SG11201506367TA - Apparatus and methods for pulsed photo-excited deposition and etch - Google Patents
Apparatus and methods for pulsed photo-excited deposition and etchInfo
- Publication number
- SG11201506367TA SG11201506367TA SG11201506367TA SG11201506367TA SG11201506367TA SG 11201506367T A SG11201506367T A SG 11201506367TA SG 11201506367T A SG11201506367T A SG 11201506367TA SG 11201506367T A SG11201506367T A SG 11201506367TA SG 11201506367T A SG11201506367T A SG 11201506367TA
- Authority
- SG
- Singapore
- Prior art keywords
- etch
- methods
- excited deposition
- pulsed photo
- pulsed
- Prior art date
Links
- 230000008021 deposition Effects 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
- C23C16/483—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using coherent light, UV to IR, e.g. lasers
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/121—The active layers comprising only Group IV materials
- H10F71/1215—The active layers comprising only Group IV materials comprising at least two Group IV elements, e.g. SiGe
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02529—Silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02576—N-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Optics & Photonics (AREA)
- Drying Of Semiconductors (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361798938P | 2013-03-15 | 2013-03-15 | |
| PCT/US2014/017384 WO2014149336A1 (en) | 2013-03-15 | 2014-02-20 | Apparatus and methods for pulsed photo-excited deposition and etch |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11201506367TA true SG11201506367TA (en) | 2015-09-29 |
Family
ID=51522864
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201506367TA SG11201506367TA (en) | 2013-03-15 | 2014-02-20 | Apparatus and methods for pulsed photo-excited deposition and etch |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US9123527B2 (en) |
| KR (1) | KR102161241B1 (en) |
| CN (2) | CN105103271B (en) |
| SG (1) | SG11201506367TA (en) |
| TW (1) | TWI638402B (en) |
| WO (1) | WO2014149336A1 (en) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9157730B2 (en) * | 2012-10-26 | 2015-10-13 | Applied Materials, Inc. | PECVD process |
| US9576810B2 (en) | 2013-10-03 | 2017-02-21 | Applied Materials, Inc. | Process for etching metal using a combination of plasma and solid state sources |
| US9620382B2 (en) * | 2013-12-06 | 2017-04-11 | University Of Maryland, College Park | Reactor for plasma-based atomic layer etching of materials |
| JP6807860B2 (en) * | 2015-03-20 | 2021-01-06 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | Atomic layer processing chamber for 3D conformal processing |
| US20170345665A1 (en) * | 2016-05-26 | 2017-11-30 | Tokyo Electron Limited | Atomic layer etching systems and methods |
| CN108468037B (en) * | 2018-02-26 | 2019-03-29 | 武汉大学 | Femtosecond laser predissociation device and chemical vapor depsotition equipment |
| KR102049806B1 (en) * | 2018-04-25 | 2020-01-22 | 한국과학기술연구원 | Method and apparatus for surface planarization of object using light source of specific wavelength and reactive gas |
| WO2020033046A1 (en) * | 2018-08-08 | 2020-02-13 | Applied Materials, Inc. | Method of gas composition determination, adjustment, and usage |
| US10867815B2 (en) * | 2018-09-04 | 2020-12-15 | Tokyo Electron Limited | Photonically tuned etchant reactivity for wet etching |
| CA3168583A1 (en) * | 2020-02-21 | 2021-08-26 | Joseph D. BEACH | Systems and methods for microwave removal of nh3 from adsorbent material |
| US11289325B2 (en) * | 2020-06-25 | 2022-03-29 | Tokyo Electron Limited | Radiation of substrates during processing and systems thereof |
| US12334317B2 (en) * | 2021-04-09 | 2025-06-17 | Taiwan Semiconductor Manufacturing Company, Ltd. | Remote plasma ultraviolet enhanced deposition |
| US20220390840A1 (en) * | 2021-06-03 | 2022-12-08 | Mks Instruments, Inc. | Light-Enhanced Ozone Wafer Processing System and Method of Use |
| JP2023044571A (en) * | 2021-09-17 | 2023-03-30 | キオクシア株式会社 | Laser processing apparatus, laser peeling method and method for manufacturing semiconductor device |
| CN117488267A (en) * | 2023-10-19 | 2024-02-02 | 武汉理工大学 | A method of depositing silicon carbide coating on the surface of quartz glass |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4435445A (en) * | 1982-05-13 | 1984-03-06 | Energy Conversion Devices, Inc. | Photo-assisted CVD |
| US4624736A (en) * | 1984-07-24 | 1986-11-25 | The United States Of America As Represented By The United States Department Of Energy | Laser/plasma chemical processing of substrates |
| US4719122A (en) * | 1985-04-08 | 1988-01-12 | Semiconductor Energy Laboratory Co., Ltd. | CVD method and apparatus for forming a film |
| US5769950A (en) * | 1985-07-23 | 1998-06-23 | Canon Kabushiki Kaisha | Device for forming deposited film |
| US4748045A (en) | 1986-04-09 | 1988-05-31 | Massachusetts Institute Of Technology | Method and apparatus for photodeposition of films on surfaces |
| US4816294A (en) * | 1987-05-04 | 1989-03-28 | Midwest Research Institute | Method and apparatus for removing and preventing window deposition during photochemical vapor deposition (photo-CVD) processes |
| JP2641385B2 (en) * | 1993-09-24 | 1997-08-13 | アプライド マテリアルズ インコーポレイテッド | Film formation method |
| US5874011A (en) * | 1996-08-01 | 1999-02-23 | Revise, Inc. | Laser-induced etching of multilayer materials |
| US6780464B2 (en) * | 1997-08-11 | 2004-08-24 | Torrex Equipment | Thermal gradient enhanced CVD deposition at low pressure |
| US6863733B1 (en) * | 1999-07-15 | 2005-03-08 | Nec Corporation | Apparatus for fabricating thin-film semiconductor device |
| US6770144B2 (en) | 2000-07-25 | 2004-08-03 | International Business Machines Corporation | Multideposition SACVD reactor |
| US20020197402A1 (en) * | 2000-12-06 | 2002-12-26 | Chiang Tony P. | System for depositing a film by modulated ion-induced atomic layer deposition (MII-ALD) |
| US7744735B2 (en) * | 2001-05-04 | 2010-06-29 | Tokyo Electron Limited | Ionized PVD with sequential deposition and etching |
| US6838125B2 (en) * | 2002-07-10 | 2005-01-04 | Applied Materials, Inc. | Method of film deposition using activated precursor gases |
| US7253120B2 (en) * | 2002-10-28 | 2007-08-07 | Orbotech Ltd. | Selectable area laser assisted processing of substrates |
| US7311947B2 (en) * | 2003-10-10 | 2007-12-25 | Micron Technology, Inc. | Laser assisted material deposition |
| WO2005071725A1 (en) | 2004-01-23 | 2005-08-04 | Koninklijke Philips Electronics, N.V. | Method of fabricating a mono-crystalline emitter |
| US7094661B2 (en) * | 2004-03-31 | 2006-08-22 | Dielectric Systems, Inc. | Single and dual damascene techniques utilizing composite polymer dielectric film |
| US7682940B2 (en) | 2004-12-01 | 2010-03-23 | Applied Materials, Inc. | Use of Cl2 and/or HCl during silicon epitaxial film formation |
| JP4825459B2 (en) * | 2005-06-28 | 2011-11-30 | 株式会社東芝 | Heat treatment apparatus, heat treatment method, and semiconductor device manufacturing method |
| FR2900277B1 (en) | 2006-04-19 | 2008-07-11 | St Microelectronics Sa | PROCESS FOR FORMING A SILICON-BASED MONOCRYSTALLINE PORTION |
| FR2900275A1 (en) | 2006-04-19 | 2007-10-26 | St Microelectronics Sa | Forming a silicon based monocrystalline portion on a first zone surface of a substrate in which a silicon based monocrystalline material belonging to the substrate is initially exposed and on outside of a second zone of the substrate |
| EP2036120A4 (en) * | 2006-05-30 | 2012-02-08 | Applied Materials Inc | NOVEL PLASMA CURING AND PLASMA CURING PROCESS TO ENHANCE THE QUALITY OF SILICON DIOXIDE FILM |
| JP2009052093A (en) * | 2007-08-27 | 2009-03-12 | Canon Anelva Corp | Embedded film forming method and apparatus |
| KR100996919B1 (en) * | 2008-07-08 | 2010-11-26 | (주) 아모엘이디 | Semiconductor package |
| KR20100006009A (en) * | 2008-07-08 | 2010-01-18 | 주성엔지니어링(주) | Apparatus for manufacturing semiconductor |
| CN101736326B (en) * | 2008-11-26 | 2011-08-10 | 中微半导体设备(上海)有限公司 | Capacitively coupled plasma processing reactor |
| EP2426702A4 (en) * | 2009-05-01 | 2014-03-26 | Univ Tokyo | CHEMICAL COMPOUND SEMICONDUCTOR DEPOSITION METHOD AND DEVICE THEREOF |
| CN102605341A (en) * | 2011-01-20 | 2012-07-25 | 奇力光电科技股份有限公司 | Vapor deposition apparatus and susceptor |
| CN102352512B (en) * | 2011-10-26 | 2013-07-17 | 江苏大学 | Method for preparing high-adhesion diamond coating with pulse laser |
-
2014
- 2014-02-20 CN CN201480010733.1A patent/CN105103271B/en active Active
- 2014-02-20 CN CN201710619095.9A patent/CN107578983A/en active Pending
- 2014-02-20 SG SG11201506367TA patent/SG11201506367TA/en unknown
- 2014-02-20 KR KR1020157029509A patent/KR102161241B1/en active Active
- 2014-02-20 WO PCT/US2014/017384 patent/WO2014149336A1/en not_active Ceased
- 2014-02-21 US US14/186,783 patent/US9123527B2/en not_active Expired - Fee Related
- 2014-02-25 TW TW103106340A patent/TWI638402B/en active
-
2015
- 2015-08-28 US US14/839,554 patent/US10508341B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20150368800A1 (en) | 2015-12-24 |
| CN105103271B (en) | 2018-05-22 |
| CN107578983A (en) | 2018-01-12 |
| WO2014149336A1 (en) | 2014-09-25 |
| TWI638402B (en) | 2018-10-11 |
| US10508341B2 (en) | 2019-12-17 |
| CN105103271A (en) | 2015-11-25 |
| KR102161241B1 (en) | 2020-09-29 |
| TW201436035A (en) | 2014-09-16 |
| US20140263180A1 (en) | 2014-09-18 |
| US9123527B2 (en) | 2015-09-01 |
| KR20150132465A (en) | 2015-11-25 |
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