SG10201801998TA - Substrate holding device, exposure apparatus, and device manufacturing method - Google Patents
Substrate holding device, exposure apparatus, and device manufacturing methodInfo
- Publication number
- SG10201801998TA SG10201801998TA SG10201801998TA SG10201801998TA SG10201801998TA SG 10201801998T A SG10201801998T A SG 10201801998TA SG 10201801998T A SG10201801998T A SG 10201801998TA SG 10201801998T A SG10201801998T A SG 10201801998TA SG 10201801998T A SG10201801998T A SG 10201801998TA
- Authority
- SG
- Singapore
- Prior art keywords
- exposure apparatus
- substrate holding
- holding device
- device manufacturing
- manufacturing
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/707—Chucks, e.g. chucking or un-chucking operations or structural details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68735—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/6875—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004271634 | 2004-09-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG10201801998TA true SG10201801998TA (en) | 2018-04-27 |
Family
ID=36060155
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG2013018965A SG188899A1 (en) | 2004-09-17 | 2005-09-16 | Substrate holding device, exposure apparatus, and device manufacturing method |
| SG10201801998TA SG10201801998TA (en) | 2004-09-17 | 2005-09-16 | Substrate holding device, exposure apparatus, and device manufacturing method |
| SG200906167-2A SG155927A1 (en) | 2004-09-17 | 2005-09-16 | Substrate holding device, exposure apparatus, and device manufacturing method |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG2013018965A SG188899A1 (en) | 2004-09-17 | 2005-09-16 | Substrate holding device, exposure apparatus, and device manufacturing method |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG200906167-2A SG155927A1 (en) | 2004-09-17 | 2005-09-16 | Substrate holding device, exposure apparatus, and device manufacturing method |
Country Status (6)
| Country | Link |
|---|---|
| US (4) | US8102512B2 (en) |
| EP (2) | EP2325866A1 (en) |
| JP (1) | JP4618253B2 (en) |
| KR (1) | KR101106496B1 (en) |
| SG (3) | SG188899A1 (en) |
| WO (1) | WO2006030908A1 (en) |
Families Citing this family (41)
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|---|---|---|---|---|
| TW200511388A (en) | 2003-06-13 | 2005-03-16 | Nikon Corp | Exposure method, substrate stage, exposure apparatus and method for manufacturing device |
| WO2005055296A1 (en) | 2003-12-03 | 2005-06-16 | Nikon Corporation | Exposure apparatus, exposure method, device producing method, and optical component |
| US8705008B2 (en) * | 2004-06-09 | 2014-04-22 | Nikon Corporation | Substrate holding unit, exposure apparatus having same, exposure method, method for producing device, and liquid repellant plate |
| SG188899A1 (en) | 2004-09-17 | 2013-04-30 | Nikon Corp | Substrate holding device, exposure apparatus, and device manufacturing method |
| EP3285282A1 (en) * | 2004-12-15 | 2018-02-21 | Nikon Corporation | Exposure apparatus and device fabricating method |
| US7433016B2 (en) | 2005-05-03 | 2008-10-07 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| JP4657824B2 (en) * | 2005-06-17 | 2011-03-23 | 東京エレクトロン株式会社 | Substrate mounting table, substrate processing apparatus, and method for manufacturing substrate mounting table |
| KR101539517B1 (en) * | 2005-12-08 | 2015-07-24 | 가부시키가이샤 니콘 | Substrate holding device, exposure device, exposure method, and device fabrication method |
| US20070273856A1 (en) | 2006-05-25 | 2007-11-29 | Nikon Corporation | Apparatus and methods for inhibiting immersion liquid from flowing below a substrate |
| WO2007139017A1 (en) * | 2006-05-29 | 2007-12-06 | Nikon Corporation | Liquid recovery member, substrate holding member, exposure apparatus and device manufacturing method |
| US7532309B2 (en) * | 2006-06-06 | 2009-05-12 | Nikon Corporation | Immersion lithography system and method having an immersion fluid containment plate for submerging the substrate to be imaged in immersion fluid |
| WO2008029884A1 (en) * | 2006-09-08 | 2008-03-13 | Nikon Corporation | Cleaning member, cleaning method and device manufacturing method |
| US8134685B2 (en) * | 2007-03-23 | 2012-03-13 | Nikon Corporation | Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method |
| US8514365B2 (en) * | 2007-06-01 | 2013-08-20 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7561250B2 (en) * | 2007-06-19 | 2009-07-14 | Asml Netherlands B.V. | Lithographic apparatus having parts with a coated film adhered thereto |
| JP4961299B2 (en) * | 2007-08-08 | 2012-06-27 | キヤノン株式会社 | Exposure apparatus and device manufacturing method |
| NL1036194A1 (en) * | 2007-12-03 | 2009-06-04 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
| NL1036526A1 (en) * | 2008-02-14 | 2009-08-17 | Asml Netherlands Bv | Use of a coating, an article having the coating and a lithographic apparatus including the coating. |
| US20090218743A1 (en) * | 2008-02-29 | 2009-09-03 | Nikon Corporation | Substrate holding apparatus, exposure apparatus, exposing method, device fabricating method, plate member, and wall |
| US9176393B2 (en) * | 2008-05-28 | 2015-11-03 | Asml Netherlands B.V. | Lithographic apparatus and a method of operating the apparatus |
| EP2131242A1 (en) * | 2008-06-02 | 2009-12-09 | ASML Netherlands B.V. | Substrate table, lithographic apparatus and device manufacturing method |
| NL1036924A1 (en) * | 2008-06-02 | 2009-12-03 | Asml Netherlands Bv | Substrate table, lithographic apparatus and device manufacturing method. |
| JP5235509B2 (en) * | 2008-06-04 | 2013-07-10 | 株式会社東京精密 | Wafer positioning device and table in wafer positioning device |
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| NL2004305A (en) * | 2009-03-13 | 2010-09-14 | Asml Netherlands Bv | Substrate table, immersion lithographic apparatus and device manufacturing method. |
| NL2005126A (en) * | 2009-09-21 | 2011-03-22 | Asml Netherlands Bv | Lithographic apparatus, coverplate and device manufacturing method. |
| NL2007802A (en) | 2010-12-21 | 2012-06-25 | Asml Netherlands Bv | A substrate table, a lithographic apparatus and a device manufacturing method. |
| JP5617708B2 (en) * | 2011-03-16 | 2014-11-05 | 東京エレクトロン株式会社 | Lid opening / closing device |
| DE102011007682A1 (en) * | 2011-04-19 | 2012-10-25 | Siltronic Ag | Susceptor for supporting a semiconductor wafer and method for depositing a layer on a front side of a semiconductor wafer |
| US11085112B2 (en) * | 2011-10-28 | 2021-08-10 | Asm Ip Holding B.V. | Susceptor with ring to limit backside deposition |
| WO2017194247A1 (en) * | 2016-05-12 | 2017-11-16 | Asml Netherlands B.V. | Extraction body for lithographic apparatus |
| JP6758920B2 (en) | 2016-06-01 | 2020-09-23 | キヤノン株式会社 | Manufacturing method of chuck, substrate holding device, pattern forming device, and article |
| WO2019072504A1 (en) * | 2017-10-12 | 2019-04-18 | Asml Netherlands B.V. | Substrate holder for use in a lithographic apparatus |
| JP6985102B2 (en) * | 2017-10-31 | 2021-12-22 | 株式会社ディスコ | Laser processing equipment |
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| TWI697740B (en) * | 2018-01-03 | 2020-07-01 | 志聖工業股份有限公司 | Exposure assembly and exposure device |
| JP7105900B2 (en) * | 2018-02-20 | 2022-07-25 | アプライド マテリアルズ インコーポレイテッド | Patterned vacuum chuck for double-sided processing |
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| JP7618996B2 (en) * | 2020-10-09 | 2025-01-22 | 富士電機株式会社 | SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR WAFER INSPECTION METHOD |
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-
2005
- 2005-09-16 SG SG2013018965A patent/SG188899A1/en unknown
- 2005-09-16 SG SG10201801998TA patent/SG10201801998TA/en unknown
- 2005-09-16 EP EP11158026A patent/EP2325866A1/en not_active Withdrawn
- 2005-09-16 KR KR1020067027853A patent/KR101106496B1/en not_active Expired - Fee Related
- 2005-09-16 US US11/575,392 patent/US8102512B2/en not_active Expired - Fee Related
- 2005-09-16 SG SG200906167-2A patent/SG155927A1/en unknown
- 2005-09-16 EP EP05783614.0A patent/EP1801850B1/en not_active Expired - Lifetime
- 2005-09-16 WO PCT/JP2005/017173 patent/WO2006030908A1/en not_active Ceased
- 2005-09-16 JP JP2006535229A patent/JP4618253B2/en not_active Expired - Fee Related
-
2011
- 2011-12-22 US US13/334,773 patent/US9341959B2/en not_active Expired - Fee Related
-
2016
- 2016-04-19 US US15/132,717 patent/US20160231653A1/en not_active Abandoned
-
2018
- 2018-06-13 US US16/007,655 patent/US20180292759A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2006030908A1 (en) | 2008-05-15 |
| EP1801850A4 (en) | 2008-12-10 |
| US8102512B2 (en) | 2012-01-24 |
| US20120094238A1 (en) | 2012-04-19 |
| SG188899A1 (en) | 2013-04-30 |
| KR101106496B1 (en) | 2012-01-20 |
| US20070269294A1 (en) | 2007-11-22 |
| EP1801850B1 (en) | 2014-11-26 |
| KR20070054603A (en) | 2007-05-29 |
| HK1106616A1 (en) | 2008-03-14 |
| EP1801850A1 (en) | 2007-06-27 |
| US20180292759A1 (en) | 2018-10-11 |
| US20160231653A1 (en) | 2016-08-11 |
| SG155927A1 (en) | 2009-10-29 |
| EP2325866A1 (en) | 2011-05-25 |
| WO2006030908A1 (en) | 2006-03-23 |
| JP4618253B2 (en) | 2011-01-26 |
| US9341959B2 (en) | 2016-05-17 |
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