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TW200643398A - Total-reflection attenuation optical probe and far-ultraviolet spectrophotometer - Google Patents

Total-reflection attenuation optical probe and far-ultraviolet spectrophotometer

Info

Publication number
TW200643398A
TW200643398A TW095109824A TW95109824A TW200643398A TW 200643398 A TW200643398 A TW 200643398A TW 095109824 A TW095109824 A TW 095109824A TW 95109824 A TW95109824 A TW 95109824A TW 200643398 A TW200643398 A TW 200643398A
Authority
TW
Taiwan
Prior art keywords
far
ultraviolet region
optical probe
total
optical material
Prior art date
Application number
TW095109824A
Other languages
English (en)
Chinese (zh)
Inventor
Noboru Higashi
Yukihiro Ozaki
Akifumi Ikehata
Original Assignee
Kurashiki Boseki Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kurashiki Boseki Kk filed Critical Kurashiki Boseki Kk
Publication of TW200643398A publication Critical patent/TW200643398A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW095109824A 2005-04-11 2006-03-22 Total-reflection attenuation optical probe and far-ultraviolet spectrophotometer TW200643398A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005113566 2005-04-11

Publications (1)

Publication Number Publication Date
TW200643398A true TW200643398A (en) 2006-12-16

Family

ID=37086699

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095109824A TW200643398A (en) 2005-04-11 2006-03-22 Total-reflection attenuation optical probe and far-ultraviolet spectrophotometer

Country Status (2)

Country Link
TW (1) TW200643398A (fr)
WO (1) WO2006109408A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007108328A1 (fr) * 2006-03-16 2007-09-27 Kurashiki Boseki Kabushiki Kaisha Sonde optique a attenuation de reflexion totale et dispositif spectrometrique pour solution aqueuse
JP4911606B2 (ja) 2007-03-08 2012-04-04 倉敷紡績株式会社 全反射減衰型光学プローブおよびそれを用いた水溶液分光測定装置
TW200944776A (en) 2008-03-04 2009-11-01 Kurashiki Boseki Kk Total reflection attenuation type far-ultraviolet spectroscopy and concentration measurement device using the spectroscopy
CN105071216B (zh) * 2015-09-10 2018-04-06 中国科学院理化技术研究所 一种提高短波深紫外激光输出效率的倍频晶体耦合器
CN115903108A (zh) * 2022-12-07 2023-04-04 光子集成(温州)创新研究院 一种atr晶体及附件

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5017009A (en) * 1986-06-26 1991-05-21 Ortho Diagnostic Systems, Inc. Scattered total internal reflectance immunoassay system
JP2955059B2 (ja) * 1991-04-19 1999-10-04 富士通株式会社 指紋センサ
JP2570548B2 (ja) * 1992-05-29 1997-01-08 株式会社島津製作所 赤外線表面分析方法
JP3670761B2 (ja) * 1996-05-15 2005-07-13 日本分光株式会社 全反射測定装置
JP2003270131A (ja) * 2002-03-19 2003-09-25 Matsushita Electric Ind Co Ltd 特定成分の濃度測定方法
DK1493019T3 (da) * 2002-04-03 2006-12-18 Univ Jw Goethe Frankfurt Main Infraröd måleindretning, især til spektrometriske vandholdige systemer, fortrinsvis af flerkomponentsystemer
JP2004157031A (ja) * 2002-11-07 2004-06-03 System Instruments Kk エバネッセント波を利用した光吸収分光顕微鏡

Also Published As

Publication number Publication date
WO2006109408A1 (fr) 2006-10-19

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