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SG164358A1 - Vision inspection apparatus - Google Patents

Vision inspection apparatus

Info

Publication number
SG164358A1
SG164358A1 SG201001343-1A SG2010013431A SG164358A1 SG 164358 A1 SG164358 A1 SG 164358A1 SG 2010013431 A SG2010013431 A SG 2010013431A SG 164358 A1 SG164358 A1 SG 164358A1
Authority
SG
Singapore
Prior art keywords
trays
vision inspection
inspection apparatus
electronic components
vision
Prior art date
Application number
SG201001343-1A
Inventor
Hong-Jun Yoo
Woon-Joung Yoon
Original Assignee
Jt Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jt Corp filed Critical Jt Corp
Publication of SG164358A1 publication Critical patent/SG164358A1/en

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  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Supply And Installment Of Electrical Components (AREA)

Abstract

Disclosed is a vision inspection apparatus, and particularly, to a capable of inspecting external appearance of electronic components stacked on trays. The vision inspection apparatus comprises: two or more trays loaded with electronic components thereon; a vision inspection unit for vision-inspecting the electronic components loaded in the trays; and a dumping unit for exchanging good products and bad products with each other between the trays according to a result of the vision inspection, wherein the dumping unit places good electronic component in one or more trays, and places bad electronic component in the remained one or more trays.
SG201001343-1A 2009-03-05 2010-03-01 Vision inspection apparatus SG164358A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020090018947A KR101134985B1 (en) 2009-03-05 2009-03-05 Vision inspection apparatus

Publications (1)

Publication Number Publication Date
SG164358A1 true SG164358A1 (en) 2010-09-29

Family

ID=42690311

Family Applications (1)

Application Number Title Priority Date Filing Date
SG201001343-1A SG164358A1 (en) 2009-03-05 2010-03-01 Vision inspection apparatus

Country Status (4)

Country Link
KR (1) KR101134985B1 (en)
CN (1) CN101826476B (en)
SG (1) SG164358A1 (en)
TW (1) TWI448680B (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI624660B (en) * 2015-02-10 2018-05-21 宰体有限公司 Device handler, and vision inspection method
KR101940986B1 (en) * 2017-04-25 2019-01-22 주식회사 파워로직스 Apparatus for coupling bracket for comera module
KR101908436B1 (en) 2018-06-21 2018-10-16 (주)풍진솔루션 Automatic Detection System for Insert Parts of Airbag Cover Housing for Vehicle
KR102122760B1 (en) * 2018-11-21 2020-06-26 정성욱 System for changing tray
CN109444157A (en) * 2018-12-25 2019-03-08 苏州凡目视觉科技有限公司 A kind of scratch detection apparatus and method
CN111620118A (en) * 2020-05-29 2020-09-04 苏州天准科技股份有限公司 Blanking equipment and camera protection module detection system
KR102600760B1 (en) * 2021-03-23 2023-11-14 동원시스템즈 주식회사 Automatic inspection apparatus for small battery can
KR102820399B1 (en) * 2021-09-29 2025-06-12 삼성전자주식회사 Equipment front end module and destructive analysis automation apparatus including the same
KR102367414B1 (en) * 2021-11-09 2022-02-25 주식회사 엔시스 Secondary battery sorting equipment

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01183826A (en) * 1988-01-19 1989-07-21 Toshiba Corp Method of supplying electronic component
US6956963B2 (en) * 1998-07-08 2005-10-18 Ismeca Europe Semiconductor Sa Imaging for a machine-vision system
KR200339601Y1 (en) * 2003-10-13 2004-01-24 한미반도체 주식회사 apparatus for vision inspection of semiconductor devices
US6919718B2 (en) * 2003-11-10 2005-07-19 Unisys Corporation System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically
KR100638311B1 (en) * 2005-01-31 2006-10-25 (주) 인텍플러스 Semiconductor device inspection device and method of classifying semiconductor device using same
KR100705655B1 (en) * 2005-10-19 2007-04-09 (주) 인텍플러스 Classification method of semiconductor package
TWI311542B (en) * 2006-06-27 2009-07-01 Hon Tech Inc Testing machine for electronic element
US7514914B2 (en) * 2007-04-12 2009-04-07 Chroma Ate Inc Test circuits of an apparatus for testing system-in-package devices
KR100867386B1 (en) * 2007-06-29 2008-11-06 (주) 인텍플러스 Semiconductor device vision inspection system
CN101396692B (en) * 2007-09-28 2012-02-29 鸿劲科技股份有限公司 A device that can automate the appearance inspection of electronic components

Also Published As

Publication number Publication date
CN101826476A (en) 2010-09-08
CN101826476B (en) 2012-10-10
TWI448680B (en) 2014-08-11
KR20100100198A (en) 2010-09-15
TW201033601A (en) 2010-09-16
KR101134985B1 (en) 2012-04-09

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