KR100823405B1 - 노광장치 및 디바이스 제조 방법 - Google Patents
노광장치 및 디바이스 제조 방법 Download PDFInfo
- Publication number
- KR100823405B1 KR100823405B1 KR1020070022306A KR20070022306A KR100823405B1 KR 100823405 B1 KR100823405 B1 KR 100823405B1 KR 1020070022306 A KR1020070022306 A KR 1020070022306A KR 20070022306 A KR20070022306 A KR 20070022306A KR 100823405 B1 KR100823405 B1 KR 100823405B1
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- KR
- South Korea
- Prior art keywords
- light
- optical system
- exposure apparatus
- optical element
- distribution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70158—Diffractive optical elements
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70066—Size and form of the illuminated area in the mask plane, e.g. reticle masking blades or blinds
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
- G03F7/70108—Off-axis setting using a light-guiding element, e.g. diffractive optical elements [DOEs] or light guides
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
Claims (10)
- 광원으로부터의 광을 이용해서 피조명면 위의 레티클을 조명하도록 구성된 조명광학계를 구비하고, 상기 레티클의 패턴을 기판에 노광하는 노광장치에 있어서,상기 조명광학계는 각도 분포를 갖지 않는 광이 입사했을 경우에 상기 피조명면과 퓨리에 변환 관계를 지니는 면에 복수의 휘점을 이산적으로 형성하도록 구성된 계산기 홀로그램(Computer-Generated Hologram); 및상기 계산기 홀로그램에 각도 분포를 갖는 광을 도입하도록 구성된 광학 소자를 포함하는 것을 특징으로 하는 노광장치.
- 제 1항에 있어서, 상기 광학 소자가 상기 계산기 홀로그램에 상기 각도 분포를 갖는 광을 도입할 경우, 상기 피조명면과 퓨리에 변환 관계를 지니는 면에서의 광강도 분포가 균일하게 되는 것을 특징으로 하는 노광장치.
- 제 1항에 있어서, 상기 조명광학계는 상기 계산기 홀로그램으로부터의 광을 집광하도록 구성된 집광광학계를 더 포함하고,상기 집광광학계는 가변 초점거리를 지니는 것을 특징으로 하는 노광장치.
- 제 1항에 있어서, 상기 조명광학계는 상기 계산기 홀로그램으로부터의 광을 집광하도록 구성된 집광광학계를 더 포함하고,상기 복수의 휘점의 최소 간격을 d, 상기 계산기 홀로그램에 입사하는 광의 발산 각도를 γ, 상기 집광광학계의 초점거리를 f라 할 때, d = 2 × f × tanγ를 만족하는 것을 특징으로 하는 노광장치.
- 제 1항에 있어서, 상기 조명광학계는 상기 계산기 홀로그램에 입사하는 광의, 상기 조명광학계의 광축에 수직인 면에 대한 단면 형상을 변경하도록 구성되는 변경 수단을 더 포함하는 것을 특징으로 하는 노광장치.
- 제 5항에 있어서, 상기 단면 형상은 원형상, 직사각형 형상 및 육각형 형상 중 하나인 것을 특징으로 하는 노광장치.
- 제 1항에 있어서, 상기 조명광학계는 상기 계산기 홀로그램에 입사하는 광의 발산 각도를 조정하도록 구성된 조정 수단을 더 포함하는 것을 특징으로 하는 노광장치.
- 제 2항에 있어서, 상기 광강도 분포는 다중극 분포를 지니는 것을 특징으로 하는 노광장치.
- 제 2항에 있어서, 상기 광강도 분포는 2개의 인접한 휘점에 대응하는 2개의 인접한 광강도 분포를 연결하는 연속 분포인 것을 특징으로 하는 노광장치.
- 노광장치를 이용해서 기판을 노광하는 공정; 및노광된 상기 기판을 현상하는 공정을 포함하고,상기 노광장치는 광원으로부터의 광을 이용해서 피조명면 위의 레티클을 조명하도록 구성된 조명광학계를 포함하고,상기 조명광학계는 각도 분포를 갖지 않는 광이 계산기 홀로그램에 입사했을 경우에 상기 피조명면과 퓨리에 변환 관계를 지니는 면에 복수의 휘점을 이산적으로 형성하도록 구성된 계산기 홀로그램; 및상기 계산기 홀로그램에 각도 분포를 갖는 광을 도입하도록 구성된 광학 소자를 포함하는 것을 특징으로 하는 디바이스 제조 방법.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2006-00060913 | 2006-03-07 | ||
| JP2006060913A JP2007242775A (ja) | 2006-03-07 | 2006-03-07 | 露光装置及びデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20070092144A KR20070092144A (ko) | 2007-09-12 |
| KR100823405B1 true KR100823405B1 (ko) | 2008-04-18 |
Family
ID=38478565
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020070022306A Expired - Fee Related KR100823405B1 (ko) | 2006-03-07 | 2007-03-07 | 노광장치 및 디바이스 제조 방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20070211231A1 (ko) |
| JP (1) | JP2007242775A (ko) |
| KR (1) | KR100823405B1 (ko) |
| TW (1) | TW200804959A (ko) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102009025362A1 (de) | 2008-08-01 | 2010-02-04 | Carl Zeiss Smt Ag | Variabel einstellbare Streuscheibe für Projektionsbelichtungsanlage |
| DE102008041179B4 (de) * | 2008-08-12 | 2010-11-04 | Carl Zeiss Smt Ag | Beleuchtungsoptik für eine Mikrolithografie-Projektionsbelichtungsanlage |
| NL1036877A (en) * | 2008-08-18 | 2010-03-09 | Asml Netherlands Bv | Diffractive optical element, lithographic apparatus and semiconductor device manufacturing method. |
| DE102009037646A1 (de) | 2008-10-02 | 2010-08-05 | Carl Zeiss Smt Ag | System und Verfahren zur Beleuchtung eines Retikels in einer Mikrolithographie-Projektionsbelichtungsanlage |
| EP2202580B1 (en) * | 2008-12-23 | 2011-06-22 | Carl Zeiss SMT GmbH | Illumination system of a microlithographic projection exposure apparatus |
| US9760012B2 (en) * | 2011-08-04 | 2017-09-12 | Nikon Corporation | Illumination device |
| US9529268B2 (en) * | 2014-04-03 | 2016-12-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Systems and methods for improving pattern transfer |
| JP7508278B2 (ja) * | 2020-06-04 | 2024-07-01 | キヤノン株式会社 | 露光装置、露光方法、及び物品の製造方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR19980065731A (ko) * | 1997-01-14 | 1998-10-15 | 김광호 | 반도체장치의 제조공정에 사용하는 노광장치 |
| KR20040111530A (ko) * | 2002-04-17 | 2004-12-31 | 캐논 가부시끼가이샤 | 레티클 및 광학특성 계측방법 |
| KR20050028793A (ko) * | 2003-09-17 | 2005-03-23 | 캐논 가부시끼가이샤 | 조명광학계 및 노광장치 |
| KR20060014389A (ko) * | 2003-05-07 | 2006-02-15 | 히다치 가세고교 가부시끼가이샤 | 홀로그램 광학소자 및 그것을 이용한 면광원장치 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7656504B1 (en) * | 1990-08-21 | 2010-02-02 | Nikon Corporation | Projection exposure apparatus with luminous flux distribution |
| US6563567B1 (en) * | 1998-12-17 | 2003-05-13 | Nikon Corporation | Method and apparatus for illuminating a surface using a projection imaging apparatus |
| TW587199B (en) * | 1999-09-29 | 2004-05-11 | Asml Netherlands Bv | Lithographic method and apparatus |
| JP3919419B2 (ja) * | 2000-03-30 | 2007-05-23 | キヤノン株式会社 | 照明装置及びそれを有する露光装置 |
| JP4545874B2 (ja) * | 2000-04-03 | 2010-09-15 | キヤノン株式会社 | 照明光学系、および該照明光学系を備えた露光装置と該露光装置によるデバイスの製造方法 |
| JP3413160B2 (ja) * | 2000-06-15 | 2003-06-03 | キヤノン株式会社 | 照明装置及びそれを用いた走査型露光装置 |
-
2006
- 2006-03-07 JP JP2006060913A patent/JP2007242775A/ja active Pending
-
2007
- 2007-03-07 TW TW096107853A patent/TW200804959A/zh unknown
- 2007-03-07 US US11/683,035 patent/US20070211231A1/en not_active Abandoned
- 2007-03-07 KR KR1020070022306A patent/KR100823405B1/ko not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR19980065731A (ko) * | 1997-01-14 | 1998-10-15 | 김광호 | 반도체장치의 제조공정에 사용하는 노광장치 |
| KR20040111530A (ko) * | 2002-04-17 | 2004-12-31 | 캐논 가부시끼가이샤 | 레티클 및 광학특성 계측방법 |
| KR20060014389A (ko) * | 2003-05-07 | 2006-02-15 | 히다치 가세고교 가부시끼가이샤 | 홀로그램 광학소자 및 그것을 이용한 면광원장치 |
| KR20050028793A (ko) * | 2003-09-17 | 2005-03-23 | 캐논 가부시끼가이샤 | 조명광학계 및 노광장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20070092144A (ko) | 2007-09-12 |
| TW200804959A (en) | 2008-01-16 |
| JP2007242775A (ja) | 2007-09-20 |
| US20070211231A1 (en) | 2007-09-13 |
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