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PE20150237Z - Inspeccion de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo - Google Patents

Inspeccion de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo

Info

Publication number
PE20150237Z
PE20150237Z PE2014001271U PE2014001271U PE20150237Z PE 20150237 Z PE20150237 Z PE 20150237Z PE 2014001271 U PE2014001271 U PE 2014001271U PE 2014001271 U PE2014001271 U PE 2014001271U PE 20150237 Z PE20150237 Z PE 20150237Z
Authority
PE
Peru
Prior art keywords
detectors
twinner
optical fiber
ray inspection
change optical
Prior art date
Application number
PE2014001271U
Other languages
English (en)
Inventor
Anatoli Arodzero
Joseph Callerame
Dan-Cristian Dinca
Rajen Sud
Lee Grodzins
Martin Rommel
Peter Rothschild
Jeffrey Schubert
Original Assignee
American Science & Eng Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science & Eng Inc filed Critical American Science & Eng Inc
Publication of PE20150237Z publication Critical patent/PE20150237Z/es

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/201—Measuring radiation intensity with scintillation detectors using scintillating fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20185—Coupling means between the photodiode and the scintillator, e.g. optical couplings using adhesives with wavelength-shifting fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/203—Measuring radiation intensity with scintillation detectors the detector being made of plastics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/204—Measuring radiation intensity with scintillation detectors the detector being a liquid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/06—Measuring neutron radiation with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T5/00—Recording of movements or tracks of particles; Processing or analysis of such tracks
    • G01T5/08—Scintillation chambers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

Que comprende: Un detector y metodos para inspeccionar material sobre la base de un centellografo acoplado por fibra optica de onda cambiante a uno o mas fotodetectores, con una integracion temporal de la senal del foto-detector. Un volumen no pixelado de medio de centelleo convierte la energia de radiacion incidente y penetrante en luz de centelleo, la cual se extrae de un area de luz de centellante extraible por una pluralidad de ondas guia opticas. Esta geometria ofrece detectores eficientes y compactos, permitiendo geometrias hasta ahora inalcanzables para una deteccion de retrodispersion y para una discriminacion de energia de radiacion incidente. Energia adicional de resolucion de las configuraciones de transmision estan habilitadas como la compensacion de desviacion y desalineacion
PE2014001271U 2012-02-14 2013-02-04 Inspeccion de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo PE20150237Z (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261598576P 2012-02-14 2012-02-14
US201261598521P 2012-02-14 2012-02-14
US201261607066P 2012-03-06 2012-03-06

Publications (1)

Publication Number Publication Date
PE20150237Z true PE20150237Z (es) 2015-02-12

Family

ID=48945537

Family Applications (1)

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PE2014001271U PE20150237Z (es) 2012-02-14 2013-02-04 Inspeccion de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo

Country Status (18)

Country Link
US (4) US9285488B2 (es)
EP (1) EP2825904B1 (es)
JP (6) JP2015513075A (es)
KR (4) KR102105727B1 (es)
CN (4) CN104204854B (es)
BR (1) BR112014019517B1 (es)
CA (2) CA2864354C (es)
CL (1) CL2014002144U1 (es)
DE (2) DE202013012100U1 (es)
ES (4) ES1154460Y (es)
GT (1) GT201400009U (es)
HK (1) HK1244541A1 (es)
IL (3) IL234076B (es)
MX (1) MX337476B (es)
PE (1) PE20150237Z (es)
PL (2) PL125720U1 (es)
RU (1) RU2606698C2 (es)
WO (1) WO2013122763A1 (es)

Families Citing this family (78)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US10898732B2 (en) * 2010-04-16 2021-01-26 Maureen Petterson Multi-color charged particle detector apparatus and method of use thereof
US10532228B2 (en) * 2010-04-16 2020-01-14 Maureen Petterson Multi-color charged particle detector apparatus and method of use thereof
WO2011163108A2 (en) * 2010-06-21 2011-12-29 American Science And Engineering, Inc. Detector with active collimators
EP3252506B1 (en) 2011-02-08 2020-11-18 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
WO2013116549A1 (en) 2012-02-03 2013-08-08 Rapiscan Systems, Inc. Combined scatter and transmission multi-view imaging system
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
WO2020145999A1 (en) 2019-01-08 2020-07-16 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
PE20150237Z (es) * 2012-02-14 2015-02-12 American Science & Eng Inc Inspeccion de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo
US9182361B2 (en) 2013-05-28 2015-11-10 Ann Arbor Digital Devices Inc. Digital X-ray imaging system with still and video capture modes
RO130582B1 (ro) * 2014-01-23 2021-12-30 Mb Telecom Ltd. S.R.L. Sistem şi metodă pentru inspecţia completă şi neintruzivă a aeronavelor
US9707710B2 (en) 2014-02-27 2017-07-18 Saint-Gobain Ceramics And Plastics, Inc. Scintillator stack, device including the scintillator stack, and method for making the scintillator stack
WO2015131105A1 (en) * 2014-02-27 2015-09-03 Saint-Gobain Ceramics & Plastics, Inc. Scintillator stack, device including the scintillator stack, and method for making the scintillator stack
WO2015175751A1 (en) 2014-05-16 2015-11-19 American Science And Engineering, Inc. Source for intra-pulse multi-energy x-ray cargo inspection
US11266006B2 (en) 2014-05-16 2022-03-01 American Science And Engineering, Inc. Method and system for timing the injections of electron beams in a multi-energy x-ray cargo inspection system
US10459111B2 (en) * 2014-05-23 2019-10-29 Radiabeam Technologies, Llc System and method for adaptive X-ray cargo inspection
CN104035123B (zh) * 2014-06-27 2017-02-15 中国电子科技集团公司第八研究所 一种基于闪烁体与光纤耦合的β表面污染探测装置及方法
WO2016003547A1 (en) 2014-06-30 2016-01-07 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
CN105425273A (zh) * 2014-09-17 2016-03-23 中国科学技术大学 一种用于测量高通量x射线能谱的吸收体阵列的装置及方法
US10762998B2 (en) 2014-11-20 2020-09-01 Viken Detection Corporation X-ray scanning system
EP3248207A4 (en) * 2015-01-20 2018-09-26 American Science & Engineering, Inc. Dynamically adjustable focal spot
DE102015101764A1 (de) * 2015-02-06 2016-08-11 Thermo Fisher Scientific Messtechnik Gmbh Vorrichtung und Verfahren zur Detektion von radioaktiver Strahlung
JP6738823B2 (ja) 2015-03-04 2020-08-12 ラピスカン システムズ、インコーポレイテッド マルチエネルギ検出器
EP3271709B1 (en) 2015-03-20 2022-09-21 Rapiscan Systems, Inc. Hand-held portable backscatter inspection system
US9753151B2 (en) 2015-07-31 2017-09-05 General Electric Company Light guide array for pet detector fabrication methods and apparatus
HK1257878A1 (zh) * 2015-09-10 2019-11-01 American Science And Engineering, Inc. 使用行间自适应电磁x射线扫描的反向散射表徵
WO2017048239A1 (en) 2015-09-15 2017-03-23 Halliburton Energy Services, Inc. Downhole photon radiation detection using scintillating fibers
CN108450029B (zh) 2015-11-09 2021-07-20 美国科学及工程股份有限公司 移动x射线扫描速度控制
WO2017219225A1 (en) * 2016-06-21 2017-12-28 Shenzhen Genorivision Technology Co. Ltd. Biosensor
GB2552537B (en) * 2016-07-28 2020-05-27 Smiths Heimann Sas Inspection system with source of radiation and method
EP3505919B1 (en) * 2016-08-25 2024-07-17 Beijing Hualixing Technology Development Co., Ltd. Imaging device for use in vehicle security check and method therefor
CN106290427A (zh) * 2016-10-17 2017-01-04 北京君和信达科技有限公司 背散射成像方法及系统
CN106483153A (zh) * 2016-12-23 2017-03-08 同方威视技术股份有限公司 双能探测器及辐射检查系统
CN106526688A (zh) * 2016-12-28 2017-03-22 同方威视技术股份有限公司 背散射检查车
US10393680B2 (en) * 2017-01-18 2019-08-27 The Boeing Company X-ray sidescatter inspection of laminates
US10600609B2 (en) 2017-01-31 2020-03-24 Rapiscan Systems, Inc. High-power X-ray sources and methods of operation
WO2018156718A1 (en) * 2017-02-25 2018-08-30 Anatoly Glass, LLC. Converter plate for producing polychromatic light
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
DE102017108535A1 (de) * 2017-04-21 2018-10-25 Grünbeck Wasseraufbereitung GmbH Membranmodul sowie Vorrichtung und Verfahren zur Detektion von Ablagerungen in einem Membranmodul
US20180321418A1 (en) * 2017-05-08 2018-11-08 Saint-Gobain Ceramics & Plastics, Inc. Article including a body including a fluorescent material and a wavelength shifting fiber, a radiation detector including the article, and a method of using the same
JP2018141767A (ja) * 2017-07-13 2018-09-13 三菱電機プラントエンジニアリング株式会社 タイヤハウス汚染検査装置およびタイヤハウス汚染自動検査方法
CN108227027B (zh) * 2017-12-29 2020-12-01 同方威视技术股份有限公司 车载背散射检查系统
CN108008458B (zh) * 2017-12-29 2020-09-08 同方威视技术股份有限公司 车载背散射检查系统
US10114131B1 (en) 2018-01-05 2018-10-30 Consolidated Nuclear Security, LLC Scintillator based fiber optic plate for neutron imaging applications and the like
WO2019152900A1 (en) * 2018-02-02 2019-08-08 Viken Detection Corporation System and kit for x-ray backscatter imaging with removable detector
EP3811117A4 (en) * 2018-06-20 2022-03-16 American Science & Engineering, Inc. SCINTILLATION DETECTORS COUPLED TO WAVELENGTH OFFSET SHEET
IL260956B (en) * 2018-08-02 2022-01-01 Applied Materials Israel Ltd Electron detection sensor
DE102018220135A1 (de) * 2018-11-23 2020-05-28 Siemens Healthcare Gmbh Röntgendetektor, Bildgebungsvorrichtung und Verfahren zum Betrieb eines Röntgendetektors
CN109444182B (zh) * 2018-12-22 2024-07-23 苏州瑞派宁科技有限公司 一种闪烁晶体测试装置
US11112370B2 (en) * 2019-01-04 2021-09-07 The Boeing Company Reconfigurable backscatter detector
CN109828300B (zh) * 2019-01-31 2023-05-05 兰州空间技术物理研究所 一种小型化全向空间粒子探测器
CN109655874B (zh) * 2019-02-25 2020-04-10 衡阳师范学院 闪烁室测氡装置和方法
US10830714B1 (en) * 2019-07-26 2020-11-10 The Boeing Company Portable X-ray backscattering system
JP2022542383A (ja) 2019-07-29 2022-10-03 サン－ゴバン セラミックス アンド プラスティクス，インコーポレイティド プラスチック波長シフトファイバおよびその作製方法
EP4053856A4 (en) * 2019-10-31 2023-11-29 Kuraray Co., Ltd. PLASTIC SCINTILLATION FIBER AND PROCESS FOR PRODUCTION THEREOF
CN110988964B (zh) * 2019-12-09 2022-11-22 上海大学 复合型光纤辐射探测器
RU2730392C1 (ru) * 2020-01-14 2020-08-21 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" (Госкорпорация "Росатом") Сцинтилляционный детектор нейтронов
US11193898B1 (en) 2020-06-01 2021-12-07 American Science And Engineering, Inc. Systems and methods for controlling image contrast in an X-ray system
US11681068B2 (en) 2020-06-02 2023-06-20 Viken Detection Corporation X-ray imaging apparatus and method
US11175245B1 (en) 2020-06-15 2021-11-16 American Science And Engineering, Inc. Scatter X-ray imaging with adaptive scanning beam intensity
EP3933881A1 (en) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG X-ray source with multiple grids
CN116261677A (zh) * 2020-09-16 2023-06-13 株式会社可乐丽 塑料闪烁光纤及其制造方法
US12270955B2 (en) 2020-10-15 2025-04-08 Kuraray Co., Ltd. Plastic scintillating fiber and its manufacturing method
US12270956B2 (en) 2020-10-15 2025-04-08 Kuraray Co., Ltd. Plastic scintillating fiber and its manufacturing method
US11340361B1 (en) 2020-11-23 2022-05-24 American Science And Engineering, Inc. Wireless transmission detector panel for an X-ray scanner
MX2023009276A (es) 2021-02-23 2023-10-10 Rapiscan Systems Inc Sistemas y metodos para eliminar señales de diafonía en uno o más sistemas de escaneo que tienen múltiples fuentes de rayos x.
EP4086668A3 (en) * 2021-05-05 2023-02-15 Varex Imaging Corporation Backscatter imaging system
EP4105691A1 (en) 2021-06-16 2022-12-21 Soletanche Freyssinet Gamma and neutron radiation detector
US12019035B2 (en) 2021-07-16 2024-06-25 Rapiscan Holdings, Inc. Material detection in x-ray security screening
CN118235216A (zh) 2021-10-01 2024-06-21 拉皮斯坎控股公司 用于并发产生多个基本相似的x射线束的方法和系统
CN114180291B (zh) * 2021-11-10 2022-08-05 深圳市日联科技有限公司 叠片电池视觉纠偏装置及纠偏方法
CN114355430B (zh) * 2022-01-05 2025-09-16 中国科学院高能物理研究所 一种用于成像系统的液闪探测装置、成像系统和方法
WO2023150418A2 (en) 2022-02-03 2023-08-10 Rapiscan Holdings, Inc. Systems and methods for real-time energy and dose monitoring of an x-ray linear accelerator
US12230468B2 (en) 2022-06-30 2025-02-18 Varex Imaging Corporation X-ray system with field emitters and arc protection
EP4551976A2 (en) 2022-07-07 2025-05-14 Viken Detection Corporation Rotating hoop chopper wheel for x-ray imagers
EP4562413A1 (en) 2022-07-26 2025-06-04 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of x-ray inspection systems
US20240380481A1 (en) * 2023-05-13 2024-11-14 Cisco Technology, Inc. Backscatter device onboarding
WO2025050041A1 (en) * 2023-08-31 2025-03-06 Mayo Foundation For Medical Education And Research X-ray detector with x-ray fluorescent components

Family Cites Families (152)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4045672A (en) 1975-09-11 1977-08-30 Nihon Denshi Kabushiki Kaisha Apparatus for tomography comprising a pin hole for forming a microbeam of x-rays
US4242583A (en) 1978-04-26 1980-12-30 American Science And Engineering, Inc. X-ray imaging variable resolution
US4259582A (en) * 1979-11-02 1981-03-31 Albert Richard D Plural image signal system for scanning x-ray apparatus
JPS60159675A (ja) * 1984-01-31 1985-08-21 Shimadzu Corp 放射線検出器
US4788436A (en) 1986-12-24 1988-11-29 Walter Koechner Radiation sensitive optical fiber and detector
DE3841136A1 (de) * 1988-12-07 1990-06-13 Hoechst Ag Strahlungsdetektor
US5281820A (en) * 1988-07-12 1994-01-25 Hoechst Aktiengesellschaft Radiation detector
JPH03257391A (ja) * 1990-03-08 1991-11-15 Mitsubishi Atom Power Ind Inc Ｘ線照射分布計測装置
US5784507A (en) * 1991-04-05 1998-07-21 Holm-Kennedy; James W. Integrated optical wavelength discrimination devices and methods for fabricating same
DE69205652T2 (de) 1991-06-21 1996-05-23 Toshiba Kawasaki Kk Röntgendetektor und Untersuchungssystem.
JPH0627249A (ja) * 1992-07-13 1994-02-04 Toshiba Corp 放射線検査装置
US5420959A (en) 1992-12-17 1995-05-30 Nanoptics Incorporated High efficiency, high resolution, real-time radiographic imaging system
JP3496958B2 (ja) * 1993-09-01 2004-02-16 富士写真フイルム株式会社 放射線検出器、画像読出処理条件決定方法および照射野認識方法
JPH07211877A (ja) * 1994-01-21 1995-08-11 Hamamatsu Photonics Kk 放射線像検出器及び放射線像検出装置
FR2716012B1 (fr) * 1994-02-09 1996-04-12 Corning Inc Procédé et dispositif d'assemblage d'extrémités de fibres optiques disposées en nappe.
US5600144A (en) * 1994-05-10 1997-02-04 Trustees Of Boston University Three dimensional imaging detector employing wavelength-shifting optical fibers
FR2725722B1 (fr) * 1994-10-14 1997-01-03 Atochem Elf Sa Copolymere fluore a tenue thermique amelioree, son procede de preparation et son utilisation comme revetement protecteur de substrats
CN1161103A (zh) * 1995-06-27 1997-10-01 菲利浦电子有限公司 X射线检测器
GB2303938A (en) * 1995-07-31 1997-03-05 Stc Submarine Systems Ltd Optical fibre cable having kingwire bearing extruded thermoplastic elastomer layers
US5764683B1 (en) * 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
JP3813656B2 (ja) * 1996-03-07 2006-08-23 株式会社東芝 光ファイバ型大面積放射線モニタ
DE19610538A1 (de) * 1996-03-18 1997-09-25 Deutsches Krebsforsch Strahlungsermittlungsvorrichtung
JPH10232284A (ja) * 1997-02-19 1998-09-02 Toshiba Corp 波長シフト型放射線センサおよび放射線検出装置
JPH10288671A (ja) * 1997-04-15 1998-10-27 Toshiba Corp 位置検出型放射線検出装置
US6078052A (en) 1997-08-29 2000-06-20 Picker International, Inc. Scintillation detector with wavelength-shifting optical fibers
US6081580A (en) 1997-09-09 2000-06-27 American Science And Engineering, Inc. Tomographic inspection system
US5968425A (en) * 1997-10-28 1999-10-19 The United States Of America As Represented By The United States Department Of Energy Methods for the continuous production of plastic scintillator materials
US6151381A (en) 1998-01-28 2000-11-21 American Science And Engineering, Inc. Gated transmission and scatter detection for x-ray imaging
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
JP2923500B1 (ja) * 1998-06-04 1999-07-26 株式会社東芝 放射線検出器および放射線計測システム、並びに放射線計測プログラムを記録したコンピュータ読み取り可能な記録媒体
US6621888B2 (en) 1998-06-18 2003-09-16 American Science And Engineering, Inc. X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
US6442233B1 (en) 1998-06-18 2002-08-27 American Science And Engineering, Inc. Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
WO2000004403A1 (fr) * 1998-07-15 2000-01-27 Keiichi Kuroda Unite d'imagerie a rayonnement numerique
WO2000033059A2 (en) 1998-11-30 2000-06-08 American Science And Engineering, Inc. Multiple scatter system for threat identification
WO2000033109A1 (en) 1998-11-30 2000-06-08 American Science And Engineering, Inc. Fan and pencil beams from a common source for x-ray inspection
US6453007B2 (en) 1998-11-30 2002-09-17 American Science And Engineering, Inc. X-ray inspection using co-planar pencil and fan beams
US6421420B1 (en) 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
US6249567B1 (en) * 1998-12-01 2001-06-19 American Science & Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
EP1147406A1 (en) 1998-12-22 2001-10-24 American Science & Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
US6459764B1 (en) * 1999-01-27 2002-10-01 American Science And Engineering, Inc. Drive-through vehicle inspection system
JP2000235078A (ja) * 1999-02-15 2000-08-29 Toshiba Corp 放射線検出用構造体と、それを用いた放射線検出器および放射線検査装置
JP2000304865A (ja) * 1999-04-23 2000-11-02 Hitachi Ltd 光伝送式放射線計測装置及びその計測システム
US6391434B1 (en) * 1999-05-06 2002-05-21 General Electric Company Composite scintillator material and method of manufacture
JP4313895B2 (ja) * 1999-06-04 2009-08-12 株式会社東芝 放射線検出装置
JP2001013254A (ja) 1999-06-29 2001-01-19 Mitsubishi Heavy Ind Ltd 平板状中性子線検出器及びこれを用いた中性子源計測装置
JP2001013250A (ja) 1999-06-30 2001-01-19 Toshiba Corp 汚染検査装置
US6546072B1 (en) 1999-07-30 2003-04-08 American Science And Engineering, Inc. Transmission enhanced scatter imaging
US7010094B2 (en) * 2000-02-10 2006-03-07 American Science And Engineering, Inc. X-ray inspection using spatially and spectrally tailored beams
US6459761B1 (en) 2000-02-10 2002-10-01 American Science And Engineering, Inc. Spectrally shaped x-ray inspection system
JP4351780B2 (ja) * 2000-02-15 2009-10-28 株式会社東芝 放射線検出装置
US6671451B1 (en) 2000-03-10 2003-12-30 Wired Japan Co., Ltd. Optical fiber, optical fiber cable, and radiation detecting system using such
US8325871B2 (en) 2000-03-28 2012-12-04 American Science And Engineering, Inc. Radiation threat detection
US6576907B1 (en) * 2000-06-01 2003-06-10 Elgems Ltd. High count rate gamma camera system
JP2002071816A (ja) * 2000-08-29 2002-03-12 Japan Atom Energy Res Inst ２次元放射線および中性子イメージ検出器
US6907281B2 (en) * 2000-09-07 2005-06-14 Ge Medical Systems Fast mapping of volumetric density data onto a two-dimensional screen
JP4552020B2 (ja) * 2001-01-29 2010-09-29 独立行政法人 日本原子力研究開発機構 放射線および中性子イメージ検出器
US6658087B2 (en) 2001-05-03 2003-12-02 American Science And Engineering, Inc. Nautical X-ray inspection system
JP4203710B2 (ja) * 2001-12-28 2009-01-07 株式会社日立メディコ Ｘ線画像処理装置
US6542580B1 (en) * 2002-01-15 2003-04-01 Rapiscan Security Products (Usa), Inc. Relocatable X-ray imaging system and method for inspecting vehicles and containers
US7122804B2 (en) * 2002-02-15 2006-10-17 Varian Medical Systems Technologies, Inc. X-ray imaging device
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US8503605B2 (en) 2002-07-23 2013-08-06 Rapiscan Systems, Inc. Four sided imaging system and method for detection of contraband
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US9958569B2 (en) 2002-07-23 2018-05-01 Rapiscan Systems, Inc. Mobile imaging system and method for detection of contraband
US7369643B2 (en) * 2002-07-23 2008-05-06 Rapiscan Security Products, Inc. Single boom cargo scanning system
US6853707B2 (en) * 2002-09-05 2005-02-08 Agilent Technologies, Inc. Shielded x-ray detector
US20090257555A1 (en) 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7099434B2 (en) * 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US7505556B2 (en) 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US6927397B2 (en) * 2002-12-03 2005-08-09 Universities Research Association, Inc. Systems and methods for detecting neutrons
US7067079B2 (en) 2002-12-03 2006-06-27 Universities Research Association, Inc. Extruded plastic scintillator including inorganic powders
US6909098B2 (en) * 2002-12-03 2005-06-21 Universities Research Association Inc. Systems and methods for detecting nuclear radiation in the presence of backgrounds
US7149393B2 (en) * 2002-12-09 2006-12-12 Eastman Kodak Company Apparatus and method for forming a fiber optic faceplate
JP2006510033A (ja) * 2002-12-10 2006-03-23 コモンウェルス　サイエンティフィック　アンド　インダストリアル　リサーチ　オーガニゼーション 放射線撮影装置
US6965662B2 (en) 2002-12-17 2005-11-15 Agilent Technologies, Inc. Nonplanar x-ray target anode for use in a laminography imaging system
US20040140431A1 (en) * 2003-01-21 2004-07-22 Cti Pet Systems, Inc. Multi-application highly reflective grid array
US20050058242A1 (en) 2003-09-15 2005-03-17 Peschmann Kristian R. Methods and systems for the rapid detection of concealed objects
US7054408B2 (en) * 2003-04-30 2006-05-30 General Electric Company CT detector array having non pixelated scintillator array
US7856081B2 (en) 2003-09-15 2010-12-21 Rapiscan Systems, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
US7366282B2 (en) 2003-09-15 2008-04-29 Rapiscan Security Products, Inc. Methods and systems for rapid detection of concealed objects using fluorescence
JP4406699B2 (ja) 2003-08-29 2010-02-03 独立行政法人 日本原子力研究開発機構 光ファイバを利用した放射線及び中性子検出器
JP2005214869A (ja) 2004-01-30 2005-08-11 Toshiba Corp 当量線量型放射線検出器
US7115875B1 (en) 2004-02-17 2006-10-03 Photodetection Systems, Inc. PET scanner with photodetectors and wavelength shifting fibers
DK1733213T3 (da) 2004-04-09 2010-05-03 American Science & Eng Inc Eliminering af cross-talk i en tilbagespredningsinspektionsportal der omfatter flere kilder, ved at sikre at kun en kilde afgiver stråling ad gangen
WO2005103759A1 (en) 2004-04-20 2005-11-03 Forimtech Sa Large area radiation imaging detector
US7141799B1 (en) * 2005-03-30 2006-11-28 Ut-Battelle, Llc Fiber optic thermal/fast neutron and gamma ray scintillation detector
US7471764B2 (en) 2005-04-15 2008-12-30 Rapiscan Security Products, Inc. X-ray imaging system having improved weather resistance
DE102005017557B4 (de) * 2005-04-16 2010-11-04 Mirion Technologies (Rados) Gmbh Leichtgewichtiger Flächendetektor für Teilchenstrahlung kontaminierter Objekte
US7335891B2 (en) * 2005-06-27 2008-02-26 General Electric Company Gamma and neutron radiation detector
CN101379415B (zh) 2005-10-24 2013-07-17 美国科技工程公司 基于散射检测的x射线检查
KR100773993B1 (ko) * 2006-03-10 2007-11-08 (주)케이디티 광여기 시트
US20090230295A1 (en) * 2006-03-29 2009-09-17 Australian Nuclear Science & Technology Organisation Measurement of hydraulic conductivity using a radioactive or activatable tracer
EP2010943A2 (en) 2006-04-21 2009-01-07 American Science & Engineering, Inc. X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams
JP4455534B2 (ja) * 2006-05-09 2010-04-21 株式会社東芝 放射線検出器およびその製造方法
US8842808B2 (en) 2006-08-11 2014-09-23 American Science And Engineering, Inc. Scatter attenuation tomography using a monochromatic radiation source
RU2448342C2 (ru) 2006-08-11 2012-04-20 Эмерикэн Сайэнс Энд Энджиниэринг, Инк. Система контроля объекта (варианты)
US7924979B2 (en) 2006-08-23 2011-04-12 American Science And Engineering, Inc. Scatter attenuation tomography
KR20090046849A (ko) 2006-08-23 2009-05-11 아메리칸 사이언스 앤 엔지니어링, 인크. 산란 감쇠 단층 촬영 방법
US7623614B2 (en) * 2006-10-24 2009-11-24 Thermo Niton Analyzers Llc Apparatus for inspecting objects using coded beam
GB0626055D0 (en) * 2006-12-29 2007-11-07 Bae Systems Plc Detection of ionising radiation
US7842908B2 (en) * 2007-08-14 2010-11-30 Raytheon Company Sensor for eye-safe and body-fixed semi-active laser guidance
WO2009067394A2 (en) * 2007-11-19 2009-05-28 American Science And Engineering, Inc. Multiple image collection and synthesis for personnel screening
US8314399B2 (en) * 2008-02-07 2012-11-20 General Electric Company Radiation detector with optical waveguide and neutron scintillating material
GB0803640D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
EP2255220B1 (en) * 2008-03-13 2015-05-13 Koninklijke Philips N.V. Low-power tdc-adc and anger logic in radiation detection applications
US20090230925A1 (en) 2008-03-14 2009-09-17 Nathan Nathan Power Saver
US8017906B2 (en) * 2008-04-08 2011-09-13 Robert Sigurd Nelson Slit and slot scan, SAR, and compton devices and systems for radiation imaging
GB0809107D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Scannign systems
GB0810638D0 (en) 2008-06-11 2008-07-16 Rapiscan Security Products Inc Photomultiplier and detection systems
WO2010005977A2 (en) * 2008-07-07 2010-01-14 University Of Florida Research Foundation, Inc. Method and apparatus for x-ray radiographic imaging
JP2008304947A (ja) * 2008-09-11 2008-12-18 Sumitomo Bakelite Co Ltd 光導波路および光導波路構造体
US8604416B2 (en) * 2008-09-19 2013-12-10 Saint-Gobain Ceramics & Plastics, Inc. Method of forming a scintillator device
US7795650B2 (en) * 2008-12-09 2010-09-14 Teledyne Scientific & Imaging Llc Method and apparatus for backside illuminated image sensors using capacitively coupled readout integrated circuits
WO2010129926A1 (en) 2009-05-07 2010-11-11 The Regents Of The University Of California Novel lanthanide doped barium mixed halide scintillators
US8275092B1 (en) 2009-06-15 2012-09-25 American Science And Engineering, Inc. Three-dimensional mapping based on scattered penetrating radiation
US8824632B2 (en) * 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
MY154268A (en) 2009-07-29 2015-05-29 American Science & Eng Inc Top-down x-ray inspection trailer
WO2011044266A2 (en) * 2009-10-07 2011-04-14 Saint-Gobain Ceramics & Plastics, Inc. System and method to detect target radiation
WO2011059838A1 (en) * 2009-10-29 2011-05-19 Rapiscan Systems, Inc. Mobile aircraft inspection system
US8582720B2 (en) 2009-12-03 2013-11-12 Rapiscan Systems, Inc. Time of flight backscatter imaging system
US8199875B2 (en) * 2009-12-11 2012-06-12 General Electric Company System and method of acquiring multi-energy CT imaging data
JP5548892B2 (ja) * 2010-01-08 2014-07-16 独立行政法人日本原子力研究開発機構 ピクセル型二次元イメージ検出器
JP2011158291A (ja) * 2010-01-29 2011-08-18 Hamamatsu Photonics Kk 放射線像変換パネル
CN201754188U (zh) * 2010-02-03 2011-03-02 中国原子能科学研究院 塑料闪烁体探测器光电倍增管固定装置
WO2011106463A1 (en) 2010-02-25 2011-09-01 Rapiscan Systems Inc. A high-energy x-ray spectroscopy-based inspection system and methods to determine the atomic number of materials
BR112012021513A2 (pt) 2010-02-26 2016-07-05 Rapiscan Systems Inc sistema integrado de ponto de inspeção portátil
JP2011227044A (ja) * 2010-03-30 2011-11-10 Fujifilm Corp 放射線撮影装置
JP2010181412A (ja) * 2010-03-15 2010-08-19 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
JP5376528B2 (ja) * 2010-05-06 2013-12-25 独立行政法人日本原子力研究開発機構 放射線および中性子イメージ検出器
WO2011159911A2 (en) * 2010-06-18 2011-12-22 Saint-Gobain Ceramics & Plastics, Inc. Radiation detection system including a scintillating material and an optical fiber and method of using the same
WO2011163108A2 (en) * 2010-06-21 2011-12-29 American Science And Engineering, Inc. Detector with active collimators
GB2482024A (en) * 2010-07-16 2012-01-18 Symetrica Ltd Radiation Detector
US8796636B2 (en) * 2010-09-13 2014-08-05 Parttec, Ltd. Neutron detector having enhanced absorption and bifurcated detection elements
US8592775B2 (en) * 2010-10-27 2013-11-26 Partec, Ltd. Radiation detector having a ribbed scintillator
EP3252506B1 (en) 2011-02-08 2020-11-18 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
BR112013019697A2 (pt) 2011-02-08 2018-07-17 American Science And Engineering, Inc. análise de energia de retrodispersão para classificação de materiais com base em não comutatividade posicional
US8908831B2 (en) 2011-02-08 2014-12-09 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
CN103597343B (zh) 2011-04-15 2016-04-27 美国科技工程公司 具有可变尺寸检测器阵列的反向散射系统
US9146201B2 (en) 2012-02-02 2015-09-29 American Science And Engineering, Inc. Convertible scan panel for x-ray inspection
WO2013116549A1 (en) 2012-02-03 2013-08-08 Rapiscan Systems, Inc. Combined scatter and transmission multi-view imaging system
PE20150237Z (es) * 2012-02-14 2015-02-12 American Science & Eng Inc Inspeccion de rayos x utilizando longitud de onda de fibra optica de cambio acoplada con detectores de centelleo
JP6114981B2 (ja) 2012-10-17 2017-04-19 株式会社リガク Ｘ線発生装置
JP6385369B2 (ja) 2013-01-31 2018-09-05 ラピスカン システムズ、インコーポレイテッド 運搬可能な安全性検査システム
US9417060B1 (en) 2013-07-25 2016-08-16 American Science And Engineering, Inc. X-ray theodolite
US9535019B1 (en) 2013-10-04 2017-01-03 American Science And Engineering, Inc. Laterally-offset detectors for long-range x-ray backscatter imaging
US9841510B2 (en) * 2014-04-17 2017-12-12 Koninklijke Philips N.V. Radiation detector with photosensitive elements that can have high aspect ratios
WO2016003547A1 (en) 2014-06-30 2016-01-07 American Science And Engineering, Inc. Rapidly relocatable modular cargo container scanner
CN104597479A (zh) * 2014-12-30 2015-05-06 中国原子能科学研究院 中子位置探测装置
CA2973721A1 (en) 2015-01-16 2016-07-21 Rapiscan Systems, Inc. Non-intrusive inspection systems and methods for the detection of materials of interest
HK1257878A1 (zh) 2015-09-10 2019-11-01 American Science And Engineering, Inc. 使用行间自适应电磁x射线扫描的反向散射表徵
EP3520120A4 (en) 2016-09-30 2020-07-08 American Science & Engineering, Inc. X-RAY RADIATION SOURCE FOR TWO-DIMENSIONAL SCANNING RADIATION
CN207752159U (zh) * 2017-09-27 2018-08-21 清华大学 阵列式大面积总放探测装置

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KR20140123996A (ko) 2014-10-23
JP2015513075A (ja) 2015-04-30

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