[go: up one dir, main page]

SG11201800262YA - Defect measurement method, defect measurement device, and testing probe - Google Patents

Defect measurement method, defect measurement device, and testing probe

Info

Publication number
SG11201800262YA
SG11201800262YA SG11201800262YA SG11201800262YA SG11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA
Authority
SG
Singapore
Prior art keywords
defect measurement
testing probe
measurement device
measurement method
defect
Prior art date
Application number
SG11201800262YA
Inventor
Toyokazu Tada
Hidehiko Suetsugu
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of SG11201800262YA publication Critical patent/SG11201800262YA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013Arrangements for scanning
    • G01N27/902Arrangements for scanning by moving the sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
SG11201800262YA 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe SG11201800262YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015142390A JP6579840B2 (en) 2015-07-16 2015-07-16 Defect measurement method, defect measurement apparatus, and inspection probe
PCT/JP2016/067808 WO2017010215A1 (en) 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe

Publications (1)

Publication Number Publication Date
SG11201800262YA true SG11201800262YA (en) 2018-02-27

Family

ID=57756918

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201800262YA SG11201800262YA (en) 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe

Country Status (8)

Country Link
US (1) US10539535B2 (en)
EP (1) EP3336533B1 (en)
JP (1) JP6579840B2 (en)
KR (1) KR102501069B1 (en)
CN (1) CN107850571B (en)
SA (1) SA518390730B1 (en)
SG (1) SG11201800262YA (en)
WO (1) WO2017010215A1 (en)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017197505A1 (en) * 2016-05-20 2017-11-23 Desjardins Integrity Ltd. System and method for detecting and characterizing defects in a pipe
US10914709B2 (en) * 2017-07-24 2021-02-09 Pii Pipetronix Gmbh Internal/external discrimination of metal loss defects
CN109491306B (en) * 2017-09-11 2024-01-23 清华大学 Dynamic magnetic detection probe and electromagnetic array control method
WO2019054158A1 (en) * 2017-09-13 2019-03-21 コニカミノルタ株式会社 Nondestructive inspecting device, nondestructive inspecting system, and nondestructive inspecting method
JP6782931B2 (en) * 2017-09-27 2020-11-11 日立造船株式会社 Eddy current flaw detector
JP6782930B2 (en) * 2017-09-27 2020-11-11 日立造船株式会社 Eddy current flaw detector
JP6978913B2 (en) 2017-12-01 2021-12-08 住友化学株式会社 Defect measuring device, defect measuring method and inspection probe
CN109975398B (en) * 2017-12-27 2022-10-21 核动力运行研究所 Method for detecting wiring of magnetic flux coil of eddy current detection probe of heat transfer pipe
CN108469514A (en) * 2018-06-07 2018-08-31 青岛理工大学 Monitoring equipment and method for corrosion behavior of steel bar in concrete
US11002638B2 (en) 2019-03-22 2021-05-11 Raytheon Technologies Corporation Multi-zone automatic magnetoscop inspection system
JP6988854B2 (en) * 2019-03-28 2022-01-05 横河電機株式会社 Sensor device, arithmetic unit, pipeline monitoring system, arithmetic method and program
EP3961203B1 (en) * 2019-04-24 2022-11-30 JFE Steel Corporation Leakage magnetic flux flaw inspection device
CN110006338B (en) * 2019-04-28 2020-11-06 哈尔滨工业大学(深圳) Method for detecting damage area of steel wire rope
CN110487889A (en) * 2019-08-30 2019-11-22 中国计量大学 Monitor the electromagnetic sensor and monitoring method of elevator traction steel band state
CN111024810B (en) * 2019-11-08 2022-10-14 上海应用技术大学 An eddy current testing device capable of simultaneously detecting defects on the inner and outer walls of a short stainless steel pipe
DE102020108963A1 (en) * 2020-03-31 2021-09-30 Rosen Swiss Ag Inspection device for the inspection of flat metal objects
KR102791047B1 (en) * 2020-04-14 2025-04-07 한화에어로스페이스 주식회사 Inspection device
CN111443127A (en) * 2020-05-29 2020-07-24 沈阳仪表科学研究院有限公司 A non-destructive testing sensor based on the principle of weak magnetic field and its measurement method
KR102837188B1 (en) * 2020-07-31 2025-07-21 제이에프이 스틸 가부시키가이샤 Inspection apparatus, inspection system and inspection method, and repair method of absence
WO2022196425A1 (en) 2021-03-16 2022-09-22 住友化学株式会社 Information processing method, program, information processing device, and model generation method
CN113267559B (en) * 2021-07-06 2023-03-17 清华大学 Magnetic flux leakage detection device and magnetic flux leakage detection method
CN113777155B (en) * 2021-09-09 2024-05-03 国家石油天然气管网集团有限公司华南分公司 An eddy current probe based on Halbach array coil
CN113777154B (en) * 2021-09-09 2024-06-07 国家石油天然气管网集团有限公司华南分公司 A method for enhancing the sensitivity of eddy current sensor coil
CN115902290A (en) * 2021-09-30 2023-04-04 中国石油化工股份有限公司 A speed measuring device and a speed measuring method for an instrument in a pipeline
CN114354740B (en) * 2022-03-09 2022-05-31 成都熊谷油气科技有限公司 Pipeline detection system
CN114551027A (en) * 2022-03-31 2022-05-27 华中科技大学 Halbach magnetizer and bridge cable defect detection device
KR102471231B1 (en) * 2022-06-27 2022-11-25 재단법인차세대융합기술연구원 External magnetization system using plurality of solenoid modules with halbach array and operation method therefor
US20240118241A1 (en) * 2022-10-03 2024-04-11 King Abdullah University Of Science And Technology Remote field eddy current based system and method for corrosion inspection
BE1032467B1 (en) * 2024-03-14 2025-10-13 Rosen Ip Ag Method for determining hard spots in metallic test objects as well as inspection device and inspection device arrangement therefor

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5094987A (en) * 1973-12-22 1975-07-29
US3940689A (en) * 1974-05-14 1976-02-24 Schlumberger Technology Corporation Combined eddy current and leakage field detector for well bore piping using a unique magnetizer core structure
US4659991A (en) * 1983-03-31 1987-04-21 Ndt Technologies, Inc. Method and apparatus for magnetically inspecting elongated objects for structural defects
DE3515977A1 (en) 1985-05-03 1986-11-06 Nukem Gmbh, 6450 Hanau METHOD AND DEVICE FOR DESTRUCTION-FREE TESTING OF FERROMAGNETIC BODIES
JPS6340850A (en) 1986-08-07 1988-02-22 Nippon Kokan Kk <Nkk> Eddy current exploration device
US4789827A (en) * 1986-10-31 1988-12-06 Electric Power Research Institute Magnetic flux leakage probe with radially offset coils for use in nondestructive testing of pipes and tubes
JPH02210256A (en) 1989-02-10 1990-08-21 Kawatetsu Techno Res Corp Method and device for eddy current flaw detection of tube
JPH0353155A (en) 1989-07-20 1991-03-07 Nippon Hihakai Keisoku Kenkyusho:Kk Detector for internal defect or damage for steel material
JP2639264B2 (en) 1991-12-13 1997-08-06 日本鋼管株式会社 Steel body inspection equipment
JPH08136508A (en) 1994-11-10 1996-05-31 Nippon Steel Corp Sensitivity calibration method for magnetic flux leakage inspection
JPH09188496A (en) 1995-11-09 1997-07-22 Sumitomo Constr Mach Co Ltd Wire rope damage detecting device
US6150809A (en) 1996-09-20 2000-11-21 Tpl, Inc. Giant magnetorestive sensors and sensor arrays for detection and imaging of anomalies in conductive materials
JP2002005893A (en) 2000-06-20 2002-01-09 Tokyo Gas Co Ltd Defect determination method and sensor calibration method in pipe inspection device
US6888346B2 (en) * 2000-11-28 2005-05-03 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Magnetoresistive flux focusing eddy current flaw detection
GB0112983D0 (en) * 2001-05-30 2001-07-18 Advanced Eng Solutions Ltd Pipe condition detecting apparatus
JP3709930B2 (en) 2002-02-15 2005-10-26 Jfeスチール株式会社 Method for detecting surface layer or surface defect, apparatus for detecting surface layer or surface defect, and method for manufacturing steel strip for manufacturing steel strip for cold rolling or plating
GB0216981D0 (en) 2002-07-22 2002-08-28 Borealis Tech Oy Testing steel members
JP2004212161A (en) 2002-12-27 2004-07-29 Osaka Gas Co Ltd Piping inspection method
JP2004279372A (en) 2003-03-19 2004-10-07 Yazaki Corp Break detection method
US7795864B2 (en) * 2005-03-11 2010-09-14 Baker Hughes Incorporated Apparatus and method of using multi-component measurements for casing evaluation
PL2100072T3 (en) * 2006-12-21 2019-07-31 Athena Industrial Technologies Inc. Linear structure inspection apparatus and method
JP5031528B2 (en) 2007-11-19 2012-09-19 株式会社日立製作所 Wire rope flaw detector
JP2009287931A (en) 2008-05-27 2009-12-10 Mitsubishi Electric Corp Rust detecting device and method
US8578860B2 (en) * 2008-09-18 2013-11-12 Lawrence Livermore National Security, Llc Inductrack III configuration—a maglev system for high loads
JP5269564B2 (en) * 2008-11-28 2013-08-21 非破壊検査株式会社 Tubular Defect Evaluation Method and Tubular Defect Evaluation Apparatus
US8368395B2 (en) * 2008-12-17 2013-02-05 Ndt Technologies, Inc. Magnetic inspection device and method for detecting loss in metallic cross section
JP5169983B2 (en) 2009-05-08 2013-03-27 住友化学株式会社 Defect inspection method for magnetic tube.
JP5233835B2 (en) * 2009-03-11 2013-07-10 住友化学株式会社 Eddy current flaw detection probe
CN102348972B (en) * 2009-03-11 2014-11-05 住友化学株式会社 Eddy current defect detection probe
RU2440493C1 (en) 2010-06-22 2012-01-20 Открытое акционерное общество Научно-производственное предприятие "Научно-исследовательский и проектно-конструкторский институт геофизических исследований геологоразведочных скважин (ОАО НПП "ВНИИГИС") Four-arm caliper- flaw detector for investigation of technical state of casing pipes and tubing strings of oil-gas wells
JP5437979B2 (en) 2010-11-12 2014-03-12 三菱電機株式会社 Wire rope flaw detector
WO2012142306A2 (en) * 2011-04-12 2012-10-18 Sarai Mohammad Magnetic configurations
JP2013160739A (en) 2012-02-09 2013-08-19 Hitachi Ltd Method and apparatus for detecting flaws in magnetic materials
CN102798660B (en) * 2012-08-30 2015-11-11 东北大学 Based on inner and outer walls of pipeline defect detecting device and the method for three axle leakage fields and current vortex
DE102012017871A1 (en) * 2012-09-06 2014-03-06 Institut Dr. Foerster Gmbh & Co. Kg Differential sensor and method for detecting anomalies in electrically conductive materials
JP6200638B2 (en) * 2012-09-06 2017-09-20 住友化学株式会社 Eddy current testing probe and eddy current testing equipment
CN103149272A (en) 2013-02-28 2013-06-12 厦门大学 Sub-saturated time-division and multi-frequency magnetic flux leakage testing method
CN103175891A (en) * 2013-02-28 2013-06-26 厦门大学 Permanent magnet and pulsed eddy current composite magnetic flux leakage detection method
US20150239708A1 (en) * 2014-02-25 2015-08-27 Thyssenkrupp Elevator Ag System and Method for Monitoring a Load Bearing Member
US10175200B2 (en) * 2014-05-30 2019-01-08 Prime Photonics, Lc Methods and systems for detecting nonuniformities in a material, component, or structure
US9678041B2 (en) * 2014-07-24 2017-06-13 City of Tallahassee Non-destructive real-time magnetic flux leakage imaging system and method
US9287029B1 (en) 2014-09-26 2016-03-15 Audeze Llc. Magnet arrays

Also Published As

Publication number Publication date
KR102501069B1 (en) 2023-02-20
WO2017010215A1 (en) 2017-01-19
JP6579840B2 (en) 2019-09-25
CN107850571B (en) 2021-03-30
US20180217097A1 (en) 2018-08-02
JP2017026354A (en) 2017-02-02
KR20180030991A (en) 2018-03-27
SA518390730B1 (en) 2021-12-06
EP3336533B1 (en) 2020-04-15
US10539535B2 (en) 2020-01-21
EP3336533A1 (en) 2018-06-20
EP3336533A4 (en) 2019-03-27
CN107850571A (en) 2018-03-27

Similar Documents

Publication Publication Date Title
SG11201800262YA (en) Defect measurement method, defect measurement device, and testing probe
BR112016020051A2 (en) AIRCRAFT STRENGTH TEST APPARATUS AND AIRCRAFT STRENGTH TEST METHOD
IL273981A (en) Methods and devices for performing an analytical measurement
SG11201800264QA (en) Defect measurement method, defect measurement device, and testing probe
SG11201702570TA (en) Position accuracy inspecting method, position accuracy inspecting apparatus, and position inspecting unit
EP3588064A4 (en) OH RADICAL DETECTION PROBE, OH RADICAL MEASURING DEVICE AND OH RADICAL MEASURING METHOD
ZA201702992B (en) Transformer test device and method for testing a transformer
SG11201702286WA (en) Residual-stress measurement device and residual-stress measurement method
GB2570849B (en) Nanopore-forming method, nanopore-forming device and biomolecule measurement device
IL259443B (en) Nondestructive measurement apparatus
SG11201700713QA (en) Device inspection method, probe card, interposer, and inspection apparatus
GB201510765D0 (en) Method, apparatus and electrochemical test device
GB201505999D0 (en) Measurement method and apparatus
EP3275374A4 (en) Ultrasonic probe, ultrasonic diagnostic device, and method for testing ultrasonic probes
SG10201400508TA (en) Method and test system for testing wireless lan devices
GB2545541B (en) Sample testing apparatus and method
EP3561468A4 (en) STRESS MEASUREMENT METHOD, STRESS MEASURING DEVICE AND STRESS MEASURING SYSTEM
EP3321663A4 (en) Measuring chip, measurement device, and measurement method
GB201518615D0 (en) Test methods and apparatus
TWI560461B (en) Test apparatus and method for testing a device under test
PL3358944T3 (en) Diagnostic apparatus and testing method
GB201421050D0 (en) Load measurement device and method for determining load
GB2536055B (en) A method for testing a device under test and a test device therefor
GB201615307D0 (en) Measurement method and apparatus
PL3427075T3 (en) Method for performing an nmr measurement, probe arrangement for an nmr spectrometer, and nmr spectrometer arrangement