KR100835703B1 - 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막 - Google Patents
유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막 Download PDFInfo
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- KR100835703B1 KR100835703B1 KR1020060110929A KR20060110929A KR100835703B1 KR 100835703 B1 KR100835703 B1 KR 100835703B1 KR 1020060110929 A KR1020060110929 A KR 1020060110929A KR 20060110929 A KR20060110929 A KR 20060110929A KR 100835703 B1 KR100835703 B1 KR 100835703B1
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- thin film
- pores
- silicon thin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02203—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates the layer being porous
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- H—ELECTRICITY
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02123—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon
- H01L21/02164—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing silicon the material being a silicon oxide, e.g. SiO2
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- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
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Abstract
Description
극반응성 이온 에칭법(DIRE 공정)을 수행하여 링 형상의 구멍을 상기 실리콘 웨이퍼의 두께보다 작은 깊이로 형성한 후 상단의 포토레지스트를 제거하는 단계
상기 실리콘 웨이퍼 바닥면에 포토레지스트를 바르고, 구멍이 그려진 포토마스크를 통해 빛을 투영시키면 구멍형상의 패턴을 가진 포토레지스트를 상기 실리콘 웨이퍼 바닥면에 형성하는 단계;
극반응성 이온 에칭법(DIRE 공정)을 수행하여 상기 실리콘 웨이퍼를 관통하는 다수의 기공들을 형성하는 단계;
상기 실리콘 웨이퍼 바닥면의 포토레지스트를 제거하는 단계;
실리콘 웨이퍼 상면에 열변형 부재를 코팅하는 단계;
상기 코팅된 열변형 부재를 노광과정을 통하여 상기 기공들 주위에 링 형상의 열변형 구조체만을 남기고 제거하는 단계로 구성된다.
Claims (15)
- 다수의 기공들을 포함하는 다공질 박막에 있어서,상기 다수의 기공들 중 기체를 통과시키는 기공에는 소수성 물질이 코팅되어 있고,상기 다수의 기공들 중 물을 통과시키는 기공에는 친수성 물질이 코팅되어 있으며,상기 다수의 기공들 주위에는 열변형 구조체들이 설치되어 있는 것을 특징으로 하는 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막.
- 제 1 항에 있어서,상기 열변형 구조체들은 상기 다수의 기공들의 입구 표면으로부터 50 마이크론 깊이까지 설치되는 것을 특징으로 하는 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막.
- 제 1 항에 있어서,상기 다공질 박막은 실리콘 재질임을 특징으로 하는 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막.
- 제 3 항에 있어서,상기 실리콘 재질은 단결정실리콘, 다결정실리콘 또는 에피실리콘 중의 하나임을 특징으로 하는 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막.
- 제 3 항에 있어서,상기 친수성 물질은 SiO2임을 특징으로 하는 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막.
- 제 1 항에 있어서,상기 열변형 구조체들은 SU-8, PDMS 또는 PMMA 중 하나를 포함하는 것을 특징으로 하는 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막.
- 제 1 항에 있어서,상기 소수성 물질은 실란(Silane)임을 특징으로 하는 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막.
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020060110929A KR100835703B1 (ko) | 2006-11-10 | 2006-11-10 | 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020060110929A KR100835703B1 (ko) | 2006-11-10 | 2006-11-10 | 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020080002486A Division KR100864072B1 (ko) | 2008-01-09 | 2008-01-09 | 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘박막의 제조 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20080042455A KR20080042455A (ko) | 2008-05-15 |
| KR100835703B1 true KR100835703B1 (ko) | 2008-06-05 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020060110929A Expired - Fee Related KR100835703B1 (ko) | 2006-11-10 | 2006-11-10 | 유체의 이동을 온도에 의해 조절할 수 있는 다공질 실리콘 박막 |
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| Country | Link |
|---|---|
| KR (1) | KR100835703B1 (ko) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0689891A (ja) * | 1992-09-08 | 1994-03-29 | Fujitsu Ltd | 多孔質シリコン層の加工方法 |
| JP2001270784A (ja) | 2000-03-28 | 2001-10-02 | Seiko Epson Corp | 多孔質膜形成方法及び多孔質膜形成装置並びに微小球体形成方法及び微小球体形成装置 |
| JP2002105205A (ja) | 2000-09-29 | 2002-04-10 | Mitsubishi Materials Corp | 有機ケイ素化合物からなる多孔質膜及びその製造方法 |
| KR20050004886A (ko) * | 2002-05-30 | 2005-01-12 | 가부시끼가이샤 한도따이 센단 테크놀로지스 | 무기 다공질막의 형성 방법 |
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2006
- 2006-11-10 KR KR1020060110929A patent/KR100835703B1/ko not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0689891A (ja) * | 1992-09-08 | 1994-03-29 | Fujitsu Ltd | 多孔質シリコン層の加工方法 |
| JP2001270784A (ja) | 2000-03-28 | 2001-10-02 | Seiko Epson Corp | 多孔質膜形成方法及び多孔質膜形成装置並びに微小球体形成方法及び微小球体形成装置 |
| JP2002105205A (ja) | 2000-09-29 | 2002-04-10 | Mitsubishi Materials Corp | 有機ケイ素化合物からなる多孔質膜及びその製造方法 |
| KR20050004886A (ko) * | 2002-05-30 | 2005-01-12 | 가부시끼가이샤 한도따이 센단 테크놀로지스 | 무기 다공질막의 형성 방법 |
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| Publication number | Publication date |
|---|---|
| KR20080042455A (ko) | 2008-05-15 |
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