KR100366298B1 - 극초단펄스 스펙트럼 분석방법 - Google Patents
극초단펄스 스펙트럼 분석방법 Download PDFInfo
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- KR100366298B1 KR100366298B1 KR1020000003870A KR20000003870A KR100366298B1 KR 100366298 B1 KR100366298 B1 KR 100366298B1 KR 1020000003870 A KR1020000003870 A KR 1020000003870A KR 20000003870 A KR20000003870 A KR 20000003870A KR 100366298 B1 KR100366298 B1 KR 100366298B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
Description
Claims (4)
- 펄스 프로파일 측정기에서 극초단펄스 스펙트럼을 분석하는 방법에 있어서,순환적으로 수정된 부분응답시스템 모델에 근거한 순환적 알고리즘을 사용하여 고차원 펄스를 유도하는 제 1 단계와;분석하고자 하는 극초단펄스가 입력되면, 상기 고차원 펄스의 형태가 상기 극초단펄스의 형태와 근사되도록 상기 고차원 펄스의 차수를 조절하고, 상기 고차원 펄스의 중앙전폭이 상기 극초단펄스의 중앙전폭과 근사되도록 상기 고차원 펄스의 탭계수를 조절하는 제 2 단계; 및상기 조절된 고차원 펄스의 차수와 탭계수를 이용하여 상기 극초단펄스의 스펙트럼과 전송특성을 분석하는 제 3 단계를 포함하는 것을 특징으로 하는 극초단펄스 스펙트럼 분석방법.
- 제 1 항에 있어서, 상기 고차원 펄스는 아래의 수식 1과 같이 표현되며, 스펙트럼은 아래의 수식 2와 같이 구하는 것을 특징으로 하는 극초단펄스 스펙트럼 분석방법.[수식 1][수식 2]여기서,, N은 임의의 유한 상수, t는 시간 변수, A는 펄스의 크기, n은 고차원 펄스의 차수, τ는 1차 펄스 폭, Cr은 시간 파형(time waveform), 그리고 T0은 기본 주기임.
- 제 2 항에 있어서, 상기 계수t n ,b n,i ,d n,i 는 찾아보기 표(룩업테이블)에 저장되는 것을 특징으로 하는 극초단펄스 스펙트럼 분석방법.
- 펄스 프로파일 측정기에,순환적으로 수정된 부분응답시스템 모델에 근거한 순환적 알고리즘을 사용하여 고차원 펄스를 유도하는 제 1 단계와;분석하고자 하는 극초단펄스가 입력되면, 상기 고차원 펄스의 형태가 상기 극초단펄스의 형태와 근사되도록 상기 고차원 펄스의 차수를 조절하고, 상기 고차원 펄스의 중앙전폭이 상기 극초단펄스의 중앙전폭과 근사되도록 상기 고차원 펄스의 탭계수를 조절하는 제 2 단계; 및상기 조절된 고차원 펄스의 차수와 탭계수를 이용하여 상기 극초단펄스의 스펙트럼과 전송특성을 분석하는 제 3 단계를 포함하는 극초단펄스 스펙트럼 분석방법을 실행시키기 위한 프로그램을 기록한 컴퓨터로 읽을 수 있는 기록매체.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020000003870A KR100366298B1 (ko) | 2000-01-27 | 2000-01-27 | 극초단펄스 스펙트럼 분석방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020000003870A KR100366298B1 (ko) | 2000-01-27 | 2000-01-27 | 극초단펄스 스펙트럼 분석방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010076619A KR20010076619A (ko) | 2001-08-16 |
| KR100366298B1 true KR100366298B1 (ko) | 2002-12-31 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020000003870A Expired - Fee Related KR100366298B1 (ko) | 2000-01-27 | 2000-01-27 | 극초단펄스 스펙트럼 분석방법 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR100366298B1 (ko) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01257274A (ja) * | 1988-04-06 | 1989-10-13 | Nec Corp | 周波数推定方式 |
| JPH0247561A (ja) * | 1988-07-05 | 1990-02-16 | Tektronix Inc | 周波数スペクトラムの分析方法 |
| JPH0886819A (ja) * | 1994-09-19 | 1996-04-02 | Fukuda Denshi Co Ltd | 周波数スペクトル解析処理装置及び方法 |
| WO1997000430A1 (de) * | 1995-06-19 | 1997-01-03 | Optikzentrum Nrw Gmbh (Oz) | Messvorrichtung für kurze und ultrakurze lichtimpulse |
| KR19990028308A (ko) * | 1995-06-21 | 1999-04-15 | 에르링 블롬메, 클라스노린 | 전력 스펙트럼밀도 추정방법 및 장치 |
| US5917315A (en) * | 1995-01-19 | 1999-06-29 | Nokia Telecommunications Oy | Receiver for spectrum analysis |
-
2000
- 2000-01-27 KR KR1020000003870A patent/KR100366298B1/ko not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01257274A (ja) * | 1988-04-06 | 1989-10-13 | Nec Corp | 周波数推定方式 |
| JPH0247561A (ja) * | 1988-07-05 | 1990-02-16 | Tektronix Inc | 周波数スペクトラムの分析方法 |
| JPH0886819A (ja) * | 1994-09-19 | 1996-04-02 | Fukuda Denshi Co Ltd | 周波数スペクトル解析処理装置及び方法 |
| US5917315A (en) * | 1995-01-19 | 1999-06-29 | Nokia Telecommunications Oy | Receiver for spectrum analysis |
| WO1997000430A1 (de) * | 1995-06-19 | 1997-01-03 | Optikzentrum Nrw Gmbh (Oz) | Messvorrichtung für kurze und ultrakurze lichtimpulse |
| KR19990028308A (ko) * | 1995-06-21 | 1999-04-15 | 에르링 블롬메, 클라스노린 | 전력 스펙트럼밀도 추정방법 및 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20010076619A (ko) | 2001-08-16 |
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