JPH06135797A - Method and device for synthesizing diamond - Google Patents
Method and device for synthesizing diamondInfo
- Publication number
- JPH06135797A JPH06135797A JP3023959A JP2395991A JPH06135797A JP H06135797 A JPH06135797 A JP H06135797A JP 3023959 A JP3023959 A JP 3023959A JP 2395991 A JP2395991 A JP 2395991A JP H06135797 A JPH06135797 A JP H06135797A
- Authority
- JP
- Japan
- Prior art keywords
- diamond
- cathode
- metal
- gas
- melting point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000010432 diamond Substances 0.000 title claims abstract description 64
- 229910003460 diamond Inorganic materials 0.000 title claims abstract description 62
- 238000000034 method Methods 0.000 title claims abstract description 29
- 230000002194 synthesizing effect Effects 0.000 title claims description 31
- 229910052751 metal Inorganic materials 0.000 claims abstract description 69
- 239000002184 metal Substances 0.000 claims abstract description 69
- 238000002844 melting Methods 0.000 claims abstract description 46
- 230000008018 melting Effects 0.000 claims abstract description 46
- 150000002739 metals Chemical class 0.000 claims abstract description 9
- 238000010000 carbonizing Methods 0.000 claims abstract 2
- 239000000758 substrate Substances 0.000 claims description 20
- 238000003786 synthesis reaction Methods 0.000 claims description 19
- 230000015572 biosynthetic process Effects 0.000 claims description 18
- 239000002994 raw material Substances 0.000 claims description 15
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 238000010891 electric arc Methods 0.000 claims description 8
- 239000012808 vapor phase Substances 0.000 claims description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 abstract description 27
- 229910052799 carbon Inorganic materials 0.000 abstract description 25
- 150000001247 metal acetylides Chemical class 0.000 abstract description 5
- 239000012535 impurity Substances 0.000 abstract description 3
- 230000008595 infiltration Effects 0.000 abstract 1
- 238000001764 infiltration Methods 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 90
- 229930195733 hydrocarbon Natural products 0.000 description 16
- 150000002430 hydrocarbons Chemical class 0.000 description 13
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 11
- 239000000203 mixture Substances 0.000 description 10
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 10
- 229910052721 tungsten Inorganic materials 0.000 description 10
- 239000010937 tungsten Substances 0.000 description 10
- -1 nitrogen-containing compound Chemical class 0.000 description 9
- 239000004215 Carbon black (E152) Substances 0.000 description 8
- 239000000463 material Substances 0.000 description 7
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 6
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- 238000004064 recycling Methods 0.000 description 6
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 5
- 238000004453 electron probe microanalysis Methods 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 4
- 238000000921 elemental analysis Methods 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 3
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- 229910052776 Thorium Inorganic materials 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 150000001298 alcohols Chemical class 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- WHJFNYXPKGDKBB-UHFFFAOYSA-N hafnium;methane Chemical compound C.[Hf] WHJFNYXPKGDKBB-UHFFFAOYSA-N 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- ZSLUVFAKFWKJRC-IGMARMGPSA-N 232Th Chemical compound [232Th] ZSLUVFAKFWKJRC-IGMARMGPSA-N 0.000 description 2
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 description 2
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 2
- ZTQSAGDEMFDKMZ-UHFFFAOYSA-N Butyraldehyde Chemical compound CCCC=O ZTQSAGDEMFDKMZ-UHFFFAOYSA-N 0.000 description 2
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Chemical compound CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- RGSFGYAAUTVSQA-UHFFFAOYSA-N Cyclopentane Chemical compound C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical compound COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- HUMNYLRZRPPJDN-UHFFFAOYSA-N benzaldehyde Chemical compound O=CC1=CC=CC=C1 HUMNYLRZRPPJDN-UHFFFAOYSA-N 0.000 description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- 229960004424 carbon dioxide Drugs 0.000 description 2
- 229910002091 carbon monoxide Inorganic materials 0.000 description 2
- 238000003763 carbonization Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- KEUKAQNPUBYCIC-UHFFFAOYSA-N ethaneperoxoic acid;hydrogen peroxide Chemical compound OO.CC(=O)OO KEUKAQNPUBYCIC-UHFFFAOYSA-N 0.000 description 2
- 238000011049 filling Methods 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 150000002367 halogens Chemical class 0.000 description 2
- 229910001872 inorganic gas Inorganic materials 0.000 description 2
- 150000002576 ketones Chemical class 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- 239000010955 niobium Substances 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000001294 propane Substances 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- NVJUHMXYKCUMQA-UHFFFAOYSA-N 1-ethoxypropane Chemical compound CCCOCC NVJUHMXYKCUMQA-UHFFFAOYSA-N 0.000 description 1
- PMPVIKIVABFJJI-UHFFFAOYSA-N Cyclobutane Chemical compound C1CCC1 PMPVIKIVABFJJI-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- LVZWSLJZHVFIQJ-UHFFFAOYSA-N Cyclopropane Chemical compound C1CC1 LVZWSLJZHVFIQJ-UHFFFAOYSA-N 0.000 description 1
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 description 1
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 1
- XOBKSJJDNFUZPF-UHFFFAOYSA-N Methoxyethane Chemical compound CCOC XOBKSJJDNFUZPF-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- 235000021355 Stearic acid Nutrition 0.000 description 1
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 1
- FEWJPZIEWOKRBE-UHFFFAOYSA-N Tartaric acid Natural products [H+].[H+].[O-]C(=O)C(O)C(O)C([O-])=O FEWJPZIEWOKRBE-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- MIQWEMDDUPSLRW-UHFFFAOYSA-N [O].O=C=O Chemical compound [O].O=C=O MIQWEMDDUPSLRW-UHFFFAOYSA-N 0.000 description 1
- IKHGUXGNUITLKF-XPULMUKRSA-N acetaldehyde Chemical compound [14CH]([14CH3])=O IKHGUXGNUITLKF-XPULMUKRSA-N 0.000 description 1
- DHKHKXVYLBGOIT-UHFFFAOYSA-N acetaldehyde Diethyl Acetal Natural products CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 description 1
- 150000001241 acetals Chemical class 0.000 description 1
- KXKVLQRXCPHEJC-UHFFFAOYSA-N acetic acid trimethyl ester Natural products COC(C)=O KXKVLQRXCPHEJC-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 150000001299 aldehydes Chemical class 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 150000008365 aromatic ketones Chemical class 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 239000001273 butane Substances 0.000 description 1
- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 150000001721 carbon Chemical group 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002090 carbon oxide Inorganic materials 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 150000004292 cyclic ethers Chemical class 0.000 description 1
- 150000003997 cyclic ketones Chemical class 0.000 description 1
- HWEQKSVYKBUIIK-UHFFFAOYSA-N cyclobuta-1,3-diene Chemical compound C1=CC=C1 HWEQKSVYKBUIIK-UHFFFAOYSA-N 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 125000004177 diethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- 125000005594 diketone group Chemical group 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- LRMHFDNWKCSEQU-UHFFFAOYSA-N ethoxyethane;phenol Chemical compound CCOCC.OC1=CC=CC=C1 LRMHFDNWKCSEQU-UHFFFAOYSA-N 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 150000008282 halocarbons Chemical class 0.000 description 1
- DMEGYFMYUHOHGS-UHFFFAOYSA-N heptamethylene Natural products C1CCCCCC1 DMEGYFMYUHOHGS-UHFFFAOYSA-N 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 1
- VNKYTQGIUYNRMY-UHFFFAOYSA-N methoxypropane Chemical compound CCCOC VNKYTQGIUYNRMY-UHFFFAOYSA-N 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 125000004334 oxygen containing inorganic group Chemical group 0.000 description 1
- QNGNSVIICDLXHT-UHFFFAOYSA-N para-ethylbenzaldehyde Natural products CCC1=CC=C(C=O)C=C1 QNGNSVIICDLXHT-UHFFFAOYSA-N 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- MWWATHDPGQKSAR-UHFFFAOYSA-N propyne Chemical group CC#C MWWATHDPGQKSAR-UHFFFAOYSA-N 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 235000002906 tartaric acid Nutrition 0.000 description 1
- 239000011975 tartaric acid Substances 0.000 description 1
- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- HGBOYTHUEUWSSQ-UHFFFAOYSA-N valeric aldehyde Natural products CCCCC=O HGBOYTHUEUWSSQ-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Carbon And Carbon Compounds (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、ダイヤモンドの合成方
法および合成装置に関し、特に、炭素源ガスと接触して
も陰極が溶融することのないダイヤモンドの合成方法お
よび合成装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a diamond synthesizing method and a synthesizing apparatus, and more particularly to a diamond synthesizing method and a synthesizing apparatus in which a cathode does not melt even when contacted with a carbon source gas.
【0002】[0002]
【従来の技術】熱プラズマを利用したダイヤモンドの合
成方法(特開昭62−158195号)が提案されて以
来、高周波(RF)プラズマ法や直流(DC)プラズマ
法等数多くの技術が開発されている。熱プラズマ法は合
成速度が極めて速いという長所を有するが、反面、原料
ガスのほとんどが未反応のまま排出されてしまうため、
ガスの使用量が多くなり、コストが極めて高く実用性に
欠けるという問題がある。そこで、排出されるガスのほ
とんどが未反応ガスであり、その組成が原料ガスの組成
とほとんど一致する点に着目し、排出ガスを循環再使用
してコストの低減を図ることによって、熱プラズマ法の
実用性を高める試みがなされている(特開平1−164
795号)。2. Description of the Related Art Since a diamond synthesis method utilizing thermal plasma (Japanese Patent Laid-Open No. 62-158195) was proposed, many techniques such as a radio frequency (RF) plasma method and a direct current (DC) plasma method have been developed. There is. The thermal plasma method has the advantage that the synthesis rate is extremely fast, but on the other hand, most of the source gas is discharged unreacted,
There is a problem that a large amount of gas is used, the cost is extremely high, and the gas is not practical. Therefore, by paying attention to the fact that most of the exhausted gas is unreacted gas and its composition is almost the same as that of the raw material gas, the exhaust gas is circulated and reused to reduce the cost. Attempts have been made to improve the practicality of the above (Japanese Patent Laid-Open No. 1-164).
795).
【0003】[0003]
【発明が解決しようとする課題】しかしながら、DCプ
ラズマ法において、排出ガスをそのまま循環させて、再
使用しようとすると、炭化水素ガスがカソードに接触し
てこれと反応しカソードが溶融してしまうという問題が
ある。カソードの溶融は、カソードの寿命が短くなると
いう問題のみならず、合成が不安定となり、またダイヤ
モンドに溶融したカソードが不純物として混入するとい
う問題をもたらす。However, in the DC plasma method, if the exhaust gas is circulated and reused, the hydrocarbon gas comes into contact with the cathode and reacts with it to melt the cathode. There's a problem. The melting of the cathode causes not only the problem that the life of the cathode is shortened but also the problem that the synthesis becomes unstable and that the melted cathode is mixed as an impurity in the diamond.
【0004】カソードの溶融を解消する技術として、メ
タン等の炭化水素を放電電極間には流さず、電極と反応
しないアルゴンと、電極とほとんど反応しない水素とで
放電を起させ、放電電極の下流から原料となるメタン等
の炭化水素を混入させて電極の保護およびプラズマの安
定化を図る技術が知られている(特開平1−16479
5号、特開平1−179789号)。しかし、かかる技
術を上述した原料ガスの再利用を図る技術に適用しよう
とすると、反応後に排出されるガスの中からメタン等の
炭化水素を分離しなければならず、コストがかかりすぎ
て、排出ガスを再利用する意味がなくなってしまうとい
う問題がある。また、陰極の材料に関しても、上述した
カソードの溶融問題を解決するものは未だ開発されてい
ない。例えば、DCプラズマ法におけるカソードとして
は、W(タングステン)またはTh(トリウム)を少量
混合させたW(タングステン)が多く使用されている。
これは、タングステンが放電しやすく、かつ耐熱性を有
する材料だからであるが、タングステン陰極は炭化水素
ガスと反応して融点降下してしまう。また、特開昭63
−139095号には、アーク放電電極としてタングス
テン系の電極(W−Th,W−Ba,W−Srなど)が
開示されており、特開昭64−33096号には、アー
ク放電電極として希土類元素酸化物を含むタングステン
電極が開示されているが、これらの電極も炭化水素ガス
と反応して融点降下し、初期の耐熱性を維持することが
できない。As a technique for eliminating the melting of the cathode, a hydrocarbon such as methane is not allowed to flow between the discharge electrodes, and a discharge is caused by argon that does not react with the electrodes and hydrogen that hardly reacts with the electrodes. A technique for protecting the electrode and stabilizing the plasma by mixing a hydrocarbon such as methane as a raw material is known (Japanese Patent Laid-Open No. 16479/1989).
No. 5, JP-A-1-179789). However, if such a technique is applied to the above-mentioned technique for reusing the raw material gas, hydrocarbons such as methane have to be separated from the gas discharged after the reaction, which is too costly and the emission There is a problem that there is no point in reusing gas. Further, regarding the material of the cathode, there has not yet been developed a material that solves the above-mentioned cathode melting problem. For example, W (tungsten) mixed with a small amount of W (tungsten) or Th (thorium) is often used as the cathode in the DC plasma method.
This is because tungsten is a material that easily discharges and has heat resistance, but the tungsten cathode reacts with the hydrocarbon gas and its melting point is lowered. In addition, JP-A-63
No. 139095 discloses a tungsten-based electrode (W-Th, W-Ba, W-Sr, etc.) as an arc discharge electrode, and JP-A-64-33096 discloses a rare earth element as an arc discharge electrode. Although a tungsten electrode containing an oxide is disclosed, these electrodes also cannot react with the hydrocarbon gas to lower the melting point and maintain the initial heat resistance.
【0005】なお、本願出願人は、原料ガスとして一酸
化炭素と水素を選択することによって、原料ガスを再利
用できることを見い出している(特願平2−13981
1号)。しかし、この方法においては、原料ガスが制限
されるという問題がある。The applicant of the present application has found that the raw material gas can be reused by selecting carbon monoxide and hydrogen as the raw material gas (Japanese Patent Application No. Hei 2-13981).
No. 1). However, this method has a problem that the raw material gas is limited.
【0006】本発明は上記事情にかんがみてなされたも
のであり、炭素源ガスと接触しても陰極が溶融したりす
ることがなく、したがって、ダイヤモンド合成の低コス
ト化および高品質化を図ることのできるダイヤモンドの
合成方法および合成装置の提供を目的とする。The present invention has been made in view of the above circumstances, and the cathode is not melted even when it comes into contact with a carbon source gas. Therefore, the cost and quality of diamond synthesis can be reduced. An object of the present invention is to provide a diamond synthesizing method and a diamond synthesizing device.
【0007】[0007]
【課題を解決するための手段】上記目的を達成するため
に、本発明のダイヤモンドの合成方法は、陽極および陰
極間の直流アーク放電によって原料ガスを熱プラズマ化
し、プラズマジェットとして基板に衝突させて急冷し基
板上にダイヤモンドを気相成長させるダイヤモンドの合
成方法において、少なくとも前記陰極の放電表面が、金
属を炭化して炭化金属としたときの融点が3000℃以
上となる金属または融点が3000℃以上の炭化金属で
形成された陰極を用いてダイヤモンドの気相合成を行な
うようにしてあり、必要に応じ、反応後に排出されるガ
スを回収し、循環させて再び原料ガスとしてリサイクル
して使用するようにしてある。また、本発明のダイヤモ
ンドの合成装置は、陽極および陰極を有し、これらの電
極間で直流アーク放電を起こさせて原料ガスを熱プラズ
マ化し、基板上にダイヤモンドを気相成長させるダイヤ
モンドの合成装置において、少なくとも前記陰極の放電
表面を、金属を炭化して炭化金属としたときの融点が3
000℃以上となる金属または融点が3000℃以上の
炭化金属で形成した構成とし、好ましくは前記金属をI
Va族金属あるいはVa族金属のうちから選ばれるいず
れか一の金属とし、あるいは前記炭化金属をIVa族金
属あるいはVa族金属のうちから選ばれるいずれか一の
金属を炭化したものとし、必要に応じ、反応後に排出さ
れるガスを回収し、循環させる手段を備えた構成として
ある。In order to achieve the above object, the method for synthesizing diamond of the present invention is to convert a source gas into thermal plasma by direct-current arc discharge between an anode and a cathode, and collide it with a substrate as a plasma jet. In a method for synthesizing diamond, which comprises rapidly cooling and vapor-depositing diamond on a substrate, at least the discharge surface of the cathode has a melting point of 3000 ° C. or higher when a metal is carbonized to form a metal carbide or a melting point of 3000 ° C. or higher. The gas phase synthesis of diamond is carried out using the cathode formed of metal carbide, and if necessary, the gas discharged after the reaction should be recovered, circulated and recycled as the raw material gas for use again. I am doing it. Further, the diamond synthesizing apparatus of the present invention has an anode and a cathode, and a direct current arc discharge is generated between these electrodes to turn the raw material gas into thermal plasma, thereby synthesizing diamond on the substrate in a vapor phase. In, at least the discharge surface of the cathode has a melting point of 3 when the metal is carbonized to form a metal carbide.
A metal formed at a temperature of 000 ° C. or higher or a metal carbide having a melting point of 3000 ° C. or higher is preferably used.
As a metal selected from a group Va metal or a group Va metal, or a metal selected from a group IVa metal or a group Va metal selected from the above metal carbides, if necessary. The gas exhausted after the reaction is recovered and circulated.
【0008】以下、本発明を詳細に説明する。まず、本
発明のダイヤモンドの合成装置について図面を参照して
説明する。図1は本発明のダイヤモンドの合成装置の一
例を示す構成図である。The present invention will be described in detail below. First, the diamond synthesizing apparatus of the present invention will be described with reference to the drawings. FIG. 1 is a block diagram showing an example of the diamond synthesizing apparatus of the present invention.
【0009】図面において、直流(DC)プラズマ装置
本体1は、陰極(カソード)2、陽極(アノード)3お
よび真空反応容器4等で構成されている。ここで、カソ
ード2は、少なくともその放電表面が、金属を炭化して
炭化金属としたときの融点が3000℃以上となる金属
または融点が3000℃以上の炭化金属で形成されてい
る。In the drawing, a direct current (DC) plasma device main body 1 is composed of a cathode (cathode) 2, an anode (anode) 3, a vacuum reaction container 4 and the like. Here, at least the discharge surface of the cathode 2 is formed of a metal having a melting point of 3000 ° C. or higher when a metal is carbonized into a metal carbide or a metal carbide having a melting point of 3000 ° C. or higher.
【0010】「金属を炭化して炭化金属としたときの融
点が3000℃以上となる金属」とは、金属自体の融点
は3000℃以下であるが、金属を炭化すると融点が上
昇し、融点が3000℃以上の炭化金属となるような金
属あるいは金属自体の融点および炭化金属としたときの
融点の双方が3000℃以上となるような金属をいう。
このような金属としては、例えばTi(チタン)(融点
1680℃),Zr(ジルコニウム)(融点1860
℃),Hf(ハフニウム)(融点2230℃)等のIV
aの族金属や、Nb(ニオブ)(融点2520℃),T
a(タンタル)(融点3000℃)等のVa族金属が挙
げられる。"A metal having a melting point of 3000 ° C. or higher when the metal is carbonized to form a metal carbide" means that the melting point of the metal itself is 3000 ° C. or lower, but when the metal is carbonized, the melting point rises and the melting point increases. A metal having a melting point of 3000 ° C. or higher, or a metal having both the melting point of the metal itself and the melting point of a metal carbide being 3000 ° C. or higher.
Examples of such a metal include Ti (titanium) (melting point 1680 ° C.), Zr (zirconium) (melting point 1860).
IV) such as Hf (hafnium) (melting point 2230 ° C)
Group a metal, Nb (niobium) (melting point 2520 ° C.), T
Va group metals such as a (tantalum) (melting point 3000 ° C.) can be used.
【0011】「融点が3000℃以上の炭化金属」とし
ては、例えば、上記IVaおよびVa族金属の炭化物が
挙げられる。具体的には、TiC(融点3250℃),
ZrC(融点3180℃),HfC(融点3900
℃),NbC(融点3500℃),Ta2 C(融点34
00℃),TaC(融点3880℃)等が挙げられる。Examples of the “metal carbide having a melting point of 3000 ° C. or higher” include carbides of the above group IVa and Va metals. Specifically, TiC (melting point 3250 ° C.),
ZrC (melting point 3180 ° C), HfC (melting point 3900)
℃), NbC (melting point 3500 ℃), Ta 2 C (melting point 34
00 ° C.), TaC (melting point 3880 ° C.) and the like.
【0012】これらの炭化金属は、電極として用いるも
のであるため、導電性を有することが必要である。な
お、VIa族金属であるW(タングステン)(融点33
80℃)は、金属としては融点が3000℃以上である
が、炭化が進むに従い、融点が降下し、炭化金属(W2
C;融点2750℃,WC;融点2600℃)としての
融点は3000℃以下となる。したがって、これをカソ
ードとして使用するとカソードは溶融し、溶融したタン
グステンが基板に飛着し、ダイヤモンドが不純となった
り、放電が不安定となり合成を続けることができなくな
るので不適当である。また、同じくVIa族金属である
Mo(モリブデン)(融点2630℃)は金属および炭
化金属(MoC;融点2690℃)のいずれの融点も3
0000℃以下であり、カソードとしては不適当であ
る。Since these metal carbides are used as electrodes, they need to have electrical conductivity. In addition, W (tungsten) which is a VIa group metal (melting point 33
80 ° C.) has a melting point of 3000 ° C. or higher as a metal, but as the carbonization progresses, the melting point decreases and metal carbide (W 2
C; melting point 2750 ° C., WC; melting point 2600 ° C.) is 3000 ° C. or less. Therefore, when this is used as a cathode, the cathode is melted, the molten tungsten is scattered on the substrate, the diamond becomes impure, and the discharge becomes unstable, so that the synthesis cannot be continued, which is unsuitable. Further, Mo (molybdenum) (melting point 2630 ° C.), which is also a VIa group metal, has a melting point of 3 for both metal and metal carbide (MoC; melting point 2690 ° C.).
The temperature is 0000 ° C or lower, which is unsuitable as a cathode.
【0013】カソード2は、少なくともその放電表面が
上記金属あるいは炭化金属で形成されていればよい。こ
れは、高温のプラズマと接触するのはカソード2の放電
表面だけであるため、上記金属あるいは炭化金属を水冷
した銅に接着してカソードとすれば、カソード2の内部
は高温にならず、したがって内部の耐熱性は2000〜
2500℃あれば十分であるからである。もちろん、カ
ソード2全体を上記金属あるいは炭化金属で形成しても
よい、また、カソード2の放電表面のうちプラズマと接
触する部分だけを上記金属あるいは炭化金属で形成して
もよい。At least the discharge surface of the cathode 2 should be formed of the above metal or metal carbide. This is because only the discharge surface of the cathode 2 is in contact with the high temperature plasma. Therefore, if the above metal or metal carbide is adhered to water-cooled copper to form a cathode, the inside of the cathode 2 will not have a high temperature. Internal heat resistance is 2000 ~
This is because 2500 ° C. is sufficient. Of course, the entire cathode 2 may be formed of the above metal or metal carbide, or only the portion of the discharge surface of the cathode 2 that comes into contact with plasma may be formed of the above metal or metal carbide.
【0014】アノード3は冷却性能の良い材料(例えば
Cu等)で形成されている。カソード2およびアノード
3の形状等は特に限定されない。また、電極には冷却水
(図示せず)を流すようにしてもよい。なお、カソード
の周辺に純粋なArガスを若干流し、シース(さや)を
形成するようにするとカソードの劣化を抑制する働きを
するので好ましい。The anode 3 is formed of a material having a good cooling performance (eg Cu). The shapes and the like of the cathode 2 and the anode 3 are not particularly limited. Further, cooling water (not shown) may be caused to flow through the electrodes. In addition, it is preferable that a slight amount of pure Ar gas is caused to flow around the cathode to form a sheath, because it serves to suppress the deterioration of the cathode.
【0015】電極間に印加される直流の電圧(アーク電
圧)および電流(アーク電流)値は、理論的には制限さ
れないが、現実的な範囲としては、電圧30〜200
V、電流30〜2000Aの範囲、特に電圧70〜12
0V、電流50〜500Aの範囲とするのが好ましい。The DC voltage (arc voltage) and current (arc current) values applied between the electrodes are not theoretically limited, but in a practical range, the voltage is 30 to 200.
V, current range 30-2000A, especially voltage 70-12
It is preferable that the voltage is 0 V and the current is 50 to 500 A.
【0016】本発明において使用されるガスは、原料ガ
スとして炭素源ガスが、プラズマガスとして水素(H
2 )あるいはアルゴン(Ar)などの不活性ガスが用い
られる。ここで、炭素源ガスとは、ダイヤモンド(C)
の構成元素である炭素原子(C)を含んだ分子のガスを
いう。また、プラズマガスとは、アーク放電によってプ
ラズマを生じさせるために用いられるガスをいう。The gas used in the present invention includes a carbon source gas as a raw material gas and hydrogen (H) as a plasma gas.
2 ) or an inert gas such as argon (Ar) is used. Here, the carbon source gas means diamond (C)
A gas of a molecule containing a carbon atom (C) which is a constituent element of. Further, the plasma gas refers to a gas used to generate plasma by arc discharge.
【0017】上記炭素源ガスとしては、各種炭化水素、
含ハロゲン化合物、含酸素化合物、含窒素化合物等のガ
ス、あるいはグラファイトなどの炭素をガス化したもの
を使用することもできる。As the carbon source gas, various hydrocarbons,
It is also possible to use a gas such as a halogen-containing compound, an oxygen-containing compound or a nitrogen-containing compound, or a gas such as graphite in which carbon is gasified.
【0018】炭化水素としては、例えばメタン、エタ
ン、プロパン、ブタン等のパラフィン系炭化水素;エチ
レン、プロピレン、ブチレン等のオレフィン系炭化水
素;アセチレン、アリレン等のアセチレン系炭化水素;
ブタジエン等のジオレフィン系炭化水素;シクロプロパ
ン、シクロブタン、シクロペンタン、シクロヘキサン、
シクロブタジエン等の脂環式炭化水素;ベンゼン、トル
エン、キシレン、ナフタレン等の芳香族炭化水素などを
挙げることができる。Examples of the hydrocarbon include paraffinic hydrocarbons such as methane, ethane, propane and butane; olefinic hydrocarbons such as ethylene, propylene and butylene; acetylene hydrocarbons such as acetylene and allylene.
Diolefin hydrocarbons such as butadiene; cyclopropane, cyclobutane, cyclopentane, cyclohexane,
Examples thereof include alicyclic hydrocarbons such as cyclobutadiene; aromatic hydrocarbons such as benzene, toluene, xylene and naphthalene.
【0019】含ハロゲン化合物としては、例えば、ハロ
ゲン化メタン、ハロゲン化エタン、ハロゲン化ベンゼン
等のハロゲン化炭化水素、四塩化炭素等を挙げることが
できる。Examples of the halogen-containing compound include halogenated methane, halogenated ethane, halogenated hydrocarbon such as benzene, carbon tetrachloride and the like.
【0020】含酸素化合物としては、例えば、メタノー
ル、エタノール、プロパノール、ブタノール等のアルコ
ール類;メチルエーテル、エチルエーテル、エチルメチ
ルエーテル、メチルプロピルエーテル、エチルプロピル
エーテル、フェノールエーテル、アセタール、環式エー
テル(ジオキサン、エチレンオキシド等)のエーテル
類;アセトン、ピナコリン、メチルオキシド、芳香族ケ
トン(アセトフェノン、ベンゾフェノン等)、ジケト
ン、環式ケトン等のケトン類;ホルムアルデヒド、アセ
トアルデヒド、ブチルアルデヒド、ベンズアルデヒド等
のアルデヒド類;ギ酸、酢酸、プロピオン酸、コハク
酸、酪酸、シュウ酸、酒石酸、ステアリン酸等の有機酸
類;酢酸メチル、酢酸エチル等の酸エステル類;エチレ
ングリコール、ジエチレングリコール等の二価アルコー
ル類;一酸化炭素、二酸化炭素等の含酸素無機ガス等を
挙げることができる。Examples of the oxygen-containing compound include alcohols such as methanol, ethanol, propanol and butanol; methyl ether, ethyl ether, ethyl methyl ether, methyl propyl ether, ethyl propyl ether, phenol ether, acetal, cyclic ether ( Dioxane, ethylene oxide, etc.) ethers; acetone, pinacholine, methyl oxide, aromatic ketones (acetophenone, benzophenone, etc.), diketones, cyclic ketones, and other ketones; formaldehyde, acetaldehyde, butyraldehyde, benzaldehyde, and other aldehydes; formic acid Organic acids such as acetic acid, propionic acid, succinic acid, butyric acid, oxalic acid, tartaric acid, stearic acid; Acid esters such as methyl acetate and ethyl acetate; Ethylene glycol, diethyl Dihydric alcohols such as glycol; carbon monoxide, such as carbon dioxide oxygen-containing inorganic gas, and the like.
【0021】含窒素化合物としては、例えば、トリメチ
ルアミン、トリエチルアミンなどのアミン類等を挙げる
ことができる。Examples of the nitrogen-containing compound include amines such as trimethylamine and triethylamine.
【0022】これらの炭素源ガスの中でも、常温で気体
または蒸気圧の高いメタン、エタン、プロパン等のパラ
フィン系炭化水素、あるいはアセトン、ベンゾフェノン
等のケトン類、メタノール、エタノール等のアルコール
類、一酸化炭素、二酸化炭素等の含酸素無機ガス等が好
ましい。Among these carbon source gases, paraffinic hydrocarbons such as methane, ethane and propane, which have a high gas or vapor pressure at room temperature, ketones such as acetone and benzophenone, alcohols such as methanol and ethanol, and monoxide. Oxygen-containing inorganic gases such as carbon and carbon dioxide are preferable.
【0023】本発明のダイヤモンドの合成装置において
は、真空反応容器4内に、基板7を載置した基板ホルダ
ー6が設けられている。真空反応容器4内はポンプ8に
よって所望する真空到達圧力に保たれる。ポンプ8によ
って排出されたガスは、必要に応じバッファタンク9に
回収され、再び電極間(プラズマトーチ)に供給され
る。In the diamond synthesizing apparatus of the present invention, a substrate holder 6 on which a substrate 7 is placed is provided in a vacuum reaction vessel 4. The inside of the vacuum reaction container 4 is maintained at a desired ultimate vacuum pressure by the pump 8. The gas discharged by the pump 8 is collected in the buffer tank 9 as needed and is supplied again between the electrodes (plasma torch).
【0024】次に上記装置の作用、すなわち本発明のダ
イヤモンドの合成方法について説明する。まず、反応開
始は炭素源ガスおよびプラズマガズからなる原料ガスを
電極の間(カソード2とアノード3の間)に供給し、電
極(プラズマトーチ)内でDCアーク放電によって熱プ
ラズマ化して、プラズマジェット5として噴出する。プ
ラズマジェット5は、基板ホルダー6に載置された基板
7に衝突し、急冷されて基板上にダイヤモンドを析出さ
せる。この場合、原料ガスの組成、基板の表面状態等の
条件を適宜選択することにより、膜状あるいは粒状のダ
イヤモンドを合成することができる。例えば、ダイヤモ
ンド粒子などの核形成粒子表面上にダイヤモンドを気相
成長させることにより、粒状のダイヤモンドを合成でき
る。なお、炭素源ガスは、放電電極間に流さず、その下
流側に導入してもよい。Next, the operation of the above apparatus, that is, the method for synthesizing diamond of the present invention will be described. First, in order to start the reaction, a source gas composed of a carbon source gas and plasma gas is supplied between the electrodes (between the cathode 2 and the anode 3), and thermal plasma is generated by DC arc discharge in the electrode (plasma torch), and the plasma jet 5 Gush out as. The plasma jet 5 collides with the substrate 7 placed on the substrate holder 6 and is rapidly cooled to deposit diamond on the substrate. In this case, film-like or granular diamond can be synthesized by appropriately selecting the conditions such as the composition of the source gas and the surface condition of the substrate. For example, granular diamond can be synthesized by vapor-depositing diamond on the surface of nucleation particles such as diamond particles. The carbon source gas may be introduced downstream of the discharge electrodes instead of flowing between the discharge electrodes.
【0025】本発明のダイヤモンドの合成装置および合
成方法は、上述した特定の材料からなるカソードを用い
ているので、従来のカソードを用いた合成装置および合
成方法に比べ、カソードが溶融しにくい。また、カソー
ドが溶融してプラズマが不安定になったり、ダイヤモン
ドにカソードを形成する材料が混入したりしない。した
がって、長時間安定して高品質のダイヤモンドを合成で
きる。特に、後述する排出ガスを回収してリサイクルし
てダイヤモンドを合成する装置および方法においては、
従来のW系カソードでは炭化水素等の炭素源ガスがカソ
ードと反応し、カソードが溶融し易いので、実用化は困
難であり、本発明ではじめて実用化が可能となるもの
で、本発明の効果は顕著である。Since the diamond synthesizing apparatus and synthesizing method of the present invention use the cathode made of the above-mentioned specific material, the cathode is less likely to melt than the conventional synthesizing apparatus and synthesizing method using the cathode. Further, the cathode is not melted and the plasma becomes unstable, and the material forming the cathode is not mixed into the diamond. Therefore, high-quality diamond can be synthesized stably for a long time. In particular, in the device and method for synthesizing diamond by collecting and recycling exhaust gas described later,
In the conventional W-based cathode, carbon source gas such as hydrocarbon reacts with the cathode, and the cathode is easily melted, so that it is difficult to put it into practical use, and the present invention can be put to practical use for the first time. Is remarkable.
【0026】次に排出ガスを回収してリサイクルしてダ
イヤモンドを合成する場合について説明する。上記合成
反応後、真空反応容器4内に排出されたガスは、必要に
応じポンプ8によってバッファタンク9に回収される。
真空反応容器4内は所定の真空到達圧力となるようにポ
ンプ8によって排気される。ポンプ8は排気側にオイル
が混入するのを防ぐためドライポンプ等のオイルフリー
タイプのポンプを使用するのが好ましい。Next, the case where the exhaust gas is collected and recycled to synthesize diamond will be described. After the synthesis reaction, the gas discharged into the vacuum reaction container 4 is collected in the buffer tank 9 by the pump 8 as needed.
The inside of the vacuum reaction container 4 is evacuated by the pump 8 so as to have a predetermined ultimate vacuum pressure. As the pump 8, it is preferable to use an oil-free type pump such as a dry pump in order to prevent oil from entering the exhaust side.
【0027】バッファタンク9の材質、容量、充填圧等
は、特に限定されないが、一例を示せばSUS304製
の容量500リットルのタンクで充填圧1〜2Kg/c
m2・Gである。バッファタンク9には、タンク中のガ
ス組成測定用のセンサ10が取付けられており、バッフ
ァタンク内の圧力、組成を常時監視できるようになって
いる。The material, capacity, filling pressure, etc. of the buffer tank 9 are not particularly limited, but as an example, a 500 liter tank made of SUS304 with a filling pressure of 1-2 Kg / c.
m 2 · G. A sensor 10 for measuring the gas composition in the tank is attached to the buffer tank 9 so that the pressure and composition in the buffer tank can be constantly monitored.
【0028】バッファタンク9には、炭素源ガス供給管
13、プラズマガス供給管14、15が配管されてい
る。また、各供給管13〜15にはマスフローメータ1
6〜18がそれぞれ取付けられている。炭素源ガス供給
管13、プラズマガス供給管14、15の他端はそれぞ
れガスボンベ(図示せず)に接続されている。A carbon source gas supply pipe 13 and plasma gas supply pipes 14 and 15 are provided in the buffer tank 9. Further, the mass flow meter 1 is connected to each of the supply pipes 13 to 15.
6 to 18 are attached respectively. The other ends of the carbon source gas supply pipe 13 and the plasma gas supply pipes 14 and 15 are connected to gas cylinders (not shown), respectively.
【0029】バッファタンク内のガス組成は、常時一定
となるよう不足したガスを上記ガスボンベから補充する
か、あるいは、数時間単位毎に不足したガスを上記ガス
ボンベから補充するようにする。これは、単位時間当り
のガスの消費量およびガス組成の変化が小さく、またガ
ス組成の多少の変化はダイヤモンド合成に影響を与えな
いためである。The gas composition in the buffer tank is constantly replenished with the insufficient gas from the gas cylinder, or is replenished with the insufficient gas from the gas cylinder every several hours. This is because changes in gas consumption and gas composition per unit time are small, and slight changes in gas composition do not affect diamond synthesis.
【0030】バッファタンク9内に回収され組成調整さ
れたガスは流量コントローラ11へ供給される。流量コ
ントローラ11は、炭素源ガスおよびプラズマガスの組
成で較正してある合成ガス用のものが使用される。The gas recovered in the buffer tank 9 and having its composition adjusted is supplied to the flow rate controller 11. As the flow rate controller 11, a flow rate controller 11 for synthesis gas that is calibrated with the composition of the carbon source gas and the plasma gas is used.
【0031】上記ダイヤモンド合成に伴ない原料ガス中
で消費されるのは炭素源ガス中の炭素原子のみである
が、グラファイトやダイヤモンド状カーボン(DLC:
Diamondo Like Carbon)等の副生
成物が1%程度生成し、さらに循環中に生ずるリークに
よっても原料が消費されるので、CH4 やCO等の炭素
源ガスの他、ArやH2 等のプラズマガスについても補
充が必要である。Although only the carbon atoms in the carbon source gas are consumed in the source gas accompanying the above diamond synthesis, graphite or diamond-like carbon (DLC:
By-products such as Diamond Like Carbon) are produced in an amount of about 1%, and the raw material is consumed by a leak that occurs during circulation. Therefore, in addition to carbon source gases such as CH 4 and CO, plasma such as Ar and H 2 is also generated. Gas also needs to be replenished.
【0032】上述したように本発明において、排出ガス
を回収してリサイクルし、ダイヤモンドを合成すると、
従来のように炭化水素等の炭素源ガスがカソードと反応
してカソードが溶融することがなく、原料ガスのリサイ
クルが可能となる。したがって、従来コスト面で実用化
が困難であったDCプラズマ法によるダイヤモンド合成
を実用化できる。すなわち、コストを1/10〜1/1
00と大幅に下げることができ、十分実用に供すること
ができる。また、原料ガス等がリサイクルされるので、
排出ガスが出ず、環境問題も生じることがない。As described above, in the present invention, when exhaust gas is collected and recycled to synthesize diamond,
Unlike the conventional case, carbon source gas such as hydrocarbon does not react with the cathode to melt the cathode, and the raw material gas can be recycled. Therefore, it is possible to put the diamond synthesis by the DC plasma method into practical use, which has been difficult to put into practical use in terms of cost. That is, the cost is 1/10 to 1/1
It can be greatly reduced to 00, and can be sufficiently put to practical use. In addition, since the raw material gas is recycled,
No exhaust gas is emitted and no environmental problems occur.
【0033】[0033]
【実施例】以下、実施例により本発明をさらに詳細に説
明する。The present invention will be described in more detail with reference to the following examples.
【0034】実施例1 図1に示すダイヤモンド合成装置を用意し、カソードと
しては、大きさ7mmφ×10mm、純度99.9%以
上のTa(タンタル)を使用した。プラズマガスおよび
その流量をAr:15リットル/min、H2 :15リ
ットル/minとし、炭素源ガスおよびその流量をCH
4 :0.5リットル/minとし、アーク電圧80V、
アーク電流120A、圧力200Torrの条件下、装
置の運転を開始した。排出ガスの回収およびリサイクル
を行ないつつ、120分間連続運転してダイヤモンドの
合成を行なった。上記合成の結果、Mo基板上に200
mgのダイヤモンド(膜)が得られた。合成中は、プラ
ズマは安定しており、電圧の変動は5%以内であった。
合成後カソードの状態を調べたところカソードはほとん
ど損傷(溶融)していなかった。また、上記と同様の条
件下、運転開始から20分後に基板を装置から取り出
し、基板上に形成されたダイヤモンド膜の表面状態を走
査型電子顕微鏡(SEM)で観察し、さらに表面の元素
分析をEPMA(Electron ProbeMic
ro Analysis;エレクトロンプローブ微量分
析法)によって行なった。その結果、SEMによって異
物は観察されず、EPMAによる元素分析においてもダ
イヤモンド以外の元素は検出されなかった。Example 1 The diamond synthesizer shown in FIG. 1 was prepared, and Ta (tantalum) having a size of 7 mmφ × 10 mm and a purity of 99.9% or more was used as the cathode. The plasma gas and its flow rate were Ar: 15 liter / min, H 2 : 15 liter / min, and the carbon source gas and its flow rate were CH.
4 : 0.5 liter / min, arc voltage 80V,
The operation of the device was started under the conditions of an arc current of 120 A and a pressure of 200 Torr. Diamond was synthesized by continuously operating for 120 minutes while collecting and recycling the exhaust gas. As a result of the above synthesis, 200 on the Mo substrate
mg of diamond (film) was obtained. During the synthesis, the plasma was stable and the voltage fluctuation was within 5%.
When the state of the cathode after the synthesis was examined, the cathode was scarcely damaged (melted). Also, under the same conditions as above, 20 minutes after the start of operation, the substrate was taken out of the apparatus, the surface state of the diamond film formed on the substrate was observed with a scanning electron microscope (SEM), and further elemental analysis of the surface was conducted. EPMA (Electron ProbeMic
ro Analysis; electron probe microanalysis method). As a result, no foreign matter was observed by SEM, and elements other than diamond were not detected by elemental analysis by EPMA.
【0035】実施例2 図1に示すダイヤモンド合成装置において、カソードと
して、HfC(炭化ハフニウム)の粉末をペレット状に
焼結したものを水冷用の銅ホルダーに銀ロウづけしたも
のを使用した。プラズマガスおよびその流量をAr:1
5リットル/min、H2 :10リットル/minと
し、炭素源ガスおよびその流量をC0:リットル/mi
nとし、アーク電圧70V、アーク電流120A、圧力
200Torrの条件下、装置の運転を開始した。排出
ガスの回収およびリサイクルを行ないつつ、120分間
連続運転してダイヤモンドの合成を行なった。上記合成
の結果、Mo基板上に250mgのダイヤモンド(膜)
が得られた。合成中は、プラズマは安定しており、電圧
の変動は5%以内であった。また合成後カソードの状態
を調べたところカソードはほとんど損傷(溶融)してい
なかった。Example 2 In the diamond synthesizing apparatus shown in FIG. 1, as a cathode, one obtained by sintering HfC (hafnium carbide) powder in a pellet form and silver-brazing it on a copper holder for water cooling was used. Plasma gas and its flow rate are Ar: 1
5 liter / min, H 2 : 10 liter / min, and the carbon source gas and its flow rate were C 0: liter / mi
The operation of the apparatus was started under the conditions of an arc voltage of 70 V, an arc current of 120 A, and a pressure of 200 Torr. Diamond was synthesized by continuously operating for 120 minutes while collecting and recycling the exhaust gas. As a result of the above synthesis, 250 mg of diamond (film) was formed on the Mo substrate.
was gotten. During the synthesis, the plasma was stable and the voltage fluctuation was within 5%. When the state of the cathode after the synthesis was examined, the cathode was scarcely damaged (melted).
【0036】比較例1 図1に示すダイヤモンド合成装置を用意し、カソードと
しては、大きさ7mmφ×10mmで、Th(トリウ
ム)を少量含んだW(タングステン)を使用した。プラ
ズマガスおよびその流量をAr:15リットル/mi
n、H2 :15リットル/minとし、炭素源ガスおよ
びその流量をCH4 :0.01リットル/minとし、
アーク電圧80V、アーク電流120A、圧力200T
orrの条件下、装置の運転を開始した。排出ガスの回
収およびリサイクルを行ないつつ、連続運転してダイヤ
モンドの合成を行なった。その結果、全ガス中における
カソードを溶融させる原因となる炭素源ガス(CH4 )
の量が極少量であるにもかかわらず、カソードは溶融
し、また、溶けたカソードの一部が基板に飛着した。そ
して5分間でさえも安定して合成を行なうことはできな
かった。また、実施例1と同様にして運転開始から10
分後の基板について、SEM観察およびEPMA元素分
析を行なったところ、SEMによって異物が観察され、
EPMA元素分析の結果、この異物はW(タングステ
ン)を含むもの、すなわちカソードからの飛着物である
ことが確認された。Comparative Example 1 The diamond synthesizer shown in FIG. 1 was prepared, and W (tungsten) having a size of 7 mmφ × 10 mm and containing a small amount of Th (thorium) was used as the cathode. Plasma gas and its flow rate are Ar: 15 liters / mi
n, H 2 : 15 liter / min, carbon source gas and its flow rate CH 4 : 0.01 liter / min,
Arc voltage 80V, arc current 120A, pressure 200T
The operation of the device was started under the condition of orr. Diamonds were synthesized by continuous operation while collecting and recycling the exhaust gas. As a result, the carbon source gas (CH 4 ) that causes the melting of the cathode in all the gases
The cathode melted, and a part of the melted cathode splattered on the substrate, although the amount of was very small. And, even for 5 minutes, the synthesis could not be stably performed. In addition, in the same manner as in Example 1, 10 from the start of operation
When SEM observation and EPMA elemental analysis were performed on the substrate after the minute, foreign matter was observed by SEM,
As a result of EPMA elemental analysis, it was confirmed that this foreign substance was a substance containing W (tungsten), that is, a flying substance from the cathode.
【0037】[0037]
【発明の効果】以上説明したように本発明のダイヤモン
ドの合成方法および合成装置によれば、カソードの初期
融点が高く、あるいはダイヤモンドの合成初期の炭化に
よって融点が高くなるので、カソードが劣化することな
く長期間安定してダイヤモンドの合成を行なうことがで
きる。また、排出されたガスを回収しプラズマトーチに
供給してリサイクルを行なう場合であっても、リサイク
ルした炭素源ガスによってカソードが溶融することな
く、したがって長期間安定してリサイクルを行なうこと
が可能となり、コストダウンが図られる。さらに、排出
ガスが出ず環境問題を生ずることもない。また、カソー
ドが溶融してダイヤモンド中に不純物として混入するこ
とがないので、ダイヤモンドの高品質化を図れる。As described above, according to the method and apparatus for synthesizing diamond of the present invention, the initial melting point of the cathode is high, or the melting point is high due to the carbonization at the initial stage of diamond synthesis, so that the cathode is deteriorated. Without this, diamond can be synthesized stably for a long period of time. Further, even when the discharged gas is collected and supplied to the plasma torch for recycling, the recycled carbon source gas does not melt the cathode, and thus stable recycling can be performed for a long period of time. The cost can be reduced. Further, no exhaust gas is emitted and no environmental problem occurs. Further, since the cathode does not melt and mix into diamond as an impurity, the quality of diamond can be improved.
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明のダイヤモンドの合成装置の一例を示す
構成図である。FIG. 1 is a configuration diagram showing an example of a diamond synthesizing apparatus of the present invention.
1…直流(DC)プラズマ装置 2…カソード 3…アノード 4…真空反応容器 7…基板 8…ポンプ DESCRIPTION OF SYMBOLS 1 ... Direct current (DC) plasma device 2 ... Cathode 3 ... Anode 4 ... Vacuum reaction container 7 ... Substrate 8 ... Pump
Claims (6)
って原料ガスを熱プラズマ化し、プラズマジェットとし
て基板に衝突させて急冷し基板上にダイヤモンドを気相
成長させるダイヤモンドの合成方法において、少なくと
も前記陰極の放電表面が、金属を炭化して炭化金属とし
たときの融点が3000℃以上となる金属または融点が
3000℃以上の炭化金属で形成された陰極を用いてダ
イヤモンドの気相合成を行なうことを特徴としたダイヤ
モンドの合成方法。1. A method for synthesizing diamond in which a raw material gas is converted into thermal plasma by direct-current arc discharge between an anode and a cathode, and a plasma jet is made to collide with a substrate to be rapidly cooled to vapor-deposit diamond on the substrate. The vapor phase synthesis of diamond is performed by using a cathode whose discharge surface is formed of a metal having a melting point of 3000 ° C. or higher when the metal is carbonized to form a metal carbide or a metal carbide having a melting point of 3000 ° C. or higher. The method of synthesizing diamonds.
させて再び原料ガスとしてリサイクルして使用すること
を特徴とした請求項1記載のダイヤモンドの合成方法。2. The method for synthesizing diamond according to claim 1, wherein the gas discharged after the reaction is recovered, circulated, and recycled again as a raw material gas for use.
で直流アーク放電を起こさせて原料ガスを熱プラズマ化
し、基板上にダイヤモンドを気相成長させるダイヤモン
ドの合成装置において、少なくとも前記陰極の放電表面
を、金属を炭化して炭化金属としたときの融点が300
0℃以上となる金属または融点が3000℃以上の炭化
金属で形成したことを特徴としたダイヤモンドの合成装
置。3. A diamond synthesizing apparatus having an anode and a cathode, in which direct-current arc discharge is generated between these electrodes to convert a raw material gas into thermal plasma to vapor-deposit diamond on a substrate. When the metal is carbonized to form a metal carbide on the discharge surface, the melting point is 300.
An apparatus for synthesizing diamond, which is formed of a metal having a temperature of 0 ° C. or higher or a metal carbide having a melting point of 3000 ° C. or higher.
のうちから選ばれるいずれか一の金属である請求項3記
載のダイヤモンドの合成装置。4. The diamond synthesizing apparatus according to claim 3, wherein the metal is any one metal selected from Group IVa metals and Group Va metals.
金属のうちから選ばれるいずれか一の金属を炭化したも
のである請求項3記載のダイヤモンドの合成装置。5. The diamond synthesizing apparatus according to claim 3, wherein the metal carbide is obtained by carbonizing any one metal selected from the group IVa metals and the group Va metals.
させる手段を備えたことを特徴とする請求項3,4また
は5記載のダイヤモンドの合成装置。6. The diamond synthesizing apparatus according to claim 3, 4 or 5, further comprising means for collecting and circulating the gas discharged after the reaction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3023959A JPH06135797A (en) | 1991-01-24 | 1991-01-24 | Method and device for synthesizing diamond |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3023959A JPH06135797A (en) | 1991-01-24 | 1991-01-24 | Method and device for synthesizing diamond |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06135797A true JPH06135797A (en) | 1994-05-17 |
Family
ID=12125088
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3023959A Withdrawn JPH06135797A (en) | 1991-01-24 | 1991-01-24 | Method and device for synthesizing diamond |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06135797A (en) |
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