KR20170103431A - Gate unit testing system and testing method thereof - Google Patents

Abstract

A gate unit testing apparatus for testing a gate unit connected to a thyristor according to the present invention, comprising: a thyristor tester for generating a supply voltage, connected to the gate unit; and a gate unit test unit connected to the thyristor for applying a test voltage to the gate unit Wherein the gate unit testing circuit comprises: an input for receiving the supply voltage through the thyristor tester; a converter for receiving and converting the supply voltage to supply the supply voltage to the thyristor; And a control unit for controlling the converting unit to convert the test voltage into the test voltage.

Description

[0001] GATE UNIT TESTING SYSTEM AND TESTING METHOD THEREOF [0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a gate unit testing apparatus and a test method thereof, and more particularly, to a gate unit test of a thyristor applied to a High Voltage Direct Current (HVDC) .

High Voltage Direct Current (HVDC) refers to a transmission method in which a transmission station transforms AC power generated by a power plant into DC power, and then converts the AC power from the water station to AC to supply power.

Ultra high voltage DC transmission is applied to submarine cable transmission, large-capacity long-distance transmission, and linkage between AC systems.

Transformers convert AC power to DC power. In other words, it is very dangerous to transmit AC power using a submarine cable. Therefore, the power station converts the AC power into DC power and transmits it to the power plant.

The power conversion of the power source and the water heater is converted by a power device such as a thyristor or an IGBT.

The thyristor, which is a power device, includes a gate unit for driving the thyristor and monitoring status information.

The gate unit converts a signal received from the host controller into a firing pulse, which is a signal suitable for the thyristor, and transmits the signal to the thyristor, and transmits the thyristor status information signal from the thyristor to the host controller.

This gate unit plays a role of ensuring the reliability of the thyristor of the ultra high voltage direct current transmission system.

In order to ensure the reliability of the thyristor, it is important to periodically check whether the gate unit is in normal operation. To check whether the gate unit is operating normally, it is necessary to test the gate unit at a voltage lower than the supplied voltage.

It is an object of the present invention to provide a gate unit testing apparatus and a method of inspecting a gate unit that can check the operation of the gate unit.

The present invention relates to a gate unit testing apparatus for testing a gate unit connected to a thyristor, comprising: a thyristor tester connected to the gate unit for generating a supply voltage; and a gate unit connected to the thyristor for applying a test voltage to the gate unit Circuit.

Wherein the gate unit testing circuit includes an input unit for receiving the supply voltage through the thyristor tester, a converter for receiving the supply voltage, converting the supply voltage to the thyristor, and converting the supply voltage to the test voltage lower than the supply voltage And a control unit for controlling the converting unit.

The thyristor tester may include a test control unit that tests the gate unit connected to the thyristor when the thyristor receives the test voltage from the conversion unit.

The thyristor tester may further include an input terminal connected to the gate unit and transmitting / receiving a signal to / from the gate unit, and a monitor unit outputting the test result of the gate unit.

The gate unit test circuit may further include a switch connected between the conversion unit and the thyristor.

The converting unit may include a primary side receiving the supply voltage and a secondary side connected to the switch, the secondary side of which the supply voltage input from the primary side is converted and output.

The secondary side may include a first contact receiving the supply voltage and outputting a voltage higher than the supply voltage, and a second contact receiving the supply voltage and outputting the test voltage.

The controller may control the switch to be in contact with the second contact so that the test voltage is output.

A method for testing a gate unit connected to a thyristor, the method comprising: a supply voltage generation step of generating a supply voltage to be applied to a gate unit test circuit by a thyristor tester; Converting the voltage to a test voltage lower than the supply voltage, and testing the gate unit when the gate unit test circuit applies the test voltage to the thyristor.

The test step may include a transmitting and receiving step of transmitting and receiving signals to and from the gate unit and an output step of outputting the result of the test of the gate unit to a monitor unit provided in the thyristor tester.

The present invention can simplify the structure of the gate unit test circuit for converting the supply voltage so as to simplify the volume, simplify the movement, and simplify the structure and reduce the cost.

Further, the control unit can control the converting unit to accurately convert the supply voltage to the test voltage, so that the gate unit test can be accurately performed, and the reliability of the test can be enhanced.

Further, when the test voltage is applied to the gate unit, the thyristor tester can output the result of the test of the gate unit at the test voltage, so that the user can conveniently check the normal operation of the gate unit .

1 is a view for explaining a gate unit testing apparatus and a thyristor according to an embodiment of the present invention.
2 is a circuit diagram of a gate unit test circuit according to an embodiment of the present invention.
3 is a circuit diagram of a gate unit test circuit according to an embodiment of the present invention.
4 is a view for explaining the connection of the gate unit test circuit, the thyristor tester and the thyristor, which is an embodiment of the present invention.
5 is a view for explaining a gate unit test method for testing a gate unit in which a thyristor tester and a thyristor are connected to each other in a gate unit test circuit according to an embodiment of the present invention.

Hereinafter, specific embodiments of the present invention will be described in detail with reference to the drawings. It should be understood, however, that there is no intention to limit the scope of the present invention to the embodiment shown, and other embodiments which are degenerative by adding, changing or deleting other elements or other embodiments falling within the spirit of the present invention Can be proposed.

Although the term used in the present invention is a general term that is widely used at present, there are some terms selected arbitrarily by the applicant in a specific case. In this case, since the meaning is described in detail in the description of the corresponding invention, It is to be understood that the present invention should be grasped as a meaning of a non-term.

That is, in the following description, the word 'comprising' does not exclude the presence of other elements or steps than those listed.

FIG. 1 is a view for explaining a gate unit testing apparatus according to an embodiment of the present invention, FIG. 2 is a diagram for explaining a circuit diagram of a gate unit testing circuit according to an embodiment of the present invention, 3 is a view for explaining a circuit diagram of a gate unit test circuit according to an embodiment of the present invention, and FIG. 4 is a diagram for explaining the connection of a gate unit test apparatus, a thyristor tester and a thyristor, which is an embodiment of the present invention.

Referring to Figs. 1 to 4, the gate unit test circuit 1 may be a diagram that is connected to the thyristor tester 100 and the thyristor 30.

The gate unit testing apparatus 1000 includes a thyristor tester 100 and a gate unit testing circuit 1. The gate unit testing apparatus 1000 can be connected to the thyristor 30. [

The thyristor 30 includes a gate unit 40 and snubber circuits 32 and 34. The gate unit 40 and the snubber circuits 32 and 34 may be connected to the thyristor 30 in detail.

The gate unit test circuit 1 may include an input unit 3, a conversion unit 11, and a control unit 23.

The gate unit testing circuit 1 may further include a first output section 9 and a second output section 17. [

1. A gate unit testing apparatus (1000) for testing a gate unit (40) connected to a thyristor (30), comprising: a thyristor tester (100) connected to a gate unit (40) And a gate unit test circuit 1 connected to the thyristor 30 and applying a test voltage to the gate unit 40. [

The gate unit testing circuit 1 includes an input unit 3 for receiving a supply voltage through a thyristor tester 100, a converter 11 for receiving a supply voltage and converting the supplied voltage to a thyristor 30, And a control unit 23 for controlling the converting unit 11 so as to be converted into a test voltage lower than the voltage.

The input unit 3 of the gate unit test circuit 10 can receive the supply voltage and transfer the power to the thyristor 30, and the supplied supply voltage can be an AC voltage.

The gate unit 40 can output a turn-on / off signal according to the turn-on and turn-off of the thyristor 30 and output the status signal of the thyristor 30 to the outside.

The converting unit 11 can receive the supply voltage to the primary side, convert the supplied voltage, and output the converted high voltage or low voltage to the secondary side.

The transformer 11 may be a transformer, a power transformer, or a tap transformer. The primary and secondary may be primary and secondary of the transformer. The primary and secondary are wound with coils. The primary and secondary The number of turns of the coil of the coil may be different.

The transformer may be a device for converting the voltage or current value of the AC using an electromagnetic induction phenomenon. The transformer may be composed of a core and a coil. A coil in a direction in which the input power is connected may be a primary side, May be a coil wound on the opposite side of the primary side.

The primary side is determined by the supply voltage, and the secondary side can be determined by the number of turns of the coil of the transformer according to Faraday's law.

The most preferred embodiment of the transformer 11 may be a power transformer and the power transformer may be a transformer used for a transmission line or a relatively large power distribution line.

The control unit 23 controls the gate unit testing circuit 1 and more specifically controls the switches 13 included in the gate unit testing circuit 1. The power unit 5 includes a power switch 5, (7), a switch (not shown), and the like.

The thyristor tester 100 may include a test control unit 53 for controlling the test of the gate unit 40 connected to the thyristor 30 when the thyristor 30 receives the test voltage from the converting unit 11 have.

The thyristor tester 100 further includes an input terminal 50 connected to the gate unit 40 for transmitting and receiving signals to and from the gate unit 40 and a monitor unit 52 for outputting a test result of the gate unit 40 .

The gate unit testing circuit 1 may further include a switch connected between the converting unit 11 and the thyristor 30. [

The conversion unit 11 includes a primary side N1 receiving a supply voltage and a secondary side N21 and N22 connected to the switch and having a primary side N1 converted into a test voltage and output as a test voltage .

The secondary sides N21 and N22 include a first contact a for receiving a supply voltage and outputting a voltage higher than the supply voltage and a second contact b for receiving a supply voltage and outputting a test voltage lower than the supply voltage, . ≪ / RTI >

The control unit 23 can control the switch to contact the second contact b so that a test voltage lower than the supply voltage is output.

When the supply voltage becomes a low voltage which is lower than the supply voltage through the switching of the switch 13, the low voltage can be a test voltage for testing the gate unit 40. [

When the supply voltage becomes a high voltage which is higher than the supply voltage through the switching of the switch 13, the high voltage can be the operating voltage for operating the gate unit 40. [

The test voltage may be a voltage that serves as a reference for testing the gate unit 40. For example, a test of the gate unit 40 may be performed at a low voltage lower than a normal supply voltage due to an accident in the system or an upper system, Unit 40, and may be a test for confirming whether or not the gate unit 40 is normally operated.

For example, if the supply voltage is 220 (v), the operating voltage converted by the converting section 11 is 700 (V), and the test voltage is 120 (V) The voltage supplied from the thyristor tester 100 is converted into a test voltage 120 (v) and supplied to the gate unit 40 connected to the thyristor 30 to test whether the gate unit 40 operates normally.

And a first output unit 9 for outputting a signal for confirming the presence or absence of a supply voltage input between the input unit 3 and the primary unit.

The gate unit test circuit 1 can inform the outside of the input of the supply voltage supplied from the outside through the first output section 9. [

The first output unit 9 may output a light signal to inform the outside whether a supply voltage is input, or may be sound, vibration, or the like.

And a second output unit 17 connected between the gate unit 40 and the secondary side and configured to output a signal indicating that the supply voltage is converted to one of a high voltage operation voltage and a low voltage test voltage.

The second output unit 17 outputs a signal for inspecting that the test voltage for testing the gate unit 40 is supplied to the gate unit 40 when the converting unit 11 converts the supply voltage to a test voltage having a low voltage Can be output.

The second output unit 17 can output a signal for confirming that the voltage for operating the gate unit 40 to operate normally when the converting unit 11 converts the supply voltage to a high voltage operation voltage.

The second output unit 17 may output a signal to inform the outside of the operation voltage or the low voltage test voltage input. The signal may be light, sound, or the like, and is not limited to the embodiment.

The thyristor unit 31 may include a thyristor 30 including a gate unit 40 and snubber circuits 32 and 34. The gate unit 40 may include a first terminal 42 and a second terminal 44).

The thyristor 30 includes a gate unit 40 and may be connected to the snubber circuits 32 and 34.

The snubber circuits 32 and 34 may be a series connection of the snubber resistor 32 and the snubber capacitor 34 and the snubber resistor 32 and the snubber capacitor 34 may be connected in series between the snubber circuits 32 and 34 Lt; RTI ID = 0.0 > and / or < / RTI >

The snubber circuits 32 and 34 are circuits for protecting the thyristor 30. The snubber circuits 32 and 34 are circuits for protecting the thyristor 30 and for generating a surge current when the thyristor 30 is turned on or off, (30).

The gate unit 40 can transmit a state signal indicating the state of the thyristor 30 to the host controller and send a control signal of the thyristor 30 coming from the host controller to a firing pulse ). ≪ / RTI >

The thyristor tester 100 included in the gate unit testing apparatus 1000 may include a power output unit 54, an input terminal 50, a test control unit 53, and a monitor unit 52.

The power output unit 54 may output power to the outside, and the power source may be an AC voltage.

The power supply output section 54 can supply a voltage to the input section 3 of the gate unit testing apparatus 1. [

The input terminal 50 may be connected to the gate unit 40 and may receive a signal from the gate unit 40.

The monitor unit 52 can output the state of the gate unit 40 through the signal input to the input terminal 50. [

The test control unit 53 can control the gate unit 40 to be tested at the test voltage through the input terminal 50. [

For example, the failure state of the thyristor 30, the turn-on / off state of the thyristor 30, the operation state of the gate unit 40, the failure state of the gate unit 40 Can be observed through the monitor unit (52).

A preferred embodiment of the thyristor tester 100 may be a TLT (Thyristor Level Tester). A TLT (Thyristor Level Tester) can confirm the operation confirmation characteristic when the power source of the gate unit 40 is insufficient. It may be a low power test.

The TLT (Thyristor Level Tester) can inform the outside of the result of the failure of the gate unit 40 and the operation confirmation characteristic of the gate unit 40 through the monitor unit 52.

The TLT (Thyristor Level Tester) can be electrically connected to the gate unit test circuit 1 and can supply power to the gate unit test circuit 1 through the power output unit 54.

The TLT (Thyristor Level Tester) can transmit and receive a signal to and from the thyristor 30 through the input terminal 50, and can supply power to the gate unit testing circuit 1.

The gate unit test circuit 1 can convert the supply voltage into the operation voltage or the test voltage through the control section 23 and can ensure the convenience that the user does not directly convert the supply voltage, The conversion section 11 in which the supply voltage is changed according to the control of the switch 13 is used, so that the device directly operated by the user can be simplified.

Hereinafter, Fig. 2 can be described in detail, and it is possible to illustrate that the gate unit test circuit 1, which is an embodiment of the present invention, causes the supply voltage to be converted into a high voltage operation voltage through switching of the switch 13. Fig. connect.

1 to 4, the gate unit test circuit 1 may include an input unit 3, a conversion unit 11, and a control unit 23, and may include a power switch 5, a start switch 7, And may further include a first output unit 9, a switch 13, a voltmeter 15, a second output unit 17, a resistor 21, and an ammeter 19.

One end of the input unit 3 receiving a voltage from the outside is connected to one end of the power switch 5 and the other end of the power switch 5 is connected to the first output unit 9 and one end of the ignition switch 7 And the other end of the first output unit 9 may be connected to the other end of the input unit 3.

The primary side of the conversion unit 11 is connected to the other end of the starter switch 7 and the sieve output unit 9. The secondary side of the conversion unit 11 is connected to one end of the switch 13, May be connected to the voltmeter 15 and one end of the second output unit 7.

The secondary side of the conversion unit 11 may include a first contact N21 and a second contact N22 and the embodiment of Figure 2 may be such that the switch 13 is in a state connected to the first contact N21 have.

The other end of the voltmeter 15 may be connected to the secondary side of the converting unit 11 and may be connected to the cathode terminal K of the thyristor 30. [

The other end of the second output unit 17 may be connected to one end of the ammeter 19 and the other end of the ammeter 19 may be connected to one end of the resistor 21. The other end of the resistor 21 may be connected to the thyristor 30, The node A may be connected to the node A of FIG.

The control unit 23 can control the power switch 5, the start switch 7 and the switch 13. The control unit 23 controls the power switch 5 and the start switch 7 to be turned on, When the switch 13 is controlled to be connected to N21 of the converting unit 11, the gate unit 40 can be supplied with power for operation.

When the N21 of the converting unit 11 is connected to the switch 13 under the control of the control unit 23, the converting unit 11 converts the supplied voltage into a working voltage at a low voltage lower than the supply voltage and higher than the supply voltage .

For example, the supply voltage may be converted to a high voltage or a low voltage in proportion to the number of turns of the primary winding N1 of the transformer 11 and the number of turns of the coils of the secondary winding N21, N22 of the transformer 11.

The number of coil turns of the primary side N1 of the converting unit 11 may be smaller than the number of coils of the secondary side N21 of the converting unit and the number of coil turns of N1 of the primary side of the converting unit may be larger than the number of coils of N22 of the secondary side of the converting unit.

The transformer secondary side N21 may have a larger number of coil windings than the secondary side N22 so that a high voltage may be output when the switch 13 contacts the second contact b rather than when the switch 13 contacts the first contact a.

The voltmeter 15 and the ammeter 19 can measure the voltage value and the current value, which are converted and output from the secondary side of the converting unit 11 by the supply voltage.

Fig. 3 is a diagram showing that the gate unit test circuit 1, which is an embodiment of the present invention, causes the supply voltage to be converted to a test voltage with a low voltage through the switching of the switch 13. Fig.

Referring to FIGS. 1 to 4, the switch 13 may be connected to the second contact N22.

The control unit 23 can control the power switch 5, the start switch 7 and the switch 13. The control unit 23 controls the power switch 5 and the start switch 7 to be turned on, The test voltage can be supplied to the gate unit 40 through the gate unit test circuit 1 and the test voltage can be supplied to the gate unit 40 through the thyristor tester 100. [ Can test the operation confirmation characteristic of the gate unit (40) when the power supply to the gate unit (40) is insufficient through the test control unit (53).

When the second contact N22 and the switch 13 are connected by the control unit 23 under the control of the control unit 23, the converting unit 11 can convert the supply voltage to a test voltage that is lower than the high voltage and more specifically, The gate unit testing apparatus 1 can test the operation checking characteristic of the gate unit 40. In addition,

For example, if the supply voltage is 220 (v), the operating voltage converted by the converting section 11 is 700 (V), and the test voltage is 120 (V) Can be accurately converted to a test voltage of 120 (v) or an operation voltage of 700 (V), and can be accurately converted into a test voltage, so that the reliability of the test can be increased whether the gate unit 40 operates normally or not .

The number of turns of the coil on the primary side N1 of the transformer unit is smaller than the number of turns of the coil on the secondary side N21 and may be larger than the number of turns of the coil on N22.

That is, when the supply voltage input to the transformer primary N1 is 220 V and the switch 13 contacts the first contact a, the output voltage is 700 V (V) according to the number of coils of the transformer secondary N21 Can be output. When the switch 13 is brought into contact with the second contact "b", the output voltage can be outputted as 120 (V) according to the number of turns of the coil N22 on the transformer secondary side.

The gate unit testing apparatus 1 determines whether the primary side supply voltage through the second output section 17 converts into a working voltage for operating the gate unit 40 at the secondary side or a test for testing the gate unit 40 The user can confirm whether the voltage is converted into a voltage, thereby ensuring convenience in use.

4 is a view for explaining the connection of the gate unit testing apparatus, the thyristor tester, and the thyristor according to the embodiment of the present invention.

4, the power output unit 54 of the thyristor tester 100 is connected to the input unit 3 of the gate unit testing circuit 1, and the input unit 3 supplies voltage from the power output unit 54 Can receive.

The node end A and the terminal end K of the thyristor 30 are connected to the gate unit testing apparatus 1 and one end of the snubber resistor 32 of the snubber circuits 32 and 34 is connected to the thyristor 30 and the other end of the snubber resistor 32 may be connected to one end of the snubber capacitor.

The gate unit 40 includes a gate capacitor 46 which is a capacitor for charging and discharging energy and has a first terminal 42 and a second terminal 44 connected to the input terminal 50 of the thyristor tester 100 .

The other end of the snubber capacitor 34 may be connected to one end of the gate capacitor 46 of the gate unit 40 and the other end of the gate capacitor 34 may be connected to the terminal end K of the thyristor.

The gate unit test circuit 1 receives the supply voltage from the thyristor tester 100 and can convert the supply voltage into the operation voltage or the test voltage in the conversion unit 11. [

The gate unit test circuit 1 can convert the supply voltage to a high voltage operation voltage through the conversion section 11 and supply it to the gate unit 40 of the thyristor 30 so that the gate unit 40 can operate.

The gate unit test circuit 1 may convert the supply voltage to the test voltage of low voltage through the conversion section 11 so that the gate unit 40 of the thyristor 30 may not be supplied with sufficient voltage, 40 can not receive a sufficient voltage, the gate unit testing apparatus 1000 can perform an operation confirmation test whether the gate unit 40 operates normally. That is, in order to test whether the gate unit 40 operates properly, the supply voltage must be converted into a test voltage of low voltage through the conversion unit 11. When the supply voltage is converted into a test voltage of low voltage, the thyristor tester 100, It is possible to perform a low power test which is a test for confirming whether the gate unit 40 of the thyristor 30 is normally operated.

5 is a view for explaining a gate unit test method for testing a gate unit connected to a thyristor tester and a thyristor in a gate unit test circuit according to an embodiment of the present invention.

1 to 5, the input unit 3 of the gate unit test circuit 1 can receive a voltage from the power output unit 54 of the thyristor tester 100 (S1).

A method for testing a gate unit (40) of a gate unit testing circuit (1) for testing a gate unit (40) connected to a thyristor (30) And a supply voltage generating step of generating a supply voltage to be supplied to the test circuit 1.

The first output unit 9 of the gate unit test circuit 1 can output a signal for confirming whether or not the input voltage supplied by the input unit 3 is input (S2).

The control unit 23 can convert the supply voltage input from the input unit 3 to the conversion unit 11 into the operation voltage or the test voltage through the switching control of the switch 13 at step S3, The test voltage can be converted to a low voltage.

And may be a conversion step of converting the input voltage into a test voltage lower than the input voltage.

The second output unit 17 may output a signal indicating that the supply voltage has been converted into the test voltage (S4).

The gate unit testing circuit 1 may not supply sufficient voltage to the gate unit 40 of the thyristor 30 when the supply voltage is converted to the test voltage through the converting portion 11 so that the gate unit 40 (S5).

The test voltage may be input to the thyristor 30 and the gate unit 40 may be tested.

For example, if the supply voltage is 220 (v) and the operating voltage converted by the converting unit 11 is 700 (V) and the test voltage is 120 (V), the gate unit 40 is tested The test voltage 120 (V) must be applied to the thyristor 30.

The gate unit test circuit 1 converts the supply voltage to the operating voltage through the conversion section 11 in step S5 so that a sufficient voltage is supplied to the gate unit 40 of the thyristor 30, It is possible to operate normally (S6).

The test step may include a transmitting and receiving step of transmitting and receiving signals to and from the gate unit 40 and an output step of outputting the result of the test of the gate unit 40 to the monitor unit 52 provided in the thyristor tester 100 .

The high voltage may be a voltage higher than the supply voltage, and the low voltage may be a voltage lower than the supply voltage.

The gate unit testing apparatus and the gate unit testing method according to the embodiment of the present invention can control the supply voltage to a high voltage or a low voltage under the control of the controller so that the convenience of the user not directly converting the supply voltage can be secured, In addition, a conversion unit whose supply voltage is changed in accordance with the switch control of the control unit is used, so that a device directly operated by the user is simplified. This can simplify the volume of the gate unit test equipment and reduce costs by simplifying the volume. Further, it is possible to secure reliability in testing the gate unit by converting the supply voltage by setting the reference voltage level without direct conversion by the user, and it is possible to ensure the reliability by testing the gate unit at the secondary side through the second output unit It is possible for the user to confirm whether or not the voltage is converted into a voltage for testing the gate unit or a voltage for testing the gate unit, thereby ensuring convenience in using the gate unit testing apparatus.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, It will be understood that various modifications and applications are possible. For example, each component specifically shown in the embodiments can be modified and implemented. It is to be understood that all changes and modifications that come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.

One; Gate unit test circuit, 3; An input unit,
5; Power switch, 7; Start switch,
9; A first output section, 11; Conversion section,
13; Switch, 15; Voltmeter,
17; A second output section, 19; ammeter,
21; Resistance, 23; The control unit,
30; Thyristor, 32; Snubber resistance,
34; Snubber capacitors, 40; Gate unit,
42; A first terminal, 44; A second terminal,
46; A gate capacitor, 50; Input terminal,
52; A monitor section 53; The test controller,
54; A power output unit, 100; Thyristor tester,
1000; Gate unit testing device,

Claims (7)

1. A gate unit testing apparatus for testing a gate unit connected to a thyristor,
A thyristor tester connected to the gate unit and generating a supply voltage; And
And a gate unit test circuit connected to the thyristor to apply a test voltage to the gate unit,
The gate unit test circuit
An input unit for receiving the supply voltage through the thyristor tester;
A converter for receiving and converting the supply voltage and supplying the converted voltage to the thyristor; And
And a control unit for controlling the converting unit to convert the supply voltage into the test voltage lower than the supply voltage
Gate unit testing apparatus. The method according to claim 1,
The thyristor tester
And a test control unit for testing the gate unit connected to the thyristor when the thyristor receives the test voltage from the conversion unit
Gate unit testing apparatus. 3. The method of claim 2,
The thyristor tester
An input terminal connected to the gate unit to transmit and receive a signal to / from the gate unit; And
And a monitor unit for outputting the test result of the gate unit
Gate unit testing apparatus. The method according to claim 1,
The gate unit test circuit
And a switch connected between the conversion unit and the thyristor,
The conversion unit
A primary side receiving the supply voltage; And
And a secondary side connected to the switch, the secondary side of which the supply voltage input from the primary side is converted and output
Gate unit testing apparatus. 5. The method of claim 4,
The secondary side
A first contact for receiving the supply voltage and outputting a voltage higher than the supply voltage, and a second contact for receiving the supply voltage and outputting the test voltage,
The control unit
And controls the switch to be in contact with the second contact so that the test voltage is output
Gate unit testing apparatus. A method for testing a gate unit connected to a thyristor,
A supply voltage generating step in which a thyristor tester generates a supply voltage to be applied to the gate unit test circuit;
A converting step of the gate unit testing circuit converting the supply voltage applied from the thyristor tester to a test voltage lower than the supply voltage; And
And testing the gate unit when the gate unit test circuit applies the test voltage to the thyristor
Gate unit test method. The method according to claim 6,
The test step
A transmitting and receiving step of transmitting and receiving signals with the gate unit; And
And outputting the result of the test of the gate unit to a monitor unit provided in the thyristor tester
Gate unit test method.

Images