SU1520520A1 - Device for diagnosis of group of logical units - Google Patents

Abstract

The invention relates to automation and computing, in particular to devices for functional and test diagnostics of logical nodes and blocks of a control system. The purpose of the invention is to reduce the time of functional diagnostics by performing parallel diagnostics. A device for diagnosing a group of logical nodes contains N memory blocks 1, a decoder block 2, a control unit 3, a control unit 5, an indication unit 6, a defect analysis and fixation unit 7. In the device, by introducing N-1 blocks of memory, block 2 of decoders and new connections, it is possible to reduce the time of functional diagnostics. 10 il.

Description

ate yu

JV Yu

The invention relates to automation and computing, in particular to devices for functional and test diagnostics of logical nodes and blocks of a control system.

The purpose of the invention is to reduce the time of functional diagnostics by performing parallel diagnostics.

Fig, 1 shows a diagram of the proposed device; Fig. 2 is a control block diagram; Fig, 3 is a block diagram of the analysis and fixation of defects; FIG. 4 is a diagram of the control assembly; Fig. 5 is a diagram of an address generation unit; on fis, 6 is a diagram of the synchronization node; Fig, 7 is a diagram of the switching node; Fig. 8 is a diagram of the fixing unit; Fig, 9 - the algorithm of the device; jfO shows the type of information required for diagnostics: a is the type of functional diagnostics area, where (LC is the signal value at the contact, OPC is the operable state area, CORS is the end of the operative state areas, OAK is the control node area); b - view of the area of the switching test (TK - type of contact, OCT - area of the switching test); c - type of test diagnostics area. (OTN is the area of the test state, Kot - the end of the areas of the test conditions, OOD is the area of the object of diagnosis)

A device for diagnosing a group of logical nodes (FIG. 1) contains n blocks. 1 memory, block 2 decoders, n nodes 3 controls; , diagnostics objects 4, control unit 5, display unit 6, unit 7 for analysis and fixing of defects.

The control unit 5 (FIG. 2) comprises an address generation unit 8, a synchronization unit 9 and a switching unit 10,

Block 7 analysis and fixation of defects (Fig, 3) contains n nodes 11 fixation, the element OR 12, the element And 13, the delay element 14, the elements OR 15 and 16, the encoder 17, the switch 18 and the register 19,

The control unit 3 (FIG. 4) contains the switching register 20, the information register 21, switches 22, comparison circuits 23, elements 24 and 25, ele10

15

20

25

thirty

35

40

45

50

55

ment NOT 26, tristable elements NOT 27 and 28,

The address generation unit 8 (FIG. 5) contains the element OR 29 and the counter 30,

The node 9 synchronization (Fig.6) contains the element AND 31, the elements OR 32 and 33, the Start button 34, the counters 35 and 36, the element OR 37, the decoders 38 and 39, the element OR 40, the delay element 41, the element OR 42, the generator 43, elements And 44 - 49,

The switching node 10 (FIG. 7) contains a decoder 50, switches 51, element OR 52, elements AND 53 - 55,

The fixing unit 11 (FIG. 8) comprises a trigger 56, an element AND 57, an element OR 59 and a trigger 60,

Memory block 1 is designed to store switching tests, defect numbers and information for performing functional and test diagnostics, C group of information outputs of memory block 1 is: on groups of information inputs of control nodes 3 - switching tests or information for functional and test diagnostics, on the group of information inputs of block 2 decoders - command information; on the group of information inputs of block 7 analysis and fixing of defects - information on the numbers of defects.

The decoder unit 2 is designed to recognize the labels contained in the test information. From the output group of the decoder unit 2, it is directed to a group of inputs for specifying the operation mode of the analysis and fixing defects information about the device operation modes.

The control unit 3 is designed to divide the contacts of the object 4 diagnosed into input and output, feed the input contacts of test information, compare the responses from the output contacts and the expected responses C from the group of inputs / outputs of the control unit 3 is output to the object 4 diagnose test information, with the output of the node 3 to the first) group of information inputs of the analysis and fixing defects block 7 is a signal of incomparable responses.

The control unit 5 organizes the operation of all the units of the device, C of the control unit 5 is assigned to a group

the address inputs of the memory block 1 command information for reading information from the memory block 1, from the output group of the control block 5 to the input group of the control node 3 — the command for setting the node 3 to its initial state and the commands permitting the recording of information, comparison of responses; From the group of outputs of the control unit 5 to the group of control inputs of the display unit 6 - command information allowing the indication from the output of the control unit 5 to the input of the analysis and fixing defect unit 7 - the command for setting the unit 7 to the initial state and command information for recording the unit 7 numbers of defects found.

The display unit 6 is intended to indicate the number of the inoperative diagnostic object 4, the numbers of the detected defects and the message Defect not found.

The unit 7 for analysis and fixation of defects is intended for forming and storing the number of an inoperative diagnostic object 4 and the number of defects found. From the group of information outputs of block 7 for analysis and fixing of defects, the group of information inputs of block 6 of the display will indicate the number of found defects} from the group of information outputs of block 7 to the group of information inputs of block 6 of the display and the group of inputs of block 5 of control - the number of unworkable diagnostic object 4; From the group of outputs of block 7 to the group of inputs of block 5 of the control, information about the necessary operating modes. A device for diagnosing a group of logical nodes operates as follows (FIG. 9)

On a command from the control unit 5, the control unit 5, the defect analysis and fixing unit 7 and the control units 3 are set to the initial state. After that, the device enters the functional diagnostics mode. In the functional diagnostics mode, on command from the control unit 5 from the memory units 1, the first operational states from the areas of the monitoring nodes are compared to the corresponding monitoring units 3 and the current states of the diagnostics objects 4 are compared with the possible operational states. Signals

comparisons or incomparisons with the outputs of the nodes 3 are received in block 7 for the analysis and fixation of defects. If during the functional diagnostics an error signal arrives from the diagnostics object 4 or there are no comparisons in the areas of one of the control nodes 3, then the diagnostics object 4 does not have a defect and the defect analysis and fixing unit 7 first remembers the number of the inoperative object 4 diagnoses and, secondly, translates through block 5 of the control

5 device in test diagnostics mode to search for defects. Otherwise, the functional diagnostics cycle is repeated,

In the test diagnostics mode, according to the commands from the control unit 5, the switching test is read out to the control unit 3 of the inoperative diagnostic object 4 from the corresponding memory unit 1,

5 it is clear that the node 3 of the control produces the required separation of the external contacts of the object 4 is diagnosed neither into input and output. Then, in node 3, the first test is read.

0 state from the area of the object being diagnosed and the comparison of the response received from the object 4 to the diagnosis with the expected one takes place. The comparison can have two outcomes, therefore we consider two options,

1, If a signal of noncomparison is received, then in object 4 of the diagnostics there are no corresponding test

This state of defects. In this case, the operation of the device is repeated in the next test state from the area of the object being diagnosed,

2, If a comparison signal is received,

, then in object 4 the diagnosis is

defects corresponding to this test state. In this case, the block 7 for analyzing and fixing defects from the corresponding block 1 of the memory entry-4 contains the numbers of the found defects. Then, by a command from the control unit 5, the block 6 of the display indicates the number of the inoperable diagnostic object 4 and the number of the found defects coming from block 7 analysis and fixing defects, and block 5 of the control stops the operation of the device. The operator then eliminates the defects found and translates

device into functional diagnostics mode.

If the comparison signal from node 3 still does not arrive at the area of the inoperative diagnostic object 4, then unit 5 stops the device operation and provides an indication in message indication unit 6. The defect is not found. This means that the defect that is present in the object 4 of the diagnosis is not contained in the list of defects for which the defect search test is built. In this case, it is necessary to search for the defect using, for example, test equipment, and from the search results to correct the defect spike and, as a result, to change the defect search test stored in the corresponding memory block 1 . The operator then places the device in functional diagnostics mode.

The control unit 5 (FIG. 2) operates as follows.

Preparation of the device for operation begins with the appearance at the outputs of node 9 of the synchronization of a single CBR signal — a reset, which: First, enters block 7 of analyzing and fixing defaults and establishes in it a zero GCD — number of the diagnostic object; secondly, it arrives at all nodes 3 of the control and sets them to the initial state; thirdly, it arrives at the node 8 of the formation of the address and sets at its outputs a zero NA — the state number. Then, at the outputs of the synchronization unit 9, there appear single signals of the WFD — diagnostics mode and CRIT — readout. The RVD signal arrives at the switching node 10 and transfers it to the functional diagnostics mode, for which the control outputs of the synchronization node 9 are connected to the inputs of all the control nodes 3.

The functional diagnostics mode begins with the appearance at the output of the synchronization unit 9 of a single signal of CALL, which enters memory blocks 1 and causes reading at the zero address consisting of zero GCD and HC, the first operational states. Information from blocks 1 of the memory is written into the corresponding nodes 3 of the control by the signal ZRGI - write to the register information

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tion, which comes from the output node

9 synchronization through the node 10 switching to all nodes 3 control. Then, at the output of the synchronization node 9, a single RZS signal appears — the resolution of the comparison, which, through the node

10 switching goes to all nodes

3 and allows comparison of the PC recorded in them - a healthy state - with the current state of the object

4 Diagnostics. Then, from the output of the synchronization node 9, the signal is generated at the address generation node 8

+1 NS, at which the address of the next operational state is set at the output of the ADR, and the operation of the device is repeated.

In the case of the operability of all objects 4 in the diagnostics, the output of the ADRs constantly contains zero GCD (higher address bits) and a cyclically varying NN. In addition, each repetition of the cycle of recalculation of states, starting with zero HC, is the repetition of the functional diagnostics cycle.

In the event that one of the diagnostics objects 4 fails to work, the synchronization node 9 from the analysis and fixing defects block 7 receives a PD signal — a search for defects, which puts the device into test diagnostics mode.

Test diagnostics mode consists of three modes: commutation, search, and 3 recordings.

1. Switching mode. From block 7 for analyzing and fixing GCD defects, the number of an inoperative diagnostic object comes: first, to the input of switching unit 10, which connects the control outputs of synchronization node 9 to the inputs of node 3 of the control of an inoperative PD; secondly, ADRs to form the switching test address. The signal SHIT from the synchronization node 9 is fed to the memory blocks 1, allowing the reading of the switching test on the ADR consisting of the number of the inoperative OD (the highest bits of the ADR) and zero NS. Then, according to the signal of the CMS, an entry into the switching register, coming from the synchronization node 9 through the switching node 10, to the monitoring unit 3 of the inoperative diagnostic object 4 from the corresponding memory unit 1 is recorded the switching test

After the OTdi o n node At the synchronization, the signals of the +1 MF RJ and + 1 NS signal are generated. The signal +1 (H RJ switches the device to the search mode, and the signal +1 NS, which arrives at the address generation node 8, increases by one the address at the output of the ADG unit,

2. Search mode. The signal READS from the synchronization node 9 goes to the memory blocks 1, allowing the reading of the first test state. Then

according to the ZRGI signal — recording information from the synchronization node 9 through the switching node 10 into the register; monitoring the inoperative OD from the corresponding memory block I, the first test status from the area of the diagnostic object is recorded in the control module 3. After that, the node 9 of the synchronization generates the OCR signal; the resolution of the comparison, coming through the switching node 10 to the node 3 of the control of the inoperative PD, which allows comparison of the expected response of the OD with the actual one. The comparison result can have two outcomes, therefore, we consider both options.

2.1 o At the input of the synchronization node 9 from the unit 7 for the analysis and fixation of defects, a single signal of the SRV is received. In this case the device switches to the recording mode.

2.2. At the input of the synchronization node 9, there is no single SRV signal. In this case, the synchronization node 9 generates a +1 HC signal, which goes to the address generation node 8 and increments the address at the ADR output. After that, the operation of the device is repeated in the next test state.

If the input of the COTS is the end of the test state state of the synchronization node 9, a single signal comes from the analysis and fixing unit 7, then the defect is not found. In this case, the operation of the device is terminated; and from the IND 2 code, the indication of the synchronization node 9 is enabled. A single signal arrives at the indication unit 6 and resolves the message indication Defect not found. After finding and eliminating the defect, the operator switches the devices to the functional diagnostics mode.

3, Recording mode. The signal READS from the synchronization node 9 goes to the memory blocks 1, allowing reading

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ND - defect numbers. Then, according to the ZRGN signal — an entry in the number register, coming from the synchronization node 9, in the block 7 for analyzing and fixing defects from the memory block 1 corresponding to the inoperative OD, the defect numbers of the inoperative OD are recorded. Then, the synchronization node 9 generates an IND 1 signal — an indication of the indication, according to which: first, the device stops; secondly, the indication is allowed in the indication unit 6 of the IOD and LP, by which the defect is located and repaired. After that, the operator switches the device to the functional diagnostics mode.

Unit 7 analysis and fixation of the defector (fig.Z) works as follows.

The CBP signal — a reset from the control unit 5 sets all the fixing units 11 to their initial state, at which at the OTP outputs — the diagnosed object is inoperable — zeroes appear, and at the FDC outputs — the diagnosable object is operational — one appears; the output of the encoder 17 appears zero GCD - the number of the object to be diagnosed, the output of the element And 13 is the unit that, through the delay element 14, as a signal PIT - prohibition, goes to the inputs of all fixing nodes 11 and allows writing the OSB signals to them - an error or KORS - onets areas operable object diagnosing conditions.

SRV signals — comparisons from each of the 3 control units arrive at the inputs of the corresponding latching node 11, and also pass through the OR element 12 to the control unit 5. The arrival of the SRV signal causes blocking at the corresponding input of the SORCE, which is removed by the CBR signal when the loop is repeated functionally diagnosing.

The transition from the functional diagnostics mode to the test diagnostics mode is carried out on a single OBS signal from the diagnostic object 4 or the CORD from the decoder unit 2. The arrival of the signal KORS in the absence of a blockage on this input of the model KORS or the signal of the BSG causes the following occurrence: firstly, at the corresponding output of the ODNR of the unit that is set to invalid

it OD at the output of the encoder 17; secondly, at the corresponding output of ODR zero, which through the element 13 and the delay element 14 arrives at the input of all fixing nodes 11 and prohibits reception of the OSB and KORS signals in them thirdly, at the corresponding output. de CZ - search for defects in the unit that enters through the OR element 16 on the control unit 5 and converts the device to a test diagnostics mode. The single signal at the output of the PD appears for the time determined by delay element 14 and required for setting the signals at the outputs of the PDNR, ODP.

In the test diagnostics mode, the cat signals from the decryption unit 2 pass through the OR 15 element and arrive at the control unit 5.

At the end of the search for defects, the register 19 of the corresponding memory block 1 through the IS switchboard, controlled by the encoder 17, by the enable signal ZRGY - entry in the number register - are written ND - defect numbers that come from the output of the register 19 to the display unit 6 . The operation of the block 7 for analyzing and fixing defects is repeated by the next CBP signal from the control block 5.

The control unit 3 (FIG. 4) works as follows.

First, from the control unit 5, a CBR - reset signal is received at the node input, which, in order to provide the functional diagnostics mode, sets the switching register 20 to one state, i.e., all the O. contacts are announced as output. Then the ERGI signal is input to the node - writing to the information register, by which the operational state from memory block 1 is recorded to information register 21. Then to the input of the switch 22 receives a single signal TK - type of contact. This signal passes: firstly, to the input of the element I 25 and allows the RZS signal passing through it - resolution – comparison; secondly, through the element HE 26 at the input of the three-stable element HE 28 and translates it into a state of high resistance at the output, i.e. disables the output register 21 UT of the output contact; thirdly, the input of the three-stable element is NOT 27 and provides feed through.

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RK - contact reactions from the output contact to the input of the comparison circuit 23. At the same time, the SCC is supplied to another input of the comparison circuit 23 — the signal value at the contact from the register 21 output. Then, a single RZS signal arrives at the input of the switch 22, which passes through the AND 25 element to the input of the comparison circuit 23 and enables the comparison of the RC with the AC. If the RC is not equal to RC, then at the output of the comparison circuit 23 a zero appears, which is transmitted through the element 24 as a nerve signal — incomparison goes to block 7 for analyzing and fixing defects. If the RC is equal to the RC in all circuits 23 comparing the node, then from the output of the element AND 24 is the independent signal of SRV - the comparison goes to block 7 for analyzing and fixing defects,

In the test diagnostics mode, the signal of the RRCC is sent to the input of the node — an entry in the switching register, according to which CT is recorded in the switching register 20 — a switching test. The switches 22 to which the code is connected. The OD contacts operate as described for the functional diagnostics mode.

Consider how switch 22 works when an input contact OD is connected to it. In this case, the corresponding register bit 20 of the switching is written to zero, t, e, the input of the switch 22 is received by the zero signal TC, which comes: first, the input element And 25 and prohibits the passage through it of the signal RZS; secondly, to the input of the three-stable element HE 27 and puts it into a high resistance state at the output, i.e., e, disconnects the input contact from the input of the comparison circuit 23; thirdly, through the element HE 26 to the input of the three-stable element HE 28 and provides the supply through it of the AC to the input contact,

The fixing unit 11 (FIG. 8) operates as follows.

The CBP signal — a reset from the control unit 5 sets the triggers 56 and 60 to zero. A unit arrives at the inverse output of the trigger 56, which enters the input of the And 57 element, allowing the KORS signal to pass through it — the end of the operational state OD , At the direct output of the flip-flop 60 of the ODNR, the diagnostic object is inoperable — a zero appears at the input of the encoder 17. At the inverse output of the flip-flop 60, the RRT — the diagnostics object is operational — there appears a unit that arrives at the input of the And 13 element. Yes, the delayed entry element 14 of the LPRD - the prohibition is received by the unit that permits the passage of the OSHV signals through the AND 59 element - an error and the CORS.

A single CPB signal - the comparison sets in one a trigger 56, while at the inverse output of the trigger appears zero, which prohibits the passage of the signal from the CORS through the element 57.

The arrival of the signal KORS from the block 2 of the encoders (assuming the zero state of the trigger 56) or the error signal from the diagnostic object 4 causes the appearance at the output of the element OR 58 unit, which through the element 59 comes: first, as the signal PD search for defects through the element OR 16 on the control unit 5 for switching the device to the test diagnostics mode; secondly, the input to the installation in the unit of the trigger 60, In this case, the unit from the output ODNR goes to the encoder 17 and sets the GCD - the number of the object of diagnosis. Zero from the ODP output — via element 13 and delay element 14 — arrives at the SPRT input and provides storage of information in trigger 60. Delay element 14 is designed for reliable switching of trigger 60, then the operation is repeated on the next CBP signal from control unit 5 .

Claims (1)

Invention Formula A device for diagnosing a group of logical nodes containing a first memory block, n control nodes, a control unit, a display unit, an analysis and fixing unit for defects, the group of control inputs of the display unit connected to the first group of outputs of the control unit, the group of inputs for setting the operation mode connected to a group of outputs for setting the mode of the block for analysis and fixing defects, the first group of information inputs of which is connected to ,P Q 5 0 five five The comparison outputs of the control nodes, the installation inputs of which are combined, are connected to the installation input of the analysis and defect fixation unit and connected to the installation output of the control unit, the second group of outputs of which is connected to the group of address inputs of the first memory block, the group of information outputs of which is connected to the group of information the inputs of the first control node, the group of input-output codes of the control nodes are the input-output groups of the device for connection to the input-output groups of the monitored log nodes, the second group of information inputs of the block of analysis and fixing defects is a group of device error inputs for connecting monitored logic nodes to the error output group; the first group of information outputs of the block of analysis and fixing defects is connected to the group of inputs of the number of the block of the block being monitored, controlling and the first group of information inputs of the display unit, the second group of information inputs of which is connected to the second group of informational outputs of the analysis and fixation unit Effects, the control unit contains a synchronization node, an address generation unit, the input group of the synchronization node mode setting is a group of inputs of the control unit operation mode, the first output group of which is connected to the first output node of the synchronization node, the first output of which and the output group of the formation node addresses are connected to the second group of outputs of the control unit, the group of synchronization inputs of the node forming the address is connected to the second group of outputs of the synchronization node, the second output of which th is FITTING you to exit the control unit, and the analyzing unit comprises a fixing defects claim fixing node elements and interposer, two OR gates, a delay element, a register, wherein the fixing unit comprises an OR gate, the first element. And the first trigger, and the output of the OR element of the fixation node is connected to the first input of the first element AND the fixing node, the output of the first element AND of the fixation node is connected to the installation input of 1 of the first trigger. moreover, the inputs of the first element 1W of the analysis and fixation unit of defects are connected to the first group of information inputs of the analysis and fixation unit of the second group of informational inputs of which are connected to the group of first inputs of the elements OR n fixing units, the first group of informational outputs of the unit for analyzing and fixing defects is connected to the group of outputs the encoder, the inputs of which are connected to the direct outputs of the first triggers of all fixing nodes, the outputs of the first elements And which are connected to the inputs of the second element OR of the block analysis and fixation of defects, the set-up input of which is connected to the installation inputs of the first triggers of all fixing nodes, the inverse outputs of the first triggers of which are connected to the inputs of the element AND block of the analysis and fixing of defects, the group of outputs whose mode settings are connected to the outputs of the first and second the OR elements of the block for the analysis and fixation of defects, the output of the element AND of which is connected to the input of the delay element, the output of which is connected to the second inputs of the first elements AND of all the fixation nodes, the group of outputs of the register of the ene with a second group of information outputs analysis unit and fixing defects. Compensation input, the recording of the defect number of which is connected to the recording resolution input, characterized in that, in order to reduce the time of functional diagnostics, a block of decoders and n - 1 memory blocks are entered into the device, with the group of address inputs from the second to the nth blocks the memory is connected to the second group of outputs of the control unit, the third to (n + 2) -th groups of outputs of which are connected to the corresponding groups of synchronization inputs and control nodes, the output of the control unit is connected to the input of the write permission of the defect number This block of analysis and fixation of defects, the first and second groups of inputs of which operation mode are connected to the first and second groups of outputs of the decoder block, respectively, n groups of information inputs of which are connected respectively to the third (n + 2) -th group 0 five 0 five 0 five 0 five 0 five information inputs of the block of analysis and fixation of defects, with groups of information outputs of the p blocks of memory, groups of information outputs of the second to nth memory blocks are connected respectively to groups of information inputs from the second of the nth „nodes to the ontrol, control unit, a switching node has been entered, the group of inputs of the number of the controlled logical node is connected to the group of information inputs of the switching node and the second group of outputs of the control unit whose output is connected to the third output of the synchronization node, A group of ports of which is connected to a group of control inputs of the switching node, n groups of outputs: whose turns are connected respectively to the third (n + 2) -th group of outputs of the control unit, the output of the address generation node is connected to the input of the synchronization node, the third element iUTH, the switch is entered into the block for analyzing and fixing defects, the second trigger, the second element AND, the second input of the element OR of the fixing node connected to the output of the second element AND of the fixing node, the first input of the second element a AND the fixing unit is connected to the inverse output of the second trigger, the installation input of Oh which is connected to the installation input of the analysis and fixing unit of defects, the first and second groups of inputs whose operation mode is connected respectively to the group of second inputs of the second elements of the fixation nodes and inputs of the third element OR block of analysis and fixing of defects, the output of the third element OR of which is connected to the group of outputs of setting the mode of the block of analysis and fixing of defects, from the third to () group of information inputs s which are connected with n groups of information. the switch inputs, the output group of which is connected to the register information input group, the switch control input group is connected to the encoder output group, the installation set of 1 second triggers and fixing nodes is connected to the first group of information inputs of the analysis and defect fixing unit. 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