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KR20010013495A - 냉각시스템에 갇힌 가스를 광 검출하기 위한 냉각시스템용광 누설검출기 - Google Patents

냉각시스템에 갇힌 가스를 광 검출하기 위한 냉각시스템용광 누설검출기 Download PDF

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Publication number
KR20010013495A
KR20010013495A KR1019997011501A KR19997011501A KR20010013495A KR 20010013495 A KR20010013495 A KR 20010013495A KR 1019997011501 A KR1019997011501 A KR 1019997011501A KR 19997011501 A KR19997011501 A KR 19997011501A KR 20010013495 A KR20010013495 A KR 20010013495A
Authority
KR
South Korea
Prior art keywords
photodetector
light source
light
probe
electronic signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
KR1019997011501A
Other languages
English (en)
Korean (ko)
Inventor
스티븐알.그린
Original Assignee
홀 케네스 알.
텍사코 디벨롭프먼트 코퍼레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 홀 케네스 알., 텍사코 디벨롭프먼트 코퍼레이션 filed Critical 홀 케네스 알.
Publication of KR20010013495A publication Critical patent/KR20010013495A/ko
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00Investigating fluid-tightness of structures
    • G01M3/38Investigating fluid-tightness of structures by using light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
KR1019997011501A 1997-06-06 1998-06-05 냉각시스템에 갇힌 가스를 광 검출하기 위한 냉각시스템용광 누설검출기 Abandoned KR20010013495A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US4879997P 1997-06-06 1997-06-06
US60/048,799 1997-06-06

Publications (1)

Publication Number Publication Date
KR20010013495A true KR20010013495A (ko) 2001-02-26

Family

ID=21956507

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019997011501A Abandoned KR20010013495A (ko) 1997-06-06 1998-06-05 냉각시스템에 갇힌 가스를 광 검출하기 위한 냉각시스템용광 누설검출기

Country Status (8)

Country Link
EP (1) EP0990132A4 (fr)
JP (1) JP2002505003A (fr)
KR (1) KR20010013495A (fr)
CN (1) CN1264469A (fr)
AU (1) AU741819B2 (fr)
CA (1) CA2292561A1 (fr)
PL (1) PL337214A1 (fr)
WO (1) WO1998055849A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2847670B1 (fr) * 2002-11-26 2005-06-10 Sc2N Sa Detecteur par voie optique de la presence de bulles de gaz dans un liquide
CN102128771A (zh) * 2010-12-20 2011-07-20 中国石油大学(北京) 高温气溶胶检测导管
CN102141499A (zh) * 2010-12-20 2011-08-03 中国石油大学(北京) 高压气溶胶检测导管
CN102539091A (zh) * 2011-12-21 2012-07-04 合肥工业大学 一种用于袋式除尘器的滤袋破损检测装置
CN105424331B (zh) * 2014-09-18 2019-07-05 中国石油化工股份有限公司 用于大型压裂时水泥环的机械密封性评价的装置和方法
CN106197896B (zh) * 2016-08-10 2018-11-23 怡维怡橡胶研究院有限公司 一种轮胎内胎或内衬层气密性测定装置及气密性测定方法
TWI833170B (zh) * 2022-03-01 2024-02-21 緯創資通股份有限公司 用於檢測液冷系統之殘留氣泡的檢測系統與暫態壓力響應檢測方法以及使用其之流量控制裝置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3935876A (en) * 1974-11-15 1976-02-03 Renal Systems, Inc. Air leak detector
JPS56112626A (en) * 1980-02-11 1981-09-05 Toshiba Corp Detecting device for leakage of fluid in nuclear power plant
JPS5755769A (en) * 1980-09-18 1982-04-02 Toshiba Corp Detector for leakage of water from water-cooled type thyristor valve
JPS5875041A (ja) * 1981-10-30 1983-05-06 Showa Electric Wire & Cable Co Ltd 漏水検知方法
US5263361A (en) * 1988-08-22 1993-11-23 Gates Donald C Apparatus for leak testing a fluid containing chamber utilizing a laser beam
JPH0311955A (ja) * 1989-06-06 1991-01-21 Toshiba Corp 冷却装置
US5241368A (en) * 1991-01-07 1993-08-31 Custom Sample Systems, Inc. Fiber-optic probe for absorbance and turbidity measurement
JPH0989422A (ja) * 1995-09-21 1997-04-04 Hitachi Bill Shisetsu Eng Kk 密閉循環系内に封入されている液体の漏出監視方法及び同装置
JPH1048064A (ja) * 1996-08-08 1998-02-20 Mitsubishi Electric Corp 水冷式電気機器の温度センサ

Also Published As

Publication number Publication date
AU8061298A (en) 1998-12-21
AU741819B2 (en) 2001-12-13
EP0990132A1 (fr) 2000-04-05
EP0990132A4 (fr) 2000-07-26
WO1998055849A1 (fr) 1998-12-10
CA2292561A1 (fr) 1998-12-10
PL337214A1 (en) 2000-08-14
CN1264469A (zh) 2000-08-23
JP2002505003A (ja) 2002-02-12

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 19991206

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20030318

Comment text: Request for Examination of Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20050930

Patent event code: PE09021S01D

PC1902 Submission of document of abandonment before decision of registration
SUBM Surrender of laid-open application requested