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SU577442A1 - Method of determining the dimension of a flaw in the irradiating direction - Google Patents

Method of determining the dimension of a flaw in the irradiating direction

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Publication number
SU577442A1
SU577442A1 SU7602373569A SU2373569A SU577442A1 SU 577442 A1 SU577442 A1 SU 577442A1 SU 7602373569 A SU7602373569 A SU 7602373569A SU 2373569 A SU2373569 A SU 2373569A SU 577442 A1 SU577442 A1 SU 577442A1
Authority
SU
USSR - Soviet Union
Prior art keywords
determining
flaw
dimension
defect
irradiating direction
Prior art date
Application number
SU7602373569A
Other languages
Russian (ru)
Inventor
Николай Иванович Загайнов
Дмитрий Дмитриевич Михалицын
Original Assignee
Предприятие П/Я Г-4725
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Предприятие П/Я Г-4725 filed Critical Предприятие П/Я Г-4725
Priority to SU7602373569A priority Critical patent/SU577442A1/en
Application granted granted Critical
Publication of SU577442A1 publication Critical patent/SU577442A1/en

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  • Analysing Materials By The Use Of Radiation (AREA)

Description

(54) СПОСОБ ОПРЕДЕЛЕНИЯ РАЗМЕРА ДЕФЕКТА(54) METHOD FOR DETERMINING DEFECT SIZE

в НАПРАВЛЕНИИ ПРОСВЕЧИВАНИЯin the direction of education

то отношение суммарных интенсивносгей света будет стремитьс  к единице приЗ- сю и изображение дефекта сольетс  с фоном.then the ratio of the total intensity of the light will tend to a unit of the value of 3 and the image of the defect will merge with the background.

Аналогичным образом уменьшаетс  конт растность изображени  канавок дефектометра . Это позвол ет заменить многократное радиографирование с последовательно уменьшающимис  экспозици ми рассматриванием одного первоначального снимка. При этом точность определени  глубины дефектовSimilarly, the image contrast of the flaw gauge grooves is reduced. This makes it possible to replace multiple radiography with successively decreasing exposures by viewing one original image. At the same time, the accuracy of determining the depth of defects

возрастает, а трудоемкость снижаетс . .increases and the complexity decreases. .

Определение глубины дефекта производитDetermining the depth of the defect produces

  путем радиографировани  дефектного учаска издели  и дефектометра таким образом, чтобы просвечиваема  толщина материала в месте расположени  дефекта и в месте расп ложени  дефектометра была одинаковой. Пос |)отообработкн готовый снимсж издели  и дефектометра (или поочередно) помещают перед основным источником света при выключенном дополнительном источнике и наход т изображение дефекта. Включив дополнительный источник света, постепенно увелинивают его Яркость, добива сь исчезновени  изображени  дефекта. Отсчитыва  номер наиболее глубокой канавки дефектометра, котора  также на видна, наход т размер дефекта, равного известной глубине этой канавки.by radiographing the defective part of the product and the defectometer in such a way that the thickness of the material can be illuminated at the location of the defect and at the location of the defectometer. Pos |) From the processing, the finished product and the flaw meter (or alternately) are placed in front of the main light source with the additional source turned off and the image of the defect is found. Turning on an additional light source, gradually increase its brightness, until the image of the defect disappears. Counting the number of the deepest groove of the defectometer, which is also not visible, find the size of the defect equal to the known depth of this groove.

Введение дополнительного светового потока между пленкой и наблюдателем (см. чертеж) осуществл ют, например, с помощью прозрачного стекла 1, отражающего свето вой поток 2 от бсжсжого источника света . в сторону наблюдател  3 и пропускающего основной световой поток 4, прошедщий через пленку 5. Угол наклона и расположение стекп& выбирают такими, чтобы изображени  источников в точке наблюдени  совпадали . Это позвол ет уменьщить вли ние неравномерности световых потоков на точность определени  размера дефектов.The introduction of additional light flux between the film and the observer (see drawing) is carried out, for example, using transparent glass 1, reflecting the light flux 2 from the main light source. towards the observer 3 and transmitting the main light flux 4 passing through the film 5. Tilt angle and location of the stack & choose such that the images of the sources at the point of observation coincide. This makes it possible to reduce the effect of irregularity of light fluxes on the accuracy of determining the size of defects.

Яркость дополнительного и основного источников света регулируют, например, с помощью реостата.The brightness of the additional and primary light sources is regulated, for example, by means of a rheostat.

Claims (4)

1.Рум нцев С. В. Применение радиоавти ных изотопов в дефектоскопии, М. Госатомиа дат. I960.1.Rumntsev, S.V., Use of Radioautinous Isotopes in Flaw Detection, M.Gosatomidat. I960. 2.Рум нцев С. В., Радиационна  дефекте скопи , Атомиздат, 1968, с. 263.2.Romntsev S.V., Radiation defect at Skopi, Atomizdat, 1968, p. 263. 3.Токмаков В. С.,Мойщ Ю, В. Рентген« скопи  в металлургии, М., Металлурги , 1976, с. 53.3. Tokmakov V.S., Moisch Yu, V. Roentgen “save up in metallurgy, M., Metallurgists, 1976, p. 53. 4.Авторское свидетельство СССР4. USSR author's certificate № 458744, М. кл. Q 01 N 23/О4, 1974.No. 458744, M. class. Q 01 N 23 / O4, 1974. ()() ()()
SU7602373569A 1976-06-21 1976-06-21 Method of determining the dimension of a flaw in the irradiating direction SU577442A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SU7602373569A SU577442A1 (en) 1976-06-21 1976-06-21 Method of determining the dimension of a flaw in the irradiating direction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SU7602373569A SU577442A1 (en) 1976-06-21 1976-06-21 Method of determining the dimension of a flaw in the irradiating direction

Publications (1)

Publication Number Publication Date
SU577442A1 true SU577442A1 (en) 1977-10-25

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
SU7602373569A SU577442A1 (en) 1976-06-21 1976-06-21 Method of determining the dimension of a flaw in the irradiating direction

Country Status (1)

Country Link
SU (1) SU577442A1 (en)

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