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TW200728496A - CVD reactor with replaceable process chamber cover - Google Patents

CVD reactor with replaceable process chamber cover

Info

Publication number
TW200728496A
TW200728496A TW095143357A TW95143357A TW200728496A TW 200728496 A TW200728496 A TW 200728496A TW 095143357 A TW095143357 A TW 095143357A TW 95143357 A TW95143357 A TW 95143357A TW 200728496 A TW200728496 A TW 200728496A
Authority
TW
Taiwan
Prior art keywords
process chamber
cover
support
cover plate
chamber cover
Prior art date
Application number
TW095143357A
Other languages
Chinese (zh)
Other versions
TWI402373B (en
Inventor
Johannes Kaeppeler
Walter Franken
Original Assignee
Aixtron Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aixtron Ag filed Critical Aixtron Ag
Publication of TW200728496A publication Critical patent/TW200728496A/en
Application granted granted Critical
Publication of TWI402373B publication Critical patent/TWI402373B/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45502Flow conditions in reaction chamber
    • C23C16/45508Radial flow
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4411Cooling of the reaction chamber walls
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45576Coaxial inlets for each gas

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

This invention provides a device for depositing at least one layer on at least one substrate (2) which comprises a reaction chamber arranged inside a reactor housing (1). The reaction chamber has a process chamber base formed by a substrate support (4), a process chamber cover (5, 6) opposite to the base, and a gas inlet element (7) in allowing a process gas that is producing the thin film to enter. The process chamber cover (5, 6) has a cover plate (6) which is arranged below a cover plate support (5) and extends substantially across the entire horizontal surface of the substrate support (4). The invention further improve the said device. For this purpose, the gas inlet element (7) that located in the lateral center of the process chamber (3) is fed through an opening of the substrate support (4) and the cover plate (6) which is secured to the cover support (5) can be replaced through a lateral opening (9) of the reactor housing (1).
TW95143357A 2005-11-25 2006-11-23 A CVD reactor that can replace the reaction chamber roof TWI402373B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE200510056324 DE102005056324A1 (en) 2005-11-25 2005-11-25 CVD reactor with exchangeable process chamber ceiling

Publications (2)

Publication Number Publication Date
TW200728496A true TW200728496A (en) 2007-08-01
TWI402373B TWI402373B (en) 2013-07-21

Family

ID=37728344

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95143357A TWI402373B (en) 2005-11-25 2006-11-23 A CVD reactor that can replace the reaction chamber roof

Country Status (4)

Country Link
EP (1) EP1954852A1 (en)
DE (1) DE102005056324A1 (en)
TW (1) TWI402373B (en)
WO (1) WO2007060143A1 (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8673080B2 (en) 2007-10-16 2014-03-18 Novellus Systems, Inc. Temperature controlled showerhead
DE102009025971A1 (en) 2009-06-15 2010-12-16 Aixtron Ag Method for setting up an epitaxial reactor
CN106884157B (en) 2011-03-04 2019-06-21 诺发系统公司 Mixed type ceramic showerhead
CN102231416A (en) * 2011-06-14 2011-11-02 泉州市博泰半导体科技有限公司 Chemical vapor deposition reaction equipment
DE202011103798U1 (en) * 2011-07-28 2012-10-29 Michael Harro Liese Quick release for reactors and converters
CN103765557A (en) * 2011-08-09 2014-04-30 三星电子株式会社 Vapor deposition apparatus
CN103422071B (en) * 2012-05-18 2015-06-17 中国地质大学(北京) Vacuum cavity chamber capable of rapidly changing gas-homogenizing mode
DE102012110125A1 (en) 2012-10-24 2014-04-24 Aixtron Se Device for treating substrates with a replaceable ceiling plate and method for replacing such a ceiling plate
KR102376429B1 (en) * 2013-12-18 2022-03-17 램 리써치 코포레이션 Seminconductor substrate processing apparatus including uniformity baffles
US10741365B2 (en) * 2014-05-05 2020-08-11 Lam Research Corporation Low volume showerhead with porous baffle
US10378107B2 (en) 2015-05-22 2019-08-13 Lam Research Corporation Low volume showerhead with faceplate holes for improved flow uniformity
US10023959B2 (en) 2015-05-26 2018-07-17 Lam Research Corporation Anti-transient showerhead
DE202018100363U1 (en) * 2018-01-23 2019-04-24 Aixtron Se Device for connecting a susceptor to a drive shaft
WO2021042116A1 (en) 2019-08-23 2021-03-04 Lam Research Corporation Thermally controlled chandelier showerhead
JP2022546404A (en) 2019-08-28 2022-11-04 ラム リサーチ コーポレーション deposition of metal
DE102020103947A1 (en) 2020-02-14 2021-08-19 AIXTRON Ltd. CVD reactor and method of handling a process chamber ceiling plate
DE102023128850A1 (en) * 2023-03-21 2024-09-26 Aixtron Se Device for simultaneously depositing a layer on several substrates
CN117684262B (en) * 2024-02-04 2024-05-10 楚赟精工科技(上海)有限公司 Gas injection device and gas phase reaction equipment

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3696779A (en) * 1969-12-29 1972-10-10 Kokusai Electric Co Ltd Vapor growth device
JPS6097622A (en) * 1983-11-01 1985-05-31 Toshiba Mach Co Ltd Epitaxial device
US4926793A (en) * 1986-12-15 1990-05-22 Shin-Etsu Handotai Co., Ltd. Method of forming thin film and apparatus therefor
JPH0733576B2 (en) * 1989-11-29 1995-04-12 株式会社日立製作所 Sputter device, target exchanging device, and exchanging method thereof
JPH05230625A (en) * 1992-02-19 1993-09-07 Fujitsu Ltd Thin film manufacturing apparatus and thin film manufacturing method
JP3024940B2 (en) * 1992-06-24 2000-03-27 アネルバ株式会社 Substrate processing method and CVD processing method
JP2566101B2 (en) * 1992-08-13 1996-12-25 株式会社東芝 Sputtering device
US5592581A (en) * 1993-07-19 1997-01-07 Tokyo Electron Kabushiki Kaisha Heat treatment apparatus
JPH07228970A (en) * 1994-02-16 1995-08-29 Nec Corp Sputtering device
KR960002534A (en) * 1994-06-07 1996-01-26 이노우에 아키라 Pressure reducing and atmospheric pressure treatment device
US6103069A (en) * 1997-03-31 2000-08-15 Applied Materials, Inc. Chamber design with isolation valve to preserve vacuum during maintenance
US6321680B2 (en) * 1997-08-11 2001-11-27 Torrex Equipment Corporation Vertical plasma enhanced process apparatus and method
US6108937A (en) * 1998-09-10 2000-08-29 Asm America, Inc. Method of cooling wafers
JP4162779B2 (en) * 1998-11-04 2008-10-08 キヤノンアネルバ株式会社 CVD apparatus and CVD method
KR100476370B1 (en) * 2002-07-19 2005-03-16 주식회사 하이닉스반도체 Batch type Atomic Layer Deposition and method for insitu-cleaning in the batch type atomic layer deposition
DE10320597A1 (en) * 2003-04-30 2004-12-02 Aixtron Ag Method and device for depositing semiconductor layers with two process gases, one of which is preconditioned
DE102004035335A1 (en) * 2004-07-21 2006-02-16 Schott Ag Cleanable coating system
DE102004045046B4 (en) * 2004-09-15 2007-01-04 Schott Ag Method and device for applying an electrically conductive transparent coating to a substrate

Also Published As

Publication number Publication date
TWI402373B (en) 2013-07-21
EP1954852A1 (en) 2008-08-13
WO2007060143A1 (en) 2007-05-31
DE102005056324A1 (en) 2007-06-06

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