[go: up one dir, main page]

TW200804827A - Probe unit and probe apparatus having the same - Google Patents

Probe unit and probe apparatus having the same Download PDF

Info

Publication number
TW200804827A
TW200804827A TW096111711A TW96111711A TW200804827A TW 200804827 A TW200804827 A TW 200804827A TW 096111711 A TW096111711 A TW 096111711A TW 96111711 A TW96111711 A TW 96111711A TW 200804827 A TW200804827 A TW 200804827A
Authority
TW
Taiwan
Prior art keywords
probe
bracket
pin
frame
fixing
Prior art date
Application number
TW096111711A
Other languages
Chinese (zh)
Other versions
TWI333071B (en
Inventor
Dong-Won Shin
Suk-Joong Kim
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200804827A publication Critical patent/TW200804827A/en
Application granted granted Critical
Publication of TWI333071B publication Critical patent/TWI333071B/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

A probe unit includes first probe pins arranged along a first direction, second probe pins arranged over the first pins along the first direction and interposed between the first pins, a first supporting memer for supporting both ends of the first probe pins, a second supporting member positioned on the first supporting member to support both ends of the second probe pins, a frame for supporting the first and the second probe pins, first fixing members for securing the first and the second supporting members to the frame so as to arrange the first and the second supporting members along a second direction substantially perpendicular to the first direction, and second fixing members for fixing the first and the second supporting members to the frame so as to arrange the first and the second supporting members along a third direction substantially perpendicular to the first and the second directions.

Description

200804827 九、發明說明: 【發明所屬之技術領域】 本發明之典型具體實施例侧於針 單元之探針裝置。更特定言之,本發明之血體具有,針 -與諸如液日日日顯示(LCD)屏、顯示幕關於 等顯示面板的終端接觸之探針單元,及— 斜:A光面板 顯示面板之電可靠性之探針裝置。 利用該彳木針早兀測試該 【先前技術】 2,顯示器產業不斷發展以滿足顯示器面板 勢。包括該顯示器面板在内之顯示器I =大之趨 器面板尺寸之增大聽置之衣造成本隨著該顯示 製造該顯示器裝置時,由於在完成其製 更皆極為_,因此有必要徹底檢查其缺陷。 ,商收益降低等。因此,在製 =驗該顯示器面板非常重要。此處,—探針裝置檢驗“ 行是S裝ΐίϊΐΐΓ?組裝之前檢查該顯示器面板之運 觸u驗針㈣該板之終端接 mT 一傳統探針單元之橫戴面視圖。 部件^圖丨’-傳統探針單㈣包括若干探針管腳15與一探針 該等探針管腳15與一顯示器面板5〇之铢 該等探針管腳15藉由-與該等終端55 j 55接觸。口此, 佈置。該等探針管腳15被固定至該探針部相對應之相同間隙 200804827 ,探針部件2G姻—固定^ 6㈣與〆撐板⑽組合 二ί 4探,腳15放置於該顯示器面板50之終端55上43 二,至雜針部件2〇之探針管腳15被電連接至—諸如捲‘切 之频魏65。該频電路65提供—電錢至該ί探 傳遞電信號至該等終端55,_ϊ 箄浐腳15以相同之間隙佈置於該探針部件2〇上。, 針官腳15。另一方面,可能無法重新佈詈兮笪 里士人…T腳15非吊困難。另一方面,該等探針管腳IS址此 針部 1牛=之一陶究支座25上。該陶究支座^有S 亚產生諸多問題。舉例而言,當該陶瓷支座25破士 it .ί;^ 器面板可包括1門乂女的% 各里鬲集成度之顯示 等近來研製ϊ顯===隙佈置之終端%。因此,該 代措施來防止該間隙變窄。 有必要預備替 【發明内容】 200804827 本發明之典型具體實施例提供一探針單元,該探針單元包括 若干精細佈置、易於製造與維修之探針管腳。 本發明之典型具體實施例同樣提供一具有該探針單元之探針 裝置以有效測試一具有精細佈置之終端之物體。 根據本發明之一方面,一探針單元包括:若干沿第一方向佈 置之第一探針管腳;若干沿該第一方向佈置於該等第一探針管腳 上方且插入該等第一探針管腳之間之第二探針管腳;用於支撐每 一該等第一探針管腳兩端部之第一支承構件;安置於該第一支承 構件上以支撐每一該等第二探針管腳兩端部之第二支承構件;一 _ 用於支撐該等第一與第二探針管腳之框架;若干為固定該等第一 與第二支承構件被安裝至該框架之第一固定構件,以使得沿大體 上垂直於該第一方向之第二方向佈置該等第一與第二支承構件; 及若干為固定該等第一與第二支承構件安裝至該框架之第二固定 構件,以使得沿大體上垂直於該第一方向與第二方向之第三方向 佈置該等第一與第二支承構件。 - 在本發明之典型具體實施例中,該第一支承構件可包括用於 . 支撐每一該等探針管腳之一端部之第一支架,及用於支撐每一該 等第一探針管腳之另一端部之第二支架。另外,該第二支承構件 可包括用於支撐每一該等第二探針管腳之一端部之第三支架及用 • 於支撐每一該等第二探針管腳之另一端部之第四支架。此外,用 於接收該等第一探針管腳之若干第一狹槽可形成於該等第一與第 二支架之表面部分處。用於接收該等第二探針管腳之第二狹槽可 形成於該等第三與第四支架之表面部分處。該等第一探針管腳能 可分離地與該等第一與第二支架組合。該等第二探針管腳能可分 離地與該等第三與第四支架組合。 該第一支架可被佈置於一固定座上。該第三支架可安置於該 等支座上。使用第三固定構件可固定該等支座至該框架。利用與 該第三支架之兩侧表面皆接觸之若干第四固定構件,該第三支架 可相對於該第一支架對準。 7 200804827200804827 IX. Description of the Invention: TECHNICAL FIELD OF THE INVENTION A typical embodiment of the present invention is directed to a probe unit of a needle unit. More specifically, the blood body of the present invention has a probe unit that is in contact with a terminal such as a liquid day display (LCD) screen, a display screen, and the like, and a tilt: A light panel display panel Probe device for electrical reliability. The use of the eucalyptus needle to test this [prior art] 2, the display industry continues to develop to meet the display panel potential. Display I including the display panel I = large increase in the size of the panel of the monitor. Because the display device is manufactured with the display, it is necessary to thoroughly check the system when it is finished. Its flaws. , business income is reduced, etc. Therefore, it is very important to check the display panel. Here, the probe device verifies that "the line is the S device". Check the display panel before the assembly. (A) The terminal of the board is connected to the mT-traditional view of the conventional probe unit. - a conventional probe single (four) comprising a plurality of probe pins 15 and a probe, the probe pins 15 and a display panel 5, the probe pins 15 being contacted by the terminals 55 j 55 The probe pin 15 is fixed to the same gap 200804827 corresponding to the probe portion, and the probe member 2G is fixed-fixed 6 (four) combined with the truss plate (10), and the foot 15 is placed. On the terminal 55 of the display panel 50, the probe pin 15 of the pin member 2 is electrically connected to - for example, the volume of the chip is cut 65. The frequency circuit 65 provides - the money to the An electrical signal is transmitted to the terminals 55, and the foot 15 is disposed on the probe member 2'' with the same gap. The pin 15 is on the other hand. On the other hand, the lieutenant may not be re-arranged...T The foot 15 is not difficult to hang. On the other hand, the probe pin IS is located on the needle 1 cow = one of the ceramic support 25 . There are many problems in the support of the sub-seat. For example, when the ceramic support 25 is broken, the panel can include the display of the integration of one prostitute, etc. ==The terminal % of the gap arrangement. Therefore, this generation measures to prevent the gap from narrowing. It is necessary to prepare for the present invention. [0081] A typical embodiment of the present invention provides a probe unit including several fine arrangements. A probe pin that is easy to manufacture and maintain. A typical embodiment of the present invention also provides a probe device having the probe unit to effectively test an object having a finely arranged terminal. According to one aspect of the present invention, The probe unit includes: a plurality of first probe pins arranged along the first direction; and a plurality of first probe pins disposed above the first probe pins and inserted between the first probe pins a second probe pin; a first support member for supporting both ends of each of the first probe pins; disposed on the first support member to support each of the second probe pins Second support member; one_ a frame for supporting the first and second probe pins; a plurality of first fixing members fixed to the first and second support members to be fixed to the frame so as to be substantially perpendicular to the first direction Arranging the first and second support members in a second direction; and a plurality of second fixing members for securing the first and second support members to the frame such that the first direction is substantially perpendicular to the first direction The first and second support members are disposed in a third direction of the second direction. - In an exemplary embodiment of the invention, the first support member can include for supporting one end of each of the probe pins a first bracket, and a second bracket for supporting the other end of each of the first probe pins. Additionally, the second support member may include a second probe tube for supporting each of the second probe tubes a third bracket at one end of the foot and a fourth bracket for supporting the other end of each of the second probe pins. Additionally, a plurality of first slots for receiving the first probe pins can be formed at the surface portions of the first and second brackets. A second slot for receiving the second probe pins can be formed at the surface portions of the third and fourth brackets. The first probe pins can be detachably combined with the first and second brackets. The second probe pins are separably combined with the third and fourth brackets. The first bracket can be disposed on a fixed seat. The third bracket can be placed on the seats. The holders can be secured to the frame using a third securing member. The third bracket is aligned with respect to the first bracket by a plurality of fourth securing members that are in contact with both side surfaces of the third bracket. 7 200804827

該第二支架可被接收於一接收 該第二支架上。該第二支架與該第架可被定位於 用與該第四支架之兩侧表面皆接觸之被=至該框架。利 支架可與該第二支架對準。 弟一固疋構件,該第四 根據本發明之另一方面,—探 佈置之探針管腳;若干用於支 ^.轩沿第-方向 承f牛;―用於支撐該等支承構件之兩端部之支 著大體上垂直於該第-方使得該等支承構件沿 框架之第二固定構件,用於固定該^ H及若干被安裝至該 件沿著大體上垂直於該第-方向^第二^5得該等支承構 根據本發明之另—方面,:向之弟三方向佈置。 之外殼、-位於該外殼内用於固^十^包括一用於接收-物 ·; ;:ϊ:* 體 • 階 i)若干沿第一方 該等第-探針管^若了=第-探針管 ϊΐ =該等第—探針管腳兩端部之第υ用The second bracket can be received on a receiving second bracket. The second bracket and the first frame can be positioned to be in contact with both sides of the fourth bracket to the frame. The bracket can be aligned with the second bracket. a solid-solid member, the fourth according to another aspect of the invention, the probe pin arranged for the probe; the plurality of pins for supporting the spindle in the first direction; and - for supporting the support members The ends of the ends are substantially perpendicular to the first side such that the support members are along the second securing member of the frame for securing the plurality and are mounted to the member along a direction substantially perpendicular to the first direction ^The second support is in accordance with another aspect of the invention: it is arranged in three directions. The outer casing, - located in the outer casing for fixing, includes a device for receiving - material;;: ϊ: * body • step i) a number of along the first side of the first - probe tube ^ if = - Probe tube ϊΐ = the first part of the first probe pin

承構件;ν) 一用於支撐 一叙針营腳兩端部之第二支 f構件,以沿與該第—方:對玆支m至該轉之第-固 與該第二支承構件;與V 向—佈置該第-支承構件 承構件至該框架之第二固定構件,^支承構件與該第二 !=?之第三方向佈置該第-Ϊ承:;該第二 /貝Μ早7L,其用於提供電 ,、该弟一支承構件,·及 探針管腳,以檢驗該物體是否&quot;正&quot;常:&quot;、弟-探針管腳與該等第二 精密:探:裝置可精確地檢驗-具有 逮而容易。體$方面,聰針單元之製造與維修^ 8 200804827 【實施方式】 隨後參考該等附圖更為詳細地描述本發明,其中顯示了本發 ,之典型具體實施例。然而,本發明可以許多不同之形式具體實 施’不應解釋為侷限於此處所陳述之該等典型具體實施例。確切 而:提供此專具體實施例係為使所揭示之内容詳盡而完整,且 為熟悉此項技藝之人士全面地傳達本發明之範圍。在此等圖中, 為清晰起見,層與區域之尺寸與相對大小可能被放大。 、應,瞭,當一元件或層被指“位於,,另一元件或層之上或“被 ,接至该另一凡件或層時,該元件或層可直接位於該另一元件 ,層之上或直接被連接至該另—元件或層,或可能存在介入元件 ,層‘。與此相反,當一元件被指“直接位於,,另一元件或層上、 ^直接被連接至丨-元件或層時,則不存在介入元件或層。 中’相同之兀件符號指相同之元件。此處所用之術語“與/ 或匕括-個或多個該等列出之相關零件之任何及所有組合。 於儘ί該等術語第―、第二、第三等可能在此處被用 =田=同之兀件、組件、區域、層與/或截面,但此等元件、組 ^域截面不絲由轉術語關。鱗術語僅用於 區 域、層或截面與另-元件、組件、區域、 S此i不偏離本發明之教示之情況下,下面所討論 域面 域、層或截面可稱為第二元件、組件、 諸如“下部’ 易地描述如該等圖中所示」 下面” 方 上 。因此,該實例用術語“下面,,γ a: 與“在…之下'該裝置可以其他方=括二9=於 9 200804827 =方位)’且相應地據此解釋此處所使狀轉空m目對位置描 、,此處所使用之該術語僅用作描述特定之具體實施例之 用於限制本發明。如此處所使用之單數形式術語 该,包括複數形式’除非上下文中明確指出其為單 ^。應進一步瞭解術語“包含”用在本說明中 1 ^上 徵、整體、步驟、操作、元件與/或組件,; ί/ΐϊΐ:個或更多其他紐、整體、步驟、操作、元件、組件 此處參照本發明之理想具體實_ (與中間結構)示 圖解描述本發明之典型具體實施例。同樣地,舉例ί 开或誤差之故,可能出現與該等示意圖形二之 =狀二口此,本發明之典型具體實施例不應解釋為侷限於此 二!^兄^區域之該等特定形狀,而是包括由於製造之故(舉例 ::)一:出現之不同形狀。圖示說明於該等圖中之該等區域實 二不思圖,且其形狀並不企圖圖示說明—裝置之— 實^ 形狀,且並不企圖限制本發明之範圍。貝際 定^此處所使用之所有術語(包括技術術語與科 子4m)之3義與熟悉本發明所屬技藝之人士通常所瞭解之 二致。應進-步瞭解,諸如常用字典中所義 ==與相關技藝上下文中其含義一致,而不應=以 式或過度正式之方式解釋,除非此處特意地如此定義。a member (v) for supporting a second f member at both ends of the foot of the camping pin, to extend along the first and second sides to the first and second support members; And arranging the first support member bearing member to the second fixing member of the frame, and the supporting member is disposed in the third direction of the second!=?: the second/before 7L, which is used to supply electricity, the support member of the brother, and the probe pin to verify whether the object is &quot;正&quot;常:&quot;, brother-probe pin and the second precision: Detecting: The device can be accurately inspected - it is easy to catch. Manufacture and maintenance of a Clamping Needle Unit ^ 8 200804827 [Embodiment] The present invention will be described in more detail hereinafter with reference to the accompanying drawings in which FIG. However, the invention may be embodied in many different forms and should not be construed as being limited to the particular embodiments disclosed herein. The specific embodiments are provided so that this disclosure will be thorough and complete, and the scope of the invention is fully disclosed by those skilled in the art. In these figures, the size and relative sizes of layers and regions may be exaggerated for clarity. And, when an element or layer is referred to as being "on," or "directly connected to" another element or layer, the element or layer may be directly to the other element. Above or simply connected to the other element or layer, or there may be an intervening element, layer '. In contrast, when an element is referred to as being "directly on, on another element or layer, "directly connected to the element or layer, there is no intervening element or layer. The term "and/or" includes any and all combinations of one or more of the listed related parts. The terms "," "second, third, etc." may be used herein = the same elements, components, regions, layers, and/or sections, but such elements, groups, and sections are not By turning the term off. The scaled terms are used only for regions, layers or sections and other elements, components, regions, and so on, without departing from the teachings of the present invention, the domain regions, layers or sections discussed below may be referred to as second elements, components. For example, the "lower part's description of the lower part is as shown in the figures below". Therefore, the example uses the term "below, γ a: and "under" the device can be other parties = 2 = </ RTI> at 9 200804827 = azimuth)' and accordingly the explanation herein is made to the positional description, and the term used herein is used merely to describe a particular embodiment for limiting the invention. The singular terms used herein shall be used in the <RTI ID=0.0> </RTI> <RTIgt; </RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> unless the context clearly indicates that it is a single ^. It should be further understood that the term "comprising" is used in this specification.或 其他 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个 个, For example, the opening or the error may occur with the second embodiment. The exemplary embodiment of the present invention should not be construed as being limited to the specific shapes of the two regions. It is included in the manufacture (for example: :) one: the different shapes appearing. The illustrations show that the areas in the figures are not considered, and the shape is not intended to illustrate - the device - The shapes are not intended to limit the scope of the present invention. All of the terms (including technical terms and 4m) used herein are generally understood by those skilled in the art to which the present invention pertains. It should be further understood that, for example, the meanings in the commonly used dictionary == are consistent with their meanings in the context of the relevant art, and should not be interpreted in a formal or overly formal manner unless specifically defined herein.

if闰圖根據本糾之—典型具體實_之—探針單元之透 I = 3為圖2中A部分之一放大透視圖,圖4為圖2中B 解Ιί圖視圖。圖5為。圖示說明圖2中該探針單元之分 若照5 ’ 一探針單元励包括若干第一探針管腳110、 ΙίϊγΠ」20、第一支承構件130、第二支承構件150、 框木170、右干第一固定構件m、若干第二固 200804827 =ί3,185、若干第四固定構件187與若干支座190。該 ίϊ,包括第—支架131與第二支架141。該第二支承 構件150_包括弟三支架ι51與第四支架161。 該第-支架131與該第二支架141佈置於該框架m上 I二=插槽f與第一對準插槽137沿第一方向形成於該第 在—典型具體實施例中,該等第一針腳插 Z若千;猎斜:二,家G1&quot;皮此間隔開。若干第二針腳插槽145 ,、右:弟—對準插槽147可沿該第—方向形成於該第二支架⑷ 二蜂典型具體實施例中,該等第二針腳插槽145可藉 由該弟一間隙G11彼此間隔開。 ,等第-探針管腳110被插入該等第一與第二支架⑶與141 邱η并典?具體實施例令,每一該等第一探針管腳110之一端 等第一針腳插槽135内。另外,每一該等第一 i = 端部可被插入每一該等第二探針管腳插槽145 ^ ί 4弟一探針管腳110可藉由該第一間隙G11彼此間 I,G11可根據一物體上終端間之—間隙確定。舉 内。5 ’以弟-間隙G11可在大約1〇师至大約卿⑺之一範圍 固』ίίί =置於該第一支架131之兩侧。利用該等第三 被放^該等m°該第三支架151 第二支架14ii 另一方面,該第四支架161定位於該 第if腳插槽155與第三對準插槽157沿該第一方向形 151之一表面部分。在一典型具體實施例中,該 155可藉由第二_ G12彼關隔開。若干第四 第 ==糊1 167-獅成於該 奸揭— 广在一典型具體實施例申,該等第四針腳 插槽16上y糟由該弟二間隙⑺2彼此間隔開。 “第一支木151與該第一支架131對準。在一典型具體實施 200804827 用該等第三對準插槽157 二支木151可相對於該第一支竿13、f ^丰播槽137,該第 於該第二支架141對準^^ $二^四支架161相對 Ϊ;插該等第二對準插槽以 該弟一支架141對準。 示又木161可相對於 131 體實施例中,每支架151及⑹中。在-典型具 該等第三針腳插枰官”2〇之一端部可被插入每— 另一端部可sms,'’每一該等第二探針管請之 等第二探針管^ 針管腳插槽165内。因此,該 間隙G12 據⑦物二間隙G12彼此間隔開。該第二 該第-據該物體上之料終端之一間隙確定。舉偏t L _ ΓΓ, ;; 2可在大約10卿至大約漏μιη之—範圍内二室 ,川間之該;二:探針 管腳120間之該m/」3 ^擇為’該等第二探針 間之該第-間隙Gn。’、 W略不同於該等第—探針管腳110 利?ί第ί探針管腳120被插入該等第一探針管腳1U)州If the map is based on this correction—typically concrete—the penetration of the probe unit I = 3 is an enlarged perspective view of one of the parts A in Figure 2, and Figure 4 is a view of the B diagram in Figure 2. Figure 5 is. 2, the probe unit includes a plurality of first probe pins 110, ΙίϊγΠ 20, the first support member 130, the second support member 150, and the frame wood 170. The right first fixed member m, the plurality of second solids 200804827 = ί3, 185, a plurality of fourth fixing members 187 and a plurality of supports 190. The ϊ ϊ includes a first bracket 131 and a second bracket 141. The second support member 150_ includes a third bracket ι51 and a fourth bracket 161. The first bracket 131 and the second bracket 141 are disposed on the frame m, and the first bracket 137 is formed in the first direction in the first direction. A pin is inserted into Z if thousands; hunting oblique: two, home G1 &quot; skin is spaced apart. A plurality of second pin slots 145, and a right-hand-aligning slot 147 can be formed along the first direction in the second bracket (4). In the exemplary embodiment, the second stitch slots 145 can be The brothers have a gap G11 spaced apart from each other. The first probe pin 110 is inserted into the first and second brackets (3) and 141, and the first pin is inserted into one end of each of the first probe pins 110. Inside the slot 135. In addition, each of the first i=ends can be inserted into each of the second probe pin slots 145^4, and the probe pin 110 can be mutually I by the first gap G11. G11 can be determined based on the gap between the terminals on an object. Inside. 5 '' Brother-Gap G11 may be in the range of about 1 〇 to about one (7). 』 ίίί = placed on both sides of the first bracket 131. The second bracket 151 is mounted on the third bracket 151, and the fourth bracket 161 is positioned on the first foot slot 155 and the third alignment slot 157 along the first One of the surface portions of the one-direction shape 151. In a typical embodiment, the 155 can be separated by a second _G12. A number of fourths == 糊1 167- lions are ruined - in a typical embodiment, the fourth stitch slots 16 are spaced apart from each other by the second gap (7) 2. "The first branch 151 is aligned with the first bracket 131. In a typical implementation 200804827, the second yoke 157 can be used with respect to the first fulcrum 13, f 137. The second bracket 141 is aligned with the second bracket 161. The second alignment slot is aligned with the bracket 141. The display wood 161 is opposite to the 131 body. In the embodiment, each of the brackets 151 and (6) can be inserted into each of the other ends of the brackets at the end of the "one of the third stitches", and each of the second probes can be inserted into each of the other ends. Please wait for the second probe tube to be inside the pin socket 165. Therefore, the gap G12 is spaced apart from each other according to the seven-gap gap G12. The second one is determined based on a gap of a material terminal on the object. The deviation t L _ ΓΓ, ;; 2 can be in the range of about 10 qing to about μ μηη, in the range of two chambers, the middle of the tube; two: the m/"3 between the probe pins 120 is selected as 'the same The first gap Gn between the second probes. ', W is slightly different from the first - probe pin 110. The first probe pin 120 is inserted into the first probe pin 1U)

隔開。ii十:^間隙G13自該第二探針管腳120間 確定。隙3:!根f該第一間隙G11與該第二間隙J 利用ίίί Ϊ 第三間隙G13可為大約25卿。 架⑷弟^「1構件181與183,該等第二與第四支 141盘二 皮疋至該框架170。同時,該等第二鱼第四去牟Separated. Ii 10: ^ Gap G13 is determined from the second probe pin 120. The gap 3:! root f the first gap G11 and the second gap J may be about 25 qing by the third gap G13. Rack (4) brother ^ "1 member 181 and 183, the second and fourth branches 141 are smashed to the frame 170. At the same time, the second fish is fourth.

3 —與第二探針管腳則與C 件。:^該等附圖詳細圖示說明該十單元11〇之上述元 圖。圖6為-圖示說明圖2中該探針單元之第一探針管腳之透視 12 200804827 參照圖2與圖6,玆筮批力丄- 接觸部分m與-連接針管腳110包括一體部分iu、-該體部分111可為—寬度為wu 長度L11大體上比該寬声w 長度為L11之溥板狀,該 輕該體部分111之重量Γ可介料触一典型具體實施例中,為減 另外,該體部分體^分111形成複數個孔Π6。 角度ctl。該第-角度α1可相撼面沿順時針方向傾斜第一 定。該體部分m具有第一描f之該框架170之形狀確 第二端部lllb。該第—端該第一端部ma相對之 行於該豎直平面佈置。該接觸一端部lllb可大體上平 部Ilia之-頂面延伸。自該體部分111之第—端 之第二端部lllb之一頂面延伸。‘接部分117自該體部分111 該接觸部分114直接與一諸如一液晶 體之終端接觸。該接觸部分 ^ :=之物 該連二Γ該接觸部分114可具有一尖端部。 伸,且然後水平延,ΐ、=二端部lllb之頂面垂直延 它一士t 甲因此該連接部分117可具有一 η壯 如上所ΐ連ΪΪ分117可具有一向上之彎頭與尖端部/ 可i4 = 部分11卜該簡部分114與該連接部分117 體奋^丨Φ &lt;域,以便形成該第—探針管腳11G。在—业型且 體貝%例中’該等第—探針管腳11G可具有大體上二“ί具 另ΐϊί,等第一探針管腳110之形狀可略微不同。7 姑斜H&quot;7111、該接觸部分114與該連接部分117可包括, £至』==信號經由該體部分111可自該連接部分11J 部分4,反之亦然。該等第-探針管腳”〇沿-4 由該第-間隔^ 了方面’該等第一探針管腳110藉 圖7為-圖示說明圖2中該探針單元之第二探針管腳之透視 13 200804827 圖。3 — with the second probe pin and the C piece. The drawings illustrate in detail the above-described meta-graphs of the ten units. Figure 6 is a perspective view of the first probe pin of the probe unit of Figure 2; 200804827 Referring to Figures 2 and 6, the force-contact portion m and the - connection pin pin 110 include an integral portion. Iu, the body portion 111 can be a slab-like shape having a width wu length L11 substantially greater than the width of the wide sound w, and the weight of the light body portion 111 can be referred to in a typical embodiment. In addition, the body portion 111 forms a plurality of apertures 6. Angle ctl. The first angle α1 can be tilted by a predetermined amount in the clockwise direction. The body portion m has a first second end portion 111b of the frame 170 of the first depiction f. The first end ma of the first end is arranged opposite to the vertical plane. The contact end portion 11lb may extend substantially the top surface of the Ilia. A top surface of one of the second ends 111b of the first end of the body portion 111 extends. The terminating portion 117 is in direct contact with the terminal portion of the body portion 111 from a terminal such as a liquid crystal. The contact portion ^ := The contact portion 114 may have a tip end portion. Stretching, and then horizontally extending, 顶, = the top surface of the two end portions 11lb is vertically extended by one s t. Therefore, the connecting portion 117 can have a η strong as the ΐ ΪΪ ΪΪ 117 can have an upward elbow and tip The portion / can be i4 = the portion 11 of the portion 114 and the connecting portion 117 body Φ Φ &lt; field to form the first probe pin 11G. In the case of the industry type, the first probe pin 11G may have substantially two different shapes, and the shape of the first probe pin 110 may be slightly different. 7 斜 oblique H&quot; 7111, the contact portion 114 and the connecting portion 117 may include, a £ to 』== signal may be from the connecting portion 11J portion 4 via the body portion 111, and vice versa. The first probe pin "〇" 4 From the first-interval aspect, the first probe pins 110 are illustrated in FIG. 7 to illustrate a perspective view of the second probe pin of the probe unit of FIG. 2 200804827.

參照圖2與圓7,哕M 接觸部分m與-連接部㈣120包括一體部分m、-該體部分121可具有一農具疮τ 薄板狀。在-典型具體實施上比其寬度W21大之 121之寬度W21可大體上盘了弟一餘針管腳之體部分 寬度相同。另一選擇為該t探針管腳⑽之體部分m之 之寬度彻與該第-探針管腳^之體部分m 不同。另一方面,該第二探針管腳f2f= m 略微 短於該第-探針管腳11G之體部分ln之^^長度L21 實施例中,為減輕該體部们21之重量,。=型具體 成複數個孔126。另外,該體部八 了牙過該體邛为121形 針方向傾斜-第三角度⑸^第刀乂才目對於一豎直平面沿順時 框架,之形狀較。該體可根^面所描述之該 一端部121a相對之第-= =211有弟—端部⑵a及與該第 m 卜%= 122職該體部分 m自該體部分121之第二==12化處。該接觸部分 接部分,,121:= 之線^刀124直接與諸如一液晶顯示器(LCD後置之物體 “二觸部分124沿一自該體部分121延伸之方向自 端部咖延伸。該接觸部分124可具有一向 觸ΐίίίϋ27触如—捲帶式封裝(TCP)之—積體電路接 觸。該連接部分127自該體部分121之第 ^伸叙然後水平延伸。此外,該連接部分127可具有」向:之 穹頭與尖端部。 14 200804827 可以^式:成與該連接部分m ί^]Ι : ;ϊί 該體部分ϋΪ^Ϊ^12()之微可略微不同。 材料。因:2^接=部f 124與該連接部分127可包括導電 遞至該接觸部分r24H該體部分121自該連接部分叫專 等第-探針管腳則沿該第一方向被插入該 探針管腳120間之咳第-Sm 7弟一探針管腳110與該第二 間之該第-_ G f為大約該等第一探針管腳U0 ⑴2之-半。^^或tt!:探針管腳120間之該第二間隙 第二間隙G12可為大口約Π士間f GU可為大約20μιη且該 门 J為大約20叫1時,則該第三間隙G13可Α士奶 針此兮f由在該等第一探針管腳11〇之間插入該等;-探 窄一探:著管=?,探針管㈣上ϊ 與該第三_阳可根據該物體^終 ^ ^3關2中該探針單元之框架之透視圖。 产a = t, 框架17G可為第—寬度為W3卜第一長 ίί加U二H31之長方體形狀。一接收槽176形成於 向與ί第二之一頭部處。該接收槽176朝該第一方 該接收槽176具有第二寬度W32、第二長度U2盘第 比^第W32麟第—寬度觀窄。鱗二長度L32 比該弟-長度L31短。此外,該第—深度則可大於 H31。在一典型具體實施例中,該接收槽⑺之第二寬度㈣可 15 200804827 141之寬度相同。另—選擇為,該接收槽176 之弟一見度W32可與該第二支架141之寬度略微不同。Referring to Fig. 2 and circle 7, the 哕M contact portion m and the - joint portion (four) 120 include an integral portion m, which may have a thin plate shape of a farm tool. The width W21 of 121 which is larger than the width W21 in a typical embodiment can be substantially the same as the width of the body portion of the remaining pin. Alternatively, the width of the body portion m of the t-probe pin (10) is completely different from the body portion m of the first probe pin. On the other hand, the second probe pin f2f = m is slightly shorter than the length L21 of the body portion ln of the first probe pin 11G. In the embodiment, the weight of the body portion 21 is reduced. The = type is defined as a plurality of holes 126. In addition, the body has eight teeth over the body and is tilted in the direction of the 121-pin direction - the third angle (5) ^ the first knife is for a vertical plane along the clockwise frame, the shape is relatively. The one end portion 121a of the body may be opposite to the first -==211 has a brother-end portion (2)a and the second portion of the body portion 121 from the second portion of the body portion 121 === 12 rounds. The contact portion, the line 121 of the 121:= is directly connected to the self-end coffee such as a liquid crystal display (the object behind the LCD "the two-touch portion 124 extends in a direction extending from the body portion 121. The contact The portion 124 can have an integrated circuit contact that is a touch-sensitive package (TCP). The connection portion 127 extends horizontally from the body portion 121 and then extends horizontally. Further, the connection portion 127 can have To: The hoe and the tip. 14 200804827 It can be typed: the part connected with the m ί^]Ι : ;ϊί The part of the body ϋΪ^Ϊ^12() can be slightly different. Material: 2 The connection portion f 124 and the connection portion 127 may include a conductive portion to the contact portion r24H. The body portion 121 is inserted into the probe pin in the first direction from the connection portion called the special probe-pin pin. The 120-those-Sm 7-one probe pin 110 and the second-stage __G f are about half of the first probe pins U0(1)2. ^^ or tt!: The second gap between the needle pins 120, the second gap G12 may be a large mouth, the gentleman f GU may be about 20 μm and the door J is about 20 , the third gap G13 may be a gentleman's milk needle, the 兮f is inserted between the first probe pins 11〇; - a probe: the tube = ?, the probe tube (four) And the third_yang can be based on the perspective of the frame of the probe unit in the object ^^33. Produce a = t, the frame 17G can be the first width W3, the first long ίί plus U a rectangular parallelepiped shape of H31. A receiving groove 176 is formed at one of the second faces of the second direction. The receiving groove 176 faces the first side. The receiving groove 176 has a second width W32 and a second length U2. W32 Lin - narrow view width. Scale 2 length L32 is shorter than the length - L31. In addition, the first depth can be greater than H31. In a typical embodiment, the second width (four) of the receiving groove (7) can be 15 The width of the 200804827 141 is the same. Alternatively, the degree of visibility W32 of the receiving slot 176 may be slightly different from the width of the second bracket 141.

占側壁171可垂直地佈置於該接收槽176之兩側。該 可自該框架170之頂面170a部分地突出。 L _ 向上成階梯狀之部分沿該第二方向形成於該接收槽176之 一】:在:典,具體實施例中’該接收槽176之底面包括第 可ί 76b與第三絲176e。_三底面w - 該底面176b之上,且該第二底面176b安置於該第 該底ϊιΐ上。此外’該第一底面176a、該第二底面176b與 二Ϊ、面4可大體上彼此相互平行。為佈置該第二支架141 該固底面1 一 二寶声—之見度相同。另一選擇為,該固定座173之第 與該第—支架131之寬度可略微不同。 固定Ϊ 3座之=3面自:if/1分開。在一典型具體實施例中,該 同。因此,佈置該等彼此可大體上相 侧壁m之間形成。 處之工間可於该固定座173與該等 該固定座173具有一仞於_ t 上安置有該框_ ,a,該水平面 挪定位於其上之該水/面面不上為同^平面面與該框架⑽之頂面 第一支架二佈置=固=: &gt;、U緊在地與該階梯狀部分l73b接觸。 16 200804827 ,,定f 173具有一傾斜之背面173c。在一典型具體實施例 中’該第-背面173c之-傾斜角α4可大體上與該第一探針管腳 =之第i度(XI相同。該背面173e之傾斜角α4與該第一探針 管腳110之第一角度可略微不同。 分I終端槽178形成於該框架170之頂面170遠。該終端槽178 相通。諸如該TCP之積體電路被佈置在該終端槽 外,另外之槽或階梯狀部分可形成於該框架170處。 孔弟二固定孔,、若干第二固定孔183a、若干第三固定 哕笨繁二、=弟四固疋孔187a穿過該框架170之侧壁171形成。 =兮箄/ =181&amp;、該等第二固定孔183a、該等第三固定孔185a a “專苐一固定孔183a、該等第二固定孔i85a盘兮莖筮 四固’,沿該第二方向川貝序佈置手弟-口疋孔與料弟 該等第一固定孔181a自該框架170之等側壁171至_接&amp;播 176之第—内壁176d形成 ^收槽 定孔_可相對於該第-方向傾斜。固 可沿藉由該第-方向與該第二方 之一軸“ΐ ·孔181&amp;可相對於沿該第二方向延伸 每分別_入該等第一固定孔⑻a内。 而露出。該等第一固定構件m與該第4牟14t—f 面接觸,以沿該第二方向壓該第二支架141〆弟一支*141之—背 第-3定鄰近該等第一固定孔⑻a安置。今箄 ?實施例中,該等第二固定錢3a可相對上 =成2:典型具 ^之該f二固定孔難可沿藉由該第傾^換 ,疋之一平面上之一傾斜方向佈置。另 〔、一Μ弟一方向所 可相對於沿鱗二糾替之___置 17 200804827 第二固定孔183a可朝向該第一底面176a佈置。 每插入該等第二固定孔1心内。 U 广 一端部穿過該接收槽”6之第一底 面|76a與弟二底面176b而露出。該等第二固定構件 兩側面皆接觸,以沿該第—方向與該第三方向: 第H第3定Λ1·鄰近該等第二固定孔183a定位。該等 t 孔跑可相對於該第一方向傾斜換 界疋之-平面上之-傾斜方向佈置。此外第、所 可相對於沿該第二方向延伸之軸線對稱佈卜置。#—日疋孔咖 —該等第三固定構件⑻分別被插入該等第 母一該等第三固定構件1幻之一端部穿 内。 面嶋露出。該等第三固定構件⑻與該^支座底 以沿該向與該第三方向壓該支座19()支广 接觸’ —.該等第四固定孔187a鄰近該等第三 _ 187a 170 =置該專弟四固定孔187a可相對於沿該第二方向延伸之軸線= 每-ϊΐίΞΞίΖ187分別被插人該等第四固定孔咖内。 面ϋ盥繁:广構件187之一端部通過該接收槽176之第二底 支木151之兩側面皆接觸,以沿該第—方向壓 ^加、=弟: —典口實:列中’另外之若干固定孔可穿過該“ Γ7〇形成 支架=圖圖不說明圖2中該第-支承構件之第-支架與第二 與該S架2 ΪΓ。9,該第—支承構件130包括該第-支架⑶ 18 200804827 該第-支架131支樓每-該等第一探針管腳11〇 111a,用於使得該等第-探針管腳11〇藉由該第彼; 間隔佈置。該第一支架131放置於該固定座173之上f 彼此 在本發明之一典型具體實施例中,該第一支架131 一 橫截面為L雜之樑。該第-支架131可具有與該座乃: 第三寬度糊大體上相同之寬度侧。另—選擇為,該第^ 131之寬度W41略微不同於該固定座173第二 木 該第-支㈣!具有-倾之躺131^^^之 與該第一探針管腳110之第二角度α2大體上相同。另 一選擇為,該頂面131a之傾斜角α5可略微 j 腳110之第二角度α2。 卜爪邊弟如針官 該等第-乂聊插槽135沿該第二方向形成於該第一支架 第&quot;^面131b處。該等第一針腳插槽135沿該第 f弟-針腳域135之數量可多於該等第—探針管腳&amp;之數 具體實施例中,該等第—針腳插槽135可 =135可糟由一略微不同於該等第一探針管腳ιι〇之第, G41彼此間隔開佈置。該等 丄有 ,,第-探針管腳11G之寬度wn大體 1 =有 no^iwn 135 接觸邮、略微同之寬度W42。該等第一探針管腳110之 部分。11:被插入該等第一針腳插槽135内。當該等接觸 腳U0於該第一 ί i tT!插_佈置該等第一探針管 圖3中所示之該第_門$ =該等第一採針官腳110可自動以 弟間隙G11彼此間隔開佈置。 19 200804827 該專弟-丨37沿該*二方向碱於該第—支架131 與第一背面131b處。該等第一對準插槽137位於鄰 、最外之弟一針腳插槽135處。該等第一對準插槽137被設計成 與=管腳(未顯示)相對應。該等對準‘分別被插入 -對準插槽137 0。糊被插人鱗帛 來對,第-支力細與該第三丄,或對準ί|ί 支木亥第一支架141、該第三支架151與該第四支架161。 向形成於7長I1%可沿該第一方 ^ 又1之頂面131&amp;處。此處,兩列該等第一斜 := 與處兩列該等第一對準插槽137可形成於該第-支架⑶ 用於接收每一該等第一探針管腳11〇 131 J ! 。才日136被❸十成與圖6中該第一探針管腳削之第一端部 。二第一組合槽136沿該第一方向形成。在二典型 ί弟;,之高度hu大體上相同之高度聰。另;擇 槽13二針管腳110沿該第-方向移弟動:且口 nlb 二端部 3佈置。該第二支架141放置於該接收槽176 之第二寬度職大體上姻之“二 20 200804827 架141之寬度W43可略微不同於該接 該第二支架⑷可具有—與該接枚槽 大體上相同之高度H42。另i擇為, == 該接收,m之第1度D31略微不同之高度ϋ41 了具有與 戎第二支架141具有一平坦之頂面141a。哕 145沿該第二方向形成於該第二支_ ㈤=弟:針腳插心 二針腳插槽145产該第一方二:頂面化處。該等第 =腳;槽:之數量與該等第, 等第-探物=數^期姆145之數量可多於該 在本發明之一典型具體實施例中,該等 由-間隙G42彼此間隔開佈置,該間隙⑽與該—^ = 110之第一間隙G11大體上相同。另一選擇該木^吕, 槽⑷可藉由一_不同於該等第一探針管腳 ΐίΓ=此間Γ開佈置。該等第二針腳插槽145 “有一盘 Ϊί ί 一ΪΪί腳11G之寬度WU大體上相同之寬度綱4另二 二針腳鋪145可具有與該等第一探針管腳11〇 邱八L j略微不同之寬度賴。該等第一探針管腳110之連接 邛分117分別被插入該等第二針腳插 =插^__丨45 m顧賴 所;:架=上時,該等第—探針管腳⑽可自動以圖4中The side walls 171 may be vertically disposed on both sides of the receiving groove 176. This may partially protrude from the top surface 170a of the frame 170. A stepped portion of L _ is formed in the second direction along the second direction in the receiving groove 176. In the embodiment, the bottom surface of the receiving groove 176 includes a first yoke 76b and a third wire 176e. _ three bottom surface w - above the bottom surface 176b, and the second bottom surface 176b is disposed on the first bottom surface. Further, the first bottom surface 176a, the second bottom surface 176b, and the second surface 4 may be substantially parallel to each other. In order to arrange the second bracket 141, the solid bottom surface 1 has the same visibility. Alternatively, the width of the holder 173 may be slightly different from the width of the first bracket 131. Fixed Ϊ 3 seats = 3 faces from: if / 1 separate. In a typical embodiment, the same. Therefore, the arrangement of these and the like can be formed substantially between the side walls m. The work space may be disposed on the fixing base 173 and the fixing base 173. The frame _, a is disposed on the water surface/the surface on which the water level is located. The flat surface and the top surface of the frame (10) are arranged in a first bracket 2 = solid =: &gt; U is in contact with the stepped portion l73b. 16 200804827 , , fixed f 173 has a sloping back 173c. In a typical embodiment, the tilt angle α4 of the first-back surface 173c may be substantially the same as the i-th degree (XI of the first probe pin = θ. The tilt angle α4 of the back surface 173e and the first probe The first angle of the pin 110 may be slightly different. The I-terminal slot 178 is formed on the top surface 170 of the frame 170. The terminal slot 178 is in communication. The integrated circuit such as the TCP is disposed outside the terminal slot, and A groove or a stepped portion may be formed at the frame 170. A second fixing hole, a plurality of second fixing holes 183a, a plurality of third fixing holes, and a second fixing hole 187a passing through the frame 170 The side wall 171 is formed. = 兮箄 / = 181 &amp;, the second fixing hole 183a, the third fixing hole 185a a "specifically, a fixing hole 183a, the second fixing hole i85a ', along the second direction, the Chuanbei order arrangement hand---------------------------------------------- The slotted hole _ can be inclined with respect to the first direction. The solid can be along the axis of the first direction and the second side of the second axis ΐ · hole 181 & Exposed to each of the first fixing holes (8)a in the second direction, the first fixing members m are in surface contact with the fourth 牟14t-f to press the second direction The second bracket 141 is a pair of *141-back--3 fixed adjacent to the first fixing holes (8)a. In the embodiment, the second fixed money 3a can be relatively up=2: typical ^ The two fixed holes of the f can not be arranged along the tilt direction of one of the planes by the first tilting, and the other direction can be corrected with respect to the scales. 17 200804827 The second fixing hole 183a can be arranged toward the first bottom surface 176a. Each of the second fixing holes 1 is inserted into the inner core of the second fixing hole 1. The U end portion passes through the first bottom surface |76a of the receiving groove "6" The second fixing member is in contact with each other to be positioned along the first direction and the third direction: the Hth third fixed point 1 is adjacent to the second fixing holes 183a. The t holes can be run. Arranging with respect to the first direction obliquely - in the plane - oblique direction. Further, the second, extending relative to the second direction The line-symmetric cloth is placed. #—日疋孔咖—The third fixing members (8) are respectively inserted into the first mother member and the third fixing member 1 is bent into one end portion. The face is exposed. The fixing member (8) and the bottom of the support base are in contact with the support member 19() in the third direction. The fourth fixed holes 187a are adjacent to the third _187a 170. The four fixing holes 187a are insertable into the fourth fixing holes respectively with respect to the axis extending in the second direction = every ϊΐ ΞΞ ΞΞ Ζ 187. The surface of the wide member 187 is contacted by both sides of the second bottom branch 151 of the receiving groove 176, so as to be pressed along the first direction, and the younger brother: a plurality of fixing holes may pass through the "Γ7〇 forming bracket=Fig. does not illustrate the first bracket of the first support member in Fig. 2 and the second and the second frame 2. The first support member 130 includes the The first bracket (3) 18 200804827 The first bracket 131 spans each of the first probe pins 11〇111a for arranging the first probe pins 11 by the first and second intervals. The first bracket 131 is placed on the fixing base 173. In a typical embodiment of the present invention, the first bracket 131 has a cross section of a beam of L. The first bracket 131 can have a seat with the seat : The third width paste is substantially the same width side. Alternatively, the width W41 of the first width 131 is slightly different from the second base of the fixing base 173. The first branch (four) has a tilting lying 131^^^ The second angle α2 of the first probe pin 110 is substantially the same. Alternatively, the tilt angle α5 of the top surface 131a may be slightly smaller than the first leg 110 The angle α2. The claw-side brother, such as the needle officer, the first-speaking slot 135 is formed along the second direction at the first bracket &quot;^ face 131b. The first stitch slot 135 along the f The number of pin-pin fields 135 may be more than the number of the probe-pins &amp; the number of pin-pin slots 135 may be 135 may be slightly different from the first probe The needle pin ι 〇, G41 is spaced apart from each other. The width of the first probe pin 11G wn is generally 1 = there is no ^ iwn 135 contact post, slightly the same width W42. a portion of a probe pin 110. 11: is inserted into the first pin slots 135. When the contact pins U0 are disposed in the first probe tube, the first probe tubes are arranged in FIG. The first door $1 is shown to be automatically spaced apart from each other by the parental gap G11. 19 200804827 The younger brother-丨37 is in the same direction as the first bracket 131 The first backing slot 137 is located at the adjacent, outermost one-pin slot 135. The first alignment slots 137 are designed to be aligned with the = pin (not shown). Correspondingly, the alignments are respectively inserted-aligned into the slot 137 0. The paste is inserted into the scale, the first force is fine with the third jaw, or the ί|ί 支木海 first bracket 141, the third bracket 151 and the fourth bracket 161. The formation of the length I1% can be along the top surface 131 &amp; of the first square ^1. Here, the two columns of the first slope: = and Two rows of the first alignment slots 137 may be formed in the first bracket (3) for receiving each of the first probe pins 11 〇 131 J ! . The day 136 is smashed into the first end of the first probe pin in Fig. 6. The second first combination groove 136 is formed along the first direction. In the second typical ί brother;, the height of hu is roughly the same as the height of Cong. In addition, the two-pin 110 of the slot 13 is moved in the first direction: and the two ends 3 of the port nlb are arranged. The second bracket 141 is placed in the second width of the receiving slot 176. "The width of the second 20 200804827 frame 141 W43 may be slightly different from the connection of the second bracket (4) may have - substantially The same height H42. Alternatively, == the receiving, the first degree D31 of m is slightly different height ϋ41 has a flat top surface 141a with the second bracket 141. The 哕145 is formed along the second direction In the second branch _ (five) = brother: the pin inserts the two-pin slot 145 to produce the first square two: the top surface. The first = foot; slot: the number and the number, the first - the first object The number of numerators 145 may be more than that. In a typical embodiment of the present invention, the gaps G42 are spaced apart from each other, and the gap (10) and the first gap G11 of the ^^=110 are substantially The same is selected. The other option is that the slot (4) can be arranged by a different one than the first probe pins 。 Γ 。 。 该 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 The width of 11G is substantially the same as the width of the frame 4 and the other two pins 145 can have the same with the first probe pin 11 〇 Qiu L L j slightly The width of the micro is different. The connection points 117 of the first probe pins 110 are respectively inserted into the second pin insertions=inserts__丨45m dependencies; when the shelves=up, the first probe pins (10) Can automatically be in Figure 4

所不之,=一間隙G11彼此間隔開佈置。 U T &gt;^?第二對準鋪147沿該第二方向形成於該第二支牟141 之頂面141a處。該等第二對準插槽147位於鄰近最 二紅 插#145處。該等第二對準插槽147被設計成與對準管二 等對準管腳分別被插入該等第二對準插槽 四支架161,或對準該第—支架⑶、該第二ί 木41該弟二支架151與該第四支架161。 文 21 200804827 用於接收每-該等第-探針管腳11〇之第二端部m 組合槽146形成於該第二支架⑷之一正面隱處。 ^ 槽146被設計成與圖6中該第一探針管㈣〇之第二端部^ : ^相對應。該第二組合槽146沿該第—方向形成。在—血型且 體;施例中’該第二組合槽146可具有—與該第—探針管 t t組合槽146可具有與該第—探針管腳11G之第二端ί 111b之高度Η12略微不同之高度⑽。 *一缟邛 146 二端部被插入該第二組合槽 t 弟—端部Ulb可被緊緊地插入該第二植人 9 了止該第一探針管卿110沿該第一方向移動。。 之透ΙΓ 一圖示說明圖2中該第二支承構件之第三與第四支架 與該ΐΞ=ω’該第二支承咖包括該第三伽 等第二探針管_之第-端部 支架151被固定至該等支座190。、 * 之上。'亥第二 樑形例中’該第三支架⑸可為一直 大體上_之綠W51。^^^^76之#二寬度W32 151 心該第-二=二:;。該等第三針腳插槽 二針腳插槽155沿該第_方向罢&quot;^。 頂面151a處。該等第 等第三針腳插槽155之數_^^具體實施例中,該 體上相同。另一選擇A 弟一铋針管腳^之數量可大 等第二探針數ί4弟三針腳插槽⑸之數量可多於該 22 200804827 夢由3 型具體實施例中’轉第三針腳插槽155可 ϋϊί 舰間隔開佈置。該等第三針腳插槽⑸可且有 2ίί Πί ΐ腳12G之寬度W21 Α體上姻之寬度咖 120 弟三針腳插槽155可具有與該等第二探針管腳 接舖^微不同之寬度觀。該等第二探針管腳12〇之 ^刀別,入該等第三針_槽155 a。當該等接觸 0刀 被插入該等第三針腳插槽155内以佈置該等第二探針營 第三支架⑸上時,該等第二探針管二可= 圖3,所示之該第二間隙G12彼此間隔開佈置。 该等第二對準插槽Μ沿該第二方_成於該第三支架⑸ i2=5ia處。該等第三對準插槽157位於鄰近最外之第三針腳 插槽155處。該等第三對準插槽157被設計成與對準管腳(未顯 =)相對應。該等對準管腳分別被插入該等第三對準插槽内。 =用被插人該·三對鞠槽157舰該等解管麟準該 ^架131與該第三支架15卜或對準該第一支架131、該第二支架 141、該第三支架151與該第四支架161。 ” 與該等第二探針管腳120之第一端部121&amp;組合之第一組合 154形成於該第二支架151之一背面151b處。如圖7所示,該第 一組合桿154被設計成與該第二探針管腳12〇之第一固定槽122 之形狀相對應。因此,該第-組合桿154沿該第—方向形』。舉 =而言’當該第-固定槽122可具有一矩形橫截面時,該第一組 j 154财一與該第一固定槽122之橫截面大體上相同之矩形 k,面。在一典型具體實施例中,該第一組合桿154可具有一與 該第一固疋槽122之咼度H13大體上相同之高度H51。另一選擇 為,該第一組合槽154可具有與該第一固定槽122之高度H13略 微不同之高度H51。 23 200804827 该第一組合桿154被插入該等第二探針管腳12〇之第一固定 槽122内。此處,該第一組合桿154被緊緊地插入該第一固定样 122内L用以防止該等第二探針管腳120沿該第一方向移動。曰 该第二支架151之一下表面之兩邊形成若干爪156。在一血 具體貝施例中,該等爪156可具有一與該等支座刚之寬度$ 同ί寬度W56°另一選擇為,該等爪156可具有i該等 支座190之1度W55略微不同之寬度W56。 /、、 支座述’糊該等爪156該第三支架151可被佈置於該等 用以佈置於該框架170之固定座173之兩侧處, 可呈有2圖^中^二^在一典型具體實施例中,該等支座190 大體ί相!^:5疋„該等側壁171間之該間隙B3! 8中該固定座173又盥兮等為’該等支座190可具有與圖 度W55。 相壁171間之該間隙B31略微不同之寬 =:==觸形狀。該第三支架⑸之二= 月面190c可相對於該第二 二T貞斜之月面190c。該 ⑵b,ΐ得i;以工:等管腳12。之第二蠕部 猎由5亥弟二間隙G12彼此間隔 24 200804827 佈置。該第二支架被放置於該接收槽176内。 於該接收槽176内之該第二支架141之上。”弟四支采161位 該第四支架161包括一固定部分163與一 典型具體實施例中,該固定部分163可為一嫁邛刀166。在一 分⑹具有-平坦之頂面163a。該等以針狀。該固,部 方向形成於該蚊部分163之頂面163&amp;處。該等該弟二 腳插槽165之數量與該等第二獅f管腳體旦該等第四針 同。另-選擇為,該等第四針腳插槽165之數亡相 探針管腳120之數量。 里了夕於该等弟二 在本發明之一典型具體實施例中 藉由-間_此間隔開佈置,該間隙:⑶ 腳120之第二間隙G12大體上相 ^ w荨弟一抓針官 插槽165可藉由-與該等第二探針管腳⑽第」=== 不同之間隙G52彼此間隔開佈置。該等第四針略微 一與該等第二探針管腳12〇之寬度w / 65可具有 m之寬度W21略微不同之寬度。該^第U忒:腳 ;=27分別被插入該等第四針腳插以 &quot;77 被插入该等第四針腳插槽丨65内以佈置該等第二庐 腳120於該固定部分163之上詨 私二荨弟一奴針官 地藉由該第二間隙G12彼此間隔開佈1。一木、十官腳咖可自動 外四/样插槽167沿該第二方向形成於固定部分163之 Ϊ該等第四對準插槽167位於鄰近最外之第Hi - °5亥等第四對準插槽167被設計成與對準管腳C夫顧 -古加141 d ί相對準插槽167内之該等對準管腳來對料裳 ztT二與該第四支架161,或對準該第-支架⑶ΐίΞΐ 木卜該弟二支架151與該第四支架⑹。 X弟一支 25 200804827 與該第二探針管腳120之第二端部i2 164形,該固定部们63之—正面_處。如圖= -組合杯164被設計成與鄕二探管 1 對應。因此,該第二組合桿⑹沿該第工 ,二^固定槽m具有矩形橫截面時,該第二組合 “ΐί:固定槽123之橫截面大體上相同之矩形顯面。^-典型具體實施例中’該第二組合槽164可具有—^ 123之高度Η14大體上相同之高度出2。另—選g為;第j 3。164可具有與該第二固定槽123之高度m4略微不g之高度 等第二組合桿164被插人該等第二探針管腳⑽之第二固 ^槽3内。該第二組合桿164可被緊緊地插人該第二固定槽⑵ 内,用,防止該等第二探針管腳12〇沿該第一方向移動。 該,支撐部分166形成於該固定部分163之一下表面之兩 邊。該等支撐部分166具有一橫截面為l形之樑形狀。該等支撐 部分166可彼此對稱地佈置於該固定部分163之下表面之兩邊。 包括該固定部分163與該等支撐部分166之第四支架161可具有 二與該接收槽176之第二寬度W32大體上相同之寬度W53。g 一 選擇為,包括該固定部分163與該等支撐部分166之第四支架161 可具有與該接收槽176之第二寬度W32略微不同之寬度…^。 下文中將參照該等附圖詳細描述製造該探針單元丨⑻之一方 法。 圖11至圖17為圖示說明製造圖2中該探針單元之一方法之 透視圖與橫截面視圖。 苓照圖11與圖12,該第一支承構件130與該框架17〇組合。 在一典型具體實施例中,該第一支架131可被放置於該固定座^73 上。該第二支架141可被佈置於該接收槽176之第一底板176a上。 此處,可佈置該第一支架m與該第二支架141,使得該第一支架 131之第一組合槽136與該第二支架141之第二組合槽146彼此相 26 200804827 對。 該第-忿目固對定一定方第二方向之位置確定後, 寬度=支176之寬度大體上相同之 支架141沪該第一古被插入該接收槽Π6後,該第二 接收槽‘内州:以二支架⑷被插入該 置即可被確定。 木41相對於該第一方向之一位 ,,被佈置於該第一支架⑶與該第二支 ί-端iufa :疒ίΐ 131支撐該等第一探針管腳no之 第二端部111b。〇弟一 * 141支撐該等第一探針管腳110之 在-:^^口7^管腳m與該第—支架131組合。 Τ,βΧ$^Π1α -探針管腳削之接觸部分114可;;支=: 一針腳插槽135之内。 乐叉木131之弟 槽第有與該第, -組合槽喝合:3第llla可與該第 方向移動。 ㈣針讚U0可不沿該第— 利用該上述之過程,所有該等第一探 支架m組合。因此,該等第一探針管腳11〇之第一端了; 猎由如圖3所示之該第—間隙如彼此間隔開佈置。 7 參照圖14與圖15,該等支座190被佈置於該固定座173之兩 27 200804827 典^具體實施例中,該等支座190可被放置於該接收槽 Lmi _與第三底板mc上。該等支座刚由該第: 内:ίίΐΐί?件185被插入該框架170之第三固定孔_ 185之專支 至該框架170。此處,該等第三固定構件 露出之觸該等第三固定構件⑻之被 :接收ij:逆 外,該mt支座190相對於該第二方向之一位置被確定。此 支座;90之'^疋構件185 第三方向壓該等支座190。當該等 第:固定舰^面娜與該第二底板176b $隔開時,利用該等 弟構件185可調節該等支座刚之頂面施之傾角。手 16ΗΓίΓϋ51被佈置於該等支座190上。然後該第四支架 第四切τί知—支架141上。此處’佈置該第三支架151與該 架之第—固定桿154與該第四支 移軸第三支架151以緊密連接該第三絲⑸至該等 ㈣,,該第三支架151相對於該第 確定=_與=_座=之兩側彼此對準,以 後;:=1被:第至;=,方向之位置被確定 内之= 161被插入該接收槽176内。此處,該接收槽176 。因此,該第四支架 之一 接收槽176内之同時’該第四支架⑹沿該第-方向 置被確疋。此外’該第四支架161之第四對準插槽167與 28 200804827 f二支架141之第二物_7可沿該第二方向大體上被對 架於該第三支架⑸與該第四支 端部121a。另一方面,=51支撐該等第二探針管腳120之第一 之第二端部121b。 X弟四支条161支撐該等第二探針管腳120 12〇之第-固定槽122弟二旱154被插入該等第二探針管腳 固定槽122嗜合,以便^寻楚疋吕4之,該第一组合桿154與該第一 移動。該等第二探針針㈣120可不沿該第一方向 架⑸之第三針腳插槽I中之接觸部分124被放置於該第三支 架丨程該:J該二探針管腳m可與該第三支 探針管腳12G之第—购191 f此間&amp;開佈置。此外,該等第二 與該等第-探3所示之該第三間隙G13 參照圖,該llla間隔開佈置。 分別組合該等第一件⑻被插入該框架Π〇内,以 支架151、該第四支架。、該等第二探針管腳120與該第三 141d接觸。續辇筮一田〜址細丨该弟一支木141之背面 141,以緊密連接該第二以14118^該f 動該第二支架If not, = a gap G11 is arranged spaced apart from each other. U T &gt; ^? The second alignment pad 147 is formed at the top surface 141a of the second support 141 along the second direction. The second alignment slots 147 are located adjacent to the second red socket #145. The second alignment slots 147 are designed to be inserted into the second alignment slot four brackets 161 respectively with the alignment tube second alignment pins, or to the first bracket (3), the second The wood 41 is the second bracket 151 and the fourth bracket 161. Article 21 200804827 The second end m combination groove 146 for receiving each of the first probe pins 11 is formed on the front side of one of the second brackets (4). The slot 146 is designed to correspond to the second end portion ^ of the first probe tube (four) in FIG. The second combination groove 146 is formed along the first direction. In the embodiment, the second combination groove 146 may have a height Η12 with the second probe tt 111b of the first probe pin 11G. Slightly different heights (10). * One end 146 is inserted into the second combination slot. The second end portion Ulb can be tightly inserted into the second implanting member 9 to stop the first probe tube 110 from moving in the first direction. . Illustrating the third and fourth brackets of the second support member in FIG. 2 and the second support coffee including the third end of the third probe tube The bracket 151 is fixed to the holders 190. , * above. In the second example of the beam, the third bracket (5) may be substantially always green. ^^^^76##Width W32 151 Heart the first-two=two:;. The third pin slot 1/2 pin slot 155 along the _ direction. At the top surface 151a. The number of the third stitch slots 155, etc., is the same in the embodiment. Another option A brother, the number of needles can be greater than the number of second probes ί4 brothers three-pin slots (5) can be more than the number of 22 200804827 Dream by type 3 in the specific embodiment of the 'turn to the third pin slot 155 ϋϊ 舰 The ship is spaced apart. The third pin slot (5) can have a width of 2 ίί Π ΐ foot 12G W21 宽度 上 之 咖 咖 咖 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 120 Width view. The second probe pins 12 are inserted into the third pin slots 155a. When the contact 0 knives are inserted into the third pin slots 155 to dispose the second probe battalion third brackets (5), the second probe tubes 2 can be as shown in FIG. The second gaps G12 are arranged spaced apart from each other. The second alignment slots are along the second side at the third bracket (5) i2=5ia. The third alignment slots 157 are located adjacent the outermost third pin slot 155. The third alignment slots 157 are designed to correspond to alignment pins (not shown). The alignment pins are respectively inserted into the third alignment slots. = The first bracket 131, the second bracket 141, the third bracket 151 are aligned with the third bracket 15 or the third bracket 15 or the third bracket 151. And the fourth bracket 161. A first combination 154 combined with the first end portion 121 & of the second probe pin 120 is formed at one of the back faces 151b of the second bracket 151. As shown in Figure 7, the first combination lever 154 is It is designed to correspond to the shape of the first fixing groove 122 of the second probe pin 12〇. Therefore, the first-combination rod 154 is shaped along the first direction. When the 122 can have a rectangular cross section, the first set j 154 is substantially the same rectangular cross section as the cross section of the first fixing groove 122. In a typical embodiment, the first combination rod 154 There may be a height H51 which is substantially the same as the width H13 of the first fixing groove 122. Alternatively, the first combination groove 154 may have a height H51 slightly different from the height H13 of the first fixing groove 122. 23 200804827 The first combination rod 154 is inserted into the first fixing groove 122 of the second probe pins 12 . Here, the first combination rod 154 is tightly inserted into the first fixed sample 122 L is for preventing the second probe pins 120 from moving in the first direction. The lower surface of one of the second brackets 151 A plurality of jaws 156 are formed. In a blood specific embodiment, the jaws 156 can have a width of the same as the width of the holders, and the width is W56. Alternatively, the jaws 156 can have i such 1 degree W55 of the support 190 has a slightly different width W56. /,, support, the claws 156, the third bracket 151 can be disposed on the two sides of the fixed seat 173 for the frame 170 In the exemplary embodiment, the holders 190 are substantially ί phase! ^: 5 疋 Between the sidewalls 171, the gap B3! 8 in the holder 173 Further, etc., the legs 190 may have a map W55. The gap B31 between the phase walls 171 is slightly different in width =:==touch shape. The second bracket (5) two = lunar surface 190c may be opposite to the second second T skewed moon surface 190c. The (2)b, won the i; work: equal to the pin 12. The second worm is hunted by 5 haidi two gaps G12 separated from each other 24 200804827. The second bracket is placed within the receiving slot 176. Above the second bracket 141 in the receiving slot 176. The fourth bracket 161 includes a fixed portion 163. In a typical embodiment, the fixed portion 163 can be a wedding knife 166. The top surface 163a has a flat surface at one point (6). The needle is in the form of a needle. The solid portion is formed at the top surface 163 &amp; of the mosquito portion 163. The number of the second leg slots 165 is the same as the fourth needle of the second lion f-tube body. The same is selected as the number of the dead phase probe pins 120 of the fourth pin slot 165. In the exemplary embodiment of the present invention, the second embodiment is The spacing is arranged, the gap: (3) the second gap G12 of the foot 120 is substantially different from the second needle (10) by the second probe pin (10) === The gaps G52 are arranged spaced apart from each other. The fourth pin is slightly different from the width of the second probe pin 12 w w / 65 may have a width slightly different from the width W21 of m. The second 忒:foot;=27 are respectively inserted into the fourth stitches and inserted into the fourth stitch slot 丨65 to arrange the second mortises 120 to the fixed portion 163 The upper two brothers and one slave are separated from each other by the second gap G12. A wooden, ten-footed, automatic outer four-like slot 167 is formed in the second direction along the fixed portion 163. The fourth alignment slot 167 is located adjacent to the outermost Hi-°5 The four alignment slots 167 are designed to align with the alignment pins C-Guga 141 d ί in the alignment slots 167 to align the pins ztT II with the fourth bracket 161, or The second bracket 151 and the fourth bracket (6) are aligned with the first bracket (3) ΐίΞΐ wood. The X-part 25 200804827 is in the shape of a second end i2 164 of the second probe pin 120, and the fixed portion 63 is at the front side. As shown in the figure = - the combination cup 164 is designed to correspond to the second probe 1. Therefore, when the second combination rod (6) has a rectangular cross section along the second working, the second combination "ΐ: the rectangular surface of the fixing groove 123 having substantially the same cross section. ^ - Typical implementation In the example, the second combination groove 164 may have a height Η 14 of the height Η 14 which is substantially the same height 2. The other is g; the j 3.164 may have a slightly lower height than the height m4 of the second fixing groove 123. a second combination rod 164 such as a height of g is inserted into the second fixing groove 3 of the second probe pins (10). The second combination rod 164 can be tightly inserted into the second fixing groove (2) The second probe pin 12 is prevented from moving in the first direction. The support portion 166 is formed on two sides of a lower surface of the fixed portion 163. The support portions 166 have a cross-section The support members 166 can be symmetrically disposed on opposite sides of the lower surface of the fixed portion 163. The fourth bracket 161 including the fixed portion 163 and the support portions 166 can have two receiving slots 176 The second width W32 is substantially the same width W53. g is selected to include the fixed The sub-frame 163 and the fourth bracket 161 of the support portions 166 may have a width slightly different from the second width W32 of the receiving groove 176. The probe unit (8) is manufactured in detail hereinafter with reference to the drawings. Figure 11 through Figure 17 are perspective and cross-sectional views illustrating a method of manufacturing the probe unit of Figure 2. Referring to Figures 11 and 12, the first support member 130 and the frame 17 In a typical embodiment, the first bracket 131 can be placed on the fixing base 73. The second bracket 141 can be disposed on the first bottom plate 176a of the receiving slot 176. The first bracket m and the second bracket 141 are disposed such that the first combination slot 136 of the first bracket 131 and the second combination slot 146 of the second bracket 141 are opposite each other. After determining the position of the second direction of the certain square, the width=the width of the branch 176 is substantially the same as the bracket 141. After the first ancient is inserted into the receiving slot 6, the second receiving slot is the inner state: the second bracket (4) is Inserting the set can be determined. The wood 41 is relative to the first direction , the first bracket (3) and the second branch iufa: 疒ίΐ 131 support the second end portion 111b of the first probe pins no. The younger one* 141 supports the first one The probe pin 110 is combined with the first bracket 131 at the -: ^^ port 7^. The 接触, βΧ$^Π1α - the contact portion 114 of the probe pin can be cut; Within the slot 135. The fork of the yuemu 131 has the same as the first, - the combination slot: 3 llla can move with the first direction. (4) The needle praises U0 may not follow the first - using the above process, all The first probe brackets m are combined. Therefore, the first probe pins 11 are at the first ends; the first gaps are arranged as spaced apart from each other as shown in FIG. 7 and FIG. 15, the holders 190 are disposed in the two embodiments of the holder 173. In the embodiment, the holders 190 can be placed in the receiving slot Lmi_ and the third bottom plate mc. on. The holders are just inserted into the frame 170 by the first: inner: ίίίί member 185 inserted into the third fixing hole _185 of the frame 170. Here, the third fixing members are exposed to the third fixing members (8) to receive: ij: inverse, the position of the mt holder 190 with respect to the second direction is determined. The holder 185 of the holder 90 presses the holders 190 in the third direction. When the first: fixed ship surface is separated from the second bottom plate 176b $, the inclination of the top surface of the support can be adjusted by the member members 185. A hand 16ΗΓίΓϋ 51 is placed on the holders 190. Then the fourth bracket is the fourth cut, which is known as the bracket 141. Here, the third bracket 151 and the first fixing rod 154 of the frame and the fourth supporting shaft third bracket 151 are arranged to tightly connect the third wire (5) to the fourth (4), wherein the third bracket 151 is opposite to the fourth bracket 151 The first determination =_ and =_ block = both sides aligned with each other, and later;: = 1 is: the first to; =, the position of the direction is determined = 161 is inserted into the receiving slot 176. Here, the receiving slot 176. Therefore, one of the fourth brackets receives the slot 176 while the fourth bracket (6) is set in the first direction. In addition, the fourth alignment slot 167 of the fourth bracket 161 and the second object _7 of the second bracket 141 can be substantially aligned with the third bracket (5) and the fourth branch along the second direction. End portion 121a. On the other hand, = 51 supports the first second end portion 121b of the second probe pins 120. The X-four strips 161 support the second probe pins 120 12 〇 the first-fixing slot 122 Di Er 154 is inserted into the second probe pin fixing slots 122, so that 4, the first combination rod 154 moves with the first. The second probe pins (four) 120 may be placed in the third bracket without the contact portion 124 in the third pin slot 1 of the first direction frame (5): J the two probe pins m can be The third probe pin 12G is the first to purchase 191 f. Further, the third gaps G13 indicated by the second and the third probes 3 are referenced to the figure, and the llla is spaced apart. The first pieces (8) are respectively inserted into the frame frame to support the frame 151 and the fourth frame. The second probe pins 120 are in contact with the third 141d. Continued to 辇筮一田~ The location of the younger brother 141 on the back of the 141, to tightly connect the second to 14118^ the f move the second bracket

之第—底板伽與第二底板176b GH141c至該接收槽176 因而該等第一探針管腳110與該第二支架141《且人 針管腳12〇與該第四支架161組合 之:G =Γ110之第二端部lllb被插入該第二支架ί之ί;人 164 之弟-□疋槽123内。此處,該等第—探針管腳11〇 29 200804827 之連接部分117被定位於該第二支 此外,該等第二探針管腳m之連\, 弟^^插槽145中。 之第四針腳插槽165中。連接#刀127位於雜四支架161 如圖4所示,被固定至該第二支架.141 固该等第二固定構件183被插入該框架170之第-而露出;該等第二固定構件183 183 161以固疋該弟一支架141與該第四支架161。因而兮楚结 針管腳110與該等第二探針管腳12 弟一探 定。此外,該等第二固定構件5向之斜面被確 以於該第-嫩支側面: ^=83被插入該框架17〇内之深度,該第四支架ΐ6ι可 準 可触第二絲141之第二對準插槽 内。= =被插入該框架170之第四固定孔187a ^固定,件187之被露出之端部與該等支座m之侧 一 該荨弟四固定構件187壓該等支座携之側面,以在該第一^ 上固定該第二支架151與該等支座19〇。此處,根據該等第四固 構件187被插入該框架170内之深度,該第三支架151與該等支 座190可沿該第-方向輕微移動。因此,藉由輕微移動該第Λ 架151與該等支座190’該第一支架131之第一對準插槽137可與 30 200804827 該第三支架151之第三對準插槽157對準。 如上所述,該第一支架131與該第二 器第:探針管腳110之接觸部分⑶= 架⑷;Πί 之·^弋自該第二支 部分=皮電=該=:支C被露出之連接 161支撐*a路料二支架151與該第四支架 分124 ϋ第官腳120。該等第二探針管腳120之接觸部 *之』ΐ部體絲161之被露 ==聊=〇等之第接觸^分114、124可位於一=上相^ ⑴-一;-r趙與二探之^ 一間隙G11彼此間隔開佈置。 腳 ·稭由μ弟 7,由該第至; 構件181、m μ也〜等弟 第一、弟二與第四固定 Ί 口此该尋弟一板針管腳110與該等第二探斜贫娜 i 130 根據本%明之典型具體實施例,該等第一探針管腳則與該 200804827 專弟二採針,12G可快速、容易而精確地佈置 -探針管腳m與該等第二探針管腳12〇可具有二;J弋 外,本發明之該探針單元可易於維修。 3隙。此 一圖=為-圖示說日嫌據本發明之_典型具體實 圖二為圖18' “r部分之-放大透視圖圖 ]8 21 …參照圖18至圖21,-探針單元2〇〇包括圖 广,管腳U0與該等第二探針管腳⑽。因此,為專 在^略表Γ該等第一探針管腳110與該等第二探針管腳120之 ==_似針管請之元件 腳=探?ίί200包括該等第一探針管腳110、該等第二探針管 、弟一支承構件23〇、第二支承構件250、一框架27〇、若 甚第ΐΛ架231與該第二支架241被佈置於該框架270之上。 =5 f干第—對準插槽237沿第一方向形成 莖楚一^支Γ231之一表面部分處。在一典型具體實施例中,該 腳番槽235可藉由第一間隙G21彼此間隔開。若干第二 第二Hi ί若:第二對準插槽247可沿該第-方向形成於; 第分處。該等第二針_ 245可藉由該 =等第探針管腳U0被插入該等第一與第二支架231、241 咖Ϊ「典?具體實施例中,每—該㈣—探針管腳11G之-端 。阿被插入母一該等第一針腳插槽235内。每一該等第一探針管 32 200804827 之ί2部可被插入每一該等第二針腳插槽245内。因此, Γίί 可藉由該第-間隙G11彼此間隔開佈ί。 此處隙G11可根據n 1布置 三固支架-之兩側。利用ί等第 251被放置於該等被二至=二該第三支架 支架241之上。 工巧弟四支条261被定位於該第二 向形插槽257沿該第-方The first base plate gamma and the second bottom plate 176b GH 141c to the receiving groove 176 and thus the first probe pin 110 and the second bracket 141 "and the human pin 12 〇 is combined with the fourth bracket 161: G = The second end portion 11lb of the crucible 110 is inserted into the second bracket ί; Here, the connection portion 117 of the first probe pin 11 〇 29 200804827 is positioned in the second branch. Further, the second probe pins m are connected to the slot 145. The fourth pin slot 165 is in the middle. The connection #刀127 is located on the miscellaneous four bracket 161. As shown in FIG. 4, it is fixed to the second bracket. 141. The second fixing members 183 are inserted into the first portion of the frame 170 to be exposed; the second fixing members 183 183 161 to fix the younger one bracket 141 and the fourth bracket 161. Thus, the pin terminal 110 is probed with the second probe pins 12. In addition, the second fixing member 5 is slanted to the first side of the first leg: ^=83 is inserted into the frame 17 〇, the fourth bracket ΐ6ι can be touched by the second wire 141 The second alignment slot is inside. = = the fourth fixing hole 187a of the frame 170 is fixed, and the exposed end of the member 187 and the side of the holder m are pressed against the side of the holder. The second bracket 151 and the brackets 19 are fixed on the first surface. Here, the third bracket 151 and the brackets 190 are slightly movable in the first direction according to the depth at which the fourth fixing members 187 are inserted into the frame 170. Therefore, the first alignment slot 137 of the first bracket 131 can be aligned with the third alignment slot 157 of the third bracket 151 by 30 200804827 by slightly moving the first bracket 151 and the brackets 190'. . As described above, the contact portion (3) of the first bracket 131 and the second probe: probe pin 110 = frame (4); Πί的^弋 from the second branch portion = skin electricity = the =: branch C is The exposed connection 161 supports the *a road material two bracket 151 and the fourth bracket portion 124 ϋ the official foot 120. The contact portion of the second probe pin 120 is exposed to the ΐ 体 body wire 161 == 聊=〇, etc. The first contact points 114, 124 can be located at a = upper phase ^ (1) - one; -r Zhao and the second exploration ^ A gap G11 is arranged apart from each other. The foot and the straw are from the younger brother 7, from the first to the; the member 181, m μ also ~ the first brother, the second and the fourth fixed Ί mouth, the 寻弟一板针管110 and the second poor According to a typical embodiment of the present invention, the first probe pins are aligned with the 200804827 special brother, and the 12G can be quickly, easily and accurately arranged - the probe pin m and the second The probe pin 12A can have two; in addition, the probe unit of the present invention can be easily repaired. 3 gaps. Figure 1 is a diagram - the illustration is based on the present invention - a typical concrete diagram 2 is Figure 18 '"r portion - enlarged perspective view" 8 21 ... with reference to Figures 18 to 21, - probe unit 2 〇〇 includes a wide picture, pin U0 and the second probe pin (10). Therefore, it is specifically for the first probe pin 110 and the second probe pin 120. _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The second truss 231 and the second bracket 241 are disposed on the frame 270. The =5 f dry-aligning slot 237 is formed at a surface portion of the stem 231 in a first direction. In a typical embodiment, the legs 235 may be spaced apart from each other by a first gap G21. A plurality of second second ί: the second alignment slot 247 may be formed along the first direction; The second pin _245 can be inserted into the first and second brackets 231, 241 by the = probe pin U0. "In the specific embodiment, each - the (four) - probe Pin 11G - end A first inserted into the first pin slot 235. Each of the first probe tubes 32 200804827 can be inserted into each of the second pin slots 245. Therefore, Γίί can be The first gap G11 is spaced apart from each other. Here, the gap G11 can be arranged on both sides of the three solid brackets according to n 1. The second bracket bracket 241 is placed on the second bracket bracket 241 by using ί et al. The second branch 261 is positioned in the second direction slot 257 along the first side

中,該等第三針腳插槽255可“第典,具體實施例 若干第四針腳插槽265與若干第===彼此^開佈置。 形成於該第四支架261 $ 一矣 ^插槽267 了,口该弟一方向 該等第四針腳插槽265可葬^ ^处。、在一典型具體實施例中, 該第三Pm省猎由?弟—間隙G22彼此間隔開。 另外相對;該U 24= 7支架231對準。該第四支架261 腳120之另一姓立βυ土4本、— ’甘為寻弟一知針官 該等第二探針等第四針腳插槽265内。因此, 該第二_ G22可根據物隙G22彼此間隔開。此處, 間的該第-可與該等第-探針管請之 架24ΐ與該第四支架26八二I框采27〇。同時,該第二支 與該等第二探針管腳120。刀,J被固疋至該等第一探針管腳no 元件了文將挪該__細描述該探針單元200中之該等上述 33 200804827 圖22為一圖示說明圖21中該探針單元之框架之透視圖。 參照圖22,該框架270可為-具有第一寬度麗、第一長度 L61與第-高度H61之矩形平行六面體。該框架27()包括第一底 板271與第二底板275。該第-底板271被佈置成比該第二底板 275低第一深度D61。該第一底板271與該第二底板2乃分別且 平坦之頂面271a與275a。 /、 第一接收槽276形成於該第二底板275之頂面275a處。該第 -接收槽276朝該第-方向與該第二方向開口。該第一接收槽276 可具有第二寬度W62、第二長度L62與第二深度腿。該第一接 收槽276之第二寬度W62可與該第二絲241之寬度大體上相 同。若干側壁272可垂直佈置於該第一接收槽]之兩側。即, 侧壁272之内侧表面276b可界定第一接收槽276。該第二深度D62 可大體上比該第-棘D61更深。因此,—階梯狀部分275b形成 於,第一接收槽276與該第一底板271之間。該第二支架241與 該第四支架261被佈置在該第一接收槽276中。 ” 一與該第一接收槽276相通之開口 278形成於該第二底板2乃 之頂面275a處。該開口 278可具有比該第一接收槽276之第二寬 度*W62大體上更窄之第三寬度W63。該開口 278沿大體上垂直於 該第-方向與第二方向之第三方向穿過該第二底板275形成。諸 如一 TCP之一積體電路安置於該開口 278中。 一固定座273形成於該框架27〇之第一底板271上。該固定 ΐ 2?1可具有比該第一接收槽276之第二寬度w62大體上更窄之 第四寬度W64。_定座273被定位於該框架27G之—頭部處。 疋座273與該第一底板271之側表面間隔開。在一典型具體 :施^中’該固定座273之侧面間之間隙與該等側面171間之間 隙大體上可彼此相同。因此,該第—底板271之頂面271 該固定座273而露出。 右干第二固定孔285a穿過經由該固定座273而露出之該第一 底板271之頂面271a形成。該等第三固定孔285a被用於固定該 34 200804827 等支座290至該第一底板271。該固定座273可具有一放置於一 平面亡之頂面273a,該第二底板275之頂面2仏位於該水平面上。 第二接收槽277形成於該固定座273之頂面27如處。該 接收槽=7之第五寬度W65可與該第一支架231之寬度大體^ 同。该第二,收槽277被設計成與該第一支架231之一下部形狀 相對應。該第一支架231被佈置於該第二接收槽277中。 φ 具有—傾斜之背面273e。在-典型具體實施例 I痒一傾斜角α6可與該第一探針管腳110之第一 穿過該框架270形成。該等第_固定孔_ a 283a與該第一接收槽276相通。 /寺弟一固疋孔 定孔_自該框架270之側面至該第一接收槽 —形成。在—典型具體實施例中,該等第3 可沿藉由該第-方向與該第二方向所界: 線對稱佈置。 、口該弟一方向延伸之一軸 每-分別被插入該等第-固定孔_内。 出。兮等第固之一端部通過該第一接收槽276露 出该羊弟一固定構件281與該第二支牟 此 ; 沿該萆二方向壓該第二支架241。 、 3面接觸,以 該等第二固定孔283a鄰近該等第一固 第二固定孔283a穿過該框架27G之側口 該專 體實施例中,該等第二固定孔2仏3;&quot; 272而形成。在一典型具 軸線對稱佈置。 σ目對於沿該第二方向延伸之 該等第二固定構件283分別被插入 母一該等第二固定構件283之一端 Λ荨弟一固疋孔283a内。 出。該等第二固定構^ 283愈該第該第一接收槽276而露 以沿該第-方向與鱗三方向壓轉之兩勤皆接觸, 35 200804827 ,圖21所不,若干第四固定孔287a穿過該框架27〇之一底 ί ΓΪΞ等第四固定孔287a與該等第一固定孔28ia相通。 ί ϋ具體員施例中’該等第四蚊孔287a可穿過該框架270 $罝开&gt; 成。 姑榮ί等第四固疋構件287分別被插入該等第四固定孔287a内。 該專=四固定構件287之端部與該等第一固定孔黯中之該等第 ,疋構件281接觸’以抑制該等第一固定構件281自該等第一 五固定孔289a f過該框架270之底面 ΓΛΜ。 5固定構件(未顯示〕可分別被插入該等第五 姑2 一a内。該等第五固定構件固定該框架270至一用於固定 =ΐίϊ^2ί)ί)至&quot;^座(未顯示)之支撐臂(未顯示)。在-业 里具體實關巾’另外之固定孔可穿職框架,職。/、 架之ίί®為—圖示說關18中該第—支承構件之第—與第二支 與該^i8^23,該第—姆件23G包嫣一支架现 該第-支架231支擇每一該等第一探針管腳11〇之第一端部 門使ί該-等第一探針管腳110藉由該第一間隙G21彼此 =開佈置。該弟-支架231放置於該固定座273之第二接 277之上。 駒Λ一典型具體Ϊ施例中,該第一支架231可包括一橫截面為L °因此第一支架231可包括一後方下表面231c。此後 下? 23lc可被放置在第一支架剡的第一背面皿下方。該第 :支呆231可具有一與該第二接收槽277 相同之寬度W7卜 該第-支架231具有-傾斜之頂面231a。該頂面23U之一傾 斜角CX7與該第-探針管腳11〇之第二角度⑽可大體上相同。、 該等苐-針腳插槽235沿該第二方向形成於該第一支架231 之頂面23U與第-背面231b處。該等第一針腳插槽235沿該第 36 200804827 一=向ff二在一典型具體實施例中,該等第一針腳插槽235之 數量與該等第一探針管腳110之數量可大體上相同。該等第一針 腳插槽235可藉由一與該等第一探針管腳11〇之第一間隙G21大 體上相同’,隙G71彼此間隔開佈置。該等第一針腳插槽235可 具有一 5!亥?第一探針管腳110之寬度W11大體上相同之寬度 W72。該等第一探針管腳11〇之接觸部分114分別被插入 一針腳插槽235内。 該等接觸部分114被插入該等第一針腳插槽235内以佈置 該等弟一探針管腳11()於該第一支架231上時, 腳110,、,該第一間隙⑼彼此間隔開佈置。Μ才木針&amp; 該等第一對準插槽237沿該第二方向形成於該第一支架231 ^31a與第一背面231b處。該等第一對準插槽位於最 槽235鄰近。該等第—對準插槽237被設計成與 對準官腳(未顯示)相對應。 ^、 之一典型具體實施例中,一長槽说可沿該第-方 於該弟-支架231之頂面2灿處。此處,_該等第一針 之了^ 列該等第一對準插槽237可形成於該第一支架231 么且人一該等第一探針管腳110之第一端部llla之第一 f二槽236形成於該第-支架况之第一背面施處。該 〇槽236破設計成與圖6中該第一探管 - 對r該第一組合槽236沿該第-方向形: :ΐί;槽236可具有一與該第一探針管_ ,口Mila之回度Η11大體上相同之高度H71。 236 ί第:!^腳4〇之山第一端部llla被插入該第一組合槽 # 2^肉^ 厂端部llla可#緊緊_入該第—組合 9防止該第一探針管腳110沿該第一方向移動。 111广弟—支术241支標每一該等第一探針管腳110之第—端邱 ⑽’以使得該等第—探針管腳11G藉由該第—間隙 37 200804827 隔開佈置。該第二支架241放置於該第一接收槽276中。 #、在本發明之一典型具體實施例中,該第二支架241可包括一 棱截面f L形狀之樑。該第二支架241可具有一與該第一接收槽 276之第二寬度W62大體上相同之寬度W73。該第二支架241可 具有一與該第一接收槽276之第一深度D62大體上相同之高度 H72。 U 、&quot;亥X第了支架241具有一平坦之頂面241a。該等第二針腳插槽 一 2沿该第二方向形成於該第二支架241之頂面241&amp;處。該等第 j腳插槽245沿該第-方向佈置。在一典型具體實施例中,該 =弟二針腳插槽245之數量與該等第一探針管腳削之數量可大 體上相同。 在本發明之—典型具體實施例中,該等第二針腳插槽泌可 =-與該等第-探針管腳m之第一間隙G21大體上相同 間隔開佈置。該等第二針腳簡245可具有一與該等 抑^針讀11G之寬度WU大體上相同之寬度W74。該等第-=、。官腳110之連接部分117分別被插入該等第二針腳插槽% 令箄Ϊ該Ϊ,部分117被插入該等第二針腳插槽245内以佈置 。亥4弟一楝針管腳110於該第二支架241上時, 腳11〇可自動以該第一間隙G21彼此間隔開佈置。、' 該等第二對準插槽247沿該第二方向形成於該第二支架241 貝面241a處。該等第二對準插槽247位於 =近。糊二鮮插槽247被設計成與對準^腳一(=t) 向形ίίΪίΐ支⑽^^产一^^242可沿該第-方 兩列該等第二對準插槽-可形成於該 用於接收每一該等第_探針管腳11〇之第二端部服之第二 38 200804827 組合槽246形成於該第二支架241之一正面24比處。 槽246被設計成與圖6中該第—探針管腳训之第二端 形狀相對應。該第二組合槽撕沿該第一方向形成 3施=二产上,246可具有一與該第—探針管腳ιί〇 之弟一之间度Η12大體上相同之高度Η73。 該第j針管腳110之第二端部⑽被插入 246内。特定言之,該第二端部⑽可被嫌也插入:= 槽246内,用以防止該第一探針管腳則沿該第一方向移弟·且口 架之圖說明圖18中該第二支承構件之第三舆第四支 與該24 ’該第二支承構請包括該第三支架⑸ 該第三支,25,1支撐每一該等第二探針管腳12〇之第 等針管腳i2G藉由該第二間隙G22彼^ 曰]网幵]佈置該弟二支采251被放置於該等支座29〇之上。 在本發明之一典型具體實施例中,該f251 . 樑形狀。該第三支架251可且右:^f:支条251可為-直 大體上相同之寬度^具有—與_架27g之第—寬度· 255 支m具有一平坦之頂面251a。該等第三针腳插槽 &amp;該弟—方向形成於該第三支架25 三針腳插槽255沿該第一方向佈置。 貝面la處δ玄專弟 數量具體實施例中,該等第三針腳插槽255之 槽二間,彼此間隔開佈二?間== 同之f卢彻^ / 十管腳120之寬度W21大體上相 120 124 當該等接觸部分124被插入該等第三針腳插槽255内以佈置 39 200804827 該等第二探針管腳120於該第三支架151上時,該等第二探 腳120自動以該第二間隙G22彼此間隔開佈置。 该等第三對準插槽257沿該第二方向形成於該第三支架251 =面251a處。該㈣三對準姆25?放置於最外之第三針腳插 槽255鄰近。該等第三對準插槽⑸被設計成麟準管腳(未顯 示)相對應。 ·…In the third pin slot 255, the fourth pin slot 265 and the plurality of the second pin slots 265 are arranged to be separated from each other. The fourth bracket 261 is formed in the slot 267. The fourth pin slot 265 can be buried in the direction of the younger brother. In a typical embodiment, the third Pm saver is separated from each other by the gap G22. U 24 = 7 bracket 231 is aligned. The fourth bracket 261 foot 120 has another surname of β bauxite 4, - 'Gan is looking for a younger brother, the second probe, etc., the fourth pin slot 265 Therefore, the second _ G22 may be spaced apart from each other according to the object gap G22. Here, the first-to-the-probe-probe tube 24 ΐ and the fourth bracket 26 At the same time, the second branch and the second probe pins 120. The knife J is fixed to the first probe pins no elements, and the probe unit 200 is described in detail. The above-mentioned 33 200804827 Figure 22 is a perspective view illustrating the frame of the probe unit of Figure 21. Referring to Figure 22, the frame 270 can be - having a first width, a first length L61 A rectangular parallelepiped with a height-height H61. The frame 27() includes a first bottom plate 271 and a second bottom plate 275. The first bottom plate 271 is disposed lower than the second bottom plate 275 by a first depth D61. A bottom plate 271 and the second bottom plate 2 are respectively flat and flat top surfaces 271a and 275a. The first receiving groove 276 is formed at the top surface 275a of the second bottom plate 275. The first receiving groove 276 faces the first The first receiving groove 276 can have a second width W62, a second length L62 and a second depth leg. The second width W62 of the first receiving groove 276 can be opposite to the second wire 241 The widths are substantially the same. A plurality of side walls 272 can be vertically disposed on either side of the first receiving groove]. That is, the inner side surface 276b of the side wall 272 can define a first receiving groove 276. The second depth D62 can be substantially larger than the first The spine D61 is deeper. Therefore, the stepped portion 275b is formed between the first receiving groove 276 and the first bottom plate 271. The second bracket 241 and the fourth bracket 261 are disposed in the first receiving groove 276. An opening 278 communicating with the first receiving slot 276 is formed at the top of the second bottom plate 2 At 275a. The opening 278 can have a third width W63 that is substantially narrower than the second width *W62 of the first receiving slot 276. The opening 278 is formed through the second bottom plate 275 in a third direction that is substantially perpendicular to the first direction and the second direction. An integrated circuit such as a TCP is disposed in the opening 278. A fixing seat 273 is formed on the first bottom plate 271 of the frame 27A. The fixed ridge 2?1 may have a fourth width W64 that is substantially narrower than the second width w62 of the first receiving groove 276. The yoke 273 is positioned at the head of the frame 27G. The shank 273 is spaced apart from the side surface of the first bottom plate 271. In a typical embodiment, the gap between the sides of the holder 273 and the sides 171 may be substantially identical to each other. Therefore, the top surface 271 of the first bottom plate 271 is exposed by the fixing seat 273. The right dry second fixing hole 285a is formed through the top surface 271a of the first bottom plate 271 exposed through the fixing base 273. The third fixing holes 285a are used to fix the brackets 290 such as 34 200804827 to the first bottom plate 271. The fixing base 273 can have a top surface 273a placed on a flat surface, and the top surface 2 of the second bottom plate 275 is located on the horizontal surface. The second receiving groove 277 is formed at the top surface 27 of the fixing base 273. The fifth width W65 of the receiving slot = 7 can be substantially the same as the width of the first bracket 231. In the second, the receiving groove 277 is designed to correspond to the lower shape of one of the first brackets 231. The first bracket 231 is disposed in the second receiving groove 277. φ has a sloping back surface 273e. In the exemplary embodiment, the itching-inclination angle α6 can be formed with the first of the first probe pins 110 passing through the frame 270. The first fixing holes _ a 283a are in communication with the first receiving groove 276. / 弟弟一固疋孔定孔_ is formed from the side of the frame 270 to the first receiving groove. In a typical embodiment, the third segments may be arranged symmetrically by the first direction and the second direction: line symmetry. One of the axes extending in one direction of the mouth is inserted into the first-fixing holes _. Out. One end of the first solid portion of the crucible and the like is exposed through the first receiving groove 276 to the fixing member 281 and the second supporting member. The second bracket 241 is pressed in the second direction. The third fixing hole 283a is adjacent to the first fixing second fixing hole 283a and passes through the side opening of the frame 27G. In the embodiment, the second fixing hole 2仏3; ; formed in 272. They are symmetrically arranged on a typical axis. The second fixing members 283 extending in the second direction are respectively inserted into one of the second fixing members 283 and the second fixing member 283. Out. The second fixing structure 283 is exposed to the first receiving groove 276 so as to be in contact with the two directions in the first direction and the three directions, 35 200804827, FIG. 21, and a plurality of fourth fixing holes The 287a passes through the frame 27, and the fourth fixing hole 287a communicates with the first fixing holes 28ia. In the specific embodiment, the fourth mosquito holes 287a can pass through the frame 270 $. The fourth fixing members 287 such as Gu Rong ί are inserted into the fourth fixing holes 287a, respectively. The end portion of the special fixing member 287 is in contact with the first one of the first fixing holes 281 to prevent the first fixing members 281 from passing through the first five fixing holes 289a The bottom surface of the frame 270 is ΓΛΜ. 5 fixing members (not shown) can be inserted into the fifth quilts 2a, respectively. The fifth fixing members fix the frame 270 to a fixed=ΐίϊ^2ί) ί) to &quot;^ seat (not Display) support arm (not shown). In the industry, the specific fixed hole can be used as a wearable frame. /, ίί® is - the illustration of the first - the second member of the support member - and the second member and the ^i8^23, the first member 23G is wrapped with a bracket and the first bracket 231 The first end of each of the first probe pins 11 is selected such that the first probe pins 110 are arranged to each other by the first gap G21. The younger-bracket 231 is placed over the second connection 277 of the mount 273. In a typical embodiment, the first bracket 231 can include a cross section of L° such that the first bracket 231 can include a rear lower surface 231c. Thereafter, the 23lc can be placed under the first backing plate of the first holder. The fulcrum 231 may have the same width W7 as the second receiving groove 277. The first bracket 231 has a sloping top surface 231a. One of the tilting angles CX7 of the top surface 23U and the second angle (10) of the first probe pin 11's may be substantially the same. The 苐-pin slots 235 are formed in the second direction at the top surface 23U and the first back surface 231b of the first bracket 231. The first pin slot 235 is along the 36th 200804827-to ff2. In a typical embodiment, the number of the first pin slots 235 and the number of the first probe pins 110 can be substantially Same on the same. The first pin slots 235 can be substantially identical to each other by a first gap G21 of the first probe pins 11 and the gaps G71 are spaced apart from one another. The first pin slots 235 can have a width W72 that is substantially the same width W11 of the first probe pin 110. The contact portions 114 of the first probe pins 11 are inserted into a pin slot 235, respectively. When the contact portions 114 are inserted into the first pin slots 235 to arrange the first probe pins 11 () on the first bracket 231, the legs 110, the first gaps (9) are spaced apart from each other. Open layout. The first alignment slots 237 are formed in the second direction at the first bracket 231 ^ 31a and the first back surface 231b. The first alignment slots are located adjacent the most slot 235. The first-alignment slots 237 are designed to correspond to alignment feet (not shown). ^ In one exemplary embodiment, a long slot is said to be along the first side of the top-side of the brother-bracket 231. Here, the first alignment slots 237 of the first probe pins 237 may be formed on the first bracket 231 and the first end portion 111a of the first probe pins 110 The first f-two slots 236 are formed on the first back side of the first stent condition. The slot 236 is designed to be broken with the first probe tube 260 in FIG. 6 along the first direction: ΐί; the slot 236 can have a first probe tube _, the mouth Mila's return Η11 is roughly the same height H71. 236 ί第:!^ The foot of the mountain is the first end of the mountain llla is inserted into the first combination slot # 2^ meat ^ factory end llla can be tight_into the first - combination 9 to prevent the first probe tube The foot 110 moves in the first direction. 111 Guangdi - Branch 241 is labeled as the first end of each of the first probe pins 110 (10)' such that the first probe pins 11G are spaced apart by the first gap 37 200804827. The second bracket 241 is placed in the first receiving slot 276. In an exemplary embodiment of the present invention, the second bracket 241 may include a beam having a prismatic cross section f L shape. The second bracket 241 can have a width W73 that is substantially the same as the second width W62 of the first receiving slot 276. The second bracket 241 can have a height H72 that is substantially the same as the first depth D62 of the first receiving slot 276. U, &quot; Hai X first bracket 241 has a flat top surface 241a. The second pin slots 2 are formed in the second direction at the top surface 241 &amp; of the second bracket 241. The j-th pin slots 245 are arranged along the first direction. In a typical embodiment, the number of the two pin slots 245 can be substantially the same as the number of the first probe pins. In a typical embodiment of the invention, the second stitch slots can be arranged at substantially the same spacing as the first gap G21 of the first probe pins m. The second stitch 245 can have a width W74 that is substantially the same as the width WU of the needle reading 11G. The first -=,. The connection portions 117 of the official feet 110 are respectively inserted into the second pin slots %, and the portions 117 are inserted into the second pin slots 245 for arrangement. When the cymbal pin 110 is on the second bracket 241, the foot 11 〇 can be automatically spaced apart from each other by the first gap G21. The second alignment slots 247 are formed in the second direction at the second bracket 241 shell surface 241a. The second alignment slots 247 are located at = near. The paste two fresh slot 247 is designed to be aligned with the foot ^ (= t) to the shape ί Ϊ ΐ ( 10 10 10 10 10 产 产 产 产 产 可 可 可 可 可 可 可 可 可 242 242 242 242 242 242 242 242 242 242 沿 沿 沿 沿A second 38 200804827 combination slot 246 for receiving the second end of each of the first probe pins 11 is formed at a front surface 24 of the second bracket 241. The slot 246 is designed to correspond to the shape of the second end of the first probe pin of Figure 6. The second combination groove is formed along the first direction, and the second portion 246 has a height Η73 which is substantially the same as the degree Η12 between the first and second probe pins. The second end (10) of the j-th pin 110 is inserted into 246. In particular, the second end portion (10) can be inserted into the slot 246 to prevent the first probe pin from being moved along the first direction and the port frame is illustrated in FIG. a third fourth branch of the second support member and the second support member includes the third bracket (5). The third branch, 25, 1 supports each of the second probe pins 12 The equal-needle pin i2G is placed on the support 29 by the second gap G22. In an exemplary embodiment of the invention, the f251. beam shape. The third bracket 251 can be right: ^f: the struts 251 can be - straight and substantially the same width ^ has - the width - 255 of the _ frame 27g has a flat top surface 251a. The third pin slot &amp; the brother-direction is formed in the third bracket 25. The three-pin slot 255 is disposed along the first direction. In the specific embodiment of the number of δ 专 专 专 贝 具体 具体 具体 具体 具体 具体 具体 具体 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 具体 具体 具体 具体 具体 具体 具体 具体 具体 具体 具体 具体 具体Substantially 120 124. When the contact portions 124 are inserted into the third pin slots 255 to dispose 39 200804827 when the second probe pins 120 are on the third bracket 151, the second probes 120 is automatically arranged with the second gap G22 spaced apart from each other. The third alignment slots 257 are formed in the second direction at the third bracket 251 = face 251a. The (four) three alignment 25 is placed adjacent to the outermost third pin slot 255. The third alignment slots (5) are designed to correspond to pin (not shown). ·...

/在本务明之一典型具體實施例中,一長槽可沿該一 成於韻二支架251之頂面251a處。此處,兩列該等第三針 與處兩列該等第三對準插槽267可形成於該第三支架L 與該等第二探針管腳120之第一端部121a組合之第一电 一 於該第三支架251之一背面㈣處。如圖7所示,該第 254被設計成與該第二探針管腳⑽之第-固定槽122 一-組合桿254沿該第-方向形成。在 3d 弟—組合桿254可具有-與該第-固定 槽122巧度H13大體上相同之高度剛。 柙合桿254被插入該等第二探針管腳120之第一固定 ^ ·,用以防Π# ί合彡桿254可被緊緊地插人該第—111定槽122 具體中兩邊形成若干爪256。在一典型 大體上相同=2。56 τ具有一與該等支座290之寬請5 支座tit ’利用該等爪256,該第三支架251可被布置於该等 以支置—於該框架270之固定座273之兩側,用 該開口 295包括支座2^口 295穿過該等支座29G垂直形成。 第-孔之4=^二9=頂之* -孔與自該 二孔之第二直徑大之ί t孔。此處’該弟一孔可具有比該第 大之弟—直徑。因此,具有一階梯狀之該開口 295 200804827 可穿過該等支座290形成。 該等第三固定構件烈㈠皮插入該 Ϊ ==人雜架27G之第三固定孔2心tS 弟一口疋構件285之一頭部可緊宓接觸今pq 分,以固,等支座29。至::該開口 295之一階梯狀部 該第四支架261支撐每一該等第二探針 上該弟二支架241放置於該第一接收槽276中之# 血型r i括—固定部分263與—支撐部分266。在一 在本發明之一典型具體實該 ,與該等?二探針管腳120之數量大體二同針:插等槽第= 插槽265可藉由一與該等第二探針管腳12〇之第隙士 = ί相广間隔開佈置。該等第四針腳i槽265可ί 有一與該4弟二探針管腳12〇之寬度W21 j = 调4。該等第二探針管腳12〇之連接部分 ^ 第四針腳插槽265内。 J刀〜被插入該專 料ί^ίΓΐ&gt;127被插入該等細針腳姉265内以佈置 «弟-域官腳12〇於該固定部分263之上時, = 管腳ϋ I自動地以該第二間隙G22彼此間隔開佈置 267 向形成於該固定部分263 該等第四對準插槽267錄最外之第四針 四對準插槽267可被設計成與對準管腳(未顯示) 與該等第二探針管腳12G之第二端部咖組合之第二組合桿 200804827 264形成於該固定部分263之一正面263b處。如圖7所示 二組合桿264被設計成與該第二探針管腳12〇之第二固hi] 之形狀相對應。因此,該第二組合桿264沿該第一^向。 —典型具體實施例中,該第二組合槽264可具有一與;第—— 槽123之高度H14大體上相同之高度H82。、 —固疋 邊第一組合桿264被插入該等第二探針管腳mo之第二— 槽123内。此處,該第二組合桿264可被緊緊地插入該第二因$ 槽123内,用以防止該等第二探針管腳12〇沿該第一方^勤。 該等支撐部分266形成於該固定部分263之一下声而 邊。該專支撐部分266彼此對稱地佈置於該固定部分2纪之,、 面之兩邊。該等支撐部分266可具有一相對於該第一方向= /^&quot;固定構件283可接觸該側面施, 乂&gt;口 U亥弟方向與弟二方向壓該第四支架261。 包括該固,部分263與該等支撐部分Μ6之該第时 =有-與該第-接收槽276之第二寬度職大體上相同之寬度 下文將蒼照附圖詳細描述—製造該探針單元2〇〇 透視麻綱製關18魏鱗料元之—方法之 Ϊ 7 支架231與該第二支架241佈置於 該框架270上。在一典型具體實施例中,該 於該第-接收槽276中,且該第一 Φ加木1 T放置 忑弟支条231被佈置於該第二接收 77中。此處,可佈置該第一支架231與該第二支架24 ^第-支架231之第-組合槽236與該第 人 槽246彼此相對。 卞 n弟一、、且口 當該第一支架231被插入該帛二接收槽 架231可不沿該第-方向移動。換言之,該第4 23= 該第二接收_内之同時,該第—支架231相 42 277 200804827 向之-位置。加ϋ疋f弟—支架231相對於該第二方 位置被確定後/該第一二231 該第一方向與該第二方向之 該第二支架241被插入該第第二接收槽則。 W該第一方向之 = 立^ = 架3置於該第一支架卻與該第二支 第-端部111a,且一ΐί f1支標該等第一探針管腳110之 第二端部nib弟一支架241支揮該等第一探針管腳no之 探針管腳11G與該第—支架231組合。 第-; a之; 内。此處,抑弟一支架231之第一組合槽236 一支架2313:^==Q5 ^觸部分114可被定位於該第 第-端邱nfH槽之内。該等第—探針管腳削之 ;二:=:36 ⑽ 支竿程=有該等第—探針管腳⑽可與該第一 =戶了等第一探針管腳110之第一端部1山以 =9所不之該弟_ _⑽彼此間隔開佈置。 等第:ϊ ϋ該等支座2%被佈置於該固定座273之兩侧。該 固定架_三固定孔285a内,以 261 ΐίΤΐί 被放置於該等支座携上。然後該第四支架 四支年26i=:^:架241上。此處,佈置該第三支架251與該第 加目f組合㈣與該第四支架 支座ttit,三支架251以使該第三支架251緊密接觸該等 之上^梯狀部分290b。因此’該第三支架251相對於該 43 200804827 第二方向之一位置被確定。 該第三支架251相對於該第一支架231對準。在此情況下, 該第三支架251之第三對準插槽257與該第一支架231之第一對 準插槽237沿該第二方向對準。因此,可確定該第三支架251相 對於該第一方向之一位置。 該&gt;第=;支架251相對於該第一方向與該第二方向之位置被確 定後,=第三支架251被固定至該等支座29〇之頂面。 該第四支架261被插入該第一接收槽276内。此處,該第一 接^槽276中之該第四支架261可不沿該第一方向移動。因此, 邊第支,261被插入該第一接收槽276内之同時,該第四支架 向之一位置被確定。此外,該第四支架261之第四 账伽41之247可沿該第二 *該^探1管腳120被佈置於該第三支架251 2第Sit t ±三支架251支撐該等第二探針管腳12〇 第ί端=lb該弟四支架261支擇該等第二探針管和〇之 合桿254可被插入該等第二J針管腳$,第一組 Γ中0之接觸部分124可粒於該第三支= 251 =找第二間隙G22彼此間隔開佈置。以如圖19 之弟一端部121a可以如圖19所示之該二專弟一板針官腳120 探針管之第—端部llla間隔開ϋ間隙G23與該等第一 茶知圖31,該等第一固定槿 疋構件281、該等第二固定構件283 44 200804827 Ϊ該t第=固定構件287被插入該框架270,以便牢牢地固定該等 弟一^針官腳110與該等第二探針管腳12〇至該框架27〇。 在本發明之一典型具體實施例中,該等第一固定構件281可 姑命弟一,收槽276而露出。該等第一固定構件281之 槿5 部,i第二支架241之背面241c接觸。該等第一固定 241腎宓該5二方向移動該第二支架241,以使該第二支架 加二接1該第一接收槽276之階梯狀部分275b。該第二支 Ϊ第心^^&gt;第四支架261可與該第二支架241 一起移動,以便 ra木61同樣接觸該第一接收槽276之該階梯狀部分 且料2而/該等第一探針管腳110可與該第二支架241組合, ίΪίίίί針f腳⑽與該第四支架261組合。特定言之,該 第二組之第二端部Ulb可被插入該第二支架241之 被插入^内。此外,該第四支架261之第二組合桿264可 第-探上20,第二固定槽123内。此處,該等 第二針Β ΐΐίΐ117可被定位於該第二支架241之 被放置於該^四支_ 26 1針管腳12G之連接部分127可 λ乐四叉木261之弟四針腳插槽265中。 tm 287 ΐ ?/ 1 ^ ® 281a &quot; 等第四固柳Ϊ L 該/第四_孔麻内。該 第一固定構件281移動弟—固疋構件281接觸,以限制該等 内。該被插人該轉27G之第二固定孔勘 該等第-固定構^加83^端部穿過該第二接收槽277而露出。 接觸露出之端部與該第四支_之侧面 固定該第ίί Γ=第三方向舰第四支架261,以 12G沿該第二方向之斜面被確定。 &quot; I、有對準斜面之第-探針管腳110與第二探 45 200804827 針官腳m中,該等連接部分m 相同之平面上。此外,該等接觸部分m 大體上 位於-大體上相同之平面上。因此 之&amp;部同樣被定 易地連接至該等連接部分117與127。該等i觸體電路可容 容易地與該物體之終端接觸。 …接觸4刀1M與m可 笛一第一固定構件283遷該第四支架261之兩側面於兮 Ϊ; &quot;if :f ;四對準_67可相對於該第二^= 等第一探針管腳110盥該等第一^承構件250,以便該 等第二探針管二佈置。該 一支她H 腳120可容易地分別自該第 針管腳110盘該ϋϋΐ構件250分開。因此,該等第一探 第一支承構件第Hii0可易於維修與更換。因而該 根據本發明之典件維修或更換。 圖幻為-圖不說明根據本發明之一典型具體實施例之一探針 46 200804827 裝置之側視圖,圖33為一圖矛七、日日闰士 單元之透視圖。巧目不况明圖^中該探針裝置之一探針 參照圖32與圖33’一探針裝置3〇 一 100。因此,相同之元株锌躲主υπα 〒之該k針早兀 f之圖示說明。該探針裝置3:關 進; 探針皁元100與一測試單元(未顯示)。 忒 該外殼310之形狀與該探針裳f 3〇〇之一外表In a typical embodiment of the present invention, a long slot can be formed along the top surface 251a of the second bracket 251. Here, the two rows of the third pins and the two rows of the third alignment slots 267 may be formed in the third bracket L and the first end portion 121a of the second probe pins 120. One electric power is at the back (four) of one of the third brackets 251. As shown in Fig. 7, the 254th is designed to be formed in the first direction with the first fixing groove 122 of the second probe pin (10). At 3d, the combination lever 254 can have a height just - substantially the same as the first fixed slot 122. The coupling rod 254 is inserted into the first fixing pin of the second probe pin 120 to prevent the 彡 彡 254 from being tightly inserted into the first 111 slot 122 Several claws 256. In a typical substantially the same = 2.56 τ has a width with the support 290, please 5 mounts 't' with the claws 256, the third bracket 251 can be arranged to be supported - in the The two sides of the fixing seat 273 of the frame 270 are vertically formed by the opening 295 including the holder 2 295 through the holders 29G. The first hole - 4 = ^ 2 = top * - the hole and the second diameter from the second hole. Here, the younger brother can have a diameter larger than the largest brother. Therefore, the opening 295 200804827 having a step shape can be formed through the holders 290. The third fixing member is inserted into the Ϊ == the third fixing hole 2 of the human miscellaneous frame 27G, the heart tS, one of the 疋 member 285, the head of the member 285 can be in close contact with the present pq, to fix the seat 29 . To: a stepped portion of the opening 295, the fourth bracket 261 supports the # blood type ri-fixing portion 263 of the second receiving bracket 276 in each of the second probes. - a support portion 266. In a typical embodiment of the present invention, the number of the two probe pins 120 is substantially the same as the pin: the slot 265 can be inserted by the second probe pin. 12 〇 第 = = ί 相 广 wide spacing arrangement. The fourth pin i slot 265 has a width W21 j = 4 with the 4 pin probe pin 12 。. The connection portion of the second probe pin 12 is in the fourth pin slot 265. When the J knife ~ is inserted into the special material ί^ίΓΐ &gt; 127 is inserted into the fine pin 姊 265 to arrange the « brother-domain official foot 12 之上 above the fixed portion 263, the pin ϋ I automatically The second gap G22 is spaced apart from each other 267. The fourth pin four alignment slot 267, which is formed at the fourth alignment slot 267, which is formed at the fourth alignment slot 267, can be designed to be aligned with the alignment pin (not shown). A second combination rod 200804827 264 combined with the second end of the second probe pins 12G is formed at one of the front faces 263b of the fixed portion 263. As shown in Fig. 7, the two combination levers 264 are designed to correspond to the shape of the second fixer of the second probe pin 12''. Therefore, the second combination lever 264 is along the first direction. In a typical embodiment, the second combination groove 264 can have a height H82 that is substantially the same as the height H14 of the first groove 123. The first combination rod 264 is inserted into the second slot 123 of the second probe pins mo. Here, the second combination lever 264 can be tightly inserted into the second factor slot 123 to prevent the second probe pins 12 from being along the first side. The support portions 266 are formed under one of the fixed portions 263. The dedicated support portions 266 are symmetrically arranged with each other on the fixed portion 2, on both sides of the face. The supporting portions 266 may have a fourth bracket 261 that is contactable with respect to the first direction, and the fixing member 283 may contact the side surface, and the second and second sides of the second bracket 261. The width including the solid portion 263 and the support portion Μ6 is substantially the same as the second width of the first receiving groove 276. The following is a detailed description of the drawing. 2 〇〇 麻 麻 18 18 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 支架 支架 支架 支架 支架 支架 支架 支架 支架 支架 支架 支架 支架In a typical embodiment, the first Φ plus slot 1 T is placed in the second receiving 77. Here, the first bracket 231 and the first bracket 236 of the second bracket 24^the bracket 231 and the first slot 246 may be disposed to face each other. The first bracket 231 is inserted into the second receiving slot 231 so as not to move in the first direction. In other words, while the 4th 23 = the second reception_ is in the middle, the first bracket 231 phase 42 277 200804827 is in the position. The second bracket 241 in the first direction and the second direction is inserted into the second receiving slot after the second bracket 231 is determined relative to the second position. W the first direction = the vertical frame = the frame 3 is placed on the first bracket but the second leg end portion 111a, and a second end portion of the first probe pin 110 The nib-one bracket 241 swings the probe pins 11G of the first probe pins no to the first bracket 231. -- a; inside. Here, the first combination slot 236 of the bracket 231 is a bracket 2313: ^==Q5 The contact portion 114 can be positioned within the first end-end nfH slot. The first - probe pin is cut; two: =: 36 (10) support process = the first probe pin (10) can be the first one of the first probe pin 110 The end 1 mountain is arranged at a distance of =9. The __(10) are spaced apart from each other. Equivalent: ϊ 2 2% of the supports are arranged on both sides of the fixed seat 273. The holder_three fixing holes 285a are placed on the holders at 261 ΐίΤΐί. Then the fourth bracket is four years 26i =: ^: on the frame 241. Here, the third bracket 251 is arranged in combination with the first mesh f (four) and the fourth bracket support ttit, and the three brackets 251 are arranged such that the third bracket 251 is in close contact with the upper ladder portion 290b. Thus, the position of the third bracket 251 relative to the second direction of the 43 200804827 is determined. The third bracket 251 is aligned with respect to the first bracket 231. In this case, the third alignment slot 257 of the third bracket 251 is aligned with the first alignment slot 237 of the first bracket 231 in the second direction. Therefore, the position of the third bracket 251 relative to the first direction can be determined. After the position of the bracket 251 with respect to the first direction and the second direction is determined, the third bracket 251 is fixed to the top surface of the brackets 29〇. The fourth bracket 261 is inserted into the first receiving groove 276. Here, the fourth bracket 261 in the first slot 276 may not move in the first direction. Therefore, while the side branch 261 is inserted into the first receiving groove 276, the position of the fourth bracket is determined. In addition, the 247 of the fourth bracket 261 of the fourth bracket 261 can be disposed along the second bracket 1 of the second bracket 251 2, the Sit t ± three bracket 251 supports the second probe The pin 12 〇 端 end = lb, the fourth bracket 261 selects the second probe tube and the shank 254 can be inserted into the second J pin $ $, the first group Γ 0 contact The portion 124 may be granulated at the third branch = 251 = the second gap G22 is found to be spaced apart from each other. The first end portion 121a of FIG. 19 can be separated from the first end of the probe tube by the first end portion 111a of the second probe pin 120 of the two professional discs as shown in FIG. The first fixing member 281, the second fixing members 283 44 200804827, the t=fixing member 287 are inserted into the frame 270, so as to firmly fix the brothers 110 and the like The second probe pin 12 is twisted to the frame 27A. In an exemplary embodiment of the invention, the first securing member 281 can be exposed to the slot 276. The fifth portion of the first fixing member 281 is in contact with the back surface 241c of the second holder 241. The first fixed 241 renal pelvis moves the second bracket 241 in the direction of 5, so that the second bracket is coupled to the stepped portion 275b of the first receiving groove 276. The second support body ^^&gt; the fourth bracket 261 can be moved together with the second bracket 241 so that the ra wood 61 also contacts the stepped portion of the first receiving groove 276 and the material 2 is/the same A probe pin 110 can be combined with the second bracket 241, and the pin (10) is combined with the fourth bracket 261. Specifically, the second end portion Ulb of the second group can be inserted into the inserted portion of the second holder 241. In addition, the second combination rod 264 of the fourth bracket 261 can be firstly probed into the second fixing groove 123. Here, the second pin ΐΐ ΐΐ ΐ 117 can be positioned on the second bracket 241 and placed in the connecting portion 127 of the four _ 26 1-pin pins 12G, and the four-pin slot of the λ Le quad wood 261 265. Tm 287 ΐ ?/ 1 ^ ® 281a &quot; etc. The fourth solid willow L / the fourth _ hole inside the numb. The first fixing member 281 moves the contact of the sturdy-solid member 281 to limit the inside. The second fixing hole inserted into the 27G is exposed to the second receiving groove 277 through the second fixing hole 277. The exposed end portion of the contact and the side of the fourth branch are fixed to the fourth bracket 261 of the third directional wheel 3, and the slope of the second direction is determined by 12G. &quot; I. The first probe hole 110 with the alignment bevel and the second probe 45 200804827 in the needle foot m, the connecting portions m are on the same plane. Moreover, the contact portions m are located substantially on - substantially the same plane. Therefore, the & section is also selectively connected to the connecting sections 117 and 127. The i-contact circuits can be easily brought into contact with the terminal of the object. ...contacting 4 knives 1M and m whistle-first fixing member 283 to move the two sides of the fourth bracket 261 to the 兮Ϊ; &quot;if:f; four alignment _67 can be relative to the second ^= etc. first The probe pins 110 are affixed to the first support members 250 such that the second probe tubes are disposed. The one of the H-foots 120 can be easily separated from the first member of the first pin 110. Therefore, the first probe first support member Hii0 can be easily repaired and replaced. Thus, the kit according to the present invention is repaired or replaced. Figure 1 is a side view of a device according to one exemplary embodiment of the present invention. The device is a side view of a device, and Figure 33 is a perspective view of a spear seven, a Japanese gentleman unit. One of the probe devices of the probe device is shown in Fig. 32 and Fig. 33'. Therefore, the same element of the zinc plant hides the main υαα 〒 the k-needle early 兀 f graphical illustration. The probe device 3: is turned on; the probe soap unit 100 and a test unit (not shown).忒 The shape of the outer casing 310 and the outer surface of the probe

具有一接收該臺階330、該探針單元励與該測試ΐ元^ 該外殼310之-頭部處配備有一透明之開閉器仍 ,閉益315打開與關閉該外殼31〇。由於該開閉器315包^一透明 ,料,因此在該外殼31〇内透過該透明之開閉器阳肖外看係可 能的。 該堂階330支撐一諸如一顯示器面板之物體3〇1。該臺階33〇 被佈置於該外殼310中。該臺階33〇之尺寸與該物體3()1之 ,對應。舉例而言,該物體301之尺寸在幾英吋至幾百英吋之一 範圍内。因此,與該物體3〇1之尺寸相對應,該臺階之尺 可在幾英吋至幾百英吋之一範圍内。 在本發明之一典型具體實施例中,為減小佈置該臺階33〇之 一空間,可傾斜佈置該臺階330。另一選擇為,該臺階33〇可水平 佈置或垂直佈置。 一用於移動該堂階330之一驅動單元(未表示)被連接至該 堂階330。該驅動單元在一垂直方向與一水平方向移動該臺階 330。該驅動早元同樣使該堂階330傾斜。該驅動單元將該物體3〇1 裝載進該外殼310内。該物體301被測試後,該驅動單元自該外 殼310卸載該物體301。此處,該驅動單元可包括一已知之機械 I、一馬達、一圓筒等。因此,為簡潔起見,此處省略任何有關 該驅動早元之進^—步說明。 47 200804827 該振針單το 100被佈置於一圍繞該物體3〇1之周圍區域,該 物體301位於已被移動至一測試位置之該臺階33〇上。該探針單 兀1〇〇被安裝至一被固定至該外殼310之一内壁之板352。在一典 型具體實施例中,該探針單元丨⑻可利用一固定器挪被安裝至 該板351。 士诗3定!ί 320 111定該探針單元_至該板325。該固定器320 使得該等第一探針管腳110與該等第二探針 g腳120疋向於該物體3〇1。 裝i复數個固定器320至該板325。因此,可用該等固定器 謂i i ΐ定複數個探針單元⑽。該等固定器320與該探針單元 100之數1可根據該物體301之終端模組3〇5之數量確定。 線端組·該終端模組305具有複數個 而一# 專〜鈿306猎由—相同之間隙彼此間隔開佈置。舉例 而5,該專終端306之間之間隙可能小於大約25_。 ^第一探針管腳110與該等第二探針管腳120與該等终端 f觸。為使該等帛—探針管腳11G與 1 〇产 終端306 ’該第-探針管腳π〇與該第二二 =2 4之間隙,、該等終端306間之間隙可大體上相同。 ^上所述’可不同地調整該等第—探 =====此,林-終端 /'ί二例該操'^置300皆可測試該物體3〇1。 “才木針早元10Θ被電連接至該測試單 電連接至該探針單元:該 之人士所悉知,耻此處省略任何«該 # f本發敗-典财體實歸彳巾,棘針單幻 弟一探針管腳m與該等第二探針管腳m。另 48 200804827 探針管腳120。此外,該探腳1Ό或該等弟二 項技SH蒙 如^用該探針單元即可精確地測試該物體。此外=口、 :了易=組裝與拆卸。因此,可快速而容易地 ^ =。因而利用該探針單元可有效地測試容量大且集成隹 徒係本發明之例證性朗’不應解釋為對本發明之限制。 ίΐίίϊί發明之幾個典型具體實施例,熟悉此項技藐之人士 ϊί,,具體實施例中,在本質上不偏離i發明ΐ 此等可對其進行許多更改。相應地,所有 fUt申4專利_中’方法加功能條款旨在涵蓋實施該 ==夺此處所描述之該等結構,不僅涵蓋結構上ΐ等價 且涵盍等效之結構。.因此,應瞭解前述係 噔 SL不應解釋為侷限於所揭示之該等特定具體實施例,= 該等及其他具體實施例之更改確定為被包括在 二、丄附申明專利辄圍之辄圍内。本發明藉由下面之申請專利 、匕括於其巾之該等申請專利範圍之等效條款界定。 【圖式簡單說明】 特徵^:==細=及該等賴’本發明之上述及其他 圖1為-圖示說明-傳統探針單元之橫截面視圖; 49 200804827 一圖、2為-圖示說明根據本發明之—典型具體實施例之一探針 皁7^之透視圖; 圖3為一圖2中“A”部分之放大透視圖; 圖4為一圖2中“B”部分之一放大透視圖; 圖5為一圖示說明圖2中該探針單元之分解透視圖。 圖6為-圖示說明圖2中該探針單元之第一探針管腳之透視 .圖7為-圖示說_ 2中該探針單^之第二探針管腳之透視Having a receiving step 330, the probe unit is energized with the test unit, the housing 310 is provided with a transparent shutter at the head, and the closure 315 opens and closes the housing 31. Since the shutter 315 is transparent, it is possible to see through the transparent shutter in the outer casing 31. The church step 330 supports an object 3〇1 such as a display panel. The step 33〇 is disposed in the outer casing 310. The size of the step 33〇 corresponds to the object 3()1. For example, the object 301 is sized from a few inches to a few hundred inches. Therefore, corresponding to the size of the object 3〇1, the step can be in the range of a few inches to several hundred inches. In an exemplary embodiment of the present invention, in order to reduce a space in which the step 33 is disposed, the step 330 may be obliquely arranged. Alternatively, the steps 33〇 may be arranged horizontally or vertically. A drive unit (not shown) for moving the hall stage 330 is coupled to the hall stage 330. The drive unit moves the step 330 in a vertical direction and a horizontal direction. The drive early element also tilts the church step 330. The drive unit loads the object 3〇1 into the outer casing 310. After the object 301 is tested, the drive unit unloads the object 301 from the outer casing 310. Here, the drive unit may include a known machine I, a motor, a cylinder, and the like. Therefore, for the sake of brevity, any description of the advancement of the drive is omitted here. 47 200804827 The vibrating needle single το 100 is arranged in a surrounding area around the object 3〇1, which is located on the step 33〇 that has been moved to a test position. The probe unit 1 is mounted to a plate 352 that is fixed to an inner wall of the outer casing 310. In a typical embodiment, the probe unit (8) can be mounted to the plate 351 by a retainer. Shishi 3 set! ί 320 111 sets the probe unit _ to the plate 325. The holder 320 causes the first probe pin 110 and the second probe g pin 120 to be directed toward the object 3〇1. A plurality of holders 320 are mounted to the board 325. Therefore, the plurality of probe units (10) can be determined by the fixtures i i . The number of the fixtures 320 and the probe unit 100 can be determined according to the number of terminal modules 3〇5 of the object 301. The line end group·the terminal module 305 has a plurality of ones and the other ones are arranged to be spaced apart from each other. For example, 5, the gap between the terminals 306 may be less than about 25 mm. The first probe pin 110 and the second probe pin 120 are in contact with the terminals f. In order to make the first probe pin 11G and the first probe pin 306' the first probe pin π 〇 and the second two = 24 gap, the gap between the terminals 306 may be substantially the same. . ^The above can be adjusted differently. - Detective ===== This, Lin-Terminal / ' ί two cases of this operation can be tested the object 3 〇 1. "The wood needle is connected to the test unit electrically connected to the probe unit. The person knows that the shame here omits any «this #f本发败-典财实实彳巾, A single needle of the spine pin is a probe pin m and the second probe pin m. Another 48 200804827 probe pin 120. In addition, the probe pin 1 or the other two skills SH The probe unit can accurately test the object. In addition, the port is easy to assemble and disassemble. Therefore, it can be quickly and easily ^. Therefore, the probe unit can be used to effectively test large capacity and integrated gangsters. The exemplification of the present invention should not be construed as limiting the invention. Several typical embodiments of the invention, those skilled in the art, in the specific embodiments, do not deviate from the invention in nature. And so on, many changes can be made to it. Accordingly, all the fUt application 4 patents - the 'method plus functional clauses are intended to cover the implementation of the == to capture the structure described here, not only the structural equivalents and implications, etc. The structure of the effect. Therefore, it should be understood that the aforementioned system SL should not be interpreted as a limitation. The specific embodiments disclosed, the changes to the above and other specific embodiments are determined to be included in the scope of the second patent application. The present invention is hereby incorporated by reference. The equivalent terms of the patent application scope of the towel are defined. [Simplified description of the drawings] Features ^: ==fine = and the above-mentioned and other figures of the present invention are illustrated - the conventional probe unit Cross-sectional view; 49 200804827 A diagram, 2 is a diagram illustrating a perspective view of a probe soap 7^ according to an exemplary embodiment of the present invention; FIG. 3 is an enlarged perspective view of a portion "A" of FIG. Figure 4 is an enlarged perspective view of one of the "B" portions of Figure 2; Figure 5 is an exploded perspective view of the probe unit of Figure 2. Figure 6 is a schematic view of the probe of Figure 2. The perspective of the first probe pin of the needle unit. Fig. 7 is a perspective view of the second probe pin of the probe unit

圖8為-圖示說明圖2中之該探針單元之框架之透視圖; ,9為-圖示說明圖2中第—支承構件之第—支架 木之透視圖; 圖10為一圖示說明圖2中第二支承構件之第三與第四支架之 透視圖; 圖11至圖17為圖示說明製造圖2中該探針單元之一方法 透視圖與橫截面視圖·, ⑽i圖18為一圖示說明根據本發明之一典型具體實施例之一探 早元之透視圖; 圖19為圖18中“C”部分之一放大透視圖; 圖20為圖18中“D”部分之一放大透視圖; 圖21為圖示說明圖18中該探針單元之一分解透視圖; 圖22為圖示說明圖18中該探針單元之框架之透視圖; 圖23為一圖示说明圖18中第一支承構件之第一與第二支架 之透視圖; &quot;一 /、 圖24為一圖示說明圖18中第二支承構件之第三與第四支架 之透視圖; 、、圖25至圖31為圖示說明製造圖π中該探針單元之一方法之 透視圖與橫截面視圖; 圖32為一圖示說明根據本發明之一典型具體實施例之一探針 50 200804827 裝置之側視圖; 圖33為一圖示說明圖32中該探針裝置之一探針單元之透視 圖。Figure 8 is a perspective view showing the frame of the probe unit of Figure 2; 9 is - a perspective view illustrating the first - support member of the first support member of Figure 2; Figure 10 is an illustration A perspective view illustrating the third and fourth brackets of the second support member of Fig. 2; Figs. 11 to 17 are perspective views and cross-sectional views illustrating a method of manufacturing the probe unit of Fig. 2, (10) i Fig. 18 BRIEF DESCRIPTION OF THE DRAWINGS FIG. 19 is an enlarged perspective view of one of the "C" portions of FIG. 18; FIG. 20 is a portion of the "D" portion of FIG. Figure 21 is an exploded perspective view of the probe unit of Figure 18; Figure 22 is a perspective view illustrating the frame of the probe unit of Figure 18; Figure 23 is an illustration Figure 18 is a perspective view of the first and second brackets of the first support member; &quot;一/, Figure 24 is a perspective view illustrating the third and fourth brackets of the second support member of Figure 18; 25 to 31 are perspective and cross-sectional views illustrating a method of manufacturing the probe unit of Fig. π; Fig. 32 is According illustrates one exemplary embodiment of the present invention is a side view of one of the particular probe apparatus 50200804827 embodiment; FIG. 33 is a perspective view illustrating a probe unit of one of the probe apparatus 32 in FIG.

【主要元件符號說明】 10 傳統探針單元 15 探針管腳 20 探針部件 25 陶瓷支座 40 撐板 50 顯示器面板 55 終端 60 固定器 65 積體電路 100 探針單元 110 第一探針管腳 111 體部分 111a 第一端部 111b 第二端部 114 接觸部分 116 孑L 117 連接部分 120 第二探針管腳 121 體部分 121a 第一端部 121b第二端部 122 第一固定槽 123 第二固定槽 124 接觸部分 126 孑匕 51 200804827 127連接部分 130第一支承構件 131第一支架 131a頂面 131b背面 131c第二背面 131d第一支架131之兩侧 132長槽 135 第一針腳插槽 136 第一組合槽 137 第一對準插槽 141第二支架 141a平坦之頂面 141b第二支架之一正面 141c第二支架141之第二正面 141d第二支架之背面 145 第二針腳插槽 146第二組合槽 147第二對準插槽 150第二支承構件 151第三支架 151a平坦頂面 151b 第三支架151背面 154 第一組合槽 155 第三針腳插槽 156 爪 157 第三對準插槽 161 第四支架 163 固定部分 52 200804827 163a固定部分163之頂面 163b固定部分163之正面 164 第二組合槽 165 第四針腳插槽 166支撐部分 167 第四對準插槽 170框架 170a框架170之頂面 171 侧壁 173 固定座 173a頂面 173b階梯狀部分 173c傾斜背面 173d固定座131之兩侧 176接收槽 176a接收槽176之第一底板 176b接收槽176之第二底板 176c接收槽176之第三底板 176d接收槽176之第一内壁 178終端槽 181第一固定構件 181a第一固定孔 183第二固定構件 183a第二固定孔 185第三固定構件 185a第三固定孔 187 第四固定構件 187a第四固定孔 190支座 53 200804827 190a支座190之頂面 190b支座190之下表面 19〇c支座190之傾斜背面 192上階梯狀部分 193下階梯狀部分 200探針單元 230第一支承構件 231第一支架 231a傾斜頂面 231b第一背面 231c後方下表面 232長槽 235 第一針腳插槽 236 第一組合槽 237第一對準插槽 241第二支架 241a第二支架之平坦頂面 241b第二支架241之正面 241c第二支架241之背面 242長槽 245 第二針腳插槽 246第二組合槽 247 第二對準插槽 250第二支承構件 251第三支架 251a第三支架251之平坦頂面 251b第三支架251之背面 252長槽 254 第一組合桿 54 200804827 255第三針腳插槽 256爪 257第三對準插槽 261第四支架 263 固定部分 263a固定部分263之頂面 263b固定部分263之正面 264 第二組合桿 265第四支架261之第四針腳插槽 266支撐部分 266a侧面 267第四對準插槽 270框架 270b框架之底面 271第一底板 271a平坦頂面 272側壁 273 固定座- 273a固定座273之頂面 273b第二接收槽277之階梯狀部分 273c固定座273之傾斜背面 275第一接收槽 275a平坦頂面 275b第一接收槽276之階梯狀部分 276第一接收槽 276b内侧表面 276d第一接收槽276之第一内壁 277第二接收槽 278 開口 55 200804827 281第一固定構件 281a第一固定孔 283 第二固定構件 283a第二固定孔 285第三固定構件 285a第三固定孔 287 第四固定構件 287a第四固定孔 289a第五固定孔 290 支座 290a支座290之頂面 290b支座290之上階梯狀部分 295 開口 300探針裝置 301物體 305 物體301之終端模組 306 終端 310外殼 315開閉器 32Θ 固定器 325板 330探針裝置 56[Main component symbol description] 10 Conventional probe unit 15 Probe pin 20 Probe component 25 Ceramic support 40 Strut plate 50 Display panel 55 Terminal 60 Retainer 65 Integrated circuit 100 Probe unit 110 First probe pin 111 body portion 111a first end portion 111b second end portion 114 contact portion 116 孑L 117 connecting portion 120 second probe pin 121 body portion 121a first end portion 121b second end portion 122 first fixing groove 123 second Fixing groove 124 Contact portion 126 孑匕51 200804827 127 Connecting portion 130 First supporting member 131 First bracket 131a Top surface 131b Back surface 131c Second back surface 131d Both sides 132 of the first bracket 131 Long slot 135 First stitch slot 136 A combination slot 137 a first alignment slot 141 a second bracket 141a flat top surface 141b a second bracket front surface 141c a second bracket 141 second front surface 141d a second bracket back surface 145 a second stitch slot 146 second Combination groove 147 second alignment slot 150 second support member 151 third bracket 151a flat top surface 151b third bracket 151 back surface 154 first combination slot 155 third pin slot 156 Claw 157 third alignment slot 161 fourth bracket 163 fixing portion 52 200804827 163a top surface 163b of fixing portion 163 front surface 164 of fixing portion 163 second combination groove 165 fourth pin slot 166 support portion 167 fourth alignment plug Slot 170 frame 170a top surface 171 of frame 170 side wall 173 fixing seat 173a top surface 173b stepped portion 173c inclined back surface 173d two sides 176 of the fixing seat 131 receiving groove 176a receiving groove 176 first bottom plate 176b receiving groove 176 second The bottom plate 176c receives the third bottom plate 176d of the groove 176, the first inner wall 178 of the receiving groove 176, the terminal groove 181, the first fixing member 181a, the first fixing hole 183, the second fixing member 183a, the second fixing hole 185, the third fixing member 185a, the third fixing hole 187 fourth fixing member 187a fourth fixing hole 190 bearing 53 200804827 190a bearing 190 top surface 190b bearing 190 lower surface 19〇c bearing 190 inclined back surface 192 upper stepped portion 193 lower stepped portion 200 Needle unit 230 first support member 231 first bracket 231a inclined top surface 231b first back surface 231c rear lower surface 232 long slot 235 first stitch slot 236 first combination slot 237 first alignment plug 241 second bracket 241a second bracket flat top surface 241b second bracket 241 front surface 241c second bracket 241 back surface 242 long slot 245 second stitch slot 246 second combination slot 247 second alignment slot 250 second Support member 251 third bracket 251a flat top surface 251b of third bracket 251 back side 252 long slot 254 of third bracket 251 first combination rod 54 200804827 255 third stitch slot 256 claw 257 third alignment slot 261 fourth Bracket 263 fixing portion 263a fixing portion 263 top surface 263b fixing portion 263 front surface 264 second combining rod 265 fourth bracket 261 fourth stitch slot 266 supporting portion 266a side 267 fourth alignment slot 270 frame 270b frame Bottom surface 271 first bottom plate 271a flat top surface 272 side wall 273 fixing seat - 273a fixing seat 273 top surface 273b second receiving groove 277 stepped portion 273c fixing seat 273 inclined back surface 275 first receiving groove 275a flat top surface 275b Stepped portion 276 of receiving groove 276 First receiving groove 276b Inner surface 276d First receiving groove 276 First inner wall 277 Second receiving groove 278 Opening 55 200804827 281 First fixing member 281a first fixed 283 second fixing member 283a second fixing hole 285 third fixing member 285a third fixing hole 287 fourth fixing member 287a fourth fixing hole 289a fifth fixing hole 290 bearing 290a bearing 290 top surface 290b bearing 290 Upper stepped portion 295 opening 300 probe device 301 object 305 terminal module 306 of object 301 terminal 310 housing 315 shutter 32 固定 holder 325 plate 330 probe device 56

Claims (1)

200804827 十、申請專利範圍:^一種探針單元,其包括: f干:一f-方向佈置之第-探針管腳;第- 第—探針管腳上方且插入該 支撐該等第一探針管腳兩-佈置於郷—絲獅上以m巧件;· 寺弟一探針管腳兩端部 等 之第二支承構件 用於支撐該第一 支承構件與該第二支承構件 若干第一固定構件,其用於固定該㈣框架; 二支承構件至該框架,以便沿—寺^支承構件與該等第 置該第-支承構件與雜二支承構;方向崎之第二方向佛 若干第二固定構件,其用於固定兮笛_+ 承該框架,以便沿-與該第;向;構該第二支 ffΠί一支承構件與該第二支承構件 對之第 2. 如申言月專利範圍第!項所述之探^ =包括—用於支樓每-該等第-探針管腳二g中該第—支承 之一弟二端部之第二支架,及 母该#弟一探針管腳 該第二支承構件包括一第三支牟鱼一 =置於該第-支架上用以支撐每_該等該第三支架 :,四^佈置於該第二支架上用 子之母一該等第一探針管腳之第二端部。牙 &gt;、該第一端部相 3. 如申請專利範圍第2項所述之 收每-該等第-探針管腳之第—端部之第=_其中若干用於接 一支架之一表面處, 針腳插槽形成於該第 若干用於接收每-該等第一探針管 插槽形成於該第二支架之一表面處, 弟—端部之第二針腳 若干用於接收每一該等第二探針管 腳之第一端部之第三 針腳 57 200804827 插槽形成於該第三支架之一表面處, 林姑若干用於接收每一該等第二探針管腳之第二端部之第四針腳 插槽形成於該第四支架之一表面處。 、 、4·如申請專利範圍第2項所述之探針單元,其中一 成於該框f之-表面處,該接收槽之―寬度比雜架之寬产^ 且其朝該第一方向與該第二方向開口,及 、又 底面 一向上之階梯狀部分沿該第二方向形成於該接收槽之一 〇 5·如申請專利範圍第4項所述之探 广第:底板、一放置於該第一底板上之第 置於該弟一底板上之第三底板;及 驾該Si;步包括一固定座’該固定座佈置於該第二底板盘 接==W糊—絲,該狀紅-寬度比該 步包圍第5項所述之探針單元’其中該框架進一 端=右干佈置於該固定座兩侧之支座,以支撐該第三支^兩 甚ί料利細第6項所述之探針單元,其中進-牛勺把 ίΓ=:?架且與該等支座之背面接觸之第三固定:ΐ 面 使該等支座和該第二底板與該第三底板㈣ 疋構件被分職人該_定制。 補涵且該4弟三固 固定專利範圍第8項所述之探針單元,1中盘今笔笛 固疋構件接觸之該等支紅背面傾斜。〃馆料弟三 括若探針單元,其^一步包 構件’該等㈣上 58 200804827 方向輕微移動。 加、Ji·班如申ί奮專利範圍第5項所述之探針單元,苴中哕μ - 4« =。於謂-底板之上,且該第四支架被佈置於該^二支架 收該1,料-用於接 於該第-支架之-背面ί,ί软《、組合槽沿該第一方向形成 Μ二用於接收該等第-探針管腳之第二端部 弟一方向形成於該第二支架之 處 槽沿該 該第一方向面對該第-支架之背面面处°亥弟-絲之—正面沿 架二 1 範: 背面f接收該等“三支架之-;收該組合狀㈣獅成騎 架包]^人申範2第2項所述之探針單元,其中該第四支 ,ί 、合桿沿該第—方向形成於該第四支架之ί 处.以接收該等第二探針管腳之第二端部。 接你11申請專利範圍第15項所述之探針單元,其中-用於 ί收該纽合桿之固_成於每—該等第二探針管 7專圍第2項所述之探針單元,其中_架之 與一比該第一底板高之第二底板,及 知-支架’該固枝之—寬度比該框架之寬度窄。疋厓乂口疋 進一 Ϊ包括如若申mm17項所述之探針單元,其中該框架 制定紅_之支叙讀郷三支架 59 200804827 19.如申請專利範圍第18項所述接 包括^座/雜紅一步 第一支加之乾圍第18項所述之探針單元,其中一辦 ί:ί;下部分相對應之階梯狀部分形成於每-該以 21.如申請專利範園第17項所述之摈斜留— 槽形成於該第二底板之一表面處‘之十早G,一接收 ff窄’且朝該第-方向與該第二方 架與該第四支架。 用以接收该弟二支 —如申請專利範圍第2項所述之探針單元, 斜之固定孔形成於該框架之兩側面,且;等C 構件分別被插入該等固定孔内,且與該第二^^而弟伽固疋 23.如申請專利範圍第2項所述之探針^月面接觸。 孔沿該第-方向形成於該框架之兩側面,且該等第 孔内,且舆該第四支架之兩側面ΐ觸 支架Ϊ背二,圍第23項所述之探針單元其中該第四 25.如申請專利範圍第2項所述之 對於該第二方向對準該等第_、第二、第三與第^支架。’用於相 加27一 *申請專利範圍第2項所述之探針單元, 木或該第二支架可移動地佈置於該框架 $〜子 該第二支架間之該等第一探針管腳。 乂口疋該弟-支架與 加七如申請專利範圍第2項所述之探針單元,其中兮第-去 木或該弟四支架可移動地佈置於該框架 $ 該第四支架間之該等第二探針管腳。 X口⑼弟二支架與 200804827 第一 ^如=專利細第1項所述之探針料,其中每一該等 二方二t度=具有一沿該第—方向之寬度與 ^向上之傾斜接觸部分,該接觸部分自該體部分 之一上端部 延伸;及 伸,Ιίί妾接部分自該體部分之另一上端部垂直延 30.二心U連接部分具有一向上彎曲之上端部。 第二探針 H專利1_ 1項所狀探針單元^每一i 二方向— _ —方向之寬度與一沿該第 夕部分,該接觸部分沿與該體部分之-縱向大體上相Π ::自,分之-端部延伸,該接觸部分 之-方部:沿-與該體部分之縱向大體上相同 曲之體将之另—端部延伸,該連接部分具有一向上彎 括二件其=步包 被插入該框_之該轉-固定構件^讀件,且其與該等 ί干^蝴μ面板之探料元,其包括: ί示器面板之電路終端接觸之面 顯示器面板; n㊇武為之电k唬至該平面 及 -』二管動:佈置於該框架之 61 200804827 包括处如申請專利範圍第32項所述之探針單元,其中進一步 若干用於固定該等支架至該框 該第-方向相對之-第二方向佈置固定構件,用以沿與 若干用於固定該敎架至該框第; 該第一方向及該第二方向⑽之構件,用以沿與 34. -觀針裝置,其=:弟二方向佈置該框架。 一用於接收一物體之外殼; —位於該外殼内用於固i該物體之臺階; 一鄰近該臺階上之該物體佈置之探一 括:0若干沿一第一方向佈置之一 ,該探針單元包 ,安置於該等第一探針管腳上方且干沿該第-弟,針管腳,.m)-用於支撐每一該等j二=針管腳間之 探針管腳之兩端部之第二承、構件上以支撐每-該等第二 與該第二支承構件之框;支:;該第-支承構件 S承;r該框架之第-==义,, 對之弟二方向佈置該第一支承構件盥該 弟一方向相 定f第一支承構件與該第ϋ構至=Hvii)若干 弟一支承構件與該第二支承構件; 弟一方向佈置該 及-測試單元,其用於提供電信號至該 4弟二探針管腳,以檢驗該物體是否正常。 铋針s腳與該 62200804827 X. Patent application scope: ^ A probe unit comprising: f dry: a probe-probe arranged in an f-direction; a first probe above the first-probe pin and inserted into the support a needle pin two-arranged on the 郷-Siles with a m-piece; a second support member such as a temple pin at both ends of the probe pin for supporting the first support member and the second support member a fixing member for fixing the (four) frame; two supporting members to the frame for arranging the first supporting member and the second supporting member along the first supporting member and the second direction of the direction a second fixing member for fixing the whistle _+ to the frame so as to be along the - and the second; the second member ff Π a supporting member and the second supporting member opposite to the second. Patent scope! The test described in the item includes: - for the branch, each of the first - probe pins 2 g, the second support of the second support of the first support, and the mother and the probe The second supporting member includes a third squid 1 disposed on the first bracket for supporting each of the third brackets: the fourth bracket is disposed on the second bracket Waiting for the second end of the first probe pin. Teeth&gt;, the first end phase 3. As described in claim 2, the first end of each of the first probe pins is = _ some of which are used to connect a bracket a surface of the pin slot formed in the first portion for receiving each of the first probe tube slots formed at a surface of the second bracket, and a second pin of the second end portion for receiving each A third pin 57 of the first end of the second probe pin is formed at a surface of one of the third brackets, and a plurality of sockets are used for receiving each of the second probe pins. A fourth stitch slot of the second end portion is formed at a surface of one of the fourth brackets. 4. The probe unit of claim 2, wherein one of the plurality of the receiving grooves is wider than the width of the cross-frame and facing the first direction And the second direction opening, and the stepped portion of the bottom surface is formed in the second direction in the second direction of the receiving groove ·5. According to the fourth aspect of the patent application scope: the bottom plate, a place a third bottom plate disposed on the bottom plate of the first bottom plate; and driving the Si; the step includes a fixing seat disposed on the second bottom plate to be connected to the ==W paste-filament The red-width ratio surrounds the probe unit described in item 5, wherein the frame enters one end=right stem is arranged on the sides of the fixed seat to support the third branch. The probe unit according to Item 6, wherein the third-fixing of the Γ 牛 : 且 且 接触 接触 接触 且 且 且 且 接触 接触 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三 第三Three bottom plates (four) 疋 components are assigned to the _custom. The symmetry and the probe unit described in Item 8 of the patent scope of the 4th brother and the third solid are tilted by the back side of the red contact member of the present invention. 〃 料 料 若 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针 探针Jia, Ji·Ban Rushen, the probe unit described in item 5 of the patent scope, 苴μ - 4« =. Above the bottom plate, and the fourth bracket is disposed on the second bracket to receive the first material, and is used for connecting to the back surface of the first bracket - ί, ", the combination groove is formed along the first direction The second end portion of the second probe portion for receiving the first probe pin is formed at the second bracket. The slot faces the back surface of the first bracket along the first direction. Silk - front along the frame 2 1 Fan: The back f receives the "three brackets -; the combination of the four (four) lion into the rack package] ^ person Shen Fan 2 item 2 of the probe unit, which Four legs, ί, and a pair of rods are formed along the first direction at the fourth bracket to receive the second end of the second probe pins. a probe unit, wherein - the solid-state rod is used for each of the second probe tubes 7 to specifically surround the probe unit described in item 2, wherein the frame is compared with the first a second bottom plate having a bottom plate height, and a width of the support-bracket 'the fixed branch is narrower than a width of the frame. The 疋 乂 乂 Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ mm mm The framework defines a red _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The lower part corresponds to the stepped portion formed in each of the two. Ten early G, a receiving ff narrow 'and toward the first direction and the second square frame and the fourth bracket. For receiving the second branch - as described in claim 2, the probe unit, oblique The fixing holes are formed on both sides of the frame, and the C members are respectively inserted into the fixing holes, and the second and the sturdy shackles 23. As described in claim 2, The needle is in contact with the moon surface. The hole is formed on both sides of the frame along the first direction, and the two sides of the fourth bracket are in contact with the bracket back, and the second side is a fourth unit of the probe unit, wherein the fourth unit is aligned with the second direction as described in item 2 of the patent application scope Second, the third and the second bracket. 'The probe unit for adding the 27-* patent application scope item 2, the wood or the second bracket is movably arranged in the frame $~ the second bracket The first probe pin between the two. The probe unit of the second aspect of the patent application, wherein the first to the wood or the fourth bracket are movably arranged The second probe pin between the fourth bracket of the frame. The X port (9) and the second bracket and the second piece of the second embodiment of the invention are as described in the first item, wherein each of the two Square two degrees = having a slanted contact portion along the width of the first direction and the upward direction, the contact portion extending from an upper end portion of the body portion; and extending, Ιίί妾 from the other upper end of the body portion The vertical extension 30. The two-core U-connecting portion has an upwardly curved upper end. The probe unit of the second probe H is in the form of a probe unit, each i-direction, the width of the direction, and a portion along the eve, the contact portion being substantially opposite to the longitudinal direction of the body portion: : extending from the end portion, the side portion of the contact portion: extending along the longitudinal direction of the body portion is substantially the same as the end portion, the connecting portion having an upwardly curved two pieces The = step package is inserted into the frame - the rotation-fixing member ^ reading member, and the probe element of the same, and the surface of the display panel that is in contact with the circuit panel of the display panel n 八武为电电唬 to the plane and - "two tube movements: arranged in the frame 61 200804827 includes a probe unit as described in claim 32, wherein a further number is used to fix the brackets Arranging a fixing member to the second direction opposite to the second direction of the frame for traversing a plurality of members for fixing the truss to the frame; the first direction and the second direction (10) for 34. - Needle-catching device, which =: The frame is arranged in the second direction. a casing for receiving an object; a step for fixing the object in the casing; and an arrangement of the object adjacent to the step: a plurality of ones arranged along a first direction, the probe a unit package disposed above the first probe pins and dry along the first leg, the pin pins, .m) - for supporting the ends of the probe pins between each of the j=pin pins a second bearing member, a member for supporting each of the second and second supporting members; a support member; the first support member S; the frame of the first -== meaning, Disposing the first supporting member in two directions, the first supporting member f and the second supporting member to the second supporting member and the second supporting member; the first direction is arranged in the direction of the test unit It is used to provide an electrical signal to the 4th pin probe pin to verify that the object is normal.铋 pin s foot with the 62
TW096111711A 2006-05-09 2007-04-03 Probe unit and probe apparatus having the same TWI333071B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060041528A KR100773732B1 (en) 2006-05-09 2006-05-09 Probe unit and probe device including same

Publications (2)

Publication Number Publication Date
TW200804827A true TW200804827A (en) 2008-01-16
TWI333071B TWI333071B (en) 2010-11-11

Family

ID=38898461

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111711A TWI333071B (en) 2006-05-09 2007-04-03 Probe unit and probe apparatus having the same

Country Status (3)

Country Link
KR (1) KR100773732B1 (en)
CN (1) CN101071141B (en)
TW (1) TWI333071B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI698645B (en) * 2018-06-22 2020-07-11 日商日本麥克隆尼股份有限公司 Probe assembly
TWI709751B (en) * 2018-06-07 2020-11-11 日商日本麥克隆尼股份有限公司 Probe assembly

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101049445B1 (en) 2009-01-12 2011-07-15 주식회사 디엠엔티 Probe unit for display panel inspection
CN101498759B (en) * 2009-03-19 2012-04-11 安徽天元电子科技有限公司 Test tools
JP5417265B2 (en) * 2010-06-24 2014-02-12 株式会社日本マイクロニクス Probe assembly
KR101166107B1 (en) 2010-12-16 2012-07-23 주식회사 디에스케이 Probe unit for inspecting display panel
KR101234088B1 (en) * 2010-12-30 2013-02-19 주식회사 탑 엔지니어링 Array test apparatus
KR101191343B1 (en) 2010-12-30 2012-10-16 주식회사 탑 엔지니어링 Array test apparatus
JP6184667B2 (en) * 2012-07-26 2017-08-23 日置電機株式会社 Probe unit, substrate inspection apparatus, and probe unit manufacturing method
CN103018505A (en) * 2012-12-04 2013-04-03 无锡圆方半导体测试有限公司 Probe correcting device
CN105467175A (en) * 2015-12-10 2016-04-06 苏州世纪福智能装备股份有限公司 An angle-adjustable test machine
KR102098650B1 (en) * 2019-07-24 2020-04-10 주식회사 프로이천 Pin type probe apparatus
KR102294168B1 (en) * 2021-06-18 2021-08-25 이시훈 Blade type probe block

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3076600B2 (en) 1990-11-20 2000-08-14 株式会社日本マイクロニクス Display panel prober
JPH09127156A (en) * 1995-11-01 1997-05-16 Tokyo Electron Ltd Probe card for liquid crystal display body
KR100314586B1 (en) * 1999-05-17 2001-11-15 이석행 Prober apparatus for testing of tft-lcd
JP2001056346A (en) * 1999-08-19 2001-02-27 Fujitsu Ltd Probe card and method for testing wafer on which a plurality of semiconductor devices are formed
JP4462732B2 (en) * 2000-07-31 2010-05-12 富士通株式会社 Probe head
KR20020081721A (en) * 2001-04-19 2002-10-30 비엔엘솔루컴 (주) Pin-probe assembly for testing LCD
JP4430621B2 (en) * 2002-11-22 2010-03-10 ファイコム コーポレイション Probe for inspection of flat panel display device and method for manufacturing the same
KR100635524B1 (en) * 2004-11-12 2006-10-18 주식회사 세지 Probe Device of Semiconductor Wafer Inspector
CN1731203A (en) * 2005-03-09 2006-02-08 飞而康公司 LCD panel inspection apparatus and inspection method thereof
KR100720122B1 (en) * 2005-03-30 2007-05-22 주식회사 세지 Probe Device of Semiconductor Wafer Inspector
KR100610889B1 (en) 2005-10-10 2006-08-08 (주)엠씨티코리아 Probe unit for inspection of flat panel display devices with ultra fine pitch

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI709751B (en) * 2018-06-07 2020-11-11 日商日本麥克隆尼股份有限公司 Probe assembly
TWI698645B (en) * 2018-06-22 2020-07-11 日商日本麥克隆尼股份有限公司 Probe assembly

Also Published As

Publication number Publication date
KR100773732B1 (en) 2007-11-09
CN101071141A (en) 2007-11-14
TWI333071B (en) 2010-11-11
CN101071141B (en) 2010-05-26

Similar Documents

Publication Publication Date Title
TW200804827A (en) Probe unit and probe apparatus having the same
Reinhard et al. Step-by-step instructions for retina recordings with perforated multi electrode arrays
Wagenknecht et al. Electron tomography of frozen-hydrated isolated triad junctions
TW200820363A (en) Universal system for testing different semiconductor devices
TW200834779A (en) Testing apparatus and probe card
TW200809211A (en) Probe
Di Bari et al. Stereochemistry and near-infrared circular dichroism of a chiral Yb complex
CN101726673A (en) Point measuring device
TW201022645A (en) Three-purpose force standard machine with independent dead-weight stack and lever arm
Schroeder et al. Lipid rafts and caveolae organization
TWM417645U (en) Detecting device allowing fast replacement of conductive film
Kent et al. Adsorption of myoglobin to Cu (II)-IDA and Ni (II)-IDA functionalized Langmuir monolayers: Study of the protein layer structure during the adsorption process by neutron and X-ray reflectivity
Bilgen et al. Ex vivo magnetic resonance imaging of rat spinal cord at 9.4 T
EP3439621B1 (en) Aqueous foaming cleansing compositions comprising n-acyl salts of polycarboxlic acids and plant microfibers
CN106841697B (en) A kind of monoblock type cement-based material ac impedance measurement fixture
Zemlin et al. Near-threshold field stimulation: intramural versus surface activation
CN203885093U (en) Dual-purpose chair for clinical inspection
CN205454327U (en) Ready -package dot matrix LCD screen support
CN210665654U (en) Needle flame test device
TW200305023A (en) Probe contact device for inspecting display panel
TWM357720U (en) Back board device
CN101736393A (en) Fixing device of electrolytic polishing sample
CN217731372U (en) Sample rack
CN202748703U (en) Improved structure of screen assembly positioning
TW201250261A (en) Electrical connecting apparatus and testing apparatus using the same

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees