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TW201005430A - Mold, process for producing the same, and process for producing substrate having transferred fine pattern - Google Patents

Mold, process for producing the same, and process for producing substrate having transferred fine pattern Download PDF

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Publication number
TW201005430A
TW201005430A TW98111492A TW98111492A TW201005430A TW 201005430 A TW201005430 A TW 201005430A TW 98111492 A TW98111492 A TW 98111492A TW 98111492 A TW98111492 A TW 98111492A TW 201005430 A TW201005430 A TW 201005430A
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Taiwan
Prior art keywords
mold
layer
fluoropolymer
transparent resin
fine pattern
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TW98111492A
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Chinese (zh)
Inventor
Kentarou Tsunozaki
Yasuhide Kawaguchi
Mikihiko Sano
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Asahi Glass Co Ltd
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Publication of TW201005430A publication Critical patent/TW201005430A/en

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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/84Processes or apparatus specially adapted for manufacturing record carriers
    • G11B5/855Coating only part of a support with a magnetic layer
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C33/00Moulds or cores; Details thereof or accessories therefor
    • B29C33/38Moulds or cores; Details thereof or accessories therefor characterised by the material or the manufacturing process
    • B29C33/40Plastics, e.g. foam or rubber
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C33/00Moulds or cores; Details thereof or accessories therefor
    • B29C33/42Moulds or cores; Details thereof or accessories therefor characterised by the shape of the moulding surface, e.g. ribs or grooves
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C35/00Heating, cooling or curing, e.g. crosslinking or vulcanising; Apparatus therefor
    • B29C35/02Heating or curing, e.g. crosslinking or vulcanizing during moulding, e.g. in a mould
    • B29C35/08Heating or curing, e.g. crosslinking or vulcanizing during moulding, e.g. in a mould by wave energy or particle radiation
    • B29C35/0888Heating or curing, e.g. crosslinking or vulcanizing during moulding, e.g. in a mould by wave energy or particle radiation using transparant moulds

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  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Mechanical Engineering (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Oral & Maxillofacial Surgery (AREA)
  • Thermal Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Micromachines (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)

Abstract

A mold is provided which has high light transmission and high releasability and has a fine pattern having a relatively large maximum height. Also provided are: a process for producing the mold; and a process for producing a substrate with a transferred fine pattern using the mold. The mold (10) includes a transparent resin layer (A) (12) constituted of a transparent resin and having chemical bonds based on a functional group (x) in the surface thereof on the interlayer (C) side, an interlayer (C) (14) comprising a fluoropolymer (II) which has a backbone having a fluorinated alicyclic structure and has a reactive group (y) reactive with the functional group (x), and a surface layer (B) (16) comprising a fluoropolymer (I) which has a backbone having a fluorinated alicyclic structure and does not have the reactive group (y), the transparent resin having a glass transition temperature not higher than the glass transition temperatures of the fluoropolymer (I) and the fluoropolymer (II). The fine pattern has a maximum height exceeding the sum of the thickness of the surface layer (B) and the thickness of the interlayer (C).

Description

201005430 六、發明說明: 【發明所屬之技術領域】 . 技術領域 • 本發明係關於一種模具、其製造方法以及使用該模具 之具有轉錄微細圖案之基材的製造方法,該基材係由光硬 化性樹脂之硬化物所構成者。 【斗椅;j 背景技術 〇 近年來,使表面具有微細圖案之模具與基材接觸而將 微細圖案之翻轉圖案形成於基材表面之方法,即所謂的奈 米壓印法正受到矚目(參照專利文獻〗及專利文獻2)。其中, 尤以依序進行下述步驟之光奈米壓印法最受矚目,即:於 i 模具之微細圖案表面與基材之間配置光硬化性樹脂之步 ’ 驟;對光硬化性樹脂進行光照射,使光硬化性樹脂硬化而 製成硬化物之步驟;及,使模具從硬化物分離之步驟。 _ 奈米壓印法係主要作為形成半導體元件之微細配線及 記錄媒體專之最大高度係於1 〇〇nm以下之微細圖案的方法 而被探討,但從可大幅提高生產性之觀點來看,即使在作 為形成MEMS(Micro-Electro-Mechanical-Systems)、生技相 關部件、光學部件等之最大高度從數^^至超過數十μιη之微 細圖案的方法上,其應用亦受到期待。 作為可用於光奈米壓印法之模具,已有下述模具被提 出。 (1)石英製模具。 3 201005430 ⑺具有:透明基體(A);由主鏈具有含氟脂肪族環結構 之含1聚合物所構成,且表面具有微細圖案之表面層⑼; 及,存在於透明基體(A)與表面層(B)間之中間層(c)的模具 (參照專利文獻3)。 ' ' (1)之模具之脫模性較低,使模具從硬化物分離時硬 化物之轉錄微細圖案的精度容易降低。作為提高脫模性的 方法,目前已提出於模具之微細圖案表面塗佈脫模劑之方 法。然而,因所塗布之脫模劑厚度不均,無法高精度地轉 錄模具之微細圖案。再者,連續使用模具時,必須再次塗 佈脫模劑,生產效率易降低。 (2)之模具因表面層(B)係由含氟聚合物所構成,脫模性 較高。然而,以提高機械強度及尺寸安定性為目的之(2)之 模具由於係使用較硬之材料作為透明基體(A),因下述理由 而難以形成最大高度係超過表面層(B)之厚度與中間層(c) 之厚度總量的微細圖案 藉塗佈而於透明基體(A)表面形成中間層(〇及表面層 (B),將母模緊壓於表面層(B)以使母模之翻轉圖案轉錄於表 面層(B),而製出(2)之模具。然而,由於藉塗佈而形成之表 面層(B)之厚度與中間層(C)之厚度總量甚薄(〇.1〜i5gmj 右)’母模之翻轉圖案的最大高度(包含母模整體彎曲之凹凸 結構的最大高低差)超過前述厚度總量時,為了正確地轉_ 母模之翻轉圖案,就超出前述厚度總量的部分,亦必須將 翻轉圖案轉錄於透明基體(A)上。但是,因透明基體(A)較 硬,就超過前述厚度總量的部分’並無法將翻轉圖案轉錄 201005430 於透明基體(Α)上。 毋寧是,當母模之翻轉圖案到達透明基體(A)時,中間 層(c)及表面層(B)將斷裂,透明基體(A)露出表面。透明基 體(A)露出表面之(2)之模具因透明基體(A)與硬化物黏著, 脫模性較低。 Ο201005430 VI. Description of the Invention: [Technical Field] The present invention relates to a mold, a method of manufacturing the same, and a method of manufacturing a substrate having a transcriptional fine pattern using the mold, the substrate being photohardened The composition of the cured resin of the resin. [Drawing Chair; j Background] In recent years, a method in which a mold having a fine pattern on a surface is brought into contact with a substrate to form a reverse pattern of a fine pattern on a surface of a substrate, that is, a so-called nanoimprint method is attracting attention (refer to Patent Document and Patent Document 2). Among them, the photon imprinting method which performs the following steps in order, in particular, is a step of arranging a photocurable resin between the surface of the fine pattern of the i-die and the substrate; a step of performing light irradiation to cure the photocurable resin to form a cured product; and a step of separating the mold from the cured product. _ The nano-imprinting method is mainly used as a method of forming a micro-pattern of a fine wiring and a recording medium for a semiconductor element, which is based on a fine pattern of 1 〇〇 nm or less, but from the viewpoint of greatly improving productivity, Even in the method of forming a micro pattern having a maximum height of MEMS (Micro-Electro-Mechanical-Systems), biotechnology-related components, optical components, and the like from several to more than several tens of μm, the application thereof is expected. As a mold which can be used for the photo-nano imprint method, the following molds have been proposed. (1) Quartz mold. 3 201005430 (7) having: a transparent substrate (A); a surface layer (9) composed of a polymer having a fluorine-containing aliphatic ring structure in a main chain and having a fine pattern on the surface; and, present on the transparent substrate (A) and surface A mold of the intermediate layer (c) between the layers (B) (see Patent Document 3). The mold of ' ' (1) has a low mold release property, and the precision of the transcribed fine pattern of the hard resin is easily lowered when the mold is separated from the cured product. As a method of improving mold release property, a method of applying a release agent to the surface of a fine pattern of a mold has been proposed. However, due to the uneven thickness of the applied release agent, the fine pattern of the mold cannot be reproduced with high precision. Further, when the mold is continuously used, the release agent must be applied again, and the production efficiency is easily lowered. The mold of (2) is composed of a fluoropolymer because the surface layer (B) is formed, and the mold release property is high. However, in the mold (2) for the purpose of improving mechanical strength and dimensional stability, it is difficult to form the maximum height exceeding the thickness of the surface layer (B) because the hard material is used as the transparent substrate (A) for the following reason. A fine pattern of the total thickness of the intermediate layer (c) is applied to form an intermediate layer (the surface layer (B) on the surface of the transparent substrate (A), and the mother mold is pressed against the surface layer (B) to make the mother The mold inversion pattern is transcribed to the surface layer (B) to produce the mold of (2). However, since the thickness of the surface layer (B) formed by coating is thinner than the total thickness of the intermediate layer (C) ( 〇.1~i5gmj right) 'The maximum height of the flip pattern of the master mold (the maximum height difference of the concave-convex structure including the overall bending of the master mold) exceeds the total thickness described above, in order to correctly turn the flip pattern of the master mold, it exceeds In the above part of the total thickness, the flip pattern must also be transcribed on the transparent substrate (A). However, since the transparent substrate (A) is hard, the portion exceeding the total thickness is not able to transcribe the flip pattern 201005430 in transparency. On the base (Α). When the transfer pattern reaches the transparent substrate (A), the intermediate layer (c) and the surface layer (B) are broken, and the transparent substrate (A) is exposed to the surface. The transparent substrate (A) is exposed to the surface of the mold (2) due to the transparent substrate (A) ) Adhesive to hardened material, low release property.

【專利文獻1】曰本特表2004-504718號公報 【專利文獻2】特表2002-539604號公報 【專利文獻3】國際公開第2006/059580號手冊 【發明内容;3 發明之揭示 發明欲解決之課題 本發明提供:一種光穿透性及脫模性高且具有最大高 度相對較大之微細圖案的模具;其製造方法;以及,一種 具有轉錄微細圖案之基材的製造方法,其可高精度且高生 產效率地轉錄模具之微細圖案,且轉錄微細圖案之最大高 度相對較大。 解決課題之手段 本發明之模具係—種具有用以使光硬化性樹脂成形之 微細圖案的模具,其特徵在於具有:下述透明樹脂層(A); 下述表面層(B);形成於前述透明細旨層(A)表面,且存在於 則述透明榷f月旨層(A)與前述表面層⑻之間的下述中間層 圖案之最大高度係、超過前述表面層(B)之厚 度與剛it中間層(c)之厚度的總量;其中, 透月樹知層(句:係由透明樹脂所構成之層,該透明樹 201005430 脂之玻璃轉移溫度係於下述含《合物(i)及下述含氟聚合 物(II)之玻壤轉移溫度以下,且該透明樹脂層(A)係—於中 間層(C)形成前,在將會形成中間層(c)之表面具有官能基 (x) ’而於中間層(c)形成後,在已形成有中間層(C)之表面 具有以前述官能基(x)與下述反應性基(力為基礎之化學鍵 結的層; 表面層(B):係由含氟聚合物⑴所構成之層,該含氟聚 合物(I)於主鏈具有含氟脂肪族環結構,且實質上不具有下 述反應性基(y); 中間層(C):係由含氟聚合物(II)所構成之層,該含氟聚 合物(II)於主鏈具有含氟脂肪族環結構,且具有對前述官能 基(X)呈反應性之反應性基(y)。 前述微細圖案之最大高度宜為1〜500叫111。 前述透明樹脂層(A)宜由透明支持物(13)所支持。 前述官能基(X)宜為羥基、胺基或環氧乙基(〇xiranyl), 且前述反應性基(y)宜為羧基。 前述透明樹脂層(A)宜為藉表面處理而於表面導入有 官能基(X)之層。 本發明之模具製造方法係-種具有心將光硬化性樹 脂成形之微細圖案的模具之製造方法,其特徵在於具有下 述步驟: 形成中間層(C)之步驟:於由下述透明樹脂所構成,且 在表面具有官能基(X)之透明樹脂層(A)的該表面上,塗佈已 溶解有下述含氟聚合物(π)之含a溶劑而成的溶液並加以 201005430 乾燥,而形成由下述含氟聚合物(II)所構成之中間層广 製得模具前驅物之步驟:於該中間層(c)之表面上塗佈 ' 6令下述含㈣合物⑴溶解於含氟溶#1而成之溶液並使其 • 乾燥,而形成由下述含氟聚合物⑴所構成之表面層(B),製 得模具前驅物; 製得模具之步驟:使表面具有微細圖案之翻轉圖案且 • 該翻轉圖案之最大高度超過前述表面層(B)厚度與前述中 眷 Pa1層(C)厚度之總量的母模之該翻轉圖案,於前述模具前驅 ⑯及該母模中之至少一者在下述含氟聚♦物(I)及下述含氟 聚合物(II)之玻璃轉移溫度以上的狀態下,從前述模具前驅 物之該表面層(B)側緊壓,而橫跨該表面層(B)、該中間層(c) - 及該透明樹脂層(A)形成微細圖案,而製得模具;及 分離步驟:使母模從前述模具分離;其中, - 透明樹脂:玻璃轉移溫度係於下述含氟聚合物⑴及下 述含氟聚合物(II)之玻璃轉移溫度以下的透明樹脂; Ο 含氟聚合物(I):於主鏈具有含氟脂肪族環結構,且實 質上不具有下述反應性基(y)之含氟聚合物; 含氟聚合物(II):於主鏈具有含氟脂肪族環結構,且具 有對前述官能基(X)呈反應性之反應性基(y)的含氟聚合物。 本發明之具有轉錄微細圖案之基材的製造方法之特徵 ' 在於具有下述步驟’即:將光硬化性樹脂配置於基材表面 之步驟;將本發明之模具緊壓於該光硬化性樹脂,以使該 模具之微細圖案與該光硬化性樹脂相接的步驟;於將該模 具緊壓在該光硬化性樹脂上之狀態下,對該光硬化性樹脂 7 201005430 照射光,使該光硬化性樹脂硬化而製成硬化物之步驟;及, 使模具從該硬化物分離之步驟。 本發明之具有轉錄微細圖案之基材的製造方法之特徵 在於具有下述步驟:將光硬化性樹脂配置於如本發明之模 具的微細圖案表面之步驟;將基材緊壓於該模具表面之該 光硬化性樹脂上的步驟;於已將該基材緊壓於該光硬化性 樹脂上之狀態下,對該光硬化性樹脂照射光,使該光硬化 性樹脂硬化而製成硬化物之步驟;及,使模具從該硬化物 分離之步驟。 本發明之具有轉錄微細圖案之基材的製造方法之特徵 在於具有下述步驟:使基材與本發明之模具接近或接觸, 以使該模具之微細圖案成為該基材側;將光硬化性樹脂充 填於該基材與該模具之間的步驟;於該基材已與該模具接 近或接觸之狀態下,對該光硬化性樹脂照射光,使該光硬 化性樹脂硬化而製成硬化物之步驟;及,使模具從該硬化 物分離之步驟。 發明之效果 本發明之模具之製造方法可製造光穿透性及脫模性高 且具有最大高度相對較大之微細圖案的模具。 此外,本發明可藉由使用本發明之模具來製造基材, 該基材可使模具之微細圖案高精度且生產_良好地轉 錄,且具有最大高度相對較大之轉錄微細圖案。 圖式簡單說明 第1圖係-顯示本發明模具之一例的截面圖。 201005430 第2圖係一截面圖,其顯示具有轉錄微細圖案之基材之 製造方法的—例。 第3圖係—截面圖,其顯示具有轉錄微細圖案之基材之 製造方法的另一例。 第4圖係—截面圖,其顯示具有轉錄微細圖案之基材之 製造方法的另一例。 第5圖係例7之模具的雷射顯微鏡影像。[Patent Document 1] Japanese Patent Publication No. 2004-504718 (Patent Document 2) Japanese Patent Publication No. 2002-539604 (Patent Document 3) International Publication No. 2006/059580, the disclosure of the present invention; The present invention provides a mold having a high light transmittance and mold release property and having a fine pattern having a maximum height and a relatively large height; a method for producing the same; and a method for producing a substrate having a transcribed fine pattern, which can be high The fine pattern of the mold is transcribed with high precision and high productivity, and the maximum height of the transcribed fine pattern is relatively large. Means for Solving the Problem A mold according to the present invention is a mold having a fine pattern for molding a photocurable resin, comprising: a transparent resin layer (A); a surface layer (B) described below; The surface of the transparent thin layer (A), and the maximum height of the intermediate layer pattern existing between the transparent layer (A) and the surface layer (8), exceeding the surface layer (B) The total thickness of the thickness and the thickness of the intermediate layer (c); wherein, the layer of the moon is known as a layer composed of a transparent resin, and the glass transition temperature of the transparent tree 201005430 is in the following The (i) and the fluoropolymer (II) below are below the glass transition temperature, and the transparent resin layer (A) is formed before the intermediate layer (C) is formed, and the intermediate layer (c) is formed. The surface has a functional group (x)' and after the intermediate layer (c) is formed, has a chemical bond based on the aforementioned functional group (x) and the following reactive group (force-based) on the surface on which the intermediate layer (C) has been formed. Surface layer (B): a layer composed of a fluoropolymer (1) having a main chain a fluorine-containing aliphatic ring structure and having substantially no reactive group (y); an intermediate layer (C): a layer composed of a fluorine-containing polymer (II), the fluorine-containing polymer (II) The main chain has a fluorine-containing aliphatic ring structure and has a reactive group (y) reactive with the above functional group (X). The maximum height of the fine pattern is preferably from 1 to 500, which is 111. The aforementioned transparent resin layer (A) It is preferably supported by a transparent support (13). The aforementioned functional group (X) is preferably a hydroxyl group, an amine group or an epoxy group, and the aforementioned reactive group (y) is preferably a carboxyl group. (A) It is preferable to introduce a layer having a functional group (X) on the surface by surface treatment. The method for producing a mold of the present invention is a method for producing a mold having a fine pattern in which a photocurable resin is molded. The method has the following steps: forming the intermediate layer (C): on the surface of the transparent resin layer (A) having a functional group (X) on the surface of the transparent resin, the coating is dissolved a solution containing a solvent of a fluoropolymer (π) and dried by 201005430 to form a fluorine-containing material a step of preparing a mold precursor by forming an intermediate layer of the polymer (II): coating the surface of the intermediate layer (c) with the following (4) compound (1) dissolved in the fluorine-containing solution #1 The solution is dried and formed to form a surface layer (B) composed of the following fluoropolymer (1) to prepare a mold precursor; a step of preparing a mold: a surface having a fine pattern of a reverse pattern and The flip pattern of the master pattern of the total height of the flip pattern exceeding the thickness of the surface layer (B) and the thickness of the middle layer Pa1 layer (C) is at least one of the mold precursor 16 and the master mold described below. In a state where the fluorine-containing poly(I) (I) and the fluoropolymer (II) described below are at a glass transition temperature or higher, the surface layer (B) side of the mold precursor is pressed to cross the surface layer ( B), the intermediate layer (c) - and the transparent resin layer (A) form a fine pattern to prepare a mold; and a separating step: separating the master mold from the mold; wherein - the transparent resin: glass transition temperature is The following fluoropolymer (1) and the following fluoropolymer (II) have a glass transition temperature or lower Transparent resin; 含氟 Fluoropolymer (I): a fluoropolymer having a fluorinated aliphatic ring structure in the main chain and having substantially no reactive group (y): fluoropolymer (II): A fluoropolymer having a fluorinated aliphatic ring structure in the main chain and having a reactive group (y) reactive with the above functional group (X). The method for producing a substrate having a transcribed fine pattern of the present invention is characterized by the step of: arranging a photocurable resin on a surface of a substrate; and pressing the mold of the present invention against the photocurable resin a step of bringing the fine pattern of the mold into contact with the photocurable resin; and applying light to the photocurable resin 7 201005430 in a state where the mold is pressed against the photocurable resin, the light is irradiated a step of hardening the curable resin to form a cured product; and a step of separating the mold from the cured product. The method for producing a substrate having a transcribed fine pattern of the present invention is characterized by the step of disposing a photocurable resin on a surface of a fine pattern of a mold of the present invention; and pressing the substrate against the surface of the mold a step of the photocurable resin; the photocurable resin is irradiated with light, and the photocurable resin is cured to form a cured product in a state in which the substrate is pressed against the photocurable resin. a step; and a step of separating the mold from the hardened material. The method for producing a substrate having a transcription fine pattern of the present invention is characterized in that the substrate is brought into close contact with or in contact with the mold of the present invention such that the fine pattern of the mold becomes the substrate side; a step of filling a resin between the substrate and the mold; and irradiating the photocurable resin with light in a state in which the substrate is in close contact with or in contact with the mold, and curing the photocurable resin to form a cured product And a step of separating the mold from the hardened material. EFFECT OF THE INVENTION The method for producing a mold of the present invention can produce a mold having high light transmittance and mold release property and having a fine pattern having a maximum height and a relatively large height. Further, the present invention can manufacture a substrate by using the mold of the present invention, which can make the fine pattern of the mold high-precision and produce _ goodly transcribed, and has a transcribed fine pattern having a maximum height and a relatively large size. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a cross-sectional view showing an example of a mold of the present invention. 201005430 Fig. 2 is a cross-sectional view showing an example of a method of manufacturing a substrate having a transcribed fine pattern. Fig. 3 is a cross-sectional view showing another example of a method of producing a substrate having a transcribed fine pattern. Fig. 4 is a cross-sectional view showing another example of a method of producing a substrate having a transcribed fine pattern. Figure 5 is a laser microscope image of the mold of Example 7.

【實施方式】 本發明之最佳實施形態 於本發明說明書中,係將式(1)所示化合物記為化合物 (1)。其他通式所示化合物亦以同樣方式記載。 <模具> 本發明之板具係一種具有用以使光硬化性樹脂成形之 微細圖案的模具。第丨圖係一顯示本發明模具之一例的截面 圖。模具10具有:透明樹脂層(A)12;表面層(B)16;形成於 透明樹脂層(A)12表面,且存在於透明樹脂層(A)12與表面 層⑻i6之間的中間層(C)14 ;及,從裏面侧支持透明樹脂層 (A)12之透明支持物(D)17;且具有橫跨表面層⑼16、中間 層(C)14及透明樹脂層(A)12而形成之微細圖案18。此外,透 明支持物(Ρ)17並非必須設置者。 (微細圖案) 微細圖案宜為由凹凸結構所構成的微細圖案。 凹凸結構中之凸結構部係呈線狀或點狀地存在於模具 表面。 9 201005430 ”狀凸結構部可呈直線或曲線,亦可呈折曲形狀。此 外’線狀凸結構部村平行轉在錄^現條紋狀。線 構。P的截面形狀(相對於長向,在直角方向之截面形 狀)可列舉如長方形、梯形、三角形及半圓形等。 /㈣凸結構部之形狀可列舉如底面形狀為長方形、正 方$菱形、六邊形、三㈣及圓形等之柱狀、錐狀 球形及多面體形等。 半 凸結構部之縱橫比(aspect ratio,凸結構部高度/凸[Embodiment] BEST MODE FOR CARRYING OUT THE INVENTION In the present specification, a compound represented by the formula (1) is referred to as a compound (1). Other compounds of the general formula are also described in the same manner. <Mold> The plate of the present invention is a mold having a fine pattern for molding a photocurable resin. The figure is a cross-sectional view showing an example of the mold of the present invention. The mold 10 has a transparent resin layer (A) 12; a surface layer (B) 16; an intermediate layer formed on the surface of the transparent resin layer (A) 12 and present between the transparent resin layer (A) 12 and the surface layer (8) i6 ( And a transparent support (D) 17 supporting the transparent resin layer (A) 12 from the inner side; and having a cross-surface layer (9) 16, an intermediate layer (C) 14, and a transparent resin layer (A) 12 Fine pattern 18. In addition, the transparent support (Ρ) 17 is not required to be set. (Micro pattern) The fine pattern is preferably a fine pattern composed of a concavo-convex structure. The convex structural portion in the uneven structure exists in a line shape or a dot shape on the surface of the mold. 9 201005430 The shape of the convex structure can be straight or curved, or it can be in a curved shape. In addition, the linear convex structure is parallelized and recorded in a stripe shape. The cross-sectional shape of P (relative to the long direction, Examples of the cross-sectional shape in the right-angle direction include a rectangular shape, a trapezoidal shape, a triangular shape, a semicircular shape, and the like. / (4) The shape of the convex structural portion may be, for example, a rectangular shape of a bottom surface, a square shape of a rhombus, a hexagon, a triangle, a circle, or the like. Columnar, tapered spherical shape, polyhedral shape, etc. Aspect ratio of the semi-convex structure (aspect ratio, convex structure height / convex

部底邊寬度)宜為5以下。若縱橫比為5以下,轉錄母模: 轉圖案時’可形成域孔等顧之良好微細㈣。縱橫: 較且為3以下,更宜為2以下。 、 凸結構部之高度及底邊寬度可藉共耗焦雷射顯微鏡 (confocal laser micr〇sc〇pe)之輪廉(pr〇fi⑷計測來求出。The width of the bottom edge of the part should be 5 or less. When the aspect ratio is 5 or less, the transcription master mold: when the pattern is rotated, the domain pores can be formed into fine pores (four). Vertical and horizontal: It is 3 or less, and more preferably 2 or less. The height of the convex structure portion and the width of the bottom edge can be obtained by measuring the conf〇fi(4) of a confocal laser micr〇sc〇pe.

但,凸結構部之高度及底邊寬度因具有陡山肖壁面之微細圖 案等而難以藉共滅雷射顯微鏡作正相定時,亦可將微 細圖案截’以顯魏(料顯微鏡、雷射顯賴或電子顯 微鏡)觀察截面來求出。微細圖案之截斷係以習知方法進 行。但,在圖案形狀有因截斷而崩毀之虞時,則進行樹月t 包埋處理及液態氮之冷卻處理等。 微細圖案之最大高度超過表面層(B)厚度與中間層忙) 厚度之總量。微細圖案之最大高度宜為5〇〇μιη以下。若微 細圖案之最大高度為5〇〇μιη以下,則可使母模之翻轉圖案 橫跨廣大面積地均勻轉錄。微細圖案之最大高度較宜為 300μιη以下’且更宜為ι〇〇μηι以下。 10 201005430 微細圖案之最大高度下限雖取決於表面層(B)厚度與 中間層(C)厚度之總量,但通常為Ιμηι。 本發明中之最大高度為JIS Β0601所規定之最大高度, 即:於基準長度L中,凹凸結構之最高山頂線與最低谷底線 之最大南低差。 最大高度可藉共軛焦雷射顯微鏡之輪廓計測來求出。 •但最大高度因具有陡峭壁面之微細圖案等而難以藉共軛焦 0 雷射顯微鏡作正確測定時,亦可將微細圖案截斷而以顯微 鏡(光學顯微鏡、雷射顯微鏡或電子顯微鏡)觀察截面來求 出。微細圖案之截斷係以習知方法進行。但,在圖案形狀 有因截斷而崩毀之虞時,則進行樹脂包埋處理及液態氮之 . 冷卻處理等。 - 基準長L之長度在線與空間(line-and-space)、V溝、點 - 圖案等之週期圖案的情況下,令其為5〜20週期分之長度。 而於非圖案時,聽基準紅之長度蚊成可包含設計 © 上會成為最高點之部分與成為最低點之部分。基準長[之長 度較大時(數mm以上),欲以共概焦f射顯微鏡之輪靡計測 及截面觀察作丨:欠測定就求出最大高度是很_的。此時, 計測及截面觀察在每處分成多數麵行,之後再 連結數據以求出最大高度。 • 此外,令表面層⑻及中間層⑼之厚度為形成微細圖案 刖模具前驅物之表面層(B)及中間層(c)的厚度。 (透明樹脂層(A)) 透明樹脂層⑷係一由玻墙轉移溫度在含氟聚合物⑴ 11 201005430 及含氟聚合物(ιι)之玻璃轉移溫度以下的透明樹脂所構成 之層;且’其係—於形成中間層(C)之前,在將會形成中間 層(c)之表面具有官能基(X),而在中間層(C)形成後,於已 形成有中間層(C)之表面上具有以該官能基(x)與反應性基 (y)為基礎之化學鍵結的層。 透明樹脂之破璃轉移溫度係於含氟聚合物(I)之玻璃轉 移溫度以下,且於含氟聚合物(η)之玻璃轉移溫度以下。透 明樹脂之玻璃轉移溫度若於含氟聚合物⑴及含㈣合物(π) 之玻璃轉移溫度以下,母模之翻轉圖案的最大高度(包含母 模整體f曲之凹凸結構的最大高低差)即使超過表面層(B) 厚度與中間層(C)厚度之總量,因透明樹脂層(A)將變形而追 隨翻轉圖案之凹凸結構及母模整料曲等,而可精度良好 地轉錄該翻案。此外,透明樹脂之玻璃轉移溫度若於 3氟心a物(I)及含氟聚合物⑼之玻場轉移溫度以下,壓緊 母模時’即使異物混人母模與表面層(Β)之間,透明樹脂層 (Α)將變形而吸收異物之影響,因此不會損傷到高價之母 模。 透明樹脂之玻璃轉移溫度宜較含氧聚合物⑴及含氣聚 合物(Π)之玻璃轉移溫度低5以上,更宜⑽。c以上。 透明樹脂之玻璃轉移溫度宜為20t以上。透明樹脂之 玻璃轉移溫度若_1以上,使母模從表面層(B)分離時透 明樹脂層(A)不會變形,微細圖案之尺寸精度變得良好。透 明樹脂之㈣轉移溫縣達贼時,雖可⑽溫進行母模 翻轉圖案之轉錄以使微細圖案之尺寸精度變得良好,作於 12 201005430 作業性及生產性之觀點上並不利。透明樹脂之坡螭轉移溫 度尤宜為40°C以上。 • 從難以合成玻璃轉移溫度超過200°C之含氟聚合物⑴ 及含氟聚合物(Π)的觀點來看,透明樹脂之玻璃轉移溫度宜 為200°C以下。 本發明中之玻璃轉移溫度可使用示差掃描熱析儀(DSC) • 並依照JIS K7121 . 1987來求出。此外,本發明中之玻璃 ^ 轉移溫度係指中間點玻璃轉移溫度。 透明樹脂可列舉如丙烯酸樹脂、聚苯乙烯、丙烯腈丁 二烯苯乙烯樹脂(ABS)、非晶性聚酯、環烯烴系樹脂(c〇p)、 聚四氟乙烯(PTFE)、聚偏二氟乙烯(PVDF)、乙烯_四氟乙稀 - 共聚物(ETFE)、氟烯烴-烷基乙烯基醚系共聚物(FEVE)及矽 ' 氧樹脂等。 ' 設置透明支持物(D)時,從光線穿透率、成形加工性及 圖案成形性等觀點來看,透明樹脂宜為丙烯酸樹脂、非晶 _ 性聚醋WEVE。丙稀酸樹脂可列舉如聚甲基丙稀酸甲醋 (ΡΜΜA)。FEVE可列舉如路米夫龍(旭硝子社製)。非晶性 聚酯可列舉如拜隆(東洋紡社製)。 不設透明支持物(D)時,從光線穿透率、成形加工性、 • ㈣成形性及财熱性等觀點來看,透明樹脂宜為丙烯酸樹 . 脂、聚苯乙嫦或C0P。丙烯酸樹脂可列舉如PMMA。C〇p 可列舉如ZEONEX(日本ΖΕΟΝ社製)。 透明樹月曰層(A)(設置透明支持物⑼時,係透明樹脂層 (A)與透明支持物⑼之積層體)宜為:於3〇〇〜獅細波長區 13 201005430 域之光中之至少一部分的波長區域下,光線穿透率為75% 以上者;且更宜為85%以上者。若該光線穿透率於㈣以 上,於後述之具有轉錄微細圖案之基材的製造方法中可 使光硬化性樹脂有效率地硬化。特別是,以436碰(高壓水 銀燈之g線波長)或365nm(高壓水銀燈之丨線波長)之光線穿 透率為75%以上者較佳,且85%以上者更佳。波長偽喊 365細之光線穿透率若為乃%以上,於後述之具有轉錄微細 圖案之基㈣製造方法巾’可使用高壓水紐使光硬化性 樹脂有效率地硬化。 設置透明支持物(D)時,可將透明樹脂之前驅物或透明 樹脂溶液塗佈於㈣域_)細,藉則彡舰明樹脂層 ㈧。此外,亦可將透明樹脂層⑷之膜與透明支持物⑼作 層積處理以進行接合。 不設透明支持物(聯,取f知成形法使透明樹脂成 ,製成透明樹脂層(A)之成形體 形,以 透_脂綱(設置制切物(晴 =支持物⑼之積層體)之形狀可為平板狀(四邊: 圓柱為雜,也可4㈣狀(透餘、圓筒狀、 ㈧*=Γ)(設置透明支持物(D)時,為透明樹料 脂層、(二⑼之積層体)之形狀為平板狀時,透明樹 。.5二Γ:宜為。.4_以上一下,且較宜為 上 15mi«以下,更宜為〇 5 以μ 透明樹脂層巧.5脑以上、8mm«T。 )之厚度若為0.4咖以上,模具不易挽曲且使 201005430 性佳透明樹腊層(A)之厚度若為加_以下,材料之浪 費較夕此外’因不會變重而使用性較佳。 用 參However, the height of the convex structure portion and the width of the bottom edge are difficult to be used for the positive phase timing by the common laser microscope due to the fine pattern of the steep wall surface of the steep mountain, and the fine pattern can be cut off to reveal the microscope (laser, laser). Observe or electron microscope) Observe the cross section to find out. The cutting of the fine pattern is carried out by a conventional method. However, when the shape of the pattern is collapsed due to the cutting, the tree moon t embedding treatment and the liquid nitrogen cooling treatment are performed. The maximum height of the fine pattern exceeds the total thickness of the surface layer (B) and the intermediate layer. The maximum height of the fine pattern is preferably 5 μm or less. If the maximum height of the fine pattern is 5 〇〇 μηη or less, the flip pattern of the master pattern can be uniformly transcribed across a large area. The maximum height of the fine pattern is preferably 300 μm or less and more preferably ι〇〇μηι or less. 10 201005430 The maximum height lower limit of the fine pattern depends on the total thickness of the surface layer (B) and the thickness of the intermediate layer (C), but is usually Ιμηι. The maximum height in the present invention is the maximum height specified by JIS Β0601, that is, the maximum south-low difference between the highest peak line and the lowest bottom line of the uneven structure in the reference length L. The maximum height can be determined by the contour measurement of a conjugated focal laser microscope. • However, when the maximum height is difficult to measure by a conjugate focal point 0 laser microscope due to the fine pattern of a steep cliff surface, the fine pattern can be cut off and the cross section can be observed with a microscope (optical microscope, laser microscope, or electron microscope). Find out. The cutting of the fine pattern is carried out by a conventional method. However, when the shape of the pattern is collapsed due to the cutting, the resin embedding treatment, the liquid nitrogen, the cooling treatment, and the like are performed. - When the length of the reference length L is a periodic pattern of line-and-space, V-groove, dot-pattern, etc., let it be 5 to 20 cycles long. In the case of non-patterns, the length of the base red can be included in the design © which will be the highest point and the lowest point. When the length of the reference length is large (a few mm or more), it is necessary to use the rim measurement of the common focus and the observation of the cross section as the 丨: the maximum height is found to be very low. At this time, the measurement and the cross-sectional observation are divided into a plurality of face lines at each place, and then the data is connected to obtain the maximum height. • Further, the thickness of the surface layer (8) and the intermediate layer (9) is the thickness of the surface layer (B) and the intermediate layer (c) which form the fine pattern 刖 mold precursor. (Transparent Resin Layer (A)) The transparent resin layer (4) is a layer composed of a transparent resin whose transition temperature is lower than the glass transition temperature of the fluoropolymer (1) 11 201005430 and the fluoropolymer (ι 1); The system has a functional group (X) on the surface where the intermediate layer (c) will be formed before the intermediate layer (C) is formed, and an intermediate layer (C) is formed after the intermediate layer (C) is formed. The surface has a layer bonded chemically based on the functional group (x) and the reactive group (y). The glass transition temperature of the transparent resin is below the glass transition temperature of the fluoropolymer (I) and below the glass transition temperature of the fluoropolymer (η). The glass transition temperature of the transparent resin is below the glass transition temperature of the fluoropolymer (1) and the (tetra) compound (π), and the maximum height of the flip pattern of the master mold (including the maximum height difference of the concave-convex structure of the entire master mold) Even if the thickness of the surface layer (B) and the thickness of the intermediate layer (C) are exceeded, the transparent resin layer (A) is deformed to follow the concave-convex structure of the reverse pattern, the master mold, and the like, and the transcription can be accurately reproduced. Reverse the case. In addition, if the glass transition temperature of the transparent resin is below the glass transition temperature of the 3F core (I) and the fluoropolymer (9), when the master mold is pressed, even if the foreign matter is mixed with the master and the surface layer (Β) In the meantime, the transparent resin layer (Α) will be deformed to absorb the influence of foreign matter, so that it does not damage the high-priced master. The glass transition temperature of the transparent resin is preferably 5 or more lower than that of the oxygen-containing polymer (1) and the gas-containing polymer (Π), and is more preferably (10). c or more. The glass transition temperature of the transparent resin is preferably 20 t or more. When the glass transition temperature of the transparent resin is _1 or more, the transparent resin layer (A) is not deformed when the master mold is separated from the surface layer (B), and the dimensional accuracy of the fine pattern is improved. When the translucent resin (4) is transferred to the Wenxian County thief, the transcription of the mother pattern reversal pattern can be performed at (10) temperature to make the dimensional accuracy of the fine pattern good, and it is not advantageous from the viewpoint of workability and productivity in 12 201005430. The transfer temperature of the transparent resin is preferably 40 ° C or more. • The glass transition temperature of the transparent resin is preferably 200 ° C or less from the viewpoint of the fluoropolymer (1) and the fluoropolymer (Π) which are difficult to transfer the glass to a temperature exceeding 200 °C. The glass transition temperature in the present invention can be determined by using a differential scanning calorimeter (DSC) and in accordance with JIS K7121. Further, the glass transition temperature in the present invention means the intermediate point glass transition temperature. Examples of the transparent resin include acrylic resin, polystyrene, acrylonitrile butadiene styrene resin (ABS), amorphous polyester, cycloolefin resin (c〇p), polytetrafluoroethylene (PTFE), and polybutylene. Difluoroethylene (PVDF), ethylene-tetrafluoroethylene-copolymer (ETFE), fluoroolefin-alkyl vinyl ether copolymer (FEVE), and oxime oxy-resin. When the transparent support (D) is provided, the transparent resin is preferably an acrylic resin or an amorphous styrene WEVE from the viewpoints of light transmittance, moldability, and pattern formability. The acrylic resin may, for example, be polymethyl methacrylate (ΡΜΜA). FEVE can be cited as Lumifu (made by Asahi Glass Co., Ltd.). The amorphous polyester is exemplified by Bayon (manufactured by Toyobo Co., Ltd.). When the transparent support (D) is not provided, the transparent resin is preferably an acrylic resin, a polystyrene or a COP, from the viewpoints of light transmittance, moldability, (4) formability, and heat recovery. The acrylic resin may, for example, be PMMA. C〇p is exemplified by ZEONEX (manufactured by Nippon Kasei Co., Ltd.). The transparent tree moon layer (A) (when the transparent support (9) is provided, the layer of the transparent resin layer (A) and the transparent support (9) is preferably: in the light of the 3〇〇~ lion fine wavelength region 13 201005430 domain In at least a part of the wavelength region, the light transmittance is 75% or more; and more preferably 85% or more. When the light transmittance is (4) or more, the photocurable resin can be efficiently cured in the method for producing a substrate having a transcribed fine pattern which will be described later. In particular, it is preferable that the light transmittance of 436 (the g-wavelength of the high-pressure mercury lamp) or 365 nm (the wavelength of the high-pressure mercury lamp) is 75% or more, and more preferably 85% or more. When the light transmittance of the wavelength 365 is 5% or more, the base (4) manufacturing method towel having a transcribed fine pattern described later can be used to efficiently cure the photocurable resin using a high pressure water. When the transparent support (D) is provided, the transparent resin precursor or the transparent resin solution may be applied to the (4) domain _) fine, and the 彡 明 明 resin layer (8). Further, the film of the transparent resin layer (4) and the transparent support (9) may be laminated to be joined. The transparent support is not provided (joining, the transparent resin is formed by the forming method, and the shape of the transparent resin layer (A) is formed, and the shape of the transparent resin layer (A) is transmitted to form a cut product (clear = support layer (9) laminated body) The shape may be flat (four sides: cylindrical or heterogeneous (4) (transparent, cylindrical, (eight) *=Γ) (when transparent support (D) is provided, it is a transparent tree fat layer, (two (9) When the shape of the laminated body is flat, the transparent tree is .5 Γ: preferably. 4_ or more, and preferably 15mi« or less, more preferably 〇5 to μ transparent resin layer. 5 If the thickness of the brain above, 8mm «T.) is 0.4 or more, the mold is not easy to be bent and the thickness of the 201005430 transparent transparent wax layer (A) is added _ below, the waste of the material is more than It is better to change weight and use.

»又置透j支持物(D)時,透明樹脂層⑷之厚度宜在微 、圖案最大Π»度之丨倍〜1G倍的範圍内。—旦透明樹脂層(A) 之厚度較微、田圖案之最大高度更小,微細圖案之轉錄會有 不充刀纟it月樹脂層(A)之厚度一旦超過微細圖案最大 同度之1G倍透明樹脂層(A)之玻璃轉移溫度較低⑽。C以下) 時’微細圖#之尺寸安定性有變差之虞。透明樹脂層⑷之 厚度若於微細圖案最大高度之}倍〜1G倍的範圍内可輕易 地兼顧良好之轉錄性與良好之尺寸安定性。透明樹脂層㈧ 之厚度更宜在微細圖案最大高度之1,5倍〜6倍的範_。 官能基⑻宜為經基、環氧乙基或是胺基。官能基(X)可 為源自透明樹脂之官能基,亦可為藉著用以導人官能基⑻ 之表面處理而被賦予至透明樹脂層(A)表面之官能基。從可 任意控制官能基(X)之種類及量的觀點來看,宜為後者之官 能基。 用以導入官能基(X)之表面處理方法宜為:以具有官能 基(X)之矽烧Μ合劑(silane coupling agent)將透明樹脂層(A) 作表面處理之方法;藉電漿處理而將透明樹脂層(A)作表面 處理之方法;藉接枝聚合處理將透明樹脂層(A)作表面處理 之方法;藉UV臭氧處理而將透明樹脂層(A)作表面處理之 方法;及,將具有官能基(X)之底漆(primer)塗佈於透明樹脂 層(A)上之方法等。 具有官能基(X)之矽烷耦合劑宜為下述化合物。 15 201005430 具有胺基之矽烷耦合劑:胺基丙基三乙氧基矽烷、胺 基丙基曱基二乙氧基石夕烧、胺基乙基-胺基丙基三曱氧基石夕 烷、胺基乙基-胺基丙基甲基二甲氧基矽烷等。 具有環氡乙基之矽烷耦合劑:縮水甘油氧基丙基三曱 氧基妙炫*(Glycidoxypropyltrimethoxysilane)、縮水甘油氧基 丙基曱基二甲氧基矽烷等。 於透明樹脂層(A)表面形成中間層(C),藉此,部分或全 部之官能基(X)會與含氟聚合物(II)之部分或全部的反應性 基(y)形成化學鍵結。在透明樹脂層(A)之部分官能基(χ)已 形成化學鍵結時,本發明之模具中之透明樹脂層(Α)具有官 能基(X)。另一方面,透明樹脂層(Α)之全部官能基⑻均已 形成化學鍵結時,本發明之模具中之透明樹脂層(Α)不具有 Β能基(X)。 無論如何,形成中間層(c)後之透明樹脂層(Α)表面都存 在著由官祕⑻與反應性基(y)_紅化學鍵結。化學鍵 ,可列舉如:反應性基(y)為絲,且官能基⑻為經基或環 〇 乳乙基時之賴;及,反應性场)為羧基,且官能 胺基時之醯胺鍵等。因此,本發一 “、“ +赞明之模具中,透明樹脂層 ()與中間層(C)係透過化學鍵結而穩固地黏著。 (表面層(B)) 表面層(_^主鏈具有含氟脂職環結構 不具有下収舰基(狀含氟衫_賴_層。 或非::::=族環結構,聚合物⑴為無定形 16 201005430 所謂主鏈具有含氟脂肪族環 氟脂肪族環之構成環的碳原 冓係指.聚合物中,含 主鏈之碳原子。含氟脂1個以上為構成聚合物 之外’亦可包含氧原子及_ 切的料除了碳原子 有卜2個氧原子之含氟脂料環。心含氟_族環宜為具 數宜為4〜7個。 再成含I脂肪族環之原子 上述聚合物係令環狀單 之碳原子##ή °獲得者時,構成主鏈»When the j-support (D) is again placed, the thickness of the transparent resin layer (4) should be within the range of 微 to ~1G times the maximum Π» degree of the micro pattern. - the thickness of the transparent resin layer (A) is smaller, the maximum height of the field pattern is smaller, and the transcription of the fine pattern may not be filled. The thickness of the resin layer (A) is 1 G times the maximum degree of the same pattern of the fine pattern. The glass transition temperature of the transparent resin layer (A) is low (10). When C is below), the dimensional stability of the 'fine graph # has deteriorated. The thickness of the transparent resin layer (4) can easily achieve both good transcription and good dimensional stability if it is within the range of 1 to 1 G times the maximum height of the fine pattern. The thickness of the transparent resin layer (8) is preferably in the range of 1, 5 times to 6 times the maximum height of the fine pattern. The functional group (8) is preferably a trans group, an epoxy group or an amine group. The functional group (X) may be a functional group derived from a transparent resin, or may be a functional group imparted to the surface of the transparent resin layer (A) by surface treatment for guiding the functional group (8). From the viewpoint of arbitrarily controlling the kind and amount of the functional group (X), it is preferable to be the latter's functional group. The surface treatment method for introducing the functional group (X) is preferably a method of surface-treating the transparent resin layer (A) with a silane coupling agent having a functional group (X); a method of surface treating a transparent resin layer (A); a method of surface treating the transparent resin layer (A) by graft polymerization; and a method of surface treating the transparent resin layer (A) by UV ozone treatment; A method of applying a primer having a functional group (X) to the transparent resin layer (A). The decane coupling agent having a functional group (X) is preferably the following compound. 15 201005430 Alkane-based decane coupling agent: aminopropyl triethoxy decane, aminopropyl decyl diethoxy oxalate, aminoethyl-aminopropyltrimethoxy oxetane, amine Ethylethyl-aminopropylmethyldimethoxydecane, and the like. A decane coupling agent having a cyclodecylethyl group: glycidoxypropyltrimethoxysilane, glycidoxypropylpropyldimethoxydecane, and the like. An intermediate layer (C) is formed on the surface of the transparent resin layer (A), whereby part or all of the functional group (X) forms a chemical bond with some or all of the reactive groups (y) of the fluoropolymer (II). . When a part of the functional group (χ) of the transparent resin layer (A) has formed a chemical bond, the transparent resin layer (Α) in the mold of the present invention has a functional group (X). On the other hand, when all the functional groups (8) of the transparent resin layer (?) have formed chemical bonding, the transparent resin layer (?) in the mold of the present invention does not have a fluorenyl group (X). In any case, the surface of the transparent resin layer (Α) after the formation of the intermediate layer (c) is chemically bonded by the official (8) and the reactive group (y)_red. The chemical bond may be, for example, a reactive group (y) which is a silk, and the functional group (8) is a sulfhydryl group via a sulfhydryl group; and a reactive field is a carboxyl group, and a guanamine bond at a functional amine group Wait. Therefore, in the mold of the present invention, the transparent resin layer () and the intermediate layer (C) are firmly adhered by chemical bonding. (surface layer (B)) surface layer (_^ main chain has a fluorinated fat ring structure does not have a lower ship base (like fluorinated shirt _ _ layer. or non:::: = family ring structure, polymer (1) is amorphous 16 201005430 The carbon skeleton which has a constituent ring of a fluorine-containing aliphatic cyclofluoroaliphatic ring in the main chain, and the carbon atom of the main chain in the polymer. One or more of the fluorine-containing lipids constitute a polymer. In addition to 'oxygen atoms and _ cut materials in addition to carbon atoms with two oxygen atoms of the fluorine-containing fat ring. Heart fluorine _ family ring should preferably have a number of 4~7. The atom of the aliphatic ring, the above-mentioned polymer is a ring-shaped single carbon atom ##ή ° when it is obtained, it constitutes the main chain

上述聚合物係 I诙屌卞係源自聚合性雙鍵之碳原子, 令二稀系單斷環崎合㈣得料^ 係源自2個聚合性雙鍵之4個碳原子。 <主鏈之奴原子 肪族Ζ料糾:具有含氟脂肪族環,且構成該含氣脂 麟原子·碳原子之間具有聚合性雙鍵之單體;或 是,具有含氟脂肪族環,域成該含氟脂肪族環之碳原子 與含氟脂肪族環外之碳原子之間具有聚合性雙鍵的單體。 二烯系單體係指具有2個聚合性雙鍵之單體。 環狀單體及二烯系單體中,相對於已與碳原子鍵結之 SL原子及已與碳原子鍵結之氟原子的總數,已與碳原子鍵 結之氟原子數的比例各宜為80%以上,且以1〇〇%尤佳。 環狀單體宜為化合物(1)或化合物(2)。 17 201005430 【化1】The above-mentioned polymer system is derived from a carbon atom of a polymerizable double bond, and the diuret is a single ring-breaking ring (four) material derived from four carbon atoms of two polymerizable double bonds. <Slave of the main chain of the main chain: a monomer having a fluorine-containing aliphatic ring and having a polymerizable double bond between the gas-containing lipid atoms and carbon atoms; or having a fluorine-containing aliphatic group The ring is a monomer having a polymerizable double bond between a carbon atom of the fluorine-containing aliphatic ring and a carbon atom other than the fluorine-containing aliphatic ring. The diene monosystem refers to a monomer having two polymerizable double bonds. In the cyclic monomer and the diene monomer, the ratio of the number of fluorine atoms bonded to the carbon atom is preferably relative to the total number of the SL atoms bonded to the carbon atom and the fluorine atom bonded to the carbon atom. It is 80% or more, and is preferably 1%. The cyclic monomer is preferably the compound (1) or the compound (2). 17 201005430 【化1】

χ; x3 FC-CF 1 \ cf2 (2) 2但’ X表讀原子或碳原子數㈠之全氟院氧基,Rl 及R23各自獨立表示氟原子或碳原子數1〜6之全氟烧基,X2 及X3各自獨立表示氟原子或碳原子數1〜9之全氟烧基。 化合物(1)之具體例可列舉如化合物(Μ)〜(1_3)。 【化2】3; x3 FC-CF 1 \ cf2 (2) 2 but 'X readings the atomic or carbon number (a) of the perfluorol group, Rl and R23 each independently represent a fluorine atom or a perfluorocarbon number of 1 to 6 carbon atoms The groups, X2 and X3 each independently represent a fluorine atom or a perfluoroalkyl group having 1 to 9 carbon atoms. Specific examples of the compound (1) include, for example, the compounds (Μ) to (1_3). [Chemical 2]

OCFOCF

Fp=CF FC=CF FC=C ' 〇V〇 < > 〇N ;0 F3〇Acf3 % Π-1) (1-2) (1-3) 化合物(2)之具體例可列舉如化合物(2_i)〜(2-2)。 【化3] cf3 f2C-CF2 f2c-cf v S;0 CF2 cf2 (2-1) (2-2) 18 201005430 二烯系單體宜為化合物(3)。 CF2 =CF-Q-CF = CF2 ---(3) 但,Q表示碳原子數1〜3之全氟伸烷基(亦可具有醚氧原 子)。為具有醚氧原子之全氟伸烷基時,醚氧原子可存在於 該基之一個終端,亦可存在於該基之兩終端,也可存在於 該基之碳原子之間。從環化聚合性之觀點來看,以存在於 該基之一個終端為佳。Fp=CF FC=CF FC=C ' 〇V〇<>〇N; 0 F3 〇 Acf3 % Π-1) (1-2) (1-3) Specific examples of the compound (2) include, for example, a compound (2_i) ~ (2-2). [Chemical 3] cf3 f2C-CF2 f2c-cf v S; 0 CF2 cf2 (2-1) (2-2) 18 201005430 The diene monomer is preferably the compound (3). CF2 = CF-Q-CF = CF2 ---(3) However, Q represents a perfluoroalkylene group having 1 to 3 carbon atoms (which may also have an ether oxygen atom). In the case of a perfluoroalkylene group having an ether oxygen atom, an ether oxygen atom may be present at one terminal of the group, or may be present at both terminals of the group, or may be present between the carbon atoms of the group. From the viewpoint of cyclization polymerization, it is preferred to be present at one terminal of the group.

藉由化合物(3)之環化聚合,可製得具有下式〜(r) 中之1種以上單體單位的含氟聚合物。 【化4】By the cyclization polymerization of the compound (3), a fluorine-containing polymer having one or more monomer units of the following formulas (r) can be obtained. 【化4】

化合物(3)之具體例可列舉如化合物(3-1)〜(3-9)。 cf2 = = CFOCF2CF = CF2 • • · (3_1); cf2 = = cfocf(cf3)cf = cf2 • · · (3-2); cf2 = = cfocf2cf2cf = cf2 • · · (3-3); 19 201005430 cf2 cf2 cf2 cf2 cf2 2 . · · (3-4) CFOCF(CF3 )CF2 cf = CF CFOCF2CF(CF3)CF = CF2 . . . (3 5) CFOCF2 OCF = CF2 · · .(3-6); CFOC(CF3)2OCF = CF2 . . . (3_7). CFCF2CF二CF2 · . . (3_8); CF2==CFCF2CF2CF = CF2 · · .(3-9)。Specific examples of the compound (3) include the compounds (3-1) to (3-9). Cf2 == CFOCF2CF = CF2 • • · (3_1); cf2 == cfocf(cf3)cf = cf2 • · · (3-2); cf2 == cfocf2cf2cf = cf2 • · · (3-3); 19 201005430 cf2 Cf2 cf2 cf2 cf2 2 . · · (3-4) CFOCF(CF3 )CF2 cf = CF CFOCF2CF(CF3)CF = CF2 . . . (3 5) CFOCF2 OCF = CF2 · · .(3-6); CFOC( CF3) 2OCF = CF2 . . . (3_7). CFCF2CF II CF2 · . . (3_8); CF2==CFCF2CF2CF = CF2 · · . (3-9).

從含氟聚合物(I)之透明性的觀點來看,於含氟聚入物 ⑴中,相對於全單體單位(_莫耳%),具有錢脂肪二環 結構之單體單位的比例宜為2〇莫耳%以上,更宜為4〇莫耳% 以上,而尤宜為100莫耳%。具有含氟脂肪族環結構之單體 單位係指:藉環狀單體之聚合而形成之單體單位,或是藉 二烯系單體之環化聚合而形成之單體單位。From the viewpoint of the transparency of the fluoropolymer (I), in the fluorine-containing agglomerate (1), the ratio of the monomer unit having a money fat bicyclic structure to the all monomer unit (% by mole) It should be 2% or more of mol%, more preferably 4% by mole or more, and particularly preferably 100% by mole. The monomer unit having a fluorine-containing aliphatic ring structure means a monomer unit formed by polymerization of a cyclic monomer or a monomer unit formed by cyclization polymerization of a diene monomer.

含氟t合物(I)實質上不具有反應性基(y)。所謂實質上 不具有反應性基(y)係指,含氟聚合物⑴中之反應性基(y) 含量係於檢測界限以下。此外,含氟聚合物⑴於實質上亦 宜不具有反應性基(y)以外之反應性基。 含氟聚合物(I)之固有黏度宜為〇.ldL/g〜1.0dL/g。固有 黏度與含氟聚合物之分子量相關。固有黏度若為〇.ldL/g以 上,將會成為機械強度高之含氟聚合物(I),因此微細圖案 不易損傷。固有黏度若為l.〇dL/g以下,加熱時含氟聚合物 (I)之流動性變得良好’因此變得容易形成微細圖案。含氟 聚合物⑴之固有黏度更宜為〇.15dL/g〜0.75dL/g。 本發明中之固有黏度係於全氟(2-丁基四氫呋喃)中在 3〇°C下測定之固有黏度。黏度測定係使用烏氏黏度計 20 201005430 , (ubbelohde viscometer ’毛細管黏度計),細z剛進行。 含氟聚合物⑴宜為透明性高之含氟聚合物。含氟聚合 _之波長300〜50〇nm光的光線穿透率宜為9㈣以上。光線 冑透率係厚度謂吨之含—合物⑴的光線穿透率。 含敦聚合物⑴之玻璃轉移溫度宜為贼以上。含說聚 合物⑴之玻補移溫度若输€以上,使母模從表面層(b) . ㈣’微細圖案之尺寸精度變得良 ❹ #料’於令所得模具之微細圖轉錄至光硬化性樹脂 ㈣程中,含氟聚合物⑴之形狀得以維持而使圖案之尺寸 精度變得H含氟聚合物⑴之柄轉移溫度未達坑 時’雖可使母模之翻轉圖案於低溫下進行轉錄以使微細圖 ; #之尺寸精錢得良好,但在作業性及生產性的觀點上較 J 柯。含氟聚合物⑴之麵轉移溫度更宜為贼以上,且 以70°C以上更佳。 從難以合成㈣轉移溫度超過·。c之含氟聚合物⑴ ❹ 的觀‘點來看’含氣聚合物(I)之玻璃轉移溫度宜S200T:以 下,且更宜為150。(:以下。 含氟聚合物(I)可依習知方法來獲得。舉例來說,依後 述方法製得主鏈具有含氟脂肪族環結構之含氟聚合物(P)或 具有反應性基(y)之含氟聚合物(II)之後,使該含氟聚合物(P) ' 或含氟聚合物(II)與氟氣接觸,藉此可獲得實質上不含反應 性基(y)之含氟聚合物(J)。 表面層(B)之厚度宜為〇 2μιη以上。表面層之厚度若 為〇.2μηι以上’於轉錄母模之翻轉圖案時’不會發生銷孔等 21 201005430 之缺陷而可形成良好之微細圖案。表面層(B)之厚度更宜為 0_5μιη以上,而以Ιμπι以上更佳。 表面層(Β)之厚度宜為ΐ5μηι以下。表面層⑼之厚度若 為15μιη以下,可藉塗佈方式來形成厚度均勻之膜。表面層 (Β)之厚度更宜為1〇μΙη以下,而以5μιη以下更佳。 曰 令表面層(Β)之厚度為形成微細圖案前之模具前驅物 的表面層(Β)厚度。 (中間層(C)) . 中間層(c)係-由含氟聚合物(11)所構成之層,且該含 . 聚合物(II)主鏈具有含氟脂職環結構,且具料前述作 基(X)呈反應性之反應性基(y)。 主鍵具有含敗脂肪族環結構之含氟聚合物(11)為無定 形或非結晶性之聚合物。 含氟聚合物(II)除了具有反應性基⑺以外,與前述含氟 聚合物(I)為相同之聚合物。The fluorine-containing compound (I) does not substantially have a reactive group (y). The fact that substantially no reactive group (y) means that the content of the reactive group (y) in the fluoropolymer (1) is below the detection limit. Further, the fluoropolymer (1) does not substantially have a reactive group other than the reactive group (y). The inherent viscosity of the fluoropolymer (I) is preferably ld.ldL/g to 1.0 dL/g. The intrinsic viscosity is related to the molecular weight of the fluoropolymer. If the intrinsic viscosity is 〇.ldL/g or more, it will become a fluoropolymer (I) having a high mechanical strength, so that the fine pattern is not easily damaged. When the intrinsic viscosity is 1. 〇dL/g or less, the fluidity of the fluoropolymer (I) becomes good when heated. Therefore, it becomes easy to form a fine pattern. The inherent viscosity of the fluoropolymer (1) is more preferably from 15 dL/g to 0.75 dL/g. The intrinsic viscosity in the present invention is the intrinsic viscosity measured in perfluoro(2-butyltetrahydrofuran) at 3 °C. The viscosity was measured using a Ubbel viscometer 20 201005430, (ubbelohde viscometer ‘capillary viscometer), and fine z was just performed. The fluoropolymer (1) is preferably a fluoropolymer having high transparency. The light transmittance of the fluorine-containing polymerization _ wavelength of 300 to 50 Å is preferably 9 (four) or more. The light penetration rate is the thickness of the light-containing compound (1). The glass transition temperature of the polymer (1) should be above the thief. If the glass-filling temperature of the polymer (1) is more than €, the master mold is removed from the surface layer (b). (4) The dimensional accuracy of the fine pattern is improved. The material is transcribed to the photohardening of the obtained mold. In the process of the resin (four), the shape of the fluoropolymer (1) is maintained to make the dimensional accuracy of the pattern become H. When the flaky temperature of the fluoropolymer (1) is not reached, the flipping pattern of the master mold can be performed at a low temperature. Transcription to make a fine map; #的尺寸 fine money is good, but in terms of workability and productivity, it is better than J Ke. The surface transfer temperature of the fluoropolymer (1) is more preferably a thief or more, and more preferably 70 ° C or more. From the difficulty of synthesis (four) transfer temperature exceeds ·. The fluoropolymer of c (1) ❹ The point of view of the gas-containing polymer (I) is preferably a glass transition temperature of S200T: below, and more preferably 150. (The following. The fluoropolymer (I) can be obtained by a conventional method. For example, a fluoropolymer (P) having a fluorinated aliphatic ring structure in the main chain or a reactive group can be obtained by the method described later ( After the fluoropolymer (II) of y), the fluoropolymer (P) ' or the fluoropolymer (II) is contacted with fluorine gas, whereby substantially no reactive group (y) can be obtained. Fluoropolymer (J) The thickness of the surface layer (B) is preferably 〇2μηη or more. If the thickness of the surface layer is 〇.2μηι or more 'in the flip pattern of the transcription master mold, 'pin holes do not occur, etc. 21 201005430 The surface layer (B) preferably has a thickness of 0_5 μm or more, and more preferably Ιμπι or more. The thickness of the surface layer (Β) is preferably ΐ5 μηι or less. The thickness of the surface layer (9) is 15 μm or less. The film having a uniform thickness can be formed by coating. The thickness of the surface layer (Β) is preferably 1 〇μΙη or less, and more preferably 5 μηη or less. The thickness of the surface layer (Β) is before the formation of the fine pattern. The thickness of the surface layer (Β) of the mold precursor. (Intermediate layer (C)). Intermediate layer (c) - a layer composed of a fluoropolymer (11), and the polymer (II) main chain has a fluorinated aliphatic ring structure, and the reactive group (y) which is reactive as the above (X) The fluoropolymer (11) having a primary structure having a ruin-containing aliphatic ring structure is an amorphous or amorphous polymer. The fluoropolymer (II) has a reactive fluoropolymer (II) in addition to the fluoropolymer ( I) is the same polymer.

從中間層(C)與表面層(B)可更穩固黏著而使模具耐久 性優異之觀點來看,含氟聚合物⑴中之具有含氟脂肪族環 Q 結構的單體單位與含氟聚合_)中之具有含氟脂肪族環 結構的單體單位宜為相同之單體單位。 從含氟聚合物(I)之透明性的觀點來看,於含氟聚合物 (II)中,相對於全單體單师轉耳%),具有含旨肪贿 結構之單體單位的比例宜為轉耳%以上更宜為㈣耳% - 以上,且尤宜為100莫耳%。 含氟聚合物(11)具有反應性基(y)。反應性基(y)之種類 22 201005430 可因應依官能基(X)之種類來適當選擇。官能基(X)為羥基、 環氧乙基或胺基時,反應性基(y)宜為羧基、羥基、矽醇基 或該等之衍生物。從與環氧乙基或胺基之反應性較高而可 容易形成穩固鍵結之觀點來看,反應性基(y)尤宜為羧基。 此外,官能基(X)為經基時,從可容易地形成穩固鍵結之觀 點來看,宜為矽醇基或碳數1〜4之烷氧基矽烷基。 . 宜以紅外線光譜來確認有無反應性基(y)。此外,宜依 • 需要使用日本特開昭60-240713號公報所載方法,定量出 1〇6碳原子之平均反應性基數量。 含氟^聚合物(II)之固有黏度宜為0.1dL/g~1.0dL/g。固有 黏度與含氟聚合物之分子量相關。令固有黏度為 . 0.ldL/g〜l.〇dL/g,藉此可使與含氟聚合物(I)之親和性提 - 高,表面層(B)與中間層(C)之間可獲得良好之密著性。含敗 聚合物(II)之固有黏度更宜為0.15dL/g〜0.75dL/g。 含氟聚合物(II)宜為透明性兩之含氟聚合物。含氟聚合 參 物(π)之波長300〜500nm光的光線穿透率宜為90%以上。光 線穿透率為厚度ΙΟΟμηι之含氟聚合物(π)的光線穿透率。 含氟聚合物(II)可依習知方法獲得。舉例來說,於烴系 自由基聚合起始劑存在下,使二烯系單體或環狀單體聚合 而製得主鏈具有含氟脂肪族環結構之含氟聚合物(Ρ),接著 . 將*亥含氟聚合物(ρ)置於乳氣環境下加熱處理,再浸潰於水 中,即可獲得反應性基(y)為羧基之含氟聚合物(11)。 如曰本特開平4-226177號公報所載方法般,令具有羧 基之含氟聚合物(II)的該叛基醋化而製成叛酸甲醋,再使叛 23 201005430 酸甲酯與具有胺基或環氧乙基之矽烷耦合劑反應而形成酿 胺鍵’藉此可獲得反應性基(y)為矽醇基之含氟聚合物⑴)。 使具有羧基之含氟聚合物的該羧基還原,藉此可獲得 反應性基(y)為羥基之含氟聚合物(11)。 中間層(C)之厚度宜為5nm〜2000nm。若中間層(c)之厚 度為5mn以上,可形成均勻之膜,獲得較高之密著性。中間 層(c)之厚度若為2000nm以下,材料之浪費較少。中間層(〇 之厚度更且為l〇nm~100〇nm,而以20〜500nm更佳。 令中間層(C)之厚度為形成微細圖案前模具前驅物之 ❹ 中間層(C)厚度。 (透明支持物(D)) 透明樹脂層(A)宜被透明支持物(D)支持。 透月樹月曰層(A)被透明支持物(D)支持,則轉錄母模 之翻轉圖案時,透明樹脂層⑷之彎曲受到抑制,可選來作 為透明樹脂層(A)材料之透明樹脂的選項增多。From the viewpoint that the intermediate layer (C) and the surface layer (B) can be more firmly adhered to make the mold durable, the monomer unit having a fluorine-containing aliphatic ring Q structure in the fluorine-containing polymer (1) and the fluorine-containing polymerization are obtained. The monomer unit having a fluorinated aliphatic ring structure in _) is preferably the same monomer unit. From the viewpoint of the transparency of the fluoropolymer (I), in the fluoropolymer (II), the ratio of the monomer unit having the structure of the fraternal bribe is relative to the total monomer unit (%) Preferably, it is more than (%) ear% or more, and particularly preferably 100% by mole. The fluoropolymer (11) has a reactive group (y). The type of the reactive group (y) 22 201005430 can be appropriately selected depending on the type of the functional group (X). When the functional group (X) is a hydroxyl group, an epoxy group or an amine group, the reactive group (y) is preferably a carboxyl group, a hydroxyl group, a decyl group or a derivative thereof. The reactive group (y) is particularly preferably a carboxyl group from the viewpoint of high reactivity with an epoxy group or an amine group and easy formation of a stable bond. Further, when the functional group (X) is a trans-group, it is preferably a decyl group or an alkoxyalkyl group having 1 to 4 carbons from the viewpoint that a stable bond can be easily formed. It is preferable to confirm the presence or absence of a reactive group (y) by an infrared spectrum. In addition, it is necessary to quantify the average number of reactive groups of 1 to 6 carbon atoms using the method described in JP-A-60-240713. The inherent viscosity of the fluorine-containing polymer (II) is preferably from 0.1 dL/g to 1.0 dL/g. The intrinsic viscosity is related to the molecular weight of the fluoropolymer. Let the intrinsic viscosity be 0.ldL/g~l.〇dL/g, whereby the affinity with the fluoropolymer (I) can be improved, and between the surface layer (B) and the intermediate layer (C) Good adhesion can be obtained. The intrinsic viscosity of the polymer (II) is preferably from 0.15 dL/g to 0.75 dL/g. The fluoropolymer (II) is preferably a transparent fluoropolymer. The light transmittance of light having a wavelength of 300 to 500 nm of the fluorine-containing polymerization parameter (π) is preferably 90% or more. The light transmittance is the light transmittance of the fluoropolymer (π) having a thickness of ΙΟΟμηι. The fluoropolymer (II) can be obtained by a conventional method. For example, in the presence of a hydrocarbon-based radical polymerization initiator, a diene monomer or a cyclic monomer is polymerized to obtain a fluoropolymer (Ρ) having a fluorinated aliphatic ring structure in a main chain, followed by. The fluoropolymer (11) having a reactive group (y) as a carboxyl group can be obtained by subjecting the fluoropolymer (ρ) to heat treatment in a milky atmosphere and then impregnating it in water. The retinoyl group of the fluoropolymer (II) having a carboxyl group is made into a retinoic acid vinegar according to the method described in Japanese Patent Application Laid-Open No. Hei 4-226177, and the reductive methyl ester of 2010-0430 is provided. The amine group or the epoxy ethyl decane coupling agent reacts to form a brewing amine bond 'by thereby obtaining a fluoropolymer (1) having a reactive group (y) which is a sterol group. The carboxyl group of the fluoropolymer having a carboxyl group is reduced, whereby a fluoropolymer (11) having a reactive group (y) as a hydroxyl group can be obtained. The thickness of the intermediate layer (C) is preferably from 5 nm to 2000 nm. If the thickness of the intermediate layer (c) is 5 mn or more, a uniform film can be formed, and a high adhesion can be obtained. If the thickness of the intermediate layer (c) is 2000 nm or less, material waste is less. The intermediate layer (the thickness of the tantalum is more preferably from 10 nm to 100 nm, and more preferably from 20 to 500 nm. The thickness of the intermediate layer (C) is the thickness of the intermediate layer (C) of the mold precursor before the formation of the fine pattern. (Transparent Support (D)) The transparent resin layer (A) should be supported by the transparent support (D). The Mooncake layer (A) is supported by the transparent support (D), and the transcription pattern of the master mold is reversed. The bending of the transparent resin layer (4) is suppressed, and the option of a transparent resin as a material of the transparent resin layer (A) is increased.

透明支持物(D)之熱變形溫度宜為i〇〇°c以上,更宜j 12〇C以上。透明支持物(D)之熱變形溫度若為1〇(rc以上 維持透明樹脂層(A)形狀之狀態下進行加熱,作業性$ 、此外,轉錄母模之翻轉圖案時,可尺寸安定性良好A 轉錄翻轉圖案。 透明支持物(D)之熱變形溫度上限並未特別受限。亦可 吏用坡螭等無機材料般之熱變形溫度超過300。(:的透明支 持物〇)&gt;。 本發明 中之熱變形溫度係依ASTM D648 ,於 1.82MPa 24 201005430 • 荷重條件下測定。 透明支持物(D)之材料可列舉如無機材料(石英、玻璃、 透光性喊等)及透明樹脂(聚碳酸醋(PC)、聚對苯二甲酸乙 —Sa(PET)、聚對苯二甲酸丁二S旨(PBT)、聚萘二甲酸乙二 醋(PEN)、苐系聚酯、C〇P、聚芳酯(__扯,pAR)、芳 香族聚㈣賴(PEEK)、芳香族㈣礙(pES)、㈣香族聚 • _、氟樹脂、魏樹脂、丙騎樹脂、環氧樹脂及盼樹脂 φ 等)。從光線穿透率、成形加工性及耐熱性之觀點來看,宜 為石英、玻璃、PC及COP。 (模具之製造方法) 本發明之模具製造方法可列舉如依序進行下述步驟 &gt; M1、下述步驟M2、下述步驟M3及下述步驟肘4的方法。 ^ 步驟M1 .於表面具有官能基(X)之透明樹脂層(A)的該 表面側,塗佈係於含氟溶劑中溶有含氟聚合物(π)之溶液, 接著藉乾燥來去除含氟溶劑,而使含氟聚合物(H)所構成之 Θ 巾間層(C)形成於表面具有官能基⑻之透明樹脂層(A)的該 表面側。 步驟M2··於中間層(C)之表面侧塗佈係於含氟溶劑溶有 含氟聚合物(I)之溶液,接著藉乾燥來去除含氟溶劑而於 - 中間層(C)表面形成由含氟聚合物⑴所構成之表面層(B),製 , 得模具前驅物。 步驟M3 :將表面具有微細圖案之翻轉圖案且該翻轉圖 案最大高度超過表面層(B)厚度與中間層(c)厚度總量之母 模的該翻轉圖案,於令模具前驅物及母模中之至少一者呈 25 201005430 含氟聚合物(I)及含氟聚合物(II)之破璃轉移溫度以上的狀 態下’從模具前驅物之表面層(B)側壓緊,而橫跨表面層 (B)、中間層(C)及透明樹脂層(A)形成微細圖案,製得本發 明之模具。 步驟M4:將模具及母模冷卻至含氟聚合物⑴及含氟聚 合物(II)之玻璃轉移溫度以下後,使模具從母模分離。 步驟Ml中之乾舞係於透明樹脂層(A)之部分或全部官 能基(X)與含氟聚合物(Π)之部分或全部反應性基之間可 形成化學鍵結的溫度下進行。乾燥溫度通常為l〇〇°C以上。 步驟M2中之乾燥溫度宜為含氟聚合物(II)之玻璃轉移 溫度以上及含氟聚合物(I)之玻璃轉移溫度以上。藉由於該 溫度下進行乾燥,中間層(C)與表面層(B)可高強度地黏著。 步驟M3中,將模具前驅物及母模中之至少一者加熱至 含氟聚合物(I)及含氟聚合物(II)之玻璃轉移溫度以上。加熱 溫度若為含氟聚合物⑴及含氟聚合物(II)之玻璃轉移溫度 以上,可高精度地轉錄母模之翻轉圖案。加熱溫度宜較含 氟聚合物(I)及含氟聚合物(π)之玻璃轉移溫度更高1(rc以 上。加熱溫度宜為250°C以下,更宜為220°C以下。加熱溫 度一旦超過250°C,以官能基(X)與反應性基(y)為基礎之化 學鍵結會被破壞,透明樹脂層(A)與中間層(C)之間有發生剝 離之虞。 此外,步驟M3中,即使是在模具如驅物及母模之加熱 溫度未達含氟聚合物⑴及含氟聚合物(π)之玻璃轉移溫度 時,只要加熱溫度為透明樹脂層(Α)之玻璃轉移溫度以上, 26 201005430 即可進行圖案之轉錄,但會有圖案形狀無法正確轉錄、發 生圖案轉錄不及之領域以及圖案表面粗链之虞。 步驟Μ3+ ’模具前驅物及母模之加熱溫度較透明樹脂 f(A)之玻璃轉移溫度更低時,圖案將不會被轉錄。 上述說明之本發明模具因其係由透明樹脂層(Α)、含氟 聚合物(II)所構成之中間層(c)及含㈣合物⑴所構成之表 . 自雜)的積層體,而具有高度之光穿透性。 φ 此外,本發明之模具因表面層(Β)為含氟聚合物(I)所構 《之層’而具有可令高黏著性之光硬化性_顏程度的 同度脫膜性。此外’因無需塗佈脫膜劑而具有高精度之微 、”田圖案’ 即使重覆使用,微細圖案亦不易因脫膜劑而受 到汙染。 η 此外本發明模具之構成透明樹脂層(Α)之透明樹脂的 纟璃轉移溫度係於含m物⑴及含㈣合物(II)之玻璃 轉移溫度以下。因此,即使微細圖案之最大高度(包含模具 ❹ ㈣f曲之凹凸結構的最大高低差)超過表面層⑻厚度與 中間層(C)厚度之總量,轉錄母模之翻轉圖案時,透明樹脂 層(A)會變形而可追隨翻轉圖案之凹凸結構及母模整體弯 曲等’而可橫跨表面層(B)、中間層(C)及透明樹脂層(A)且 . 冑精度地形成微細圖案。再者,緊壓母模時,即使母模與 ' 表面層(B)之間混人異物粒子,H透明樹脂層(A)變形而不會 損傷價昂之母模。 &lt;具有轉錄微細圖案之基材的製造方法&gt; 本發明之具有轉錄微細圖案之基材的製造方法可列舉 27 201005430 如下述方法(a)〜(c)。 方法⑷: 具有下述步驟(a-l)〜(a-4)之方法。 (a-Ι)將光硬化性樹脂20配置於基材30表面之步驟。 (a-2)如第2圖所示,將模具10緊壓於光硬化性樹脂20, 以使該模具10之微細圖案18與光硬化性樹脂20相接的步 (a-3)在將模具10緊壓於光硬化性樹脂20之狀態下,對 光硬化性樹脂20照射光,使光硬化性樹脂20硬化而製出硬 化物的步驟。 (a-4)使模具10從硬化物分離之步驟。 方法: 具有下述步驟(b-Ι)〜(b-4)之方法。 (b-Ι)將光硬化性樹脂20配置於模具1〇之微細圖案18表 面的步驟。 (b-2)如第3圖所示,將基材30緊壓於模具10表面之光硬 化性樹脂20的步驟。 (b-3)於將基材30緊壓至光硬化性樹脂20之狀態下,對 光硬化性樹脂20照射光,使光硬化性樹脂2〇硬化而製出硬 化物的步驟。 (b-4)使模具10從硬化物分離之步驟。 方法(c): 具有下述步驟(c-1)〜(c-4)之方法。 (c-1)使基材30與模具1〇接近或接觸,而使模具10之微 28 201005430 細圖案18成為該基材30側的步驟。 (c-2)如第4圖所示,將光硬化性樹脂2〇充填於基材3〇與 模具10之間的步驟。 (c-3)於基材30與模具10呈接近或接觸的狀態下,對光 硬化性樹脂20照射光,使光硬化性樹脂2〇硬化而製出硬化 物的步驟。 (c-4)使模具10從硬化物分離的步驟。 光硬化性樹脂係指會因光照射而硬化並形成硬化物之 樹脂。 光硬化性樹脂宜為包含聚合性化合物及光聚合起始劑 之光硬化性樹脂。 聚合性化合物為具有聚合性基之化合物’可列舉如聚 合性單體、聚合性募聚物及聚合性聚合物。 光聚合起始劑係指會因光引起自由基反應或離子反應 的光聚合起始劑。 光照射通常係從模具10側進行。基材30之光穿透性高 時,亦可從基材30側進行光照射。 光照射中之光波長僅需為本發明模具係具有高度光穿 透性之波長範圍即可。從可使一般之光硬化性樹脂於低溫 下硬化的觀點來看,光照射中之光波長尤宜為高壓水銀燈 之g線(波長436nm)或i線(波長365nm)。 因透明樹脂層(A)與石英或玻璃相較下耐光性較差,光 照射中之光宜不含波長未達3 OOnm之光,更宜不含未達 350nm之光。不含波長未達3〇〇nm之光時,不易引起透明樹 29 201005430 脂層(A)黃變或脆化,可更長期地使用模具1〇。 方法(a)〜(c)之各步驟中,系統溫度宜於含氟聚合物(1) 之玻璃轉移溫度以下。 本發明之製造方法所製造之具有轉錄微細圖案之基材 ' 係於基材表面具有由光硬化性樹脂之硬化物所構成之轉錄 微細圖案。轉錄微細圖案係本發明模具之微細圖案翻轉而 成之微細圖案。 轉錄微細圖案宜為由光硬化性樹脂硬化物所構成之具 有凹凸結構之構造物(以下亦記為凹凸構造物)。凹凸構造物 © 亦可具有由表面具有凹凸形狀之連續物所構成之層結構, 且亦可具有由獨立突起物之集合所構成的結構。前者係 指:由包覆基材表面之光硬化性樹脂硬化物之層所構成, 且光硬化性樹脂硬化物之層表面呈現凹凸形狀的結構。後 者係指:光硬化性樹脂硬化物所構成之突起物係多數獨立 存在於基材表面,且連同基材表面所構成之凹部共同呈現 凹凸形狀的結構。無論是在任一情況下,凸結構部(突起物) 均由光硬化性樹脂硬化物構成。此外,凹凸構造物亦可具 〇 有於基材表面之不同位置一併具有前述2種結構的結構。 具有轉錄微細圖案之基材可列舉如半導體元件、記錄 媒體、MEMS、生技關連部件及光學部件等。 MEMS、生技關連部件及光學部件之具體例可列舉如 下述者。 印字頭、HDD頭、高頻開關、振里器用振動子、光通 訊用光開關、光掃描器、電子紙、數位鏡裝置、微音器、 30 201005430 • 壓力感測器、觸覺感測器、慣性感測器、加速度感測器、 陀螺儀感測器、生物感測器、微閥(microvalve)、微流路、 • DNA分析晶片、蛋白質分析晶片、血液檢測晶片、能動導 管、藥物傳送系統、化學感測器、棱鏡片、微鏡陣列及光 導波路等。 依據以上說明之本發明之具有轉錄微細圖案的基材製 造方法,可高精度且生產效率良好地轉錄模具之微細圖 φ 案’且可形成最大高度相對較大之轉錄微細圖案。 實施例 以下列舉實施例以說明本發明,但本發明並不侷限於 該等實施例。 , 例6〜8、12〜14為實施例,例4、5、9、10、15為比較例。 ^ (固有黏度) 3氟聚合物之固有黏度係使用玻璃烏氏管,於3〇。匸之 全氟(2-丁基四氫0夫喃)中測定者。 參 (紅外線吸收光譜) 3氟聚合物之紅外線吸收光谱係使用傅立葉轉換紅外 線分光計(尼可雷特社製,20DXC)測定者。 (玻璃轉移溫度) 透明樹脂及含氟聚合物之玻璃轉移溫度係使用示差掃 - 七田熱析儀(布魯克Axs社製,DSC31〇〇),於昇溫速度聰/ 刀之條件下測定者。此外,玻璃轉移溫度之測定係以jis K7121 : 1987為準進行測定,且令巾間點玻璃轉移溫度為玻 璃轉移溫度。 31 201005430 (熱變形溫度) 依AS™ D648 ’使用熱變形測試機(Heat Distortion tester,女田精機製作所社製,HD_pc),於182Mpa荷重之 條件下測定透明樹脂之熱變形溫度。 - (光線穿透率) 透明樹脂層(A)之膜、或是透明樹脂層⑷與透明支持 物(D)之積層體的极⑽穿透率及365膽穿透帛以及含氣聚 合物膜之波長3GG〜5GGnm光的光線穿透率係使用分光光度 計(日立高科技社製,U-41〇〇)測定。 © (厚度) 表面層(B)及中間層(C)之厚度係使用光干涉式膜厚測 定裝置(濱松荷特尼克斯社製,cl〇178)測定。令含氟聚合 物(1-1)、含氟聚合物(II-1)及含氟聚合物(11_2)之折射率分別 、 為 1 ·34 〇 (最大高度) 形成於模具之微細圖案的最大高度係使用共軛焦雷射 顯微鏡(奇研社製,VK-9500),以輪廓計測來求出。於ν溝 〇 圖案的情況下,測定相對於溝呈垂直方向之輪廓,而於圓 筒狀圖案的情況下,測定通過圓筒中心之線上輪廓。具體 來說’於透鏡倍率50倍、光學變焦丨倍、測定節距〇 〇5μπι之 條件下進行彩色超深度觀察,進行面傾斜矯正(自動)後,求 出長度200μπι範圍中之輪廓,再求出凹凸結構之最高山頂 線與最低谷底線之最大高低差。 [例1] 32 201005430 含氟聚合物(p-i)之製造: 於熱壓釜(耐壓玻璃製)中加入l〇〇g化合物(3-3)、0.5g 甲醇及0.7g化合物(4-1),以懸浮聚合法進行化合物(3_3)之 聚合,製得含氟聚合物(P-1)。含氟聚合物(P-1)係由下式(α -1)所示單體單位所構成的聚合物。含氟聚合物(pq)之固有 黏度為0.34dL/g。含氟聚合物(pq)之玻璃轉移溫度為1〇8 。(:。 ❹ CF2=CF〇CF2CF2CF = CF2 . . . (3-3); ((CH3)2CH〇CO〇)2 · · .(4-1)。 【化5】The heat distortion temperature of the transparent support (D) is preferably i 〇〇 ° c or more, more preferably j 12 〇 C or more. When the heat-resistant temperature of the transparent support (D) is 1 Torr (when the shape of the transparent resin layer (A) is maintained at rc or more, the workability is $, and when the transfer master mold is reversed, the dimensional stability is good. A. The transcriptional reversal pattern is not particularly limited. The heat distortion temperature of the transparent support (D) is not particularly limited. The thermal deformation temperature of inorganic materials such as sloping enamel may exceed 300. (: transparent support 〇)&gt;. The heat distortion temperature in the present invention is measured under the load condition according to ASTM D648 at 1.82 MPa 24 201005430. The material of the transparent support (D) may be, for example, an inorganic material (quartz, glass, light transmissive, etc.) and a transparent resin. (Polycarbonate (PC), polyethylene terephthalate-Sa (PET), polybutylene terephthalate (PBT), polyethylene naphthalate (PEN), lanthanide polyester, C 〇P, polyarylate (__ pull, pAR), aromatic poly (tetra) lys (PEEK), aromatic (four) barrier (pES), (four) fragrant poly _, fluororesin, Wei resin, propylene riding resin, epoxy Resin and resin φ, etc.) From the viewpoints of light transmittance, formability and heat resistance, it is preferably quartz or glass. PC and COP. (Manufacturing method of the mold) The method for producing a mold according to the present invention includes the following steps: M1, the following step M2, the following step M3, and the following method of the elbow 4. ^Step M1 On the surface side of the transparent resin layer (A) having a functional group (X) on the surface, a solution in which a fluoropolymer (π) is dissolved in a fluorine-containing solvent is applied, followed by drying to remove the fluorine-containing solvent, Further, the inter-wicking layer (C) composed of the fluoropolymer (H) is formed on the surface side of the transparent resin layer (A) having the functional group (8) on the surface. Step M2·· on the surface of the intermediate layer (C) The side coating is a solution in which a fluorine-containing solvent is dissolved in the fluorine-containing polymer (I), followed by drying to remove the fluorine-containing solvent to form a surface layer composed of the fluorine-containing polymer (1) on the surface of the intermediate layer (C) ( B), made, the mold precursor. Step M3: the flip pattern of the surface having a fine pattern of the flip pattern and the flip pattern having a maximum height exceeding the thickness of the surface layer (B) and the total thickness of the intermediate layer (c) , at least one of the mold precursor and the master mold is 25 201005430 fluoropolymer (I) When the fluoropolymer (II) has a glass transition temperature or higher, it is pressed from the surface layer (B) side of the mold precursor, and across the surface layer (B), the intermediate layer (C), and the transparent resin layer ( A) A fine pattern is formed to obtain a mold of the present invention. Step M4: After cooling the mold and the master mold to a temperature below the glass transition temperature of the fluoropolymer (1) and the fluoropolymer (II), the mold is separated from the master mold. The dry dance in the step M1 is carried out at a temperature at which a part or all of the functional group (X) of the transparent resin layer (A) and a part or all of the reactive groups of the fluoropolymer (Π) form a chemical bond. The drying temperature is usually above 10 °C. The drying temperature in the step M2 is preferably at least the glass transition temperature of the fluoropolymer (II) and above the glass transition temperature of the fluoropolymer (I). The intermediate layer (C) and the surface layer (B) can be adhered with high strength by drying at this temperature. In the step M3, at least one of the mold precursor and the master mold is heated to a temperature higher than the glass transition temperature of the fluoropolymer (I) and the fluoropolymer (II). When the heating temperature is equal to or higher than the glass transition temperature of the fluoropolymer (1) and the fluoropolymer (II), the flip pattern of the master mold can be transcribed with high precision. The heating temperature is preferably higher than the glass transition temperature of the fluoropolymer (I) and the fluoropolymer (π) by 1 (rc or more. The heating temperature is preferably 250 ° C or less, more preferably 220 ° C or less. Above 250 ° C, the chemical bond based on the functional group (X) and the reactive group (y) is destroyed, and there is a peeling between the transparent resin layer (A) and the intermediate layer (C). In M3, even when the heating temperature of the mold such as the drive and the master mold does not reach the glass transition temperature of the fluoropolymer (1) and the fluoropolymer (π), as long as the heating temperature is the glass transition of the transparent resin layer (Α) Above the temperature, 26 201005430 can transcribe the pattern, but there will be a pattern shape that cannot be correctly transcribed, a region where the pattern is not transcribed, and a thick chain on the surface of the pattern. Step +3+ 'The temperature of the mold precursor and the master mold is higher than that of the transparent resin. When the glass transition temperature of f(A) is lower, the pattern will not be transcribed. The mold of the present invention described above is an intermediate layer composed of a transparent resin layer (Α) and a fluoropolymer (II). And the composition of (4) compound (1). Self-mixed) Laminate, having a height light penetration. Further, the mold of the present invention has the same degree of film release property as a layer of the fluoropolymer (I) because the surface layer (Β) is a layer of the fluoropolymer (I). In addition, 'there is no need to apply a release agent, and it has high precision, and the "pattern" is not easily contaminated by the release agent even if it is used repeatedly. η In addition, the transparent resin layer (Α) of the mold of the present invention is formed. The glass transition temperature of the transparent resin is below the glass transition temperature of the m-containing (1) and (tetra)-containing compound (II). Therefore, even the maximum height of the fine pattern (including the maximum height difference of the concave-convex structure of the mold ❹ (4) f curve) When the thickness of the surface layer (8) and the thickness of the intermediate layer (C) exceed the total thickness of the intermediate layer (C), the transparent resin layer (A) is deformed to follow the concave-convex structure of the inverted pattern and the overall bending of the master mold. The fine pattern is formed accurately across the surface layer (B), the intermediate layer (C), and the transparent resin layer (A). Further, when the master mold is pressed, even if the master mold is mixed with the 'surface layer (B) The foreign matter particles and the H transparent resin layer (A) are deformed without damaging the expensive master mold. <Method for Producing Substrate Having Transcribed Fine Pattern> The method for producing a substrate having a transcription fine pattern of the present invention can be List 27 201005430 as follows The method (a) to (c). The method (4): The method of the following steps (al) to (a-4): (a-Ι) The step of disposing the photocurable resin 20 on the surface of the substrate 30. -2) As shown in Fig. 2, the mold 10 is pressed against the photocurable resin 20 so that the fine pattern 18 of the mold 10 is in contact with the photocurable resin 20 (a-3). In the state in which the photocurable resin 20 is pressed against the photocurable resin 20, the photocurable resin 20 is irradiated with light to cure the photocurable resin 20 to produce a cured product. (a-4) Step of separating the mold 10 from the cured product Method: The method of the following steps (b-Ι) to (b-4): (b-Ι) The step of disposing the photocurable resin 20 on the surface of the fine pattern 18 of the mold 1 (b-2) As shown in Fig. 3, the substrate 30 is pressed against the photocurable resin 20 on the surface of the mold 10. (b-3) In the state where the substrate 30 is pressed to the photocurable resin 20, the light is applied. The curable resin 20 is irradiated with light to cure the photocurable resin 2 to produce a cured product. (b-4) A step of separating the mold 10 from the cured product. Method (c): has the following steps (c- 1) The method of (c-4) (c-1) the substrate 30 and The step of making the micro-28 201005430 fine pattern 18 of the mold 10 close to or in contact with the mold 10 is the step of the substrate 30. (c-2) As shown in Fig. 4, the photocurable resin 2 is filled on the substrate. (c-3) The photocurable resin 20 is irradiated with light to cure the photocurable resin 2 in a state in which the substrate 30 is in close contact with or in contact with the mold 10, and the photocurable resin is cured. Step of curing the cured material (c-4) Step of separating the mold 10 from the cured product. The photocurable resin is a resin which is cured by light irradiation to form a cured product. The photocurable resin is preferably a photocurable resin containing a polymerizable compound and a photopolymerization initiator. The polymerizable compound is a compound having a polymerizable group, and examples thereof include a polymerizable monomer, a polymerizable polymer, and a polymerizable polymer. The photopolymerization initiator refers to a photopolymerization initiator which causes a radical reaction or an ionic reaction due to light. Light irradiation is usually performed from the side of the mold 10. When the light transmittance of the substrate 30 is high, light irradiation can be performed from the side of the substrate 30. The wavelength of light in the light irradiation only needs to be a wavelength range in which the mold system of the present invention has high light transmittance. From the viewpoint of curing the general photocurable resin at a low temperature, the wavelength of light in the light irradiation is particularly preferably the g line (wavelength 436 nm) or the i line (wavelength 365 nm) of the high pressure mercury lamp. Since the transparent resin layer (A) is inferior in light resistance to quartz or glass, the light in the light irradiation should preferably not contain light having a wavelength of less than 300 nm, and preferably does not contain light of less than 350 nm. When the light of wavelength less than 3〇〇nm is not included, it is not easy to cause transparent tree. 29 201005430 The lipid layer (A) is yellow or embrittled, and the mold can be used for a longer period of time. In each of the steps (a) to (c), the system temperature is preferably below the glass transition temperature of the fluoropolymer (1). The substrate having a transcribed fine pattern produced by the production method of the present invention has a transcribed fine pattern composed of a cured product of a photocurable resin on the surface of the substrate. The transcribed fine pattern is a fine pattern in which the fine pattern of the mold of the present invention is inverted. The transcribed fine pattern is preferably a structure having a concavo-convex structure composed of a cured photocurable resin (hereinafter also referred to as a concavo-convex structure). The concavo-convex structure © may have a layer structure composed of a continuous object having a concavo-convex shape on the surface, and may have a structure composed of a collection of independent protrusions. The former is a structure in which a layer of a photocurable resin cured material covering the surface of the substrate is formed, and the surface of the layer of the photocurable resin cured product has a concavo-convex shape. The latter means that the projections composed of the cured film of the photocurable resin are mostly independently present on the surface of the substrate, and have a structure in which the concave portion formed by the surface of the substrate together exhibits a concavo-convex shape. In either case, the convex structure portion (protrusion) is composed of a photocurable resin cured product. Further, the concavo-convex structure may have a structure having the above two structures at different positions on the surface of the substrate. Examples of the substrate having a transcribed fine pattern include a semiconductor element, a recording medium, a MEMS, a biotechnology-related member, and an optical member. Specific examples of the MEMS, the biotechnological related component, and the optical component are as follows. Printing head, HDD head, high frequency switch, vibrator for vibrator, optical switch for optical communication, optical scanner, electronic paper, digital mirror device, microphone, 30 201005430 • Pressure sensor, tactile sensor, Inertial sensors, acceleration sensors, gyroscope sensors, biosensors, microvalve, microfluidics, DNA analysis wafers, protein analysis wafers, blood detection wafers, active catheters, drug delivery systems , chemical sensors, prism sheets, micro mirror arrays and optical waveguides. According to the method for producing a substrate having a transcribed fine pattern of the present invention described above, it is possible to transcribe a fine pattern φ of a mold with high precision and high productivity, and to form a transcribed fine pattern having a relatively large maximum height. EXAMPLES The following examples are given to illustrate the invention, but the invention is not limited to the examples. Examples 6 to 8, 12 to 14 are examples, and examples 4, 5, 9, 10, and 15 are comparative examples. ^ (Intrinsic Viscosity) The intrinsic viscosity of 3 fluoropolymers is the use of glass Ubbelite at 3 〇. The test is carried out in perfluoro(2-butyltetrahydrofuran). Ref. (Infrared Absorption Spectrum) The infrared absorption spectrum of the 3 fluoropolymer was measured using a Fourier transform infrared spectrometer (manufactured by Nikolet, 20DXC). (Glass transfer temperature) The glass transition temperature of the transparent resin and the fluoropolymer was measured using a differential sweeper - a seven-field pyrolyzer (manufactured by Bruker Axs, DSC31(R)) under the conditions of a heating rate of Cong/knife. Further, the glass transition temperature was measured in accordance with jis K7121: 1987, and the glass transition temperature between the towels was changed to the glass transition temperature. 31 201005430 (Heat Deformation Temperature) The heat distortion temperature of the transparent resin was measured under a load of 182 MPa using a heat distortion tester (Heat Distortion Tester, manufactured by Nishida Seiki Co., Ltd., HD_pc) according to ASTM D648'. - (Light transmittance) The film of the transparent resin layer (A), or the polar (10) transmittance of the laminate of the transparent resin layer (4) and the transparent support (D), and the 365 biliary penetration enthalpy and the gas-containing polymer film The light transmittance of the light of the wavelength of 3 GG to 5 GGnm was measured using a spectrophotometer (U-41 制, manufactured by Hitachi High-Technologies Corporation). © (thickness) The thickness of the surface layer (B) and the intermediate layer (C) was measured using an optical interference type film thickness measuring device (manufactured by Hamamatsu Hernix Co., Ltd., cl〇178). The refractive index of the fluoropolymer (1-1), the fluoropolymer (II-1) and the fluoropolymer (11_2) is respectively 1.34 〇 (maximum height). The height was obtained by a contour measurement using a conjugated-focus laser microscope (VK-9500, manufactured by Koshihiko Co., Ltd.). In the case of the ν groove 〇 pattern, the contour in the vertical direction with respect to the groove is measured, and in the case of the cylindrical pattern, the contour on the line passing through the center of the cylinder is measured. Specifically, the color ultra-depth observation is performed under the conditions of a lens magnification of 50 times, an optical zoom of 丨, and a measurement pitch of μ5 μm, and after the surface tilt correction (automatic) is performed, the contour in the range of 200 μm is obtained, and then The maximum height difference between the highest peak line and the lowest bottom line of the concave-convex structure. [Example 1] 32 201005430 Production of fluoropolymer (pi): 1 g of compound (3-3), 0.5 g of methanol, and 0.7 g of compound (4-1) were added to an autoclave (made of pressure-resistant glass). The polymerization of the compound (3-3) was carried out by a suspension polymerization method to obtain a fluoropolymer (P-1). The fluoropolymer (P-1) is a polymer composed of a monomer unit represented by the following formula (α-1). The intrinsic viscosity of the fluoropolymer (pq) was 0.34 dL/g. The glass transition temperature of the fluoropolymer (pq) is 1〇8. (:. ❹ CF2=CF〇CF2CF2CF = CF2 . . . (3-3); ((CH3)2CH〇CO〇) 2 · · .(4-1).

(α-1) 由上式(α -1)所示單體單位構成之聚合物且終端為_cF3之 3氣聚口物⑼下記為含氟聚合物(1-1))的製造: 將3氣聚合物(P·1)襄人熱壓蚤(鎳製,内容積1L),再 於熱壓爸内以H/ 礼乳進行3次取代後,減壓至4.0kPa(絕對壓 力)將業、錢氣稀釋至14體積%之減導人熱壓爸内至 101.3kPa後,將埶厭 …、後I之内溫保持於230°C6小時。回收熱 壓釜内谷物而獲得含氟聚合物(1-1)。測定含氟聚合物(1-1) ^線吸收光谱’結果未確認到因羧基而起之尖峰。將 含乱聚合物* ’加工為厚度ΙΟΟμπι之腠,測定波長 33 201005430 300〜500nm之光的光線穿透率,結果為95%以上。含氟聚合 物(μ)之玻璃轉移溫度為108〇c。含氟聚合物(11)之固有^ 度為 0.33dL/g。 含有含氟聚合物(Ι-D之溶液組成物(以下記為溶液組成似) 之調製: 調製出含有9質量%含氟聚合物(1_1}之全氟三丁基胺溶 液,以膜濾器(孔徑:0·2μΓη,PTFE製)過濾該溶液而獲得溶 液組成物1。 [例3] 由上式(α-l)所示之單體單位構成之聚合物且終端為反應 性基(y)(綾基)的含氟聚合物(以下記為含氟聚合物(11_1})的 製造: 將含氟聚合物(P-1)置於大氣壓環境下之熱風循環爐 中,於300°c下熱處理1小時,接著於ll〇°c下浸潰在超純水 中1週’再於真空乾燥機中且於loot:下乾燥24小時,獲得 含II聚合物(II-1)。測定含氟聚合物(II-1)之紅外線吸收光 谱,結果於1810cm-1處確認到源自叛基之尖峰。將含氟聚 合物(II-1)加工為厚度ΙΟΟμηι之膜,測定波長300〜500nm之 光的光線穿透率,結果為93%以上。含氟聚合物(Π-1)之玻 璃轉移溫度為108°C。含氟聚合物(Π-1)之固有黏度為 〇.34dL/g。 含有含氟聚合物(II-1)之溶液組成物(以下記為溶液組成物2) 之調製: 調製出含有1質量%含氟聚合物(II-1)之全氟三丁基胺 201005430 溶液’以膜濾器(孔徑:〇·2μηι,PTFE製)過濾該溶液,獲得 溶液組成物2。 [例 4] . 模具之製造: 準備PC片(縱40mmx橫40mmx厚0.5mm)作為透明樹脂 層(A)。將該透明樹脂層之物性示於表1。 ' 以乙酸乙酯/2-丙醇(5/9質量比)之混合溶劑,將具有環 〇 氧乙基之底漆(信越化學工業社製,FS-10)稀釋至20倍而製 成底漆塗佈液。使用旋塗法將底漆塗佈液塗佈於透明樹脂 層(A)表面,於氮氣流中在100乞下加熱乾燥3〇分鐘,進行 將環氧乙基導入透明樹脂層(A)表面之表面處理。 、 接著,使用旋塗法將溶液組成物2塗佈於透明樹脂層(A) 之表面處理面,於11(TC下加熱乾燥2小時,使溶液組成物2 中之全氟三丁基胺揮發。同時,使透明樹脂層(A)表面之環 氧乙基與含乱聚合物(II-1)之叛基作化學鍵結,形成由含氟 〇 聚合物(II-1)構成之中間層(c)(厚度:〇_1μιη)。 接著,使用旋塗法將溶液組成物1塗佈於中間層(c)表 面,於110°C下加熱乾燥4小時,使溶液組成物丨中之全氟三 . 丁基胺揮發’形成表面層(B)而獲得模具前驅物。表面層(B) 之厚度與中間層(C)厚度之總量為ι.3μηι。 準備表面具有深度(最大高度广1〇μπι、節距:2叫姐、 斜面角度:45度之由V溝構成的微細圖案之鎳製母模作為 楔。 ’、、、 將該母模加熱至160°C,從模具前驅物表面層(B)侧以 35 201005430 3MPa(絕對壓力)緊壓2分鐘。使母模與模具前驅物之溫度達 5〇°C以下後,使母模從模具前驅物分離,而獲得係由透明 樹脂層(A)、中間層(C)及表面層(B)所構成’且橫跨表面層 (B)及中間層(C)形成有微細圖案之模具。微細圖案之最大高 度為9·8μιη。觀察到模具有若干之彎曲。此外,透明樹脂層 (Α)於模具之微細圖案的谷底露出。 具有轉錄微細圖案之基材的製造: 將光硬化性樹脂(旭硝子社製,NIF-A-1)塗佈於模具之 微細圖案表面,從其上方緊壓矽晶圓以與光硬化性樹脂相 ® 接。從模具側照射紫外線(波長:365nm,照度:50mW/cm2 )30 秒’使光硬化性樹脂硬化。接著,雖欲使模具分離,但因 模具與*夕晶圓黏著,無法分離。 [例 5] r 模具之製造: ~ 準備PMMA片(縱4〇mmx横40mmx厚度1.8mm)作為透 明樹脂層(A)。將該透明樹脂層(A)之物性示於表1。 除了透明樹脂層(A)係使用PMMA片來取代PC片及令 ® 母模加熱溫度為130°C以外,與例4相同地製得係由透明樹 脂層(A)、中間層(C)及表面層(B)所構成,且橫跨表面層(B) 及中間層(C)形成有微細圖案之模具。微細圖案之最大高度 為9·8μιη。模具觀察到若干之彎曲。此外,透明樹脂層(A) 露出於模具之微細圖案谷底。 - 具有轉錄微細圖案之基材的製造: 將光硬化性樹脂(旭硝子社製,MF-A-i)塗佈於模具之 36 201005430 微細圖案表面,從其上方緊壓矽晶圓以與光硬化性樹脂相 接。從模具側照射紫外線(波長·· 3 6 5 nm,照度:5 0mW/cm2 )3 〇 . 秒,使光硬化性樹脂硬化。接著,雖欲使模具分離,但因 模具與矽晶圓黏著,無法分離。 [例6] 模具之製造: 準備與例5所用PMMA片相較下玻璃轉移溫度更低之 PMMA片(縱40mmx橫40mmx厚度1.8mm)作為透明樹脂層 (A) 。將該透明樹脂層(A)之物性示於表2。 除了透明樹脂層(A)係使用PMMA片來取代PC片及令 母模加熱溫度為120。(:以外,與例4相同地製得係由透明樹 脂層(A)、中間層(C)及表面層(B)所構成,且橫跨表面層 (B) 、中間層(〇及透明樹脂層地形成有微細圖案之模 具。微細圖案之最大高度為1 〇.Qpm。模具觀察到若干之彎 曲。 具有轉錄微細圖案之基材的製造: 將光硬化性樹脂(旭硝子杜製,沌厂冬丨)塗佈於模具之 微細圖案表面,從其上方緊射晶圓而使其與光硬化性樹 脂相接。從模具侧照射紫外線(波長:365nm,照度: 50mW/cm2)30秒,使光硬化性樹脂硬化。接著,使模具與 石夕晶圓分離’崎得表面具有由光硬化性_硬化物所構 成之轉錄微細圖案的矽晶圓。 以雷射顯微鏡(奇研社製,νκ•觸)觀察轉錄微細圖案 的結果,其已再現了母模之微細圖案。 37 201005430 [例7] 模具之製造: 將透明樹脂之FEVE(旭硝子社製,露米福隆LF71〇F)溶 解於甲苯而成為30質量。/。,製成塗佈液。使用施用器 ' (applicator),將該塗佈液塗佈於透明支持物(D)(鹼石灰玻璃 板’厚度:1.30mm ’熱變形溫度:3〇〇°c以上”於⑽力下 乾燥2小時而形成透明樹脂層(A)。以微測計測 疋透明樹脂層(A)之厚度,結果為3〇μηι。將透明樹脂層(A) 及透明支持物(D)之物性示於表2。 © 除了使用已形成有FEVE所構成之透明樹脂層(Α)的玻 璃板來取代pc片,以及令母模之加熱溫度為12(rc以外與 例4相同地製得係由透明支持物(D)、透明樹脂層(a)、中間 層(C)及表面層(B)所構成,且橫跨表面層(B)、中間層(c)及 ' 透明樹脂層(A)地形成有微細圖案之模具。微細圖案之最大 高度為9·9μηι。茲將模具之雷射顯微鏡像示於第5圖。模具 並未觀察到彎曲。 具有轉錄微細圖案之基材的製造: 除了使用例7之模具來取代例6之模具以外,與例6相同 地製得表面具有由光硬化性樹脂硬化物所構成之轉錄微細 圖案的碎晶圓。 以雷射顯微鏡觀察轉錄微細圖案之結果,已再現了母 模之微細圖案。 _ [例8] 模具之製造: 38 201005430 將透明樹脂之FEVE(旭硝子社製,露米福隆LF71〇F)溶 解於甲苯而成為30質量%,製成塗佈液。使用施用器 (applicator)’將該塗佈液塗佈於透明支持物(d)(鹼石灰玻璃 板,厚度:1.3〇mm,熱變形溫度:3〇〇t以上),於ι〇η:τ 乾燥2小時而形成透明樹脂層(A)。以微測計(micr_ter)測 定透明樹脂層⑷之厚度,結果為3()帅。紐明職層㈧ 及透明支持物(D)之物性示於表2。 預先將透明樹脂層(A)表面作親水化處理(氮電漿處 理)。親水化處理係使用反應離子蝕刻裝置(薩畝可社製’ RIE-10NR),於氮流量:2〇sccm、壓力:他、輸出功率: 8〇W、處理時間:1分鐘的條件下進行。 使用旋塗法,將含有0.5質量%具有胺基之石夕烧麵合劑 (信越化學工業社製,&amp;8匕903)與5質量%水之乙醇溶液塗 佈於透明樹脂層(A)表面。將透明樹脂層(A)水洗後,於氮 氣流中在1GGC下加熱乾燥3G分鐘’進行將源自财烧麵合 劑之胺基導入透明樹脂層(A)表面之表面處理。 接著,使用旋塗法將溶液組成物2塗佈於透明樹脂層(A) 之表面處理面,於11G〇C下加熱乾燥2小時,使溶液組成物2 中之全氟二丁基胺揮發。同時,使透明樹脂層表面之胺 基與含氟聚合物(II-1)之羧基作化學鍵結,形成由含氟聚合 物(II-1)所構成之中間層(C)(厚度:〇10μιη)。 接著,使用旋塗法將溶液組成物丨塗佈於中間層(c)表 面,於ll〇°C下加熱乾燥4小時,使溶液組成物丨中之全氟三 丁基胺揮發,形成表面層(B),製得模具前驅物。表面層 39 201005430 之厚度與中間層(C)之厚度總量為! 25哗。 除了使用該模具前驅物以外,與例4相同地形成微細圖 案,製得係由透明樹脂層㈧、中間層(c)及表面層⑼所構 成,且橫跨表面層(B)、中間層(C)及透⑽脂層⑷形成有 微細圖案之模具。微細圖案之最大高度為则卿。模具並 未觀察到彎曲。 具有轉錄微細圖案之基材的製造: 除了使用例8之模具來取代例6之模具以外與例6相同 地製得表Φ具有由光硬恤黯硬化物所構叙轉錄微細 圖案的矽晶圓。 以雷射顯微鏡觀察轉錄微細圖案之結果,已再現了母 棋之微細圖案。 [例9] 模具之製造: 除了未將環氧乙基導入透明樹脂層(A)表面以外,與例 7相同地進行,而於將母模從模具分離時,透_脂層(A) 與中間層(C)之間發生剝離。 [例 10] 模具之製造: 形成中間層(C)時,除了使用溶液組成物1取代溶液級 成物2以外,與例8相同地進行,結果於使母模從模具分離 時,於透明樹脂層(A)與中間層之間發生剝離。 [例 11] 由上式(α-1)所不單體單位構成之聚合物且終端為反應性 40 201005430 基(y)(矽醇基(烷氧基矽烷基))之含氟聚合物(以下記為含氣 聚合物(II-2))的製造: • 使例3所得含氟聚合物(II-1)之羧基酯化而成為 -COOCH3。將O.lg之7* -胺基丙基三曱氧基矽烷加入已於 46_5g全氟(2-丁基四氫呋喃)中溶解有3.5g該聚合物之溶 液。於系統内以氮進行取代,室溫下攪拌3小時,製得含氣 - 聚合物(Π-2)。測定含氟聚合物(II-2)之紅外線吸收光譜,結 φ 果並無存在於原本聚合物之-COOCH3的ISOOcm.1吸收, -CONH-之吸收被確認於1730cm·1。將含氟聚合物(11_2)加 工為厚度100μιη之膜’測定波長300〜5OOnm之光的光線穿透 率’結果為92%以上。含氟聚合物(Π-2)之玻璃轉移溫度為 , 108°C。含氟聚合物(II-2)之固有黏度為〇.32dL/g。 • 含有含氟聚合物(II-2)之溶液組成物(以下記為溶液組成物 • 3)之調製: 調製出含有1質量%含氟聚合物(II-2)之全氟三丁基胺 〇 溶液,以膜濾器(孔徑:〇·2μπι,PTFE製)過濾該溶液,獲得 溶液組成物3。 [例 12] 模具之製造: ' 將透明樹脂之非晶質聚酯(東洋纺社製,拜龍2〇〇)溶解 - 於環己酮而成為30質量%,製成塗佈液。使用施用器,將 該塗佈液塗佈於透明支持物(D)(鹼石灰玻璃板,厚度: 1.30mm ’熱變形溫度:300°C以上)’於150°C下乾燥2小時 而形成透明樹脂層(A)。以微測計測定透明樹脂層之厚 41 201005430 度,結果為30μηι。將透明樹脂層(A)及透明支持物(D)之物 性示於表2。 預先將透明樹脂層(A)表面作親水化處理(氮電漿處 理)。親水化處理係使用反應離子餘刻裝置(薩故可社製, RIE-10NR),於氧流量:50sccm、壓力:i〇pa、輸出功率: 100W '處理時間:10秒的條件下進行。藉由該處理,透明 樹脂層(A)表面已導入經基。 接著,使用旋塗法將溶液組成物3塗佈於透明樹脂層(a) 之表面處理面,於litre下加熱乾燥2小時,使溶液組成物3 中之全氟三丁基胺揮發。同時,使透明樹脂層(A)表面之羥 基與含狀^^合物(II-1)之碎醇基作化學鍵結,形成由含氟聚 合物(II-2)所構成之中間層(C)(厚度:〇 1μηι)。 接著,使用旋塗法將溶液組成物丨塗佈於中間層(c)表 面,於11(TC下加熱乾燥4小時,使溶液組成物丨中之全氟三 丁基胺揮發,形成表面屠(Β),製得模具前驅物。表面層⑻ 之厚度與中間層(c)之厚度總量為丨2μιη。 除了使用該模具前驅物以外,與例4相同地形成微細圖 案,製得係由透明樹脂層⑷、中間層(c)及表面層(β)所構 成’且橫跨表面層(Β)、中間層(〇及透明樹脂層(Α)形成有 微細圖案之模具。微細圖案之最大高度為9如。模具並未 觀察到彎曲。 具有轉錄微細圖案之基材的製造: 除了使用例U之模具來取代例6之模具以外,與例6相 同地製得表面具有由光硬化性樹脂硬化物所構成之轉錄微 42 201005430 細圖案的矽晶圓。 以雷射顯微鏡觀察轉錄微細圖案之結果,已再現了母 . 模之微細圖案。 [例 13] 模具之製造: 將透明樹脂之非晶質聚酯(東洋紡社製,拜龍3〇〇)溶解 . 於環己酮而成為30質量%,製成塗佈液。使用施用器,將 ❹ 該塗佈液塗佈於透明支持物(D)(鹼石灰玻璃板,厚度: 1.30mm,熱變形溫度:300°C以上),於l5(rc下乾燥2小時 而形成透明樹脂層(A)。以微測計測定透明樹脂層(a)之厚 度’結果為30μιη。將透明樹脂層(A)及透明支持物之物 性示於表2。 • 除了使用已开&gt;成有非晶質聚酯所構成之透明樹脂層(A) . 的玻璃板來取代PC片,以及令母模之加熱溫度為12〇tw 外,與例4相同地製得係由透明支持物(D)、透明樹脂層 參 (A)、中間層(C)及表面層(B)所構成,且橫跨表面層(b)、中 間層(C)及透明樹脂層(A)形成有微細圖案之模具。微細圖案 之最大高度為ιο.ίμη»。模具並未觀察到彎曲。 具有轉錄微細圖案之基材的製造: 除了使用例13之模具取代例6之模具以外,與例6相同 地製得表面具有由光硬化性樹脂硬化物所構成之轉錄微^ 圖案的矽晶圓。 以雷射顯微鏡觀察轉錄微細圖案,雖然已再現了 之微細圖案,但部分地觀察到微細圖案之傾倒及崩壞* 43 201005430 m Η] 模具之製造: 除了使用具有直徑.5μηι、深度(最大高度):5μιη之圓 枉狀穴以ΙΟμηι間隔排列成格子狀之微細圖案的矽模具來 取代例1之母模以外,與例7相同地製得係由透明支持物 (D)、透明樹脂層(Α)、中間層(C)及表面層(Β)所構成,且橫 跨表面層(Β)、中間層(C)及透明樹脂層⑷形成有微細圖案 之模具。微細圖案之最大高度為5·1μηι。模具並未觀察到彎 曲。 © 具有轉錄微細圖案之基材的製造: 除了使用例14之模具來取代例6之模具以外 同地製得表面具有*光硬化性樹脂硬化物所構成與例6相 細圖案的矽晶圓。 之轉錄微 以雷射顯微鏡觀察轉錄微細圖案之妹果 模之微細圖案。 ’已再現了母 [例 15] 〇 與例7相同地進 圖案。 模具之製造: 除了令母模之加熱溫度為4〇。(:以外, 行,結果模具表面並未轉錄有母模之微細 44 201005430 表1 例4 例5 例9 例10 含氟聚合物0)之玻璃轉移溫度rc) 108 108 108 108 含氟聚合物on之玻璃轉移温度rc) 108 108 108 • 含氟聚合物on之反應性基(y) 羧基 羧基 羧基 透明樹脂屉ίΑ)表面之官能基(X) 瓌氣乙基 環氧乙基 • 胺基 透明樹脂 PC PMMA FEVE FEVE 透明樹脂之破璃轉移溫度rc) 145 115 55 55 透明樹脂之熱變形溫度rc) 124 105 _ 透明支持體(D) - 玻璃 玻璃 透明支持體(DH透明樹脂層(A) 之總厚度(mm) 0.5 1.8 1.33 1.33 透明支持體(D)+透明樹脂層(A) 之436nm穿透率(%) 89 92 93 93 透明支持體(D)+透明樹脂層(A) 之365nm穿透率(%) 87 36 89 89 表面層(B)+中間層(C)之總厚度(μηι) 1.3 1.3 1.3 1.3 母膜之翻轉圖案的最大高度(Mm) 10 10 10 10 膜具之微細圖案的最大高度(nm) 9.8 9.8 棋具之製造 可 可 不可(剝離) 不可(制離) 具有轉錄微細圖案之基材的製造 不可 不可(α-1) Manufacture of a polymer composed of a monomer unit represented by the above formula (α -1) and having a terminal of _cF3 (hereinafter referred to as fluoropolymer (1-1)): 3 gas polymer (P·1) 襄人热压蚤 (nickel, internal volume 1L), and then replaced with H/ 礼乳 3 times in hot pressure dad, decompression to 4.0kPa (absolute pressure) will After the industry and money are diluted to 14% by volume, the pressure of the person is reduced to 101.3 kPa, and the internal temperature of the I is maintained at 230 ° C for 6 hours. The fluoropolymer (1-1) was obtained by recovering the grain in the autoclave. When the fluoropolymer (1-1) ^ line absorption spectrum was measured, the peak due to the carboxyl group was not confirmed. The chaotic polymer *' was processed into a thickness of ΙΟΟμπι, and the light transmittance of light having a wavelength of 33 201005430 300 to 500 nm was measured, and as a result, it was 95% or more. The glass transition temperature of the fluorine-containing polymer (μ) was 108 〇c. The inherent degree of the fluoropolymer (11) was 0.33 dL/g. Preparation of a fluoropolymer (solution composition of Ι-D (hereinafter referred to as a solution composition): A perfluorotributylamine solution containing 9 mass% of a fluoropolymer (1_1} was prepared as a membrane filter ( The pore size: 0·2 μΓη, manufactured by PTFE) was filtered to obtain a solution composition 1. [Example 3] A polymer composed of a monomer unit represented by the above formula (α-l) and terminally a reactive group (y) (Fluorinated) fluoropolymer (hereinafter referred to as fluoropolymer (11_1}): The fluoropolymer (P-1) is placed in a hot air circulating furnace at atmospheric pressure and heat treated at 300 ° C After 1 hour, it was immersed in ultrapure water for 1 week at ll 〇 °c and then dried in a vacuum dryer for 24 hours under a loot: to obtain a polymer II-containing (II-1). The infrared absorption spectrum of the substance (II-1) was confirmed to be a peak derived from a ruthenium at 1810 cm-1. The fluoropolymer (II-1) was processed into a film having a thickness of ΙΟΟμηι, and light having a wavelength of 300 to 500 nm was measured. The light transmittance is 93% or more. The glass transition temperature of the fluoropolymer (Π-1) is 108 ° C. The solid content of the fluoropolymer (Π-1) The viscosity is 〇.34 dL/g. Preparation of a solution composition containing a fluoropolymer (II-1) (hereinafter referred to as solution composition 2): A fluoropolymer (II-1) containing 1% by mass is prepared. Perfluorotributylamine 201005430 Solution 'The solution was filtered with a membrane filter (pore size: 〇·2μηι, PTFE) to obtain a solution composition 2. [Example 4] . Mold manufacturing: Preparation of a PC sheet (longitudinal 40 mm x horizontal 40 mm x thick) 0.5 mm) as the transparent resin layer (A). The physical properties of the transparent resin layer are shown in Table 1. 'A mixed solvent of ethyl acetate/2-propanol (5/9 by mass) will have an oxirane The primer (manufactured by Shin-Etsu Chemical Co., Ltd., FS-10) was diluted to 20 times to prepare a primer coating liquid. The primer coating liquid was applied onto the surface of the transparent resin layer (A) by spin coating. The film was heated and dried at 100 Torr for 3 minutes in a nitrogen stream to carry out a surface treatment for introducing an epoxy group onto the surface of the transparent resin layer (A). Next, the solution composition 2 was applied to the transparent resin layer by spin coating ( A) The surface-treated surface was heated and dried at 11 °C for 2 hours to volatilize perfluorotributylamine in solution composition 2. The epoxy ethyl group on the surface of the transparent resin layer (A) is chemically bonded to the rebel group of the disordered polymer (II-1) to form an intermediate layer (c) composed of the fluorine-containing cerium polymer (II-1). (thickness: 〇_1μιη). Next, the solution composition 1 was applied to the surface of the intermediate layer (c) by spin coating, and dried by heating at 110 ° C for 4 hours to make the solution composition fluorinated. The butylamine volatilizes to form the surface layer (B) to obtain a mold precursor. The total thickness of the surface layer (B) and the thickness of the intermediate layer (C) is ι.3 μηι. Prepare a nickel master mold having a depth (maximum height of 1 〇μπι, pitch: 2 screaming, bevel angle: 45 degrees, and a fine pattern of V grooves) as a wedge. ',,, and heat the master mold to Pressing at 160 ° C from the side of the mold precursor surface (B) for 35 minutes at 35 201005430 3 MPa (absolute pressure). After the temperature of the master mold and the mold precursor is less than 5 ° C, the master mold is driven from the mold. The object is separated to obtain a mold in which a transparent resin layer (A), an intermediate layer (C), and a surface layer (B) are formed and a fine pattern is formed across the surface layer (B) and the intermediate layer (C). The maximum height of the pattern is 9·8 μm. It is observed that the mold has a certain curvature. Further, the transparent resin layer is exposed at the bottom of the fine pattern of the mold. Fabrication of a substrate having a transcribed fine pattern: a photocurable resin ( Nippon Glass Co., Ltd., NIF-A-1) is applied to the surface of the fine pattern of the mold, and the wafer is pressed from above to bond with the photocurable resin. The ultraviolet light is irradiated from the mold side (wavelength: 365 nm, illumination: 50 mW) /cm2) 30 seconds' hardens the photocurable resin. Then, In order to separate the mold, the mold cannot be separated from the wafer. [Example 5] r Mold manufacturing: ~ A PMMA sheet (4 mm mm x 40 mm x thickness 1.8 mm) was prepared as the transparent resin layer (A). The physical properties of the transparent resin layer (A) are shown in Table 1. The same procedure as in Example 4 was carried out except that the transparent resin layer (A) was replaced with a PC sheet using a PMMA sheet and the heating temperature of the master mold was 130 °C. A mold comprising a transparent resin layer (A), an intermediate layer (C) and a surface layer (B), and having a fine pattern formed across the surface layer (B) and the intermediate layer (C). The maximum height of the fine pattern is In addition, the transparent resin layer (A) is exposed to the bottom of the fine pattern of the mold. - Fabrication of a substrate having a transcribed fine pattern: Photocurable resin (made by Asahi Glass Co., Ltd., MF- Ai) Applying on the mold 36 201005430 Fine pattern surface, pressing the wafer from above to contact the photocurable resin. Irradiation from the mold side (wavelength · · 3 6 5 nm, illuminance: 50 mW / cm 2 ) 3 〇. Second, the photocurable resin is hardened. Then, although the mold is to be divided However, the mold cannot be separated from the tantalum wafer. [Example 6] Mold manufacturing: Prepare PMMA sheet (vertical 40 mm x horizontal 40 mm x thickness 1.8 mm) with a lower glass transition temperature than the PMMA sheet used in Example 5 as a transparent Resin layer (A) The physical properties of the transparent resin layer (A) are shown in Table 2. In addition to the transparent resin layer (A), a PMMA sheet was used instead of the PC sheet, and the master mold heating temperature was 120. In the same manner as in Example 4, the transparent resin layer (A), the intermediate layer (C), and the surface layer (B) were formed, and the surface layer (B) and the intermediate layer (the ruthenium and the transparent resin layer were formed finely). The mold of the pattern. The maximum height of the fine pattern is 1 〇.Qpm. A number of bends were observed in the mold. Production of a substrate having a transcribed fine pattern: A photocurable resin (Asahi Glass, manufactured by Asahi Glass Co., Ltd.) is applied to the surface of the fine pattern of the mold, and the wafer is directly pressed from above to form a photocurable resin. Pick up. Ultraviolet rays (wavelength: 365 nm, illuminance: 50 mW/cm 2 ) were irradiated from the mold side for 30 seconds to cure the photocurable resin. Next, the mold was separated from the Shishi wafer, and the tantalum wafer having the transcribed fine pattern composed of the photocurable _cured material was formed on the surface. The result of observing the fine pattern of transcription was observed by a laser microscope (manufactured by Kwai Kasei Co., Ltd.), and the fine pattern of the master mold was reproduced. 37 201005430 [Example 7] Manufacture of a mold: FEVE (manufactured by Asahi Glass Co., Ltd., amil. LF71 〇F) was dissolved in toluene to obtain 30 mass. /. , made into a coating liquid. Using a applicator, the coating liquid was applied to a transparent support (D) (soda lime glass plate 'thickness: 1.30 mm 'heat distortion temperature: 3 〇〇 ° c or more') and dried under (10) force 2 The transparent resin layer (A) was formed in an hour. The thickness of the transparent resin layer (A) was measured by a micrometer and found to be 3 μm. The physical properties of the transparent resin layer (A) and the transparent support (D) are shown in Table 2. © In addition to using a glass plate on which a transparent resin layer (F) composed of FEVE is formed, in place of the pc sheet, and the heating temperature of the master mold is 12 (except for rc, the transparent support is produced in the same manner as in Example 4) D), the transparent resin layer (a), the intermediate layer (C), and the surface layer (B) are formed, and finely formed across the surface layer (B), the intermediate layer (c), and the 'transparent resin layer (A) The mold of the pattern. The maximum height of the fine pattern is 9·9 μηι. The laser microscope image of the mold is shown in Fig. 5. No bending is observed in the mold. Fabrication of substrate with transcriptional fine pattern: Except for use example 7 The surface was made to have a surface hardened by a photocurable resin in the same manner as in Example 6 except that the mold was replaced with the mold of Example 6. A fine wafer in which a fine pattern is transcribed. The fine pattern of the master mold is reproduced by a laser microscope. _ [Example 8] Manufacture of a mold: 38 201005430 FEVE of transparent resin (Asako Glass Co., Ltd. The product was prepared by dissolving in toluene to 30% by mass to prepare a coating liquid. The coating liquid was applied to a transparent support (d) (soda lime glass using an applicator' Plate, thickness: 1.3 〇 mm, heat distortion temperature: 3 〇〇 t or more), dried at ι〇η:τ for 2 hours to form a transparent resin layer (A). The transparent resin layer (4) was measured by a micrometer (micr_ter) The thickness was 3 () handsome. The physical properties of the New Zealand layer (8) and the transparent support (D) are shown in Table 2. The surface of the transparent resin layer (A) was hydrophilized (nitrogen plasma treatment) in advance. Hydrophilization The treatment was carried out under the conditions of a nitrogen flow rate: 2 〇 sccm, a pressure: he, an output of 8 〇 W, and a treatment time of 1 minute using a reactive ion etching apparatus ("RIE-10NR" manufactured by Saku Co., Ltd.). Coating method, containing 0.5% by mass of an amine-based stone kiwi noodle mixture (Shinoshi Chemical Industry Co., Ltd., &amp; 8匕903) and a 5 mass% water ethanol solution were applied to the surface of the transparent resin layer (A). After the transparent resin layer (A) was washed with water, it was dried by heating at 3 GGC in a nitrogen stream. The surface treatment of introducing the amine group derived from the kiln-baked dough mixture into the surface of the transparent resin layer (A) is carried out. Next, the solution composition 2 is applied onto the surface-treated surface of the transparent resin layer (A) by spin coating. The mixture was dried by heating at 11 G C for 2 hours to volatilize perfluorodibutylamine in the solution composition 2. At the same time, the amine group on the surface of the transparent resin layer was chemically bonded to the carboxyl group of the fluoropolymer (II-1). An intermediate layer (C) (thickness: 〇10 μmη) composed of the fluoropolymer (II-1) was formed. Next, the solution composition is applied onto the surface of the intermediate layer (c) by spin coating, and dried by heating at ll ° C for 4 hours to volatilize perfluorotributylamine in the solution composition to form a surface layer. (B), a mold precursor is produced. The thickness of the surface layer 39 201005430 and the thickness of the intermediate layer (C) are! 25 years old. A fine pattern was formed in the same manner as in Example 4 except that the mold precursor was used, and the resultant was composed of a transparent resin layer (8), an intermediate layer (c), and a surface layer (9), and straddle the surface layer (B) and the intermediate layer ( C) and the (10) lipid layer (4) are formed with a fine pattern of the mold. The maximum height of the fine pattern is qing. No bending was observed in the mold. Fabrication of a substrate having a transcribed fine pattern: A ruthenium wafer having a pdf-structured fine pattern embossed by a hardened enamel cured material was produced in the same manner as in Example 6 except that the mold of Example 8 was used instead of the mold of Example 6. . As a result of observing the transcribed fine pattern by a laser microscope, the fine pattern of the mother chess has been reproduced. [Example 9] Production of a mold: The same procedure as in Example 7 was carried out except that the epoxy group was not introduced into the surface of the transparent resin layer (A), and when the master mold was separated from the mold, the permeation layer (A) was Peeling occurred between the intermediate layers (C). [Example 10] Production of a mold: When the intermediate layer (C) was formed, the same procedure as in Example 8 was carried out except that the solution composition 1 was used instead of the solution composition 2. As a result, when the master mold was separated from the mold, the transparent resin was used. Peeling occurs between layer (A) and the intermediate layer. [Example 11] A polymer composed of a monomer unit of the above formula (α-1) and terminally a fluoropolymer of a reactivity 40 201005430 (y) (nonanol (alkoxyalkyl)) Hereinafter, the production of the gas-containing polymer (II-2)) is as follows: • The carboxyl group of the fluoropolymer (II-1) obtained in Example 3 is esterified to form -COOCH3. O.lg 7*-aminopropyltrimethoxy decane was added to a solution in which 3.5 g of the polymer was dissolved in 46_5 g of perfluoro(2-butyltetrahydrofuran). It was replaced with nitrogen in the system and stirred at room temperature for 3 hours to obtain a gas-containing polymer (Π-2). The infrared absorption spectrum of the fluoropolymer (II-2) was measured, and the φ was not present in the ISOOcm.1 absorption of -COOCH3 of the original polymer, and the absorption of -CONH- was confirmed to be 1730 cm·1. The fluoropolymer (11_2) was processed into a film having a thickness of 100 μm. The light transmittance of light having a wavelength of 300 to 5 nm was measured and found to be 92% or more. The glass transition temperature of the fluoropolymer (Π-2) was 108 °C. The intrinsic viscosity of the fluoropolymer (II-2) was 〇32 dL/g. • Preparation of a solution composition containing fluoropolymer (II-2) (hereinafter referred to as solution composition • 3): Preparation of perfluorotributylamine containing 1% by mass of fluoropolymer (II-2) The solution was filtered through a membrane filter (pore size: 〇·2 μm, PTFE) to obtain a solution composition 3. [Example 12] Manufacture of a mold: 'Amorphous polyester of a transparent resin (manufactured by Toyobo Co., Ltd., Benelux) was dissolved in cyclohexanone to 30% by mass to prepare a coating liquid. The coating liquid was applied to a transparent support (D) (soda lime glass plate, thickness: 1.30 mm 'heat distortion temperature: 300 ° C or more) using an applicator to dry at 150 ° C for 2 hours to form a transparent Resin layer (A). The thickness of the transparent resin layer was measured by a micrometer 41 201005430 degrees, and the result was 30 μm. The physical properties of the transparent resin layer (A) and the transparent support (D) are shown in Table 2. The surface of the transparent resin layer (A) was previously subjected to a hydrophilization treatment (nitrogen plasma treatment). The hydrophilization treatment was carried out under the conditions of a flow rate of oxygen: 50 sccm, a pressure: i〇pa, an output of 100 W, and a treatment time of 10 seconds using a reactive ion remanufacturing device (manufactured by Sasaki Co., Ltd., RIE-10NR). By this treatment, the surface of the transparent resin layer (A) has been introduced into the warp group. Next, the solution composition 3 was applied onto the surface-treated surface of the transparent resin layer (a) by spin coating, and dried by heating under litre for 2 hours to volatilize perfluorotributylamine in the solution composition 3. At the same time, the hydroxyl group on the surface of the transparent resin layer (A) is chemically bonded to the ground alcohol group of the compound (II-1) to form an intermediate layer composed of the fluoropolymer (II-2) (C). ) (thickness: 〇1μηι). Next, the solution composition was applied to the surface of the intermediate layer (c) by spin coating, and dried by heating at 11 (TC for 4 hours) to volatilize perfluorotributylamine in the solution composition to form a surface.模具), a mold precursor was prepared. The thickness of the surface layer (8) and the total thickness of the intermediate layer (c) were 丨2 μm. A fine pattern was formed in the same manner as in Example 4 except that the mold precursor was used, and the system was made transparent. a mold in which a resin layer (4), an intermediate layer (c), and a surface layer (β) are formed and a fine pattern is formed across the surface layer (中间) and the intermediate layer (〇 and the transparent resin layer (。). The maximum height of the fine pattern 9: The mold was not observed to be bent. Fabrication of a substrate having a transcribed fine pattern: The surface was made to be hardened by a photocurable resin in the same manner as in Example 6 except that the mold of Example U was used instead of the mold of Example 6. Transcription micro-structured by the object 42 201005430 Fine-patterned enamel wafer. The micro-pattern of the mother mold was reproduced as a result of observing the transcribed fine pattern by a laser microscope. [Example 13] Manufacture of the mold: Amorphous of the transparent resin Polyester (Toyobo Co., Ltd. The solution was prepared by dissolving it in cyclohexanone to 30% by mass to prepare a coating liquid. The coating liquid was applied to a transparent support (D) (soda lime glass plate) using an applicator. , thickness: 1.30 mm, heat distortion temperature: 300 ° C or more), dried at 15 ° for 2 hours to form a transparent resin layer (A). The thickness of the transparent resin layer (a) was measured by a micrometer, and the result was 30 μm. The physical properties of the transparent resin layer (A) and the transparent support are shown in Table 2. • Instead of using a glass plate which has been opened with a transparent resin layer (A) made of amorphous polyester, replace the PC sheet. And a transparent support (D), a transparent resin layer (A), an intermediate layer (C), and a surface layer (B) were obtained in the same manner as in Example 4 except that the heating temperature of the master was 12 〇tw. A mold having a fine pattern formed across the surface layer (b), the intermediate layer (C), and the transparent resin layer (A). The maximum height of the fine pattern is ιο. ίμη». No bending is observed in the mold. Production of substrate of fine pattern: A table was produced in the same manner as in Example 6 except that the mold of Example 13 was used instead of the mold of Example 6. A ruthenium wafer having a transcribed micropattern of a cured film of a photocurable resin. The transcribed fine pattern was observed by a laser microscope, and although the fine pattern was reproduced, the tilting and collapse of the fine pattern were partially observed* 43 201005430 m Η] Mold manufacturing: In place of the master mold of Example 1, except that a tantalum mold having a fine pattern of a lattice shape of a diameter of 5 μm and a depth of 5 μm is arranged in a lattice shape at intervals of ΙΟμηι, In the same manner as in Example 7, a transparent support (D), a transparent resin layer (Α), an intermediate layer (C), and a surface layer (Β) were formed, and the surface layer (Β) and the intermediate layer (C) were formed. And the transparent resin layer (4) is formed with a mold having a fine pattern. The maximum height of the fine pattern is 5·1 μηι. No bending was observed in the mold. © Manufacture of a substrate having a transcribed fine pattern: A ruthenium wafer having a pattern of a thin film having a surface of a light-curable resin and a fine pattern of Example 6 was produced in the same manner as in the mold of Example 14 except that the mold of Example 14 was used. The micro-pattern of the sister model of the transcribed micropattern was observed by a laser microscope. 'The mother has been reproduced [Example 15] 进 The pattern is entered in the same manner as in Example 7. Mold manufacturing: In addition to the heating temperature of the master mold is 4 〇. (Besides:, the result is that the surface of the mold is not transcribed with the fineness of the master mold. 44 201005430 Table 1 Example 4 Example 5 Example 9 Example 10 Fluoropolymer 0) Glass transition temperature rc) 108 108 108 108 Fluoropolymer on Glass transition temperature rc) 108 108 108 • Fluorinated polymer on reactive group (y) Carboxycarboxycarboxylate transparent resin drawer Α) Functional group on the surface (X) Xenon ethyl epoxide ethyl • Amino transparent resin PC PMMA FEVE FEVE Transparent resin glass transition temperature rc) 145 115 55 55 Transparent resin heat distortion temperature rc) 124 105 _ Transparent support (D) - Glass transparent support (DH transparent resin layer (A) Thickness (mm) 0.5 1.8 1.33 1.33 Transparent support (D) + transparent resin layer (A) 436 nm transmittance (%) 89 92 93 93 Transparent support (D) + transparent resin layer (A) 365 nm penetration Rate (%) 87 36 89 89 Total thickness of surface layer (B) + intermediate layer (C) (μηι) 1.3 1.3 1.3 1.3 Maximum height of the reverse pattern of the mother film (Mm) 10 10 10 10 Fine pattern of the film Maximum height (nm) 9.8 9.8 The manufacture of chess pieces is not (peeling), not (division) with fine transcription The manufacture of the substrate of the pattern is not acceptable.

表2 例6 例7 例8 例12 例13 例14 含氟聚合物0)之玻璃轉移溫度rc) 108 108 108 108 108 108 含氟聚合物01)之玻璃轉移溫度rc) 108 108 108 108 108 108 含氟聚合物(II)之反應性基fv) 羧基 羧基 羧基 羧基 叛基 透明樹脂層(a)表面之官能某ω 環氧乙基 瓖氣乙基 胺基 羥基 環氧乙基 環氧.乙某 透明樹脂 PMMA FEVE FEVE 聚酯 聚酯 FEVE 透明樹脂之玻璃轉稃溫度(°c ) 105 55 55 67 7 55 透明樹脂之熱變形溫度(°c) 95 - - 透明支持體iDI - 玻璃 玻璃 _玻璃 玻璃 祐璃 透明支持體(D)+透明樹脂層(A) 之總厚度tom) 1.8 1.33 1.33 1.33 1.33 1.33 透明支持體(D)+透明樹脂層(A) 之436nm穿透率(%) 92 93 93 91 92 93 透明支持體(D)+透明樹脂層(A) 之365nm穿透率(%) 36 89 89 90 89 89 表面層(B)+中間層(Q之總厚度Cum) 1.3 1.3 1.25 1.2 1,3 13 母膜翻轉固案的最大高度(卿) 10 10 10 10叫 10 1 5 膜具之微細圖案的最大高廣ium) 10.0 9.9 10.0 9.7 10.1 5.1 模具之IHi舍 可 可 可 可 可 可 具有轉錄微細圖索之基材的贺造 可 可 可 可 可 可 —--- 產業上之可利用性Table 2 Example 6 Example 7 Example 8 Example 12 Example 13 Example 14 Fluoropolymer 0) Glass transition temperature rc) 108 108 108 108 108 108 Fluoropolymer 01) Glass transition temperature rc) 108 108 108 108 108 108 Reactive group of fluoropolymer (II) fv) Carboxylcarboxycarboxycarboxy-reactive transparent resin layer (a) Functionality of the surface ω Ethylene oxime Ethyl Ethyl Ethyl Ethoxy Epoxy Epoxy. Transparent resin PMMA FEVE FEVE Polyester polyester FEVE Transparent resin glass transition temperature (°c) 105 55 55 67 7 55 Transparent resin heat distortion temperature (°c) 95 - - Transparent support iDI - Glass glass _ glass glass The total thickness of the transparent support (D) + transparent resin layer (A) is 1.8 1.33 1.33 1.33 1.33 1.33 Transparent support (D) + transparent resin layer (A) 436 nm transmittance (%) 92 93 93 91 92 93 Transparent support (D) + transparent resin layer (A) 365nm transmittance (%) 36 89 89 90 89 89 Surface layer (B) + intermediate layer (total thickness C of Cum) 1.3 1.3 1.25 1.2 1 , 3 13 The maximum height of the mother film flipping case (Qing) 10 10 10 10 is called 10 1 5 The maximum height and width of the fine pattern of the film is 10.0 9.9 10.0 9.7 10.1 5.1 IHis of Mold Cocoa Cocoa Cocoa with transcripts of micro-patterns Cocoa Cocoa Cocoa---- Industrial Applicability

本發明之模具作為使用光硬化性樹脂之光奈米壓印用 权具係甚有用。使用本發明之模具可獲得之具有轉賴細 圖案的基材作為半導體元件 '記㈣體、mems、生技相 關部件、光學部件等上均有用。 45 201005430 此外,於此援引業已於2008年4月8日提申之日本專利 申請案第2008-100552號說明書、申請專利範圍、圖式及摘 要的全部内容,並作為本發明發明說明書之揭示内容加以 . 納入。 * I:圖式簡單說明3 第1圖係一顯示本發明模具之一例的截面圖。 第2圖係一截面圖,其顯示具有轉錄微細圖案之基材之 製造方法的一例。 第3圖係一截面圖,其顯示具有轉錄微細圖案之基材之 製造方法的另一例。 第4圖係一截面圖,其顯示具有轉錄微細圖案之基材之 製造方法的另一例。 第5圖係例7之模具的雷射顯微鏡影像。 &gt; I:主要元件符號說明】 . 10.. .模具 17...透明支持物(D) ..微細圖案 ..光硬化性樹脂 ..基材 12.. .透明樹脂層(A) 18. 14.. .中間層(C) 16.. .表面層(B) 20. 30. 46The mold of the present invention is useful as a light nanoimprinting tool using a photocurable resin. The substrate having the transferred fine pattern which can be obtained by using the mold of the present invention is used as a semiconductor element 'fourth body, mems, biotechnology related parts, optical parts, and the like. 45 201005430 In addition, the entire contents of the specification, the scope of the application, the drawings and the abstract of the Japanese Patent Application No. 2008-100552, filed on Apr. 8, 2008, the disclosure of which is incorporated herein by reference. Add. Inclusion. *I: Brief description of the drawings 3 Fig. 1 is a cross-sectional view showing an example of the mold of the present invention. Fig. 2 is a cross-sectional view showing an example of a method of producing a substrate having a transcribed fine pattern. Fig. 3 is a cross-sectional view showing another example of a method of producing a substrate having a transcribed fine pattern. Fig. 4 is a cross-sectional view showing another example of a method of producing a substrate having a transcribed fine pattern. Figure 5 is a laser microscope image of the mold of Example 7. &gt; I: Description of main component symbols] 10.. Mold 17... Transparent support (D) .. Fine pattern: Photocurable resin: Substrate 12: Transparent resin layer (A) 18 14.. . Middle layer (C) 16.. Surface layer (B) 20. 30. 46

Claims (1)

201005430 七、申請專利範圍: 1· 一種模具,具有用以將光硬化性樹脂成形之微細圖案, ·· 其特徵在於具有: ' 下述透明樹脂層(A); 下述表面層(B);及 下述中間層(C) ’其係形成於該透明樹脂層之表 面,且存在於該透明樹脂層(A)與該表面層(B)之間; Q 且’前述微細圖案之最大高度係超出該表面層(B) 之厚度與該中間層(C)之厚度總量;其中, 透明樹脂層(A):係由透明樹脂所構成之層,該透 明樹脂之玻璃轉移溫度係於下述含氟聚合物⑴及下述 ^ 含氟聚合物(π)之玻璃轉移溫度以下,且該透明樹脂層 , (Α)係一於中間層(C)形成前,在將會形成中間層(C)之表 ' 面具有官能基(x) ’而於中間層(C)形成後,在已形成有 中間層(C)之表面具有以前述官能基(X)與下述反應性基 參 (y)為基礎之化學鍵結的層; 表面層(B):係由含氟聚合物⑴所構成之層,該含 氟聚合物(I)於主鏈具有含氟脂肪族環結構,且實質上不 具有下述反應性基(y); 中間層(C):係由含氟聚合物(II)所構成之層,該含 氟聚合物(II)於主鏈具有含氟脂肪族環結構,且具有對 前述官能基(X)呈反應性之反應性基(y)。 2.如申請專利範圍第1之模具,其中前述微細圖案之最 大南度為1〜500μηι。 47 201005430 3. 如申請專利範圍第丨或2項之模具,其中前述透明樹脂層 (Α)係由透明支持物(D)所支持。 4. 如申請專利範圍第丨至3項中任一項之模具’其中前述官 月b基(X)為經基、胺基或環氧乙基(〇xiranyi),且前述反 * 應性基(y)為羧基。 . 5•如申請專利範圍第丨至4項中任—項之模具,其中前述透 明樹脂層(A)係藉表面處理而於表面導入有官能基以)之 層。 ' 6· -種模具之製造方法,該模具具有用以將光硬化性樹月旨 魯 成形之微細圖案’且前述模具之製造方法之特徵在於$ 有下述步驟: I成中間層(C)之步驟:於由下述透明樹脂所構 成,且在表面具有官能基(χ)之透明樹脂層⑷的該表面 : 上,塗佈已溶解有下述含氟聚合物(Π)之含氟溶劑而成 _ 的/合液並加以乾燥’而形成由下述含氣聚合物⑼所構 成之中間層(C); 製得模具前驅物之步驟:於該中間層(C)之表面上 ° 塗佈已令下述含氟聚合物(1)溶解於含氣溶劑而成之溶 液並使其乾燥,而形成由下述含氟聚合物⑴所構成之表 面層(Β),製得模具前驅物; ▲製得模具之步驟:使表面具有微細圖案之翻轉圖案 ▲ X翻轉圖案之最大高度係超過前述表面層⑼厚度與 月J述中間層(C)厚度之總量的母模之該翻轉圖案,於前 述模具則驅物及該母模中之至少一者在下述含氣聚合 48 201005430 物(I)及下述含氟聚合物(II)之玻璃轉移溫度以上的狀 下,從前述模具前驅物之該表面層(B)側緊壓,而产跨 該表面層(B)、該中間層(C)及該透明樹脂層(A)形成微乡 圖案並製得模具;及 @ 分離步驟:使母模從前述模具分離;其中, 透明樹脂:玻璃轉移溫度係於下述含氟聚合物(ι) 及下述含氟聚合物(II)之玻璃轉移溫度以下的透明樹 Ο 含氟聚合物(I):於主鏈具有含氟脂肪族環結構,且 實質上不具有下述反應性基(y)之含氟聚合物; 含氟聚合物(II):於主鏈具有含氟脂肪族環結構, 且具有對前述官能基(X)呈反應性之反應性基(y)的含氟 聚合物。 7. —種具有轉錄微細圖案之基材之製造方法,其特徵在於 具有下述步驟: 將光硬化性樹脂配置於基材表面之步驟; 將如申請專利範圍第1〜5項中任一項之模具緊壓於 s亥光硬化性樹脂,以使該模具之微細圖案與該光硬化性 樹脂相接的步驟; 於將該模具緊壓在該光硬化性樹脂上之狀態下,對 該光硬化性樹脂照射光,使該光硬化性樹脂硬化而製成 硬化物之步驟;及 使模具從該硬化物分離之步驟。 8. —種具有轉錄微細圖案之基材之製造方法,其特徵在於 49 201005430 具有下述步驟: 將光硬化性樹脂配置於如巾請專利朗第丨〜$項中 任一項之模具的微細圖案表面之步驟; 將基材緊壓於該模具表面之該光硬化性樹脂 · 步驟; . 於已將該基材緊壓於該光硬化性樹脂上之狀態 下,對該光硬化性樹賴㈣,使該光硬化性樹脂硬^ 而製成硬化物之步驟;及 ‘ 使模具從該硬化物分離之步驟。 〇 9. -種具有轉錄微細圖案之基材的製造方法,其特徵在於 . 具有下述步驟: ' 使基材與如申請專利範圍第1〜5項中任一項之模具 接近或接觸,以使該模具之微細圖案成為該基材側;、 ; 將光硬化性樹脂充填於該基材與該模具之間的步 , 驟; 於該拳材已與談模&gt;具接近或接觸之狀態下,對該光 硬化性樹脂照射光,使該光硬化性樹脂硬化而製成硬化 物之步驟;及 使模具從該硬化物分離之步驟。 50201005430 VII. Patent application scope: 1. A mold having a fine pattern for forming a photocurable resin, characterized in that it has: 'the following transparent resin layer (A); the following surface layer (B); And an intermediate layer (C) formed on the surface of the transparent resin layer and present between the transparent resin layer (A) and the surface layer (B); Q and 'the maximum height of the aforementioned fine pattern The thickness of the surface layer (B) and the total thickness of the intermediate layer (C) are exceeded; wherein the transparent resin layer (A) is a layer composed of a transparent resin, and the glass transition temperature of the transparent resin is as follows. The fluoropolymer (1) and the following fluoropolymer (π) have a glass transition temperature below, and the transparent resin layer (the 树脂) is formed before the intermediate layer (C) is formed, and an intermediate layer (C) is formed. The surface of the surface has a functional group (x)' and after the intermediate layer (C) is formed, the surface having the intermediate layer (C) has the functional group (X) and the following reactive group (y) a chemically bonded layer; a surface layer (B): consisting of a fluoropolymer (1) In the layer, the fluoropolymer (I) has a fluorinated aliphatic ring structure in the main chain and does not substantially have the following reactive group (y); the intermediate layer (C): is composed of a fluoropolymer (II) In the layer formed, the fluoropolymer (II) has a fluorine-containing aliphatic ring structure in the main chain and has a reactive group (y) reactive with the functional group (X). 2. The mold of claim 1, wherein the finest pattern has a maximum south degree of from 1 to 500 μm. 47 201005430 3. The mold of claim No. 2 or 2, wherein the transparent resin layer (Α) is supported by a transparent support (D). 4. The mold according to any one of claims 1-3, wherein the aforementioned b-base (X) is a trans group, an amine group or an epoxy ethyl group, and the aforementioned anti-reagent group (y) is a carboxyl group. 5. The mold according to any one of the above-mentioned claims, wherein the transparent resin layer (A) is a layer obtained by surface treatment with a functional group introduced on the surface. A manufacturing method of a mold having a fine pattern for forming a photocurable tree, and the method for manufacturing the mold described above is characterized by the following steps: I forming an intermediate layer (C) a step of coating a fluorine-containing solvent having the following fluoropolymer (Π) dissolved on the surface of the transparent resin layer (4) having a functional group (χ) on the surface: Forming a liquid mixture and drying it to form an intermediate layer (C) composed of the following gas-containing polymer (9); a step of preparing a mold precursor: coating on the surface of the intermediate layer (C) The cloth has been prepared by dissolving the following fluoropolymer (1) in a solution containing a gas solvent and drying it to form a surface layer (Β) composed of the following fluoropolymer (1), thereby preparing a mold precursor. ▲Step of making a mold: a flip pattern having a fine pattern on the surface ▲ The maximum height of the X flip pattern is the flip pattern of the master mold exceeding the thickness of the surface layer (9) and the thickness of the intermediate layer (C) In the foregoing mold, at least one of the drive and the master mold is When the following gas-containing polymerization 48 201005430 (I) and the following fluoropolymer (II) have a glass transition temperature or higher, the surface layer (B) side of the mold precursor is pressed, and the product is produced. The surface layer (B), the intermediate layer (C) and the transparent resin layer (A) form a micro-pattern and prepare a mold; and @ separation step: separating the master mold from the mold; wherein, the transparent resin: glass transition temperature system The transparent fluorene polymer (I) having a fluoropolymer (1) or less and a glass transition temperature of the following fluoropolymer (II): a fluorinated aliphatic ring structure in the main chain, and substantially a fluorine-containing polymer having no reactive group (y) described below; a fluorine-containing polymer (II) having a fluorine-containing aliphatic ring structure in a main chain and having a reactivity with respect to the aforementioned functional group (X) a fluoropolymer of the group (y). 7. A method of producing a substrate having a transcribed fine pattern, comprising the steps of: disposing a photocurable resin on a surface of a substrate; and as in any one of claims 1 to 5 of the patent application; a step of pressing the mold on the s-light-curable resin to bring the fine pattern of the mold into contact with the photo-curable resin; and pressing the mold against the photo-curable resin The step of irradiating light to the curable resin, curing the photocurable resin to form a cured product, and separating the mold from the cured product. 8. A method of producing a substrate having a transcribed fine pattern, characterized in that: 49 201005430 has the following steps: arranging the photocurable resin in a fine mold of any one of the patents a step of patterning the surface; the photocurable resin that presses the substrate against the surface of the mold; step; in the state where the substrate is pressed against the photocurable resin, the photohardenability depends on (4) a step of hardening the photocurable resin to form a cured product; and a step of separating the mold from the cured product. 〇9. A method for producing a substrate having a transcribed fine pattern, comprising: the step of: contacting or contacting a substrate with a mold according to any one of claims 1 to 5, a fine pattern of the mold is made to be the substrate side; a step of filling the photocurable resin between the substrate and the mold; and the punching material is in close proximity to or in contact with the mold The step of irradiating the photocurable resin with light, curing the photocurable resin to form a cured product, and separating the mold from the cured product. 50
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* Cited by examiner, † Cited by third party
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CN102741926A (en) * 2009-10-29 2012-10-17 Dic株式会社 Uv curable composition for optical discs and optical disc
JP5549245B2 (en) * 2010-02-01 2014-07-16 住友電気工業株式会社 Formation method of diffraction grating by nanoimprint method
KR101820200B1 (en) * 2012-04-10 2018-01-18 다이킨 고교 가부시키가이샤 Resin mold material composition for imprinting
JP6019685B2 (en) * 2012-04-10 2016-11-02 大日本印刷株式会社 Nanoimprint method and nanoimprint apparatus
JP7515240B2 (en) * 2019-08-21 2024-07-12 Agcセイミケミカル株式会社 Electronic substrate, manufacturing method thereof, and electronic device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4317375B2 (en) * 2003-03-20 2009-08-19 株式会社日立製作所 Nanoprint apparatus and fine structure transfer method
EP1820619A4 (en) * 2004-11-30 2010-07-07 Asahi Glass Co Ltd MOLD AND METHOD FOR MANUFACTURING SUBSTRATES HAVING MICROMOTIVES TRANSFERRED THEREON
JP2007245702A (en) * 2006-02-20 2007-09-27 Asahi Glass Co Ltd Template and method for producing treated substrate having transferred fine pattern
JP2007266384A (en) * 2006-03-29 2007-10-11 Toppan Printing Co Ltd Imprint mold and manufacturing method thereof
JP2007320071A (en) * 2006-05-30 2007-12-13 Asahi Glass Co Ltd Template and method for producing treated substrate having transferred fine pattern
JP4281773B2 (en) * 2006-09-25 2009-06-17 ヤマハ株式会社 Fine molding mold and method for regenerating fine molding mold

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11886110B2 (en) 2020-03-27 2024-01-30 Illumina, Inc. Imprinting apparatus

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