JPH065208B2 - Continuous hardness measurement device for many sample pieces - Google Patents

Description

Description: TECHNICAL FIELD The present invention relates to a hardness measuring device, and more particularly to a hardness measuring device for automatically and continuously measuring a large number of sample pieces held by a common holding device. .

<Prior Art> Rockwell, Brinell, and Vickers hardness meters are widely used as hardness measuring instruments for metallic materials. In any of these cases, the sample is placed on the sample table, an indenter of a specified shape is pressed into the sample surface with a specified load, the depth of the indentation or the size of the indentation is measured, and this is converted into some conversion value. It is represented by.

In the hardness measurement work, in each case of Rockwell, Brinell, and Vickers, one sample is placed on the sample table and the table is raised to bring the surface to be inspected close to the indenter.
Alternatively, the indenter is brought into contact with a constant preliminary pressure, a predetermined load is applied to the indenter, the indentation depth of the indenter is measured and recorded, and then the table is lowered and replaced with the next sample. . In many hardness meters, this measurement operation is entirely automated except for the operation of mounting or replacing the sample on the table.

<Problems to be Solved by the Invention> Since these hardness meters rely on human power to replace the samples, when a large number of samples are to be measured one after another, an operator must replace the samples on a case-by-case basis. Therefore, the contribution to labor saving was small. Moreover, when the sample is a small piece such as a wire rod, the replacement work becomes more precise, and the efficiency is remarkably reduced.

Therefore, automation of the entire hardness measurement work including replacement of the sample has been desired.

<Means for Solving the Problem> The sample according to the present invention is in a state in which a large number of sample pieces are arranged in the X direction and held by the sample piece holding device.
As this sample piece holding device, a jig-shaped device that can hold each sample piece at a predetermined position may be used, but a large number of sample pieces molded in a plate shape with synthetic resin may be used. it can.

When the sample pieces are in the form of elongated rods, the sample pieces are held in parallel with each other by aligning the longitudinal direction thereof with the Y direction orthogonal to the X direction.

The sample table on which the sample piece holding device is placed has an X-direction moving device for moving it in the X direction and a Y-direction moving device for moving it in the Y direction. These moving devices are controlled by a control device described later. To be done. Beside the indenter for measuring hardness, a detector is attached to detect that the indenter faces the start end position and the end position of the sample piece when the sample piece holding device moves in the X direction. As this detecting device, an appropriate one such as optical or magnetic can be used, and its detection output is supplied to the control device described later. The hardness measuring means has a Z-direction moving device that lowers the indenter or raises the sample table in the Z direction orthogonal to both XY directions, similar to a normal automatic hardness measuring machine, and measures by its movement. It is configured to collect data.

The above-described control device includes an electronic computer, and causes the above-described units to operate in the following order.

(1) The X-direction moving device is controlled so that the sample piece holding device moves in the + X direction.

(2) When the starting end of the sample piece is detected by the detector, +
Start counting the amount of movement in the X direction.

(3) When the end position of the sample piece is detected by the detection device, the X-direction moving device is controlled so that the movement of the sample piece holding device is reversed from the + X direction to the -X direction.

(4) At the same time, stop counting the amount of movement in the + X direction.

(5) At the same time, start counting the amount of movement in the -X direction.

(6) When the count value in the −X direction is smaller than the count value in the + X direction and reaches a numerical value in a predetermined ratio with this,
The X-direction moving device is controlled so that the sample piece holding device stops.

(7) Operate the Z-direction moving device to perform hardness measurement operation.

(8) Repeat steps (1) to (7) above.

When the measurement is performed at the center of the sample piece, the above ratio is 1/2. In hardness measurement, it is common practice to measure the same sample at three different points and combine the measured values. In that case, the hardness measurement operation in (7) above may be subdivided as follows.

(7a) The Z-direction moving device is operated to perform the hardness measurement operation at the first point.

(7b) The Y-direction moving device is controlled so that the sample piece holding device moves in the Y direction by a certain amount.

(7c) The Z-direction moving device is operated to perform the hardness measurement operation at the second point.

(7d) The Y-direction moving device is controlled so that the sample piece holding device further moves in the same direction by the fixed amount.

(7e) The Z-direction moving device is operated to perform the hardness measurement operation at the third point.

(7f) The hardness of the sample is calculated by comprehensively calculating the results of hardness measurement at three points.

(7g) The moving direction of the sample piece holding device in the Y-direction moving device is reversed. (However, actual movement cannot be performed.) When the sample piece is a wire rod or a rod-shaped lateral piece, the measurement is often performed at three points, that is, the portion near the surface layer, the middle layer portion, and the central portion. In that case, the above (6) and (7) are as follows.

(6a) When the count value in the -X direction reaches, for example, 10% of the count value in the + X direction, the X-direction moving device is controlled so that the sample piece holding device stops.

(7a) The Z direction moving device is operated to perform the hardness measuring operation of the portion near the surface layer.

(6b) The movement of the sample piece holding device in the -X direction is restarted, and when the count value reaches, for example, 30% of the count value in the + X direction, the X direction moving device is controlled so that the sample piece holding device stops.

(7b) The Z-direction moving device is operated to perform the hardness measurement operation of the middle layer portion.

(6c) The movement of the sample piece holding device in the -X direction is restarted, and when the count value reaches 50% of the count value in the + X direction, the X direction moving device is controlled so that the sample piece holding device stops.

(7c) The z-direction moving device is operated to measure the hardness of the central portion.

<Operation> When the sample holder is placed on the sample table and the controller is started, the X-direction moving device starts to operate. Then, when the detection device detects the start end of the first sample piece, the movement amount count starts, and when the end is detected, the movement direction is +
The movement stops when the indenter is reversed from the X direction to the −X direction and the indenter returns to the predetermined position of the sample piece. Here, the hardness is measured. Then, the X-direction moving device is restarted, and the hardness of the second and subsequent sample pieces is measured by repeating the same operation as described above.

When the hardness is measured at three points on the same sample piece, the sample piece holding device is set to Y after the hardness measurement on the first point is completed.
It moves by a certain amount in the direction and then stops, where the hardness measurement at the second point is performed. After that, the sample piece holding device moves in the same direction by the same amount and stops, whereupon the hardness measurement at the third point is performed. When the hardness measurement at the three points is completed in this way, the total measurement value is calculated, and the moving direction in the Y-direction moving device is reversed in preparation for the measurement of the next sample piece. In this way, for example, the odd-numbered sample pieces undergo hardness measurement at three points by movement in the -Y direction, and the even-numbered sample pieces undergo hardness measurement at three points by movement in the + Y direction.

When hardness is measured at three points on a wire rod or rod-shaped cross section, the sample piece should have a diameter of, for example, 10 after the end is detected.
The measurement is performed by returning by%, the measurement at the portion close to the surface layer, then by the measurement, for example, by 20% of the diameter, at the middle portion, and further by 20% of the diameter, at the central portion.

<Example> In FIG. 1, 1 is a hardness measuring part, which has a U-shaped machine frame 2, an indenter 3 hangs downward from a machine frame upper part 2a, and a Z direction in a machine frame lower part 2b. A moving device, that is, a column 5 extending upward from the elevating device 4 supports a moving device 6 in the Y direction which is horizontal on the paper surface, and a moving device 7 in the X direction perpendicular to the paper surface is mounted on the Y direction moving device 6. A sample table 8 is placed on the X-direction moving device 7 facing the indenter 3 so as to face the indenter 3. Machine frame upper part 2a
Further, a light source 9 that illuminates the vicinity of the tip of the indenter 3 and a photodetector 10 that receives the reflected light near the tip of the indenter 3 are provided.

A sample holding device 11 as shown in FIGS. 2 and 3 is mounted on the sample table 8 at a predetermined position. The sample holding device 11 includes a large number of sample pieces 12a, 12b, ...
12n are lined up in parallel with each other in the X direction and are molded in a synthetic resin plate 13 and the surface is polished flat.

Reference numeral 14 denotes a control device including a computer 15, which controls the operations of the X-direction moving device 7, the Y-direction moving device 6 and the elevating device 4 while receiving the detection signal of the photo-detecting device 10, and detects the hardness detection signal. Accept and organize this.

The operation of the above apparatus will be described based on the flowchart shown in FIG.

First, in step 21, the details of the sample type, sample number, number of sample pieces, date of measurement, etc. are input to the computer 15, and at the same time, the sample holding device 11 holding the sample pieces is placed on the sample table 8. To do. After checking this preparatory operation in step 22, the measuring operation is started in step 23.

In step 24, as a result of the operation of the X-direction moving device 7 in response to the command from the control device 14, the photodetecting device 10 causes the sample holder 11
The upper part starts moving in the + X direction as indicated by an arrow 51 shown in FIGS. 3 and 5. After the start end 52 of the first sample piece 12a is detected in step 25, the movement in the + X direction continues as shown in step 26, but thereafter, the movement amount is counted as shown in step 27. In step 28, end 53 of sample piece 12a
Is detected, the count value N up to that time is stored,
Next, the moving direction of the X-direction moving device 7 is reversed to the -X direction. Therefore, the photodetector 10 begins to move backward on the sample holding device 11 as shown by the arrow 54, but the movement amount is counted during this time. When the movement amount in the −X direction reaches N / 2 in step 30, the X direction movement device 7 stops and the photodetection device 10 stops at the central point 55 of the sample piece 12a.

In step 31, the lifting device 4 operates to operate the sample holding device 11
Is pushed up, the position close to the point 55 of the sample piece 12a is pressed against the indenter 3 to measure the hardness, and the result is stored. When this operation is completed, the Y-direction moving device 6 is operated in step 33, and as shown by an arrow 56 in FIG. 5, the Y-direction moving device 6 is moved by a certain distance L in the −Y direction and reaches the point 57. Here, the hardness measurement in step 31 is performed again. After this hardness measurement,
In step 33 again, the fixed distance L is moved in the -Y direction indicated by the arrow 58 to reach the point 59, and the hardness measurement in step 31 is performed again.

In this way, when the hardness of the sample piece 12a is measured three times, the process proceeds from step 32 to step 34. In step 34, the moving direction of the Y-direction moving device 6 is reversed in preparation for the measurement of the next sample piece 12b, and the number of sample pieces measured in step 35 is counted.
Move to 37, where X direction movement amount N and -X direction movement amount N
/ 2 is reset, and the process returns to step 24 again.

In the following steps 24 to 30, in the direction of the arrow 60, the sample piece 12
After detecting the starting end 61 and the ending end 62 of b and moving in the direction of arrow 63, a point 64 is reached. In subsequent steps 31 to 33, the measurement is performed at the point 64, the second measurement is performed at the point 66 after the movement of the arrow 65, and the third measurement is performed at the point 68 after the movement of the arrow 67.

As described above, the sample pieces 12
a, 12b ... 12n are measured three times in sequence.

When the measurement of the last sample piece 12n is completed, step 3
The count value at 5 reaches the number of sample pieces n. Then, the process proceeds to step 38, and the measurement data of all sample pieces are printed out on one sheet. When it is necessary to record the measurement data on a floppy disk or the like, the registration processing is performed in step 40, and the measurement in step 41 ends.

According to the flow chart shown in FIG. 4, the zigzag measurement is performed at three points while sequentially traversing each sample piece, but if steps 31 to 34 are omitted, each sample piece moves in the X direction. Only by this, the measurement is performed point by point.

<Effects of the Invention> As described above, according to the present invention, the hardness can be automatically and sequentially measured for a large number of sample pieces supported by the sample piece holding device. Moreover, even if the sample pieces have uneven support positions or different widths, the measurement is always performed at the center of each sample piece. Therefore, it is possible to automate the replacement of the sample in the hardness measurement and greatly contribute to the labor saving and the high efficiency of the measurement work.

[Brief description of drawings]

FIG. 1 is a block diagram of an embodiment of the present invention, FIG. 2 is a schematic view of a sample piece holding device in the same embodiment, FIG. 3 is an enlarged sectional view of the sample piece holding device in the X direction, and FIG. FIG. 5 is an enlarged plan view showing the movement path of the hardness measuring indenter on the sample piece holding device described above. 1 ... Hardness measuring unit, 3 ... Hardness measuring indenter, 4 ... Lifting device (Z-direction moving device), 6 ... Y-direction moving device, 7 ...
・ ・ ・ X direction moving device, 10 ・ ・ ・ Photodetector, 11 ・ ・ ・ Specimen holder, 12a to 12n ・ ・ ・ Specimen, 14 ・ ・ ・ Control device, 15 ・ ・ ・
Electronic computer, 52 ... start of sample piece, 53 ... end of sample piece.

Claims (1)

[Claims] 1. A sample piece holding device for holding a large number of sample pieces arranged in the X direction, an X direction moving device for moving the sample piece holding device in the X direction, and a hardness measuring indenter with respect to the sample piece. Hardness measuring means including a Z-direction moving device for moving in the Z-direction orthogonal to the X-direction, and a starting-end position and an end-position of the sample piece that the hardness-measuring indenter faces when the sample-piece holding device moves in the X-direction. And a control device including an electronic computer. The control device starts the X-direction moving device so that the sample piece holding device moves in the + X direction, and in association with the + X-direction movement. The detection of the sample piece starting end position of the detection device starts counting the + X direction movement amount, and the detection of the subsequent sample piece end position stops the counting, and at the same time, the movement direction of the sample piece holding device is changed. The X-direction moving device is controlled so as to be inverted in the X-direction, and counting of the following movement amount in the -X direction is started, and the count value of the -X direction movement amount is larger than the count value of the + X direction movement amount. The operation of the X-direction moving device is stopped when the value reaches a small value and a predetermined ratio, and then the hardness measuring means is operated a required number of times to store the measured value, and thereafter the above-described operation is repeated. An apparatus for continuously measuring the hardness of a large number of sample pieces, which is configured as described above.