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JPS57179611A - Configuration detecting device - Google Patents

Configuration detecting device

Info

Publication number
JPS57179611A
JPS57179611A JP6603881A JP6603881A JPS57179611A JP S57179611 A JPS57179611 A JP S57179611A JP 6603881 A JP6603881 A JP 6603881A JP 6603881 A JP6603881 A JP 6603881A JP S57179611 A JPS57179611 A JP S57179611A
Authority
JP
Japan
Prior art keywords
steel plate
memory
binary coding
configuration
characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6603881A
Other languages
Japanese (ja)
Other versions
JPH0121882B2 (en
Inventor
Toyoichi Saito
Shizuyoshi Sannomiya
Akio Hosooka
Kazuo Takashima
Minoru Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Nippon Steel Corp
Original Assignee
Mitsubishi Electric Corp
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp, Nippon Steel Corp filed Critical Mitsubishi Electric Corp
Priority to JP6603881A priority Critical patent/JPS57179611A/en
Priority to DE3215673A priority patent/DE3215673C2/en
Priority to US06/372,354 priority patent/US4481534A/en
Priority to KR8201891A priority patent/KR870000456B1/en
Priority to GB08212518A priority patent/GB2102119B/en
Publication of JPS57179611A publication Critical patent/JPS57179611A/en
Publication of JPH0121882B2 publication Critical patent/JPH0121882B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To detect the configuration without the effect of scattered light by dividing the processing area based on the characteristic of temperature distribution of a steel plate, obtaining a threshold value by the histogram processing for every part, and coding said value into the bibary values. CONSTITUTION:The outputs of the N number of photoelectric element groups 3 are obtained when a scanning circuit 13 scans and reads the field of sight in the width direction of the steel plate 1 every time the steel plate 1 advances for a specified distance in the direction of an arrow one by one. Said video signal is stored in a memory 11 through an amplifier 4 and a quantizing ciruit 10. The histogram is prepared by reading the video signal from the high temperature central part of the steel plate 1 out of the memory 11. With the signal level indicating the boundary with the scattered part as the threshold level, binary coding is performed in a binary coding circuit 12 and the result is stored in the memory 11 again. In the similar way, the binary coding and memorizing are performed for the parts which are divided in response to the characteristic of the temperature distribution in the width direction. Thus the configuration which is not affected by the disturbance is detected by a width measuring circuit 6.
JP6603881A 1981-04-29 1981-04-29 Configuration detecting device Granted JPS57179611A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP6603881A JPS57179611A (en) 1981-04-29 1981-04-29 Configuration detecting device
DE3215673A DE3215673C2 (en) 1981-04-29 1982-04-27 Scanning device for determining the configuration of rolled material
US06/372,354 US4481534A (en) 1981-04-29 1982-04-27 Configuration detecting device
KR8201891A KR870000456B1 (en) 1981-04-29 1982-04-29 Shape detection device
GB08212518A GB2102119B (en) 1981-04-29 1982-04-29 Configuration detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6603881A JPS57179611A (en) 1981-04-29 1981-04-29 Configuration detecting device

Publications (2)

Publication Number Publication Date
JPS57179611A true JPS57179611A (en) 1982-11-05
JPH0121882B2 JPH0121882B2 (en) 1989-04-24

Family

ID=13304306

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6603881A Granted JPS57179611A (en) 1981-04-29 1981-04-29 Configuration detecting device

Country Status (1)

Country Link
JP (1) JPS57179611A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6114508A (en) * 1984-06-30 1986-01-22 Nippon Kokan Kk <Nkk> Shape measuring instrument
US5798925A (en) * 1995-05-16 1998-08-25 L-S Electro-Galvanizing Company Method and apparatus for monitoring a moving strip

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6114508A (en) * 1984-06-30 1986-01-22 Nippon Kokan Kk <Nkk> Shape measuring instrument
US5798925A (en) * 1995-05-16 1998-08-25 L-S Electro-Galvanizing Company Method and apparatus for monitoring a moving strip

Also Published As

Publication number Publication date
JPH0121882B2 (en) 1989-04-24

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