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TW200732678A - Insulation inspecting device and insulation inspecting method - Google Patents

Insulation inspecting device and insulation inspecting method

Info

Publication number
TW200732678A
TW200732678A TW095138401A TW95138401A TW200732678A TW 200732678 A TW200732678 A TW 200732678A TW 095138401 A TW095138401 A TW 095138401A TW 95138401 A TW95138401 A TW 95138401A TW 200732678 A TW200732678 A TW 200732678A
Authority
TW
Taiwan
Prior art keywords
insulation
inspection region
inspecting
inspection
circuit board
Prior art date
Application number
TW095138401A
Other languages
Chinese (zh)
Other versions
TWI394961B (en
Inventor
Munehiro Yamashita
Original Assignee
Nidec Read Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp filed Critical Nidec Read Corp
Publication of TW200732678A publication Critical patent/TW200732678A/en
Application granted granted Critical
Publication of TWI394961B publication Critical patent/TWI394961B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

An insulation inspecting device and method for inspecting insulation of spark of a circuit board with higher accuracy. The insulation inspecting device (1) is used for inspecting the insulation of a circuit board (10) where wiring patterns (P) are formed. The device (1) comprises selecting means (2) for selecting one of the wiring patterns as a first inspection region (T1 shown in Fig.2) and the other wiring patterns as a second inspection region (T2 shown in Fig. 2), power supply means (3) connected to the second inspection region and adapted to apply a voltage to the second inspection regions as to set a predetermined potential difference between the first and second inspection regions, first current detecting means (4) connected to the first inspection region so as to detect a current flowing to the first inspection region, and judging means (7) for comparing the current value detected by the first current detecting means with a predetermined reference value and judging that the circuit board is an acceptable one or a rejected one on the basis of the result of the comparison.
TW095138401A 2005-10-18 2006-10-18 Insulation inspection equipment and insulation inspection methods TWI394961B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005303543 2005-10-18
JP2006172373A JP3953087B2 (en) 2005-10-18 2006-06-22 Insulation inspection device and insulation inspection method

Publications (2)

Publication Number Publication Date
TW200732678A true TW200732678A (en) 2007-09-01
TWI394961B TWI394961B (en) 2013-05-01

Family

ID=37962333

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095138401A TWI394961B (en) 2005-10-18 2006-10-18 Insulation inspection equipment and insulation inspection methods

Country Status (5)

Country Link
JP (1) JP3953087B2 (en)
KR (3) KR20100105757A (en)
CN (1) CN101292166B (en)
TW (1) TWI394961B (en)
WO (1) WO2007046237A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI636263B (en) * 2013-08-27 2018-09-21 日商日本電產理德股份有限公司 Inspecting apparatus
TWI779649B (en) * 2021-06-07 2022-10-01 祁昌股份有限公司 Testing system, judging device, testing method for testing insulation of a circuit board, and computer-readable recording medium thereof

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4532570B2 (en) * 2008-01-22 2010-08-25 日置電機株式会社 Circuit board inspection apparatus and circuit board inspection method
CN101408582B (en) * 2008-11-24 2011-07-20 浙江中控技术股份有限公司 Method and apparatus for testing circuit board
JP5899961B2 (en) * 2012-01-24 2016-04-06 日本電産リード株式会社 Insulation inspection device and insulation inspection method
JP5910262B2 (en) * 2012-04-10 2016-04-27 日本電産リード株式会社 Inspection method of component built-in board
JP6069884B2 (en) * 2012-05-08 2017-02-01 日本電産リード株式会社 Insulation inspection method and insulation inspection apparatus
JP5727976B2 (en) * 2012-07-31 2015-06-03 ヤマハファインテック株式会社 Printed circuit board insulation inspection apparatus and insulation inspection method
TWI498571B (en) * 2013-03-29 2015-09-01 Nidec Read Corp Method and apparatus of inspecting insulation
JP6137536B2 (en) * 2013-04-26 2017-05-31 日本電産リード株式会社 Substrate inspection apparatus and substrate inspection method
JP6182974B2 (en) * 2013-05-20 2017-08-23 日本電産リード株式会社 Board inspection method
JP2015001470A (en) * 2013-06-17 2015-01-05 日本電産リード株式会社 Substrate testing device
JP6229876B2 (en) * 2013-08-27 2017-11-15 日本電産リード株式会社 Inspection device
JP6252106B2 (en) * 2013-10-31 2017-12-27 日本電産リード株式会社 Contact maintenance method and inspection device
JP2015111082A (en) * 2013-12-06 2015-06-18 富士通テレコムネットワークス株式会社 Wiring tester, wiring test method and reference value measurement device
CN103743954A (en) * 2013-12-27 2014-04-23 北京天诚同创电气有限公司 Insulation performance detecting device
DE102014205918A1 (en) * 2014-03-31 2015-10-01 Robert Bosch Gmbh Method for testing an isolation device
JP6421463B2 (en) * 2014-06-02 2018-11-14 日本電産リード株式会社 Substrate inspection apparatus and substrate inspection method
CN104749543B (en) * 2015-03-26 2019-01-01 苏州朗博校准检测有限公司 A kind of calibration method of plug comprehensive tester
JP7009814B2 (en) * 2017-07-27 2022-02-10 日本電産リード株式会社 Insulation inspection equipment and insulation inspection method
JP6907790B2 (en) * 2017-08-07 2021-07-21 トヨタ自動車株式会社 Inspection method and manufacturing method of power storage device
DE102020100838B4 (en) * 2020-01-15 2021-07-29 Sma Solar Technology Ag METHOD AND CIRCUIT ARRANGEMENT FOR THE DETECTION OF AN ARC ARC AND PHOTOVOLTAIC (PV) INVERTER WITH A CORRESPONDING CIRCUIT ARRANGEMENT
JP7517680B2 (en) * 2020-04-15 2024-07-17 ヤマハファインテック株式会社 Inspection device and inspection method
CN115684845A (en) * 2021-07-21 2023-02-03 祁昌股份有限公司 Detection system, judging device, detection method and computer-readable storage medium

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2695687A (en) * 1952-07-02 1954-11-30 Warner Electric Brake & Clutch Magnetic friction device with replaceable friction face
GB2336217B (en) * 1997-12-02 2002-06-19 Advantest Corp Method of measuring current while applying a voltage and apparatus therefor
JP3788129B2 (en) 1999-03-26 2006-06-21 富士通株式会社 Wiring board inspection apparatus and inspection method
KR20000070650A (en) * 1999-07-30 2000-11-25 오우라 히로시 Applied-voltage-based current measuring method and device
KR100877243B1 (en) * 2001-02-19 2009-01-07 니혼 덴산 리드 가부시끼가이샤 Circuit board inspection apparatus and method for inspecting a circuit board
JP3546046B2 (en) 2001-09-26 2004-07-21 日本電産リード株式会社 Circuit board insulation inspection apparatus and insulation inspection method
TWI221925B (en) * 2002-05-17 2004-10-11 Nihon Densan Read Kabushiki Ka Apparatus and method for examining insulation of circuit board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI636263B (en) * 2013-08-27 2018-09-21 日商日本電產理德股份有限公司 Inspecting apparatus
TWI779649B (en) * 2021-06-07 2022-10-01 祁昌股份有限公司 Testing system, judging device, testing method for testing insulation of a circuit board, and computer-readable recording medium thereof

Also Published As

Publication number Publication date
JP3953087B2 (en) 2007-08-01
JP2007139747A (en) 2007-06-07
KR101367439B1 (en) 2014-02-25
WO2007046237A1 (en) 2007-04-26
KR20120096601A (en) 2012-08-30
CN101292166B (en) 2010-12-29
KR101346936B1 (en) 2014-01-03
CN101292166A (en) 2008-10-22
KR20080066686A (en) 2008-07-16
TWI394961B (en) 2013-05-01
KR20100105757A (en) 2010-09-29

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