JPH04248871A - Paste of polyimide-based resin and ic using the same paste - Google Patents
Paste of polyimide-based resin and ic using the same pasteInfo
- Publication number
- JPH04248871A JPH04248871A JP3007990A JP799091A JPH04248871A JP H04248871 A JPH04248871 A JP H04248871A JP 3007990 A JP3007990 A JP 3007990A JP 799091 A JP799091 A JP 799091A JP H04248871 A JPH04248871 A JP H04248871A
- Authority
- JP
- Japan
- Prior art keywords
- paste
- fine particles
- polyimide
- polyimide resin
- solvent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
- H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Production Of Multi-Layered Print Wiring Board (AREA)
- Formation Of Insulating Films (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Paints Or Removers (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【0001】0001
【産業上の利用分野】本発明は、スクリーン印刷用オー
バーコート材に適した新規なポリイミド系樹脂ペースト
およびこれを用いたICに関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a new polyimide resin paste suitable as an overcoat material for screen printing and an IC using the same.
【0002】0002
【従来の技術】従来、有機樹脂に微粒子を含有させてな
る樹脂ペーストとしてはエポキシ樹脂、フェノール樹脂
等を用いたものが良く知られている。しかし、これらの
樹脂はいずれも耐熱性が低いために、これを用いたペー
ストは可使温度が高くても300℃程度である。300
℃以上の温度で使用可能なペースト用の樹脂としては、
芳香族ポリイミド樹脂、芳香族ポリアミドイミド樹脂、
芳香族ポリアミド樹脂等の耐熱性樹脂が知られている。2. Description of the Related Art Conventionally, resin pastes made of organic resins containing fine particles using epoxy resins, phenol resins, etc. are well known. However, since all of these resins have low heat resistance, the usable temperature of pastes made using these resins is about 300° C. at most. 300
Paste resins that can be used at temperatures above ℃ include:
aromatic polyimide resin, aromatic polyamideimide resin,
Heat-resistant resins such as aromatic polyamide resins are known.
【0003】しかし、一般に、これらの高分子量の耐熱
性樹脂は、溶剤に対する溶解性が著しく劣り、溶液を高
濃度にすることが困難なため、ペースト中の溶剤量が多
くなり、チキソトロピー性を付与しにくく、また、これ
らを用いたペーストはスクリーン印刷をする際にペース
トが版裏回りし易いこと、厚膜が形成できない等の欠点
を有していた。However, in general, these high molecular weight heat-resistant resins have extremely poor solubility in solvents and it is difficult to make the solution highly concentrated, so the amount of solvent in the paste is large and it is difficult to impart thixotropic properties. In addition, pastes using these have disadvantages such as the paste tends to turn around the plate during screen printing and a thick film cannot be formed.
【0004】一方、従来、微粒子としては無機微粒子と
有機樹脂微粒子が用いられている。この有機樹脂微粒子
としては、高度な耐熱性が要求される用途にはポリイミ
ド樹脂微粒子が用いられている。しかし、これら無機微
粒子やポリイミド樹脂微粒子はいずれも溶剤に不溶なも
のであるため、これを用いたペーストは加熱して得られ
る皮膜中にこれらの微粒子が多量に残存するため、この
皮膜は機械的性質が著しく劣る。機械的性質が十分でな
いと皮膜にクラックが発生し易いので、このような皮膜
を層間絶縁膜表面保護膜に用いた半導体素子は信頼性に
欠ける。On the other hand, inorganic fine particles and organic resin fine particles have conventionally been used as fine particles. As the organic resin fine particles, polyimide resin fine particles are used for applications requiring a high degree of heat resistance. However, since these inorganic fine particles and polyimide resin fine particles are both insoluble in solvents, a large amount of these fine particles remain in the film obtained by heating the paste using them, so this film cannot be mechanically coated. The properties are significantly inferior. If the mechanical properties are not sufficient, cracks are likely to occur in the film, so semiconductor devices using such a film as the interlayer insulating film surface protection film lack reliability.
【0005】[0005]
【発明が解決しようとする課題】本発明はこのような問
題点を解決するものであり、チキソトロピー性を有し、
特にピンホール、空隙の少ない均一な厚膜を形成でき、
印刷性および皮膜の耐熱性、機械的性質に優れたポリイ
ミド系樹脂ペーストおよびこれを用いたICを提供する
ものである。[Problems to be Solved by the Invention] The present invention solves these problems and has thixotropic properties.
In particular, it can form a uniform thick film with few pinholes and voids.
The present invention provides a polyimide resin paste with excellent printability, film heat resistance, and mechanical properties, and an IC using the same.
【0006】[0006]
【課題を解決するための手段】本発明は、芳香族テトラ
カルボン酸二無水物とアルコールとを反応せさて得られ
る芳香族テトラカルボン酸ハーフエステルに芳香族ジア
ミンを混合または反応させて得られる低分子量のポリイ
ミド前駆体、耐熱性樹脂の微粒子および溶剤を含み、加
熱硬化前には微粒子はポリイミド前駆体と溶剤からなる
均一相に対して不均一相として存在し、加熱硬化後には
ポリイミド前駆体および微粒子が均一相として存在する
ようにしたポリイミド系樹脂ペーストおよびこのポリイ
ミド系樹脂ペーストを用いたICに関する。[Means for Solving the Problems] The present invention provides an aromatic tetracarboxylic acid half ester obtained by reacting an aromatic tetracarboxylic dianhydride and an alcohol with an aromatic diamine. Contains a molecular weight polyimide precursor, fine particles of heat-resistant resin, and a solvent. Before heat curing, the fine particles exist as a heterogeneous phase in contrast to a homogeneous phase consisting of the polyimide precursor and solvent, and after heat curing, the polyimide precursor and The present invention relates to a polyimide resin paste in which fine particles exist as a uniform phase and an IC using this polyimide resin paste.
【0007】本発明におけるポリイミド系樹脂ペースト
は、結合材として主に機能するポリイミド前駆体および
溶剤を含む溶液とペーストのチキソトロピー性付与剤と
して主に機能する耐熱性樹脂の微粒子とから構成されて
いる。このペーストにおいて、耐熱性樹脂の微粒子は配
合時にはポリイミド前駆体および溶剤を含む溶液中に分
散してチキソトロピー性を発現し、加熱硬化時には溶剤
に溶解し、次いでポリイミド前駆体またはこれの反応生
成物と相溶成膜化して均一な皮膜を形成する。得られた
皮膜はピンホール、空隙がなく均一であり、機械的性質
に優れる。また、結合材として、低分子量で耐熱性に優
れた骨格をもつポリイミド前駆体を用いるので、印刷性
、耐熱性に優れ、厚膜が形成できる。The polyimide resin paste of the present invention is composed of a solution containing a polyimide precursor and a solvent that mainly functions as a binder, and fine particles of a heat-resistant resin that mainly functions as a thixotropic agent for the paste. . In this paste, the fine particles of heat-resistant resin are dispersed in a solution containing a polyimide precursor and a solvent during blending to develop thixotropic properties, are dissolved in the solvent during heat curing, and are then combined with the polyimide precursor or its reaction product. Forms a uniform film by forming a compatible film. The resulting film is uniform with no pinholes or voids, and has excellent mechanical properties. Furthermore, since a polyimide precursor having a low molecular weight skeleton with excellent heat resistance is used as the binder, it has excellent printability and heat resistance, and a thick film can be formed.
【0008】本発明におけるポリイミド前駆体は、必要
に応じて、溶媒の存在下で芳香族テトラカルボン酸二無
水物と過剰のアルコールを反応させて得られる芳香族テ
トラカルボン酸ハーフエステルに、芳香族テトラカルボ
ン酸ハーフエステルと好ましくはほぼ等モルの芳香族ジ
アミンを混合または反応させて得られる。[0008] The polyimide precursor in the present invention is produced by reacting aromatic tetracarboxylic acid dianhydride with excess alcohol in the presence of a solvent to form an aromatic tetracarboxylic acid half ester, if necessary. It is obtained by mixing or reacting the tetracarboxylic acid half ester with preferably about the same molar amount of aromatic diamine.
【0009】溶媒としては、芳香族テトラカルボン酸二
無水物および芳香族ジアミンを溶解するものであればよ
く、例えばN−メチル−2−ピロリドン、N,N−ジメ
チルホルムアミド、1,3−ジメチル−3,4,5,6
−テトラヒドロ−2(1H)−ピリミジノン、1,3−
ジメチル−2−イミダゾリジノン等の含窒素系溶媒、γ
−ブチロラクトン、γ−カプロラクトン等のラクトン類
、ジエチレングリコールジメチルエーテル、トリエチレ
ングリコールジメチルエーテル等のグライム類が好まし
く用いられる。The solvent may be any solvent as long as it dissolves the aromatic tetracarboxylic dianhydride and the aromatic diamine, such as N-methyl-2-pyrrolidone, N,N-dimethylformamide, 1,3-dimethyl- 3, 4, 5, 6
-tetrahydro-2(1H)-pyrimidinone, 1,3-
Nitrogen-containing solvents such as dimethyl-2-imidazolidinone, γ
Lactones such as -butyrolactone and γ-caprolactone, and glymes such as diethylene glycol dimethyl ether and triethylene glycol dimethyl ether are preferably used.
【0010】芳香族テトラカルボン酸二無水物は、一般
式Aromatic tetracarboxylic dianhydride has the general formula
【化1】
(ここでR1は4価の芳香族炭化水素基である)で示さ
れるものであり、例えば、ピロメリット酸二無水物、3
,3′,4,4′−ベンゾフェノンテトラカルボン酸二
無水物、1,2,5,6−ナフタレンテトラカルボン酸
二無水物、3,3′,4,4′−ビフェニルテトラカル
ボン酸二無水物、4,4′−スルホニルジフタル酸二無
水物、4,4′−オキシジフタル酸二無水物、〔1,3
−ビス(3,4−ジカルボキシフェニル)−1,1,3
,3−テトラメチルジシロキサン〕二無水物、1,1,
1,3,3,3−ヘキサフルオロ−2,2−ビス(3,
4−ジカルボキシフェニル)プロパン二無水物、ビス(
3,4−ジカルボキシフェニル)ジメチルシラン二無水
物などがあり、これらは1種または2種以上が用いられ
る。[Chemical formula 1] (where R1 is a tetravalent aromatic hydrocarbon group), for example, pyromellitic dianhydride, 3
, 3',4,4'-benzophenonetetracarboxylic dianhydride, 1,2,5,6-naphthalenetetracarboxylic dianhydride, 3,3',4,4'-biphenyltetracarboxylic dianhydride , 4,4'-sulfonyldiphthalic dianhydride, 4,4'-oxydiphthalic dianhydride, [1,3
-bis(3,4-dicarboxyphenyl)-1,1,3
, 3-tetramethyldisiloxane] dianhydride, 1,1,
1,3,3,3-hexafluoro-2,2-bis(3,
4-dicarboxyphenyl)propane dianhydride, bis(
Examples include 3,4-dicarboxyphenyl) dimethylsilane dianhydride, and one or more of these may be used.
【0011】また、芳香族テトラカルボン酸二無水物を
ハーフエステル化するアルコールとしては、メタノール
、エタノール、プロパノール、イソプロピルアルコール
、ブタノール、ベンジルアルコール等の1価アルコール
、エチレングリコール、プロピレングリコール、グリセ
リン、トリメチロールプロパン等の多価アルコール、エ
チレングリコールモノメチルエーテル等のセロソルブ類
、ジエチレングリコールモノメチルエーテル等のカルビ
トール類などがあり、これらの1種または2種以上が用
いられる。特に、メタノール、エタノール、ブタノール
等の1価アルコールが好ましく用いられる。[0011] Alcohols for half-esterifying the aromatic tetracarboxylic dianhydride include monohydric alcohols such as methanol, ethanol, propanol, isopropyl alcohol, butanol, and benzyl alcohol, ethylene glycol, propylene glycol, glycerin, and trihydric alcohol. Examples include polyhydric alcohols such as methylolpropane, cellosolves such as ethylene glycol monomethyl ether, and carbitols such as diethylene glycol monomethyl ether, and one or more of these may be used. In particular, monohydric alcohols such as methanol, ethanol, and butanol are preferably used.
【0012】また、本発明に用いられる芳香族ジアミン
は一般式Further, the aromatic diamine used in the present invention has the general formula
【化2】
(ここでR2は2価の芳香族炭化水素基である。)で示
されるものであり、例えば、パラフェニレンジアミン、
メタフェニレンジアミン、4,4′−(または3,4′
−,3,3′−2,4′−)、ジアミノジフェニルエー
テル、4,4′−ジアミノジフェニルメタン、4,4′
−ジアミノジフェニルスルホン、4,4′−ジアミノジ
フェニルサルファイド、ベンジジン、1,5−ナフタレ
ンジアミン、2,6−ナフタレンジアミン、2,2−ビ
ス〔4−(4−アミノフェノキシ)フェニル〕プロパン
、4,4′−ジ(4−アミノフェノキシ)フェニルスル
ホン、1,1,1,3,3,3−ヘキサフルオロー2,
2−ビス(4−アミノフェニル)プロパン、3,3′−
ジメチル−4,4′−ジアミノジフェルメタン、3,3
′,5,5′−テトラメチル−4,4′−ジアミノジフ
ェニルメタン、4,4′−ジ(3−アミノフェノキシ)
フェニルスルホン等があり、これらは1種又は2種以上
が用いられる。embedded image (where R2 is a divalent aromatic hydrocarbon group), such as paraphenylenediamine,
metaphenylenediamine, 4,4'-(or 3,4'
-,3,3'-2,4'-), diaminodiphenyl ether, 4,4'-diaminodiphenylmethane, 4,4'
-diaminodiphenylsulfone, 4,4'-diaminodiphenyl sulfide, benzidine, 1,5-naphthalenediamine, 2,6-naphthalenediamine, 2,2-bis[4-(4-aminophenoxy)phenyl]propane, 4, 4'-di(4-aminophenoxy)phenylsulfone, 1,1,1,3,3,3-hexafluoro2,
2-bis(4-aminophenyl)propane, 3,3'-
Dimethyl-4,4'-diaminodifermethane, 3,3
',5,5'-tetramethyl-4,4'-diaminodiphenylmethane, 4,4'-di(3-aminophenoxy)
There are phenyl sulfones and the like, and one type or two or more types of these can be used.
【0013】必要に応じて、上記芳香族ジアミン以外の
脂肪族ジアミン、脂環式ジアミン、複素環式ジアミンお
よび下記一般式[0013] If necessary, aliphatic diamines other than the above aromatic diamines, alicyclic diamines, heterocyclic diamines, and the following general formula
【化3】
(ここで、R3炭素数1〜10の2価の炭化水素基、R
4、R5、R6、R7は炭素数1〜10の1価の炭化水
素基であり、これらは同一であっても相違してもよい。
nは1〜10の整数である。)
のジアミノシロキサンを芳香族ジアミンの50モル%以
下の割合で用いてもよい。ジアミノシロキサンは皮膜と
基材(特にシリコンウェハ)の接着性を高める効果があ
る。[Chemical formula 3] (Here, R3 is a divalent hydrocarbon group having 1 to 10 carbon atoms, R
4, R5, R6, and R7 are monovalent hydrocarbon groups having 1 to 10 carbon atoms, and they may be the same or different. n is an integer from 1 to 10. ) may be used in a proportion of 50 mol% or less of the aromatic diamine. Diaminosiloxane has the effect of increasing the adhesion between the film and the substrate (particularly silicon wafers).
【0014】本発明における芳香族テトラカルボン酸二
無水物のハーフエステル化は、芳香族テトラカルボン酸
二無水物1モルに対し、アルコールを等モルないしは過
剰モル用いて行われる。反応温度は使用する溶媒、アル
コール及びアルコール誘導体によって異なり、特に制限
はないが、例えば3,3′,4,4′−ビフェニルテト
ラカルボン酸二無水物をN−メチル−2−ピロリドン中
でエタノールを用いてハーフエステル化する場合80℃
〜150℃の反応温度が好ましい。また、ハーフエステ
ル化の後、濃度を調整するため過剰のアルコールを除去
してもよい。ハーフエステル化の際の溶媒としては、本
発明における溶剤を用いることもできる。芳香族テトラ
カルボン酸エステルと芳香族ジアミンとの反応の反応温
度は必要な低分子量のポリイミド前駆体、具体的にはポ
リアミド酸エステルオリゴマやポリイミドオリゴマが得
られる温度であればよく、任意である。通常40〜25
0℃、好ましくは60〜200℃の温度が好ましく用い
られる。単に芳香族テトラカルボン酸ハーフエステルと
芳香族ジアミンとを混合する場合は室温付近で混合する
ことが好ましい。The half-esterification of the aromatic tetracarboxylic dianhydride in the present invention is carried out using an equimolar or excess molar amount of alcohol per mole of the aromatic tetracarboxylic dianhydride. The reaction temperature varies depending on the solvent, alcohol and alcohol derivative used, and is not particularly limited. 80℃ for half esterification using
A reaction temperature of ˜150° C. is preferred. Furthermore, after half-esterification, excess alcohol may be removed to adjust the concentration. The solvent used in the present invention can also be used as the solvent for half-esterification. The reaction temperature for the reaction between the aromatic tetracarboxylic acid ester and the aromatic diamine is arbitrary as long as it can provide the necessary low molecular weight polyimide precursor, specifically a polyamic acid ester oligomer or a polyimide oligomer. Usually 40-25
A temperature of 0°C, preferably 60 to 200°C is preferably used. When simply mixing an aromatic tetracarboxylic acid half ester and an aromatic diamine, it is preferable to mix them at around room temperature.
【0015】芳香族テトラカルボン酸ハーフエステルと
芳香族ジアミンの実質的に単体同士の混合物からなるポ
リイミド前駆体がペーストの保存安定性に優れるので好
ましく用いられる。ポリイミド前駆体は低分子量のもの
が用いられる。好ましくは数平均分子量が5000以下
のものが用いられる。低分子量のポリイミド前駆体を用
いることによって、ペーストを高固形分濃度にでき、厚
膜の形成が可能となる。また、ペーストの動的弾性率を
小さくでき、印刷時のペーストの版裏回りを抑制するこ
とが可能となる。[0015] A polyimide precursor consisting of a mixture of aromatic tetracarboxylic acid half ester and aromatic diamine, which are essentially monomers, is preferably used because it has excellent storage stability as a paste. A low molecular weight polyimide precursor is used. Preferably, those having a number average molecular weight of 5,000 or less are used. By using a low molecular weight polyimide precursor, the paste can have a high solids concentration and thick films can be formed. Furthermore, the dynamic elastic modulus of the paste can be reduced, and it is possible to suppress the paste from turning behind the plate during printing.
【0016】本明細書において数平均分子量は、分子量
既知のポリスチレンを検量線とするゲルパーミエイショ
ンクロマトグラフィー法により求めたポリスチレン換算
値である。具体的には、以下の条件で測定した。
装置:日立655A型
カラム:日立化成工業社製 Gelpak GL−
S300
MDT−S(300mm×8mmφ)2本溶離液:テト
ラヒドロフラン/ジメチルホルムアミド=1/1(容量
)、H3PO4(0.06モル/l)/LiBr・
H2O(0.03モル/l)
流量 :1ml/分
検出器:UV(270nm)[0016] In this specification, the number average molecular weight is a polystyrene equivalent value determined by gel permeation chromatography using polystyrene of known molecular weight as a calibration curve. Specifically, the measurement was performed under the following conditions. Equipment: Hitachi 655A column: Gelpak GL- manufactured by Hitachi Chemical Co., Ltd.
S300 MDT-S (300 mm x 8 mmφ) 2 bottles Eluent: Tetrahydrofuran/dimethylformamide = 1/1 (volume), H3PO4 (0.06 mol/l)/LiBr・H2O (0.03 mol/l) Flow rate: 1 ml /min Detector: UV (270nm)
【0017】上記のようにして得られたポリイミド前駆
体は、それ自身が100〜400℃、好ましくは250
〜350℃で加熱硬化することによって、耐熱性、機械
的性質に優れた高分子量のポリイミド樹脂となる。The polyimide precursor obtained as described above has a temperature of 100 to 400°C, preferably 250°C.
By heating and curing at ~350°C, a high molecular weight polyimide resin with excellent heat resistance and mechanical properties is obtained.
【0018】本発明における耐熱性樹脂の微粒子として
は、本質的に溶媒に可溶性の熱可塑性または熱硬化性の
耐熱性樹脂の微粒子が用いられる。耐熱性と機械的性質
の観点から、好ましくは上記したポリアミド樹脂、ポリ
アミドイミド樹脂、ポリイミド樹脂(ポリイミド樹脂の
前駆体であるポリアミド酸樹脂、テトラカルボン酸二無
水物とこの二無水物と錯体を形成しうる溶媒とを反応さ
せて得られる錯体に、ジアミンを混合または反応させた
組成物又はポリアミド酸オリゴマー(この溶媒としては
、好ましくはN−メチル−2−ピロリドン、ピリジン、
ε−カプロラクタム等が用いられる)を含む)の微粒子
が用いられる。The heat-resistant resin fine particles used in the present invention are essentially solvent-soluble thermoplastic or thermosetting heat-resistant resin fine particles. From the viewpoint of heat resistance and mechanical properties, the above-mentioned polyamide resins, polyamideimide resins, polyimide resins (polyamic acid resins that are precursors of polyimide resins, and tetracarboxylic dianhydrides form a complex with this dianhydride. A composition obtained by mixing or reacting a diamine with a complex obtained by reacting a complex with a suitable solvent or a polyamic acid oligomer (the solvent is preferably N-methyl-2-pyrrolidone, pyridine,
Fine particles of ε-caprolactam (including ε-caprolactam, etc.) are used.
【0019】耐熱性樹脂の微粒子はペーストにチキソト
ロピー性を付与し、また、ペーストを高固形分濃度化し
て厚膜を形成する目的で用いられる。耐熱性樹脂の微粒
子としては、平均粒子径が40μm以下であるポリアミ
ド樹脂、ポリアミドイミド樹脂およびポリイミド樹脂が
好ましく用いられる。本発明におけるペーストをスクリ
ーン印刷に用いる場合、ペーストのチキソトロピー性、
皮膜の均一性及び膜厚との調和を考慮すると耐熱性樹脂
の微粒子は、好ましくは平均粒子径が0.1〜10μm
とされる。The fine particles of heat-resistant resin are used for the purpose of imparting thixotropy to the paste and increasing the solid content of the paste to form a thick film. As the heat-resistant resin fine particles, polyamide resins, polyamideimide resins, and polyimide resins having an average particle diameter of 40 μm or less are preferably used. When the paste of the present invention is used for screen printing, the thixotropic property of the paste,
Considering the uniformity of the film and the harmony with the film thickness, the heat-resistant resin fine particles preferably have an average particle diameter of 0.1 to 10 μm.
It is said that
【0020】耐熱性樹脂の微粒子は非水分散重合法や沈
殿重合法で得ることができるが、他の方法、例えば樹脂
溶液から回収した粉末を機械粉砕する方法、樹脂溶液に
貧溶媒を加えながら高せん断下に微粒子化する方法、樹
脂溶液の噴霧油滴を乾燥して微粒子を得る方法等があり
、任意の方法が用いられる。Fine particles of heat-resistant resin can be obtained by a non-aqueous dispersion polymerization method or a precipitation polymerization method, but other methods are also available, for example, by mechanically pulverizing powder recovered from a resin solution, or by adding a poor solvent to a resin solution. Any method can be used, including a method of forming fine particles under high shear, and a method of drying sprayed oil droplets of a resin solution to obtain fine particles.
【0021】熱硬化性と熱可塑性の耐熱性樹脂の微粒子
の熱分解開始温度は、好ましくは250℃以上、特に好
ましくは350℃以上であり、ガラス転移温度は好まし
くは200℃以上、特に好ましくは260℃以上であり
、これらは単独で又は混合して用いられる。The thermal decomposition initiation temperature of the fine particles of thermosetting and thermoplastic heat-resistant resins is preferably 250°C or higher, particularly preferably 350°C or higher, and the glass transition temperature is preferably 200°C or higher, particularly preferably The temperature is 260°C or higher, and these are used alone or in combination.
【0022】本発明における溶剤は、例えば「溶剤ハン
ドブック」(講談社、1976年刊行)の143〜85
2頁に掲載されている溶剤が用いられる。例えばN−メ
チル−2−ピロリドン、ジメチルアセトアミド、ジメチ
ルホルムアミド、1,3−ジメチル−3,4,5,6−
テトラヒドロ−2(1H)−ピリミジノン、1,3−ジ
メチル−2−イミダゾリジノン等の含窒素化合物、スル
ホラン、ジメチルスルホキシド等の硫黄化合物、γ−ブ
チロラクトン、γ−バレロラクトン、γ−カプロラクト
ン、γ−ヘプタラクトン、α−アセチル−γ−ブチロラ
クトン、ε−カプロラクトン等のラクトン類、ジオキサ
ン、1,2−ジメトキシエタン、ジエチレングリコール
ジメチル(又はジエチル、ジプロピル、ジブチル)エー
テル、トリエチレングリコールジメチル(又はジエチル
、ジプロピル、ジブチル)エーテル、テトラエチレング
リコールジメチル(又はジエチル、ジプロピル、ジブチ
ル)エーテル等のエーテル類、メチルエチルケトン、メ
チルイソブチルケトン、シクロヘキサノン、アセトフェ
ノン等のケトン類、ブタノール、オクチルアルコール、
エチレングリコール、グリセリン、ジエチレングリコー
ルモノメチル(又はモノエチル)エーテル、トリエチレ
ングリコールモノメチル(又はモノエチル)エーテル、
テトラエチレングリコールモノメチル(又はモノエチル
)エーテル等のアルコール類、フェノール、クレゾール
、キシレノール等のフェノール類、酢酸エチル、酢酸ブ
チル、エチルセロソルブアセテート、ブチルセロソルブ
アセテート等のエステル類、トルエン、キシレン、ジエ
チルベンゼン、シクロヘキサン等の炭化水素類、トリク
ロロエタン、テトラクロロエタン、モノクロロベンゼン
等のハロゲン化炭化水素類などが用いられる。The solvent used in the present invention can be used, for example, in ``Solvent Handbook'' (Kodansha, published in 1976), 143-85.
The solvents listed on page 2 are used. For example, N-methyl-2-pyrrolidone, dimethylacetamide, dimethylformamide, 1,3-dimethyl-3,4,5,6-
Nitrogen-containing compounds such as tetrahydro-2(1H)-pyrimidinone and 1,3-dimethyl-2-imidazolidinone, sulfur compounds such as sulfolane and dimethyl sulfoxide, γ-butyrolactone, γ-valerolactone, γ-caprolactone, γ- Lactones such as heptalactone, α-acetyl-γ-butyrolactone, and ε-caprolactone, dioxane, 1,2-dimethoxyethane, diethylene glycol dimethyl (or diethyl, dipropyl, dibutyl) ether, triethylene glycol dimethyl (or diethyl, dipropyl, ethers such as dibutyl) ether, tetraethylene glycol dimethyl (or diethyl, dipropyl, dibutyl) ether, ketones such as methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone, acetophenone, butanol, octyl alcohol,
Ethylene glycol, glycerin, diethylene glycol monomethyl (or monoethyl) ether, triethylene glycol monomethyl (or monoethyl) ether,
Alcohols such as tetraethylene glycol monomethyl (or monoethyl) ether, phenols such as phenol, cresol, xylenol, esters such as ethyl acetate, butyl acetate, ethyl cellosolve acetate, butyl cellosolve acetate, toluene, xylene, diethylbenzene, cyclohexane, etc. Hydrocarbons, halogenated hydrocarbons such as trichloroethane, tetrachloroethane, and monochlorobenzene are used.
【0023】溶剤の沸点はスクリーン印刷時のペースト
の可使時間を考慮すると100℃以上、特に150℃以
上であることが好ましい。The boiling point of the solvent is preferably 100° C. or higher, particularly 150° C. or higher, considering the pot life of the paste during screen printing.
【0024】本発明になるポリイミド系樹脂ペーストは
、加熱硬化前には微粒子はポリイミド前駆体と溶剤から
なる均一相に対して不均一相として存在し、加熱硬化後
にはポリイミド前駆体、微粒子および溶剤が均一相とし
て存在するように、ポリイミド前駆体、耐熱性樹脂の微
粒子及び溶剤の組成を調整することにより得られる。In the polyimide resin paste of the present invention, before heat curing, the fine particles exist as a heterogeneous phase in contrast to the homogeneous phase consisting of the polyimide precursor and solvent, and after heat curing, the polyimide precursor, fine particles, and solvent It can be obtained by adjusting the composition of the polyimide precursor, heat-resistant resin fine particles, and solvent so that it exists as a homogeneous phase.
【0025】すなわち、ポリイミド前駆体と耐熱性樹脂
の微粒子とは加熱硬化時に互いに相溶する性質をもつも
のが好ましく用いられる。ポリイミド前駆体は溶剤に対
して室温及び加熱硬化時によく溶解するものが好ましく
用いられる。耐熱性樹脂の微粒子は溶剤に対して室温で
は溶解しないが、加熱硬化時には溶解するものが好まし
く用いられる。このような溶剤としては、単独溶剤また
は2種類以上の溶剤からなる混合溶剤が用いられる。単
独溶剤としては、耐熱性樹脂の微粒子に対する溶解性の
温度依存性が強いもの、すなわち、室温ではほとんど溶
解性を示さず、加熱硬化時に良好な溶解性を示すものが
好ましく用いられる。また、混合溶剤としては、溶解性
と乾燥性が異なる2種類の溶剤、すなわち耐熱性樹脂の
微粒子に対して、良好な溶解性を示す良溶剤と溶解性を
示さない貧溶剤に相当するそれぞれ高沸点、ならびに低
沸点の2種類の溶剤からなる混合溶剤が好ましく用いら
れる。良溶剤の沸点は貧溶剤の沸点よりも高い、好まし
くは5℃、より好ましくは20℃高いものが好ましく用
いられる。この場合、耐熱性樹脂の微粒子はこの混合溶
剤に対して、室温では不溶であって、加熱時には溶解す
るように良溶剤と貧溶剤との使用割合を調節する。こう
することによって微粒子は保管および印刷時にはペース
ト中に安定に分散し、印刷後加熱すると低沸点の貧溶剤
がまずペーストから揮散除去され、微粒子は残存する高
沸点良溶剤に溶解する。次いでポリイミド前駆体または
これの反応生成物と均一に相溶・成膜化するので、ピン
ホールや空隙がなく均一であり、機械的性質に優れた皮
膜が得られる。That is, it is preferable to use polyimide precursors and heat-resistant resin particles that have the property of being compatible with each other during heat curing. Preferably, the polyimide precursor is one that dissolves well in the solvent at room temperature and during heat curing. Preferably, the fine particles of the heat-resistant resin are those that do not dissolve in the solvent at room temperature, but dissolve during heat curing. As such a solvent, a single solvent or a mixed solvent consisting of two or more types of solvents may be used. As the sole solvent, it is preferable to use a solvent whose solubility in the fine particles of the heat-resistant resin is strongly dependent on temperature, that is, one which exhibits almost no solubility at room temperature and exhibits good solubility during heat curing. In addition, as a mixed solvent, two types of solvents with different solubility and drying properties are used: a good solvent that shows good solubility for heat-resistant resin fine particles, and a poor solvent that does not show solubility. A mixed solvent consisting of two types of solvents, one with a boiling point and one with a low boiling point, is preferably used. The boiling point of the good solvent is higher than the boiling point of the poor solvent, preferably 5°C, more preferably 20°C higher. In this case, the ratio of the good solvent to the poor solvent is adjusted so that the fine particles of the heat-resistant resin are insoluble in the mixed solvent at room temperature but dissolve when heated. By doing so, the fine particles are stably dispersed in the paste during storage and printing, and when heated after printing, the low boiling point poor solvent is first volatilized and removed from the paste, and the fine particles are dissolved in the remaining high boiling point good solvent. Then, it is uniformly dissolved and formed into a film with the polyimide precursor or its reaction product, resulting in a uniform film with no pinholes or voids and excellent mechanical properties.
【0026】本発明においては、ポリイミド前駆体と溶
剤との溶液に耐熱性樹脂の微粒子を分散させることによ
ってポリイミド系樹脂ペーストが得られる。In the present invention, a polyimide resin paste is obtained by dispersing fine particles of a heat-resistant resin in a solution of a polyimide precursor and a solvent.
【0027】ポリイミド前駆体と耐熱性樹脂の微粒子の
割合は、好ましくは総量を100重量部として、ポリイ
ミド前駆体5〜70重量部に対して耐熱性樹脂の微粒子
95〜30重量部が用いられる。耐熱性樹脂の微粒子の
割合を多くするとチキソトロピー性と乾燥膜厚を増大で
きる。The ratio of the polyimide precursor to the heat-resistant resin fine particles is preferably such that the total amount is 100 parts by weight, and 95 to 30 parts by weight of the heat-resistant resin fine particles are used for 5 to 70 parts by weight of the polyimide precursor. Increasing the proportion of fine particles of heat-resistant resin can increase thixotropy and dry film thickness.
【0028】ペーストのチキソトロピー係数はE型粘度
計(東京計器社製、EHD−U型)を用いて試料量0.
4g、測定温度25℃で測定した。回転数1rpmと1
0rpmのペーストのみかけ粘度、η1とη10の比、
η1/η10として表わされる。The thixotropic coefficient of the paste was determined using an E-type viscometer (Model EHD-U, manufactured by Tokyo Keiki Co., Ltd.) using a sample amount of 0.
4g, measured at a measurement temperature of 25°C. Rotation speed 1 rpm and 1
Apparent viscosity of paste at 0 rpm, ratio of η1 and η10,
It is expressed as η1/η10.
【0029】ポリイミド前駆体と耐熱性樹脂の微粒子の
ペースト中の濃度は、好ましくはペーストの粘度が30
〜10,000ポアズ、チキソトロピー係数が1.5以
上となるように調製される。ペーストの粘度が30ポア
ズ未満であると印刷後のペーストにだれが生じ易く、1
0,000ポアズを越えると印刷の作業性が低下する。
特に好ましくは300〜5,000ポアズとされる。具
体的には、ポリイミド前駆体と耐熱性樹脂の微粒子の総
和のペースト中の濃度は、好ましくは10〜90重量%
とされる。10重量%未満であると乾燥膜厚を厚くしに
くくなり、90重量%を越えるとペーストの流動性が損
なわれる。The concentration of the polyimide precursor and heat-resistant resin fine particles in the paste is preferably such that the viscosity of the paste is 30.
~10,000 poise and a thixotropy coefficient of 1.5 or more. If the viscosity of the paste is less than 30 poise, the paste tends to sag after printing;
If it exceeds 0,000 poise, printing workability will decrease. Particularly preferably, it is 300 to 5,000 poise. Specifically, the total concentration of the polyimide precursor and heat-resistant resin fine particles in the paste is preferably 10 to 90% by weight.
It is said that If it is less than 10% by weight, it will be difficult to increase the dry film thickness, and if it exceeds 90% by weight, the fluidity of the paste will be impaired.
【0030】耐熱性樹脂の微粒子をポリイミド前駆体及
び溶剤を含む溶液中に分散させる方法としては通常、塗
料分野で行われているロール練り、ミキサー混合などが
適用され、十分な分散が行われる方法であれば特に制限
はない。三本ロールによる複数回の混練が最も好ましい
。[0030] As a method for dispersing heat-resistant resin fine particles in a solution containing a polyimide precursor and a solvent, roll kneading, mixer mixing, etc., which are usually used in the paint field, are applied, and methods that ensure sufficient dispersion are used. If so, there are no particular restrictions. Most preferred is multiple kneading using three rolls.
【0031】本発明におけるペーストのチキソトロピー
係数は1.5以上とすることが好ましい。1.5未満で
あると基板に転写されたペーストにだれが発生し易く、
十分なパターン精度が得られにくい。本発明のペースト
は基材に塗布された後、好ましくは最終的に150〜5
00℃で1〜120分間加熱硬化することによって強じ
んな膜を形成させることができる。[0031] The thixotropy coefficient of the paste in the present invention is preferably 1.5 or more. If it is less than 1.5, sagging is likely to occur in the paste transferred to the substrate,
It is difficult to obtain sufficient pattern accuracy. After the paste of the present invention is applied to the substrate, it preferably has a final
A tough film can be formed by heating and curing at 00°C for 1 to 120 minutes.
【0032】本発明のペーストには、必要に応じて消泡
剤、顔料、塗料、可塑剤、酸化防止剤などを併用しても
よい。[0032] The paste of the present invention may contain antifoaming agents, pigments, paints, plasticizers, antioxidants, and the like, if necessary.
【0033】本発明になるポリイミド系樹脂ペーストは
シリコンウエハを基板としたモノリシックIC、セラミ
ック基板やガラス基板を用いるハイブリッドIC、サー
マルヘッド、イメージセンサー、マルチチツプ高密度実
装基板等のデバイス、フレキシブル配線板、リジット配
線板等の各種配線板などの層間絶縁膜及び/又は表面保
護膜、各種耐熱印字用インク、耐熱接着剤などに広く利
用でき、工業的に極めて有用である。The polyimide resin paste of the present invention can be used for devices such as monolithic ICs using silicon wafers as substrates, hybrid ICs using ceramic or glass substrates, thermal heads, image sensors, multi-chip high-density mounting boards, flexible wiring boards, It can be widely used in interlayer insulating films and/or surface protective films of various wiring boards such as rigid wiring boards, various heat-resistant printing inks, heat-resistant adhesives, etc., and is extremely useful industrially.
【0034】本発明になるポリイミド系樹脂ペーストを
、モノリシックIC等の半導体装置の保護膜に用いる場
合には、ウラン、トリウム等のα線源物質、ナトリウム
、カリウム、銅、鉄等のイオン性不純物などの含量を少
なくすることが好ましい。保護膜のウラン、トリウム等
のα線源物質の総含量は1ppb以下が好ましく、より
好ましくは0.2ppb以下とされる。これは0.2乃
至1ppbを境にして保護膜から放射されるα線の素子
の誤動作に対する影響が急激に減少するからである。
得られた保護膜のウラン、トリウム等のα線源物質の総
含量が0.2乃至1ppbを越える場合には、前記樹脂
の製造に用いられるモノマ、溶剤、樹脂の精製等に用い
られる沈殿剤、有機液体等を精製することによりウラン
、トリウム等のα線源物質の総含量を減少させることが
できる。精製は、樹脂の製造に用いられるモノマ、溶剤
、樹脂の精製等に用いられる沈殿剤、有機液体等を蒸留
、昇華、再結晶、抽出などによって、また、合成した樹
脂溶液を精製した貧溶媒中に沈殿させる工程を複数回行
うことが便利である。When the polyimide resin paste of the present invention is used as a protective film for a semiconductor device such as a monolithic IC, α-ray source substances such as uranium and thorium, and ionic impurities such as sodium, potassium, copper, and iron can be used. It is preferable to reduce the content of . The total content of α-ray source substances such as uranium and thorium in the protective film is preferably 1 ppb or less, more preferably 0.2 ppb or less. This is because the influence of the alpha rays emitted from the protective film on malfunction of the device decreases rapidly at 0.2 to 1 ppb. If the total content of α-ray source substances such as uranium and thorium in the obtained protective film exceeds 0.2 to 1 ppb, the monomers used in the production of the resin, the solvent, the precipitant used in the purification of the resin, etc. By purifying organic liquids, etc., the total content of α-ray source substances such as uranium and thorium can be reduced. Purification is carried out by distilling, sublimating, recrystallizing, extracting, etc. the monomers, solvents, precipitants used for resin purification, organic liquids, etc. used in the production of resin, or by purifying the synthesized resin solution in a purified poor solvent. It is convenient to perform the precipitation step multiple times.
【0035】また、使用時の腐食、リークなどを少なく
するため、ナトリウム、カリウム、銅、鉄等のイオン性
不純物の含量は2ppm以下が好ましく、より好ましく
は1ppm以下とされる。得られた皮膜のイオン性不純
物の総含量が1乃至2ppmを超える場合には、上記の
樹脂の製造に用いられるモノマ等を上記の精製と同じ工
程で精製することによりイオン性不純物の総含量を減少
させることができる。精製は必ずしも用いられるモノマ
等の全てについて行う必要はない。例えばモノマのみあ
るいはモノマおよび溶剤についてのみ精製を行ってもよ
い。Furthermore, in order to reduce corrosion and leakage during use, the content of ionic impurities such as sodium, potassium, copper, iron, etc. is preferably 2 ppm or less, more preferably 1 ppm or less. If the total content of ionic impurities in the obtained film exceeds 1 to 2 ppm, the total content of ionic impurities can be reduced by refining the monomers used in the production of the above resin in the same process as the above purification. can be reduced. It is not necessary to purify all of the monomers used. For example, purification may be performed only on the monomer or only on the monomer and the solvent.
【0036】本発明におけるICとしては、モノリシッ
クIC、ハイブリッドIC、マルチチツプ高密度実装基
板等がある。The IC used in the present invention includes a monolithic IC, a hybrid IC, a multi-chip high-density mounting board, and the like.
【0037】モノリシックICは、例えば第1図に示す
構造を有するもので、本発明になるポリイミド系樹脂ペ
ーストはLSIチップ2の上に塗工され加熱されてポリ
イミド系樹脂皮膜1(表面保護膜)とされる。The monolithic IC has the structure shown in FIG. 1, for example, and the polyimide resin paste of the present invention is applied onto the LSI chip 2 and heated to form the polyimide resin film 1 (surface protection film). It is said that
【0038】図1において、1はポリイミド系樹脂皮膜
、2はLSIチップ、3はボンディングワイヤ、4は樹
脂パッケージ、5はリード、6は支持体である。ハイブ
リッドICは、例えば図2に示す構造を有するもので、
第1層配線11および抵抗層12の上に、本発明になる
ポリイミド系樹脂ペーストを塗工、加熱してポリイミド
系樹脂皮膜10(層間絶縁膜)とされる。この上に、第
2層配線9が形成される。図2において、7はダイオー
ドチップ、8ははんだ、9は第2層配線、10はポリイ
ミド系樹脂皮膜、11は第1層配線、12は抵抗層、1
3はアルミナ基板である。In FIG. 1, 1 is a polyimide resin film, 2 is an LSI chip, 3 is a bonding wire, 4 is a resin package, 5 is a lead, and 6 is a support. The hybrid IC has the structure shown in FIG. 2, for example,
A polyimide resin paste according to the present invention is applied onto the first layer wiring 11 and the resistance layer 12 and heated to form a polyimide resin film 10 (interlayer insulation film). A second layer wiring 9 is formed on this. In FIG. 2, 7 is a diode chip, 8 is solder, 9 is a second layer wiring, 10 is a polyimide resin film, 11 is a first layer wiring, 12 is a resistance layer, 1
3 is an alumina substrate.
【0039】マルチチツプ高密度実装基板は、例えば図
3に示す構造を有するもので、セラミック多層配線板2
0の上に公知の方法により配線層15、16の形成、本
発明になるポリイミド系樹脂ペーストの塗工、加熱によ
るポリイミド系樹脂皮膜14(層間絶縁膜)の形成等を
くり返して、銅/ポリイミド系樹脂多層配線層19が形
成される。図3において、17はLSIチップ、18は
はんだである。The multi-chip high-density mounting board has, for example, the structure shown in FIG.
0 by a known method, coating the polyimide resin paste of the present invention, and forming a polyimide resin film 14 (interlayer insulation film) by heating, etc., the copper/polyimide A resin multilayer wiring layer 19 is formed. In FIG. 3, 17 is an LSI chip and 18 is a solder.
【0040】[0040]
【実施例】次に、本発明を比較例、実施例によって説明
する。[Examples] Next, the present invention will be explained with reference to comparative examples and examples.
【0041】比較例1
(1)ポリイミド樹脂の調製
温度計、かきまぜ機、窒素導入管をつけた四つ口フラス
コに窒素ガスを通しながら、3,3´,4,4´−ベン
ゾフェノンテトラカルボン酸二無水物11.729g(
0.0364モル)、2,4´−ジアミノジフェニルエ
ーテル7.289g(0.0364モル)とN−メチル
−2−ピロリドン72gを仕込んだ。撹拌下、室温で2
0時間反応を進めた。次いで無水酢酸52gとピリジン
26gを添加し、室温で12時間放置した。得られた溶
液をメタノール中に投入し、沈殿した微粒子状の固形樹
脂を回収した。この固形樹脂をメタノールで十分に煮沸
洗浄した後、80℃で10時間減圧乾燥して粉末の下式
のくり返し単位を有するN−メチル−2−ピロリドンに
可溶なポリイミド樹脂(数平均分子量:35,000)
を得た。Comparative Example 1 (1) Preparation of polyimide resin 3,3',4,4'-benzophenonetetracarboxylic acid was added while passing nitrogen gas through a four-necked flask equipped with a thermometer, a stirrer, and a nitrogen inlet tube. Dianhydride 11.729g (
0.0364 mol), 7.289 g (0.0364 mol) of 2,4'-diaminodiphenyl ether, and 72 g of N-methyl-2-pyrrolidone were charged. 2 at room temperature under stirring
The reaction proceeded for 0 hours. Next, 52 g of acetic anhydride and 26 g of pyridine were added, and the mixture was left at room temperature for 12 hours. The obtained solution was poured into methanol, and the precipitated solid resin in the form of fine particles was recovered. After thoroughly boiling and washing this solid resin with methanol, it was dried under reduced pressure at 80°C for 10 hours to obtain a powder of a polyimide resin soluble in N-methyl-2-pyrrolidone (number average molecular weight: 35 ,000)
I got it.
【化4】[C4]
【0042】(2)ポリイミド樹脂微粒子の調製温度計
、かきまぜ機、窒素導入管および水分定量器をつけた四
つ口フラスコ内に窒素ガスを通しながらピロメリット酸
二無水物218g(1モル)とN−メチル−2−ピロリ
ドン(水分0.03%)1672gを入れ、撹拌しなが
ら50℃に昇温し、同温度で0.5時間保ち完全に溶解
して均一な溶液とした。これに4,4´−ジアミノジフ
ェニルエーテル100g(0.5モル)と4,4´−ジ
アミノジフェニルメタン99g(0.5モル)を加え、
ただちに110℃に昇温し、同温度で20分間保ち完全
に溶解して均一な溶液とした。ついで、約2時間で20
0℃に昇温し、同温度で3時間反応させた。途中、約1
40℃でポリイミド樹脂の微粒子の析出が観察された。
また、反応中、留出する水はすみやかに系外に除去した
。N−メチル−2−ピロリドン中に分散した黄褐色のポ
リイミド樹脂の微粒子を得たので、これを濾過によって
回収し、更にアセトン煮沸を2回繰り返した後、減圧下
、200℃で5時間乾燥させた。このポリイミド樹脂微
粒子の形状はほぼ球形、多孔性であって、平均粒子径(
コールターエレクトロニクス社製TA−II型による。
以下同じ)は8μm、最大粒子径は40μm以下であっ
た。このポリイミド樹脂微粒子はN−メチル−2−ピロ
リドンに不溶で、次式のくり返し単位を有するものであ
る。(2) Preparation of polyimide resin fine particles 218 g (1 mol) of pyromellitic dianhydride and 218 g (1 mol) of pyromellitic dianhydride were passed through a four-necked flask equipped with a thermometer, stirrer, nitrogen inlet tube, and moisture meter. 1672 g of N-methyl-2-pyrrolidone (water content 0.03%) was added, and the temperature was raised to 50° C. while stirring, and the temperature was maintained at the same temperature for 0.5 hours to completely dissolve and form a homogeneous solution. To this, 100 g (0.5 mol) of 4,4'-diaminodiphenyl ether and 99 g (0.5 mol) of 4,4'-diaminodiphenylmethane were added,
The temperature was immediately raised to 110° C. and kept at the same temperature for 20 minutes to completely dissolve and form a uniform solution. Then, in about 2 hours, 20
The temperature was raised to 0°C, and the reaction was continued at the same temperature for 3 hours. On the way, about 1
Precipitation of fine particles of polyimide resin was observed at 40°C. Additionally, water distilled out during the reaction was promptly removed from the system. Fine particles of yellow-brown polyimide resin dispersed in N-methyl-2-pyrrolidone were obtained, which were collected by filtration, further boiled in acetone twice, and then dried at 200°C under reduced pressure for 5 hours. Ta. The shape of the polyimide resin fine particles is approximately spherical, porous, and has an average particle diameter (
Based on TA-II model manufactured by Coulter Electronics. (same below) was 8 μm, and the maximum particle size was 40 μm or less. This polyimide resin fine particle is insoluble in N-methyl-2-pyrrolidone and has a repeating unit of the following formula.
【化5】[C5]
【0043】(3)ポリイミド樹脂ペーストの調製上記
(1)の可溶性のポリイミド樹脂15gをN−メチル−
2−ピロリドン60gに溶解した溶液に上記(2)で調
製したポリイミド樹脂微粒子25gを加え、まず、乳鉢
で粗混練し、ついで高速の三本ロールを用いて6回通し
て混練し、ポリイミド樹脂微粒子が分散したポリイミド
樹脂ペーストを得た。(3) Preparation of polyimide resin paste 15 g of the soluble polyimide resin from (1) above was mixed with N-methyl-
25 g of the polyimide resin fine particles prepared in (2) above were added to a solution dissolved in 60 g of 2-pyrrolidone, and first roughly kneaded in a mortar and then kneaded by passing it through six times using a high-speed triple roll to form the polyimide resin fine particles. A polyimide resin paste containing dispersed polyimide resin was obtained.
【0044】比較例2
(1)ポリイミド樹脂微粒子の調製
温度計、かきまぜ機、窒素導入管をつけた四つ口フラス
コに窒素ガスを通しながら、3,3´,4,4´−ビフ
ェニルテトラカルボン酸二無水物10.711g(0.
0364モル)、2,4´−ジアミノジフェニルエーテ
ル7.289g(0.0364モル)とN−メチル−2
−ピロリドン72gを仕込んだ。撹拌下、室温で10時
間反応を進めた。次いで無水酢酸52gとピリジン26
gを添加し、室温で12時間放置した。得られたペース
トをメタノール中に投入し、沈殿した微粒子状の固形樹
脂を回収した。この固形樹脂をメタノールで十分に煮沸
洗浄した後、80℃で10時間減圧乾燥して粉末の下式
のくり返し単位を有するポリイミド樹脂(数平均分子量
:31,000)を得た。このポリイミド樹脂を粉砕機
で粉末化し、平均粒子径4.5μm、最大粒子径40μ
m以下のN−メチル−2−ピロリドン等の含窒素系溶剤
に可溶でブチルセロソルブアセテート等のセロソルブ類
に不溶の次式のくり返し単位を有するポリイミド樹脂微
粒子を得た。Comparative Example 2 (1) Preparation of polyimide resin fine particles 3,3',4,4'-biphenyltetracarboxylic acid was added while passing nitrogen gas through a four-necked flask equipped with a thermometer, a stirrer, and a nitrogen inlet tube. Acid dianhydride 10.711g (0.
0364 mol), 7.289 g (0.0364 mol) of 2,4'-diaminodiphenyl ether and N-methyl-2
- 72g of pyrrolidone was charged. The reaction was allowed to proceed for 10 hours at room temperature under stirring. Next, 52 g of acetic anhydride and 26 g of pyridine
g was added and left at room temperature for 12 hours. The resulting paste was poured into methanol, and the precipitated solid resin in the form of fine particles was recovered. This solid resin was sufficiently boiled and washed with methanol, and then dried under reduced pressure at 80° C. for 10 hours to obtain a powdered polyimide resin (number average molecular weight: 31,000) having repeating units of the following formula. This polyimide resin is pulverized using a pulverizer, with an average particle size of 4.5 μm and a maximum particle size of 40 μm.
Polyimide resin microparticles having repeating units of the following formula, which are soluble in nitrogen-containing solvents such as N-methyl-2-pyrrolidone and insoluble in cellosolves such as butyl cellosolve acetate, were obtained.
【化6】[C6]
【0045】(2)ポリイミド樹脂ペーストの調製比較
例1、(1)で調製した可溶性のポリイミド樹脂12g
を1,3−ジメチル−3,4,5,6−テトラヒドロ−
2(1H)−ピリミジノン28gとブチルセロソルブア
セテート42gとの混合溶剤に溶解した溶液に、上記(
1)で調製したポリイミド樹脂微粒子18gを加え、ま
ず、乳鉢で粗混練し、ついで高速の三本ロールを用いて
6回通して混練し、ポリイミド樹脂微粒子が分散したポ
リイミド樹脂ペーストを得た。(2) Preparation of polyimide resin paste Comparative Example 1, 12 g of the soluble polyimide resin prepared in (1)
1,3-dimethyl-3,4,5,6-tetrahydro-
The above (
18 g of the polyimide resin fine particles prepared in 1) were added and first roughly kneaded in a mortar and then kneaded six times using a high-speed triple roll to obtain a polyimide resin paste in which the polyimide resin fine particles were dispersed.
【0046】実施例1
(1)ポリイミド前駆体の調製
温度計、かきまぜ機、窒素導入管および冷却管をそなえ
た四つ口フラスコ内に3,3´,4,4´−ベンゾフェ
ノンテトラカルボン酸二無水物32.223g(0.1
000モル)、3,3´,4,4´−ビフェニルテトラ
カルボン酸二無水物264.801g(0.9000モ
ル)、エタノール92.601g(2.01モル)とN
−メチル−2−ピロリドン589gを仕込み、かきまぜ
ながら加熱し、100℃に昇温した。同温度で3時間反
応させて芳香族テトラカルボン酸ハーフエステルを得た
。室温に冷却後、4,4´−ジアミノジフェニルエーテ
ル200.240g(1.000モル)を仕込み溶解し
てポリイミド前駆体(数平均分子量:1,000)の溶
液(固形分濃度:50重量%)を得た。Example 1 (1) Preparation of polyimide precursor 3,3',4,4'-benzophenonetetracarboxylic acid dihydrate was placed in a four-necked flask equipped with a thermometer, a stirrer, a nitrogen introduction tube, and a cooling tube. Anhydride 32.223g (0.1
000 mol), 264.801 g (0.9000 mol) of 3,3',4,4'-biphenyltetracarboxylic dianhydride, 92.601 g (2.01 mol) of ethanol and N
-Methyl-2-pyrrolidone (589 g) was charged and heated while stirring to raise the temperature to 100°C. The mixture was reacted at the same temperature for 3 hours to obtain an aromatic tetracarboxylic acid half ester. After cooling to room temperature, 200.240 g (1.000 mol) of 4,4'-diaminodiphenyl ether was charged and dissolved to form a solution (solid content concentration: 50% by weight) of polyimide precursor (number average molecular weight: 1,000). Obtained.
【0047】(2)耐熱性樹脂の微粒子の調製上記(1
)で調製したポリイミド前駆体のN−メチル−2−ピロ
リドン溶液(固形分濃度:50重量%)44g、比較例
2、(1)で調製したポリイミド樹脂微粒子23gとブ
チルセロソルブ33gを、まず乳鉢で粗混練し、ついで
高速の三本ロールを用いて6回通して混練し、ポリイミ
ド樹脂微粒子が分散したポリイミド系樹脂ペーストを得
た。ここで、N−メチル−2−ピロリドンの沸点は20
2℃、ブチルセロソルブの沸点は171℃である。(2) Preparation of fine particles of heat-resistant resin (1)
), 44 g of the N-methyl-2-pyrrolidone solution (solid content concentration: 50% by weight) of the polyimide precursor prepared in Comparative Example 2, 23 g of the polyimide resin fine particles prepared in (1), and 33 g of butyl cellosolve were first coarsely ground in a mortar. The mixture was kneaded and then kneaded six times using a high-speed triple roll to obtain a polyimide resin paste in which polyimide resin fine particles were dispersed. Here, the boiling point of N-methyl-2-pyrrolidone is 20
At 2°C, the boiling point of butyl cellosolve is 171°C.
【0048】実施例2
(1)ポリイミド前駆体の調製
温度計、かきまぜ機、窒素導入管をつけた四つ口フラス
コに窒素ガスを通しながら、1,1,1,3,3,3−
ヘキサフルオロ−2,2−ビス(3,4−ジカルボキシ
フェニル)プロパン二無水物444.24g(1モル)
、エタノール92.601g(2.01モル)と1,3
−ジメチル−3,4,5,6−テトラヒドロ−2(1H
)−ピリミジノン737gを仕込み、かきまぜながら加
熱し、100℃に昇温した。同温度で3時間反応させて
芳香族テトラカルボン酸ハーフエステルを得た。
室温に冷却後、2,4´−ジアミノジフェニルエーテル
200.240g(1.000モル)を仕込み溶解して
ポリイミド前駆体(数平均分子量:900)の溶液(固
形分濃度:50重量%)を得た。Example 2 (1) Preparation of polyimide precursor 1,1,1,3,3,3-
Hexafluoro-2,2-bis(3,4-dicarboxyphenyl)propane dianhydride 444.24g (1 mol)
, 92.601 g (2.01 mol) of ethanol and 1,3
-dimethyl-3,4,5,6-tetrahydro-2(1H
)-pyrimidinone (737 g) was charged and heated while stirring to raise the temperature to 100°C. The mixture was reacted at the same temperature for 3 hours to obtain an aromatic tetracarboxylic acid half ester. After cooling to room temperature, 200.240 g (1.000 mol) of 2,4'-diaminodiphenyl ether was charged and dissolved to obtain a solution (solid content concentration: 50% by weight) of a polyimide precursor (number average molecular weight: 900). .
【0049】(2)耐熱性樹脂の微粒子の調製芳香族テ
トラカルボン酸二無水物として、3,3´,4,4´−
ビフェニルテトラカルボン酸二無水物に変えてビス(3
,4−ジカルボキシフェニル)ジメチルシラン二無水物
12.826g(0.0364モル)、芳香族ジアミン
として、2,4´−ジアミノジフェニルエーテルに変え
て4,4´−ジアミノジフェニルエーテル7.289g
(0.0364モル)を用いる以外は比較例2、(1)
と全く同様にして行い、粉末のポリイミド樹脂を得た。
このポリイミド樹脂を粉砕機で粉末化し、平均粒子径4
μm、最大粒子径40μm以下の1,3−ジメチル−3
,4,5,6−テトラヒドロ−2(1H)−ピリミジノ
ン等の含窒素系溶剤に可溶で、ブチルセロソルブアセテ
ート等のセロソルブ類に不溶な下式のくり返し単位を有
するポリイミド樹脂(数平均分子量:40,000)を
得た。(2) Preparation of fine particles of heat-resistant resin As the aromatic tetracarboxylic dianhydride, 3,3',4,4'-
Bis(3) was used instead of biphenyltetracarboxylic dianhydride.
,4-dicarboxyphenyl)dimethylsilane dianhydride 12.826 g (0.0364 mol), as aromatic diamine, 7.289 g of 4,4'-diaminodiphenyl ether instead of 2,4'-diaminodiphenyl ether
Comparative Example 2, except using (0.0364 mol), (1)
A powdered polyimide resin was obtained in exactly the same manner as above. This polyimide resin is pulverized using a pulverizer, and the average particle size is 4.
μm, 1,3-dimethyl-3 with a maximum particle size of 40 μm or less
, 4,5,6-tetrahydro-2(1H)-pyrimidinone and other nitrogen-containing solvents, and is insoluble in cellosolves such as butyl cellosolve acetate. Polyimide resin having repeating units of the following formula (number average molecular weight: 40 ,000) was obtained.
【化7】[C7]
【0050】(3)ポリイミド樹脂ペーストの調製上記
(1)で調製したポリイミド前駆体の1,3−ジメチル
−3,4,5,6−テトラヒドロ−2(1H)−ピリミ
ジノン溶液(固形分濃度:50重量%)44g、上記(
2)で調製したポリイミド樹脂の微粒子23gとブチル
セロソルブアセテート33gをまず乳鉢で粗混練し、つ
いで高速の三本ロールを用いて6回通して混練し、ポリ
イミド樹脂微粒子が分散したポリイミド樹脂ペーストを
得た。ここで、1,3−ジメチル−3,4,5,6−テ
トラヒドロ−2(1H)−ピリミジノンの沸点は246
℃、ブチルセロソルブアセテートの沸点は192℃であ
る。(3) Preparation of polyimide resin paste A 1,3-dimethyl-3,4,5,6-tetrahydro-2(1H)-pyrimidinone solution of the polyimide precursor prepared in (1) above (solid content concentration: 50% by weight) 44g, above (
23 g of the polyimide resin fine particles prepared in 2) and 33 g of butyl cellosolve acetate were first roughly kneaded in a mortar, and then kneaded by passing them through six times using a high-speed triple roll to obtain a polyimide resin paste in which the polyimide resin fine particles were dispersed. . Here, the boiling point of 1,3-dimethyl-3,4,5,6-tetrahydro-2(1H)-pyrimidinone is 246
°C, the boiling point of butyl cellosolve acetate is 192 °C.
【0051】実施例3
(1)ポリイミド前駆体の調製
溶剤のN−メチル−2−ピロリドンを1,3−ジメチル
−2−イミダゾリジノンに変えた以外は実施例1、(1
)と全く同様にして行い、ポリイミド前駆体(数平均分
子量:1,000)の溶液(固形分濃度:50重量%)
を得た。Example 3 (1) Preparation of polyimide precursor Example 1 and (1) except that N-methyl-2-pyrrolidone in the solvent was changed to 1,3-dimethyl-2-imidazolidinone.
), and a solution of polyimide precursor (number average molecular weight: 1,000) (solid content concentration: 50% by weight) was prepared.
I got it.
【0052】(2)ポリイミド系樹脂ペーストの調製上
記(1)で調製したポリイミド前駆体の1,3−ジメチ
ル−2−イミダゾリジノン溶液(固形分濃度:50重量
%)44g、比較例2、(1)で調製したポリイミド樹
脂微粒子23gとジエチレングリコールモノエチルエー
テルアセテート33gを、まず乳鉢で粗混練し、ついで
高速の三本ロールを用いて6回通して混練し、ポリイミ
ド樹脂微粒子が分散したポリイミド系樹脂ペーストを得
た。ここで、1,3−ジメチル−2−イミダゾリジノン
の沸点は226℃、ジエチレングリコールモノエチルエ
ーテルアセテートの沸点は217℃である。(2) Preparation of polyimide resin paste 44 g of 1,3-dimethyl-2-imidazolidinone solution (solid content concentration: 50% by weight) of the polyimide precursor prepared in (1) above, Comparative Example 2, 23 g of the polyimide resin fine particles prepared in (1) and 33 g of diethylene glycol monoethyl ether acetate were first roughly kneaded in a mortar, and then kneaded by passing them through six times using a high-speed triple roll to form a polyimide system in which the polyimide resin fine particles were dispersed. A resin paste was obtained. Here, the boiling point of 1,3-dimethyl-2-imidazolidinone is 226°C, and the boiling point of diethylene glycol monoethyl ether acetate is 217°C.
【0053】実施例4
(1)ポリイミド前駆体の調製
実施例1、(1)で調製したポリイミド前駆体のN−メ
チル−2−ピロリドン溶液(固形分濃度:50重量%)
を80℃で4時間反応させて数平均分子量3,100の
ポリイミド前駆体(ポリアミド酸エステルオリゴマ)の
N−メチル−2−ピロリドン溶液(固形分濃度:50重
量%)を得た。Example 4 (1) Preparation of polyimide precursor Example 1, N-methyl-2-pyrrolidone solution of the polyimide precursor prepared in (1) (solid content concentration: 50% by weight)
were reacted at 80° C. for 4 hours to obtain an N-methyl-2-pyrrolidone solution (solid content concentration: 50% by weight) of a polyimide precursor (polyamic acid ester oligomer) having a number average molecular weight of 3,100.
【0054】(2)ポリイミド系樹脂ペーストの調製上
記(1)で調製したポリイミド前駆体のN−メチル−2
−ピロリドン溶液(固形分濃度:50重量%)44g、
比較例2、(1)で調製したポリイミド樹脂微粒子23
gとブチルセロソルブ33gをまず乳鉢で粗混練し、つ
いで高速の三本ロールを用いて6回通して混練し、ポリ
イミド樹脂微粒子が分散したポリイミド系樹脂ペースト
を得た。(2) Preparation of polyimide resin paste N-methyl-2 of the polyimide precursor prepared in (1) above
- 44 g of pyrrolidone solution (solid concentration: 50% by weight),
Comparative Example 2, polyimide resin fine particles 23 prepared in (1)
g and 33 g of butyl cellosolve were first coarsely kneaded in a mortar, and then kneaded by passing through a high-speed triple roll six times to obtain a polyimide resin paste in which polyimide resin fine particles were dispersed.
【0055】実施例5
(1)ポリイミド前駆体の調製
温度計、かきまぜ機、窒素導入管をつけた四つ口フラス
コに、無水酢酸から再結晶して精製した3,3´,4,
4´−ベンゾフェノンテトラカルボン酸二無水物11.
602g(0.0360モル)、トルエンとジエチルエ
ーテルとの重量比で1:1の混合液で再結晶した〔1,
3−ビス(3,4−ジカルボキシフェニル)−1,1,
3,3−テトラメチルジシロキサン〕二無水物0.80
8g(0.0019モル)と減圧蒸留によって精製した
N−メチル−2−ピロリドン23gとエタノール3.5
gを窒素ガスを通しながら仕込んだ。撹拌しながら10
0℃で3時間反応させて、芳香族テトラカルボン酸二無
水物ハーフエステルを得た。室温に冷却した後、メタノ
ールと水との重量比で8:2(メタノール:水)の混合
液で再結晶した2,4´−ジアミノジフェニルエーテル
7.589g(0.0379モル)を仕込み、室温で溶
解してポリイミド前駆体(数平均分子量:1,000)
の溶液(固形分濃度:50重量%)を得た。Example 5 (1) Preparation of polyimide precursor 3,3',4, purified by recrystallization from acetic anhydride was placed in a four-necked flask equipped with a thermometer, a stirrer, and a nitrogen inlet tube.
4'-benzophenone tetracarboxylic dianhydride 11.
602g (0.0360 mol), recrystallized from a mixture of toluene and diethyl ether in a weight ratio of 1:1 [1,
3-bis(3,4-dicarboxyphenyl)-1,1,
3,3-tetramethyldisiloxane dianhydride 0.80
8g (0.0019 mol), 23g of N-methyl-2-pyrrolidone purified by vacuum distillation, and 3.5g of ethanol.
g was charged while passing nitrogen gas. 10 while stirring
The mixture was reacted at 0° C. for 3 hours to obtain an aromatic tetracarboxylic dianhydride half ester. After cooling to room temperature, 7.589 g (0.0379 mol) of 2,4'-diaminodiphenyl ether recrystallized from a mixture of methanol and water at a weight ratio of 8:2 (methanol:water) was charged, and the mixture was heated to room temperature. Dissolve polyimide precursor (number average molecular weight: 1,000)
A solution (solid content concentration: 50% by weight) was obtained.
【0056】(2)耐熱性樹脂の微粒子の調製温度計、
かきまぜ機、窒素導入管、水分定量器をつけた四つ口フ
ラスコに、無水酢酸から再結晶して精製した3,3´,
4,4´−ベンゾフェノンテトラカルボン酸二無水物6
.106g(0.0190モル)及び3,3´,4,4
´−ビフェニルテトラカルボン酸二無水物5.578g
(0.0190モル)、トルエンとジエチルエーテルと
の重量比で1:1の混合液を用いて再結晶した〔1,3
−ビス(3,4−ジカルボキシフェニル)−1,1,3
,3−テトラメチルジシロキサン〕二無水物0.851
g(0.0020モル)、メタノールと水との重量比で
8:2(メタノール:水)の混合液を用いて再結晶した
2,4´−ジアミノジフェニルエーテル7.993g(
0.0400モル)と減圧蒸留によって精製したN−メ
チル−2−ピロリドン84gを窒素ガスを通しながら仕
込んだ。撹拌下、室温で10時間反応を進めた後、18
5℃に昇温し、同温度で10時間反応を進めた。途中、
留出する水を反応系外にすみやかに除去した。得られた
溶液を減圧蒸留によって精製したN−メチル−2−ピロ
リドン735gで希釈して固形分濃度2.5重量%の溶
液とした。これをアシザワニロアトマイザー社製モービ
ルマイナー型スプレードライヤーで噴霧乾燥して微粒子
化した後、分級して平均粒子径4.5μm、最大粒子径
40μm以下のN−メチル−2−ピロリドンに可溶で、
ブチルセロソルブに不溶な次式のくり返し単位を有する
ポリイミド樹脂の微粒子を得た。このポリイミド樹脂の
数平均分子量は33,000であった。(2) Thermometer for preparing fine particles of heat-resistant resin;
3,3′, purified by recrystallization from acetic anhydride, was placed in a four-necked flask equipped with a stirrer, a nitrogen inlet tube, and a moisture meter.
4,4'-benzophenonetetracarboxylic dianhydride 6
.. 106g (0.0190mol) and 3,3',4,4
'-Biphenyltetracarboxylic dianhydride 5.578g
(0.0190 mol) was recrystallized using a mixture of toluene and diethyl ether in a weight ratio of 1:1 [1,3
-bis(3,4-dicarboxyphenyl)-1,1,3
,3-tetramethyldisiloxane] dianhydride 0.851
g (0.0020 mol), 7.993 g of 2,4'-diaminodiphenyl ether recrystallized using a mixture of methanol and water at a weight ratio of 8:2 (methanol:water)
0.0400 mol) and 84 g of N-methyl-2-pyrrolidone purified by vacuum distillation were charged while passing nitrogen gas. After proceeding with the reaction for 10 hours at room temperature under stirring, 18
The temperature was raised to 5°C, and the reaction was continued at the same temperature for 10 hours. in the middle,
The distilled water was promptly removed from the reaction system. The resulting solution was diluted with 735 g of N-methyl-2-pyrrolidone purified by vacuum distillation to obtain a solution with a solid content concentration of 2.5% by weight. This was spray-dried using a Mobil Minor type spray dryer manufactured by Ashizawa Waniro Atomizer Co., Ltd. to form fine particles, and then classified to have an average particle size of 4.5 μm and a maximum particle size of 40 μm or less, soluble in N-methyl-2-pyrrolidone.
Fine particles of polyimide resin having repeating units of the following formula which are insoluble in butyl cellosolve were obtained. The number average molecular weight of this polyimide resin was 33,000.
【化8】[Chemical formula 8]
【0057】(3)ポリイミド系樹脂ペーストの調製上
記(1)のポリイミド前駆体のN−メチル−2−ピロリ
ドン溶液(固形分濃度:50重量%)44gに上記(2
)のポリイミド樹脂の微粒子23gとブチルセロソルブ
33gをまず、乳鉢で粗混練し、ついで高速の三本ロー
ルを用いて6回通して混練し、ポリイミド樹脂の微粒子
が分散したポリイミド系樹脂ペーストを得た。このペー
ストから溶剤を除去し、ウランおよびトリウムの含量を
放射化分析によって調べたところ、各々検出限界の0.
02ppb以下、及び0.05ppb以下であった。ま
た、ナトリウム、カリウム、銅、鉄のイオン性不純物の
含量はそれぞれ2ppm以下であった。次にこのペース
トを集積度16KビットのMOS型RAMの表面に、ス
クリーン印刷によって塗布し、100℃、150℃、2
00℃、250℃及び350℃でそれぞれ0.5時間加
熱硬化して、約20μmの厚みを有するポリイミド保護
膜を形成した。ついで得られた半導体素子を低融点ガラ
スを封止接着剤とするセラミックパッケージを用い約4
50℃で封止した。この半導体装置のソフトエラー率は
30フィットであった。(3) Preparation of polyimide resin paste Add the above (2) to 44 g of the N-methyl-2-pyrrolidone solution (solid content concentration: 50% by weight) of the polyimide precursor in (1) above.
) 23 g of polyimide resin fine particles and 33 g of butyl cellosolve were first roughly kneaded in a mortar, and then kneaded by passing them through six times using a high-speed triple roll to obtain a polyimide resin paste in which polyimide resin fine particles were dispersed. The solvent was removed from this paste, and the content of uranium and thorium was examined by activation analysis, and the detection limit of each was 0.
0.02 ppb or less, and 0.05 ppb or less. Moreover, the content of ionic impurities of sodium, potassium, copper, and iron was each 2 ppm or less. Next, this paste was applied to the surface of a MOS type RAM with a density of 16K bits by screen printing, and
The polyimide protective film having a thickness of about 20 μm was formed by heating and curing at 00° C., 250° C., and 350° C. for 0.5 hours, respectively. Then, the obtained semiconductor element is packaged in a ceramic package using low melting point glass as a sealing adhesive for about 4 hours.
It was sealed at 50°C. The soft error rate of this semiconductor device was 30 fit.
【0058】比較例1、2および実施例1〜4で得たペ
ーストをシリコンウェハ基材上にスクリーン印刷し、1
00℃で1時間、200℃で0.5時間、250℃で0
.5時間、更に350℃で0.5時間加熱硬化して得た
皮膜について以下の特性を評価し、結果を表1に示した
。スクリーン印刷は開孔率71%、ステンシルの厚さ1
30μm、耐溶剤性タイプ乳剤の版を用い、スキージ速
度30mm/sの条件で行った。ペーストの版裏回り性
は20ショット印刷後の版裏面にペーストが付着してい
るか否かを目視観察した。膜厚は電磁式膜厚計で測定し
た。The pastes obtained in Comparative Examples 1 and 2 and Examples 1 to 4 were screen printed on a silicon wafer substrate.
1 hour at 00℃, 0.5 hour at 200℃, 0 at 250℃
.. The following characteristics of the film obtained by heating and curing at 350° C. for 5 hours and 0.5 hour were evaluated, and the results are shown in Table 1. Screen printing has a porosity of 71% and a stencil thickness of 1
The test was carried out using a 30 μm, solvent-resistant emulsion plate at a squeegee speed of 30 mm/s. The plate turning property of the paste was determined by visually observing whether the paste adhered to the back surface of the plate after 20 shots of printing. The film thickness was measured using an electromagnetic film thickness meter.
【0059】ピンホール密度は基材としてアルミニウム
板を用い、その皮膜表面にフェノールフタレインの適量
を加えた0.2%食塩水を張り、この液を正極、アルミ
ニウム板を負極とし、20Vの直流電圧を1分間加えて
、発生するピンホール数を測定した。引張強さは基材と
してガラス板を用い、ガラス板からはく離したフィルム
について、引張試験機(オリエンテック社製テンシロン
万能試験機UCT−5T型)を用いて測定した。ガラス
転移温度は上記のガラス板からはく離したフィルムにつ
いて、示差走査熱量計(デュポン社製910型)を用い
て、昇温速度5℃/分で測定した。[0059] To determine the pinhole density, an aluminum plate was used as the base material, a 0.2% saline solution containing an appropriate amount of phenolphthalein was applied to the surface of the film, this solution was used as the positive electrode, the aluminum plate was used as the negative electrode, and a 20V DC current was applied. A voltage was applied for 1 minute, and the number of pinholes generated was measured. The tensile strength was measured using a glass plate as a base material and a film peeled from the glass plate using a tensile tester (Tensilon Universal Tester Model UCT-5T manufactured by Orientech Co., Ltd.). The glass transition temperature was measured for the film peeled off from the glass plate using a differential scanning calorimeter (Model 910 manufactured by DuPont) at a heating rate of 5° C./min.
【0060】[0060]
【表1】[Table 1]
【0061】[0061]
【発明の効果】表1から、特定のポリイミド前駆体、可
溶性の耐熱性樹脂の微粒子および溶剤を組合せた実施例
1〜4のポリイミド系樹脂ペーストは、配合したフィラ
が皮膜中にそのまま残存して不均一な膜を形成する比較
例1のペーストに比べて均一でピンホールのない膜が形
成でき、引張強さに著しく優れることが示される。さら
に、実施例1〜4のペーストは結合材として低分子量の
ポリイミド前駆体を用いることによって、高分子量のポ
リイミド樹脂を用いる比較例2のペーストに比べて、ペ
ーストの版裏回りがなく印刷性に優れている。また、固
形分濃度が高く、厚膜が形成できることが示される。Effects of the Invention From Table 1, it can be seen that in the polyimide resin pastes of Examples 1 to 4 in which a specific polyimide precursor, fine particles of soluble heat-resistant resin, and a solvent were combined, the blended filler remained intact in the film. Compared to the paste of Comparative Example 1, which forms a non-uniform film, a uniform film without pinholes can be formed, and it is shown that the tensile strength is significantly superior. Furthermore, by using a low molecular weight polyimide precursor as a binder, the pastes of Examples 1 to 4 have better printability because the paste does not run behind the plate, compared to the paste of Comparative Example 2 which uses a high molecular weight polyimide resin. Are better. It is also shown that the solid content concentration is high and a thick film can be formed.
【0062】[0062]
【図面の簡単な説明】
図1は本発明のポリイミド系樹脂ペーストを用いたモノ
リシックICの断面図、図2は本発明のポリイミド系樹
脂ペーストを用いたハイブリッドICの断面図、および
図3は本発明のポリイミド系樹脂ペーストを用いたマル
チチップ高密度実装基板の断面図である。[Brief Description of the Drawings] Figure 1 is a cross-sectional view of a monolithic IC using the polyimide resin paste of the present invention, Figure 2 is a cross-sectional view of a hybrid IC using the polyimide resin paste of the present invention, and Figure 3 is a cross-sectional view of a monolithic IC using the polyimide resin paste of the present invention. FIG. 2 is a cross-sectional view of a multi-chip high-density mounting board using the polyimide resin paste of the invention.
1 ポリイミド系樹脂皮膜
2 LISチップ
3 ボンディングワイヤ
4 樹脂パッケージ
5 リード
6 支持体
7 ダイオードチップ
8 はんだ
9 第2層配線
10 ポリイミド系樹脂皮膜
11 第1層配線
12 抵抗層
13 アルミナ基板
14 ポリイミド系樹脂皮膜
15 配線層
16 配線層
17 LSIチップ
18 はんだ
19 銅/ポリイミド系樹脂多層配線層
20 セラミック多層配線板1 Polyimide resin film
2 LIS chip 3 Bonding wire
4 Resin package 5 Lead
6 Support 7 Diode chip
8 Solder 9 Second layer wiring
10 Polyimide resin film 11 First layer wiring
12 Resistance layer 13 Alumina substrate
14 Polyimide resin film 15 Wiring layer
16 Wiring layer 17 LSI chip
18 Solder 19 Copper/polyimide resin multilayer wiring layer
20 Ceramic multilayer wiring board
Claims (4)
ルコールとを反応させて得られる芳香族テトラカルボン
酸ハーフエステルに芳香族ジアミンを混合または反応さ
せて得られる低分子量のポリイミド前駆体、耐熱性樹脂
の微粒子および溶剤を含み、加熱硬化前には微粒子はポ
リイミド前駆体と溶剤からなる均一相に対して不均一相
として存在し、加熱硬化後にはポリイミド前駆体および
微粒子が均一相として存在するようにしたポリイミド系
樹脂ペースト。[Claim 1] A low molecular weight polyimide precursor obtained by mixing or reacting an aromatic diamine with an aromatic tetracarboxylic acid half ester obtained by reacting an aromatic tetracarboxylic dianhydride and an alcohol, heat resistant. Contains fine resin particles and a solvent. Before heat curing, the fine particles exist as a heterogeneous phase in contrast to a homogeneous phase consisting of a polyimide precursor and solvent, and after heat curing, the polyimide precursor and fine particles exist as a homogeneous phase. polyimide resin paste.
リイミド樹脂、ポリアミドイミド樹脂またはポリアミド
樹脂である請求項1記載のポリイミド系樹脂ペースト。2. The polyimide resin paste according to claim 1, wherein the fine particles are polyimide resin, polyamideimide resin, or polyamide resin having an average particle diameter of 40 μm or less.
5以上である請求項1または2記載のポリイミド系樹脂
ペースト。Claim 3: The paste has a thixotropy coefficient of 1.
The polyimide resin paste according to claim 1 or 2, which has a polyimide resin paste of 5 or more.
載のポリイミド系樹脂ペーストより得られる層間絶縁膜
および/または表面保護膜を有するIC。4. An IC having an interlayer insulating film and/or a surface protection film obtained from the polyimide resin paste according to claim 1, 2, or 3.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP799091A JP2987950B2 (en) | 1991-01-25 | 1991-01-25 | Polyimide resin paste and IC using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP799091A JP2987950B2 (en) | 1991-01-25 | 1991-01-25 | Polyimide resin paste and IC using the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04248871A true JPH04248871A (en) | 1992-09-04 |
| JP2987950B2 JP2987950B2 (en) | 1999-12-06 |
Family
ID=11680851
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP799091A Expired - Lifetime JP2987950B2 (en) | 1991-01-25 | 1991-01-25 | Polyimide resin paste and IC using the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2987950B2 (en) |
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| JP2001059071A (en) * | 1999-08-23 | 2001-03-06 | Mitsui Mining & Smelting Co Ltd | Solder resist coating solution |
| JP2007258710A (en) * | 2006-03-22 | 2007-10-04 | Semikron Elektronik Gmbh & Co Kg | Power semiconductor component having a secondary passivation layer and method of manufacturing the same |
| WO2007132560A1 (en) * | 2006-05-16 | 2007-11-22 | Kabushiki Kaisha Toshiba | High frequency device module and method for manufacturing the same |
| JP2011225647A (en) * | 2010-04-15 | 2011-11-10 | Kaneka Corp | Method for imparting flame retardancy, imide flame retardant, resin solution, film, and method for producing the same |
| JP2013095851A (en) * | 2011-11-01 | 2013-05-20 | Ube Industries Ltd | Method for producing polyimide laminate, polyimide laminate, polyimide film, and polyimide precursor solution composition |
| JP2015049508A (en) * | 2014-02-24 | 2015-03-16 | 住友ベークライト株式会社 | Photosensitive resin material and resin film |
| CN115863640A (en) * | 2022-11-22 | 2023-03-28 | 浙江中科玖源新材料有限公司 | Binder for silicon negative electrode, silicon negative electrode material and preparation method thereof |
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| EP2408836B1 (en) | 2009-03-16 | 2014-12-10 | Sun Chemical B.V. | Liquid coverlays for flexible printed circuit boards |
| CA2779065A1 (en) | 2009-10-29 | 2011-05-05 | Sun Chemical B.V. | Polyamideimide adhesives for printed circuit boards |
| KR102147265B1 (en) | 2019-09-30 | 2020-08-24 | 에스케이이노베이션 주식회사 | Polyimide film and flexible display panel including the same |
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1991
- 1991-01-25 JP JP799091A patent/JP2987950B2/en not_active Expired - Lifetime
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| WO1997003542A1 (en) * | 1995-07-10 | 1997-01-30 | Hitachi, Ltd. | Circuit board and method of manufacturing the same |
| US5958600A (en) * | 1995-07-10 | 1999-09-28 | Hitachi, Ltd. | Circuit board and method of manufacturing the same |
| JP2001059071A (en) * | 1999-08-23 | 2001-03-06 | Mitsui Mining & Smelting Co Ltd | Solder resist coating solution |
| JP2007258710A (en) * | 2006-03-22 | 2007-10-04 | Semikron Elektronik Gmbh & Co Kg | Power semiconductor component having a secondary passivation layer and method of manufacturing the same |
| WO2007132560A1 (en) * | 2006-05-16 | 2007-11-22 | Kabushiki Kaisha Toshiba | High frequency device module and method for manufacturing the same |
| US7635918B2 (en) | 2006-05-16 | 2009-12-22 | Kabushiki Kaisha Toshiba | High frequency device module and manufacturing method thereof |
| JP2011225647A (en) * | 2010-04-15 | 2011-11-10 | Kaneka Corp | Method for imparting flame retardancy, imide flame retardant, resin solution, film, and method for producing the same |
| JP2013095851A (en) * | 2011-11-01 | 2013-05-20 | Ube Industries Ltd | Method for producing polyimide laminate, polyimide laminate, polyimide film, and polyimide precursor solution composition |
| JP2015049508A (en) * | 2014-02-24 | 2015-03-16 | 住友ベークライト株式会社 | Photosensitive resin material and resin film |
| CN115863640A (en) * | 2022-11-22 | 2023-03-28 | 浙江中科玖源新材料有限公司 | Binder for silicon negative electrode, silicon negative electrode material and preparation method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2987950B2 (en) | 1999-12-06 |
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