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SG11201505677PA - Extended field iterative reconstruction technique (efirt) for correlated noise removal - Google Patents

Extended field iterative reconstruction technique (efirt) for correlated noise removal

Info

Publication number
SG11201505677PA
SG11201505677PA SG11201505677PA SG11201505677PA SG11201505677PA SG 11201505677P A SG11201505677P A SG 11201505677PA SG 11201505677P A SG11201505677P A SG 11201505677PA SG 11201505677P A SG11201505677P A SG 11201505677PA SG 11201505677P A SG11201505677P A SG 11201505677PA
Authority
SG
Singapore
Prior art keywords
efirt
noise removal
extended field
iterative reconstruction
reconstruction technique
Prior art date
Application number
SG11201505677PA
Inventor
Faisal Mahmood
Lars-Goran Wallentin Ofverstedt
Bo Ulf Skoglund
Original Assignee
Okinawa Inst Of Science And Technology School Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Okinawa Inst Of Science And Technology School Corp filed Critical Okinawa Inst Of Science And Technology School Corp
Publication of SG11201505677PA publication Critical patent/SG11201505677PA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/002D [Two Dimensional] image generation
    • G06T11/003Reconstruction from projections, e.g. tomography
    • G06T11/006Inverse problem, transformation from projection-space into object-space, e.g. transform methods, back-projection, algebraic methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/401Imaging image processing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/419Imaging computed tomograph
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • G01N2223/42Imaging image digitised, -enhanced in an image processor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/612Specific applications or type of materials biological material
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00Image generation
    • G06T2211/40Computed tomography
    • G06T2211/432Truncation

Landscapes

  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Algebra (AREA)
  • Mathematical Physics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • Image Processing (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SG11201505677PA 2013-03-13 2014-03-05 Extended field iterative reconstruction technique (efirt) for correlated noise removal SG11201505677PA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361779116P 2013-03-13 2013-03-13
PCT/JP2014/001214 WO2014141630A1 (en) 2013-03-13 2014-03-05 Extended field iterative reconstruction technique (efirt) for correlated noise removal

Publications (1)

Publication Number Publication Date
SG11201505677PA true SG11201505677PA (en) 2015-08-28

Family

ID=51536310

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201505677PA SG11201505677PA (en) 2013-03-13 2014-03-05 Extended field iterative reconstruction technique (efirt) for correlated noise removal

Country Status (7)

Country Link
US (2) US9594032B2 (en)
EP (1) EP2972254B8 (en)
JP (1) JP5892501B1 (en)
CN (1) CN105143865B (en)
CA (2) CA2955331C (en)
SG (1) SG11201505677PA (en)
WO (1) WO2014141630A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6429428B2 (en) * 2015-07-20 2018-11-28 学校法人沖縄科学技術大学院大学学園 Two-dimensional discrete Fourier transform with simultaneous edge artifact removal for real-time applications
CN110208605B (en) * 2019-06-04 2021-06-04 河南师范大学 A Method for Reconstructing Conductivity Distribution of Resistance Tomography with Suppression of Staircase Effect

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE9601229D0 (en) 1996-03-07 1996-03-29 B Ulf Skoglund Apparatus and method for providing reconstruction
JP3373720B2 (en) 1996-03-25 2003-02-04 株式会社日立メディコ X-ray tomography equipment
SE0100728D0 (en) 2001-03-05 2001-03-05 Sidec Technologies Ab Karolins New method
AU2002351405A1 (en) * 2001-12-18 2003-06-30 Mri Devices Corporation Method and apparatus for noise tomography
WO2004006189A1 (en) 2002-07-08 2004-01-15 Sidec Technologies Ab Imaging apparatus and method
SE526941C2 (en) 2003-01-30 2005-11-22 Sidec Technologies Ab High resolution 3D reproduction procedure
EP1590772A1 (en) 2003-01-30 2005-11-02 Sidec Technologies AB Method for high-resolution 3d reconstruction
WO2007094721A1 (en) 2006-02-17 2007-08-23 Sidec Technologies Ab Apparatus, method and simulation objetcs for simulation of the image formation in a transmission electron microscope
EP2002246A1 (en) 2006-04-04 2008-12-17 Sidec Technologies AB Extended electron tomography
WO2008041945A1 (en) 2006-10-06 2008-04-10 Sidec Technologies Ab Parallel beam local tomography reconstruction method
WO2008055953A2 (en) 2006-11-08 2008-05-15 Sidec Technologies Ab Iterated variational regularization combined with componentwise regularization
US9087404B2 (en) * 2010-05-27 2015-07-21 Koninklijke Philips N.V. Reconstruction for cone-beam computed tomography imaging with off-center flat panel detector

Also Published As

Publication number Publication date
EP2972254A4 (en) 2016-12-21
EP2972254B1 (en) 2018-05-09
CA2955331A1 (en) 2014-09-18
CA2900004C (en) 2018-06-05
US20160356728A1 (en) 2016-12-08
JP2016513786A (en) 2016-05-16
JP5892501B1 (en) 2016-03-23
EP2972254A1 (en) 2016-01-20
EP2972254B8 (en) 2018-06-27
CN105143865B (en) 2018-03-20
US9594032B2 (en) 2017-03-14
CA2900004A1 (en) 2014-09-18
WO2014141630A1 (en) 2014-09-18
US20160003752A1 (en) 2016-01-07
CA2955331C (en) 2020-09-01
US9733199B2 (en) 2017-08-15
CN105143865A (en) 2015-12-09

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