TW200728496A - CVD reactor with replaceable process chamber cover - Google Patents
CVD reactor with replaceable process chamber coverInfo
- Publication number
- TW200728496A TW200728496A TW095143357A TW95143357A TW200728496A TW 200728496 A TW200728496 A TW 200728496A TW 095143357 A TW095143357 A TW 095143357A TW 95143357 A TW95143357 A TW 95143357A TW 200728496 A TW200728496 A TW 200728496A
- Authority
- TW
- Taiwan
- Prior art keywords
- process chamber
- cover
- support
- cover plate
- chamber cover
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 6
- 239000000758 substrate Substances 0.000 abstract 4
- 238000000151 deposition Methods 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45502—Flow conditions in reaction chamber
- C23C16/45508—Radial flow
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4411—Cooling of the reaction chamber walls
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45576—Coaxial inlets for each gas
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
This invention provides a device for depositing at least one layer on at least one substrate (2) which comprises a reaction chamber arranged inside a reactor housing (1). The reaction chamber has a process chamber base formed by a substrate support (4), a process chamber cover (5, 6) opposite to the base, and a gas inlet element (7) in allowing a process gas that is producing the thin film to enter. The process chamber cover (5, 6) has a cover plate (6) which is arranged below a cover plate support (5) and extends substantially across the entire horizontal surface of the substrate support (4). The invention further improve the said device. For this purpose, the gas inlet element (7) that located in the lateral center of the process chamber (3) is fed through an opening of the substrate support (4) and the cover plate (6) which is secured to the cover support (5) can be replaced through a lateral opening (9) of the reactor housing (1).
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE200510056324 DE102005056324A1 (en) | 2005-11-25 | 2005-11-25 | CVD reactor with exchangeable process chamber ceiling |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200728496A true TW200728496A (en) | 2007-08-01 |
| TWI402373B TWI402373B (en) | 2013-07-21 |
Family
ID=37728344
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95143357A TWI402373B (en) | 2005-11-25 | 2006-11-23 | A CVD reactor that can replace the reaction chamber roof |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP1954852A1 (en) |
| DE (1) | DE102005056324A1 (en) |
| TW (1) | TWI402373B (en) |
| WO (1) | WO2007060143A1 (en) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8673080B2 (en) | 2007-10-16 | 2014-03-18 | Novellus Systems, Inc. | Temperature controlled showerhead |
| DE102009025971A1 (en) | 2009-06-15 | 2010-12-16 | Aixtron Ag | Method for setting up an epitaxial reactor |
| CN106884157B (en) | 2011-03-04 | 2019-06-21 | 诺发系统公司 | Mixed type ceramic showerhead |
| CN102231416A (en) * | 2011-06-14 | 2011-11-02 | 泉州市博泰半导体科技有限公司 | Chemical vapor deposition reaction equipment |
| DE202011103798U1 (en) * | 2011-07-28 | 2012-10-29 | Michael Harro Liese | Quick release for reactors and converters |
| CN103765557A (en) * | 2011-08-09 | 2014-04-30 | 三星电子株式会社 | Vapor deposition apparatus |
| CN103422071B (en) * | 2012-05-18 | 2015-06-17 | 中国地质大学(北京) | Vacuum cavity chamber capable of rapidly changing gas-homogenizing mode |
| DE102012110125A1 (en) | 2012-10-24 | 2014-04-24 | Aixtron Se | Device for treating substrates with a replaceable ceiling plate and method for replacing such a ceiling plate |
| KR102376429B1 (en) * | 2013-12-18 | 2022-03-17 | 램 리써치 코포레이션 | Seminconductor substrate processing apparatus including uniformity baffles |
| US10741365B2 (en) * | 2014-05-05 | 2020-08-11 | Lam Research Corporation | Low volume showerhead with porous baffle |
| US10378107B2 (en) | 2015-05-22 | 2019-08-13 | Lam Research Corporation | Low volume showerhead with faceplate holes for improved flow uniformity |
| US10023959B2 (en) | 2015-05-26 | 2018-07-17 | Lam Research Corporation | Anti-transient showerhead |
| DE202018100363U1 (en) * | 2018-01-23 | 2019-04-24 | Aixtron Se | Device for connecting a susceptor to a drive shaft |
| WO2021042116A1 (en) | 2019-08-23 | 2021-03-04 | Lam Research Corporation | Thermally controlled chandelier showerhead |
| JP2022546404A (en) | 2019-08-28 | 2022-11-04 | ラム リサーチ コーポレーション | deposition of metal |
| DE102020103947A1 (en) | 2020-02-14 | 2021-08-19 | AIXTRON Ltd. | CVD reactor and method of handling a process chamber ceiling plate |
| DE102023128850A1 (en) * | 2023-03-21 | 2024-09-26 | Aixtron Se | Device for simultaneously depositing a layer on several substrates |
| CN117684262B (en) * | 2024-02-04 | 2024-05-10 | 楚赟精工科技(上海)有限公司 | Gas injection device and gas phase reaction equipment |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3696779A (en) * | 1969-12-29 | 1972-10-10 | Kokusai Electric Co Ltd | Vapor growth device |
| JPS6097622A (en) * | 1983-11-01 | 1985-05-31 | Toshiba Mach Co Ltd | Epitaxial device |
| US4926793A (en) * | 1986-12-15 | 1990-05-22 | Shin-Etsu Handotai Co., Ltd. | Method of forming thin film and apparatus therefor |
| JPH0733576B2 (en) * | 1989-11-29 | 1995-04-12 | 株式会社日立製作所 | Sputter device, target exchanging device, and exchanging method thereof |
| JPH05230625A (en) * | 1992-02-19 | 1993-09-07 | Fujitsu Ltd | Thin film manufacturing apparatus and thin film manufacturing method |
| JP3024940B2 (en) * | 1992-06-24 | 2000-03-27 | アネルバ株式会社 | Substrate processing method and CVD processing method |
| JP2566101B2 (en) * | 1992-08-13 | 1996-12-25 | 株式会社東芝 | Sputtering device |
| US5592581A (en) * | 1993-07-19 | 1997-01-07 | Tokyo Electron Kabushiki Kaisha | Heat treatment apparatus |
| JPH07228970A (en) * | 1994-02-16 | 1995-08-29 | Nec Corp | Sputtering device |
| KR960002534A (en) * | 1994-06-07 | 1996-01-26 | 이노우에 아키라 | Pressure reducing and atmospheric pressure treatment device |
| US6103069A (en) * | 1997-03-31 | 2000-08-15 | Applied Materials, Inc. | Chamber design with isolation valve to preserve vacuum during maintenance |
| US6321680B2 (en) * | 1997-08-11 | 2001-11-27 | Torrex Equipment Corporation | Vertical plasma enhanced process apparatus and method |
| US6108937A (en) * | 1998-09-10 | 2000-08-29 | Asm America, Inc. | Method of cooling wafers |
| JP4162779B2 (en) * | 1998-11-04 | 2008-10-08 | キヤノンアネルバ株式会社 | CVD apparatus and CVD method |
| KR100476370B1 (en) * | 2002-07-19 | 2005-03-16 | 주식회사 하이닉스반도체 | Batch type Atomic Layer Deposition and method for insitu-cleaning in the batch type atomic layer deposition |
| DE10320597A1 (en) * | 2003-04-30 | 2004-12-02 | Aixtron Ag | Method and device for depositing semiconductor layers with two process gases, one of which is preconditioned |
| DE102004035335A1 (en) * | 2004-07-21 | 2006-02-16 | Schott Ag | Cleanable coating system |
| DE102004045046B4 (en) * | 2004-09-15 | 2007-01-04 | Schott Ag | Method and device for applying an electrically conductive transparent coating to a substrate |
-
2005
- 2005-11-25 DE DE200510056324 patent/DE102005056324A1/en not_active Withdrawn
-
2006
- 2006-11-20 WO PCT/EP2006/068642 patent/WO2007060143A1/en not_active Ceased
- 2006-11-20 EP EP06819598A patent/EP1954852A1/en not_active Withdrawn
- 2006-11-23 TW TW95143357A patent/TWI402373B/en active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI402373B (en) | 2013-07-21 |
| EP1954852A1 (en) | 2008-08-13 |
| WO2007060143A1 (en) | 2007-05-31 |
| DE102005056324A1 (en) | 2007-06-06 |
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