KR20080036627A - 연속 범위의 수소 센서 - Google Patents
연속 범위의 수소 센서 Download PDFInfo
- Publication number
- KR20080036627A KR20080036627A KR1020087005320A KR20087005320A KR20080036627A KR 20080036627 A KR20080036627 A KR 20080036627A KR 1020087005320 A KR1020087005320 A KR 1020087005320A KR 20087005320 A KR20087005320 A KR 20087005320A KR 20080036627 A KR20080036627 A KR 20080036627A
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- South Korea
- Prior art keywords
- sensor
- hydrogen
- nanoparticles
- palladium
- temperature
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- 229910052739 hydrogen Inorganic materials 0.000 title claims abstract description 121
- 239000001257 hydrogen Substances 0.000 title claims abstract description 120
- 125000004435 hydrogen atom Chemical class [H]* 0.000 title 1
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims abstract description 157
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 94
- 239000002105 nanoparticle Substances 0.000 claims abstract description 84
- 229910052763 palladium Inorganic materials 0.000 claims abstract description 65
- 239000000758 substrate Substances 0.000 claims abstract description 37
- 229910001252 Pd alloy Inorganic materials 0.000 claims abstract description 4
- 230000004044 response Effects 0.000 claims description 43
- 230000008859 change Effects 0.000 claims description 38
- 150000002431 hydrogen Chemical class 0.000 claims description 26
- 230000007704 transition Effects 0.000 claims description 4
- 239000002245 particle Substances 0.000 description 67
- 238000000034 method Methods 0.000 description 58
- 239000010936 titanium Substances 0.000 description 44
- 238000007747 plating Methods 0.000 description 39
- 230000008569 process Effects 0.000 description 37
- 239000003921 oil Substances 0.000 description 33
- 229910045601 alloy Inorganic materials 0.000 description 32
- 239000000956 alloy Substances 0.000 description 32
- 239000010408 film Substances 0.000 description 30
- 235000012431 wafers Nutrition 0.000 description 27
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 22
- 230000012010 growth Effects 0.000 description 22
- 229910052719 titanium Inorganic materials 0.000 description 22
- 229910052751 metal Inorganic materials 0.000 description 20
- 239000002184 metal Substances 0.000 description 20
- 239000000463 material Substances 0.000 description 18
- 230000035945 sensitivity Effects 0.000 description 18
- 238000005259 measurement Methods 0.000 description 17
- 239000010410 layer Substances 0.000 description 16
- 238000004519 manufacturing process Methods 0.000 description 16
- 230000035882 stress Effects 0.000 description 16
- 230000006911 nucleation Effects 0.000 description 15
- 238000010899 nucleation Methods 0.000 description 15
- 238000012360 testing method Methods 0.000 description 15
- 238000009792 diffusion process Methods 0.000 description 14
- 239000010409 thin film Substances 0.000 description 14
- 230000000694 effects Effects 0.000 description 13
- 238000007254 oxidation reaction Methods 0.000 description 13
- 230000032683 aging Effects 0.000 description 12
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 11
- 239000001301 oxygen Substances 0.000 description 11
- 229910052760 oxygen Inorganic materials 0.000 description 11
- 239000000203 mixture Substances 0.000 description 10
- 230000003647 oxidation Effects 0.000 description 10
- 238000000151 deposition Methods 0.000 description 9
- 238000013461 design Methods 0.000 description 9
- 238000009713 electroplating Methods 0.000 description 9
- 229910001316 Ag alloy Inorganic materials 0.000 description 8
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 8
- 230000007423 decrease Effects 0.000 description 8
- 239000002070 nanowire Substances 0.000 description 8
- 229910052709 silver Inorganic materials 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 7
- 230000003750 conditioning effect Effects 0.000 description 7
- 230000008021 deposition Effects 0.000 description 7
- 239000011521 glass Substances 0.000 description 7
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 7
- 229910052737 gold Inorganic materials 0.000 description 7
- 239000010931 gold Substances 0.000 description 7
- 150000002739 metals Chemical class 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 7
- 239000010703 silicon Substances 0.000 description 7
- 230000000877 morphologic effect Effects 0.000 description 6
- 239000004332 silver Substances 0.000 description 6
- 239000007787 solid Substances 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000035699 permeability Effects 0.000 description 5
- 229910052720 vanadium Inorganic materials 0.000 description 5
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 5
- 238000013459 approach Methods 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 230000001143 conditioned effect Effects 0.000 description 4
- 230000006378 damage Effects 0.000 description 4
- 230000001419 dependent effect Effects 0.000 description 4
- 238000001000 micrograph Methods 0.000 description 4
- 230000000116 mitigating effect Effects 0.000 description 4
- 230000009467 reduction Effects 0.000 description 4
- 238000001878 scanning electron micrograph Methods 0.000 description 4
- 229910010413 TiO 2 Inorganic materials 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
- 230000003749 cleanliness Effects 0.000 description 3
- 230000007774 longterm Effects 0.000 description 3
- -1 palladium hydride Chemical class 0.000 description 3
- 238000000206 photolithography Methods 0.000 description 3
- 230000001681 protective effect Effects 0.000 description 3
- 238000011084 recovery Methods 0.000 description 3
- 230000008719 thickening Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical group [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000012790 adhesive layer Substances 0.000 description 2
- 238000005275 alloying Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000012512 characterization method Methods 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000003550 marker Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 230000001590 oxidative effect Effects 0.000 description 2
- SWELZOZIOHGSPA-UHFFFAOYSA-N palladium silver Chemical compound [Pd].[Ag] SWELZOZIOHGSPA-UHFFFAOYSA-N 0.000 description 2
- 230000036961 partial effect Effects 0.000 description 2
- 230000002829 reductive effect Effects 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910000952 Be alloy Inorganic materials 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 206010037660 Pyrexia Diseases 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000003679 aging effect Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000003698 anagen phase Effects 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000000970 chrono-amperometry Methods 0.000 description 1
- 238000004769 chrono-potentiometry Methods 0.000 description 1
- 238000012777 commercial manufacturing Methods 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 239000007771 core particle Substances 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 238000005202 decontamination Methods 0.000 description 1
- 230000003588 decontaminative effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000368 destabilizing effect Effects 0.000 description 1
- 238000009658 destructive testing Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000005984 hydrogenation reaction Methods 0.000 description 1
- 230000036039 immunity Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000002427 irreversible effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000010813 municipal solid waste Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000011165 process development Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 230000009291 secondary effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
- 238000004448 titration Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
- G01N33/005—H2
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/12—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid
- G01N27/125—Composition of the body, e.g. the composition of its sensitive layer
- G01N27/127—Composition of the body, e.g. the composition of its sensitive layer comprising nanoparticles
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Nanotechnology (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Molecular Biology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
Description
Claims (7)
- 나노입자가 저항성 기판상에 퇴적되어, 1% 미만의 수소를 감지할 수 있고; 나노입자가 연속 저항성 층에 고립된 섬처럼 퇴적된, 팔라듐 또는 팔라듐 합금 나노입자를 기재로 한 수소 감지 장치.
- 제 1 항에 있어서, 나노입자가, 공기 내 수소 또는 오일 내 용해된 수소에 노출시, 크기가 증가하고, 센서의 저항을 변경시키는 것을 특징으로 하는 장치.
- 제 1 항에 있어서, 공기 내 수소를 감지하는 것을 특징으로 하는 장치.
- 제 1 항에 있어서, 주어진 수소 농도에서의 팔라듐 상 전이 온도보다 더 높은 온도에서, 수소 존재하에 나노입자가 팽창하는 것을 특징으로 하는 장치.
- 제 1 항에 있어서, 오일 내 수소를 감지하는 것을 특징으로 하는 장치.
- 제 1 항에 있어서, 나노입자가 주어진 수소 농도에서의 팔라듐 상 전이 온도보다 더 높은 온도 조작시, 빠른 응답 시간을 얻기 위하여, 팔라듐 합금을 포함하는 것을 특징으로 하는 장치.
- 제 1 항에 있어서, 나노입자가 간격이 있는 줄무늬 모양으로 퇴적되는 것을 특징으로 하는 장치.
Applications Claiming Priority (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US70529405P | 2005-08-03 | 2005-08-03 | |
| US60/705,294 | 2005-08-03 | ||
| US72835305P | 2005-10-19 | 2005-10-19 | |
| US60/728,353 | 2005-10-19 | ||
| US72898005P | 2005-10-21 | 2005-10-21 | |
| US60/728,980 | 2005-10-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20080036627A true KR20080036627A (ko) | 2008-04-28 |
Family
ID=37727896
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020087005320A Ceased KR20080036627A (ko) | 2005-08-03 | 2006-08-03 | 연속 범위의 수소 센서 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20100005853A1 (ko) |
| EP (1) | EP1910819A4 (ko) |
| KR (1) | KR20080036627A (ko) |
| CA (1) | CA2615107A1 (ko) |
| TW (1) | TW200712486A (ko) |
| WO (1) | WO2007019244A2 (ko) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7287412B2 (en) | 2003-06-03 | 2007-10-30 | Nano-Proprietary, Inc. | Method and apparatus for sensing hydrogen gas |
| CN101482528B (zh) * | 2009-01-23 | 2013-01-02 | 南京大学 | 一种可集成的密集纳米颗粒单层膜氢气传感器的制备方法 |
| US8839659B2 (en) * | 2010-10-08 | 2014-09-23 | Board Of Trustees Of Northern Illinois University | Sensors and devices containing ultra-small nanowire arrays |
| US20140379299A1 (en) * | 2012-01-18 | 2014-12-25 | Jawaharlal Nehru Centre For Advanced Scientific Research | System and a method to detect hydrogen leakage using nano-crystallized palladium gratings |
| US9618465B2 (en) * | 2013-05-01 | 2017-04-11 | Board Of Trustees Of Northern Illinois University | Hydrogen sensor |
| CN106645531B (zh) * | 2016-12-21 | 2018-09-21 | 国网河北省电力公司电力科学研究院 | 一种变压器油中溶解气体检测数据的修正方法 |
| DE102018107516B4 (de) * | 2018-03-28 | 2024-07-11 | Trafag Ag | Sensorschichtsystemvorläufer, daraus herstellbares Sensorschichtsystem sowie dieses verwendendes Wasserstoffsensorelement und entsprechende Herstellverfahren |
| CN111855756B (zh) * | 2019-04-28 | 2023-11-21 | 中国科学院上海微系统与信息技术研究所 | 一种基于Pd-Ag合金纳米晶的氢气传感器及其制备方法 |
| CN110346239B (zh) * | 2019-07-10 | 2022-02-11 | 国家纳米科学中心 | 一种纳米材料密度的检测方法 |
| CN113155904B (zh) * | 2021-02-02 | 2023-06-20 | 浙江工业大学 | 一种用于空气环境中的高灵敏氢气传感器及其制备方法 |
| EP4671751A1 (en) * | 2023-02-24 | 2025-12-31 | Japan Science and Technology Agency | GAS HYDROGEN COLLECTOR AND ITS PRODUCTION PROCESS |
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-
2006
- 2006-08-03 EP EP06789328A patent/EP1910819A4/en not_active Withdrawn
- 2006-08-03 TW TW095128532A patent/TW200712486A/zh unknown
- 2006-08-03 CA CA002615107A patent/CA2615107A1/en not_active Abandoned
- 2006-08-03 KR KR1020087005320A patent/KR20080036627A/ko not_active Ceased
- 2006-08-03 WO PCT/US2006/030314 patent/WO2007019244A2/en not_active Ceased
- 2006-08-03 US US11/995,263 patent/US20100005853A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| CA2615107A1 (en) | 2007-02-15 |
| WO2007019244A2 (en) | 2007-02-15 |
| WO2007019244A3 (en) | 2008-11-13 |
| US20100005853A1 (en) | 2010-01-14 |
| TW200712486A (en) | 2007-04-01 |
| EP1910819A2 (en) | 2008-04-16 |
| EP1910819A4 (en) | 2011-03-16 |
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