KR20130016518A - 이중 감지 기능을 가지는 기판 적층형 이미지 센서 - Google Patents
이중 감지 기능을 가지는 기판 적층형 이미지 센서 Download PDFInfo
- Publication number
- KR20130016518A KR20130016518A KR1020110078512A KR20110078512A KR20130016518A KR 20130016518 A KR20130016518 A KR 20130016518A KR 1020110078512 A KR1020110078512 A KR 1020110078512A KR 20110078512 A KR20110078512 A KR 20110078512A KR 20130016518 A KR20130016518 A KR 20130016518A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- photodiode
- image sensor
- type image
- transfer transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
- H04N25/778—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
- H04N13/239—Image signal generators using stereoscopic image cameras using two 2D image sensors having a relative position equal to or related to the interocular distance
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/199—Back-illuminated image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/809—Constructional details of image sensors of hybrid image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/812—Arrangements for transferring the charges in the image sensor perpendicular to the imaging plane, e.g. buried regions used to transfer generated charges to circuitry under the photosensitive region
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/805—Coatings
- H10F39/8053—Colour filters
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/806—Optical elements or arrangements associated with the image sensors
- H10F39/8063—Microlenses
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/811—Interconnections
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Facsimile Heads (AREA)
Abstract
본 발명에 따른 기판 적층형 이미지 센서는 제1 기판에 제1 포토 다이오드를 형성하고, 제2 기판에 제2 포토 다이오드를 형성한 다음, 양 기판을 서로 정렬하여 접착함에 의해 양 포토 다이오드가 전기적으로 결합하여 한 픽셀내의 완전한 포토 다이오드를 이루는 것을 특징으로 한다.
Description
도 1b는 도 1a 가운데 하나의 화소만을 선택하여 크기를 표시한 것이다.
도 1c는 크로스토크 현상을 설명하기 위한 도면이다.
도 2는 본 발명의 한 실시 예에 따른 기판 적층형 이미지 센서의 구조를 나타내는 간략 회로도이다.
도 3은 도2에 나타난 회로도를 반도체 기판에 구현했을 때의 단면도를 예시적으로 나타낸 것이다.
도 4는 본 발명의 다른 실시 예에 따른 기판 적층형 이미지 센서의 구조를 나타내는 간략 회로도이다.
도 5는 본 발명의 또 다른 실시 예에 따른 기판 적층형 이미지 센서의 구조를 나타내는 간략 회로도이다.
도 6은 본 발명에서 각 포토 다이오드 사이에 트렌치를 형성한 그림이다.
221 : 제1 전달 트랜지스터 222 : 제2 전달 트랜지스터
230 : 리셋 트랜지스터 240 : 추적 트랜지스터
250 : 선택 트랜지스터 260 : 제2 패드
270 : 제2 패드
Claims (13)
- 이중 감지 기능을 가지는 기판 적층형 이미지 센서에 있어서,
제1 기판에 형성된 제1 포토 다이오드;
제2 기판에 형성된 제2 포토 다이오드;
상기 제1 포토 다이오드와 상기 제2 포토 다이오드가 서로 전기적으로 접촉된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서. - 이중 감지 기능을 가지는 기판 적층형 이미지 센서에 있어서,
제1 기판에 형성된 제1 포토 다이오드 및 제1 패드;
제2 기판에 형성된 제2 포토 다이오드 및 제2 패드;
상기 제1 포토 다이오드와 상기 제2 포토 다이오드가 상기 제1 패드및 상기 제2 패드의 접촉에 의해 서로 전기적으로 연결된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서. - 제1항 또는 제2항에 있어서 상기 제1 기판 및 상기 제2 기판은 실리콘(Si), 게르마늄(Ge), 또는 갈륨-비소(GaAs)인 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 제1항 또는 제2항에 있어서 상기 제2 기판에는 억세스 트랜지스터들 가운데 일부 또는 전부가 형성된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 제1항 또는 제2항에 있어서 상기 제1 기판 또는 상기 제2 기판 가운데 하나에만 선택적으로 전달 트랜지스터가 형성된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 제1항 또는 제2항에 있어서 상기 제1 기판에는 억세스 트랜지스터들 가운데 제1 전달 트랜지스터가, 상기 제2 기판에는 제2 전달 트랜지스터가 형성된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 제1항 또는 제2항에 있어서 상기 제1 포토 다이오드와 상기 제2 포토 다이오드는 상기 접촉에 의해 한 픽셀 내의 완전한 포토 다이오드로 합쳐지는 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 제1항 또는 제2항에 있어서 상기 제1 포토 다이오드 또는 상기 제2 포토 다이오드는 그 P-N접합의 크기가 서로 다른 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 제1항 또는 제2항에 있어서, 상기 제1 포토 다이오드 또는 상기 제2 포토 다이오드 가운데 최소한 하나 이상에서 주변부에 트렌치가 형성되어 있는 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 제9항에 있어서, 상기 트렌치에는 불투과성 성분이 채워져 있는 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
- 이중 감지 기능을 가지는 기판 적층형 이미지 센서에 있어서,
제1 기판에 형성된 제1 포토 다이오드 및 제1 전달 트랜지스터;
제2 기판에 형성된 제2 포토 다이오드 및 제2 전달 트랜지스터;
상기 제1 포토 다이오드 및 상기 제2 포토 다이오드, 상기 제1 전달 트랜지스터 및 상기 제2 전달 트랜지스터가 서로 전기적으로 접촉된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서. - 이중 감지 기능을 가지는 기판 적층형 이미지 센서에 있어서,
제1 기판에 형성된 제1 포토 다이오드 및 제1 전달 트랜지스터;
제2 기판에 형성된 제2 포토 다이오드;
상기 제1 포토 다이오드와 상기 제2 포토 다이오드가 서로 전기적으로 접촉된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서. - 이중 감지 기능을 가지는 기판 적층형 이미지 센서에 있어서,
제1 기판에 형성된 제1 포토 다이오드;
제2 기판에 형성된 제2 포토 다이오드 및 제2 전달 트랜지스터;
상기 제1 포토 다이오드와 상기 제2 포토 다이오드가 서로 전기적으로 접촉된 것을 특징으로 하는 이중 감지 기능을 가지는 기판 적층형 이미지 센서.
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020110078512A KR101399338B1 (ko) | 2011-08-08 | 2011-08-08 | 이중 감지 기능을 가지는 기판 적층형 이미지 센서 |
| EP12822070.4A EP2743985A4 (en) | 2011-08-08 | 2012-08-08 | IMAGE SENSOR FOR SEVERAL SUBSTRATES WITH DOUBLE DETECTION FUNCTION |
| US14/237,853 US9337227B2 (en) | 2011-08-08 | 2012-08-08 | Multi-substrate image sensor having a dual detection function |
| JP2014524927A JP2014523148A (ja) | 2011-08-08 | 2012-08-08 | 二重感知機能を有する基板積層型イメージセンサ |
| CN201280038912.7A CN103733342B (zh) | 2011-08-08 | 2012-08-08 | 具有双重检测功能的多基底图像传感器 |
| PCT/KR2012/006293 WO2013022269A2 (ko) | 2011-08-08 | 2012-08-08 | 이중 감지 기능을 가지는 기판 적층형 이미지 센서 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020110078512A KR101399338B1 (ko) | 2011-08-08 | 2011-08-08 | 이중 감지 기능을 가지는 기판 적층형 이미지 센서 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20130016518A true KR20130016518A (ko) | 2013-02-18 |
| KR101399338B1 KR101399338B1 (ko) | 2014-05-30 |
Family
ID=47669076
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020110078512A Active KR101399338B1 (ko) | 2011-08-08 | 2011-08-08 | 이중 감지 기능을 가지는 기판 적층형 이미지 센서 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9337227B2 (ko) |
| EP (1) | EP2743985A4 (ko) |
| JP (1) | JP2014523148A (ko) |
| KR (1) | KR101399338B1 (ko) |
| CN (1) | CN103733342B (ko) |
| WO (1) | WO2013022269A2 (ko) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101334219B1 (ko) * | 2013-08-22 | 2013-11-29 | (주)실리콘화일 | 3차원 적층구조의 이미지센서 |
| KR101530696B1 (ko) * | 2013-10-04 | 2015-06-22 | (주)실리콘화일 | 분광 특성이 개선된 이미지 센서 |
| WO2016072539A1 (ko) * | 2014-11-06 | 2016-05-12 | (주) 실리콘화일 | 분광 특성이 개선된 이미지 센서 |
| KR20180026067A (ko) * | 2016-09-02 | 2018-03-12 | 삼성전자주식회사 | 반도체 장치 |
Families Citing this family (179)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11984445B2 (en) | 2009-10-12 | 2024-05-14 | Monolithic 3D Inc. | 3D semiconductor devices and structures with metal layers |
| US10388863B2 (en) | 2009-10-12 | 2019-08-20 | Monolithic 3D Inc. | 3D memory device and structure |
| US10354995B2 (en) | 2009-10-12 | 2019-07-16 | Monolithic 3D Inc. | Semiconductor memory device and structure |
| US10043781B2 (en) | 2009-10-12 | 2018-08-07 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10366970B2 (en) | 2009-10-12 | 2019-07-30 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11018133B2 (en) | 2009-10-12 | 2021-05-25 | Monolithic 3D Inc. | 3D integrated circuit |
| US11374118B2 (en) | 2009-10-12 | 2022-06-28 | Monolithic 3D Inc. | Method to form a 3D integrated circuit |
| US10157909B2 (en) | 2009-10-12 | 2018-12-18 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US12027518B1 (en) | 2009-10-12 | 2024-07-02 | Monolithic 3D Inc. | 3D semiconductor devices and structures with metal layers |
| US10910364B2 (en) | 2009-10-12 | 2021-02-02 | Monolitaic 3D Inc. | 3D semiconductor device |
| US10217667B2 (en) | 2011-06-28 | 2019-02-26 | Monolithic 3D Inc. | 3D semiconductor device, fabrication method and system |
| US8163581B1 (en) * | 2010-10-13 | 2012-04-24 | Monolith IC 3D | Semiconductor and optoelectronic devices |
| US11482440B2 (en) | 2010-12-16 | 2022-10-25 | Monolithic 3D Inc. | 3D semiconductor device and structure with a built-in test circuit for repairing faulty circuits |
| US10497713B2 (en) | 2010-11-18 | 2019-12-03 | Monolithic 3D Inc. | 3D semiconductor memory device and structure |
| US12362219B2 (en) | 2010-11-18 | 2025-07-15 | Monolithic 3D Inc. | 3D semiconductor memory device and structure |
| US11469271B2 (en) | 2010-10-11 | 2022-10-11 | Monolithic 3D Inc. | Method to produce 3D semiconductor devices and structures with memory |
| US11227897B2 (en) | 2010-10-11 | 2022-01-18 | Monolithic 3D Inc. | Method for producing a 3D semiconductor memory device and structure |
| US11158674B2 (en) | 2010-10-11 | 2021-10-26 | Monolithic 3D Inc. | Method to produce a 3D semiconductor device and structure |
| US11257867B1 (en) | 2010-10-11 | 2022-02-22 | Monolithic 3D Inc. | 3D semiconductor device and structure with oxide bonds |
| US11315980B1 (en) | 2010-10-11 | 2022-04-26 | Monolithic 3D Inc. | 3D semiconductor device and structure with transistors |
| US10896931B1 (en) | 2010-10-11 | 2021-01-19 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11024673B1 (en) | 2010-10-11 | 2021-06-01 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11018191B1 (en) | 2010-10-11 | 2021-05-25 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11600667B1 (en) | 2010-10-11 | 2023-03-07 | Monolithic 3D Inc. | Method to produce 3D semiconductor devices and structures with memory |
| US10290682B2 (en) | 2010-10-11 | 2019-05-14 | Monolithic 3D Inc. | 3D IC semiconductor device and structure with stacked memory |
| US10833108B2 (en) | 2010-10-13 | 2020-11-10 | Monolithic 3D Inc. | 3D microdisplay device and structure |
| US11327227B2 (en) | 2010-10-13 | 2022-05-10 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with electromagnetic modulators |
| US10978501B1 (en) | 2010-10-13 | 2021-04-13 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with waveguides |
| US11133344B2 (en) | 2010-10-13 | 2021-09-28 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors |
| US11437368B2 (en) | 2010-10-13 | 2022-09-06 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with oxide bonding |
| US11855114B2 (en) | 2010-10-13 | 2023-12-26 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors and wafer bonding |
| US10998374B1 (en) | 2010-10-13 | 2021-05-04 | Monolithic 3D Inc. | Multilevel semiconductor device and structure |
| US11694922B2 (en) | 2010-10-13 | 2023-07-04 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with oxide bonding |
| US11043523B1 (en) | 2010-10-13 | 2021-06-22 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors |
| US11164898B2 (en) | 2010-10-13 | 2021-11-02 | Monolithic 3D Inc. | Multilevel semiconductor device and structure |
| US11605663B2 (en) | 2010-10-13 | 2023-03-14 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors and wafer bonding |
| US11984438B2 (en) | 2010-10-13 | 2024-05-14 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with oxide bonding |
| US11869915B2 (en) | 2010-10-13 | 2024-01-09 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors and wafer bonding |
| US10943934B2 (en) | 2010-10-13 | 2021-03-09 | Monolithic 3D Inc. | Multilevel semiconductor device and structure |
| US11404466B2 (en) | 2010-10-13 | 2022-08-02 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors |
| US11855100B2 (en) | 2010-10-13 | 2023-12-26 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with oxide bonding |
| US11929372B2 (en) | 2010-10-13 | 2024-03-12 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors and wafer bonding |
| US11063071B1 (en) | 2010-10-13 | 2021-07-13 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with waveguides |
| US10679977B2 (en) | 2010-10-13 | 2020-06-09 | Monolithic 3D Inc. | 3D microdisplay device and structure |
| US12360310B2 (en) | 2010-10-13 | 2025-07-15 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with oxide bonding |
| US12080743B2 (en) | 2010-10-13 | 2024-09-03 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with image sensors and wafer bonding |
| US12094892B2 (en) | 2010-10-13 | 2024-09-17 | Monolithic 3D Inc. | 3D micro display device and structure |
| US11163112B2 (en) | 2010-10-13 | 2021-11-02 | Monolithic 3D Inc. | Multilevel semiconductor device and structure with electromagnetic modulators |
| US11004719B1 (en) | 2010-11-18 | 2021-05-11 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor memory device and structure |
| US11164770B1 (en) | 2010-11-18 | 2021-11-02 | Monolithic 3D Inc. | Method for producing a 3D semiconductor memory device and structure |
| US11508605B2 (en) | 2010-11-18 | 2022-11-22 | Monolithic 3D Inc. | 3D semiconductor memory device and structure |
| US11521888B2 (en) | 2010-11-18 | 2022-12-06 | Monolithic 3D Inc. | 3D semiconductor device and structure with high-k metal gate transistors |
| US11443971B2 (en) | 2010-11-18 | 2022-09-13 | Monolithic 3D Inc. | 3D semiconductor device and structure with memory |
| US11482439B2 (en) | 2010-11-18 | 2022-10-25 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor memory device comprising charge trap junction-less transistors |
| US12125737B1 (en) | 2010-11-18 | 2024-10-22 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and memory cells |
| US11495484B2 (en) | 2010-11-18 | 2022-11-08 | Monolithic 3D Inc. | 3D semiconductor devices and structures with at least two single-crystal layers |
| US11031275B2 (en) | 2010-11-18 | 2021-06-08 | Monolithic 3D Inc. | 3D semiconductor device and structure with memory |
| US11923230B1 (en) | 2010-11-18 | 2024-03-05 | Monolithic 3D Inc. | 3D semiconductor device and structure with bonding |
| US11615977B2 (en) | 2010-11-18 | 2023-03-28 | Monolithic 3D Inc. | 3D semiconductor memory device and structure |
| US11211279B2 (en) | 2010-11-18 | 2021-12-28 | Monolithic 3D Inc. | Method for processing a 3D integrated circuit and structure |
| US11854857B1 (en) | 2010-11-18 | 2023-12-26 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor device and structure with memory cells and multiple metal layers |
| US11901210B2 (en) | 2010-11-18 | 2024-02-13 | Monolithic 3D Inc. | 3D semiconductor device and structure with memory |
| US11862503B2 (en) | 2010-11-18 | 2024-01-02 | Monolithic 3D Inc. | Method for producing a 3D semiconductor device and structure with memory cells and multiple metal layers |
| US12272586B2 (en) | 2010-11-18 | 2025-04-08 | Monolithic 3D Inc. | 3D semiconductor memory device and structure with memory and metal layers |
| US12068187B2 (en) | 2010-11-18 | 2024-08-20 | Monolithic 3D Inc. | 3D semiconductor device and structure with bonding and DRAM memory cells |
| US11482438B2 (en) | 2010-11-18 | 2022-10-25 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor memory device and structure |
| US11355381B2 (en) | 2010-11-18 | 2022-06-07 | Monolithic 3D Inc. | 3D semiconductor memory device and structure |
| US11107721B2 (en) | 2010-11-18 | 2021-08-31 | Monolithic 3D Inc. | 3D semiconductor device and structure with NAND logic |
| US12154817B1 (en) | 2010-11-18 | 2024-11-26 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor memory device and structure |
| US12144190B2 (en) | 2010-11-18 | 2024-11-12 | Monolithic 3D Inc. | 3D semiconductor device and structure with bonding and memory cells preliminary class |
| US12243765B2 (en) | 2010-11-18 | 2025-03-04 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and memory cells |
| US11610802B2 (en) | 2010-11-18 | 2023-03-21 | Monolithic 3D Inc. | Method for producing a 3D semiconductor device and structure with single crystal transistors and metal gate electrodes |
| US11355380B2 (en) | 2010-11-18 | 2022-06-07 | Monolithic 3D Inc. | Methods for producing 3D semiconductor memory device and structure utilizing alignment marks |
| US12100611B2 (en) | 2010-11-18 | 2024-09-24 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor device and structure with memory cells and multiple metal layers |
| US11569117B2 (en) | 2010-11-18 | 2023-01-31 | Monolithic 3D Inc. | 3D semiconductor device and structure with single-crystal layers |
| US11804396B2 (en) | 2010-11-18 | 2023-10-31 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor device and structure with memory cells and multiple metal layers |
| US12033884B2 (en) | 2010-11-18 | 2024-07-09 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor device and structure with memory cells and multiple metal layers |
| US11735462B2 (en) | 2010-11-18 | 2023-08-22 | Monolithic 3D Inc. | 3D semiconductor device and structure with single-crystal layers |
| US11784082B2 (en) | 2010-11-18 | 2023-10-10 | Monolithic 3D Inc. | 3D semiconductor device and structure with bonding |
| US12136562B2 (en) | 2010-11-18 | 2024-11-05 | Monolithic 3D Inc. | 3D semiconductor device and structure with single-crystal layers |
| US11094576B1 (en) | 2010-11-18 | 2021-08-17 | Monolithic 3D Inc. | Methods for producing a 3D semiconductor memory device and structure |
| US11121021B2 (en) | 2010-11-18 | 2021-09-14 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11018042B1 (en) | 2010-11-18 | 2021-05-25 | Monolithic 3D Inc. | 3D semiconductor memory device and structure |
| US12463076B2 (en) | 2010-12-16 | 2025-11-04 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10388568B2 (en) | 2011-06-28 | 2019-08-20 | Monolithic 3D Inc. | 3D semiconductor device and system |
| US11694944B1 (en) | 2012-04-09 | 2023-07-04 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and a connective path |
| US11881443B2 (en) | 2012-04-09 | 2024-01-23 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and a connective path |
| US11616004B1 (en) | 2012-04-09 | 2023-03-28 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and a connective path |
| US11476181B1 (en) | 2012-04-09 | 2022-10-18 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11410912B2 (en) | 2012-04-09 | 2022-08-09 | Monolithic 3D Inc. | 3D semiconductor device with vias and isolation layers |
| US11735501B1 (en) | 2012-04-09 | 2023-08-22 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and a connective path |
| US11594473B2 (en) | 2012-04-09 | 2023-02-28 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and a connective path |
| US10600888B2 (en) | 2012-04-09 | 2020-03-24 | Monolithic 3D Inc. | 3D semiconductor device |
| US11164811B2 (en) | 2012-04-09 | 2021-11-02 | Monolithic 3D Inc. | 3D semiconductor device with isolation layers and oxide-to-oxide bonding |
| US11088050B2 (en) | 2012-04-09 | 2021-08-10 | Monolithic 3D Inc. | 3D semiconductor device with isolation layers |
| US11961827B1 (en) | 2012-12-22 | 2024-04-16 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11217565B2 (en) | 2012-12-22 | 2022-01-04 | Monolithic 3D Inc. | Method to form a 3D semiconductor device and structure |
| US12051674B2 (en) | 2012-12-22 | 2024-07-30 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11916045B2 (en) | 2012-12-22 | 2024-02-27 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11018116B2 (en) | 2012-12-22 | 2021-05-25 | Monolithic 3D Inc. | Method to form a 3D semiconductor device and structure |
| US11967583B2 (en) | 2012-12-22 | 2024-04-23 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11063024B1 (en) | 2012-12-22 | 2021-07-13 | Monlithic 3D Inc. | Method to form a 3D semiconductor device and structure |
| US11309292B2 (en) | 2012-12-22 | 2022-04-19 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11784169B2 (en) | 2012-12-22 | 2023-10-10 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11430667B2 (en) | 2012-12-29 | 2022-08-30 | Monolithic 3D Inc. | 3D semiconductor device and structure with bonding |
| US11004694B1 (en) | 2012-12-29 | 2021-05-11 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11177140B2 (en) | 2012-12-29 | 2021-11-16 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10892169B2 (en) | 2012-12-29 | 2021-01-12 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11430668B2 (en) | 2012-12-29 | 2022-08-30 | Monolithic 3D Inc. | 3D semiconductor device and structure with bonding |
| US12249538B2 (en) | 2012-12-29 | 2025-03-11 | Monolithic 3D Inc. | 3D semiconductor device and structure including power distribution grids |
| US10651054B2 (en) | 2012-12-29 | 2020-05-12 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10115663B2 (en) | 2012-12-29 | 2018-10-30 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10600657B2 (en) | 2012-12-29 | 2020-03-24 | Monolithic 3D Inc | 3D semiconductor device and structure |
| US10903089B1 (en) | 2012-12-29 | 2021-01-26 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11087995B1 (en) | 2012-12-29 | 2021-08-10 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10325651B2 (en) | 2013-03-11 | 2019-06-18 | Monolithic 3D Inc. | 3D semiconductor device with stacked memory |
| US11869965B2 (en) | 2013-03-11 | 2024-01-09 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and memory cells |
| US11935949B1 (en) | 2013-03-11 | 2024-03-19 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and memory cells |
| US8902663B1 (en) | 2013-03-11 | 2014-12-02 | Monolithic 3D Inc. | Method of maintaining a memory state |
| US12094965B2 (en) | 2013-03-11 | 2024-09-17 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers and memory cells |
| US11923374B2 (en) | 2013-03-12 | 2024-03-05 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US12100646B2 (en) | 2013-03-12 | 2024-09-24 | Monolithic 3D Inc. | 3D semiconductor device and structure with metal layers |
| US11088130B2 (en) | 2014-01-28 | 2021-08-10 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10840239B2 (en) | 2014-08-26 | 2020-11-17 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11398569B2 (en) | 2013-03-12 | 2022-07-26 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10224279B2 (en) | 2013-03-15 | 2019-03-05 | Monolithic 3D Inc. | Semiconductor device and structure |
| US11720736B2 (en) | 2013-04-15 | 2023-08-08 | Monolithic 3D Inc. | Automation methods for 3D integrated circuits and devices |
| US11574109B1 (en) | 2013-04-15 | 2023-02-07 | Monolithic 3D Inc | Automation methods for 3D integrated circuits and devices |
| US11341309B1 (en) | 2013-04-15 | 2022-05-24 | Monolithic 3D Inc. | Automation for monolithic 3D devices |
| US11487928B2 (en) | 2013-04-15 | 2022-11-01 | Monolithic 3D Inc. | Automation for monolithic 3D devices |
| US11030371B2 (en) | 2013-04-15 | 2021-06-08 | Monolithic 3D Inc. | Automation for monolithic 3D devices |
| US9021414B1 (en) | 2013-04-15 | 2015-04-28 | Monolithic 3D Inc. | Automation for monolithic 3D devices |
| US11270055B1 (en) | 2013-04-15 | 2022-03-08 | Monolithic 3D Inc. | Automation for monolithic 3D devices |
| JP6161522B2 (ja) * | 2013-11-20 | 2017-07-12 | オリンパス株式会社 | 撮像素子 |
| US11107808B1 (en) | 2014-01-28 | 2021-08-31 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US12094829B2 (en) | 2014-01-28 | 2024-09-17 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10297586B2 (en) | 2015-03-09 | 2019-05-21 | Monolithic 3D Inc. | Methods for processing a 3D semiconductor device |
| US11031394B1 (en) | 2014-01-28 | 2021-06-08 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US9818779B2 (en) | 2014-03-27 | 2017-11-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | CMOS image sensor structure |
| FR3026227A1 (fr) * | 2014-09-18 | 2016-03-25 | Commissariat Energie Atomique | Dispositif d'acquisition d'images 3d |
| US10825779B2 (en) | 2015-04-19 | 2020-11-03 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11011507B1 (en) | 2015-04-19 | 2021-05-18 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US11056468B1 (en) | 2015-04-19 | 2021-07-06 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10381328B2 (en) | 2015-04-19 | 2019-08-13 | Monolithic 3D Inc. | Semiconductor device and structure |
| US11956952B2 (en) | 2015-08-23 | 2024-04-09 | Monolithic 3D Inc. | Semiconductor memory device and structure |
| US10014333B2 (en) * | 2015-08-26 | 2018-07-03 | Semiconductor Components Industries, Llc | Back-side illuminated pixels with interconnect layers |
| US12477752B2 (en) | 2015-09-21 | 2025-11-18 | Monolithic 3D Inc. | 3D semiconductor memory devices and structures |
| US12250830B2 (en) | 2015-09-21 | 2025-03-11 | Monolithic 3D Inc. | 3D semiconductor memory devices and structures |
| US12100658B2 (en) | 2015-09-21 | 2024-09-24 | Monolithic 3D Inc. | Method to produce a 3D multilayer semiconductor device and structure |
| US11937422B2 (en) | 2015-11-07 | 2024-03-19 | Monolithic 3D Inc. | Semiconductor memory device and structure |
| CN115942752A (zh) | 2015-09-21 | 2023-04-07 | 莫诺利特斯3D有限公司 | 3d半导体器件和结构 |
| US12178055B2 (en) | 2015-09-21 | 2024-12-24 | Monolithic 3D Inc. | 3D semiconductor memory devices and structures |
| US11978731B2 (en) | 2015-09-21 | 2024-05-07 | Monolithic 3D Inc. | Method to produce a multi-level semiconductor memory device and structure |
| US11114427B2 (en) | 2015-11-07 | 2021-09-07 | Monolithic 3D Inc. | 3D semiconductor processor and memory device and structure |
| US10522225B1 (en) | 2015-10-02 | 2019-12-31 | Monolithic 3D Inc. | Semiconductor device with non-volatile memory |
| US12219769B2 (en) | 2015-10-24 | 2025-02-04 | Monolithic 3D Inc. | 3D semiconductor device and structure with logic and memory |
| US10418369B2 (en) | 2015-10-24 | 2019-09-17 | Monolithic 3D Inc. | Multi-level semiconductor memory device and structure |
| US12016181B2 (en) | 2015-10-24 | 2024-06-18 | Monolithic 3D Inc. | 3D semiconductor device and structure with logic and memory |
| US12035531B2 (en) | 2015-10-24 | 2024-07-09 | Monolithic 3D Inc. | 3D semiconductor device and structure with logic and memory |
| US11296115B1 (en) | 2015-10-24 | 2022-04-05 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US10847540B2 (en) | 2015-10-24 | 2020-11-24 | Monolithic 3D Inc. | 3D semiconductor memory device and structure |
| US11991884B1 (en) | 2015-10-24 | 2024-05-21 | Monolithic 3D Inc. | 3D semiconductor device and structure with logic and memory |
| US11114464B2 (en) | 2015-10-24 | 2021-09-07 | Monolithic 3D Inc. | 3D semiconductor device and structure |
| US12120880B1 (en) | 2015-10-24 | 2024-10-15 | Monolithic 3D Inc. | 3D semiconductor device and structure with logic and memory |
| US11329059B1 (en) | 2016-10-10 | 2022-05-10 | Monolithic 3D Inc. | 3D memory devices and structures with thinned single crystal substrates |
| US11930648B1 (en) | 2016-10-10 | 2024-03-12 | Monolithic 3D Inc. | 3D memory devices and structures with metal layers |
| US12225704B2 (en) | 2016-10-10 | 2025-02-11 | Monolithic 3D Inc. | 3D memory devices and structures with memory arrays and metal layers |
| US11251149B2 (en) | 2016-10-10 | 2022-02-15 | Monolithic 3D Inc. | 3D memory device and structure |
| US11869591B2 (en) | 2016-10-10 | 2024-01-09 | Monolithic 3D Inc. | 3D memory devices and structures with control circuits |
| US11711928B2 (en) | 2016-10-10 | 2023-07-25 | Monolithic 3D Inc. | 3D memory devices and structures with control circuits |
| US11812620B2 (en) | 2016-10-10 | 2023-11-07 | Monolithic 3D Inc. | 3D DRAM memory devices and structures with control circuits |
| JP6746476B2 (ja) * | 2016-11-24 | 2020-08-26 | キヤノン株式会社 | 撮像装置、撮像システム、および、移動体 |
| FR3075462B1 (fr) * | 2017-12-19 | 2020-03-27 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Dispositif d'acquisition d'une image 2d et d'une image de profondeur d'une scene |
| US11018156B2 (en) | 2019-04-08 | 2021-05-25 | Monolithic 3D Inc. | 3D memory semiconductor devices and structures |
| US11296106B2 (en) | 2019-04-08 | 2022-04-05 | Monolithic 3D Inc. | 3D memory semiconductor devices and structures |
| US11763864B2 (en) | 2019-04-08 | 2023-09-19 | Monolithic 3D Inc. | 3D memory semiconductor devices and structures with bit-line pillars |
| US10892016B1 (en) | 2019-04-08 | 2021-01-12 | Monolithic 3D Inc. | 3D memory semiconductor devices and structures |
| US11158652B1 (en) | 2019-04-08 | 2021-10-26 | Monolithic 3D Inc. | 3D memory semiconductor devices and structures |
| US12317688B2 (en) * | 2021-05-08 | 2025-05-27 | Wuhan China Star Optoelectronics Technology Co., Ltd. | Display panel and display device with nanocrystalline particles that improve the light intensities of the light-emitting areas |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100782463B1 (ko) * | 2005-04-13 | 2007-12-05 | (주)실리콘화일 | 3차원 구조를 갖는 이미지 센서의 분리형 단위화소 및 그제조방법 |
| KR100800310B1 (ko) * | 2006-02-16 | 2008-02-01 | 마루엘에스아이 주식회사 | 가시광선 및 적외선을 감지할 수 있는 광 감지 소자 및 그제조 방법 |
| KR100835892B1 (ko) * | 2007-03-26 | 2008-06-09 | (주)실리콘화일 | 칩 적층 이미지센서 |
| DE102007018014A1 (de) | 2007-04-17 | 2008-10-23 | Bayer Materialscience Ag | Wärmeintegration in einem Deacon-Prozess |
| US7888763B2 (en) * | 2008-02-08 | 2011-02-15 | Omnivision Technologies, Inc. | Backside illuminated imaging sensor with improved infrared sensitivity |
| US7893468B2 (en) * | 2008-05-30 | 2011-02-22 | International Business Machines Corporation | Optical sensor including stacked photodiodes |
| US8471939B2 (en) * | 2008-08-01 | 2013-06-25 | Omnivision Technologies, Inc. | Image sensor having multiple sensing layers |
| US8054355B2 (en) * | 2008-10-16 | 2011-11-08 | Omnivision Technologies, Inc. | Image sensor having multiple sensing layers |
| KR20100046400A (ko) | 2008-10-27 | 2010-05-07 | 엘지전자 주식회사 | 디스플레이 장치 및 디스플레이 방법 |
| KR101056141B1 (ko) | 2008-11-13 | 2011-08-11 | 주식회사 다한이엔지 | 피씨비 기판 레이저 마킹 장치 |
| KR20100076261A (ko) * | 2008-12-26 | 2010-07-06 | 주식회사 동부하이텍 | 이미지 센서의 정전기 방전 보호 소자 |
| KR101049083B1 (ko) * | 2009-04-10 | 2011-07-15 | (주)실리콘화일 | 3차원 구조를 갖는 이미지 센서의 단위 화소 및 그 제조방법 |
| JP2010258157A (ja) * | 2009-04-23 | 2010-11-11 | Panasonic Corp | 固体撮像装置およびその製造方法 |
| KR101107627B1 (ko) | 2010-02-22 | 2012-01-25 | (주)실리콘화일 | 3차원 구조를 갖는 웨이퍼의 패드 형성 방법 |
| KR20110126891A (ko) | 2010-05-18 | 2011-11-24 | (주)실리콘화일 | 3차원 구조의 이미지센서 및 그 제조방법 |
| KR20110134139A (ko) | 2010-06-08 | 2011-12-14 | (주)실리콘화일 | 3차원 구조의 이미지센서의 제조방법 |
-
2011
- 2011-08-08 KR KR1020110078512A patent/KR101399338B1/ko active Active
-
2012
- 2012-08-08 US US14/237,853 patent/US9337227B2/en active Active
- 2012-08-08 WO PCT/KR2012/006293 patent/WO2013022269A2/ko not_active Ceased
- 2012-08-08 CN CN201280038912.7A patent/CN103733342B/zh active Active
- 2012-08-08 EP EP12822070.4A patent/EP2743985A4/en not_active Withdrawn
- 2012-08-08 JP JP2014524927A patent/JP2014523148A/ja active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101334219B1 (ko) * | 2013-08-22 | 2013-11-29 | (주)실리콘화일 | 3차원 적층구조의 이미지센서 |
| US9484375B2 (en) | 2013-08-22 | 2016-11-01 | Siliconfile Technologies Inc. | Image sensor with 3D stack structure |
| KR101530696B1 (ko) * | 2013-10-04 | 2015-06-22 | (주)실리콘화일 | 분광 특성이 개선된 이미지 센서 |
| WO2016072539A1 (ko) * | 2014-11-06 | 2016-05-12 | (주) 실리콘화일 | 분광 특성이 개선된 이미지 센서 |
| KR20180026067A (ko) * | 2016-09-02 | 2018-03-12 | 삼성전자주식회사 | 반도체 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2013022269A3 (ko) | 2013-06-13 |
| EP2743985A2 (en) | 2014-06-18 |
| CN103733342A (zh) | 2014-04-16 |
| US9337227B2 (en) | 2016-05-10 |
| US20140191357A1 (en) | 2014-07-10 |
| CN103733342B (zh) | 2016-10-19 |
| JP2014523148A (ja) | 2014-09-08 |
| EP2743985A4 (en) | 2015-07-15 |
| KR101399338B1 (ko) | 2014-05-30 |
| WO2013022269A2 (ko) | 2013-02-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101399338B1 (ko) | 이중 감지 기능을 가지는 기판 적층형 이미지 센서 | |
| KR101334099B1 (ko) | 이중 감지 기능을 가지는 기판 적층형 이미지 센서 | |
| US9786710B2 (en) | Image sensor device with sub-isolation in pixels | |
| US20170098675A1 (en) | Mechanisms for forming image sensor device | |
| JP2007221134A (ja) | 背面照射を用いる光センサおよびピクセル・アレイ、ならびに光センサを形成する方法 | |
| JP6079807B2 (ja) | 固体撮像装置及び電子機器 | |
| JP2012064709A (ja) | 固体撮像装置及び電子機器 | |
| JP2012169530A (ja) | 固体撮像装置、および、その製造方法、電子機器 | |
| JP2014232761A (ja) | 固体撮像装置 | |
| US20240170525A1 (en) | Sensor device | |
| JP5677238B2 (ja) | 固体撮像装置 | |
| KR101132852B1 (ko) | 픽셀 어레이 및 이를 포함하는 이미지센서 | |
| CN111129053A (zh) | 一种cmos图像传感器像素单元结构和形成方法 | |
| Fontaine | Recent innovations in CMOS image sensors | |
| KR20110079337A (ko) | 후면수광 이미지센서 및 그 제조방법 | |
| US20240170522A1 (en) | Image sensors | |
| KR102897588B1 (ko) | 이미지 센서 | |
| KR101305457B1 (ko) | 이중 감지 기능을 가지는 기판 적층형 이미지 센서 | |
| CN222638997U (zh) | 图像传感器、电子设备 | |
| WO2020063121A1 (zh) | 一种堆叠式图像传感器像素结构与制备方法 | |
| US20240363665A1 (en) | Semiconductor device including bonded substrates and manufacturing method thereof | |
| US20240006436A1 (en) | Image sensor and method of manufacturing an image sensor | |
| TW202310383A (zh) | 光檢測裝置及電子機器 | |
| KR20240113076A (ko) | 이미지 센서 및 이의 제조 방법 | |
| WO2023195265A1 (ja) | センサデバイス |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20110808 |
|
| PA0201 | Request for examination | ||
| AMND | Amendment | ||
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20121120 Patent event code: PE09021S01D |
|
| PG1501 | Laying open of application | ||
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20130730 Patent event code: PE09021S01D |
|
| AMND | Amendment | ||
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
Patent event date: 20140228 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20130730 Comment text: Notification of reason for refusal Patent event code: PE06011S01I Patent event date: 20121120 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |
|
| AMND | Amendment | ||
| PX0901 | Re-examination |
Patent event code: PX09011S01I Patent event date: 20140228 Comment text: Decision to Refuse Application Patent event code: PX09012R01I Patent event date: 20130927 Comment text: Amendment to Specification, etc. Patent event code: PX09012R01I Patent event date: 20110826 Comment text: Amendment to Specification, etc. |
|
| PX0701 | Decision of registration after re-examination |
Patent event date: 20140516 Comment text: Decision to Grant Registration Patent event code: PX07013S01D Patent event date: 20140430 Comment text: Amendment to Specification, etc. Patent event code: PX07012R01I Patent event date: 20140228 Comment text: Decision to Refuse Application Patent event code: PX07011S01I Patent event date: 20130927 Comment text: Amendment to Specification, etc. Patent event code: PX07012R01I Patent event date: 20110826 Comment text: Amendment to Specification, etc. Patent event code: PX07012R01I |
|
| X701 | Decision to grant (after re-examination) | ||
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20140520 Patent event code: PR07011E01D |
|
| PR1002 | Payment of registration fee |
Payment date: 20140520 End annual number: 3 Start annual number: 1 |
|
| PG1601 | Publication of registration | ||
| FPAY | Annual fee payment |
Payment date: 20170425 Year of fee payment: 4 |
|
| PR1001 | Payment of annual fee |
Payment date: 20170425 Start annual number: 4 End annual number: 4 |
|
| FPAY | Annual fee payment |
Payment date: 20180425 Year of fee payment: 5 |
|
| PR1001 | Payment of annual fee |
Payment date: 20180425 Start annual number: 5 End annual number: 5 |
|
| FPAY | Annual fee payment |
Payment date: 20190422 Year of fee payment: 6 |
|
| PR1001 | Payment of annual fee |
Payment date: 20190422 Start annual number: 6 End annual number: 6 |
|
| PR1001 | Payment of annual fee |
Payment date: 20200424 Start annual number: 7 End annual number: 7 |
|
| PR1001 | Payment of annual fee |
Payment date: 20220426 Start annual number: 9 End annual number: 9 |
|
| PR1001 | Payment of annual fee |
Payment date: 20230425 Start annual number: 10 End annual number: 10 |
|
| PR1001 | Payment of annual fee |
Payment date: 20240425 Start annual number: 11 End annual number: 11 |