SG10201913148YA - System and method for imaging a surface defect on an object - Google Patents
System and method for imaging a surface defect on an objectInfo
- Publication number
- SG10201913148YA SG10201913148YA SG10201913148YA SG10201913148YA SG10201913148YA SG 10201913148Y A SG10201913148Y A SG 10201913148YA SG 10201913148Y A SG10201913148Y A SG 10201913148YA SG 10201913148Y A SG10201913148Y A SG 10201913148YA SG 10201913148Y A SG10201913148Y A SG 10201913148YA
- Authority
- SG
- Singapore
- Prior art keywords
- imaging
- surface defect
- defect
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/40—Analysis of texture
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/20—Image preprocessing
- G06V10/25—Determination of region of interest [ROI] or a volume of interest [VOI]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8867—Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10028—Range image; Depth image; 3D point clouds
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20016—Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Signal Processing (AREA)
- Multimedia (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Ink Jet (AREA)
- Image Processing (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SG10201602496P | 2016-03-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG10201913148YA true SG10201913148YA (en) | 2020-02-27 |
Family
ID=59964979
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201808609YA SG11201808609YA (en) | 2016-03-30 | 2017-03-30 | System and method for imaging a surface defect on an object |
| SG10201913148YA SG10201913148YA (en) | 2016-03-30 | 2017-03-30 | System and method for imaging a surface defect on an object |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11201808609YA SG11201808609YA (en) | 2016-03-30 | 2017-03-30 | System and method for imaging a surface defect on an object |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10823681B2 (en) |
| SG (2) | SG11201808609YA (en) |
| WO (1) | WO2017171651A1 (en) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102017107270A1 (en) * | 2017-04-05 | 2018-10-11 | Asmec Advanced Surface Mechanics Gmbh | Method for the analysis of surface measurements |
| US10706524B2 (en) | 2017-11-28 | 2020-07-07 | Henkel IP & Holding GmbH | Systems and methods for analyzing stained fabric articles |
| CN108133473B (en) * | 2017-12-21 | 2021-10-01 | 江南大学 | Defect detection method of warp knitted jacquard fabric based on Gabor filter and deep neural network |
| CN108010029B (en) * | 2017-12-27 | 2020-11-03 | 江南大学 | Fabric defect detection method based on deep learning and support vector data description |
| JP7073785B2 (en) | 2018-03-05 | 2022-05-24 | オムロン株式会社 | Image inspection equipment, image inspection method and image inspection program |
| CN108582416B (en) * | 2018-04-25 | 2020-09-08 | 湖南筑巢智能科技有限公司 | Manufacturing method of large and medium ceramic ware |
| CN108871197B (en) * | 2018-04-27 | 2020-07-28 | 中国石油大学(北京) | Displacement field measuring method, device, equipment and storage medium for material surface |
| CN108507476B (en) * | 2018-04-27 | 2020-08-07 | 中国石油大学(北京) | Displacement field measurement method, device, equipment and storage medium for material surface |
| CN109886912B (en) * | 2018-10-09 | 2021-02-05 | 中国计量大学 | A method for detecting surface defects of thrust bearing cage |
| CN109410192B (en) * | 2018-10-18 | 2020-11-03 | 首都师范大学 | A fabric defect detection method and device for multi-texture grading fusion |
| JP7134253B2 (en) * | 2018-12-11 | 2022-09-09 | 本田技研工業株式会社 | WORK INSPECTION DEVICE AND WORK INSPECTION METHOD |
| US11210770B2 (en) | 2019-03-15 | 2021-12-28 | Hitachi, Ltd. | AI-based inspection in transportation |
| CN110310258B (en) * | 2019-06-18 | 2022-03-29 | 深圳大学 | Method for evaluating corrosion degree of concrete member steel bar |
| DE102019219269A1 (en) * | 2019-12-10 | 2021-06-10 | Peri Gmbh | Computer-aided method and control device for determining the quality of fair-faced concrete |
| JP7501264B2 (en) * | 2020-09-15 | 2024-06-18 | 株式会社アイシン | Anomaly detection device, anomaly detection program, and anomaly detection system |
| CN112434694B (en) * | 2020-11-20 | 2021-07-16 | 哈尔滨市科佳通用机电股份有限公司 | Method and system for identifying damage fault of outer ring of front cover of rolling bearing |
| US12270731B2 (en) | 2021-04-08 | 2025-04-08 | Pavement Recycling Systems Inc. | Automated analysis and sorting of milling drum tools |
| US11669956B2 (en) * | 2021-06-01 | 2023-06-06 | Caterpillar Inc. | Ground engaging tool wear and loss detection system and method |
| JP7767741B2 (en) * | 2021-06-08 | 2025-11-12 | 富士フイルムビジネスイノベーション株式会社 | Surface inspection device and program |
| US12229994B1 (en) * | 2021-08-23 | 2025-02-18 | Amazon Technologies, Inc. | Depth sensor evaluation |
| CN114581404B (en) * | 2022-03-03 | 2022-08-30 | 常州市宏发纵横新材料科技股份有限公司 | Broken yarn detection method for interweaving binding yarns |
| CN114663403B (en) * | 2022-03-25 | 2022-11-18 | 北京城建设计发展集团股份有限公司 | Prefabricated part assembling surface local defect identification method based on dense scanning data |
| CN114612469B (en) * | 2022-05-09 | 2022-08-12 | 武汉中导光电设备有限公司 | Product defect detection method, device and equipment and readable storage medium |
| CN116165216B (en) * | 2023-03-16 | 2023-08-04 | 苏州鼎纳自动化技术有限公司 | Liquid crystal display micro scratch flaw 3D detection method, system and computing equipment |
| US12353949B2 (en) * | 2023-04-27 | 2025-07-08 | Zebra Technologies Corporation | Indicia tracking and decoding systems |
| CN116609345B (en) * | 2023-07-19 | 2023-10-17 | 北京阿丘机器人科技有限公司 | Battery cover plate defect detection method, device, equipment and storage medium |
| CN117214183B (en) * | 2023-11-07 | 2024-01-30 | 山东泗水金立得纸业有限公司 | Paper defect detection method based on machine vision |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5517027A (en) * | 1993-06-08 | 1996-05-14 | Mitsubishi Denki Kabushiki Kaisha | Method for detecting and examining slightly irregular surface states, scanning probe microscope therefor, and method for fabricating a semiconductor device or a liquid crystal display device using these |
| KR100877449B1 (en) * | 2001-07-09 | 2009-01-07 | 요시로 야마다 | Surface inspection device and method |
| DE10343148A1 (en) * | 2003-09-18 | 2005-04-21 | Leica Microsystems | Method and device for inspecting a wafer |
| US8244025B2 (en) * | 2006-03-20 | 2012-08-14 | Siemens Energy, Inc. | Method of coalescing information about inspected objects |
| EP2006804A1 (en) * | 2007-06-22 | 2008-12-24 | Siemens Aktiengesellschaft | Method for optical inspection of a matt surface and apparatus for applying this method |
| US8681211B2 (en) * | 2009-09-22 | 2014-03-25 | Cyberoptics Corporation | High speed optical inspection system with adaptive focusing |
| US8111905B2 (en) * | 2009-10-29 | 2012-02-07 | Mitutoyo Corporation | Autofocus video tool and method for precise dimensional inspection |
| US10068326B2 (en) * | 2016-03-18 | 2018-09-04 | Siemens Energy, Inc. | System and method for enhancing visual inspection of an object |
| WO2018017575A2 (en) * | 2016-07-18 | 2018-01-25 | Instrumental, Inc. | Modular optical inspection station |
-
2017
- 2017-03-30 SG SG11201808609YA patent/SG11201808609YA/en unknown
- 2017-03-30 WO PCT/SG2017/050175 patent/WO2017171651A1/en not_active Ceased
- 2017-03-30 SG SG10201913148YA patent/SG10201913148YA/en unknown
- 2017-03-30 US US16/090,170 patent/US10823681B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017171651A1 (en) | 2017-10-05 |
| SG11201808609YA (en) | 2018-10-30 |
| US20190120770A1 (en) | 2019-04-25 |
| US10823681B2 (en) | 2020-11-03 |
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