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TW200718114A - Symbol modulation accuracy measuring device, method, program, and recording medium - Google Patents

Symbol modulation accuracy measuring device, method, program, and recording medium

Info

Publication number
TW200718114A
TW200718114A TW095126921A TW95126921A TW200718114A TW 200718114 A TW200718114 A TW 200718114A TW 095126921 A TW095126921 A TW 095126921A TW 95126921 A TW95126921 A TW 95126921A TW 200718114 A TW200718114 A TW 200718114A
Authority
TW
Taiwan
Prior art keywords
symbol
modulation
ideal
unit
modulation accuracy
Prior art date
Application number
TW095126921A
Other languages
English (en)
Inventor
Takashi Shimura
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200718114A publication Critical patent/TW200718114A/zh

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00Arrangements for detecting or preventing errors in the information received
    • H04L1/24Testing correct operation
    • H04L1/242Testing correct operation by comparing a transmitted test signal with a locally generated replica
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L27/00Modulated-carrier systems
    • H04L27/26Systems using multi-frequency codes
    • H04L27/2601Multicarrier modulation systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
TW095126921A 2005-07-26 2006-07-24 Symbol modulation accuracy measuring device, method, program, and recording medium TW200718114A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005216071 2005-07-26

Publications (1)

Publication Number Publication Date
TW200718114A true TW200718114A (en) 2007-05-01

Family

ID=37683463

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095126921A TW200718114A (en) 2005-07-26 2006-07-24 Symbol modulation accuracy measuring device, method, program, and recording medium

Country Status (4)

Country Link
US (1) US20090135891A1 (zh)
JP (1) JP4772792B2 (zh)
TW (1) TW200718114A (zh)
WO (1) WO2007013573A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI393906B (zh) * 2008-05-09 2013-04-21 Advantest Corp 數位調變訊號的測試裝置及測試方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4935596B2 (ja) * 2007-09-25 2012-05-23 横河電機株式会社 半導体試験装置
JP5113677B2 (ja) * 2008-09-03 2013-01-09 株式会社アドバンテスト 位相差対応値測定装置、ゲインインバランス測定装置、方法、プログラムおよび記録媒体
JP5521073B2 (ja) * 2013-03-07 2014-06-11 アンリツ株式会社 移動通信端末試験装置及び移動通信端末試験方法
FR3046705B1 (fr) 2016-01-08 2018-02-16 Commissariat Energie Atomique Source laser a semi-conducteur

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JPH01241931A (ja) * 1988-03-23 1989-09-26 Fujitsu Ltd 加入者無線回線用保守盤
JP3055085B2 (ja) * 1994-04-22 2000-06-19 株式会社アドバンテスト デジタル変調解析装置
JP3017955B2 (ja) * 1996-03-27 2000-03-13 アンリツ株式会社 無線機試験装置及び方法
JP3180727B2 (ja) * 1997-08-06 2001-06-25 日本電気株式会社 送受信機
JP3819592B2 (ja) * 1998-05-18 2006-09-13 株式会社アドバンテスト 64qam、256qam変調解析方法
US6249518B1 (en) * 1998-08-07 2001-06-19 Nortel Networks Limited TDMA single antenna co-channel interference cancellation
US6308065B1 (en) * 1998-12-07 2001-10-23 Agilent Technologies, Inc. Apparatus for testing cellular base stations
JP2000341356A (ja) * 1999-05-31 2000-12-08 Hitachi Denshi Ltd 送信機
US6486819B2 (en) * 1999-10-28 2002-11-26 The National University Of Singapore Circuitry with resistive input impedance for generating pulses from analog waveforms
US20010031023A1 (en) * 1999-10-28 2001-10-18 Kin Mun Lye Method and apparatus for generating pulses from phase shift keying analog waveforms
US6477198B1 (en) * 2000-05-01 2002-11-05 Tektronix, Inc. Quality cause measurement display
US7082174B1 (en) * 2000-07-24 2006-07-25 Qualcomm, Incorporated Method and apparatus for processing a modulated signal using an equalizer and a rake receiver
DE10130687A1 (de) * 2001-06-26 2003-01-02 Rohde & Schwarz Meßsystem mit einem Referenzsignal zwischen einem Signalgenerator und einem Signalanalysator
US7158494B2 (en) * 2001-10-22 2007-01-02 Matsushita Electric Industrial Co., Ltd. Multi-mode communications transmitter
JP3782382B2 (ja) * 2002-08-30 2006-06-07 アンリツ株式会社 変調信号解析装置及び受信モジュール評価システム
JP2004120244A (ja) * 2002-09-25 2004-04-15 Toshiba Corp ディジタル変調信号の品質測定方法
US6882217B1 (en) * 2002-09-27 2005-04-19 3Com Corporation Cubic spline predistortion, algorithm and training, for a wireless LAN system
US7358828B2 (en) * 2003-03-24 2008-04-15 Advantest Corporation Orthogonal modulation device, method, program, recording medium, and modulation device
JP3877708B2 (ja) * 2003-05-23 2007-02-07 三洋電機株式会社 基地局装置、端末装置、通信システム
JP2004356936A (ja) * 2003-05-29 2004-12-16 Tech Res & Dev Inst Of Japan Def Agency 回線品質測定方法及び装置、通信諸元制御方法、無線通信システム並びに無線通信局
JP4673594B2 (ja) * 2004-09-15 2011-04-20 株式会社アドバンテスト 逆特性測定装置および歪み補償装置、方法、プログラム、記録媒体
US7564893B2 (en) * 2005-03-22 2009-07-21 Agilent Technologies, Inc. Test system and method for parallel modulation error measurement of transceivers
JP2007170941A (ja) * 2005-12-21 2007-07-05 Advantest Corp 歪み測定装置、方法、プログラムおよび記録媒体

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI393906B (zh) * 2008-05-09 2013-04-21 Advantest Corp 數位調變訊號的測試裝置及測試方法

Also Published As

Publication number Publication date
US20090135891A1 (en) 2009-05-28
WO2007013573A1 (ja) 2007-02-01
JPWO2007013573A1 (ja) 2009-02-12
JP4772792B2 (ja) 2011-09-14

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