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TW200502998A - Method for trimming temperature coefficients of electronic components - Google Patents

Method for trimming temperature coefficients of electronic components

Info

Publication number
TW200502998A
TW200502998A TW093107602A TW93107602A TW200502998A TW 200502998 A TW200502998 A TW 200502998A TW 093107602 A TW093107602 A TW 093107602A TW 93107602 A TW93107602 A TW 93107602A TW 200502998 A TW200502998 A TW 200502998A
Authority
TW
Taiwan
Prior art keywords
parameter value
electronic components
temperature coefficients
trimming
trimming temperature
Prior art date
Application number
TW093107602A
Other languages
English (en)
Inventor
Oleg Grudin
Leslie Landsberger
Gennadiy Frolov
Lyudmila Grudina
Original Assignee
Microbridge Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microbridge Technologies Inc filed Critical Microbridge Technologies Inc
Publication of TW200502998A publication Critical patent/TW200502998A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H01C17/232—Adjusting the temperature coefficient; Adjusting value of resistance by adjusting temperature coefficient of resistance
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01C—RESISTORS
    • H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
    • H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
    • H01C17/26—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by converting resistive material
    • H01C17/265—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by converting resistive material by chemical or thermal treatment, e.g. oxydation, reduction, annealing
    • H01C17/267—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by converting resistive material by chemical or thermal treatment, e.g. oxydation, reduction, annealing by passage of voltage pulses or electric current
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/40—Resistors
    • H10D1/47—Resistors having no potential barriers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49082—Resistor making

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
TW093107602A 2003-03-20 2004-03-20 Method for trimming temperature coefficients of electronic components TW200502998A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US45585503P 2003-03-20 2003-03-20

Publications (1)

Publication Number Publication Date
TW200502998A true TW200502998A (en) 2005-01-16

Family

ID=33418069

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093107602A TW200502998A (en) 2003-03-20 2004-03-20 Method for trimming temperature coefficients of electronic components

Country Status (4)

Country Link
US (1) US7703051B2 (zh)
EP (1) EP1606830A1 (zh)
TW (1) TW200502998A (zh)
WO (1) WO2004097860A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114413437A (zh) * 2021-12-31 2022-04-29 北京小米移动软件有限公司 一种空调压缩机参数调节方法、装置及存储介质

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004097859A2 (en) * 2003-03-20 2004-11-11 Microbridge Technologies Inc. Bidirectional thermal trimming of electrical resistance
US7714694B2 (en) 2004-09-21 2010-05-11 Microbridge Technologies Canada, Inc. Compensating for linear and non-linear trimming-induced shift of temperature coefficient of resistance
US7261461B2 (en) * 2004-09-23 2007-08-28 Microbridge Technologies Inc. Measuring and trimming circuit components embedded in micro-platforms
JP5029615B2 (ja) * 2006-12-19 2012-09-19 日本電気株式会社 回路シミュレータ
KR100902084B1 (ko) * 2007-06-15 2009-06-10 (주)태진기술 전압 레귤레이터 및 그 제조 방법
WO2009111890A1 (en) * 2008-03-14 2009-09-17 Microbridge Technologies Inc. A method of stabilizing thermal resistors
US8618786B1 (en) * 2009-08-31 2013-12-31 Altera Corporation Self-biased voltage regulation circuitry for memory
US8200461B2 (en) * 2009-09-24 2012-06-12 Texas Instruments Incorporated Small-signal stability analysis at transient time points of integrated circuit simulation
WO2014163521A1 (en) 2013-04-01 2014-10-09 Freescale Semiconductor, Inc A current generator circuit and method of calibration thereof
US9570538B2 (en) 2014-03-19 2017-02-14 International Business Machines Corporation Methods of manufacturing polyresistors with selected TCR
US9317647B2 (en) 2014-03-31 2016-04-19 Taiwan Semiconductor Manufacturing Company, Ltd. Method of designing a circuit and system for implementing the method
US9245079B1 (en) * 2014-07-06 2016-01-26 United Microelectronics Corp. Computer implemented method for performing extraction
MY187082A (en) 2015-03-26 2021-08-30 Philip Morris Products Sa Heater management
CN119470573A (zh) * 2023-08-11 2025-02-18 深圳市基克纳科技有限公司 Tcr校准方法、装置、校准设备及可读存储介质

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6306718B1 (en) * 2000-04-26 2001-10-23 Dallas Semiconductor Corporation Method of making polysilicon resistor having adjustable temperature coefficients
JP3896827B2 (ja) * 2001-02-21 2007-03-22 株式会社デンソー 情報コードの解読方法および解読システム
US20030062984A1 (en) * 2001-09-28 2003-04-03 Ishizuka Electronics Corporation Thin film thermistor and method of adjusting reisistance of the same
US20030101573A1 (en) * 2001-12-04 2003-06-05 Nelson Charles Scott Method for manufacturing a planar temperature sensor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114413437A (zh) * 2021-12-31 2022-04-29 北京小米移动软件有限公司 一种空调压缩机参数调节方法、装置及存储介质
CN114413437B (zh) * 2021-12-31 2024-04-02 北京小米移动软件有限公司 一种空调压缩机参数调节方法、装置及存储介质

Also Published As

Publication number Publication date
US20060279349A1 (en) 2006-12-14
US7703051B2 (en) 2010-04-20
EP1606830A1 (en) 2005-12-21
WO2004097860A1 (en) 2004-11-11

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