SG10201906679RA - Chip manufacturing method - Google Patents
Chip manufacturing methodInfo
- Publication number
- SG10201906679RA SG10201906679RA SG10201906679RA SG10201906679RA SG10201906679RA SG 10201906679R A SG10201906679R A SG 10201906679RA SG 10201906679R A SG10201906679R A SG 10201906679RA SG 10201906679R A SG10201906679R A SG 10201906679RA SG 10201906679R A SG10201906679R A SG 10201906679RA
- Authority
- SG
- Singapore
- Prior art keywords
- chip manufacturing
- chip
- manufacturing
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
- H01L21/3043—Making grooves, e.g. cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/38—Removing material by boring or cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Dicing (AREA)
- Laser Beam Processing (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018143126A JP7072993B2 (en) | 2018-07-31 | 2018-07-31 | Chip manufacturing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG10201906679RA true SG10201906679RA (en) | 2020-02-27 |
Family
ID=69383822
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG10201906679RA SG10201906679RA (en) | 2018-07-31 | 2019-07-18 | Chip manufacturing method |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP7072993B2 (en) |
| KR (1) | KR102699722B1 (en) |
| CN (1) | CN110783185B (en) |
| SG (1) | SG10201906679RA (en) |
| TW (1) | TWI800668B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7273756B2 (en) * | 2020-03-18 | 2023-05-15 | 株式会社東芝 | Semiconductor device and its manufacturing method |
| JP7450426B2 (en) * | 2020-03-24 | 2024-03-15 | 株式会社ディスコ | Processing method of workpiece |
| KR102405460B1 (en) | 2020-06-26 | 2022-06-07 | 매그나칩 반도체 유한회사 | Semiconductor Die Forming and Packaging Method Using Ultrashort pulse Laser Micromachining |
| KR20220167106A (en) | 2021-06-11 | 2022-12-20 | 삼성전자주식회사 | Semiconductor chip, and semiconductor package |
| CN113649709A (en) * | 2021-08-16 | 2021-11-16 | 湖北三维半导体集成创新中心有限责任公司 | Wafer cutting method |
| TWI888749B (en) * | 2021-08-19 | 2025-07-01 | 大陸商合肥創發微電子有限公司 | Method for manufacturing semiconductor chips |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3583279B2 (en) * | 1998-01-13 | 2004-11-04 | 三菱電機株式会社 | Drilling method |
| JP4694845B2 (en) | 2005-01-05 | 2011-06-08 | 株式会社ディスコ | Wafer division method |
| JP2011035302A (en) * | 2009-08-05 | 2011-02-17 | Renesas Electronics Corp | Method of manufacturing semiconductor device |
| US8383984B2 (en) | 2010-04-02 | 2013-02-26 | Electro Scientific Industries, Inc. | Method and apparatus for laser singulation of brittle materials |
| JP2014093445A (en) * | 2012-11-05 | 2014-05-19 | Disco Abrasive Syst Ltd | Processing method of optical device wafer |
| US9919380B2 (en) | 2013-02-23 | 2018-03-20 | Coherent, Inc. | Shaping of brittle materials with controlled surface and bulk properties |
| JP2015020195A (en) | 2013-07-19 | 2015-02-02 | アイシン精機株式会社 | Laser processing apparatus, laser processing method, and laser oscillation apparatus |
| JP6189700B2 (en) * | 2013-10-03 | 2017-08-30 | 株式会社ディスコ | Wafer processing method |
| JP2015138857A (en) * | 2014-01-22 | 2015-07-30 | 株式会社ディスコ | Wafer processing method |
| JP2016162809A (en) * | 2015-02-27 | 2016-09-05 | 株式会社ディスコ | Wafer processing method |
| CN104716066B (en) * | 2015-03-20 | 2018-03-30 | 上海华力微电子有限公司 | One kind detects the defects of figure bottom photoetching glue residua detection method |
| JP6587911B2 (en) | 2015-11-16 | 2019-10-09 | 株式会社ディスコ | Wafer division method |
| CN106229309B (en) * | 2016-07-20 | 2019-05-07 | 日月光半导体(上海)有限公司 | Package substrate and manufacturing method thereof |
-
2018
- 2018-07-31 JP JP2018143126A patent/JP7072993B2/en active Active
-
2019
- 2019-07-05 KR KR1020190081485A patent/KR102699722B1/en active Active
- 2019-07-09 CN CN201910614448.5A patent/CN110783185B/en active Active
- 2019-07-18 SG SG10201906679RA patent/SG10201906679RA/en unknown
- 2019-07-26 TW TW108126555A patent/TWI800668B/en active
Also Published As
| Publication number | Publication date |
|---|---|
| TW202008452A (en) | 2020-02-16 |
| CN110783185B (en) | 2023-10-10 |
| TWI800668B (en) | 2023-05-01 |
| JP7072993B2 (en) | 2022-05-23 |
| KR20200014195A (en) | 2020-02-10 |
| JP2020021786A (en) | 2020-02-06 |
| CN110783185A (en) | 2020-02-11 |
| KR102699722B1 (en) | 2024-08-27 |
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