TW200920867A - Magnetron sputter cathode mechanism - Google Patents
Magnetron sputter cathode mechanism Download PDFInfo
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- TW200920867A TW200920867A TW096143292A TW96143292A TW200920867A TW 200920867 A TW200920867 A TW 200920867A TW 096143292 A TW096143292 A TW 096143292A TW 96143292 A TW96143292 A TW 96143292A TW 200920867 A TW200920867 A TW 200920867A
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- target
- backing plate
- cathode
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- magnetic
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- 230000007246 mechanism Effects 0.000 title claims abstract description 58
- 239000000463 material Substances 0.000 claims description 36
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 34
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- 229910045601 alloy Inorganic materials 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims description 3
- 229910052742 iron Inorganic materials 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 238000007747 plating Methods 0.000 claims description 2
- -1 australis Chemical compound 0.000 claims 1
- 239000004575 stone Substances 0.000 claims 1
- 239000000696 magnetic material Substances 0.000 abstract 4
- 238000000034 method Methods 0.000 description 12
- 230000008878 coupling Effects 0.000 description 11
- 238000010168 coupling process Methods 0.000 description 11
- 238000005859 coupling reaction Methods 0.000 description 11
- 150000002500 ions Chemical class 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 238000013461 design Methods 0.000 description 6
- 238000004544 sputter deposition Methods 0.000 description 5
- 238000009826 distribution Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 238000009434 installation Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 230000009172 bursting Effects 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000013077 target material Substances 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 206010033799 Paralysis Diseases 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- 230000003670 easy-to-clean Effects 0.000 description 1
- 230000005288 electromagnetic effect Effects 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
364PA 200920867 九、發明說明: 【發明所屬之技術領域】 本發明是有關於一種濺鍍裝置,且特別是有關於一種 利用導磁零件結合靶材及背板且提高磁場接近於靶材之 轟擊面的磁控濺鍍陰極機構。 【先前技術】 在機械工業、電子工業或半導體工業領域,為了對所 C; 使用的材料賦與某種特性在材料表面上以各種方法形成 被膜(一層薄膜)而加以使用。藏鑛法是目前最流行的方 法之一,可應用於裝飾品、餐具、刀具、工具、模具、半 導體元件等之表面處理,泛指在各種金屬材料、超硬合 金、陶曼材料及晶圓基板的表面上,成長一層同質或異質 材料薄膜的製程,以期獲得美觀、耐磨、耐熱、耐蝕等特 性。 磁控藏鍵設備(Magnetron Sputter Apparatus)是一種 I 實現濺鍍法薄膜製程的設備,可適用於電機、機械、電子、 光學、材料等研究領域,磁控濺鍍設備其基本原理乃根據 離子減:射原理,當由電場加速的正離子衝擊到乾材表面, 靶材轟擊面的原子和分子在與這些高能正離子交換動能 後,就從靶材轟擊面飛出來,此現象稱之為「濺射」。 磁控歲鑛設備利用電場使兩電極間產生電子7這些加 速電子會與鍍膜室中已預先充入的惰性氣體(如氬氣)碰 撞,使其帶正電,這些帶正電的離子會受磁控陰極機構中364PA 200920867 IX. INSTRUCTIONS: [Technical Field] The present invention relates to a sputtering apparatus, and more particularly to a bonding surface using a magnetically permeable part to combine a target and a backing plate and to increase the magnetic field close to the target Magnetron sputtering cathode mechanism. [Prior Art] In the field of the mechanical industry, the electronics industry, or the semiconductor industry, a film (a film) is formed on the surface of a material by various methods in order to impart a certain property to the material used. The mining method is one of the most popular methods at present. It can be applied to the surface treatment of decorations, tableware, knives, tools, molds, semiconductor components, etc., and refers to various metal materials, superhard alloys, Tauman materials and wafers. On the surface of the substrate, a process of growing a film of homogenous or heterogeneous material is obtained in order to obtain characteristics such as appearance, abrasion resistance, heat resistance and corrosion resistance. The Magnetron Sputter Apparatus is a device for implementing the sputtering process. It can be applied to the research fields of motors, machinery, electronics, optics, materials, etc. The basic principle of magnetron sputtering equipment is based on ion reduction. : The principle of radiation, when the positive ions accelerated by the electric field impinge on the surface of the dry material, the atoms and molecules of the target bombardment surface fly out of the target bombardment surface after exchanging kinetic energy with these high-energy positive ions. This phenomenon is called " Sputtering." The magnetron ageing equipment uses an electric field to generate electrons between the two electrodes. These accelerating electrons collide with the pre-charged inert gas (such as argon) in the coating chamber to positively charge them. These positively charged ions are subject to Magnetron cathode mechanism
64PA 200920867 的陰極吸引而撞擊靶材轟擊面的原子,這些原子受到正離 子的碰撞得到入射離子的動量轉移,使靶材轟擊面下原子 造成壓擠而發生移位,此靶材轟擊面下多層原子的擠壓, 會產生垂直靶材轟擊面的作用力而把轟擊面原子碰撞出 去’這些被職出去的原子(㈣尚可將巾性1原子碰撞 成帶正電),最後終於沉積在基板(陽極)上形成薄膜。 在磁控濺鍍設備内加入一組磁鐵,藉著磁場與電場間電磁 效應所產生的電磁力,會影響電子的移動,若磁場方向與 電場方向垂直,電子將以螺旋式運動使運動距離加長,所 以電子與氣體碰撞次數將會❹,使惰性氣體碰撞成帶正 電離子的機率提尚,因此增加薄膜沉積效率。 在傳統之磁控賤錢陰極機構中,通常以背板黏接 —邮)機構或夾具(clamp)夹持機構將靶材固定於 二背板黏接機構而言,即是將靶材透過黏接物質 脸θ板上’至於夾具夾持機構如何固定乾材於背板 上’將附圖說明如下。 ί 極機ia〜ib圖’其分騎示傳狀磁控雜陰 乾材12、至少一 jss: 7Z 1及至少一夾具15,且夹旦丨 ^ x _ 尺八 肘乾材12夹住於背板u 上,使靶材12之轟擊面背向背板u,夹具15可 :置立用螺絲固定於背板U或陰極上:磁石14 〇又置於者板11之背面,用以提供磁場。 然而’上述傳統之磁控缝陰極機構所採用之背板黏 橫向剖面圖。如第ia〜ib圖所示,磁 控濺錢陰極機構包括一背板11The cathode of 64PA 200920867 attracts and hits the atom of the bombardment surface of the target. These atoms are subjected to the collision of positive ions to obtain the momentum transfer of the incident ions, causing the target to bombard the atom under the bombardment and shifting. The target is bombarded under the surface. The extrusion of the atom will produce the force of the vertical target bombardment surface and collide the bombardment surface atoms. These atoms (the (4) can also collide into a positive charge) and finally deposit on the substrate. A film is formed on the (anode). Adding a set of magnets in the magnetron sputtering device, the electromagnetic force generated by the electromagnetic effect between the magnetic field and the electric field will affect the movement of the electron. If the direction of the magnetic field is perpendicular to the direction of the electric field, the electron will be lengthened by the spiral motion. Therefore, the number of electrons and gas collisions will be paralyzed, and the probability of the inert gas colliding into positively charged ions is increased, thereby increasing the film deposition efficiency. In the conventional magnetron control cathode mechanism, usually the back plate bonding-mail mechanism or the clamp clamping mechanism fixes the target to the second back plate bonding mechanism, that is, the target is viscous. The material face θ plate is 'as for how the clamp clamping mechanism fixes the dry material on the back plate'. The drawings are explained below. ί 机机 ia~ib diagram 'its sub-riding magnetic control miscellaneous dry material 12, at least one jss: 7Z 1 and at least one fixture 15, and the 丨 丨 ^ x _ 尺 eight cubits dry material 12 clipped on the back On the board u, the bombardment surface of the target 12 is turned back to the back plate u, and the clamp 15 can be fixed to the back plate U or the cathode by screws: the magnet 14 is placed on the back of the plate 11 to provide a magnetic field. However, the above-mentioned conventional magnetically controlled slit cathode mechanism employs a back-plate adhesive cross-sectional view. As shown in the figure ia~ib, the magnetically controlled splash cathode mechanism includes a back plate 11
364PA 200920867 接機構或夾具夹持機構具有下列缺點: L背板黏接機構在更換乾材時,必 背板從陰極拆下,再安裝另—塊 ㈣^餘乾材之 陰極上,相安b作㈣且複雜。•材之背板於 2. 背板黏接機構必須經常更換陰極上 因為安裝瑕疲而造成真空腔體或 θ反’因此 高,且每次更換背板後都必須執行測漏;^;:機率會提364PA 200920867 The mechanism or fixture clamping mechanism has the following disadvantages: When the L back plate bonding mechanism replaces the dry material, the back plate must be removed from the cathode, and then the other block (4) ^ the dry material of the cathode is installed. (d) and complicated. • The back plate of the material is used in 2. The backing plate bonding mechanism must be replaced frequently. The vacuum cavity or θ is reversed because of the fatigue of the installation, and the leak must be performed after each replacement of the backing plate; ^; Probability
3. 背板黏接機構必須利用黏接靶材之# 先將殘餘靶材從背板上脫離(⑽:製程 接(B〇nding)在空的背板p 再將新乾枓點 产二!板_構必須準備較多之背板,除了安裝於 二二須準備用以黏接製錄材之背板,因 之 (如以陶㈣機構巾,如果夾騎料與㈣相同 、 是材料為靶材之製程),則常會增加夾具製作 成本及日後清潔保養之困難。 6,在夹具夾持機構中,如果夾具材料為製 低及容易凊潔保養之铭或不鏽鋼金屬材料,則失具 出會 >可染沉積之薄膜。 仇一7· ^爽具夾持機構中,因為顧慮失具被轟擊出會污 =二積之薄祺,陰極及磁場設計時必須使靶材被轟擊區域 ώ離夾/、所以靶材之轟擊區域變窄,因此會降低鍍膜速 率同時縮小基被之尺寸。 — 8.在爽具夾持機構中,因為靶材之轟擊區域變窄,3. The backing plate bonding mechanism must use the bonding target # first to remove the residual target from the backing plate ((10): process connection (B〇nding) in the empty backing plate p and then the new dry point to produce two! The plate structure must be prepared with more back plates, except that it is installed on the back plate that must be prepared for bonding the recording materials. For example, if the ceramic (four) mechanism towel is used, if the clamp material is the same as (4), the material is The process of the target) often increases the cost of the fixture and the difficulty of cleaning and maintenance in the future. 6. In the fixture clamping mechanism, if the fixture material is low-cut and easy to clean and maintain the metal or stainless steel metal material, it will be out of the way. Will > dyeable deposition film. Qiuyi 7· ^ cool in the clamping mechanism, because of the concern of the lost shell is bombarded with pollution = two thin, the cathode and magnetic field design must make the target bombarded areaώ Off-clamping/, so the bombardment area of the target is narrowed, thus reducing the coating rate and reducing the size of the base. - 8. In the cool-clamping mechanism, because the bombardment area of the target is narrowed,
J64PA 200920867 所以會降低乾材使用率。 9. 在夾具夾持機構中,一般以螺絲將爽具固定於背 板或陰極,固定螺絲之鬆緊不易均勻控制,如果固定螺絲 太緊靶材可能會因受熱膨脹而破碎;太鬆則會造成靶材與 背板接觸不良,因此祀材上的熱無法傳導至冷卻背板。 10, 在背板黏接機構或夹具夾持機構中,磁石位在背 板下方’所以靶材上方之磁場分布不佳且磁場較弱,不易 控制電子有效地撞擊惰性氣體。J64PA 200920867 will therefore reduce dry material usage. 9. In the clamp clamping mechanism, the cooling device is generally fixed to the back plate or the cathode by screws, and the fixing screw is not easy to be evenly controlled. If the fixing screw is too tight, the target may be broken due to thermal expansion; too loose will cause The target is in poor contact with the backing plate, so the heat on the coffin cannot be conducted to the cooling backing plate. 10. In the backing plate bonding mechanism or the clamp clamping mechanism, the magnet is located below the backing plate. Therefore, the magnetic field distribution above the target is poor and the magnetic field is weak, and it is difficult to control the electrons to effectively impinge on the inert gas.
【發明内容】 本發明係有關於一種磁控濺鍍陰極機構,其將乾材加 工,使配合之導磁零件之-端固定於乾材。在㈣相對磁 控陰極上之磁石區域加工凹槽,使導磁零件 〜为一端可插 入月板上的凹槽而被磁石所吸附,因而使靶材安穿於背板 上,因此,本發明之磁控濺鍍陰極機構之靶持安^比背板SUMMARY OF THE INVENTION The present invention is directed to a magnetron sputtering cathode mechanism that processes a dry material such that the end of the mating magnetically conductive component is fixed to the dry material. Processing the groove in the magnet region on the opposite magnetron cathode so that the magnetic conductive member is inserted into the groove on the moon plate and is adsorbed by the magnet, thereby allowing the target to be worn on the back plate. Therefore, the present invention The target of the magnetron sputtering sputtering cathode mechanism
黏接(Bonding)機構容易,成本較低,且不需使用爽具 (Clamp)夾持機構之設計,不需考慮夾具被正離子轟^ 之可能,所以’可設計增加乾材之轟擊面積,以提高錢膜 速率及增加靶材使用率,又,在靶材與背板之間之導=零 件已經將磁場提高接近靶材之轟擊面,所以可改盖磁妒¥ 分佈及強度。 每之" 根據本發明,提出一種磁控濺鍍陰極機構,包括一背 板、一靶材、至少一導磁零件及至少一磁石。背板 對之-第-面及m —面具有至少—定位;槽,The bonding mechanism is easy, the cost is low, and the design of the Clamp clamping mechanism is not required. It is not necessary to consider the possibility that the clamp is positively bombarded, so the design can increase the bombardment area of the dry material. In order to increase the rate of the money film and increase the target utilization rate, in addition, the guide between the target and the back plate = the part has increased the magnetic field close to the bombardment surface of the target, so the magnetic distribution and intensity can be changed. According to the present invention, a magnetron sputtering cathode mechanism is provided comprising a backing plate, a target, at least one magnetically conductive component, and at least one magnet. The backing plate has at least - positioning of the - face and m - face;
364PA 200920867 且靶材具有相對之一轟擊面及一非轟擊面,非轟擊面具有 至少一結合凹槽,導磁零件設置於背板及靶材之間,並具 有一結合部及一定位部,而結合部容置於靶材之結合凹槽 内,且定位部容置於背板之定位凹槽内,磁石設置於背板 之第二面,且導磁零件對應吸附於磁石,以供靶材之非轟 擊面固定於背板之第一面。 為讓本發明之上述内容能更明顯易懂,下文特舉一較 佳實施例,並配合所附圖式,作詳細說明如下: 【實施方式】 第一實施例 請同時參照第2A〜2B圖,其分別繪示依照本發明之 第一實施例之磁控濺鍍陰極機構的俯視圖及橫向剖面 圖。如第2A〜2B圖所示,磁控濺鍍陰極機構20係可設置 於一磁控濺鍍設備中,並包括一背板21、一靶材22、至 少一導磁零件23及至少一磁石24,背板21具有相對之一 第一面21a及一第二面21b,第一面21a具有至少一定位 凹槽25,且靶材22異於背板21之一面形成為一轟擊面 22a,另面形成為一非轟擊面22b,非轟擊面22b具有至少 一結合凹槽26,且乾材22為可被磁控錢鏡之任何把材。 如第2B圖所示,導磁零件23設置於背板21及靶材 22之間,並具有一結合部23a及一定位部23b,請參照第 2C圖,其繪示第2A圖之背板的仰視圖,如第2C圖所示, 背板21之定位凹槽25設成一條環繞第一面21a邊緣的封 10364PA 200920867 and the target has a relatively one bombardment surface and a non-bursting surface, the non-bombardment surface has at least one coupling groove, the magnetic conductive component is disposed between the back plate and the target material, and has a joint portion and a positioning portion. The joint portion is placed in the joint groove of the target, and the positioning portion is received in the positioning groove of the back plate, the magnet is disposed on the second surface of the back plate, and the magnetic conductive component is correspondingly adsorbed to the magnet for the target The non-bursting surface of the material is fixed to the first side of the backboard. In order to make the above description of the present invention more comprehensible, a preferred embodiment will be described below with reference to the accompanying drawings, and the following detailed description will be made as follows: [Embodiment] Referring to the first embodiment, please refer to the drawings 2A-2B at the same time. The top view and the transverse cross-sectional view of the magnetron sputtering cathode mechanism according to the first embodiment of the present invention are respectively shown. As shown in FIGS. 2A-2B, the magnetron sputtering cathode mechanism 20 can be disposed in a magnetron sputtering apparatus and includes a backing plate 21, a target 22, at least one magnetic conductive component 23, and at least one magnet. 24, the back plate 21 has a first surface 21a and a second surface 21b. The first surface 21a has at least one positioning groove 25, and the target 22 is formed as a bombardment surface 22a different from the surface of the back plate 21. The other surface is formed as a non-bombarding surface 22b, the non-bombarding surface 22b has at least one coupling groove 26, and the dry material 22 is any material that can be magnetized by a money mirror. As shown in FIG. 2B, the magnetic conductive component 23 is disposed between the back plate 21 and the target 22, and has a joint portion 23a and a positioning portion 23b. Referring to FIG. 2C, the back plate of FIG. 2A is illustrated. The bottom view, as shown in Fig. 2C, the positioning groove 25 of the back plate 21 is provided as a seal 10 around the edge of the first face 21a.
364PA 200920867 閉環形凹槽,以及一中央區域的長條形凹槽,且相對背板 21之第二面21b設有一條環繞第二面21b邊緣的封閉環形 之磁石,及於第二面21b之中央區域呈長條形之磁石,且 導磁零件23之結合部23a及定位部23b分別插入於靶材 22之結合凹槽26及背板21之定位凹槽25,以供靶材22 定位於背板21,且磁石24以磁力吸附導磁零件23,使靶 材22藉由導磁零件23穩定地與背板21結合。 請同時參閱第2C及2D圖,其中第2D圖為繪示第 2B圖之靶材的剖面圖。靶材22為對應背板21之封閉環形 定位凹槽25,及中央的長條形定位凹槽25,而於靶材22 之結合凹槽26形成封閉環狀結構以及中央處為長條形結 構,且結合凹槽26斷面形成T形狀,而於寬部形成一寬 凹槽26a,垂直位置形成一窄凹槽26b。 另外,導磁零件23係為可為鐵、鈷、鎳或其合金等 導磁材料或為磁石,且導磁零件23如圖面所不為一 T字 形結構,以供導磁零件23 —段形成較寬的結合部23a,另 段形成為較窄之定位部23b,以供結合部23a套設於靶材 22的寬凹槽26a,且定位部23b則插合於背板21之窄凹 槽25b内,並與磁石24所吸附,而將背板21與靶材22 相互結合固定。 如第2B所示,由於本實施例之導磁零件23設置於背 板21及靶材22之間,將不會佔用靶材22之轟擊面22a, 因此如第2A圖所示,靶材22之轟擊區域22c的範圍遠大 於如第1A圖的傳統靶材12的轟擊區域12c,因此,可以 11364PA 200920867 a closed-loop groove, and a long-shaped groove of a central portion, and a second annular surface 21b of the back plate 21 is provided with a closed annular magnet surrounding the edge of the second surface 21b, and the second surface 21b The central portion is a strip-shaped magnet, and the joint portion 23a and the positioning portion 23b of the magnetic conductive member 23 are respectively inserted into the coupling groove 26 of the target 22 and the positioning groove 25 of the back plate 21 for the target 22 to be positioned. The backing plate 21, and the magnet 24 magnetically adsorbs the magnetic conductive member 23, so that the target 22 is stably coupled to the backing plate 21 by the magnetic conductive member 23. Please also refer to Figures 2C and 2D, where Figure 2D is a cross-sectional view of the target of Figure 2B. The target 22 is a closed annular positioning groove 25 corresponding to the back plate 21, and a central elongated positioning groove 25, and the coupling groove 26 of the target 22 forms a closed annular structure and an elongated structure at the center. And the groove 26 is formed into a T shape in section, and a wide groove 26a is formed in the wide portion, and a narrow groove 26b is formed in the vertical position. In addition, the magnetic conductive component 23 may be a magnetic conductive material such as iron, cobalt, nickel or an alloy thereof or a magnet, and the magnetic conductive component 23 is not a T-shaped structure as shown in the figure, for the magnetic conductive component 23 A wide joint portion 23a is formed, and the other portion is formed as a narrow positioning portion 23b for the joint portion 23a to be sleeved on the wide groove 26a of the target 22, and the positioning portion 23b is inserted into the narrow recess of the back plate 21. The groove 25b is adsorbed to the magnet 24, and the back plate 21 and the target 22 are bonded to each other. As shown in FIG. 2B, since the magnetic conductive component 23 of the present embodiment is disposed between the backing plate 21 and the target 22, the bombardment surface 22a of the target 22 will not be occupied, so as shown in FIG. 2A, the target 22 The range of the bombardment region 22c is much larger than the bombardment region 12c of the conventional target 12 as shown in FIG. 1A, and therefore, 11
564PA 200920867 提高磁控濺鍍設備之鍍膜速率,且同時增加磁控濺鍍設備 中位於陽極上之待鍍基板的尺寸。 但本發明之技術不限於此,定位凹槽亦可以設計為複 數個獨立之凹槽,例如三個,即分別由位於背板之第一面 的左右兩侧以及中央區域,且靶材上的結合凹槽亦可對應 設計為三個獨立凹槽,分別位於靶材之非轟擊面的左右兩 側以及中央位置,且與背板之定位凹槽的位置對應。 至於導磁零件之結合部的縱向截面設計,除了 τ形之 外,亦可設呈Y形,或其他形狀,請參照第3A圖,其繪 示第二種導磁零件與靶材之結合示意圖,導磁零件123之 結合部123a設計為圓形,而靶材之122之結合凹槽126 亦對應設計為圓形,使結合部123a可以與結合凹槽126 發生結構干涉。 請參照第3B圖,其繪示第三種導磁零件與靶材之結 合示意圖,導磁零件223之結合部223a設計為鳩尾形, 而靶材之222之結合凹槽226亦對應設計為鳩尾形,使結 合部223a可以與結合凹槽226發生結構干涉,但本發明 之技術不限於此,導磁零件之結合部也可以設計為半圓 形、蛋形、橢圓形、扇形、正多邊形、非正多邊形、任意 規則或不規則形狀,且靶材22之結合凹槽的形狀亦對應 於導磁零件之結合部的形狀設計。 如第2B圖所示,位於背板21之第二面21b之周緣區 域上的磁石24,其N極可面向導磁零件23,而其S極背 向導磁零件23,且位於背板21之第二面21b的中央區域 12564PA 200920867 increases the coating rate of magnetron sputtering equipment and increases the size of the substrate to be plated on the anode in the magnetron sputtering equipment. However, the technique of the present invention is not limited thereto, and the positioning groove may also be designed as a plurality of independent grooves, for example, three, which are respectively located on the left and right sides and the central portion of the first surface of the back plate, and on the target. The coupling groove can also be correspondingly designed as three independent grooves, which are respectively located at the left and right sides and the central position of the non-bursting surface of the target, and correspond to the position of the positioning groove of the back plate. As for the longitudinal section design of the joint portion of the magnetic conductive component, in addition to the τ shape, it may be provided in a Y shape, or other shapes. Please refer to FIG. 3A, which illustrates the combination of the second magnetic conductive component and the target material. The joint portion 123a of the magnetic conductive member 123 is designed to be circular, and the joint groove 126 of the target 122 is also designed to be circular, so that the joint portion 123a can structurally interfere with the joint groove 126. Referring to FIG. 3B, a schematic diagram of the combination of the third magnetically conductive component and the target is shown. The joint portion 223a of the magnetic conductive component 223 is designed to be a dovetail shape, and the coupling groove 226 of the target 222 is also designed as a tail. The joint portion 223a can be structurally interfered with the coupling groove 226, but the technique of the present invention is not limited thereto, and the joint portion of the magnetic conductive component can also be designed as a semicircle, an egg shape, an ellipse, a fan shape, a regular polygon, The non-orthogonal polygon, any regular shape or irregular shape, and the shape of the coupling groove of the target 22 also corresponds to the shape design of the joint portion of the magnetic conductive part. As shown in FIG. 2B, the magnet 24 located on the peripheral region of the second surface 21b of the backing plate 21 has an N pole which can face the magnetic component 23 and a S pole which is opposite to the magnetic component 23 and which is located at the backing plate 21. Central region 12 of second face 21b
64PA 200920867 的磁石24中,其S極相對面向導磁零件23,而其N極背 向導磁零件23,因此,根據上述磁石24的位置排列及極 性配置的搭配設計,磁石24之間將提供磁場以增加濺鍍 的效率。 在基於靶材22能夠透過導磁零件23結合於背板21 上之前提下,本實施例之磁控濺鍍陰極機構20亦可省略 位於中間位置的導磁零件23,且相對背板21之中央區域 的定位凹槽25及靶材22中央區域的結合凹槽26亦可省 略。 第二實施例 請同時參照第4A〜4C圖,其分別繪示依照本發明之 第二實施例之磁控濺鍍陰極機構的俯視圖及橫向剖面 圖,以及第4B圖之爆炸分解圖。本實施例之磁控濺鍍陰 極機構30與實施例一之磁控濺鍍陰極機構20 (如第2B 圖所示)不同之處在於靶材32及導磁零件33之接合方 式,至於其餘相同之構成要件則繼續沿用標號,並不再贅 述其彼此之間連接關係。 如第4B〜4C圖所示,靶材32具有相對之一轟擊面 32a及一非轟擊面32b,非轟擊面32b之結合凹槽例如具 有一螺孔36,靶材32為可被磁控濺鍍之任何靶材,且導 磁零件33設置於背板21及靶材32之間,並導磁零件33 包含有一具磁性之定位部33a及一螺栓33c,定位部33a 貫穿設有一貫孔33b,且貫孔33b可供螺栓33c穿過,以 13In the magnet 24 of the 64PA 200920867, the S pole is opposite to the surface of the magnetic component 23, and the N pole is opposite to the magnetic component 23, therefore, according to the positional arrangement of the magnet 24 and the polarity arrangement, a magnetic field is provided between the magnets 24. To increase the efficiency of sputtering. The magnetron sputtering cathode mechanism 20 of the present embodiment can also omit the magnetic conductive component 23 at the intermediate position and is opposite to the backing plate 21 before the target 22 can be fused to the backing plate 21 through the magnetic conductive component 23. The positioning groove 25 in the central region and the coupling groove 26 in the central portion of the target 22 may also be omitted. SECOND EMBODIMENT Please refer to Figs. 4A to 4C, which are respectively a plan view and a transverse cross-sectional view of a magnetron sputtering cathode mechanism according to a second embodiment of the present invention, and an exploded view of Fig. 4B. The magnetron sputtering cathode mechanism 30 of the present embodiment is different from the magnetron sputtering cathode mechanism 20 of the first embodiment (as shown in FIG. 2B) in the manner in which the target 32 and the magnetically permeable member 33 are joined. The constituent elements continue to use the reference numerals, and the connection relationship between them is not repeated. As shown in FIGS. 4B to 4C, the target 32 has a relatively one bombardment surface 32a and a non-bombaring surface 32b. The coupling recess of the non-bombarding surface 32b has, for example, a screw hole 36, and the target 32 is magnetron splashable. Any of the targets are plated, and the magnetic conductive component 33 is disposed between the back plate 21 and the target 32, and the magnetic conductive component 33 includes a magnetic positioning portion 33a and a bolt 33c. The positioning portion 33a is provided with a consistent hole 33b. And the through hole 33b can be passed through the bolt 33c to 13
64PA 200920867 供螺栓33c穿過定位部33a之〆端形成為一結合部33d, 且配合結合部33d鎖合於靶材32之螺孔36,而將定位部 33a容置於定位凹槽25,而使導磁零件33之定位部33a 與背板21第二面21b之磁石24相互吸附,以將靶材32 定位於背板21之第一面21a。 根據上述實施例所述之内容’本發明之磁控濺鏡陰極 機構確實可以解決傳統之磁控濺鍍陰極機構所面臨的種 種問題’其優點分別說明如下: 1. 由於本發明之磁控濺鍍陰極機構在更換靶材時 不須更換背板,所以安裝工作上更加省時且簡單。 2. 由於本發明之磁控濺鍍陰極機構在更換靶材時 不須連同更換背板,不會因為安裝瑕疵而造成磁控濺鍍設 備之真空腔體的漏氣,也不必執行磁控濺鍍設備之測漏工 作。 3. 由於本發明之磁控濺鍍陰極機構,所以不須有靶 材之背板脫離(Debonding )及背板黏合(Bonding )製程。 4. 由於本發明之磁控濺鍍陰極機構不須有靶材之 背板脫離及背板黏合,所以本發明之磁控濺鍍陰極機構不 須準備在背板黏合製程之背板,故可節省設備之成本。 5. 本發明之磁控濺鍍陰極機構不須製作夾持乾材 於背板上之夾具,可減去夾具製作及維護之成本。 6. 本發明之磁控濺鍍陰極機構不須使用夾具,可避 免夾具被轟擊出而污染沉積之薄膜。 7. 本發明之磁控濺鍍陰極機構不須使用夾具,不需 1464PA 200920867 is formed as a joint portion 33d of the bolt 33c passing through the positioning portion 33a, and the engaging portion 33d is engaged with the screw hole 36 of the target 32, and the positioning portion 33a is received in the positioning groove 25, and The positioning portion 33a of the magnetic conductive member 33 and the magnet 24 of the second surface 21b of the backing plate 21 are attracted to each other to position the target 32 on the first surface 21a of the backing plate 21. According to the content described in the above embodiments, the magnetron sputtering mirror cathode mechanism of the present invention can solve various problems faced by the conventional magnetron sputtering cathode mechanism. The advantages thereof are respectively described as follows: 1. The magnetic control splash of the present invention The plated cathode mechanism does not need to replace the back plate when replacing the target, so the installation work is more time-saving and simple. 2. Since the magnetron sputtering cathode mechanism of the present invention does not need to replace the back plate when replacing the target, the vacuum chamber of the magnetron sputtering device is not leaked due to the installation of the crucible, and the magnetron splashing is not necessary. Leakage testing of plating equipment. 3. Due to the magnetron sputtering cathode mechanism of the present invention, there is no need for a target backplane debonding and a backbond bonding process. 4. Since the magnetron sputtering cathode mechanism of the present invention does not need to have the back plate of the target detached and the back plate adheres, the magnetron sputtering cathode mechanism of the present invention does not need to be prepared on the back plate of the back plate bonding process, so Save on the cost of equipment. 5. The magnetron sputtering cathode mechanism of the present invention eliminates the need to clamp the dry material on the backing plate, thereby reducing the cost of fixture fabrication and maintenance. 6. The magnetron sputtering cathode mechanism of the present invention does not require the use of a jig to prevent the jig from being bombarded and contaminating the deposited film. 7. The magnetron sputtering cathode mechanism of the present invention does not require the use of a jig, and does not require 14
364PA 200920867 考慮夾具被轟擊出而污染沉積之薄膜’所以陰極及磁場設 計時可使乾材之轟擊區域變寬,因此可提高鑛膜速率,且 同時增加待鍍基板之尺寸。 8. 本發明之磁控濺鐘陰極機構可使乾材之轟擊區 域變寬’所以可提高靶材使用率。 9. 本發明之磁控丨賤鐘陰極機構不須使用螺絲將爽 具 '《°合於为板或陰極,所以不會有結合螺絲鬆緊不一的情 形’一方面不會因為螺絲鎖太緊而使靶材受熱膨脹而破 〇 碎,另一方面也不會太鬆而使靶材與背板接觸不良,造成 乾材上的熱無法傳導至背板而冷卻。 ίο.本發明之磁控濺鍍陰極機構之磁石雖然也位在 背板之下方’但在靶材與背板之間之導磁零件已經將磁場 提高接近靶材之轟擊面,所以,可以改善靶材之轟擊面上 方之磁場分布,並且提高磁場的強度,以控制電子有效地 撞擊惰性氣體。 本發明上述實施例所揭露之磁控濺鍍陰極機構,复透 I 過導磁零件將粗材結合於背板上之設計,再利用磁力吸附 之原理’將乾材吸附於背板上而完成乾材安裝,可以避免 發生傳統之磁控⑽陰極機構採用背板減(b。補吨) 或夾具(Clamp)夾持機構時所出現的種種問題。同時, 在乾材與$板之間之導磁零件已經將磁場提高接近乾材 之轟擊面。所以,可以改善磁場之分佈及強度。 、結上所述’雖然本發明已以較佳實施例揭露如上,然 ,、並非用以限疋本發明。本發㈣屬技術領域巾具有通常 15364PA 200920867 Considering that the fixture is bombarded to contaminate the deposited film, so the cathode and magnetic field settings can widen the bombardment area of the dry material, thereby increasing the film rate and increasing the size of the substrate to be plated. 8. The magnetron sputtering clock cathode mechanism of the present invention can widen the bombardment area of the dry material, so that the target utilization rate can be improved. 9. The magnetron control cathode mechanism of the present invention does not need to use a screw to cool the device's "° is a plate or a cathode, so there is no case where the combined screws are tight." On the one hand, the screw lock is not too tight. The target is thermally expanded and broken, and on the other hand, it is not too loose, so that the target and the backing plate are in poor contact, so that the heat on the dry material cannot be transmitted to the backing plate and cooled. Ίο. The magnet of the magnetron sputtering cathode mechanism of the present invention is also located below the backing plate, but the magnetically permeable part between the target and the backing plate has increased the magnetic field close to the bombardment surface of the target, so it can be improved The magnetic field distribution above the bombardment surface of the target increases the strength of the magnetic field to control the electrons to effectively impinge on the inert gas. The magnetron sputtering cathode mechanism disclosed in the above embodiments of the present invention, the design of the re-transmission I over-magnetic component to bond the coarse material to the back plate, and then the principle of magnetic adsorption is used to adsorb the dry material on the back plate. The dry material installation can avoid the problems that occur when the conventional magnetron (10) cathode mechanism uses the back plate minus (b. ton) or clamp (Clamp) clamping mechanism. At the same time, the magnetically conductive parts between the dry material and the $ plate have increased the magnetic field close to the bombardment surface of the dry material. Therefore, the distribution and strength of the magnetic field can be improved. The present invention has been described above with reference to the preferred embodiments, and is not intended to limit the invention. The hair of the technical field (4) belongs to the technical field.
64PA 200920867 知識者,在不脫離本發明之精神和範圍内,當可作各種之 更動與潤飾。因此,本發明之保護範圍當視後附之申請專 利範圍所界定者為準。64PA 200920867 The knowledge of the present invention can be varied and retouched without departing from the spirit and scope of the present invention. Therefore, the scope of the invention is defined by the scope of the appended claims.
364PA 200920867 【圖式簡單說明】 第1A〜1B圖分別繪示傳統之磁控濺鍍陰極機構的俯 視圖及橫向剖面圖。 第2A〜2B圖分別繪示依照本發明之第一實施例之磁 控濺鍍陰極機構的俯視圖及橫向剖面圖。 第2C圖繪示第2A圖之背板的仰視圖。 第2D圖繪示第2B圖之靶材的剖面圖。 第3A圖繪示第二種導磁零件與靶材之結合示意圖。 (' 第3B圖繪示第三種導磁零件與靶材之結合示意圖。 第4A〜4B圖分別繪示依照本發明之第二實施例之磁 控藏鍍陰極機構的俯視圖及橫向剖面圖。 第4C圖繪示第4B圖之爆炸分解圖。 【主要元件符號說明】 10、 20、30 :磁控濺鍍陰極機構 11、 21 :背板 I 12、22、32、122、222 :靶材 12c、22c、32c :轟擊區域 14、24 :磁石 15 :夾具 21a :第一面 21b :第二面 22a、32a :轟擊面 22b、32b :非轟擊面 17364PA 200920867 [Simplified Schematic] Figures 1A to 1B show a top view and a transverse cross-sectional view of a conventional magnetron sputtering cathode mechanism, respectively. 2A to 2B are a plan view and a transverse cross-sectional view, respectively, showing a magnetron sputtering cathode mechanism according to a first embodiment of the present invention. Figure 2C is a bottom plan view of the back panel of Figure 2A. Fig. 2D is a cross-sectional view showing the target of Fig. 2B. FIG. 3A is a schematic view showing the combination of the second magnetic conductive component and the target. (' Figure 3B shows a schematic view of the combination of the third magnetically permeable part and the target. The 4A to 4B are respectively a plan view and a transverse cross-sectional view of the magnetron-plated cathode mechanism according to the second embodiment of the present invention. Figure 4C shows the exploded view of Figure 4B. [Explanation of main components] 10, 20, 30: Magnetron sputtering cathode mechanism 11, 21: Backplane I 12, 22, 32, 122, 222: Target 12c, 22c, 32c: bombardment area 14, 24: magnet 15: clamp 21a: first surface 21b: second surface 22a, 32a: bombardment surface 22b, 32b: non-bombardment surface 17
64PA 200920867 23、33、123、223 :導磁零件 23a、33d、123a、223a :結合部 23b、33a :定位部 25 :定位凹槽 26、126、226 :結合凹槽 26a :寬凹槽 26b :窄凹槽 33b :貫孔 〇 33c :螺栓 36 :螺孔 1864PA 200920867 23, 33, 123, 223: magnetic conductive parts 23a, 33d, 123a, 223a: joint portions 23b, 33a: positioning portion 25: positioning grooves 26, 126, 226: coupling groove 26a: wide groove 26b: Narrow groove 33b: through hole 〇 33c: bolt 36: screw hole 18
Claims (1)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW096143292A TWI359872B (en) | 2007-11-15 | 2007-11-15 | Magnetron sputter cathode mechanism |
| US12/255,062 US8052852B2 (en) | 2007-11-15 | 2008-10-21 | Magnetron sputtering cathode mechanism |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW096143292A TWI359872B (en) | 2007-11-15 | 2007-11-15 | Magnetron sputter cathode mechanism |
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| Publication Number | Publication Date |
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| TW200920867A true TW200920867A (en) | 2009-05-16 |
| TWI359872B TWI359872B (en) | 2012-03-11 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096143292A TWI359872B (en) | 2007-11-15 | 2007-11-15 | Magnetron sputter cathode mechanism |
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| US (1) | US8052852B2 (en) |
| TW (1) | TWI359872B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI548767B (en) * | 2010-04-16 | 2016-09-11 | 唯亞威方案公司 | Ring cathode for use in a magnetron sputtering device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8992747B2 (en) * | 2010-03-12 | 2015-03-31 | Applied Materials, Inc. | Apparatus and method for improved darkspace gap design in RF sputtering chamber |
| US10718048B2 (en) * | 2017-06-30 | 2020-07-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | Target structure of physical vapor deposition |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4204936A (en) * | 1979-03-29 | 1980-05-27 | The Perkin-Elmer Corporation | Method and apparatus for attaching a target to the cathode of a sputtering system |
| US5286361A (en) * | 1992-10-19 | 1994-02-15 | Regents Of The University Of California | Magnetically attached sputter targets |
| EP1835524A1 (en) * | 2006-03-16 | 2007-09-19 | Sulzer Metco AG | Fastening means for sputtering source |
-
2007
- 2007-11-15 TW TW096143292A patent/TWI359872B/en not_active IP Right Cessation
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| TWI548767B (en) * | 2010-04-16 | 2016-09-11 | 唯亞威方案公司 | Ring cathode for use in a magnetron sputtering device |
Also Published As
| Publication number | Publication date |
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| TWI359872B (en) | 2012-03-11 |
| US20090127107A1 (en) | 2009-05-21 |
| US8052852B2 (en) | 2011-11-08 |
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