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TW200611080A - Method for forming pattern - Google Patents

Method for forming pattern

Info

Publication number
TW200611080A
TW200611080A TW094117002A TW94117002A TW200611080A TW 200611080 A TW200611080 A TW 200611080A TW 094117002 A TW094117002 A TW 094117002A TW 94117002 A TW94117002 A TW 94117002A TW 200611080 A TW200611080 A TW 200611080A
Authority
TW
Taiwan
Prior art keywords
pattern
light
photosensitive layer
forming
exposure
Prior art date
Application number
TW094117002A
Other languages
English (en)
Inventor
Masanobu Takashima
Hiromi Ishikawa
Yuji Shimoyama
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Publication of TW200611080A publication Critical patent/TW200611080A/zh

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70283Mask effects on the imaging process
    • G03F7/70291Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • G02B26/0833Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70275Multiple projection paths, e.g. array of projection systems, microlens projection systems or tandem projection systems
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0073Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces
    • H05K3/0082Masks not provided for in groups H05K3/02 - H05K3/46, e.g. for photomechanical production of patterned surfaces characterised by the exposure method of radiation-sensitive masks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Materials For Photolithography (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)
TW094117002A 2004-05-26 2005-05-25 Method for forming pattern TW200611080A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004156596 2004-05-26
JP2005107956A JP2006011371A (ja) 2004-05-26 2005-04-04 パターン形成方法

Publications (1)

Publication Number Publication Date
TW200611080A true TW200611080A (en) 2006-04-01

Family

ID=35451035

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094117002A TW200611080A (en) 2004-05-26 2005-05-25 Method for forming pattern

Country Status (5)

Country Link
US (1) US20080113302A1 (zh)
JP (1) JP2006011371A (zh)
KR (1) KR20070026649A (zh)
TW (1) TW200611080A (zh)
WO (1) WO2005116774A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114813758A (zh) * 2014-10-31 2022-07-29 科磊股份有限公司 照明系统、具有照明系统的检验工具及操作照明系统的方法

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101059408B1 (ko) * 2006-08-03 2011-08-29 아사히 가세이 일렉트로닉스 가부시끼가이샤 감광성 수지 조성물 및 적층체
TWI363891B (en) * 2006-11-14 2012-05-11 Lg Display Co Ltd Manufacturing method of the flexible display device
IL194967A0 (en) * 2008-10-28 2009-08-03 Orbotech Ltd Producing electrical circuit patterns using multi-population transformation
EP2562599B1 (en) 2009-01-29 2014-12-10 Digiflex Ltd. Process for producing a photomask on a photopolymeric surface
KR101650878B1 (ko) * 2010-03-22 2016-08-25 삼성디스플레이 주식회사 박막 트랜지스터의 제조 방법 및 이를 이용한 표시 기판의 제조 방법
EP2793077A4 (en) 2011-12-12 2015-07-22 Mitsubishi Electric Corp LASER LIGHT SOURCE DEVICE AND IMAGE DISPLAY DEVICE
JP7111466B2 (ja) * 2014-08-01 2022-08-02 アプライド マテリアルズ インコーポレイテッド 3dパターン形成のためのデジタルグレイトーンリソグラフィ
JP6743021B2 (ja) 2014-12-31 2020-08-19 ドルビー ラボラトリーズ ライセンシング コーポレイション 画像プロジェクタ用の個別レーザファイバ入力
TWI545394B (zh) * 2015-05-29 2016-08-11 Digital roller manufacturing system
WO2017033868A1 (ja) * 2015-08-25 2017-03-02 旭化成株式会社 感光性樹脂組成物
CN111279804B (zh) * 2017-12-20 2023-10-24 住友电气工业株式会社 制造印刷电路板和层压结构的方法
TWI809201B (zh) 2018-10-23 2023-07-21 以色列商奧寶科技有限公司 用於校正晶粒放置錯誤之適應性路由
JP2022071509A (ja) * 2020-10-28 2022-05-16 矢崎総業株式会社 防食材、端子付き電線及びワイヤーハーネス
US12429769B2 (en) * 2021-02-09 2025-09-30 Dupont Electronics, Inc. Photosensitive composition and photoresist dry film made therefrom

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5340537B2 (zh) * 1974-12-27 1978-10-27
JPH02186247A (ja) * 1989-01-12 1990-07-20 Kyushu Electric Power Co Inc 光学検査装置
JP2769753B2 (ja) * 1991-08-28 1998-06-25 株式会社オーク製作所 画像形成用露光装置
JP3218658B2 (ja) * 1992-01-16 2001-10-15 日立化成工業株式会社 レジストの製造法
JP2792342B2 (ja) * 1992-06-18 1998-09-03 日本電気株式会社 厚膜配線パターンの露光法
JP3176178B2 (ja) * 1993-06-25 2001-06-11 松下電工株式会社 回路板製造用マスクおよび回路板の製造方法
JP3391896B2 (ja) * 1994-06-15 2003-03-31 東京応化工業株式会社 耐熱性感光性樹脂組成物
US5741624A (en) * 1996-02-13 1998-04-21 Micron Technology, Inc. Method for reducing photolithographic steps in a semiconductor interconnect process
US6133986A (en) * 1996-02-28 2000-10-17 Johnson; Kenneth C. Microlens scanner for microlithography and wide-field confocal microscopy
KR100214271B1 (ko) * 1996-06-29 1999-08-02 김영환 콘택홀용 위상 반전 마스크
JPH113849A (ja) * 1997-06-12 1999-01-06 Sony Corp 可変変形照明フィルタ及び半導体露光装置
JP3496674B2 (ja) * 1997-11-28 2004-02-16 日立化成工業株式会社 光硬化性樹脂組成物及びこれを用いた感光性エレメント
JP3406526B2 (ja) * 1998-11-26 2003-05-12 日立化成工業株式会社 感光性樹脂組成物、これを用いた感光性エレメント、レジストパターンの製造法及びプリント配線板の製造法
JP2001040174A (ja) * 1999-07-29 2001-02-13 Nippon Kayaku Co Ltd 樹脂組成物、ソルダーレジスト樹脂組成物及びこれらの硬化物
JP2001290014A (ja) * 2000-04-04 2001-10-19 Nikon Corp 光学素子の製造方法及び製造システム並びにこの製造方法を用いて製作された光学素子及びこの光学素子を用いた露光装置
JP2001305663A (ja) * 2000-04-20 2001-11-02 Noritsu Koki Co Ltd 画像焼付装置およびこれを備えた写真処理装置、ならびに画像焼付方法
US6493867B1 (en) * 2000-08-08 2002-12-10 Ball Semiconductor, Inc. Digital photolithography system for making smooth diagonal components
JP2002116315A (ja) * 2000-10-11 2002-04-19 Canon Inc 微細光学素子の製造方法
JP2002139824A (ja) * 2000-11-01 2002-05-17 Ricoh Opt Ind Co Ltd 濃度分布マスク及び多段階露光方法による濃度分布マスクの製造方法
JP2003029415A (ja) * 2001-07-06 2003-01-29 Internatl Business Mach Corp <Ibm> フォトレジスト加工方法及び段型金属体製造方法
JP2003131377A (ja) * 2001-10-22 2003-05-09 Fuji Photo Film Co Ltd 層間絶縁膜用感光性樹脂組成物および感光性転写材料
JP2003223007A (ja) * 2002-01-30 2003-08-08 Fuji Photo Film Co Ltd 平版印刷版の製版方法
JP4731787B2 (ja) * 2002-04-10 2011-07-27 富士フイルム株式会社 露光ヘッド及び露光装置
JP2004006440A (ja) * 2002-04-10 2004-01-08 Fuji Photo Film Co Ltd レーザ装置、露光ヘッド、及び露光装置
JP2003337425A (ja) * 2002-05-20 2003-11-28 Fuji Photo Film Co Ltd 露光装置
JP2003337427A (ja) * 2002-05-20 2003-11-28 Fuji Photo Film Co Ltd 露光装置
JP2003337426A (ja) * 2002-05-20 2003-11-28 Fuji Photo Film Co Ltd 露光装置
JP2003337428A (ja) * 2002-05-20 2003-11-28 Fuji Photo Film Co Ltd 露光装置
JP2003344865A (ja) * 2002-05-22 2003-12-03 Sharp Corp 液晶用マトリクス基板の製造方法および液晶用マトリクス基板、ならびに電子回路基板の接続部形成方法
JP2004062156A (ja) * 2002-06-07 2004-02-26 Fuji Photo Film Co Ltd 露光ヘッド及び露光装置
JP2004062157A (ja) * 2002-06-07 2004-02-26 Fuji Photo Film Co Ltd 光配線回路の製造方法、及びその光配線回路を備えた光配線基板
JP4362680B2 (ja) * 2002-07-15 2009-11-11 セイコーエプソン株式会社 微細構造体の製造方法及び製造装置
JP2004240216A (ja) * 2003-02-06 2004-08-26 Fuji Photo Film Co Ltd プリント配線板の製造方法
JP4450689B2 (ja) * 2003-07-31 2010-04-14 富士フイルム株式会社 露光ヘッド

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114813758A (zh) * 2014-10-31 2022-07-29 科磊股份有限公司 照明系统、具有照明系统的检验工具及操作照明系统的方法

Also Published As

Publication number Publication date
KR20070026649A (ko) 2007-03-08
US20080113302A1 (en) 2008-05-15
JP2006011371A (ja) 2006-01-12
WO2005116774A1 (ja) 2005-12-08

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