KR19980036973A - 마이크로파를 이용한 다결정 박막의 제조방법 - Google Patents
마이크로파를 이용한 다결정 박막의 제조방법 Download PDFInfo
- Publication number
- KR19980036973A KR19980036973A KR1019960055647A KR19960055647A KR19980036973A KR 19980036973 A KR19980036973 A KR 19980036973A KR 1019960055647 A KR1019960055647 A KR 1019960055647A KR 19960055647 A KR19960055647 A KR 19960055647A KR 19980036973 A KR19980036973 A KR 19980036973A
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- KR
- South Korea
- Prior art keywords
- thin film
- microwave
- amorphous
- polycrystalline thin
- polycrystalline
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/56—After-treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02373—Group 14 semiconducting materials
- H01L21/02381—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02422—Non-crystalline insulating materials, e.g. glass, polymers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02488—Insulating materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02667—Crystallisation or recrystallisation of non-monocrystalline semiconductor materials, e.g. regrowth
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Recrystallisation Techniques (AREA)
Abstract
Description
Claims (7)
- 기판을 세척하고 증착 장비에 장입하여 예열하는 공정 ;상기 기판에 비정질 또는 미세결정질 박막을 증착하는 공정 ; 및,증착된 박막을 마이크로파로 열처리하여 결정화함으로써 다결정 박막을 형성하는 공정으로 구성된 마이크로파를 이용한 다결정 박막의 제조방법.
- 제 1 항에 있어서,기판에 비정질 또는 미세결정질 박막을 증착하는 공정 다음에 박막의 전기적 특성이나 결정상태를 변화시키기 위한 공정이 추가로 포함되는 마이크로파를 이용한 다결정 박막의 제조방법.
- 제 2 항에 있어서,상기 박막의 전기적 특성이나 결정상태를 변화시키는 공정은 증착된 비정질 또는 미세결정질 박막에 불순물을 이식하는 공정인 마이크로파를 이용한 다결정 박막의 제조방법.
- 제 2 항에 있어서,상기 박막의 전기적 특성이나 결정상태를 변화시키는 공정은 증착된 비정질 또는 미세결정질 박막에 금속을 흡착하는 공정인 마이크로파를 이용한 다결정 박막의 제조방법.
- 제 2 항에 있어서,상기 박막의 전기적 특성이나 결정상태를 변화시키는 공정은 증착된 비정질 또는 미세결정질 박막에 불순물을 이식하고 금속을 흡착하는 공정인 마이크로파를 이용한 다결정 박막의 제조방법.
- 제 1 항에 있어서,상기 다결정 박막을 형성하는 공정에서의 마이크로파 열처리 온도는 400~600℃인 마이크로파를 이용한 다결정 박막의 제조방법.
- 제 1 항에 있어서,상기 다결정 박막을 형성하는 공정에서의 마이크로파 열처리 시간은 2~5시간인 마이크로파를 이용한 다결정 박막의 제조방법.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960055647A KR100297498B1 (ko) | 1996-11-20 | 1996-11-20 | 마이크로파를이용한다결정박막의제조방법 |
| US09/639,212 US6528361B1 (en) | 1996-11-20 | 2000-08-14 | Process for preparing a polycrystalline silicon thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019960055647A KR100297498B1 (ko) | 1996-11-20 | 1996-11-20 | 마이크로파를이용한다결정박막의제조방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR19980036973A true KR19980036973A (ko) | 1998-08-05 |
| KR100297498B1 KR100297498B1 (ko) | 2001-10-24 |
Family
ID=37528181
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960055647A Expired - Fee Related KR100297498B1 (ko) | 1996-11-20 | 1996-11-20 | 마이크로파를이용한다결정박막의제조방법 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6528361B1 (ko) |
| KR (1) | KR100297498B1 (ko) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100365327B1 (ko) * | 1998-10-22 | 2003-03-15 | 엘지.필립스 엘시디 주식회사 | 전계와플라즈마를이용한비정질막의결정화장비 |
| KR100482653B1 (ko) * | 2002-06-03 | 2005-04-13 | 한국화학연구원 | 마이크로파를 이용한 나노조립된 무기소재 박막의제조방법 |
| KR100480367B1 (ko) * | 1997-07-15 | 2005-07-18 | 엘지.필립스 엘시디 주식회사 | 비정질막을결정화하는방법 |
| KR101222283B1 (ko) * | 2008-09-11 | 2013-01-15 | 마이크론 테크놀로지, 인크. | 반도체 구조들의 형성 중에 마이크로파 방사선을 사용하는 방법 |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003031806A (ja) * | 2001-05-09 | 2003-01-31 | Hitachi Ltd | Mosトランジスタ及びその製造方法 |
| TWI382470B (zh) * | 2006-05-31 | 2013-01-11 | Corning Inc | 使用輻射退火製造半導體在絕緣體上結構 |
| US7579654B2 (en) * | 2006-05-31 | 2009-08-25 | Corning Incorporated | Semiconductor on insulator structure made using radiation annealing |
| TWI384556B (zh) * | 2008-11-12 | 2013-02-01 | Nat Applied Res Laboratoires | Microwave activation annealing process |
| JP5433462B2 (ja) * | 2010-03-03 | 2014-03-05 | 株式会社東芝 | 半導体装置の製造方法 |
| US20160284913A1 (en) * | 2015-03-27 | 2016-09-29 | Staffan WESTERBERG | Solar cell emitter region fabrication using substrate-level ion implantation |
| CN110117703A (zh) * | 2019-05-29 | 2019-08-13 | 上海应用技术大学 | 一种Finemet非晶合金的微波晶化退火工艺 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4303455A (en) * | 1980-03-14 | 1981-12-01 | Rockwell International Corporation | Low temperature microwave annealing of semiconductor devices |
| FR2513659A1 (fr) * | 1981-09-29 | 1983-04-01 | Centre Nat Rech Scient | Procede de recuit superficiel par energie micro-onde pulsee de materiaux semi-conducteurs |
| US5179073A (en) | 1987-10-07 | 1993-01-12 | Semiconductor Energy Laboratory Co., Ltd. | Method of shaping superconducting oxide material |
| CN1095204C (zh) | 1993-03-12 | 2002-11-27 | 株式会社半导体能源研究所 | 半导体器件和晶体管 |
| TW369686B (en) * | 1993-07-27 | 1999-09-11 | Semiconductor Energy Lab Corp | Semiconductor device and process for fabricating the same |
| JP3562590B2 (ja) | 1993-12-01 | 2004-09-08 | 株式会社半導体エネルギー研究所 | 半導体装置作製方法 |
| JP2860869B2 (ja) | 1993-12-02 | 1999-02-24 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
| JP3621151B2 (ja) | 1994-06-02 | 2005-02-16 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| KR0175411B1 (ko) * | 1995-11-22 | 1999-02-01 | 김광호 | 버퍼층을 이용한 비정질 규소의 결정화 방법 |
| US6172322B1 (en) * | 1997-11-07 | 2001-01-09 | Applied Technology, Inc. | Annealing an amorphous film using microwave energy |
-
1996
- 1996-11-20 KR KR1019960055647A patent/KR100297498B1/ko not_active Expired - Fee Related
-
2000
- 2000-08-14 US US09/639,212 patent/US6528361B1/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100480367B1 (ko) * | 1997-07-15 | 2005-07-18 | 엘지.필립스 엘시디 주식회사 | 비정질막을결정화하는방법 |
| KR100365327B1 (ko) * | 1998-10-22 | 2003-03-15 | 엘지.필립스 엘시디 주식회사 | 전계와플라즈마를이용한비정질막의결정화장비 |
| KR100482653B1 (ko) * | 2002-06-03 | 2005-04-13 | 한국화학연구원 | 마이크로파를 이용한 나노조립된 무기소재 박막의제조방법 |
| KR101222283B1 (ko) * | 2008-09-11 | 2013-01-15 | 마이크론 테크놀로지, 인크. | 반도체 구조들의 형성 중에 마이크로파 방사선을 사용하는 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6528361B1 (en) | 2003-03-04 |
| KR100297498B1 (ko) | 2001-10-24 |
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