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PL3388868T3 - Urządzenia do kontroli oraz sposoby kontroli kontenera - Google Patents

Urządzenia do kontroli oraz sposoby kontroli kontenera

Info

Publication number
PL3388868T3
PL3388868T3 PL17204408T PL17204408T PL3388868T3 PL 3388868 T3 PL3388868 T3 PL 3388868T3 PL 17204408 T PL17204408 T PL 17204408T PL 17204408 T PL17204408 T PL 17204408T PL 3388868 T3 PL3388868 T3 PL 3388868T3
Authority
PL
Poland
Prior art keywords
inspecting
container
methods
inspection devices
inspection
Prior art date
Application number
PL17204408T
Other languages
English (en)
Inventor
Ziran Zhao
Jianping Gu
Qian Yi
Bicheng LIU
Original Assignee
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Company Limited filed Critical Nuctech Company Limited
Publication of PL3388868T3 publication Critical patent/PL3388868T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/001Industrial image inspection using an image reference approach
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/20Image enhancement or restoration using local operators
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/50Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00Image enhancement or restoration
    • G06T5/70Denoising; Smoothing
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/70Determining position or orientation of objects or cameras
    • G06T7/73Determining position or orientation of objects or cameras using feature-based methods
    • G06T7/74Determining position or orientation of objects or cameras using feature-based methods involving reference images or patches
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10028Range image; Depth image; 3D point clouds
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10116X-ray image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30112Baggage; Luggage; Suitcase

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL17204408T 2016-12-26 2017-11-29 Urządzenia do kontroli oraz sposoby kontroli kontenera PL3388868T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201611221485.2A CN108240997B (zh) 2016-12-26 2016-12-26 检查设备和对集装箱进行检查的方法
EP17204408.3A EP3388868B1 (en) 2016-12-26 2017-11-29 Inspection devices and methods for inspecting a container

Publications (1)

Publication Number Publication Date
PL3388868T3 true PL3388868T3 (pl) 2020-10-19

Family

ID=60543383

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17204408T PL3388868T3 (pl) 2016-12-26 2017-11-29 Urządzenia do kontroli oraz sposoby kontroli kontenera

Country Status (5)

Country Link
US (1) US10586324B2 (pl)
EP (1) EP3388868B1 (pl)
JP (1) JP6538811B2 (pl)
CN (1) CN108240997B (pl)
PL (1) PL3388868T3 (pl)

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JP2019174410A (ja) * 2018-03-29 2019-10-10 住友化学株式会社 画像処理装置、異物検査装置及び画像処理方法
CN109581519A (zh) * 2018-11-27 2019-04-05 中国航发沈阳黎明航空发动机有限责任公司 一种用于发动机叶片内腔异物的x射线检测装置及方法
EP4481371A3 (en) 2019-07-11 2025-01-22 Oy Varex Imaging Finland Ltd. X-ray weld inspection
US11276542B2 (en) 2019-08-21 2022-03-15 Varex Imaging Corporation Enhanced thermal transfer nozzle and system
US11733182B2 (en) * 2019-12-20 2023-08-22 Varex Imaging Corporation Radiographic inspection system for pipes and other structures using radioisotopes
CN117063064A (zh) 2021-02-23 2023-11-14 拉皮斯坎系统股份有限公司 用于移除具有多个x-射线源的一个或多个扫描系统中的串扰信号的系统和方法
WO2023288196A1 (en) 2021-07-13 2023-01-19 Rapiscan Systems, Inc. Image inspection systems and methods for integrating third party artificial intelligence platforms
CN115901814A (zh) * 2021-09-30 2023-04-04 宁德时代新能源科技股份有限公司 电芯检测方法、装置、设备及计算机存储介质
CN116183639A (zh) * 2021-11-26 2023-05-30 同方威视技术股份有限公司 面阵探测器、探测方法及相应的集装箱/车辆检查系统
WO2023150418A2 (en) 2022-02-03 2023-08-10 Rapiscan Holdings, Inc. Systems and methods for real-time energy and dose monitoring of an x-ray linear accelerator
US12474282B2 (en) 2022-05-20 2025-11-18 Rapiscan Holdings, Inc. Systems and a method of improved material classification using energy-integrated backscatter detectors
US12467882B2 (en) 2023-03-17 2025-11-11 Rapiscan Holdings, Inc. Systems and methods for monitoring output energy of a high-energy x-ray source
CN116661012A (zh) * 2023-06-21 2023-08-29 杭州睿影科技有限公司 基于透射射线的检测系统、检测方法以及检测装置
CN119985586B (zh) * 2025-04-11 2025-07-25 宁波伯锐锶电子束科技有限公司 一种生物样品的扫描图像获取方法

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US5638420A (en) * 1996-07-03 1997-06-10 Advanced Research And Applications Corporation Straddle inspection system
JP2001004560A (ja) * 1999-06-16 2001-01-12 Shimadzu Corp X線検査装置
GB0903198D0 (en) 2009-02-25 2009-04-08 Cxr Ltd X-Ray scanners
EP1971850A2 (en) * 2005-12-12 2008-09-24 Reveal Imaging Techologies Displaced-ray ct inspection
CN101113960B (zh) * 2006-07-25 2010-07-21 上海英迈吉东影图像设备有限公司 一种利用背散射技术进行炸药检测的装置
CN101210895B (zh) * 2006-12-28 2011-09-28 清华同方威视技术股份有限公司 一种双视角扫描辐射成像的方法及系统
CN102095663B (zh) * 2007-10-05 2013-06-05 清华大学 液态物品检查方法和设备
CN101387610B (zh) * 2008-10-14 2011-02-09 重庆大学 利用双源双能量直线式安检ct装置进行安全检测的方法
US7756249B1 (en) * 2009-02-19 2010-07-13 Morpho Detection, Inc. Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source
US9665953B2 (en) * 2009-06-30 2017-05-30 Analogic Corporation Efficient quasi-exact 3D image reconstruction algorithm for CT scanners
IN2014DN06514A (pl) * 2012-02-03 2015-06-12 Rapiscan Systems Inc
US9069092B2 (en) * 2012-02-22 2015-06-30 L-3 Communication Security and Detection Systems Corp. X-ray imager with sparse detector array
CN103308535B (zh) * 2012-03-09 2016-04-13 同方威视技术股份有限公司 用于射线扫描成像的设备和方法
JP2015520846A (ja) * 2012-05-01 2015-07-23 アナロジック コーポレイション Ct密度画像とスパースマルチエネルギーデータを用いてボクセルセットのz−有効値を決定する方法およびシステム{determinationofz−effectivevalueforsetofvoxelsusingctdensityimageandsparsemulti−energydata}
US10004464B2 (en) * 2013-01-31 2018-06-26 Duke University System for improved compressive tomography and method therefor
CN105982686B (zh) * 2015-01-30 2019-04-30 合肥美亚光电技术股份有限公司 计算机断层成像设备及通过其拍摄断层图像的方法
CN105784737B (zh) * 2016-03-29 2021-06-22 清华大学 集装箱ct检查系统

Also Published As

Publication number Publication date
EP3388868B1 (en) 2020-06-24
CN108240997A (zh) 2018-07-03
US20180182085A1 (en) 2018-06-28
CN108240997B (zh) 2020-09-04
EP3388868A1 (en) 2018-10-17
US10586324B2 (en) 2020-03-10
JP2018151370A (ja) 2018-09-27
JP6538811B2 (ja) 2019-07-03

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