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SG10202006953QA - Electrical contactor and electrical connecting apparatus - Google Patents

Electrical contactor and electrical connecting apparatus

Info

Publication number
SG10202006953QA
SG10202006953QA SG10202006953QA SG10202006953QA SG10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA SG 10202006953Q A SG10202006953Q A SG 10202006953QA
Authority
SG
Singapore
Prior art keywords
electrical
connecting apparatus
contactor
electrical connecting
electrical contactor
Prior art date
Application number
SG10202006953QA
Inventor
KISHI Yasutaka
Wakazawa Masahiro
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of SG10202006953QA publication Critical patent/SG10202006953QA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06727—Cantilever beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Connections Arranged To Contact A Plurality Of Conductors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Multi-Conductor Connections (AREA)
SG10202006953QA 2019-08-09 2020-07-21 Electrical contactor and electrical connecting apparatus SG10202006953QA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019147759A JP7353859B2 (en) 2019-08-09 2019-08-09 Electrical contacts and electrical connection devices

Publications (1)

Publication Number Publication Date
SG10202006953QA true SG10202006953QA (en) 2021-03-30

Family

ID=74358283

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202006953QA SG10202006953QA (en) 2019-08-09 2020-07-21 Electrical contactor and electrical connecting apparatus

Country Status (7)

Country Link
US (1) US11372022B2 (en)
JP (1) JP7353859B2 (en)
KR (1) KR102424122B1 (en)
CN (1) CN112345802B (en)
MY (1) MY205529A (en)
SG (1) SG10202006953QA (en)
TW (1) TWI787636B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP1646397S (en) * 2019-05-21 2019-11-25
KR102791729B1 (en) * 2022-12-26 2025-04-08 주식회사 코리아 인스트루먼트 Probe with improved bonding stability
JP1755926S (en) * 2023-03-06 2023-10-23 electrical contacts
JP1755925S (en) * 2023-03-06 2023-10-23 electrical contacts

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07109780B2 (en) * 1991-02-19 1995-11-22 山一電機株式会社 Contacts in sockets for electrical components
JP2004340617A (en) * 2003-05-13 2004-12-02 Micronics Japan Co Ltd Electrical connection device for conduction test
AU2003261854A1 (en) * 2003-05-13 2004-12-03 Kabushiki Kaisha Nihon Micronics Probe for testing electric conduction
JP2004340654A (en) * 2003-05-14 2004-12-02 Micronics Japan Co Ltd Current test probe
JP4571511B2 (en) * 2005-01-07 2010-10-27 株式会社日本マイクロニクス Probe for current test
WO2006075408A1 (en) * 2005-01-14 2006-07-20 Kabushiki Kaisha Nihon Micronics Continuity testing probe
JP4571007B2 (en) * 2005-04-22 2010-10-27 株式会社日本マイクロニクス Probe for current test
JP2007113946A (en) * 2005-10-18 2007-05-10 Micronics Japan Co Ltd Probe for current test
JP4841620B2 (en) * 2006-03-15 2011-12-21 株式会社日本マイクロニクス Probe and probe assembly for current test
TW200815763A (en) * 2006-09-26 2008-04-01 Nihon Micronics Kabushiki Kaisha Electrical test probe and electrical test probe assembly
JP5113392B2 (en) * 2007-01-22 2013-01-09 株式会社日本マイクロニクス Probe and electrical connection device using the same
JP2008203036A (en) * 2007-02-19 2008-09-04 Micronics Japan Co Ltd Electrical connection device
JP5046909B2 (en) * 2007-12-21 2012-10-10 株式会社日本マイクロニクス Contact for electrical test, electrical connection device using the contact, and method for manufacturing contact
JP5438908B2 (en) * 2008-03-11 2014-03-12 株式会社日本マイクロニクス Contact for electrical test, electrical connection device using the contact, and method for manufacturing contact
JP2009229410A (en) * 2008-03-25 2009-10-08 Micronics Japan Co Ltd Contactor for electric test and method of manufacturing the same
KR100947862B1 (en) * 2008-06-30 2010-03-18 한국기계연구원 Cantilevered Micro Contact Probe with Hinge Structure
KR101019554B1 (en) 2008-11-18 2011-03-08 주식회사 코디에스 Probe and its manufacturing method
JP2011215069A (en) * 2010-04-01 2011-10-27 Tokyo Electron Ltd Probe
JP5878719B2 (en) * 2011-09-27 2016-03-08 株式会社日本マイクロニクス Cantilever type probe that can be separated from the same location
JP5886694B2 (en) * 2012-06-14 2016-03-16 株式会社日本マイクロニクス Cantilever type probe and probe card or probe unit including the same
JP5968158B2 (en) * 2012-08-10 2016-08-10 株式会社日本マイクロニクス Contact probe and probe card
CN204441545U (en) * 2015-01-07 2015-07-01 番禺得意精密电子工业有限公司 Electric connector
EP3051562B1 (en) * 2015-01-30 2018-12-26 Tyco Electronics Austria GmbH Spring Member for an Electric Switching Device such as a Cradle Relay
JP6584816B2 (en) * 2015-04-20 2019-10-02 日置電機株式会社 Probe unit and probe unit manufacturing method
JP6378642B2 (en) * 2015-04-23 2018-08-22 モレックス エルエルシー connector
WO2018003507A1 (en) * 2016-06-28 2018-01-04 株式会社日本マイクロニクス Electrical connecting device and contact
CN112904057B (en) * 2018-01-11 2022-06-07 欧姆龙株式会社 Probe, inspection tool, inspection unit, and inspection apparatus

Also Published As

Publication number Publication date
TWI787636B (en) 2022-12-21
KR20210018086A (en) 2021-02-17
KR102424122B1 (en) 2022-07-22
US20210041480A1 (en) 2021-02-11
CN112345802B (en) 2024-12-24
JP2021028602A (en) 2021-02-25
MY205529A (en) 2024-10-24
CN112345802A (en) 2021-02-09
JP7353859B2 (en) 2023-10-02
TW202119040A (en) 2021-05-16
US11372022B2 (en) 2022-06-28

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