Z axis; and • twisting of the traverse member 8c about the X axis.

第4圖替代地顯示滑座10沿著X軸移動所導致的變形。 Figure 4 instead shows the deformation caused by the carriage 10 moving along the X axis.

此變形主要地包含:●該直立部分8a與該橫越構件8c之間該接頭的變形;●該橫越構件8c的彎曲。 This deformation mainly includes: - deformation of the joint between the upright portion 8a and the traverse member 8c; - bending of the traverse member 8c.

●該直立部分8a環繞該Y軸之轉動;以及●該橫越構件8c沿著該X軸之平移。 - the rotation of the upright portion 8a about the Y axis; and - the translation of the traverse member 8c along the X axis.

一雷射感測器16亦安裝在該測量機1上以提供在該滑動器8及滑座10移動期間該可動單元7所承受的動態變形的資訊(就變形而言,見參考第3及4圖所作之說明)。 A laser sensor 16 is also mounted on the measuring machine 1 to provide information on the dynamic deformation of the movable unit 7 during movement of the slider 8 and the slider 10. (For the sake of deformation, see reference 3 and 4 instructions made).

特別地參考第2圖,該雷射感測器16係包覆於該橫越構件8c之該縱向腔室24中,以及一靶28其係佈置位於該腔室 24之該相對端部處。該發射器22發射一雷射光束26其與該X軸平行地行進通過該腔室24並擊中靶28。 Referring specifically to Figure 2, the laser sensor 16 is wrapped in the longitudinal chamber 24 of the traverse member 8c, and a target 28 is disposed in the chamber. At the opposite end of the 24th. The emitter 22 emits a laser beam 26 that travels through the chamber 24 in parallel with the X-axis and hits the target 28.

該發射器22係權宜地由一垂直棒20支撐,儘可能堅固,其在直立部分8a的一垂直腔室19內部延伸並具有一第一較低端部20a堅固地固定至該滑座9(並因此避免該垂直的直立部分8a之變形)以及一第二上端部其係自垂直部分8a突出進入該橫越構件8c的該腔室24,其中該雷射發射器22裝置係經固定。 The transmitter 22 is conveniently supported by a vertical bar 20 as strong as possible, extending inside a vertical chamber 19 of the upright portion 8a and having a first lower end 20a rigidly secured to the carriage 9 ( And thus avoiding deformation of the vertical upright portion 8a) and a second upper end portion projecting from the vertical portion 8a into the chamber 24 of the traverse member 8c, wherein the laser emitter 22 device is secured.

該靶28係由一PSD(為所熟知型式的位置感測裝置)所組成,該裝置探測該雷射光束26沿著二軸與該參考系統之Y與Z軸平行地之入射點的位移,隨著該機械結構之變形而變化,與和一未變形情況相對應的一參考位置有關。 The target 28 is comprised of a PSD (which is a position sensing device of the well-known type) that detects the displacement of the laser beam 26 along an incident point of the two axes parallel to the Y and Z axes of the reference system, As the mechanical structure changes, it is related to a reference position corresponding to an undeformed condition.

探測到在靶28上沿著Y及Z軸的雷射光束之位移my、mz,連同其他資訊,使能夠往回追縱(例如,藉用下文中所說明的技術)由於該機械結構在Y及Z軸移動所承受的動態變形。 Detecting the displacements my, mz of the laser beam along the Y and Z axes on the target 28, along with other information, enables tracking back (eg, borrowing the techniques described below) due to the mechanical structure in Y And the dynamic deformation of the Z-axis movement.

於一最初的校準步驟(方塊100,第2圖)中,所定義的一輸入-輸出模型M其說明該測量機1之該動態行為(此步驟亦係定義為模型辨識)。 In an initial calibration step (block 100, Figure 2), an input-output model M is defined which illustrates the dynamic behavior of the measuring machine 1 (this step is also defined as model identification).

該輸入-輸出模型M(第6圖)係為多變數的並具有作為輸入(u)的該等馬達之供給電流用於控制沿著各別X及Y軸的移動以及作為輸出(y)的複數量其包括由該測量機之該等軸所獲得的該測量感測器3之位置xa、ya,由由該測量機1沿著X與Y軸之彈性所產生的位置誤差ex、ey以及由雷射感 測器16所測量的該測量機之變形my、mz。於橋式機中該ez誤差可被視為微不足道的。 The input-output model M (Fig. 6) is multivariable and has supply currents for the motors as inputs (u) for controlling movement along the respective X and Y axes and as output (y) The complex number includes the position xa, ya of the measuring sensor 3 obtained by the axes of the measuring machine, the position error ex, ey generated by the elasticity of the measuring machine 1 along the X and Y axes, and Sense of lightning The deformation of the measuring machine measured by the detector 16 is my, mz. This ez error can be considered negligible in a bridge machine.

由於針對小擾動的線性現象,整個模型分解成二模型:一第一模型M1,其接收作為Y軸馬達的輸入電流Iy並提供作為輸出沿著Y軸的位置ya,以及沿著Y及Z軸的位置錯誤ey,ex及變形測量my,mz;以及一第二模型M2,完全地與模型M1等效,其所接收作為X軸馬達的電流Ix輸入並提供作為輸出沿著X軸的位置xa,以及位置誤差ey、ex和沿著Y及Z軸的變形測量my,mz。 Due to the linear phenomenon for small disturbances, the entire model is decomposed into two models: a first model M1 that receives the input current Iy as a Y-axis motor and provides the position ya along the Y-axis as an output, along the Y and Z axes. The position error ey, ex and the deformation measurement my, mz; and a second model M2, completely equivalent to the model M1, which is received as the current Ix input of the X-axis motor and provided as the output position xa along the X-axis And the position error ey, ex and the deformation along the Y and Z axes measure my, mz.

事實上,當沿著其中一軸施加應力時,具有沿著相同軸的一相對應之主要誤差作用以及沿著該正交軸的一次要作用(由於該等機械聯結器)。該測量機之所有的誤差係藉由對由該二模型所提供的該等誤差作用應用疊加之原理而得(此部分將進一步加以解釋)。 In fact, when stress is applied along one of the axes, there is a corresponding primary error effect along the same axis and a primary effect along the orthogonal axis (due to the mechanical couplers). All of the errors of the measuring machine are obtained by applying the superposition principle to the error effects provided by the two models (this section will be further explained).

假若亦希望將沿著Z軸之誤差列入考慮,則模型M1及M2亦將必需提供該ez誤差作為輸出並且其將需提供一第三模型M3,與模型M1及M2等效,其接收作為輸入該Z軸馬達之電流Iz,以及提供作為輸出沿著Z軸的位置za,及位置錯誤ey,ex,ez和沿著Y及Z軸的變形測量my,mz。 If it is also desired to take into account the error along the Z-axis, then the models M1 and M2 will also have to provide the ez error as an output and it will need to provide a third model M3, equivalent to the models M1 and M2, which are received as The current Iz of the Z-axis motor is input, and the position za as the output along the Z-axis, and the position error ey, ex, ez and the deformation measurements my, mz along the Y and Z axes are provided.

以下將相關於其中之一軸(該Y軸)說明該第一模型M1之定義,就相關於另一軸(X軸)的該第二模型M2之定義的方法而言係完全相同的。 The definition of the first model M1 will be described below with respect to one of the axes (the Y-axis), which is identical for the method of defining the second model M2 with respect to the other axis (X-axis).

如已說明,模型M1具有電流Iy作為輸入量u。該輸出量y係為: ●由測量機1提供沿著Y軸的位置ya;●藉由由該雷射感測器16所測量沿著Y及Z軸的變形my、mz;以及●藉由該二維位置轉換器15測量沿著Y及Z軸的位置誤差ey、ex。 As already explained, the model M1 has a current Iy as an input quantity u. The output y is: The position ya along the Y-axis is provided by the measuring machine 1; the deformations my, mz along the Y and Z axes measured by the laser sensor 16; and the two-dimensional position converter 15 The positional errors ey, ex along the Y and Z axes are measured.

表現模型M1特性的微分方程式係為:x=Ax+Bu+ The differential equation for the performance model M1 is: x = Ax + Bu +

y=Cx+Du+ε其中u係為該測量的輸入(輸入至該馬達的電流Iy),y該輸出量,x該動態變數以及ε代表發明由該辨識所導致的創新處理方法。最後,A、B、C、D及K係為該模型之矩陣。特別地u=[Iy] y = Cx + Du + ε where u is the input to the measurement (current Iy input to the motor), y the output, x the dynamic variable and ε represent the innovative processing method resulting from the identification of the invention. Finally, A, B, C, D, and K are the matrices of the model. Especially u =[ Iy ]

關於該創新處理方法之定義,參考由Lennart Ljung所寫書名為“系統辨識-供使用者所用的理論”,由Prentice Hall,Upper Saddle River,N.J.1999出版。 For a definition of this innovative approach, reference is made to the book entitled "System Identification - Theory for Users" by Lennart Ljung, published by Prentice Hall, Upper Saddle River, N.J.1999.

於校準步驟中,測量機係接受一系列導致動態誤差ex、ey(假設ez誤差可忽略)的工作週期,其可如以下所述方便地加以測量。 In the calibration step, the measuring machine accepts a series of duty cycles that result in dynamic errors ex, ey (assuming the ez error is negligible), which can be conveniently measured as described below.

一工具15(第7圖)係固定在該參考平面6上並配備一上腔室35,較佳地為圓錐形,經組配以接受該感測器3之尖端32而大體上無任何側向移動,以致該尖端32在X與Y座標軸的每一方向上受限制位於該腔室35中。 A tool 15 (Fig. 7) is attached to the reference plane 6 and is provided with an upper chamber 35, preferably conical, assembled to receive the tip 32 of the sensor 3 without substantially any side The movement is such that the tip 32 is constrained in the chamber 35 in each direction of the X and Y coordinate axes.

假若亦希望考慮到ez誤差,則尖端32亦必需限制在方向Z上,例如藉磁性引力。為此,該探針31之尖端32係為磁性的且該工具15係由鐵磁性材料製成是為必要的。 If it is also desirable to take into account the ez error, the tip 32 must also be constrained in the direction Z, such as by magnetic attraction. To this end, it is necessary that the tip 32 of the probe 31 is magnetic and that the tool 15 is made of a ferromagnetic material.

如所熟知,由一測量機所進行的一點之測量係藉由該 測量機軸xa,ya,za的讀數以及該探針31沿著三軸(亦即,凸緣中心-尖端中心向量)之撓曲分量(xd、yd、zd)的總和加以定義。 As is well known, the measurement by a measuring machine is performed by the point The reading of the measuring machine axes xa, ya, za and the sum of the deflection components (xd, yd, zd) of the probe 31 along the three axes (i.e., the flange center-tip center vector) are defined.

x=xa+xd;y=ya+yd;z=za+zd x=xa+xd;y=ya+yd;z=za+zd

假若該感測器3之尖端32係受限制,則略去動態彈性變形,該測量機軸(xa、ya、za)的讀數以及該探針31沿著三軸的每一軸的撓曲(xd、yd、zd)之總和係為不變的是持續的,藉由尖端32沿著討論中該軸之協調而定義。 If the tip 32 of the sensor 3 is constrained, the dynamic elastic deformation is omitted, the reading of the measuring machine shaft (xa, ya, za) and the deflection of the probe 31 along each of the three axes (xd, The sum of yd, zd) is constant and constant, defined by the coordination of the tip 32 along the axis in the discussion.

假若該參考系統係選擇在該尖端的中心處作為原點,則xa+xd=0;ya+yd=0;za+zd=0 If the reference system is selected as the origin at the center of the tip, then xa+xd=0; ya+yd=0; za+zd=0

由於該測量機結構的彈性變形,所以實際上該測量機軸的讀數係受該等位置誤差ex、ey、ez所影響並因此之該等先前的數學式變為:xa+ex+xd=0;ya+ey+yd=0;za+ez+zd=0由其容易計算隨著該等測量機軸之讀數與探針之撓曲變化的該等誤差ex=-(xa+xd);ey=-(ya+yd);ez=-(za+zd) Due to the elastic deformation of the measuring machine structure, the reading of the measuring machine shaft is actually affected by the positional errors ex, ey, ez and thus the previous mathematical formula becomes: xa+ex+xd=0; Ya+ey+yd=0; za+ez+zd=0 is easily calculated by the error of the reading of the measuring machine axis and the deflection of the probe ex=-(xa+xd); ey=- (ya+yd);ez=-(za+zd)

為實行模形M1之校準,該感測器3係接受該測量機之該可動單元所造成的一移動週期,其包含,例如,根據正弦運動定律之沿著方向Y的小振幅之振盪。 To perform the calibration of the mold M1, the sensor 3 receives a movement period caused by the movable unit of the measuring machine, which includes, for example, an oscillation of a small amplitude along the direction Y according to the sinusoidal motion law.

為了說明該測量機的動態性能是係隨著激發頻率而改變,以在權宜地低於5 Hz以下的一最小值,例如1 Hz,與權宜地大於50 Hz的一最大值,例如120 Hz,之間的可變頻 率執行該移動週期(第8圖)。 To illustrate that the dynamic performance of the measuring machine is a function of the excitation frequency, which is expediently below a minimum of 5 Hz, such as 1 Hz, and expediently greater than a maximum of 50 Hz, for example 120 Hz, Variable frequency between The rate is executed (Figure 8).

較佳地,該移動週期係在該最小頻率下開始(例如1 Hz);該頻率係以一連續方式逐步地增加直至達到最大值(例如120 Hz-第9圖)為止。 Preferably, the movement period begins at the minimum frequency (e.g., 1 Hz); the frequency is gradually increased in a continuous manner until a maximum value (e.g., 120 Hz - Figure 9) is reached.

在低頻率下(例如上至40-50 Hz),當探針之尖端係受限制時,該移動之振幅主要地係藉由該探針31相對於該凸緣30的相對移動之限制而決定。 At low frequencies (e.g., up to 40-50 Hz), when the tip of the probe is constrained, the amplitude of the movement is primarily determined by the relative movement of the probe 31 relative to the flange 30. .

在較高頻率下,該移動的振幅必需降低以在馬達控制的線性範圍內作業(第9圖)。 At higher frequencies, the amplitude of this movement must be reduced to operate within the linear range of motor control (Figure 9).

在校準步驟期間,該等輸入量u及輸出量y係經取樣,例如具有一500微秒的取樣頻率案例頻率,並儲存。 During the calibration step, the input quantity u and the output quantity y are sampled, for example, having a sampling frequency of 500 microseconds, and stored.

輸入與輸出量之樣本係供給至一辨識運算法,利用一最大概似法應用到一線性創新模型,其之特徵在於一5倍的矩陣A、B、C、D及E辨識該M1輸入-輸出模型,如由上述微分方程式的系統加以說明(針對最大概似運算法參考之定義可見由Lennart Ljung所寫書名為“系統辨識-使用者所用之理論”由Prentice Hall,Upper Saddle River,N.J.1999出版)。 The input and output samples are supplied to a recognition algorithm, which is applied to a linear innovation model using a most approximate method, which is characterized by a 5x matrix A, B, C, D, and E identifying the M1 input - The output model, as illustrated by the system of differential equations above (for the definition of the most approximate algorithm reference, the book titled "System Identification - The Theory Used by the User" by Lennart Ljung" by Prentice Hall, Upper Saddle River, NJ 1999 publishing).

嚴格地說,就整個該測量機之該測量容積而言該模型並非固定不變的,實行許多與上述相似的複數校準步驟以涵蓋該全部的測量容積。 Strictly speaking, the model is not fixed for the entire measurement volume of the measuring machine, and a number of complex calibration steps similar to those described above are carried out to cover the entire measuring volume.

與X與Z軸有關的該模型之變化性,其係為何該測量容積係權宜地劃分成複數段(例如,劃分成9段:底部-左,底部-中心,底部-右,中心-左,...)其中各別的模型M1a,M1b, M1c,...M1n已加以定義。 The variability of the model associated with the X and Z axes, which is why the measurement volume is expediently divided into complex segments (eg, divided into 9 segments: bottom-left, bottom-center, bottom-right, center-left, ...) where the respective models M1a, M1b, M1c,...M1n has been defined.

一綜合性模型M1comp1因而能被定義為接近該測量容積中不同的模型M1a,M1b,M1c,...M1n。 A comprehensive model M1comp1 can thus be defined as being close to different models M1a, M1b, M1c, ... M1n in the measured volume.

特別地,已發現的是於該測量容積中不同模型的矩陣A,B,C,D及K大體上係為固定不變的,而於該測量容積中僅有部分之矩陣C改變。 In particular, it has been found that the matrices A, B, C, D and K of the different models in the measured volume are substantially fixed, while only a portion of the matrix C in the measured volume changes.

該綜合性模型M1comp1因此包含該等矩陣A,B,C,D及K其在該測量容積中並未改變以及一矩陣C具有可變參數的一部分(與該等ex,ey誤差信號相對應的該等列),其係根據X及Z軸之座標並因而在該測量容積中為可變的:C=C(xa,za)此函數C=C(xa,za)係為一與X及Z軸相關的非線性函數並係藉由內插於具有b平滑曲線函數(b-spline function)的該工作容積之不同段中該等不同模型M1a,M1b,M1c,...M1n的C矩陣而得(關於該平滑曲線(spline)函數的定義,參考由M.Broen,C Harris所著,書名“類神經模糊適應性模擬與控制(Neurofuzzy Adaptive Modelling and Control”,Prentice Hall International(UK)Limited 1994出版)。 The comprehensive model M1comp1 thus comprises the matrices A, B, C, D and K which do not change in the measured volume and a matrix C which has a part of the variable parameters (corresponding to the ex, ey error signals) The columns are based on the coordinates of the X and Z axes and are thus variable in the measured volume: C=C(xa,za). This function C=C(xa,za) is one and X and The Z-axis related nonlinear function is a C matrix of the different models M1a, M1b, M1c, ... M1n interpolated in different segments of the working volume having a b-spline function. (For the definition of the smoothing function, reference is made by M. Broen, C Harris, title "Neurofuzzy Adaptive Modelling and Control", Prentice Hall International (UK) Limited Published in 1994).

在代表該特別的測量機經校準之“簽名”的該綜合性模型M1comp1之定義之後,步驟100之後進行步驟200其中一估測過濾器1係經設計由該綜合性模型M1comp1開始。 After the definition of the comprehensive model M1comp1 representing the calibrated "signature" of the particular measuring machine, step 100 is followed by step 200 in which an estimated filter 1 is designed to begin with the comprehensive model M1comp1.

針對此設計步驟,以以下形式代表該M1comp1模型(在該時域中以一各別方式的一相似表示係為可行的): x=Ax+Bu+Kε y=C1x+D1u z=C2x+D2u其中: u=[Iy] For this design step, the M1comp1 model is represented in the following form (a similar representation in a different way in the time domain is feasible): x = Ax + Bu + Kε y = C 1 x + D 1 u z = C 2 x + D 2 u where: u = [ Iy ]

在輸出範圍內,介於該等測量者(在上列系統中以符號y表示)與該等不需測量者之間的差別,僅是評價的目的(在上列系統中以符號z表示)。 Within the output range, the difference between these measurers (represented by the symbol y in the above system) and those who do not need to be measured is only the purpose of the evaluation (indicated by the symbol z in the above system) .

矩陣C1包含矩陣C之首先三列以及矩陣C2包含矩陣C之最後二列。相似地,矩陣D1包含矩陣D之首先三列以及矩陣D2包含矩陣D之最後二列。 The matrix C1 contains the first three columns of the matrix C and the matrix C2 contains the last two columns of the matrix C. Similarly, matrix D1 contains the first three columns of matrix D and matrix D2 contains the last two columns of matrix D.

關於該測量容積之可變性,根據該模型之新的表示,僅C2矩陣係有效地為X與Z軸之位置的函數,而所有其他矩陣係為常數:C2=C2(xa,za) Regarding the variability of the measured volume, according to the new representation of the model, only the C2 matrix is effectively a function of the position of the X and Z axes, while all other matrixes are constant: C2 = C2(xa, za)

該估測過濾器1係根據先前確認的綜合性模型M1comp1設計具有健全過濾性的分析技術(就這一點而言,參考由P.Colaneri,A.Locatelli及J.C.Jeromel所著書名為“控制理論與設計,RH2-RH-inf觀點(Control theory and design,a RH2-RH-inf viewpoint)”,出版者Academic Press,1997)。 The estimation filter 1 is based on a previously validated comprehensive model M1comp1 to design an analytical technique with robust filtering (in this regard, reference is made to P. Colaneri, A. Locatelli and JC Jeromel under the title "Control Theory and Design, RH2-RH-inf viewpoint, published by Academic Press, 1997).

容許改良估測器準確的有效技術在於接受該過濾器提供一時間延遲估計(內插法)。此技術,例如,係於由P.Bolzerem,P.Colaneri及G.De Nicolao所著文章中說明標題為“離散時間H-Infinity固定延遲平滑(Discrete-Time H-Infinity fixed lag smoothing)”IEEE Trans.On Signal Processing,Vol.52,No.1,pp.132-141,2004。 An efficient technique that allows the improved estimator to be accurate is to accept the filter to provide a time delay estimate (interpolation). This technique, for example, is described in an article by P. Bolzerem, P. Colaneri and G. De Nicolao entitled "Discrete-Time H-Infinity fixed lag smoothing" IEEE Trans . On Signal Processing, Vol. 52, No. 1, pp. 132-141, 2004.

易言之,就時間(t)而言該估測器提供與時間有關之該動態變形(t-Delta)的評估。Delta係為一時間延遲其係足夠而不會危及該測量機進行立即可取得之測量的效率,但係足夠大以改良該評估的準確性。實務上,已發現的是Delta之值係等於數百分之一秒係為適合的。 In other words, in terms of time (t), the estimator provides an assessment of the time-dependent dynamic deformation (t-Delta). Delta is a time delay that is sufficient to jeopardize the efficiency of the measurement machine's immediately available measurements, but is large enough to improve the accuracy of the evaluation. In practice, it has been found that the value of Delta is equal to a few hundredths of a second.

回應該經測量的輸入值u及輸出量y(沿著y軸之測量ya 及變形值my,mz),估測過濾器 1提供一誤差之評估。 The measured input value u and the output y (measured along the y-axis and the deformation value my, mz), the estimated filter 1 Provide an assessment of the error.

該估測過濾器 1以該等方程式表示: 其中y係為藉由該測量機所測量之該等輸出的向量以及u係為該等輸入的向量,以及其中該等矩陣Â,係為設計估測器從矩陣A,B,K,C1,D1開始,根據上述提及的健全過濾技術開始的結果。 Estimated filter 1 is expressed in these equations: Where y is the vector of the outputs measured by the measuring machine and u is the vector of the inputs, and wherein the matrices  This is the result of the design estimator starting with the matrix A, B, K, C1, D1, according to the robust filtering technique mentioned above.

如此,該估測過濾器 1提供作為輸出之該誤差的動態評估。 So, the estimation filter 1 provides a dynamic assessment of this error as an output.

於其之定義之後,一線性型式的估測過濾器 1之該等矩陣係經儲存並整合於該測量機測量軟體中用於評估未知誤差(方塊400)。 After its definition, a linear type of estimation filter The matrices of 1 are stored and integrated into the measuring machine measurement software for evaluating unknown errors (block 400).

針對一模型M2之定義(以及如有必要的M3)及一估測過濾器 2(以及如有必要的 3),重複上述該等運算,相關於該ex誤差((以及如有必要的ez)作了適當修正。 For a model M2 definition (and M3 if necessary) and an estimation filter 2 (and if necessary 3), repeating the above operations, with appropriate corrections associated with the ex error (and (if necessary).

特別地,針對模型M2之定義,該感測器3係因該測量機之該可動單元沿著方向X承受小振幅振盪,使用如相關於模型M1說明的正弦曲線運動定律及可變頻率。 In particular, for the definition of the model M2, the sensor 3 is subjected to small amplitude oscillations in the direction X due to the movable unit of the measuring machine, using a sinusoidal motion law and a variable frequency as explained in relation to the model M1.

源自於該等過濾器 1及 2(以及如有必要的 3)的結果係根據疊加原理而添加在一起。 From these filters 1 and 2 (and if necessary The results of 3) are added together according to the superposition principle.

上述說明的方法係為如何分析地使用測量my,mz以評估該測量機之動態性能的一非限定實例。本質上,能夠使 用適於該目地的任何其他分析方法。 The method described above is a non-limiting example of how to use the measurements my,mz analytically to evaluate the dynamic performance of the measuring machine. Essentially, can make Use any other analytical method appropriate for the purpose.

上述說明的方法能夠應用到配備有雷射感測器用於探測其他型式之變形的橋式測量機的模型之校準,或應用在其他型式的測量機(例如,水平臂,支架,等等),如於專利申請案EP-A-2167912中所闡明,針對部分需要該說明於此併入本案。 The method described above can be applied to the calibration of a model of a bridge measuring machine equipped with a laser sensor for detecting other types of deformation, or to other types of measuring machines (eg, horizontal arms, brackets, etc.), As explained in the patent application EP-A-2167912, this description is hereby incorporated by reference.

經由檢查其之特徵利用本發明所達到該等優點將為顯而易見的。 It will be apparent that the advantages obtained by the present invention are obtained by examining the features thereof.

特別地,用於對該測量機的動態誤差之修正的該模型之校準係以一簡單且快速的方式完成,將該測量機處於其之測量準備狀態且無需依靠測量儀器,諸如於所提及先前文件中所說明的二維感測器。 In particular, the calibration of the model for the correction of the dynamic error of the measuring machine is done in a simple and fast manner, the measuring machine is in its measurement preparation state and does not have to rely on a measuring instrument, such as mentioned The two-dimensional sensor described in the previous document.

最後,應瞭解的是可對該說明的方法作改變與修改而不致背離由該等申請專利範圍所界定之保護的範疇。 Finally, it is to be understood that the method of the description may be modified and modified without departing from the scope of the protection as defined by the scope of the application.

特別地,該移動週期不需必然地由一連續的頻率掃描所組成。能夠採用其他的激發技術,使用不同的且非週期之運動定律,只要頻率頻譜係代表動態的使用狀況。例如,位移可根據虛擬隨機脈衝,具有一與白色雜訊(white noise)相似的頻率頻譜。 In particular, the movement period does not necessarily have to consist of a continuous frequency sweep. Other excitation techniques can be used, using different and aperiodic motion laws, as long as the frequency spectrum represents dynamic usage. For example, the displacement may have a frequency spectrum similar to white noise based on a virtual random pulse.

此外,該探針可為樞轉型式,亦即,替代笛卡兒座標系統,相對於環繞與其之自有軸垂直的二軸之該凸緣的二轉動自由度(如於第7圖中顯示)。 In addition, the probe can be pivotally transformed, that is, in place of the Cartesian coordinate system, the two rotational degrees of freedom of the flange relative to the two axes perpendicular to its own axis (as shown in Figure 7) ).

1‧‧‧橋式測量機/估測過濾器 1‧‧‧Bridge measuring machine/estimated filter

3‧‧‧測量感測器 3‧‧‧Measurement sensor

5‧‧‧基座 5‧‧‧Base

6‧‧‧上表面 6‧‧‧ upper surface

7‧‧‧可動單元 7‧‧‧ movable unit

8‧‧‧滑動架 8‧‧‧Slide

8a、8b‧‧‧垂直直立部分 8a, 8b‧‧‧ vertical uprights

8c‧‧‧上水平橫越構件 8c‧‧‧Upper horizontal cross member

9‧‧‧滑座 9‧‧‧Slide

10‧‧‧滑座 10‧‧‧Slide

11‧‧‧導件 11‧‧‧ Guides

12‧‧‧垂直支柱 12‧‧‧ vertical pillar

13‧‧‧馬達 13‧‧‧Motor

14‧‧‧控制單元 14‧‧‧Control unit

14a‧‧‧動力段 14a‧‧‧Power section

15‧‧‧二維位置轉換器/工具 15‧‧‧Two-Dimensional Position Converter/Tool

16‧‧‧雷射感測器 16‧‧‧Laser sensor

19‧‧‧垂直腔室 19‧‧‧Vertical chamber

20‧‧‧垂直棒 20‧‧‧ vertical bars

20a‧‧‧較低端部 20a‧‧‧Lower end

22‧‧‧發射器 22‧‧‧transmitter

24‧‧‧縱向腔室 24‧‧‧Longitudinal chamber

26‧‧‧雷射光束 26‧‧‧Laser beam

28‧‧‧靶 28‧‧‧ Target

30‧‧‧凸緣 30‧‧‧Flange

31‧‧‧探針 31‧‧‧ probe

32‧‧‧球狀尖端 32‧‧‧Spherical tip

35‧‧‧上腔室 35‧‧‧Upper chamber

100‧‧‧方塊/步驟 100‧‧‧Box/step

200‧‧‧步驟 200‧‧‧ steps

400‧‧‧方塊 400‧‧‧ squares

xa、ya、za‧‧‧位置測量值 Xa, ya, za‧‧‧ position measurement

xd、yd、zd‧‧‧彎曲分量 Xd, yd, zd‧‧‧ bending component

ex、ey、ez‧‧‧動態位置誤差 Ex, ey, ez‧‧‧ dynamic position error

my、mz‧‧‧位移 My, mz‧‧‧ displacement

u‧‧‧輸入量 U‧‧‧ input

y‧‧‧輸出量 Y‧‧‧ Output

ya‧‧‧位置 Ya‧‧‧ position

A、B、C、C1、C2、D、D1、D2、K、Â,‧‧‧矩陣 A, B, C, C1, C2, D, D1, D2, K, Â , ‧‧‧matrix

Iy‧‧‧輸入電流 Iy‧‧‧Input current

IX、IY、IZ‧‧‧供電電流 IX, IY, IZ‧‧‧ supply current

M‧‧‧輸入-輸出模型 M‧‧‧Input-Output Model

M1‧‧‧第一模型 M1‧‧‧ first model

M2‧‧‧第二模型 M2‧‧‧ second model

M3‧‧‧第三模型 M3‧‧‧ third model

1、 2、 3‧‧‧過濾器 1, 2, 3‧‧‧Filter

第1圖顯示本發明之一橋式測量機; 第2圖係為第1圖之該機器的一前且部分橫截面視圖;第3圖係為第1圖之該機器的一滑動架的一透視及概略視圖,處於一第一動態變形之形式;第4圖係為第3圖之該滑動架的一前及概略視圖,處於一第二動態變形之形式;第5圖係為使用本發明之該校準方法的該動態變形之一補償方法的一方塊圖;第6圖係為用於實行該補償方法的一模型之一方塊圖;第7圖概略地顯示一測量機與一工具的一探針(stylus);以及第8及9圖顯示與第3圖之該滑動架的一移動週期相關聯的物理量之傾向。 Figure 1 shows a bridge measuring machine of the present invention; Figure 2 is a front and partial cross-sectional view of the machine of Figure 1; Figure 3 is a perspective and schematic view of a carriage of the machine of Figure 1, in the form of a first dynamic deformation Figure 4 is a front and schematic view of the carriage of Figure 3 in a second dynamic deformation form; Figure 5 is a compensation method for the dynamic deformation using the calibration method of the present invention. a block diagram; Fig. 6 is a block diagram of a model for implementing the compensation method; Fig. 7 schematically shows a stylus of a measuring machine and a tool; and Figs. 8 and 9 show The tendency of the physical quantity associated with a movement period of the carriage of Fig. 3.

100‧‧‧校準步驟 100‧‧‧ calibration procedure

110‧‧‧於工作週期期間測量輸入與輸出量 110‧‧‧Measure input and output during the work cycle

120‧‧‧提供樣本至識別演算法 120‧‧‧Provide samples to recognition algorithms

130‧‧‧儲存M 130‧‧‧Storage M

200‧‧‧M過濾器定義 200‧‧‧M filter definition

300‧‧‧使用M過濾器用於即時誤差定義 300‧‧‧Use M filter for immediate error definition

400‧‧‧使用誤差用於測量修正 400‧‧‧Use error for measurement correction

Claims (9)

一種用於因動態變形而致之誤差之補償的測量機的數學模型的校準方法,其包含:一可動單元,用於在一測量容積中移動一探針探頭,該可動單元包含至少一構件,其可沿著一軸在驅動裝置的驅動力作用下移動,該探頭包含配備具有一尖端之一探針,以及;一感測器,其係經組配以即時地探測與動態變形相關聯的至少一量,其中該模型,在響應與該驅動裝置之一控制信號相關聯的至少一輸入量之後,提供複數之輸出量,該等輸出量包含至少一由該變形所導致的測量誤差之分量以及至少由該感測器所探測之該量,該校準方法包含以下步驟:控制該可動單元以執行一移動週期其能夠產生動態變形;在移動週期期間收集複數之該輸入量與該輸出量之樣本;儲存該等樣本;以及供給該等樣本至一識別演算法以定義該模型;其之特徵在於執行該移動週期保持該探頭之該探針的一尖端固定,利用一運動定律其具有一振幅小於該探針之該尖端相對於該探頭之定位凸緣的位移範圍,以及一頻率頻譜其代表該測量機之使用的動態狀況。 A calibration method for a mathematical model of a measuring machine for compensating for errors due to dynamic deformation, comprising: a movable unit for moving a probe probe in a measurement volume, the movable unit comprising at least one component It is movable along a shaft under the driving force of a driving device, the probe comprising a probe having a tip, and a sensor assembled to instantly detect at least the dynamic deformation associated with An amount, wherein the model, after responding to at least one input associated with a control signal of the one of the driving devices, provides a plurality of outputs including at least one component of the measurement error caused by the deformation and At least the amount detected by the sensor, the calibration method includes the steps of: controlling the movable unit to perform a movement period to be capable of generating dynamic deformation; collecting the plurality of inputs and samples of the output during the movement period Storing the samples; and supplying the samples to a recognition algorithm to define the model; characterized by performing the movement cycle to maintain A tip of the probe of the probe is fixed using a law of motion having a range of displacement less than the tip of the probe relative to the positioning flange of the probe, and a frequency spectrum representative of the dynamics of use of the measuring machine situation. 如申請專利範圍第1項之方法,其之特徵在於該移動週 期包含沿著至少一軸的一系列之振盪。 The method of claim 1, wherein the method is characterized by The period includes a series of oscillations along at least one axis. 如申請專利範圍第2項之方法,其之特徵在於該等振盪係為可變頻率的。 The method of claim 2, wherein the oscillations are of a variable frequency. 如申請專利範圍第3項之方法,其之特徵在於其包含變化該等振盪之該頻率的步驟,係以由一最小值至一最大值之一連續方式。 The method of claim 3, characterized in that it comprises the step of varying the frequency of the oscillations in a continuous manner from a minimum to a maximum. 如申請專利範圍第4項之方法,其之特徵在於該最小值係低於5 Hz。 The method of claim 4, wherein the minimum value is less than 5 Hz. 如申請專利範圍第4或5項之方法,其之特徵在於該最大值係大於50 Hz。 The method of claim 4 or 5, wherein the maximum value is greater than 50 Hz. 如申請專利範圍第3至6項中任一項之方法,其之特徵在於該等振盪之振幅係隨著該頻率增加而降低,俾以維持控制該可動單元在線性的狀況下沿著該軸。 The method of any one of claims 3 to 6, wherein the amplitude of the oscillations decreases as the frequency increases, to maintain control of the movable unit along the axis in a linear condition. . 如前述申請專利範圍中任一項之方法,其之特徵在於該感測器係為一雷射感測器,其包含固定至該可動單元之一可移動構件的一第一部分之一發射器,以及固定至該可移動構件的一第二部分之一靶,而且藉由該感測器所探測之該量係為在該靶上該雷射光束相對於與該可動單元之一未變形狀況相對應的一參考位置之一入射點之位移。 A method according to any one of the preceding claims, wherein the sensor is a laser sensor comprising a transmitter fixed to a first portion of a movable member of the movable unit, And a target fixed to a second portion of the movable member, and the amount detected by the sensor is such that the laser beam is undeformed with respect to one of the movable units on the target The displacement of one of the corresponding reference positions of the incident point. 如申請專利範圍第8項之方法,其之特徵在於探測該雷射光束之該入射點的位移的該步驟係藉由一界定該靶的位置感測裝置(PSD)來執行。 The method of claim 8 is characterized in that the step of detecting the displacement of the incident point of the laser beam is performed by a position sensing device (PSD) defining the target.
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