TW200936289A - Fragile material substrate, laser scribe method for the fragile material substrate, and laser scribe apparatus - Google Patents
Fragile material substrate, laser scribe method for the fragile material substrate, and laser scribe apparatus Download PDFInfo
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- TW200936289A TW200936289A TW097138368A TW97138368A TW200936289A TW 200936289 A TW200936289 A TW 200936289A TW 097138368 A TW097138368 A TW 097138368A TW 97138368 A TW97138368 A TW 97138368A TW 200936289 A TW200936289 A TW 200936289A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
- B23K26/066—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms by using masks
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/073—Shaping the laser spot
- B23K26/0736—Shaping the laser spot into an oval shape, e.g. elliptic shape
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/08—Devices involving relative movement between laser beam and workpiece
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0011—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing with preliminary treatment, e.g. weakening by scoring
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
- C03B33/0222—Scoring using a focussed radiation beam, e.g. laser
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
- C03B33/023—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
- C03B33/027—Scoring tool holders; Driving mechanisms therefor
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B33/00—Severing cooled glass
- C03B33/09—Severing cooled glass by thermal shock
- C03B33/091—Severing cooled glass by thermal shock using at least one focussed radiation beam, e.g. laser beam
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2103/00—Materials to be soldered, welded or cut
- B23K2103/50—Inorganic material, e.g. metals, not provided for in B23K2103/02 – B23K2103/26
- B23K2103/52—Ceramics
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Plasma & Fusion (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Thermal Sciences (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
- Laser Beam Processing (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
Abstract
Description
200936289 九、發明說明: 【發明所屬之技術領域】 、本發明係關於對脆性材料基板照射雷射光束之後冷卻 以使垂直裂痕發生於基板而形成劃線之雷射劃線方法及雷 射劃線裝[特別是關於對塗布有透明導電膜等包覆膜之 脆性材料基板之包覆膜附近或脆性材料基板之端緣照射雷 射光以形成劃線之脆性材料基板之劃線方法及劃線裝置。 ❹ 在此所謂脆性材料基板係指玻璃基板、燒結材料之陶 瓷、單結晶矽、半導體晶圓、陶瓷基板、冑寶石基板等。 又’脆性材料基板除由-片基板構成之單板外,亦包含使 基板貼合後之貼合基板。 【先前技術】 已知於上述之玻璃基板、藍寶石基板等脆性基板,使 因雷射光束照射而形成於基板上之加熱點(亦稱光束點)沿 預先設定於基板之劃線預定線相對移動以加熱基板,再使 © 因冷媒喷射而形成之冷卻點如追隨加熱點之軌跡般移動以 冷卻基板,藉此於劃線預定線上形成劃線之雷射劃線方法 (參考例如專利文獻1)。 在此種雷射劃線加工係基於在加熱點周圍產生之壓縮 應力與在冷卻點周圍產生之拉伸應力形成垂直裂痕。此 時,在垂直裂痕形成前先使用劃線輪等工具於基板之端面 形成刻痕(初期龜裂),之後,以此刻痕為開始點掃描雷射光 束產生之加熱點與冷媒產生之冷卻點,藉此使於基板之板 5 200936289 厚方向浸透之垂直裂痕於基板之面方向進展。 -般在進行雷射劃線加卫時係使雷射光束之光 左右對稱之形狀(圓、橢圓、長圓等)並使照射位置定位為為 束點之中心通過劃線預定線上後才掃描雷射光束。具體光 ,言’在圓形光束點為圓之中心,在橢圓形或長圓形:光: 點則以左右方向、前後方向之中心線即長轴、短轴之交點 為光束點之中心,以使其在劃線駭線上移動之方式掃描。 另外,被施以雷射劃線加工之玻璃基板等脆性材料9基 板係使被掃描雷射之劃線預定線附近無障礙物存在。 在此種條件下進行雷射劃線加工使在夾光束點之中心 移動之行進線(即劃線預定線)之左右兩侧之區域發生之熱 應力之大小相等,且在光束點之中心移動之行進線之下方 近處熱應力為最大,結果起因於熱應力之裂痕便形成於行 進線之下方近處(劃線預定線之下方近處)。 【專利文獻1】日本發明專利第3027768號公報 【發明内容】 習知之雷射劃線方法係以包含預定形成劃線之線上於 §亥線附近無妨礙被照射之雷射之照射之要因存在為前提。 會被認為是妨礙要因者,例如存在於基板上且與僅有基板 時不同’將被照射之雷射光束異常吸收或反射之物質。若 此種物質於基板上之劃線預定線附近存在’於雷射光束之 中心於該線上移動時在線之左右之基板内被吸收之光能量 不同發生之熱應力大小亦不同。其結果’劃線預定線附 200936289 近被冷卻而發生之熱應力變化亦在線之左右不同。此時, 所得之裂痕會與預定之線之位置不一致。具體而言,在如 以下之狀況時,裂痕與劃線預定線會不一致。 (第1狀況) 妨礙雷射光之照汾造成之加熱作用之物質做為異物存 在於基板上。具體例可考慮於基板為平面顯示體即平面顯 示器(FPD)用之基板,為使TFT元素等形成之成膜過程中, 本來不形成於劃線預定線附近之膜成分誤附著或本來應在 先則處理被除去之膜成分殘存於劃線預定線附近之狀況。 各狀況皆在此種臈成分具有因被照射至基板之雷射光束而 受大幅影響之光學特性時,該膜成分存在於劃線預定線附 近且被㈣至基板上t雷射$束對基板《熱之影響在線之 左右大幅相異時,由雷射加熱與冷卻形成之裂痕之位置會 從劃線預定線之位置偏離。 (第2狀況) 於基板上有做為機能構件形成之透明導電膜,必須盡 可能靠近該導電膜之附近劃線以使裂痕形成之狀況。例如 可考慮兼顧基板之分斷後之尺寸與結果所得之顯示晝面之 尺寸而產生上述需求之狀況。在此種透明導電臈使被照射 至基板之雷射光束反射,該膜成分存在於劃線預定線附近 且被照射至基板上之雷射光束對基板之熱之影響在線之左 右大幅相異時,由雷射加熱與冷卻形成之裂痕之位置同樣 會從劃線預定線之位置偏離。 (第3狀況) 200936289 必須將基板端之附近盡可能靠近基板端劃線以使裂痕 形成之狀況。例如可考慮兼顧基板之分斷後之尺寸與結果 所得之顯示畫面之尺寸而產生上述需求之狀況。此時於劃 線預定線附近有基板端存在,雷射光束之一部未被照射至 基板上而對基板之熱之影響在線之左右大幅相異時,由雷 射加熱與冷卻形成之裂痕之位置同樣會從劃線預定線之位 置偏離。 亦即,若在劃線預定線附近有異物左右非對稱存在, 雷射光被照射至此異物部分,雷射光之一部會被此異物反 射、吸收。其結果,在劃線預定線之左右對基板之照射面 積相異’被基板吸收之能量產生誤差。 又,在玻璃基板等可能塗布IT0膜做為透明導電膜。 ΙΤΟ膜具有使C〇2雷射之波長光反射之特性。因此,若對玻 璃基板照射c〇2雷射而一部在IT0膜表面被反射,ιτ〇膜 之下側之玻璃基板區域實質上未被照射而被基板吸收之能 量減少,溫度上升被抑制。 反之,在包覆膜具有吸收雷射光束之波長光之特性 時,該包覆膜之下側之玻璃基板區域實質上吸收能量增 大’溫度上升被加速。 此外,形成於劃線預定線之附近之包覆膜之厚度改變 亦可能使被吸收之能量變化。 又,若包覆膜之膜厚接近雷射光之波長而產生多重反 射,在雷射光之波長與包覆膜之膜厚之關係滿足特定條件 時’即使為具有吸收特性之包覆膜,吸收亦可能變為極小 200936289 而吸收能量變化。反之,即使為具有反射特性之包覆膜, 在雷射光之波長與包覆膜之臈厚之關係滿足特定條件時, 吸收亦可能變為極大而吸收能量變化。 若包覆膜等之異物之在劃線預定線附近之非對稱配置 導致之影響使被基板吸收之能量在劃線預定線之左右相 異,於基板產生之熱分布亦在劃線預定線之左右成為非對 稱於基板内。卩發生之熱分布亦在劃線預定線之左右成為 非對稱。若熱分布為非對稱,雷射照射後之冷媒噴射導致 ©之熱應力變化亦在劃線預定線之左右成為非對稱,其結 果,實際上劃線(裂痕)被形成之位置會從劃線預定線偏離。 另外,在基板之端部附近形成劃線之必要產生時,若 使雷射光束沿端部附近之劃線預定線移動並照射,夾劃線 預定線照射基板端側之光束點僅照射至基板端,一部從基 才而露出,、、·ό果,夾劃線預定線在左右兩側照射面積相 異,被吸收之能量亦相異,熱應力之分布仍在劃線預定線 之左右成為非對稱。其結果,實際上劃線(裂痕)被形成之位 _置會從劃線預定線偏離。 使用圖說明形成於劃線預定線附近有異物非對稱存在 時之劃線或形成於基板端之劃線之具體例。 π圖14為顯示以雷射劃線方法從!片破璃製母基板Α切 出單位顯示基板U之一例之圖。 一長圓形狀之光束點P之中心(左右方向之中心線即長轴 與7後方向之中心線即短軸之交點)相對於被設定於雷射劃 線裝置之母基板A以在劃線預定線s上移動之方式被掃描 9 200936289 以進行局部加埶, 送冷媒(不圖_ 追隨光束黑”通過之軌跡之方式吹 称1不圖不)以冷卻。 c(異物)存在域有透明導電膜等包覆膜區域 劃線預定線“帚描雷射:東膜二域C之端緣ci之附近沿 被照射至劃線預定=束點p’光束點p之-部亦 ,、預疋線S附近之包覆膜區域c。 存在在包㈣區域c存在之部分與包覆錢域0不 在之4分光束點P之昭射導 即,埶 ‘、、、射導致之熱之吸收程度相異(亦 Ο 點ρ: ή 度相異)’故在劃線預定線S之左右光束 k時之基板表面之熱分布成為非對稱。 夺相對於在光束點p與包覆膜區域c無交集之位 上線T1與劃線預定線s 一致,在光束點p與包覆膜區 預有交集之區域之劃線下2從包覆膜區域c遠離 預定線S偏離。 因此’在被形成之劃與劃線T2之間位 產 生。200936289 IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a laser scribing method and a laser scribing method for forming a scribe line by irradiating a laser beam onto a brittle material substrate and then cooling it so that a vertical crack occurs on the substrate A scribing method and a scribing apparatus for irradiating laser light to form an edge of a brittle material substrate in the vicinity of a coating film of a brittle material substrate coated with a coating film such as a transparent conductive film or a brittle material substrate . Here, the brittle material substrate means a glass substrate, a ceramic of a sintered material, a single crystal germanium, a semiconductor wafer, a ceramic substrate, a sapphire substrate, or the like. Further, the brittle material substrate includes a bonding board which is bonded to the substrate in addition to the single board formed of the substrate. [Prior Art] It is known that a brittle substrate such as a glass substrate or a sapphire substrate is used, and a heating point (also referred to as a beam spot) formed on a substrate by irradiation of a laser beam is relatively moved along a predetermined line of a predetermined line on a substrate. A laser scribing method in which a substrate is heated and a cooling point formed by the ejection of the refrigerant is moved as follows the trajectory of the heating point to cool the substrate, thereby forming a scribe line on a predetermined line (refer to, for example, Patent Document 1) . Such laser scribing is based on the formation of a vertical crack based on the compressive stress generated around the heating point and the tensile stress generated around the cooling point. At this time, a scoring (initial crack) is formed on the end surface of the substrate by using a tool such as a scribing wheel before the vertical crack is formed, and then the heating point generated by scanning the laser beam and the cooling point generated by the refrigerant are started by using the scoring as a starting point. Thereby, the vertical cracks which are saturated in the thick direction of the substrate 5 200936289 progress in the direction of the surface of the substrate. Generally, when the laser marking is applied, the shape of the laser beam is rounded and symmetrical (circle, ellipse, long circle, etc.), and the illumination position is positioned so that the center of the beam point is lined by the scribe line before scanning the mine. Shoot the beam. The specific light, in the circle of the circle, is the center of the circle, in the ellipse or the oblong: light: the point is the center of the beam point in the left-right direction, the center line of the front-rear direction, that is, the intersection of the long axis and the short axis. Scan in such a way that it moves on the scribe line. Further, the brittle material 9 such as a glass substrate subjected to laser scribing is provided so that the obstacle is not present near the predetermined line of the line to be scanned. Under such conditions, the laser scribing process is performed such that the thermal stresses occurring in the regions on the left and right sides of the traveling line (i.e., the predetermined line of the scribe line) moving at the center of the clip beam point are equal and move at the center of the beam spot. The thermal stress near the lower line of the traveling line is the largest, and as a result, the crack due to the thermal stress is formed near the lower side of the traveling line (near the line below the predetermined line). [Patent Document 1] Japanese Patent Laid-Open No. 3027768 SUMMARY OF THE INVENTION A conventional laser scribing method is based on the fact that a factor including a predetermined line forming a scribe line on the line near the §hai line without obstructing the irradiation of the laser is present. premise. It is considered to be a substance that hinders the cause, such as being present on the substrate and different from the case of only the substrate, which abnormally absorbs or reflects the irradiated laser beam. If the substance is present in the vicinity of the predetermined line on the substrate, the amount of thermal energy that is absorbed in the substrate on the left and right sides of the line when the center of the laser beam moves on the line is different. As a result, the change in the thermal stress occurring in the near-lined line attached to 200936289 is also different on the line. At this point, the resulting crack will not coincide with the position of the predetermined line. Specifically, in the following cases, the crack and the line to be scribed may not coincide. (First condition) A substance that hinders the heating effect by the laser light is present as a foreign matter on the substrate. In a specific example, a substrate for a flat panel display (FPD), which is a flat display, is used. In the film formation process in which a TFT element or the like is formed, a film component which is not formed in the vicinity of a predetermined line of a scribe line is mistakenly attached or should be First, the condition in which the removed film component remains in the vicinity of the predetermined line of the scribe line is processed. In each case, when the bismuth component has an optical characteristic that is greatly affected by the laser beam irradiated onto the substrate, the film component exists in the vicinity of the scribe line and is (b) onto the substrate by a laser beam. When the influence of the heat influence is greatly different, the position of the crack formed by the laser heating and cooling is deviated from the position of the predetermined line of the scribe line. (Second condition) A transparent conductive film formed as a functional member is provided on the substrate, and it is necessary to draw a line near the conductive film as much as possible to form a crack. For example, it is conceivable to take into consideration the size of the substrate after the division and the resulting size of the display surface to produce the above demand. In such a transparent conductive crucible, the laser beam irradiated to the substrate is reflected, and the film component exists in the vicinity of the predetermined line of the scribe line and the influence of the laser beam irradiated onto the substrate on the heat of the substrate greatly differs between the lines on the line The position of the crack formed by the laser heating and cooling also deviates from the position of the predetermined line of the scribe line. (3rd condition) 200936289 It is necessary to scribe the vicinity of the substrate end as close as possible to the substrate end to form a crack. For example, it is conceivable to take into consideration the size of the substrate and the size of the display screen obtained as a result of the above-mentioned demand. At this time, there is a substrate end near the predetermined line of the scribe line, and one of the laser beams is not irradiated onto the substrate, and the influence of the heat on the substrate is greatly different when the left and right sides of the line are substantially different, and the crack formed by the laser heating and cooling is formed. The position also deviates from the position of the line to be scribed. That is, if foreign matter is asymmetrically present in the vicinity of the predetermined line, the laser light is irradiated to the foreign matter portion, and one portion of the laser light is reflected and absorbed by the foreign matter. As a result, the irradiation area of the substrate is different from the left and right scribe lines, and the energy absorbed by the substrate is erroneous. Further, an IT0 film may be applied as a transparent conductive film on a glass substrate or the like. The ruthenium film has a characteristic of reflecting light of a wavelength of a C 〇 2 laser. Therefore, when the glass substrate is irradiated with a c 〇 2 laser and one portion is reflected on the surface of the IT0 film, the glass substrate region on the lower side of the ITO film is substantially unirradiated and the energy absorbed by the substrate is reduced, and the temperature rise is suppressed. On the other hand, when the coating film has the property of absorbing the wavelength light of the laser beam, the glass substrate region on the lower side of the coating film substantially increases the absorption energy, and the temperature rise is accelerated. Further, the thickness of the coating film formed in the vicinity of the predetermined line of the scribe line may also change the energy absorbed. Further, when the film thickness of the coating film is close to the wavelength of the laser light, multiple reflection occurs, and when the relationship between the wavelength of the laser light and the film thickness of the coating film satisfies a specific condition, even if it is a coating film having absorption characteristics, absorption is also performed. May become extremely small 200936289 and absorb energy changes. On the other hand, even in the case of a coating film having a reflection property, when the relationship between the wavelength of the laser light and the thickness of the coating film satisfies a specific condition, the absorption may become extremely large and absorb energy. If the asymmetric arrangement of the foreign matter such as the coating film in the vicinity of the predetermined line is caused to affect the energy absorbed by the substrate, the heat distribution generated on the substrate is also on the predetermined line. The left and right sides become asymmetric in the substrate. The heat distribution of the enthalpy also becomes asymmetric around the line to be scribed. If the heat distribution is asymmetrical, the thermal stress change caused by the laser injection after the laser irradiation is also asymmetric around the predetermined line of the scribe line, and as a result, the position where the scribe line (crack) is actually formed is from the scribe line. The predetermined line deviates. Further, when a scribe line is formed in the vicinity of the end portion of the substrate, if the laser beam is moved along the predetermined line of the scribe line near the end portion and irradiated, the beam spot on the end side of the substrate is irradiated only to the substrate. At the end, one is exposed from the base, and the results are different. The projected lines on the left and right sides are different in the area of illumination, and the absorbed energy is also different. The distribution of thermal stress is still around the line of the line. Become asymmetric. As a result, the position where the scribe line (crack) is formed is actually deviated from the predetermined line of the scribe line. A specific example in which a scribe line or a scribe line formed at the end of the substrate is formed in the vicinity of a predetermined line of scribe line in the presence of a foreign object asymmetrically is described with reference to the drawing. π Figure 14 shows the laser scribing method from! A piece of the glass substrate is cut out and a unit display substrate U is cut out. The center of the beam point P of an oblong shape (the center line of the left-right direction, that is, the intersection of the long axis and the center line of the rear direction, that is, the short axis) is set with respect to the mother substrate A set to the laser scribing device The way of moving on the line s is scanned 9 200936289 for local twisting, sending the refrigerant (not drawing _ following the beam black) through the trajectory of the way to say that 1 is not figured to cool. c (foreign matter) exists in the domain with transparent conductive The film or the like is covered with a predetermined line of the film area. "Scanning laser: the vicinity of the edge ci of the east film two domain C is irradiated to the line of the line = the beam point p' beam point p is also the part, The coating film region c near the line S. There is a portion of the packet (4) where the existence of the region c and the 4th beam point P of the covered money domain 0 are the same, that is, the absorption of heat caused by the 埶', , and the shot is different (also Ο point: ή The difference is that the heat distribution on the surface of the substrate when the left and right beams k of the predetermined line S are scribed is asymmetrical. The upper line T1 coincides with the predetermined line s with respect to the line where the beam point p and the coating film area c do not coincide with each other, and the scribe line is removed from the area where the beam point p and the coating film region are pre-intersected. The area c deviates away from the predetermined line S. Therefore, 'between the formed line and the line T2.
二’圖15 &顯示纟i片玻璃製母基板a之基板端附近 :出單位顯示基板U之-例之圖。圓形之光束點p(光束形 =為如圖14之長圓或橢圓亦可)之中心相對於被設定於雷 棬劃線裝置之母基板A以在劃線預定線s上移動之方式被 婦插以進行局部加熱,#以輯光束.點P i過之軌跡之方 式吹送冷媒(不圖示)以冷卻。 在劃線預定線S被設定於從基板之端緣厘丨至割線預定 線s之距離d2小於從包覆膜區域c之端緣ci至劃線預定 10 200936289 線s之距離dl之位置時,對基板八被照射之光束點p之中 之圖中斜線部未被照射至基板A而偏離至基板外。因此, 在劃線預定線S之左右照射面積相異,由雷射照射在基板a 之表面產生之熱分布在劃線預定線s之左右成為非對稱, 與異物非對稱存在時同樣之位置偏移之問題產生。 此外,劃線預定線S與基板A之端緣M1為非平行, 從劃線預定、線S至±述端、緣M1之距離會變動時,由雷射照 射產生之熱分布仍在劃線預定線s之左右成為非對稱,同 ® 樣之問題產生。 另外’上述問題於由玻璃以外之材料構成之基板亦同 即使於劃線預定線附近 亦可迴避該存在造成之 針對上述問題,本發明第一以 有妨礙照射之異物例如包覆膜存在 影響進行雷射劃線加工為目的。 供Μ吏在平面顯示器用之Fig. 15 & shows the vicinity of the substrate end of the mother glass substrate a of the 纟i sheet: a diagram showing an example of the unit display substrate U. The center of the circular beam point p (the beam shape = the long circle or the ellipse as shown in FIG. 14) is opposed to the mother substrate A set on the Thunder scribe device to move on the scribe line s. Insert the local heating, and blow the refrigerant (not shown) to cool the beam by the point where the point P i passes. When the scribe line S is set at a distance d2 from the edge of the substrate to the predetermined line s of the secant line, the distance d2 is smaller than the distance d1 from the edge ci of the coating film region c to the line s of the line 10 200936289. The oblique line portion in the map among the beam spots p irradiated with the substrate eight is not irradiated to the substrate A and is deviated outside the substrate. Therefore, the irradiation area on the left and right sides of the scribe line S is different, and the heat distribution generated by the laser irradiation on the surface of the substrate a becomes asymmetric about the predetermined line s of the scribe line, and is the same as the position where the foreign matter is asymmetric. The problem of shifting occurs. Further, the planned line S of the scribe line and the edge M1 of the substrate A are non-parallel, and the heat distribution generated by the laser irradiation is still underlined when the distance from the scribe line, the line S to the end, and the edge M1 fluctuate. The left and right sides of the predetermined line s become asymmetrical, and the same kind of problem arises. Further, the above problem is caused by the fact that the substrate made of a material other than the glass can avoid the above problem even if it is in the vicinity of the predetermined line of the scribe line, and the first aspect of the present invention affects the foreign matter such as the coating film which hinders the irradiation. Laser scribing is done for the purpose. Supply for use in flat panel displays
明導電膜(ιτο膜等)形法m u 嘴土板等有边 基板上’亦可將其視為異物,於 其附近s又疋劃線預定線 目的。 /〇其進仃劃線加工之劃線方法為 .^ 馬叹疋於基板端附近之割唆預定 線’亦可沿劃線預定線進扞*… ΚΪ·!線預疋The conductive film (such as ιτο film) can be regarded as a foreign matter on the edge substrate such as the m u nozzle plate, and is slashed to a predetermined line in the vicinity thereof. / 〇 仃 仃 仃 仃 加工 加工 ^ ^ 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马 马
Aim-裏進订sJ線加工之劃線方法為目的。 ”、卜述問題而為之本發明係藉由使雷射& < # 機構相對於脆性材料基板移動射先束照射 定線掃描雷射光束之弁φ …、射田射先束以沿劃線預 線預定線冷卻基板 …'基A #藉由沿前述劃 口線預疋線形成劃線之脆性材料基 11 200936289 :之雷射劃線方法’在將將雷射光遮蔽為雷射光被照射之 表面之範圍對前述劃線預定線為對稱之照射面積調 整手段安裂於雷射光束照射機構或基板之表面其中之一之 狀態下對雷射光被照射之基板之表面之範圍對前述劃線預 定線為非對稱之區域照射雷射光束。 在此,雷射光束使用通常用於對應於脆性材料基板之 材質使用雷射之劃線者即可,可將準分子雷射、YAG雷射、 C〇2雷射或CO雷射等雷射適用於本發明之實施。 又,雷射光被照射之基板之表面之範圍對前述劃線 © 預疋線為非對稱之區域」具體而言係包含劃線預定線附近 之基板表面之狀態為左右相I、於劃線預定線附近之基板 表面有包覆膜等異物左右非對稱形成、劃線預定線之左右 兩側附近之基板形狀相異之區域。 利用本發明,於雷射光束照射機構或基板之表面其中 之安裝有照射面積調整手段。在沿劃線預定線掃描雷射 光束之光束點時,對雷射光被照射之基板之表面之範圍對 月J述劃線預疋線為非對稱之區域藉由照射面積調整手段將 ◎ 雷射光遮蔽為雷射光被照射之基板之表面之範圍對前述劃 Λ預疋線為對稱。藉此,左右兩側之熱分布於劃線預定線 全體被凋整為對稱。其結果,可形成直進性良好之劃線。 (解決其他課題之手段及效果) 上述發明中,脆性材料基板可於基板表面之一部形成 包覆膜區域’包覆膜區域係被設於被掃描之光束點之一部 通過包覆膜區域之位置。 12 200936289 在此,形成包覆膜區域之厂包覆膜」為對雷射光束具 有反射特性或吸收特性之包覆 丄仙也 匕復犋即可,並未特別限定。例 口 ””電極或無反射塗布使用之透明導電膜⑽〇 ίτ〇臈 、^電極或光反射面使用之金屬_如紹、銀、金) 寻马代表例。做為其他例而為 機能性膜亦可。 各種保護膜、各種 利用本發明,即使於書丨鍤 亦可不μ爱时1之附近形成有包覆膜 不又包覆臈之影響形成割線,其結果,可形成直進性 良好之劃線。 』心成直進性 又’上述發明_,光凌 孫mm 先束點可係被掃描之光束點之-部 係乂通過比基板外側之方式被掃描。 利用本發明,即传為 板端緣之位…線預定線被設定於靠近基 端緣之位置之狀況、法設定為平行於基板 劃線預定線之寬度方。凹;預定線附近之基板端緣有往 機構之光束點,二::=況照射來自雷射光束照射 之影響形成劃線,形成線預定線至基板端緣之距離 心成直進性良好之劃線。 又,上述發明中,史 積調整手段可係由以減射光束照射機構之照射面 之擴張之方式遮光之線之寬度方向之光束點 口以使透過此擋門構件被並限制擔門構件之開 產生之熱分布為相對於劃線、之光束點使基板表面 利用本發明,俾:左右對稱。 線之寬度方向之光束擒門構件之開口減少劃線預定 束點之擴張(亦即光束點之寬度,以下稱 200936289 光束點寬度),於劃線預定線全體使由光束點產生之熱分布 為相對於劃線預定線左右對稱對基板照射。藉此,可形成 直進性良好之劃線。 —又,雷射光束之光束點之形狀為為使熱分布沿劃線預 定線為對稱而左右對稱之形狀較理想。例如一般為圓形、 橢圓、長圓,纟只要實質上為左右對稱之形狀並未特別受 例如可形成被分離於相肖於劃線默線左㈣稱之位 置且以左右對稱之形狀形成之—對光束,f卜如上述形成—〇 對光束點可使改善劃線預定線下方近處之應力分布,使垂 直裂痕於基板厚度方向深入進展(參考w〇2〇〇6/〇38365號公 又,上述發明中,安裝於脆性材料基板之照射面積調 =手段可由沿劃線預定線形成於劃線預定線附近之包覆膜 區域之相反側之暫置包覆膜構成。 利用本發明,於劃線預定螅 ❹ ^ ± j咏預疋線之左右任一側形成有包覆 膜£域蚪’夾劃線預定線 力側形成暫置包覆膜可使雷 射光束之反射、吸收導致之埶 it ‘,,、疋衫響在劃線預定線之左右 千衡以使熱分布在劃線預定線之左右對稱。 在此,暫置包覆臈之材料 白 禾特別受限,可為與形成 亦可i 〃、要反射及吸收等光學特性相同 亦可為不同材料。例如做為 .u為電極或無反射塗布使用之透明 τ〇膜等)做為包覆膜區域形m線預Μ 時,可於另—侧形成由相同透明導電模構成之暫置 14 200936289 包覆膜。於液晶顯示面板用之母基板雖將透明導電獏形成 有圖案以做為包覆膜區域,但只要在此透明導電膜圖案形 成時於本來不必形成透明導電膜之區域即夾劃線預定線與 包覆膜區域相反側之區域同時形成暫置包覆膜便可有效率 地形成暫置包覆膜。 又’由另一觀點而為之本發明之另一實施態樣之雷射 劃線裝置係於具備雷射光束照射機構、冷卻機構、使前述 雷射光束照射機構及冷卻機構相對於基板移動之掃描機 〇 構,使雷射光束照射機構相對於基板移動以使雷射光束之 光束點沿設定於基板之劃線預定線其中心位於劃線預定線 上被掃描而在軟化點以下之溫度加熱基板,之後沿光束點 通過之軌跡使冷卻機構相對移動以冷卻基板以沿劃線預定 線形成劃線之脆性材料基板用之雷射劃線裝置中,具備減 縮劃線預定線之寬度方向之光束點之擴張以使光束點為因 被照射至基板而於表面產生之熱分布為涵蓋劃線預定線全 長左右對稱之擋門。 ❹ W用本發明,以擋門縮小光束點之光束寬度,使由光 束點產生之熱分布於劃線預定線之全體對劃線預定線左右 對稱。藉此’可形成直進性良好之劃線。 上述劃線裝置中,前述擋門具有調整劃線預定線之寬 度方向之光束點之擴張之擋門寬度調整機構,劃線預定線 之寬度方向之光束點之擴張被設定為從劃線預定線至存在 於此劃線預定線附近之包覆膜區域及基板端緣之最短距離 之2倍或2倍以下。 15 200936289 利用本發明,由於可調整為光束點被掃描時光束點不 會觸及包覆膜區域及基板端緣,故只要沿劃線預定線對稱 照射光束點即可使熱分布對稱。 〇 上述劃線裝置中,前述擋門具有調整劃線預定線之寬 度方向之光束點之擴張之擋門寬度調整機構,還具備以掃 描機構使其沿劃線預定線全長相對移動並拍攝存在於割線 預定線附近之包覆膜區域及基板端緣之影像資訊之攝影機 部、基於由攝影機部拍攝之影像資訊抽出從劃線預定線至 包覆膜區域或基板端緣之最短距離並基於抽出之最短距離 決定劃線預定線之寬度方向之光束點寬度❹㈣門^ 調整機構之擋門寬度控制部。Aim-into the sJ line processing of the scribing method for the purpose. The present invention is based on the invention that the laser &<# mechanism is moved relative to the brittle material substrate to illuminate the ray of the laser beam with the first beam to align the line. The line is pre-lined to cool the substrate. 'Base A# The brittle material base 11 is formed by the pre-twist line along the aforementioned line. 200936289: The laser scribing method 'will shield the laser light into laser light The range of the surface of the substrate to which the laser light is irradiated in a state where the surface of the irradiated surface is symmetrical with respect to the predetermined line of the scribe line and is ruptured to one of the surfaces of the laser beam irradiation mechanism or the substrate The predetermined line of the line illuminates the laser beam in an asymmetric region. Here, the laser beam can be used for the laser beam corresponding to the material of the brittle material substrate, and the excimer laser and the YAG laser can be used. A laser such as a C〇2 laser or a CO laser is suitable for the practice of the present invention. Further, the range of the surface of the substrate on which the laser light is irradiated is an asymmetric region of the scribe line © the pre-twist line. Including near the line of the line The state of the surface of the substrate is the left and right phase I, and the surface of the substrate near the predetermined line is formed asymmetrically by foreign matter such as a coating film, and the shape of the substrate in the vicinity of the left and right sides of the predetermined line is different. According to the invention, the irradiation area adjusting means is mounted on the surface of the laser beam irradiation means or the substrate. When scanning the beam spot of the laser beam along a predetermined line of the scribe line, the range of the surface of the substrate on which the laser light is irradiated is asymmetrical to the area where the line is pre-twisted by the ray line. The range of the surface of the substrate that is shielded to be irradiated with the laser light is symmetrical with respect to the aforementioned pre-twist line. Thereby, the heat distribution on the left and right sides is uniformly symmetrical to the predetermined line of the scribe line. As a result, a line with good straightness can be formed. (Means and Effects for Solving Other Problems) In the above invention, the brittle material substrate can form a coating film region on one surface of the substrate. The coating film region is provided at one of the scanned beam spots through the coating film region. The location. 12 200936289 Here, the factory coating film forming the coating film region is a coating which has a reflection property or an absorption property to the laser beam, and is not particularly limited. Example "" Electrode or non-reflective coating of transparent conductive film (10) ί ίτ〇臈, ^ electrode or metal used for light-reflecting surface _ Ru Shao, silver, gold). As a other example, it is also a functional film. Various protective films and various types of the present invention can form a dicing film in the vicinity of the case 1 without the use of the ruthenium, and as a result, a scribe line having a good straightness can be formed. The heart is straightforward. In the above invention, the beam spot can be scanned by the side of the substrate. According to the present invention, the position of the end edge of the board is set to a position near the base edge, and the method is set to be parallel to the width of the predetermined line of the substrate. Concave; the edge of the substrate near the predetermined line has a beam point of the mechanism, and the second::= condition illumination forms a scribe line from the influence of the laser beam irradiation, and the distance from the predetermined line of the line to the edge of the substrate is straightforward. line. Further, in the above invention, the history product adjustment means may be a beam spot which is shielded in the width direction of the line which is shielded by the expansion of the irradiation surface of the subtraction beam irradiation means so as to pass through the shutter member and restrict the member of the door member. The heat generated by the opening is such that the substrate surface is utilized with respect to the scribe line and the beam spot, and the 俾: is bilaterally symmetrical. The opening of the beam door member in the width direction of the line reduces the expansion of the predetermined beam point of the scribe line (that is, the width of the beam spot, hereinafter referred to as the beam width of 200936289), and the heat distribution generated by the beam spot is determined by the entire line of the scribe line. The substrate is irradiated with respect to the predetermined line of the scribe line. Thereby, a straight line with good straightness can be formed. Further, the shape of the beam spot of the laser beam is preferably a shape in which the heat distribution is symmetrical with respect to the scribe line predetermined line. For example, the shape is generally circular, elliptical or oblong, and the shape of the ytterbium is substantially not symmetrical, for example, it can be formed in a shape that is separated from the left (four) of the singular line and is formed in a bilaterally symmetrical shape. For the beam, f is formed as described above—the beam spot can improve the stress distribution near the predetermined line of the scribe line, so that the vertical crack progresses in the thickness direction of the substrate (refer to w〇2〇〇6/〇38365) In the above invention, the irradiation area adjustment means attached to the brittle material substrate may be constituted by a temporary coating film formed on the opposite side of the coating film region in the vicinity of the predetermined line of the scribe line along the predetermined line of the scribe line. The scribe line is predetermined to be 螅❹ ^ ± j 任一 any one of the left and right sides of the pre-twist line is formed with a coating film 蚪 夹 'clip line to the predetermined line force side to form a temporary coating film to cause reflection and absorption of the laser beam埶it ',,, 疋 响 在 在 在 在 在 在 ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' Forming can also be 〃, to reflect and The optical properties can be the same or different materials. For example, a transparent τ 〇 film used as an electrode or a non-reflective coating can be formed on the other side as a coating film. The same transparent conductive mold is formed by the temporary 14 200936289 coating film. In the mother substrate for a liquid crystal display panel, a transparent conductive conductive layer is formed with a pattern as a coating film region. However, when the transparent conductive film pattern is formed, a predetermined line is not required to form a transparent conductive film. The temporary coating film can be efficiently formed by simultaneously forming a temporary coating film in a region on the opposite side of the coating film region. According to another aspect of the present invention, a laser scribing apparatus is provided with a laser beam irradiation mechanism, a cooling mechanism, and the laser beam irradiation mechanism and the cooling mechanism are moved relative to the substrate. The scanner mechanism moves the laser beam illumination mechanism relative to the substrate such that the beam spot of the laser beam is scanned along a predetermined line of the substrate set on a predetermined line of the substrate and the substrate is heated at a temperature below the softening point. And a laser scribe line device for a brittle material substrate which is formed by moving a substrate along a trajectory of a beam spot to cool the substrate to form a scribe line along a predetermined line of scribe lines, and has a beam spot in a width direction of the predetermined line of the scribe line The expansion is such that the beam spot is a gate that is symmetrical to the entire length of the predetermined line of the scribe line by the heat distribution generated on the surface by being irradiated onto the substrate. According to the present invention, the beam width of the beam spot is reduced by the shutter, and the heat generated by the beam spot is distributed to the left and right of the predetermined line of the scribe line to be symmetrical with respect to the predetermined line of the scribe line. By this, a straight line with good straightness can be formed. In the scribing device, the shutter has a door width adjusting mechanism for adjusting an expansion of a beam spot in a width direction of a predetermined line of a scribe line, and an expansion of a beam spot in a width direction of a predetermined line of the scribe line is set to a predetermined line from a scribe line. Up to 2 times or less the shortest distance between the coating film region and the substrate edge existing in the vicinity of the predetermined line of the scribe line. 15 200936289 According to the present invention, since the beam spot does not touch the coating film region and the substrate edge when the beam spot is scanned, the heat distribution can be made symmetric by illuminating the beam spot symmetrically along the predetermined line of the scribe line. In the above-described scribing device, the shutter has a door width adjusting mechanism that adjusts the expansion of the beam spot in the width direction of the predetermined line of the scribe line, and further includes a scanning mechanism that relatively moves along the entire length of the predetermined line of the scribe line and captures the image a camera portion of the image information of the coating film region and the edge of the substrate near the planned line of the secant line, based on the image information captured by the camera portion, extracting the shortest distance from the predetermined line of the scribe line to the edge of the film or the edge of the substrate and based on the extraction The shortest distance determines the beam spot width in the width direction of the predetermined line of the scribe line 四 (4) The door width control unit of the adjustment mechanism.
利用本發明,以掃描機構使攝影機部沿劃線預定線全 長相對移動並拍㈣在於劃線預定線附^包覆膜區域及 基板端緣。播Η寬度控制部由攝得之影像f訊抽出從劃線 預定線至包覆膜區域或基板端緣之最短距離。之後基於抽 出之最短距離決定劃線預定線之寬度方向之光束點寬度以 控制擋門寬度調整機構控制光束寬度。 藉此,可自動檢測出至存在於劃線預定線附近之包覆 膜區域及基板端緣之最短距離,自動調整被照射之點寬度。 上述劃線裝置中,前述擋門具有調整劃線預定線之寬 度方向之光束點之擴張之擋門寬度調整機構,還具備將預 先設定之從劃線預定線至包覆膜區域或基板端緣之最短距 離以距離資料輸入之距離資料輸入部、記錄被輸入距離資 料輸入部之距離資料之距離資料記錄部、讀取記錄於距離 16 200936289 資料記錄部之距離資料並基於讀取之距離資料決定劃線預 定線之寬度方向之光束點寬度以控制揚門寬度調整機構之 擋門寬度控制部。 利用本發明,將預先設定之從劃線預定線至包覆膜區 域或基板端緣之最短距離以距離資料輸入,使記錄被輸入 之距離資料。擔門寬度控制部讀取被記錄之距離資料並基 於讀取之距離資料決定劃線預定線之宽度方向之光束點寬 度以控制擋門寬度調整機構。 5 #此’只要事先使記錄至存在於劃線預定線附近之包 覆膜區域及基板端緣之最短距離,便可自動調整被照射之 點寬度。 【實施方式】 (實施形態1) 以下基於圖面說明本發明之實施形態With the present invention, the camera unit is relatively moved relative to the predetermined line of the scribe line by the scanning mechanism and is photographed (four) by the predetermined line of the scribe line covering the film area and the edge of the substrate. The seed width control unit extracts the shortest distance from the predetermined line to the film area or the edge of the substrate from the captured image f. Then, based on the shortest distance extracted, the beam spot width in the width direction of the predetermined line is determined to control the gate width adjusting mechanism to control the beam width. Thereby, the shortest distance to the coating film region existing near the predetermined line of the scribe line and the edge of the substrate can be automatically detected, and the width of the spot to be irradiated can be automatically adjusted. In the scribing device, the shutter has a door width adjusting mechanism for adjusting an expansion of a beam spot in a width direction of a predetermined line of scribe lines, and further includes a predetermined line from a scribe line to a coating film region or a substrate edge The shortest distance is determined by the distance data input unit, the distance data input unit that records the distance data input from the data input unit, and the distance data recorded in the distance record 16 200936289 data record unit and determined based on the read distance data. The beam spot width in the width direction of the predetermined line is scribed to control the gate width control portion of the door width adjusting mechanism. With the present invention, the shortest distance from the predetermined line of the scribe line to the edge of the coating film or the edge of the substrate is input in advance as the distance data, so that the distance data input is recorded. The gate width control unit reads the recorded distance data and determines the beam spot width in the width direction of the predetermined line based on the read distance data to control the shutter width adjusting mechanism. 5 #this' automatically adjusts the width of the irradiated spot as long as it is recorded in advance to the shortest distance between the area of the coating film existing near the predetermined line of the scribe line and the edge of the substrate. [Embodiment] (Embodiment 1) Hereinafter, an embodiment of the present invention will be described based on the drawings.
… ^ 固 X... ^ Solid X
明之一實施形態之雷射查丨丨蝻酤® τ η , s丨線4置LS1之概略構成圖。圖2 為顯示圖1之雷射畫,丨綠捉 】線裴置1之控制系統之構成之圖。 圖3為說明内藏調整光 尤朿點之先學糸統之光學保持具之構 造之圖。 百先基於圖1說明雷惠 • 月雷射劃線裝置LS 1之全體構成。 沿平行配置於水平之加 ^ 7 之木上之一對導軌3、4設有於 圖1之紙面前後方向( 2。M A a h , 下稱Y方向)往復移動之滑動平台 於兩導軌3、4之間>VL ν 。Υ方向配置有導螺桿5,於此導螺 才干5螺合有固定於前 勒十台2之支柱6,以馬達(圖示 17 200936289 於Y方向往 外)正反轉導螺桿5使滑動平台2沿導軌3 復移動。 於;月動平台2上沿導軌8配置有於圖i之左右方向(以 下稱X方向)往復移動之水平台座7。於固定Μ座7之支 柱貫通螺合有藉由馬達9旋轉之導螺桿心,導螺桿心 正反轉會使滑動台座7沿導轨…方向往復移動。 於台座7上設有以旋轉機構丨丨旋轉之旋轉平台I],於 此旋轉平台i2以水平之狀態安裝切斷對象物即玻璃基板等 脆性材料基板(以下僅將其稱為母基板A)。旋轉機構n係 使旋轉平台12繞垂直之軸旋轉’可旋轉為對基準位置為任 意旋轉角度。X,分斷對象物即母基板A係以例如吸引炎 頭固定於旋轉平台12。 於旋轉平台12之上方有連接於雷射振盪器13之光學 保持具14受安裝架15保持。由雷射震盪器發射之雷射光 束係藉由光學保持具14内部之光學系統以預先設定之形狀 之光束點(在此設為沿劃線預定線方向延伸之大致長圓形狀 之光束點)被照射至母基板A上。另外,光學保持具1 4内 ❹ 部之光學系統將於後述。 於旋轉平台12之上方配設有可自由位置調整之一對 CCD攝影機20 (21)9於切斷對象物即母基板Α在基板之兩 端設有通常設定載置於旋轉平台12時之加工基準之一對對 準標記,一對CCD攝影機20 (21)係被配設為可分別拍攝此 等對準標記。另外,圖1中僅紙面近側之CCD攝影機2〇 有被顯示’紙面遠側之CCD攝影機2 1未被顯示。 18 200936289 光學保持具14係受圖2之控制部 12之上移動。一般而言,使用 &制於旋轉平台 器構成中,因雷射光束之射 ',彳線裝置之基本之機 之中心位置與光學保持具14之“ 束點 在於與被加工對象物之表面“ 士 通常不-致,但將 了豕物之表面垂|方向離 移動之光學保持具14之中心付s 1 兄疋距離之位置 <中。位置座標視為座標資 制裝置側可將光束點照射之、’处 將其他之褒置部分之位置倣…置以位置貧料測得。若 位置做為座標資料採用,使偏位I 9 錄於管理裝置之移動資料 偏位量5己 β -Γ “ •曰 之控制邛,配合需要對偏位量增 減,可控制關於光學保持具14之移動。 又’若從光學保持具Μ射 耵出之先束之形狀為大致圖 形,以其中心座標(R 致圓 八幻馮先束之中心座標資料, 形狀為於行進方向延伸之报 、彳甲之形狀且於行進方向之左右對稱之 橢圓形,以其長軸與短轴交差 神父差之位置(Ex,Ey)為光束之中心 座標資料。A schematic diagram of a laser scanning 丨丨蝻酤 τ η and an s 丨 4 4 LS1 in one embodiment. Fig. 2 is a view showing the structure of the control system of the laser beam of Fig. 1 and the green frame of the wire. Fig. 3 is a view showing the construction of an optical holder of a prior art system in which a light adjustment point is incorporated. Bai Qian first explained the overall structure of Leihui • Moon laser marking device LS 1 based on Fig. 1 . A pair of guide rails 3, 4 disposed on the wood of the horizontally added layer 7 are arranged in the front direction of the paper of Fig. 1 (2. MA ah, hereinafter referred to as the Y direction). The sliding platform reciprocates on the two guide rails 3, 4 Between > VL ν . A lead screw 5 is disposed in the Υ direction, and the lead screw 5 is screwed to the struts 6 fixed to the front 10, and the motor is rotated (shown in FIG. 17 200936289 in the Y direction) to reverse the lead screw 5 to make the sliding platform 2 Move along the guide rail 3. On the moon moving platform 2, a water platform seat 7 that reciprocates in the left-right direction of the figure i (hereinafter referred to as the X direction) is disposed along the guide rail 8. The lead screw of the fixed cymbal 7 is screwed with a lead screw shaft rotated by the motor 9, and the forward and reverse rotation of the lead screw causes the slide pedestal 7 to reciprocate in the direction of the guide rail. The pedestal 7 is provided with a rotating platform I] that is rotated by a rotating mechanism, and the rotating platform i2 is horizontally mounted with a brittle material substrate such as a glass substrate, which is an object to be cut (hereinafter, simply referred to as a mother substrate A). . The rotating mechanism n is such that the rotating platform 12 is rotated about a vertical axis 'rotatable to an arbitrary rotation angle with respect to the reference position. X, the parent substrate A, which is the object to be separated, is fixed to the rotary table 12 by, for example, a suction head. Above the rotary table 12, an optical holder 14 connected to the laser oscillator 13 is held by the mounting frame 15. The laser beam emitted by the laser oscillator is a beam point of a predetermined shape (here, a beam point of a substantially oblong shape extending in a predetermined line direction along the scribe line) by an optical system inside the optical holder 14. Irradiation onto the mother substrate A. Further, the optical system of the inner portion of the optical holder 14 will be described later. A CCD camera 20 (21) 9 is disposed above the rotating platform 12 to align the CCD camera 20 (21) 9 to the object to be cut, that is, the substrate is disposed at both ends of the substrate and is normally placed on the rotating platform 12 One of the reference pairs of alignment marks, a pair of CCD cameras 20 (21) are configured to capture the alignment marks separately. Further, in Fig. 1, only the CCD camera 2 on the near side of the paper surface is displayed, and the CCD camera 2 1 on the far side of the paper surface is not displayed. 18 200936289 The optical holder 14 is moved over the control unit 12 of Fig. 2. In general, the use of & in the construction of a rotating platform, due to the laser beam', the central position of the basic device of the twisting device and the "beam spot of the optical holder 14 are on the surface of the object to be processed. "The sergeant usually does not - but the surface of the scorpion hangs | the direction away from the center of the moving optical holder 14 pays s 1 position of the brother-in-law distance. The position coordinates are regarded as the coordinate device side that can illuminate the beam spot, and the position of the other components is assumed to be placed in the position of the poor material. If the position is used as the coordinate data, the offset data I 9 is recorded in the management device. The amount of the mobile data is 5 β β Γ 曰 曰 曰 曰 曰 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 邛 配合 邛14. The movement of the 14th. If the shape of the first beam from the optical holder is a rough figure, with its central coordinate (R to the circle of the eight phoenix feng first bundle of the coordinates of the center, the shape is extended in the direction of travel, 彳The shape of the shape of the beam is symmetrical in the direction of travel, and the position of the priest (Ex, Ey) is the center coordinate of the beam with the long axis and the short axis intersecting.
光束之中心位置盘亦徵扣J 士 PI Ο 直”先學保持具14之中心位置不—致 時’將兩者之位置差異之值視為偏位量,只要掌握其中一 方之位置’ m位置便可藉由加上偏位量迅速求得。 例如’掌握光學保持具14之中心位置座標與光束之中 心座標(Rx,Ry)之偏移量做為偏位量,只要將光學保持豆14 之位置資料以裝置之控制資料事先輸入至程式中便可:必 要时以關於偏位量之演算處理求得於基板上之光束之實際 之座標位置。 τ 另外,把握光束之座標資料與上述光學保持具Μ之座 19 200936289 標資料可將劃線動作中之光學保持具14之現在位置與光束 中心之現在位置於連接於控制部之顯示器上放映以確認。 以下之說明中為求簡化,假設光束中心位置與光學保 持具14之中心位置一致進行說明。 又,於安襄架15接近光學保持具14設有冷卻噴嘴16 由此冷卻噴嘴16對玻璃基板嘴射冷卻水、氛氣、二氧化碎 氣體等冷卻媒體。此冷卻媒體被吹送至接近之前從光學待The center position of the beam is also deducted by J. PI Ο Straight "The first position of the holder 14 is not - when the time" is regarded as the amount of position difference, as long as the position of one of them is 'm position It can be quickly obtained by adding the amount of offset. For example, 'the offset of the center position coordinate of the optical holder 14 and the center coordinate of the beam (Rx, Ry) is used as the offset amount, as long as the optically retained bean 14 The position data can be input into the program in advance by using the control data of the device: if necessary, the actual coordinate position of the light beam on the substrate can be obtained by the calculation of the offset amount. τ In addition, the coordinate data of the beam and the above optical are grasped. The holder of the holder 19 200936289 can confirm the current position of the optical holder 14 in the scribing operation and the current position of the center of the beam on the display connected to the control unit. The following description is for simplification, assuming The center position of the beam is aligned with the center position of the optical holder 14. Further, the ampoule 15 is provided with a cooling nozzle 16 adjacent to the optical holder 14 to thereby cool the nozzle 16 to the glass substrate. The nozzle emits cooling medium such as cooling water, atmosphere, and sulphur dioxide gas. This cooling medium is blown until it is close to the optical
持具Μ照射至母基板a之光束點之長邊方向之端部之位 置,於母基板A之表面形成冷卻點。 此外’劃線輪18係透過上下移動調節機構π被安褒。 此劃線輪18係以燒結鑽石或超硬合金為材料,於外周面且 備以頂點為刀前緣之v字形之棱線部,且可藉由動 :=?調對母基板。劃線㈣係專用 其次,基於圖2說明控制I:待機位置。 玉弟i系、.先。於雷射劃線梦The position of the end portion in the longitudinal direction of the beam spot irradiated to the mother substrate a is held, and a cooling point is formed on the surface of the mother substrate A. Further, the scribing wheel 18 is mounted by the up-and-down movement adjustment mechanism π. The scribing wheel 18 is made of sintered diamond or superhard alloy, and has an apex portion which is a v-shaped ridge at the outer peripheral surface and has a vertex as the leading edge of the blade, and can be adjusted to the mother substrate by motion:=. The line (four) is dedicated. Next, the control I: standby position will be described based on Fig. 2 . Yudi i series, first. Laser marking dream
驅動進行滑動平台2及台 、哀置LSI, 平台驅動部5卜為雷射光束之2疋位之馬達(馬達9等)之 尤來之照射而驅動雷 〇 雷射驅動部52、驅動連接於冷卻喷二二二之 開閉闊(不圖示)之喷嘴_#53 广控制冷媒噴射之 對母基板Α之壓接力之調整之輪二劃線輪Μ之定位及 之開口寬度W。之調整之擋心部5;之:進行擔門44 以電腦(CPU)構成之控制部56 之各驅動系統係受 盤、滑鼠等輸入裝置構成之輸八工部(不:控,部56連接由鍵 (不圖不)、由進行各種顯 20 200936289 ::顯不畫面構成之顯示部58,可將必要訊息顯示於顯示 !面且必要指示或設定可輸入。 卜於拴制部56還具備將預先設定之與從劃線預定 至包覆膜區域C或基板端緣Ml之最短距離對應之座 :::二距離資料輸入之距離資料輸入部57、記錄被輸入 :料輸入部57之距離資料之距離資料記錄部59、讀取 記錄於距離資料記錄部59之距離資料並為決定劃線預定線 之寬度方向之光束點之擴張即限制光束點寬度W而基於讀 取之距離貝料调整播門板桃《開口寬度·之播門寬度控 制部44。藉此,可自動決定播門板桃之開口寬度w〇 ^ 進行劃線。 以下基於圖3說明光學保持具! 4之内部構造。如圖^ 所不,光學保持具i 4具備將來自雷射發射器1 3之雷射光 束LB變形為具有長圓形狀之光束點之雷射光束LC之聚光 透鏡42、43、遮蔽雷射光束LC之外側部分以使其為限制光 束寬度之限制光束點LD之擂門44。另外,將限制光束點 V LD之限制點寬度卩^表示。 另外,亦可如圖4所示,沿限制光束點LD之長軸方向 之中央線攻置被遮光部分,形成具有限制點寬度以W之左 右對限制光束點[D2。此時,於光路上安裝遮蔽光束點 、邛伤之光學分割元件41 (例如遮蔽中央線之縫板)。藉 此可於基板厚度方向形成垂直進展至更深處之劃線。 另外’如圖4所示,於劃線上形成不受雷射光束之照 射之非照射部分之光束點係記載於下述之專利文獻3。此種 21 200936289 光束點係以雷射光束之照射與冷媒噴射係在垂直裂痕進展 時於脆I·生材料基板之板厚方向阻止内部壓縮力場形成於劃 線之下方近處,故可於脆性材料基板之板厚方向形成完全 垂直之裂痕(參考W02006/038365號公報)。 圖5為5兒明擋門44之構成之概略構成圖。擋門44係 :具有透過雷射光束LC之窗45之基台44a上設有以遮光 性材料(例如金屬帶)形成之擋門板441^擋門板4仆係由2 片擋門片構成,各擋門片藉由擋門驅動部55於雷射光束LC 被掃描之方向(X方向)與垂直之方向(γ方向)從窗45之中心❹ 線〇各滑動相等之任意移動距離w〇,,可調整為開口寬度 Wo (其中’開口寬度w〇 = w〇*2)。 圖6為說明於形成有包覆膜區域c之母基板a照射雷 射光時之與擋門44之位置關係之側面圖。圖7為說明於形 成有包覆膜區域C之母基板A照射雷射光時之與擋門44之 位置關係之平面圖。擋門板44b之開口寬度w〇係基於從劃 線預疋線S至包覆膜區域C或基板端緣c 1之最短距離一起 調整擔門板44b與至形成於母基板A上之光束點之距離。〇 例如圖6所示,調整擋門板44b之開口寬度Wo以使光束點 LD之一部不會被照射至形成於母基板A上之由透明導電膜 構成之包覆膜區域c之區域。藉此,於母基板A上光束點 之中〜係位於劃線預定線S,可形成光束寬度受限制之限制 光束點LD。 另外’於圖6中’為圖面之簡化而僅以擋門板44t>表 示擋門44之位置。 22 200936289 作以下參考圖1及圖2說明上述雷射劃線裝置LS1之動 首先輪入被分斷為既定大小之母基板A之尺寸、則線 之形成位置(即劃線預定線s)、劃線輪18對母基板A之壓 接力(劃線荷重)。 劃線之形成位置係由以一對攝影機2〇 (21)拍攝分別附 力^口於母基板A之一對對準標記,基於影像處理進行滑動平 台2及台座12之定位而被設定。進行此種定位之手法於日 本專利第3078668號公報等為公知之技術,詳細說明省略。 之後,於距離資料輸入部57預先設定之從劃線預定線 S至包覆膜區域C或基板端緣M1之最短距離做為距離資料 被輸入。 距離資料記錄部59記錄被輸入距離資料輸入部57之 距離資料後,讀取記錄於距離資料記錄部59之距離資料並 為決定限制光束點寬度w而基於讀取之距離資料調整檔門 板44b之開口寬度w〇。 另外,記錄於距離資料記錄部59之距離資料可為每i 條劃線預定線S之上述最短距離,亦可為由丨片母基板可 得之最小之上述最短距離。 之後’設定擋門板44b之開口寬度Wo以使光束點LD 之長軸重疊於劃線預定線s且如圖6、圖7說明,雷射光束 之一部不會被照射至劃線預定線s附近之包覆膜區域c。之 後母基板A被固定於旋轉平台12上之事先設定之位置。 之後,為形成初期龜裂而在以上下移動調節機構1 7使 23 200936289 ::輪18下降之狀態下移動母基板a,於基板端形成初期 後驅動雷射發射器13及冷卻噴嘴Μ。之後沿劃線預 媒體嘴Γ描雷射光束之光束點’再移動母基板A以使冷卻 、 進仃劃線。此時’如圖7所示,《束點LC因光 呆持-14之擋門板44b而成為劃線預定線s之寬度方向 寬度又限制之狀態之限制光束點ld (如圖3、圖 照射。因此,丌x心—面, ,r , 叉L覆膜區域C之反射或吸收之影響於The slide platform 2 and the stage are driven, and the LSI is mounted. The platform drive unit 5 drives the Thunder laser drive unit 52 to drive the Thunder laser drive unit 52, which is a two-position laser (the motor 9 or the like) of the laser beam. Cooling spray 222 opening and closing wide (not shown) nozzle _#53 Widely control the positioning of the wheel scribe rim and the opening width W of the adjustment of the crimping force of the mother substrate 冷. The adjustment of the center portion 5; the drive system 44 is a computer (CPU) control unit 56, each of which is constituted by an input device such as a disk or a mouse (not: control, part 56) By connecting the key (not shown) to the display unit 58 which is configured by various display 20 200936289: display, the necessary message can be displayed on the display! surface and the necessary indication or setting can be input. The seat corresponding to the shortest distance from the scribe line to the coating film area C or the substrate edge M1 is set in advance: the distance data input unit 57 for the two-distance data input, and the record is input: the material input unit 57 The distance data data recording unit 59 reads the distance data recorded in the distance from the data recording unit 59 and determines the expansion of the beam spot in the width direction of the predetermined line of the scribe line, that is, the limit beam spot width W, based on the distance read. The door width of the door panel is adjusted to the opening width of the door width control unit 44. The opening width w〇^ of the door panel can be automatically determined. The following is an explanation of the internal structure of the optical holder! Figure ^ No, optical protection The i 4 has a collecting lens 42 and 43 that deforms the laser beam LB from the laser emitter 13 into a laser beam LC having an elliptical beam spot, and shields the outer portion of the laser beam LC to The limit of the beam width is limited to the threshold 44 of the beam spot LD. In addition, the limit point width of the beam spot V LD is limited to 卩^. Alternatively, as shown in Fig. 4, the center of the long axis direction of the beam spot LD is limited. The line tapping is shielded by the light-shielding portion to form a limit beam width to the right and left to limit the beam spot [D2. At this time, the optical splitting element 41 for shielding the beam spot and the flaw is mounted on the optical path (for example, the seam plate shielding the center line) Thereby, a scribe line which is vertically developed to a deeper position can be formed in the thickness direction of the substrate. Further, as shown in FIG. 4, a beam point which forms a non-irradiated portion which is not irradiated with the laser beam on the scribe line is described in the following. Patent Document 3. This 21 200936289 beam point system is formed by irradiating a laser beam and a refrigerant jet in the direction of the thickness of the brittle I·material substrate when the vertical crack progresses, preventing the internal compressive force field from being formed below the scribe line. So can A completely vertical crack is formed in the thickness direction of the brittle material substrate (refer to WO2006/038365). Fig. 5 is a schematic configuration diagram of a configuration of a five-way shutter 44. The shutter 44 is provided with a transmitted laser beam LC. The base 44a of the window 45 is provided with a shutter plate 441 formed of a light-shielding material (for example, a metal strip). The door panel 4 is composed of two flaps, and each of the flaps is driven by the door drive portion 55. The moving direction (X direction) in which the beam LC is scanned and the vertical direction (γ direction) are arbitrarily moved from the center of the window 45 by an arbitrary moving distance w〇, and can be adjusted to the opening width Wo (wherein the opening width w 〇 = w〇 * 2) Fig. 6 is a side view showing the positional relationship with the shutter 44 when the mother substrate a on which the coating film region c is formed is irradiated with the laser light. Fig. 7 is a plan view showing the positional relationship with the shutter 44 when the mother substrate A having the coating film region C is irradiated with the laser light. The opening width w of the shutter 44b adjusts the distance between the door panel 44b and the beam spot formed on the mother substrate A based on the shortest distance from the scribe line S to the film region C or the substrate edge c1. . 〇 For example, as shown in Fig. 6, the opening width Wo of the shutter plate 44b is adjusted so that one portion of the beam spot LD is not irradiated to the region of the coating film region c composed of the transparent conductive film formed on the mother substrate A. Thereby, the light beam dot on the mother substrate A is located on the predetermined line S of the scribe line, and the beam spot LD can be formed to limit the beam width. Further, 'in Fig. 6' is a simplification of the drawing, and only the door panel 44t> indicates the position of the shutter 44. 22 200936289 A description will be given below with reference to FIG. 1 and FIG. 2 that the movement of the laser scribing device LS1 firstly enters the size of the mother substrate A that is divided into a predetermined size, and the position at which the line is formed (ie, the planned line s). The crimping force of the scribing wheel 18 to the mother substrate A (line load). The position at which the scribe line is formed is set by one pair of cameras 2 〇 (21), and the alignment marks are attached to one of the mother substrates A, and the positioning of the slide table 2 and the pedestal 12 is performed based on image processing. The method of performing such positioning is a well-known technique, such as Japanese Patent No. 3078668, and the detailed description is omitted. Thereafter, the shortest distance from the predetermined line S to the coating film area C or the substrate edge M1 set in advance from the distance input unit 57 is input as the distance data. The distance data recording unit 59 records the distance data input to the distance data input unit 57, reads the distance data recorded in the distance data recording unit 59, and determines the limit beam spot width w to adjust the shutter plate 44b based on the read distance data. The opening width w〇. Further, the distance data recorded in the distance from the data recording unit 59 may be the shortest distance of each predetermined line S of the scribe lines, or may be the minimum shortest distance which can be obtained from the mother substrate of the cymbal. Then, the opening width Wo of the shutter 44b is set such that the long axis of the beam spot LD is superposed on the predetermined line s of the scribe line and as illustrated in FIGS. 6 and 7, one portion of the laser beam is not irradiated to the predetermined line s. The vicinity of the coating film area c. Thereafter, the mother substrate A is fixed to a predetermined position on the rotary table 12. Thereafter, in order to form the initial crack, the upper substrate moving adjustment mechanism 17 moves the mother substrate a in a state where the 23 200936289 :: wheel 18 is lowered, and the laser emitter 13 and the cooling nozzle 驱动 are driven after the initial formation of the substrate end. Then, the beam point of the laser beam is scanned along the scribe line pre-media nozzle to move the mother substrate A to cool and advance the scribe line. At this time, as shown in FIG. 7, the beam spot LC is a limiting beam point ld in a state in which the width of the scribe line s is restricted by the width of the gate line 44b of the line 14 (see FIG. 3, FIG. Therefore, the reflection or absorption of the 丌x heart-surface, r, and the cross-over film area C is affected by
1各預疋線S全體使熱分布左右對稱,故可形成直進良 好之劃線 R 又’圖8為說明沿形成於母基板a之基板端緣之 附近之劃線預定線S劃線之狀態之圖。 f線預疋線S位於母基板A之基板端緣M1之附近時, =圖不’光束點LC之—部(斜線部分)會照射至基板A之外 貝1。此時,照射將調整擋門板楊之開口寬度 =預定線S與基板端緣Μί之間隔dl與劃線預定線^ 匕覆膜區域C之間隔d2中較短者為甚進夕 準之左右對稱之限制 占寬度W (亦即dl或d2中較 光束點LD。 ……寬度)之限制 另外,於圖5中雖說明由2片擋門片構成之擋門料做 為播門構件之構成,γ日梦p彳错彳生# Ά1構件並不文限於此種構成,擋 之形狀、移動方向及片數為可變’可適用公知之 (實施形態2) 傅。 圖9為本發明之另一實施形態之雷射劃線裝置⑴之 24 200936289 枝略構成圖、目10為顯示圖9之雷射劃線裝置之控制 系先之構成之圖。關於與圖i、圖2相同之構成給予相同符 號並省略共通部分之說明。 雷射線羞置LS2係以上述之雷射劃線裝置LS 1為基 本構造’並具備心定於基板A q彳線默線s為拍攝區 域之中心亚沿劃線預定線S映出基板A之表面之攝影機 攝元機> 6 1係被機械臂24支撐為可自由位置移動。機 械臂2 4係受圖1 〇所千夕媒旦/她 Ο ❹ 厅不之攝衫機驅動部63控制。攝影機6 i 係對應於包覆膜之種類,從紅外線攝影機、光學攝影機(可 見光攝影機射線攝影機等利用最適者,以使形成於基 板A之包覆膜區域可抽出。 又方、田射劃線裝置LS2之控制部56具備基於由攝影 機拍攝之影像資訊辨識圖案’抽出從劃線預定線s至包 覆膜區域C或基板端緣M1之最短距離,為基於抽出之最短 距離決定劃線預定線之寬度方向之光束點擴張寬度而調整 擋門板44b之開口寬度w〇之擋門寬度控制部 以圖11說明擋門寬度控制部62之動作。 圖11 (a~gH系擷取部分使攝影機61沿一條劃線預定線 s掃猫時被拍攝之影像資訊之一連串影像。 各拍攝區域係以由於與劃線預定線s直交之方向延伸 之長邊、於與劃線預m S平行之方向延伸之短邊構成之 矩形區域構成’長邊之長度被設定為點寬度被限制前之光 束之點寬度’以攝影機之拍攝區域之中心,點0為攝影機之 中'“立置座標(χ0,γ。) ’設定攝影機61之行進線使Y軸重疊 25 200936289 ==線:广卜’在此基板…形-對-“ 及八對邊sxn垂直之方向設定有劃線預定線。 —Ιΐ二如圖"⑷所示,使攝影機61之拍攝區域之X :與被…與X軸平行之基板A之一邊重疊,並設 後點以使拍攝區域之中心點〇與劃線預定線之一 端So重璺。 ❹ _使攝影機61沿1條劃線預定線S行進並如圖n⑷所 =使其行進至攝影機61之㈣區域之Μ與被設定為與 由千仃之基板Α之另—邊Sxn重疊之拍攝結束點… 基於由此行進所得之影像以公知之手法圖案辨識劃線 ^線s左右之包覆膜,對劃線預定線s之左側與劃線預 =線S之右側分別算出從劃線預定線s至包覆膜之最短距 例如,异出至位於劃線預定線s之左側之包覆膜之最 =距離dL (圖11 (d))與至位於劃線預定線s之右側之包覆 :之最短距離dR (圖U (f))並使其做為距離資料記錄。之 :媒比較兩者求取最小值,基於此最小值決定由攝影機Η 〇 :攝之劃線預定線S之限制點寬度w。之後,被決定之限 點寬度w與事先輸入之雷射光束之形狀、尺寸 '從母基 反A至擋門44之距離資料被輸入關係式,算出擋門板44b :開口寬度W〇。藉此’可自動決定播門板桃之開口宽度 W〇後進行劃線。 在實施形態2雖係擒門寬度控制部以基於被拍攝之影 象=訊圖案辨識位於劃線預定線S之附近之包覆膜,再算 出從劃線預定線S至包覆膜之最短距離以決定擔門板_ 26 200936289 之開口寬度Wo,但即使為基板端緣而非包覆膜亦可同樣進 行。 在實施形態2雖係以基於由攝影機6 1拍攝之影像資气 圖案辨識,抽出從劃線預定線S至包覆膜區域c或基板端 緣Ml之最短距離,基於抽出之最短距離調整擋門板4讣之 開口寬度Wo之構成,但攝影機6 1之使用並不受限於上述。 例如實施形態1所記載,可預先設定之從劃線預定線s至(1) The entire heat transfer distribution of each of the pre-twisted lines S is bilaterally symmetrical, so that a straight line R can be formed. FIG. 8 is a view showing a state in which a line is drawn along a predetermined line S in the vicinity of the edge of the substrate formed on the mother substrate a. Picture. When the f-line pre-twisted line S is located in the vicinity of the substrate edge M1 of the mother substrate A, the portion (hatched portion) of the beam spot LC is irradiated to the outer surface of the substrate A. At this time, the irradiation will adjust the opening width of the door panel yang = the interval dl between the predetermined line S and the substrate edge Μί and the interval d2 between the predetermined line of the scribe line and the film area C. The shorter one is symmetrical. The limitation of the width W (that is, the DF or d2 is greater than the beam point LD. . . . width). In addition, in FIG. 5, the door material composed of two flaps is used as a door member. γ日日彳彳彳彳生# The Ά1 member is not limited to this configuration, and the shape, movement direction, and number of sheets of the stopper are variable' (known as the second embodiment). Fig. 9 is a perspective view showing a structure of a laser scribing apparatus (1) according to another embodiment of the present invention, and a structure of the control unit of the laser scribing apparatus of Fig. 9. The same components as those in Figs. 2 and 2 are denoted by the same reference numerals, and the description of the common portions will be omitted. The Ray ray shy LS2 is based on the above-described laser scribe line device LS 1 and has a center on the substrate A q 彳 line □ is the center of the photographic area. The surface camera camera > 6 1 is supported by the robot arm 24 so as to be freely movable. The mechanical arm 2 4 is controlled by the camera drive unit 63 of the 1 〇 千 她 她 她 她 她 她 她 。. The camera 6 i corresponds to the type of the coating film, and is suitable for use from an infrared camera or an optical camera (a visible light camera radio camera, etc., so that the coating film region formed on the substrate A can be extracted. The control unit 56 of the LS 2 includes the shortest distance from the predetermined line s to the coating film area C or the substrate edge M1 based on the image information identification pattern captured by the camera, and determines the predetermined line based on the shortest distance extracted. The door width control unit that adjusts the opening width w of the door panel 44b in the width direction is described in Fig. 11. Fig. 11 (a to gH is a portion for taking the camera 61 along the side One line of image information of one of the image information captured when the line is scanned. The respective shooting areas are extended in a direction parallel to the line pre-m S by a long side extending in a direction orthogonal to the predetermined line s. The rectangular area formed by the short side constitutes 'the length of the long side is set to the point width of the beam before the point width is limited' to the center of the shooting area of the camera, and point 0 is the camera '"Standing coordinates (χ0, γ.) 'Set the line of the camera 61 to make the Y-axis overlap 25 200936289 == Line: Guang Bu 'in this substrate... shape-to-" and eight pairs of sides sxn vertical direction set The line is planned to be lined. - As shown in Fig. 4, the X of the shooting area of the camera 61 is overlapped with one side of the substrate A which is parallel to the X axis, and the rear point is set so that the center of the shooting area is 〇 璺 之一 之一 之一 之一 之一 使 使 使 使 使 使 使 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The end point of the overlap of the side surface of the S S ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... ... The right side of the pre-line S is calculated from the predetermined line s of the scribe line to the shortest distance of the coating film, for example, the most = distance dL of the coating film on the left side of the predetermined line s of the scribe line (Fig. 11 (d)) And the shortest distance dR (Fig. U (f)) to the right side of the predetermined line s of the scribe line and make it as the distance data record. The medium compares the two to obtain a minimum value, and based on the minimum value, determines the limit point width w of the predetermined line S of the photographed line. After that, the determined limit point width w and the shape of the previously input laser beam are input. The distance data from the base base anti-A to the shutter 44 is input into the relational expression, and the door panel 44b is opened: the opening width W〇. By this, the opening width W of the door panel peach can be automatically determined and then scribed. In the second embodiment, the trick width control unit recognizes the coating film located in the vicinity of the predetermined line S based on the image to be imaged, and calculates the shortest distance from the predetermined line S to the coating film. The opening width Wo of the door panel _ 26 200936289 is determined, but the same can be done even if the edge of the substrate is not the coating film. In the second embodiment, the shortest distance from the predetermined line S to the coating film region c or the edge of the substrate M1 is extracted based on the image resource pattern recognition by the camera 61, and the shutter is adjusted based on the shortest distance of the extraction. The configuration of the opening width Wo of 4 inches, but the use of the camera 61 is not limited to the above. For example, as described in the first embodiment, it is possible to preset from the predetermined line s to
❹ 匕覆膜區域C或基板端緣Ml之最短距離做為距離資料被輪 入,基於記錄此等之距離資料與基於由攝影機6丨拍攝之影 像資訊圖案辨識所得之距離資料兩者調整擋門板4外之開 σ寬度Wo。 # 又,在實施形態2雖係雷射劃線裝置LS2具備拍攝各 附加於母基板A之一對對準標記以求取母基板A上之各劃 線之形成位置之-對CCD攝影機2G (2 i)、沿劃線預定線_s 於線全體拍攝以調整擋門板44b之開口寬纟w〇之攝影機 61之構成,但亦可以丨機或2機之攝影機兼用上述 區域。 (實施形態3)The shortest distance between the 匕 匕 film area C or the substrate edge M1 is taken as the distance data, and the door panel is adjusted based on the distance data recorded and the distance information based on the image information pattern captured by the camera 6 调整4 outside opening σ width Wo. Further, in the second embodiment, the laser scribing device LS2 includes a pair of CCD cameras 2G for photographing each of the alignment marks attached to the mother substrate A to obtain the positions of the respective scribe lines on the mother substrate A ( 2 i) A configuration of the camera 61 that adjusts the opening width of the shutter 44b along the predetermined line _s of the scribe line. However, the above-mentioned area may be used for both the camera or the camera of the two machines. (Embodiment 3)
面積施形$ 1〜2雖係在雷射劃線裝置側安裝照射 之執使雷射照射後以劃線預定線為中心之基板A 昭^ 4左右對稱,而在本實施形態係於基板A側安裝 …、身ί面積調智:丰@ 基板a ’以5周玉為雷射照射後夹劃、線預定線之 之…、分布為左右對稱。 圖U為說明本發明之於基板A側安裝照射面積調整手 27 200936289 段以進行之劃線方法之圖。在此例中,於 之成為單位顯示基板u之區域 (母基板) LA形成有包覆膜區域C。 二’預先形成暫置包覆膜71以使劃線預定線S與包覆 膜s ’C之端緣C1之間隔dl與劃線預定線s與暫置包覆 膜71之間隔D (以下稱為「暫f白考 I置^覆膜間隔」)為等距離。 ◎ 在從此母基板A切出單位顯示基板U時,將母基板A 設定於雷射劃線裝置(例如已以i說明之雷射劃線裝置 LSD’照射雷射光。此時之光束點LE只要以劃線預定線s 為中心使其為左右對稱之形狀即可。亦即,光束點LE之一 部在包覆膜區域C被反射時,由於在暫置包覆膜71側亦同 樣被反射,故可使其為以劃線預定線s為中心左右對稱之 熱分布。 圖13係顯示被形成圖案之暫置包覆膜之一例。C1、 C2、C3 ' C4為包覆膜區域’ 72 ' 73、74、75為對應於此等 包覆膜區域之暫置包覆膜。說明之方便上,包覆膜區域雖 以各種形狀顯示,但可為相同形狀、簡單形狀等。 各暫置包覆膜間隔係等於劃線預定線s與各包覆臈區 ❹ 域之端緣之間隔。又,暫置包覆膜之形狀只要有反映到包 覆膜區域C之靠近劃線預定線s之周緣部分之形狀而以劃 線預定線S為軸呈對應即可。暫置包覆膜之寬度只要對應 於光束點LE之點寬度(橫寬)被設定在例如於圖1 2在橫越暫 置包覆膜71而與劃線預定線S相反側之區域76不會被照 射之範圍即可。 暫置包覆膜之形成可與包覆膜區域C之形成同時進The area shape $1 to 2 is symmetrical about the substrate A which is centered on the predetermined line after the laser irradiation is applied to the laser scribing device side, and is attached to the substrate A in this embodiment. Side installation..., body area adjustment wisdom: Feng @ substrate a '5 weeks of jade for laser irradiation, the line is lined with ..., the distribution is bilaterally symmetrical. Fig. U is a view for explaining a method of scribing the irradiation area adjustment hand 27 200936289 on the substrate A side of the present invention. In this example, a coating film region C is formed in a region (mother substrate) LA which is a unit display substrate u. Second, the temporary coating film 71 is formed in advance so that the interval d between the predetermined line S of the scribe line and the edge C1 of the coating film s 'C and the interval D between the predetermined line s of the scribe line and the temporary coating film 71 (hereinafter referred to as It is equidistant for "temporary f white test I set ^ film interval"). ◎ When the unit display substrate U is cut out from the mother substrate A, the mother substrate A is set to a laser scribing device (for example, the laser scribing device LSD' described in i emits laser light. The shape of the predetermined line s is symmetrical with respect to the left and right sides. That is, when one portion of the beam spot LE is reflected in the coating film region C, it is also reflected on the side of the temporary coating film 71. Therefore, it can be made to be a heat distribution centered on the predetermined line s of the scribe line. Fig. 13 is a view showing an example of a temporary coating film which is patterned. C1, C2, C3 'C4 is a coating film area' 72 '73, 74, and 75 are temporary coating films corresponding to the coating film regions. For convenience of description, the coating film regions are displayed in various shapes, but may be the same shape, simple shape, etc. The coating film spacing is equal to the spacing between the predetermined line s of the scribe line and the edge of each of the cladding regions. Further, the shape of the temporary coating film is reflected as close to the predetermined line s of the coating film region C. The shape of the peripheral portion may correspond to the line S of the scribe line as the axis. The width of the temporary coating film The dot width (width) corresponding to the beam spot LE is set to, for example, a range in which the region 76 on the side opposite to the predetermined line S of the scribe line is not irradiated on the side of the temporary coating film 71 across the temporary coating film 71. The formation of the temporary coating film can be simultaneously formed with the formation of the coating film region C
2S 200936289 行’、亦可對已形成包覆膜區域c之基板進行,或在包覆膜 區域C形成以前對該基板進行。 在形成以與包覆膜區域c相同材料之透明導電膜構成 之暫置包覆膜7丨時,只要在形成包覆膜區域c時同時圖案 形成暫置包覆膜71即可,故可使製造過程簡化。 【實施例] 以下說明關於本發明之實施形態之具體例。 ® (實驗1) 對形成有透明導電膜(IT0膜)之玻璃基板使用本發明 之雷射劃線裝置LS1調整擋門之開口寬度Wo,比較其結 果。實驗條件如下。 基板規格:材質為無驗玻璃’厚度為〇 5 mm 光束點形狀:擴圓 劃線速度· 200 mm/sec ❹ 擋門:遮光時開口寬度wo為0.4mm (限制光束點寬度 為0.4 mm)’配置高度(離玻璃面之高度)為3 mm (實驗2) 對形成有透明導電膜(IT0則之玻璃夾劃、線預定線於 、%之位置比較有形成本發明之暫置包覆膜之基板與無形 成之基板。實驗條件如下。 、’“、^ 基板規格:材質為無鹼玻璃,厚度為〇,5 m瓜 光束點形狀:橢圓 里!J線速度.200 mm/sec 29 200936289 暫置包覆膜.材質為反射紹帶 稱照 整理此等實驗結果如下。於任〜 射而使劃線之位置偏移大幅減少, 狀況皆因使光束點對 劃線之直進性提高。 [表1]The 2S 200936289 row' may be performed on the substrate on which the coating film region c has been formed, or before the coating film region C is formed. When the temporary coating film 7 is formed of a transparent conductive film of the same material as the coating film region c, the temporary coating film 71 may be formed at the same time when the coating film region c is formed. The manufacturing process is simplified. [Examples] Specific examples of the embodiments of the present invention will be described below. ® (Experiment 1) The opening width Wo of the shutter was adjusted using the laser scribing device LS1 of the present invention on the glass substrate on which the transparent conductive film (IT0 film) was formed, and the results were compared. The experimental conditions are as follows. Substrate size: material is non-test glass 'thickness 〇 5 mm beam spot shape: rounding line speed · 200 mm / sec 挡 door: opening width wo is 0.4mm (limited beam point width is 0.4 mm)' The height of the arrangement (the height from the glass surface) is 3 mm (Experiment 2) The substrate on which the transparent coating film is formed (the glass of IT0 is drawn, the predetermined line of the line is at %, and the temporary coating film of the present invention is formed) The substrate is not formed. The experimental conditions are as follows: , '', ^ Substrate specifications: the material is alkali-free glass, the thickness is 〇, 5 m melon beam spot shape: ellipse! J line speed. 200 mm/sec 29 200936289 The coating film. The material is the reflection of the belt. The results of the experiment are as follows. The positional deviation of the scribe line is greatly reduced in any of the shots, and the condition is improved by the straightness of the beam point to the scribe line. [Table 1 ]
位置偏移量 (有遮光) 〇 另外,在上述實施形態丨〜2雖 你使用橢圓形狀之光束 點,但本發明中光束點之形狀 馬對劃線預定線之左右 方向為對稱之形狀並未特別受限。 又’雖使用玻璃基板做為劃線之 勹咪之加工對象,但加工對 象並未受限於玻璃基板。 〇 本發明之雷射劃線方法及雷射劃線裳置可使適用於玻 璃、燒結材料之陶竟、單結晶矽、半導體晶圓、陶究基板' 藍寶石基板'使玻璃基板彼此貼合之液晶顯示基板:透過 型液晶顯示基板、有機EL元件基板' PDp基板、使玻璃基 板與矽基板貼合之反射形液晶顯示基板等之劃線形成。 【圖式簡單說明】 圖1為本發明之一實施形態之雷射劃線裝置之概略構 成圖。 30 200936289 圖2為顯示圖丨之雷射劃線裝置之控制系統之構成之 圖。 圖3為說明形成光束點之光學保持具之圖。 圖4為說明形成光束點之光學保持具之另一例之圖。 圖5為說明擋門之構成之概略構成圖。 圖6為說明於形成有包覆膜區域之玻璃基板照射雷射 光時之與擋門之位置關係之側面圖。 圖7為說明於形成有包覆膜區域之玻璃基板照射雷射 ❾光時之與擋門之位置關係之平面圖。 圖8為說明沿形成於玻璃基板之基板端緣附近之劃線 預定線劃線之狀況之圖。 圖9為本發明之另一實施形態之雷射劃線裝置之概略 構成圖。 圖10為!貝* ffil 9之雷射畫j線裝£之控弟j系統之構成之 圖。 ,圖U為顯示於本發明之再另-實施形態之雷射劃線裝 ©置沿1條劃線預定線s拍攝之連續影像之圖。 為°兒明本發明之另一實施形態之雷射劃線方法之 圖。 81 為”、、員不包覆棋區域與被形成圖案之暫置包覆膜之 一例之圖。 圖14為顧未η _ Λ ’’ ι知技術在包覆膜區域形成於劃線預定 線之附近之母·其& !_、,,1 土 上、/D劃線預定線掃描光束點時被形成之 劃線之示意圖。 31 200936289 圖1 5為顯示以習知技術在於離基板之端緣Μ1距離為 極短之位置形成有劃線預定線及包覆膜區域之母基板上沿 劃線預定線掃描光束點時被形成之劃線之示意圖。 【主要元件符號說明】 2 滑動平台 12 旋轉平台 13 雷射發射器 14 光學保持具 16 冷卻喷嘴 18 劃線輪 41 光學分割元件 42、43 聚光透鏡 44 擋門 44b 擋門板 51 平台驅動部 52 雷射驅動部 53 噴嘴驅動部 54 切刀驅動部 55 擋門驅動部 56 控制部 57 輸入部 58 顯示部 59 距離資料記錄部Position shift amount (shading) 〇 In addition, in the above-described embodiments 丨 2, although an elliptical beam spot is used, the shape of the beam spot in the present invention is symmetrical with respect to the left-right direction of the predetermined line of the scribe line. Particularly limited. Further, although a glass substrate is used as a target for scribing, the processing object is not limited to the glass substrate. The laser scribing method and the laser scribing skirt of the present invention can be applied to ceramics, sintered materials, single crystal germanium, semiconductor wafers, ceramic substrate 'sapphire substrate' to make the glass substrates adhere to each other. The liquid crystal display substrate is formed by a scribe line of a transmissive liquid crystal display substrate, an organic EL element substrate 'PDp substrate, and a reflective liquid crystal display substrate in which a glass substrate and a ruthenium substrate are bonded together. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view showing a configuration of a laser scribing apparatus according to an embodiment of the present invention. 30 200936289 Figure 2 is a diagram showing the construction of a control system for the laser scribing device of Figure 。. Figure 3 is a diagram illustrating an optical holder forming a beam spot. Fig. 4 is a view showing another example of an optical holder for forming a beam spot. Fig. 5 is a schematic block diagram showing the configuration of a door. Fig. 6 is a side view showing the positional relationship with the shutter when the glass substrate on which the coating film region is formed is irradiated with the laser light. Fig. 7 is a plan view showing the positional relationship with the shutter when the glass substrate on which the coating film region is formed is irradiated with the laser beam. Fig. 8 is a view for explaining a state in which a scribe line is formed along a line near the edge of the substrate formed on the glass substrate. Fig. 9 is a view showing the schematic configuration of a laser scribing apparatus according to another embodiment of the present invention. Figure 10 is! Bei*ffil 9 laser painting j line installed the control of the brother j system. Figure U is a diagram showing a continuous image taken along a predetermined line s of a line as shown in still another embodiment of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS A diagram of a laser scribing method according to another embodiment of the present invention. 81 is a diagram of a case where the member does not cover the chess area and the patterned temporary coating film. Fig. 14 shows that the technique is formed in the coating film area on the line of the scribe line. The vicinity of the mother · its & !_,,, 1 map on the soil, / D line to the line to be formed when scanning the beam point. 31 200936289 Figure 1 5 shows the conventional technology lies in the substrate A schematic diagram of a line formed by scanning a beam spot along a predetermined line of a scribe line on a mother substrate on which a predetermined line is formed at a position where the edge Μ1 is extremely short. [Main element symbol description] 2 Sliding platform 12 Rotary platform 13 Laser emitter 14 Optical holder 16 Cooling nozzle 18 Scribing wheel 41 Optical dividing element 42, 43 Condenser lens 44 Door 44b Door panel 51 Platform drive unit 52 Laser drive unit 53 Nozzle drive unit 54 Knife drive unit 55 door drive unit 56 control unit 57 input unit 58 display unit 59 distance data recording unit
32 20093628932 200936289
61 攝影機 62 擋門寬度控制部 71 〜75 暫置包覆膜 A 玻璃基板(母基板) C 包覆膜區域 D 暫置包覆膜間隔 LD 限制光束點 Wo 開口寬度 W 限制光束點寬度61 Camera 62 Door width control unit 71 to 75 Temporary cover film A Glass substrate (mother substrate) C Cover film area D Temporary film gap LD Limit beam spot Wo Opening width W Limit beam spot width
3333
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| JP (1) | JP5171838B2 (en) |
| KR (1) | KR101211021B1 (en) |
| CN (1) | CN101821071B (en) |
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| JP5444158B2 (en) * | 2010-08-02 | 2014-03-19 | 三星ダイヤモンド工業株式会社 | Cleaving method of brittle material substrate |
| US9266192B2 (en) | 2012-05-29 | 2016-02-23 | Electro Scientific Industries, Inc. | Method and apparatus for processing workpieces |
| JP2014044987A (en) * | 2012-08-24 | 2014-03-13 | Fujitsu Semiconductor Ltd | Dicing method and dicing device |
| EP2781296B1 (en) | 2013-03-21 | 2020-10-21 | Corning Laser Technologies GmbH | Device and method for cutting out contours from flat substrates using a laser |
| JP6233407B2 (en) * | 2013-03-26 | 2017-11-22 | 旭硝子株式会社 | Glass plate processing method and glass plate processing apparatus |
| KR102081286B1 (en) | 2013-04-16 | 2020-04-16 | 삼성디스플레이 주식회사 | Laser induced thermal imaging apparatus, method of laser induced thermal imaging, and manufacturing method of organic light emitting display apparatus using the same |
| EP3848334A1 (en) | 2015-03-24 | 2021-07-14 | Corning Incorporated | Alkaline earth boro-aluminosilicate glass article with laser cut edge |
| KR102427574B1 (en) * | 2016-01-22 | 2022-07-29 | 주식회사 포스코 | Method and apparatus for refining magnetic domains grain-oriented electrical steel |
| CN109803786B (en) * | 2016-09-30 | 2021-05-07 | 康宁股份有限公司 | Apparatus and method for laser processing of transparent workpieces using a non-axisymmetric beam spot |
| CN107132659B (en) * | 2017-06-29 | 2020-02-21 | 联想(北京)有限公司 | Laser beam layer generation method and device |
| JP7138297B2 (en) * | 2018-03-26 | 2022-09-16 | パナソニックIpマネジメント株式会社 | Element chip manufacturing method |
| TWI681241B (en) * | 2018-12-04 | 2020-01-01 | 友達光電股份有限公司 | Manufacturing method for display device and display device utilized thereof |
| TW202035321A (en) * | 2019-01-29 | 2020-10-01 | 美商康寧公司 | Methods and apparatus for free-form cutting of flexible thin glass |
| CN112008232A (en) * | 2020-08-11 | 2020-12-01 | 华东师范大学 | Method and device for preparing periodic stripe structure on surface of glass coated with ITO film |
| CN115709338A (en) * | 2021-08-23 | 2023-02-24 | 广东聚华印刷显示技术有限公司 | Laser scanning platform and method for laser stripping substrate |
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| US6327875B1 (en) * | 1999-03-09 | 2001-12-11 | Corning Incorporated | Control of median crack depth in laser scoring |
| KR100794284B1 (en) * | 2001-09-29 | 2008-01-11 | 삼성전자주식회사 | How to cut a nonmetal substrate |
| JP4397229B2 (en) * | 2003-12-25 | 2010-01-13 | 株式会社ブイ・テクノロジー | Laser processing equipment |
| RU2354616C2 (en) * | 2004-10-01 | 2009-05-10 | Мицубоси Даймонд Индастриал Ко., Лтд. | Method for scribing of brittle material and device for scribing |
| JP2006143506A (en) * | 2004-11-18 | 2006-06-08 | Sanyo Electric Co Ltd | Method for cutting glass substrate |
| JP2008031021A (en) * | 2006-07-31 | 2008-02-14 | Optrex Corp | Method of cutting substrate |
| JP2008044823A (en) * | 2006-08-18 | 2008-02-28 | Seiko Epson Corp | Substrate cutting method, electro-optical device manufacturing method, and laser scribing device |
| JP2008168328A (en) * | 2007-01-15 | 2008-07-24 | Seiko Epson Corp | Laser scribing apparatus, substrate cutting method, and electro-optical device manufacturing method |
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| JP5171838B2 (en) | 2013-03-27 |
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| JPWO2009047990A1 (en) | 2011-02-17 |
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