JP7576077B2 - 自動分析装置 - Google Patents
自動分析装置 Download PDFInfo
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- JP7576077B2 JP7576077B2 JP2022500283A JP2022500283A JP7576077B2 JP 7576077 B2 JP7576077 B2 JP 7576077B2 JP 2022500283 A JP2022500283 A JP 2022500283A JP 2022500283 A JP2022500283 A JP 2022500283A JP 7576077 B2 JP7576077 B2 JP 7576077B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00594—Quality control, including calibration or testing of components of the analyser
- G01N35/00613—Quality control
- G01N35/00663—Quality control of consumables
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00594—Quality control, including calibration or testing of components of the analyser
- G01N35/00693—Calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00594—Quality control, including calibration or testing of components of the analyser
- G01N35/00613—Quality control
- G01N35/00663—Quality control of consumables
- G01N2035/00673—Quality control of consumables of reagents
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00594—Quality control, including calibration or testing of components of the analyser
- G01N35/00693—Calibration
- G01N2035/00702—Curve-fitting; Parameter matching; Calibration constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N2035/0097—Control arrangements for automatic analysers monitoring reactions as a function of time
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
Description
Claims (7)
- 検体を試薬と反応させて分析する自動分析装置であって、キャリブレーション時の測定吸光度を利用し、前記試薬の劣化状態から当該試薬の使用期限を予測して通知する、ことを特徴とする自動分析装置。
- 請求項1に記載の自動分析装置であって、試薬ボトル単位でキャリブレーション時の測定吸光度を記録し、同一ロット試薬のキャリブレーション結果があれば、当該キャリブレーション結果を基に判定した使用期限に基づき、キャリブレーションが未実施の試薬ボトルの使用期限情報を提供する、ことを特徴とする自動分析装置。
- 請求項1に記載の自動分析装置であって、標準液に係る吸光光度法分析上の性質を用いて、検量線を各ロットにつき複数回生成するキャリブレーションを実行し、任意のロットにおけるキャリブレーションを(N+1)回(N=1,2,・・・)実施した段階で、1回目から(N+1)回目までのキャリブレーションの各々の測定日時、及び測定された吸光度データの少なくともいずれか一方を用いて近似直線を作成し、当該近似直線に基づいて、測定される吸光度データが所定の限界吸光度を超える日時を予測して通知する、ことを特徴とする自動分析装置。
- 請求項3に記載の自動分析装置であって、初回のキャリブレーション結果と2回目のキャリブレーション結果、およびそれぞれのキャリブレーション実施時期を用いて近似直線を作成し、その延長線上と予め設定されている限界吸光度ラインとの交点に相当するポイントを用いて前記試薬の使用予測期限を自動判定する、ことを特徴とする自動分析装置。
- 請求項3に記載の自動分析装置であって、キャリブレーション結果の採用数はキャリブレーション実施数に応じ増加させることで、判定された有効日時の精度向上を図る、ことを特徴とする自動分析装置。
- 請求項1に記載の自動分析装置であって、試薬の有効期限の判定の条件設定がフレキシビリティな設定を可能とする、ことを特徴とする自動分析装置。
- 請求項6に記載の自動分析装置であって前記判定の条件設定では、限界吸光度の設定、使用するキャリブレータの選択、測定波長である主/副/2波長差の選択を可能にした、ことを特徴とする自動分析装置。
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020023192 | 2020-02-14 | ||
| JP2020023192 | 2020-02-14 | ||
| PCT/JP2021/001435 WO2021161723A1 (ja) | 2020-02-14 | 2021-01-18 | 自動分析装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2021161723A1 JPWO2021161723A1 (ja) | 2021-08-19 |
| JPWO2021161723A5 JPWO2021161723A5 (ja) | 2023-09-12 |
| JP7576077B2 true JP7576077B2 (ja) | 2024-10-30 |
Family
ID=77293068
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022500283A Active JP7576077B2 (ja) | 2020-02-14 | 2021-01-18 | 自動分析装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230069039A1 (ja) |
| EP (1) | EP4105660A4 (ja) |
| JP (1) | JP7576077B2 (ja) |
| CN (1) | CN115004034A (ja) |
| WO (1) | WO2021161723A1 (ja) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002008768A1 (en) | 2000-07-24 | 2002-01-31 | Arkray, Inc. | Measurement instrument, reagent carrier used for the same, information recorded medium, measurement data correcting method, and program recorded medium |
| JP2009204448A (ja) | 2008-02-28 | 2009-09-10 | Hitachi High-Technologies Corp | 自動分析装置 |
| JP2009270841A (ja) | 2008-04-30 | 2009-11-19 | Hitachi High-Technologies Corp | 自動分析装置 |
| JP2012032188A (ja) | 2010-07-29 | 2012-02-16 | Hitachi High-Technologies Corp | 自動分析システム |
| JP2012107985A (ja) | 2010-11-17 | 2012-06-07 | Hitachi High-Technologies Corp | 自動分析装置 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4873633A (en) * | 1985-10-18 | 1989-10-10 | Cetus Corporation | User controlled off-center light absorbance reading adjuster in a liquid handling and reaction system |
| JPS6311862A (ja) * | 1985-10-18 | 1988-01-19 | シ−タス コ−ポレ−シヨン | コンピユ−タ管理液体処理及び反応特性化方式 |
| JPH0815265A (ja) * | 1994-06-30 | 1996-01-19 | Shimadzu Corp | 自動化学分析装置 |
| JP3873039B2 (ja) * | 2003-05-14 | 2007-01-24 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
| JP4805738B2 (ja) * | 2006-07-06 | 2011-11-02 | 富士通コンポーネント株式会社 | 光電変換モジュール及び高速伝送用コネクタ |
| JP5191664B2 (ja) * | 2007-01-09 | 2013-05-08 | ベックマン コールター, インコーポレイテッド | 分析装置 |
| JP5134931B2 (ja) * | 2007-12-03 | 2013-01-30 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
| JP4977634B2 (ja) * | 2008-01-18 | 2012-07-18 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
| JP2010261823A (ja) * | 2009-05-08 | 2010-11-18 | Hitachi High-Technologies Corp | 自動分析装置 |
| JP5147906B2 (ja) * | 2010-07-22 | 2013-02-20 | 株式会社日立ハイテクノロジーズ | 精度管理システム |
| JP5939833B2 (ja) * | 2012-02-24 | 2016-06-22 | 株式会社日立ハイテクノロジーズ | 自動分析装置 |
| JP2013217741A (ja) * | 2012-04-06 | 2013-10-24 | Hitachi High-Technologies Corp | 自動分析装置 |
| FR2994740B1 (fr) * | 2012-08-21 | 2015-03-27 | Horiba Abx Sas | Procede de compensation du vieillissement d'un reactif lors de mesures de fluorescence sur des particules, et dispositif d'analyse biologique mettant en œuvre le procede. |
| JP2014059243A (ja) * | 2012-09-19 | 2014-04-03 | Toshiba Corp | 自動分析装置 |
| EP2784514A1 (en) * | 2013-03-28 | 2014-10-01 | Sysmex Corporation | Reagent supply apparatus, sample analyzer, method for supplying reagent and storage medium |
| JP5772886B2 (ja) * | 2013-06-26 | 2015-09-02 | 東亜ディーケーケー株式会社 | 分析装置 |
| US10258590B2 (en) * | 2015-10-14 | 2019-04-16 | Alcresta Therapeutics, Inc. | Enteral feeding device and related methods of use |
| EP3589932B1 (en) * | 2017-03-01 | 2021-05-05 | Fluidion SAS | Field-deployable multiplexed sampling and monitoring device and bacterial contamination measurement method |
-
2021
- 2021-01-18 US US17/797,035 patent/US20230069039A1/en active Pending
- 2021-01-18 EP EP21754230.7A patent/EP4105660A4/en active Pending
- 2021-01-18 JP JP2022500283A patent/JP7576077B2/ja active Active
- 2021-01-18 CN CN202180009448.8A patent/CN115004034A/zh active Pending
- 2021-01-18 WO PCT/JP2021/001435 patent/WO2021161723A1/ja not_active Ceased
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002008768A1 (en) | 2000-07-24 | 2002-01-31 | Arkray, Inc. | Measurement instrument, reagent carrier used for the same, information recorded medium, measurement data correcting method, and program recorded medium |
| JP2009204448A (ja) | 2008-02-28 | 2009-09-10 | Hitachi High-Technologies Corp | 自動分析装置 |
| JP2009270841A (ja) | 2008-04-30 | 2009-11-19 | Hitachi High-Technologies Corp | 自動分析装置 |
| JP2012032188A (ja) | 2010-07-29 | 2012-02-16 | Hitachi High-Technologies Corp | 自動分析システム |
| JP2012107985A (ja) | 2010-11-17 | 2012-06-07 | Hitachi High-Technologies Corp | 自動分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20230069039A1 (en) | 2023-03-02 |
| EP4105660A4 (en) | 2024-02-28 |
| WO2021161723A1 (ja) | 2021-08-19 |
| EP4105660A1 (en) | 2022-12-21 |
| CN115004034A (zh) | 2022-09-02 |
| JPWO2021161723A1 (ja) | 2021-08-19 |
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