[go: up one dir, main page]

JP7565851B2 - Ophthalmic Equipment - Google Patents

Ophthalmic Equipment Download PDF

Info

Publication number
JP7565851B2
JP7565851B2 JP2021061307A JP2021061307A JP7565851B2 JP 7565851 B2 JP7565851 B2 JP 7565851B2 JP 2021061307 A JP2021061307 A JP 2021061307A JP 2021061307 A JP2021061307 A JP 2021061307A JP 7565851 B2 JP7565851 B2 JP 7565851B2
Authority
JP
Japan
Prior art keywords
light
illumination
light receiving
area
distortion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021061307A
Other languages
Japanese (ja)
Other versions
JP2022157209A (en
Inventor
将 中島
誠 藤野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Priority to JP2021061307A priority Critical patent/JP7565851B2/en
Publication of JP2022157209A publication Critical patent/JP2022157209A/en
Application granted granted Critical
Publication of JP7565851B2 publication Critical patent/JP7565851B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Eye Examination Apparatus (AREA)

Description

本発明は、照明用の光学系と受光用の光学系とを備える眼科装置に関する。 The present invention relates to an ophthalmic device equipped with an optical system for illumination and an optical system for receiving light.

被検眼の眼底の撮影を行うスリットスキャン方式の眼底カメラ(眼科装置)が知られている(特許文献1参照)。特許文献1に記載の眼底カメラは、照明系から眼底にスリット光(照明光)を照射しながら、光スキャナを用いて眼底に照射するスリット光を偏向させる。またこの偏向と同時に眼底カメラは、眼底内で移動するスリット光の照明領域からの戻り光を受光系に導き、この戻り光を、受光系に配置された撮像素子の受光面に入射させる。撮像素子は、CMOS(Complementary Metal Oxide Semiconductor)型で且つローリングシャッタ機能を有しており、照明領域の移動に伴い受光面内で移動する戻り光の入射領域に対して局所的な受光領域を追従させながら、受光領域での戻り光の撮像を連続して行う。これにより、不要な散乱光の影響を抑えた眼底像(観察像)が得られる。 A slit-scan fundus camera (ophthalmic device) that photographs the fundus of a subject eye is known (see Patent Document 1). The fundus camera described in Patent Document 1 irradiates the fundus with slit light (illumination light) from an illumination system, while deflecting the slit light irradiated onto the fundus using an optical scanner. At the same time as this deflection, the fundus camera also guides the return light from the illumination area of the slit light moving within the fundus to a light receiving system, and causes this return light to be incident on the light receiving surface of an image sensor arranged in the light receiving system. The image sensor is a CMOS (Complementary Metal Oxide Semiconductor) type with a rolling shutter function, and continuously captures the return light in the light receiving area while making the local light receiving area follow the incident area of the return light that moves within the light receiving surface as the illumination area moves. This allows a fundus image (observation image) to be obtained with reduced effects of unnecessary scattered light.

特許第5735211号公報Patent No. 5735211

図11は、特許文献1に記載のスリットスキャン方式の眼底カメラの課題を説明するための説明図である。なお、図11では、X方向に平行なスリット光のY方向の偏向に応じて、撮像素子44の受光面44aに入射する戻り光の入射領域R1BがY方向に移動し、さらにこの入射領域R1Bに対して撮像素子44の受光領域R2Bが追従している。 Figure 11 is an explanatory diagram for explaining the problem with the slit-scan type fundus camera described in Patent Document 1. In Figure 11, the incidence area R1B of the returning light that is incident on the light receiving surface 44a of the image sensor 44 moves in the Y direction in response to the deflection in the Y direction of the slit light parallel to the X direction, and the light receiving area R2B of the image sensor 44 follows this incidence area R1B.

上記特許文献1に記載の眼底カメラで良好な眼底像を取得するためには、照明系及び受光系の歪曲収差を考慮する必要がある。ここで、例えば走査型レーザ顕微鏡(Scanning Laser Ophthalmoscope:SLO)では、照明系及び受光系の大部分が共通であり(特開2020-142119号公報参照)、照明光及び戻り光は共通の光学系を通る。このため、SLOでは、照明系及び受光系の歪曲収差の影響はほぼキャンセルされる。 In order to obtain a good fundus image with the fundus camera described in Patent Document 1, it is necessary to take into consideration the distortion aberration of the illumination system and the light receiving system. Here, for example, in a scanning laser ophthalmoscope (SLO), most of the illumination system and the light receiving system are common (see JP 2020-142119 A), and the illumination light and the return light pass through a common optical system. Therefore, in an SLO, the effects of the distortion aberration of the illumination system and the light receiving system are almost canceled out.

しかしながら、上記特許文献1に記載のスリットスキャン方式の眼底カメラでは、照明系及び受光系に占める共通の光学系の割合がSLOよりも低いため、照明系及び受光系の歪曲収差がSLOのようにキャンセルされない。この場合には、受光面44a上の入射領域R1B(スリット光のパターン像)に歪みが発生することで、入射領域R1Bと受光領域R2Bとが一致しなくなるおそれ、すなわち受光領域R2B内に入射領域R1Bが包含されないおそれがある。 However, in the slit-scan fundus camera described in Patent Document 1, the proportion of the common optical system in the illumination system and the light-receiving system is lower than in an SLO, so the distortion aberration of the illumination system and the light-receiving system is not canceled out as in an SLO. In this case, distortion occurs in the entrance area R1B (pattern image of the slit light) on the light-receiving surface 44a, which may cause the entrance area R1B and the light-receiving area R2B to not coincide with each other, i.e., the entrance area R1B may not be contained within the light-receiving area R2B.

受光領域R2B内に入射領域R1Bが包含されないと、受光領域R2B上で十分な照明光量が確保されなくなる。このため、図11に示すように、受光領域R2BのY方向の幅WAを大きく広げて、入射領域R1Bと受光領域R2Bとを一致させる、すなわち受光領域R2B内に入射領域R1Bを包含させる必要がある。しかしながら、この場合には、眼底像のS/N比(signal-noise ratio)が劣化したり、ゴースト及びフレアの影響が大きくなったりすることで、眼底像が劣化してしまう。 If the incident region R1B is not included within the light receiving region R2B, a sufficient amount of illumination light will not be secured on the light receiving region R2B. For this reason, as shown in FIG. 11, it is necessary to greatly increase the Y-direction width WA of the light receiving region R2B to make the incident region R1B and the light receiving region R2B coincident with each other, that is, to include the incident region R1B within the light receiving region R2B. However, in this case, the fundus image will be degraded due to a deterioration in the signal-to-noise ratio (S/N) of the fundus image and an increase in the effects of ghosts and flares.

そこで、照明系及び受光系の双方の歪曲収差を極力低減させることが考えられるが、この場合には、照明系及び受光系のレンズ数を増加させたり、レンズの加工精度や組み立て精度を向上させたりする必要がある。その結果、コストが増加してしまう。 One solution to this problem would be to reduce distortion in both the illumination system and the light-receiving system as much as possible, but in this case it would be necessary to increase the number of lenses in the illumination system and the light-receiving system and to improve the machining and assembly precision of the lenses. This would result in increased costs.

本発明はこのような事情に鑑みてなされたものであり、低コストで被観察部位の観察像の劣化を低減可能な眼科装置を提供することを目的とする。 The present invention has been made in consideration of these circumstances, and aims to provide an ophthalmic device that can reduce degradation of the observation image of the observed area at low cost.

本発明の目的を達成するための眼科装置は、被検眼の被観察部位の一部に照明光を照射する照明系と、照明系から被観察部位に照射される照明光を偏向して、被観察部位内で照明光の照明領域を移動させる光スキャナと、光スキャナが照明光を偏向している間、照明光の偏向に応じて被観察部位内で移動する照明領域からの戻り光を受光する受光系と、を備え、照明系及び受光系の双方の歪曲収差が同一の種類である。なお、ここでいう戻り光は、被観察部位の照明領域或いはその付近の領域から戻ってくる光であり、照明光の反射光、照明光の散乱光、照明光が励起する蛍光及びその散乱光などが含まれる。 The ophthalmic apparatus for achieving the object of the present invention comprises an illumination system which irradiates illumination light onto a part of an observed area of a subject's eye, an optical scanner which deflects the illumination light irradiated onto the observed area from the illumination system to move the illumination area of the illumination light within the observed area, and a light receiving system which receives return light from the illumination area which moves within the observed area in response to the deflection of the illumination light while the optical scanner is deflecting the illumination light, and the distortion aberration of both the illumination system and the light receiving system is of the same type. Note that the return light referred to here is light which returns from the illumination area of the observed area or an area nearby, and includes reflected light of the illumination light, scattered light of the illumination light, and fluorescence excited by the illumination light and its scattered light.

この眼科装置によれば、照明系及び受光系の全体としての歪曲収差を低減させられるので、照明系の歪曲収差に起因する戻り光の歪みを受光系により低減させることができる。 This ophthalmic device can reduce the overall distortion of the illumination system and the light receiving system, so that the distortion of the returning light caused by the distortion of the illumination system can be reduced by the light receiving system.

本発明の他の態様に係る眼科装置において、双方の歪曲収差の差が予め定められた閾値以下である。これにより、戻り光の歪みをより低減させることができる。 In an ophthalmic device according to another aspect of the present invention, the difference between the two distortion aberrations is equal to or less than a predetermined threshold value. This makes it possible to further reduce the distortion of the returned light.

本発明の他の態様に係る眼科装置において、双方の歪曲収差が樽型又は糸巻型である。 In another aspect of the present invention, in an ophthalmic device, both distortions are barrel-shaped or pincushion-shaped.

本発明の他の態様に係る眼科装置において、照明系の光軸に垂直で且つ互いに直交する方向を第1方向及び第2方向とした場合に、照明系が、照明光として第1方向に平行なスリット光を被観察部位に照射し、光スキャナが、スリット光を第2方向に偏向する。 In an ophthalmic device according to another aspect of the present invention, when directions perpendicular to the optical axis of the illumination system and perpendicular to each other are defined as a first direction and a second direction, the illumination system irradiates the observed area with a slit light parallel to the first direction as illumination light, and the optical scanner deflects the slit light in the second direction.

本発明の他の態様に係る眼科装置において、受光系が、戻り光が入射する受光面を有する検出器であって、且つ照明領域の移動に応じて受光面内で移動するスリット光の入射領域に対して、受光面内で戻り光を検出する局所的な受光領域であって且つ第1方向に平行な矩形状の受光領域を追従させながら、受光領域での戻り光の検出を連続して行う検出器を備え、受光領域の第2方向の幅が、入射領域の第2方向の幅よりも広い。これにより、受光領域内に入射領域を包含させることができるので、受光領域上で十分な照明光量を確保することができる。 In another aspect of the ophthalmic device of the present invention, the light receiving system is a detector having a light receiving surface on which the returning light is incident, and the detector is a local light receiving area that detects the returning light within the light receiving surface, and is a rectangular light receiving area that is parallel to the first direction, and the detector continuously detects the returning light in the light receiving area while tracking the incident area of the slit light that moves within the light receiving surface in response to the movement of the illumination area, and the width of the light receiving area in the second direction is wider than the width of the incident area in the second direction. This makes it possible to include the incident area within the light receiving area, thereby ensuring a sufficient amount of illumination light on the light receiving area.

本発明の他の態様に係る眼科装置において、受光系が受光した戻り光の受光信号に基づき、被観察部位の観察像を生成する画像生成部を備える。 An ophthalmic device according to another aspect of the present invention includes an image generating unit that generates an observation image of the observed area based on a light receiving signal of the return light received by the light receiving system.

本発明は、低コストで被観察部位の観察像の劣化を低減することができる。 The present invention can reduce degradation of the observed image of the observed area at low cost.

本発明の眼科装置に相当する眼底カメラの概略図である。1 is a schematic diagram of a fundus camera corresponding to an ophthalmic apparatus of the present invention. 制御装置の機能ブロック図である。FIG. 2 is a functional block diagram of a control device. スリットスキャン撮影時の眼底(符号3A参照)と撮像素子の受光面(符号3B参照)とを対比した説明図である。3A is an explanatory diagram comparing the fundus (see symbol 3A) and the light receiving surface of the imaging element (see symbol 3B) during slit scan photography. FIG. 画像生成部により生成される眼底像の一例を示した説明図である。FIG. 4 is an explanatory diagram showing an example of a fundus image generated by an image generating unit. 樽型の歪曲収差(負の歪曲収差)を説明するための説明図である。FIG. 1 is an explanatory diagram for explaining barrel distortion (negative distortion). 糸巻型の歪曲収差(正の歪曲収差)を説明するための説明図である。FIG. 1 is an explanatory diagram for explaining pincushion distortion (positive distortion). 樽型の歪曲収差に起因する照明領域或いは入射領域の歪みを説明するための説明図である。1A and 1B are explanatory diagrams for explaining distortion of an illumination area or an entrance area caused by barrel distortion aberration; 糸巻型の歪曲収差に起因する照明領域或いは入射領域の歪みを説明するための説明図である。1A and 1B are explanatory diagrams for explaining distortion of an illumination area or an entrance area caused by pincushion distortion aberration; 照明系の歪曲収差と受光系の歪曲収差との組み合わせを示した説明図である。1 is an explanatory diagram showing a combination of distortion aberration in an illumination system and distortion aberration in a light receiving system; 受光領域の幅を説明するための説明図である。FIG. 4 is an explanatory diagram for explaining the width of a light receiving region. 特許文献1に記載のスリットスキャン方式の眼底カメラの課題を説明するための説明図である。1 is an explanatory diagram for explaining a problem with the slit-scan type fundus camera described in Patent Document 1. FIG.

[眼底カメラの全体構成]
図1は、本発明の眼科装置に相当する眼底カメラ10の概略図である。なお、図中の互いに直交するXYZ方向のうちで、X方向は被検者を基準とした左右方向(被検眼Eの眼幅方向)であり、Y方向は上下方向であり、Z方向は被検者に近づく前方向と被検者から遠ざかる後方向とに平行な前後方向(作動距離方向ともいう)である。
[Overall configuration of fundus camera]
1 is a schematic diagram of a fundus camera 10 corresponding to an ophthalmologic apparatus of the present invention. In the mutually orthogonal XYZ directions in the figure, the X direction is a left-right direction based on the subject (the interpupillary direction of the subject's eye E), the Y direction is a top-bottom direction, and the Z direction is a front-back direction (also called a working distance direction) parallel to the front direction approaching the subject and the rear direction away from the subject.

図1に示すように、眼底カメラ10は、スリットスキャン方式で被検眼Eの眼底Efの撮影(以下、スリットスキャン撮影と略す)を行う。この眼底カメラ10は、大別してカメラヘッド12(装置本体ともいう)と操作部14と表示部16と制御装置18とを備える。 As shown in FIG. 1, the fundus camera 10 photographs the fundus Ef of the subject's eye E using a slit scan method (hereinafter, abbreviated as slit scan photography). This fundus camera 10 is roughly divided into a camera head 12 (also called the device body), an operation unit 14, a display unit 16, and a control device 18.

カメラヘッド12には、詳しくは後述するが、スリットスキャン撮影に必要な各種光学系等が設けられている。また、図示は省略するがカメラヘッド12は、不図示の駆動機構によりXYZ方向に相対移動可能に保持されている。これにより、被検眼Eに対してカメラヘッド12がXYZ方向に相対移動可能になるので、被検眼Eに対するカメラヘッド12のアライメントが可能になる。 The camera head 12 is provided with various optical systems required for slit scan photography, which will be described in detail later. In addition, although not shown, the camera head 12 is held so as to be movable relative to the subject's eye E in the XYZ directions by a drive mechanism (not shown). This allows the camera head 12 to move relative to the subject's eye E in the XYZ directions, making it possible to align the camera head 12 with the subject's eye E.

操作部14は、スリットスキャン撮影の撮影開始操作、カメラヘッド12のXYZ方向の移動操作、眼底カメラ10の設定操作などの眼底カメラ10の各種操作の入力を受け付ける。 The operation unit 14 accepts inputs for various operations of the fundus camera 10, such as starting slit scan photography, moving the camera head 12 in the XYZ directions, and setting the fundus camera 10.

表示部16は、例えばLCD(Liquid Crystal Display)等の公知の各種ディスプレイが用いられる。この表示部16は、後述の制御装置18が生成した眼底Efの観察像(正面画像)である眼底像D、及び各種の設定画面等を表示する。 The display unit 16 may be any of a variety of known displays, such as an LCD (Liquid Crystal Display). The display unit 16 displays a fundus image D, which is an observation image (frontal image) of the fundus Ef generated by the control device 18 (described below), as well as various setting screens, etc.

制御装置18は、各種の演算処理及び制御処理等を実行するコンピュータ等の演算処理装置である。この制御装置18には、カメラヘッド12、操作部14、及び表示部16が接続されている。制御装置18は、操作部14に入力された操作指示に基づき、カメラヘッド12及び表示部16の各部の動作を統括制御する。例えば制御装置18は、カメラヘッド12のアライメントと、カメラヘッド12によるスリットスキャン撮影と、眼底像Dの生成及び表示と、を含む各種制御及び処理を実行する。 The control device 18 is an arithmetic processing device such as a computer that executes various arithmetic processing and control processing. The camera head 12, the operation unit 14, and the display unit 16 are connected to this control device 18. The control device 18 controls the operation of each part of the camera head 12 and the display unit 16 based on the operation instructions input to the operation unit 14. For example, the control device 18 executes various controls and processes including alignment of the camera head 12, slit scan photography by the camera head 12, and generation and display of a fundus image D.

[カメラヘッドの構成]
カメラヘッド12は、照明系20と、光スキャナ30と、受光系40と、を備える。
[Camera head configuration]
The camera head 12 includes an illumination system 20 , an optical scanner 30 , and a light receiving system 40 .

照明系20は、後述の光スキャナ30を介して、眼底Efの一部に照明光LS(スリット光)を照射する。この照明系20は、光源22と絞り24とスリット開口絞り26と照明系レンズ28とレンズ31と光路分割材34と対物レンズ38とを備える。なお、絞り24、光スキャナ30、光路分割材34、及び被検眼Eの前眼部Eaが光学的共役関係にある。 The illumination system 20 irradiates a portion of the fundus Ef with illumination light LS (slit light) via an optical scanner 30 described below. This illumination system 20 includes a light source 22, an aperture 24, a slit aperture diaphragm 26, an illumination system lens 28, a lens 31, an optical path splitting material 34, and an objective lens 38. The aperture 24, the optical scanner 30, the optical path splitting material 34, and the anterior segment Ea of the subject's eye E are in an optically conjugate relationship.

光源22は、照明光Lを出射する。この照明光Lとしては、可視光が用いられるが、被検眼Eの感度が小さい赤外領域(近赤外領域を含む)の光である赤外光を用いてもよい。この光源22には、レーザ光源、LED(Light Emitting Diode)光源、白色LED光源、レーザ励起白色光源などが用いられるが、この限りではない。光源22から出射された照明光Lは、絞り24を経てスリット開口絞り26に入射する。 The light source 22 emits illumination light L. Visible light is used as this illumination light L, but infrared light, which is light in the infrared region (including the near-infrared region) to which the subject's eye E has low sensitivity, may also be used. The light source 22 may be, but is not limited to, a laser light source, an LED (Light Emitting Diode) light source, a white LED light source, or a laser-excited white light source. The illumination light L emitted from the light source 22 passes through the diaphragm 24 and enters the slit aperture diaphragm 26.

スリット開口絞り26は、絞り24から入射した照明光LからX方向(本発明の第1方向に相当)に平行な照明光LSを生成し、この照明光LSを照明系レンズ28に向けて出射する。照明光LSは、合焦時に眼底位置及び眼底共役位置でX方向に平行なスリット状(スリット光)になる。なお、照明光LS(スリット光)は、対物レンズ38(照明系20)の光軸に垂直であれば特に限定はされない。また、スリット開口絞り26は、不図示のアクチュエータにより照明光LSの光路に沿って移動自在に設けられている。このスリット開口絞り26を移動させることで、照明系20を眼底Efに対して合焦させることができる。 The slit aperture diaphragm 26 generates illumination light LS parallel to the X direction (corresponding to the first direction of the present invention) from the illumination light L incident from the diaphragm 24, and emits this illumination light LS toward the illumination system lens 28. When focused, the illumination light LS becomes a slit shape (slit light) parallel to the X direction at the fundus position and the fundus conjugate position. Note that the illumination light LS (slit light) is not particularly limited as long as it is perpendicular to the optical axis of the objective lens 38 (illumination system 20). In addition, the slit aperture diaphragm 26 is provided so as to be freely movable along the optical path of the illumination light LS by an actuator (not shown). By moving this slit aperture diaphragm 26, the illumination system 20 can be focused on the fundus Ef.

照明系レンズ28は、1又は複数のレンズにより構成されており、スリット開口絞り26から入射した照明光LSを光スキャナ30に向けて出射する。レンズ31は、光スキャナ30により反射された照明光LSを光路分割材34に向けて出射する。レンズ31は、光スキャナ30と光路分割材34とを光学的共役関係にする。なお、光路分割材34及び対物レンズ38については後述する。 The illumination system lens 28 is composed of one or more lenses, and emits the illumination light LS incident from the slit aperture diaphragm 26 toward the optical scanner 30. The lens 31 emits the illumination light LS reflected by the optical scanner 30 toward the optical path splitting material 34. The lens 31 makes the optical scanner 30 and the optical path splitting material 34 optically conjugate. The optical path splitting material 34 and the objective lens 38 will be described later.

なお、照明系20として、照明光LSを出射可能なプロジェクタを用いてもよい。このプロジェクタとしては、LCD方式のプロジェクタ、反射型液晶パネルを用いたLCOS(Liquid crystal on silicon)方式のプロジェクタ、及びDMD(Digital Mirror Device)を用いたプロジェクタなどが例として挙げられる。この場合、光スキャナ30は、固定ミラーに替え、プロジェクタのパターンの変化で光スキャナ30が行う光走査を模してもよい。 The illumination system 20 may be a projector capable of emitting illumination light LS. Examples of such projectors include LCD projectors, LCOS (Liquid crystal on silicon) projectors using a reflective liquid crystal panel, and projectors using a DMD (Digital Mirror Device). In this case, the optical scanner 30 may be replaced by a fixed mirror, and the optical scanning performed by the optical scanner 30 may be simulated by changing the pattern of the projector.

光スキャナ30は、例えばガルバノミラー、レゾナントミラー、ポリゴンミラー、及びMEMS(Micro Electro Mechanical Systems)等の照明光LSを1次元偏向(走査)可能な偏向機構であり、照明系レンズ28の光軸とレンズ31の光軸との交点に配置されている。この光スキャナ30は、照明系レンズ28から入射した照明光LSをレンズ31に向けて反射すると共に、この照明光LSを偏向可能である。 The optical scanner 30 is a deflection mechanism capable of one-dimensionally deflecting (scanning) the illumination light LS, such as a galvanometer mirror, a resonant mirror, a polygon mirror, or a MEMS (Micro Electro Mechanical Systems), and is disposed at the intersection of the optical axis of the illumination system lens 28 and the optical axis of the lens 31. The optical scanner 30 reflects the illumination light LS incident from the illumination system lens 28 toward the lens 31, and is capable of deflecting the illumination light LS.

光スキャナ30による照明光LSの偏光方向及び偏向角度は、制御装置18によって制御される。そして、光スキャナ30は、スリットスキャン撮影時には照明光LSを対物レンズ38の光軸及びスリット光の双方に垂直な方向、ここではY方向(本発明の第2方向に相当)に偏向する。 The polarization direction and deflection angle of the illumination light LS by the optical scanner 30 are controlled by the control device 18. During slit scan photography, the optical scanner 30 deflects the illumination light LS in a direction perpendicular to both the optical axis of the objective lens 38 and the slit light, in this case the Y direction (corresponding to the second direction of the present invention).

光路分割材34は、レンズ31から入射した照明光LSを反射して対物レンズ38に向けて出射させると共に、対物レンズ38から入射した後述の戻り光LBを通過させてフォーカス光学系36に向けて出射する。なお、光路分割材34は、照明光LS及び戻り光LBを分割して、照明光LSを対物レンズ38に向けて反射し且つ戻り光LBをフォーカス光学系36に向けて出射可能であれば、各種スプリッタを用いることができる。 The optical path splitting material 34 reflects the illumination light LS incident from the lens 31 and emits it toward the objective lens 38, and also passes the return light LB incident from the objective lens 38, which will be described later, and emits it toward the focus optical system 36. Note that various splitters can be used as the optical path splitting material 34 as long as it is capable of splitting the illumination light LS and the return light LB, reflecting the illumination light LS toward the objective lens 38, and emitting the return light LB toward the focus optical system 36.

対物レンズ38は、光路分割材34により反射された照明光LSを、被検眼Eの前眼部Ea(瞳孔)を通して眼底Efの一部に照射する。この際に既述の光スキャナ30により照明光LSがY方向に偏向されることで、X方向に平行な照明光LS(スリット光)により眼底Ef内がY方向に走査される。そして、照明光LSのY方向の偏向が行われている間、照明光LSが照射された被検眼Eの眼底Efからの戻り光LBが、対物レンズ38及び光路分割材34を通してフォーカス光学系36に入射する。 The objective lens 38 irradiates the illumination light LS reflected by the optical path splitting material 34 onto a part of the fundus Ef through the anterior segment Ea (pupil) of the subject's eye E. At this time, the illumination light LS is deflected in the Y direction by the optical scanner 30 described above, and the fundus Ef is scanned in the Y direction with the illumination light LS (slit light) parallel to the X direction. Then, while the illumination light LS is being deflected in the Y direction, the return light LB from the fundus Ef of the subject's eye E irradiated with the illumination light LS enters the focus optical system 36 through the objective lens 38 and the optical path splitting material 34.

受光系40は、対物レンズ38と、光路分割材34と、フォーカス光学系36と、受光系レンズ42と、CMOS型の撮像素子44と、を備える。 The light receiving system 40 includes an objective lens 38, an optical path splitter 34, a focusing optical system 36, a light receiving system lens 42, and a CMOS type image sensor 44.

フォーカス光学系36は、戻り光LBの光路に沿って移動可能な1又は複数のレンズ(フォーカスレンズ)を備え、制御装置18の制御の下で眼底カメラ10(受光系40)のフォーカス調整を行う。フォーカス光学系36による受光系40の合焦と、スリット開口絞り26による照明系20の合焦とは、被検眼Eのディオプタ(視度)に応じて連動して動く。光路分割材34からフォーカス光学系36に入射した戻り光LBは、受光系レンズ42に入射する。なお、フォーカス光学系36に、1又は複数のフォーカスレンズを移動自在に設ける代わりに1又は複数の可変焦点レンズを設けてもよく、フォーカス調整の方法は特に限定されない。 The focus optical system 36 includes one or more lenses (focus lenses) that can move along the optical path of the return light LB, and adjusts the focus of the fundus camera 10 (light-receiving system 40) under the control of the control device 18. The focusing of the light-receiving system 40 by the focus optical system 36 and the focusing of the illumination system 20 by the slit aperture diaphragm 26 move in conjunction with each other according to the diopter (visual acuity) of the subject's eye E. The return light LB that enters the focus optical system 36 from the optical path splitter 34 enters the light-receiving system lens 42. Note that instead of providing one or more movable focus lenses in the focus optical system 36, one or more variable focus lenses may be provided, and the method of focus adjustment is not particularly limited.

受光系レンズ42は、1又は複数のレンズにより構成されており、フォーカス光学系36から入射した戻り光LBを撮像素子44に集光させる。 The light receiving lens 42 is composed of one or more lenses, and focuses the return light LB incident from the focus optical system 36 onto the image sensor 44.

撮像素子44は、受光系レンズ42からの戻り光LBが入射する受光面44aを有し、この受光面44a内で領域ごと(画素ごと、ラインごとを含む)の露光の開始及び終了のタイミングをずらしながら戻り光LBの撮像(受光、検出)を行うローリングシャッタ機能を有する。この撮像素子44は、スリットスキャン撮影時には、制御装置18によりローリングシャッタ駆動されることで、光スキャナ30による照明光LSの偏向に応じて眼底Ef内で移動する照明光LSの戻り光LBを撮像し、戻り光LBの撮像信号を制御装置18に出力する。 The image sensor 44 has a light receiving surface 44a on which the return light LB from the light receiving lens 42 is incident, and has a rolling shutter function that captures (receives, detects) the return light LB while shifting the timing of the start and end of exposure for each area (including each pixel and each line) within this light receiving surface 44a. During slit scan photography, this image sensor 44 is driven by the control device 18 as a rolling shutter to capture the return light LB of the illumination light LS that moves within the fundus Ef in response to the deflection of the illumination light LS by the optical scanner 30, and outputs an image signal of the return light LB to the control device 18.

[制御装置の機能]
図2は、制御装置18の機能ブロック図である。図2に示すように、制御装置18の機能は、各種のプロセッサ(Processor)を用いて実現される。各種のプロセッサには、CPU(Central Processing Unit)、GPU(Graphics Processing Unit)、ASIC(Application Specific Integrated Circuit)、及びプログラマブル論理デバイス[例えばSPLD(Simple Programmable Logic Devices)、CPLD(Complex Programmable Logic Device)、及びFPGA(Field Programmable Gate Arrays)]等が含まれる。なお、制御装置18の各種機能は、1つのプロセッサにより実現されてもよいし、同種または異種の複数のプロセッサで実現されてもよい。
[Control device functions]
Fig. 2 is a functional block diagram of the control device 18. As shown in Fig. 2, the functions of the control device 18 are realized by using various processors. The various processors include a central processing unit (CPU), a graphics processing unit (GPU), an application specific integrated circuit (ASIC), and a programmable logic device (e.g., simple programmable logic devices (SPLD), complex programmable logic devices (CPLD), and field programmable gate arrays (FPGA)). The various functions of the control device 18 may be realized by one processor, or may be realized by multiple processors of the same type or different types.

制御装置18は、不図示の制御プログラムを実行することで、照明制御部50、偏向制御部52、撮像制御部54、信号取得部56、画像生成部58、画像処理部59、及び表示制御部64として機能する。なお、制御装置18の「~部」として説明するものは「~回路」、「~装置」、又は「~機器」であってもよい。すなわち、「~部」として説明するものは、ファームウェア、ソフトウェア、及びハードウェアまたはこれらの組み合わせのいずれで構成されていてもよい。 The control device 18 executes a control program (not shown) to function as an illumination control unit 50, a deflection control unit 52, an imaging control unit 54, a signal acquisition unit 56, an image generation unit 58, an image processing unit 59, and a display control unit 64. Note that what is described as a "unit" of the control device 18 may also be a "circuit", a "device", or a "equipment". In other words, what is described as a "unit" may be composed of firmware, software, hardware, or a combination of these.

照明制御部50は、光源22からの照明光Lの出射、すなわち照明系20からの照明光LSの出射を制御する。 The lighting control unit 50 controls the emission of illumination light L from the light source 22, i.e., the emission of illumination light LS from the lighting system 20.

図3は、スリットスキャン撮影時の眼底Ef(符号3A参照)と撮像素子44の受光面44a(符号3B参照)とを対比した説明図である。図3中の符号R1Aは眼底Ef内での照明光LSの照明領域R1Aを示し、符号R1Bは受光面44a内に入射する戻り光LBの入射領域R1B(照明光LSのパターン像)を示す。また、図3中の符号R2Bは受光面44a内の受光領域R2B(アクティブな露光領域)を示し、符号R2Aは眼底Ef内において受光領域R2Bにより撮像される撮像範囲R2Aを示す。 Figure 3 is an explanatory diagram comparing the fundus Ef (see symbol 3A) and the light receiving surface 44a (see symbol 3B) of the image sensor 44 during slit scan photography. Symbol R1A in Figure 3 indicates the illumination area R1A of the illumination light LS in the fundus Ef, and symbol R1B indicates the incidence area R1B (pattern image of the illumination light LS) of the return light LB that enters the light receiving surface 44a. Also, symbol R2B in Figure 3 indicates the light receiving area R2B (active exposure area) in the light receiving surface 44a, and symbol R2A indicates the imaging range R2A imaged by the light receiving area R2B in the fundus Ef.

なお、図中では撮像範囲R2Aの幅が照明領域R1Aの幅よりも大きく、受光領域R2Bの幅が入射領域R1Bの幅よりも大きくなっているが、この限りではない。すなわち、眼底Ef内での照明領域R1A及び撮像範囲R2Aの個々の位置形状と、受光面44a内での入射領域R1B及び受光領域R2Bの個々の位置形状とは、図3に示した例に限定されるものではなく適宜変更してもよい。 In the figure, the width of the imaging range R2A is larger than the width of the illumination area R1A, and the width of the light receiving area R2B is larger than the width of the entrance area R1B, but this is not limited to the above. In other words, the individual positional shapes of the illumination area R1A and imaging range R2A within the fundus Ef, and the individual positional shapes of the entrance area R1B and light receiving area R2B within the light receiving surface 44a are not limited to the example shown in FIG. 3, and may be changed as appropriate.

図3及び既述の図2に示すように、偏向制御部52は、光スキャナ30による照明光LSの偏向角度を制御する。この偏向制御部52は、スリットスキャン撮影時に光スキャナ30を制御して照明光LSをY方向に偏向させることで、照明光LS(スリット光)により眼底Ef内をY方向に走査する。 As shown in FIG. 3 and the above-mentioned FIG. 2, the deflection control unit 52 controls the deflection angle of the illumination light LS by the optical scanner 30. This deflection control unit 52 controls the optical scanner 30 during slit scan photography to deflect the illumination light LS in the Y direction, thereby scanning the fundus Ef in the Y direction with the illumination light LS (slit light).

照明光LSのY方向の偏向に応じて眼底Ef内での照明光LSの照明領域R1AがY方向に移動する(図3の符号3A参照)。また、この照明領域R1Aの移動に応じて、受光面44a内で戻り光LBの入射領域R1BがY方向に移動する(図3の符号3B参照)。 In response to the deflection of the illumination light LS in the Y direction, the illumination area R1A of the illumination light LS in the fundus Ef moves in the Y direction (see reference symbol 3A in FIG. 3). In response to the movement of the illumination area R1A, the incidence area R1B of the return light LB moves in the Y direction within the light receiving surface 44a (see reference symbol 3B in FIG. 3).

撮像制御部54は、撮像素子44の駆動を制御する。この撮像制御部54は、スリットスキャン撮影時に光スキャナ30による照明光LSのY方向の偏向が行われている間、すなわち眼底Ef内で照明領域R1AがY方向に移動している間、撮像素子44のローリングシャッタ駆動(動作)を行う。 The imaging control unit 54 controls the driving of the imaging element 44. This imaging control unit 54 performs rolling shutter driving (operation) of the imaging element 44 while the illumination light LS is deflected in the Y direction by the optical scanner 30 during slit scan photography, i.e., while the illumination area R1A moves in the Y direction within the fundus Ef.

具体的には撮像制御部54は、受光面44a内での入射領域R1BのY方向の移動に応じて(同期して)、受光面44a内の入射領域R1Bに対応する位置で局所的な受光領域R2B(ここではX方向に平行な矩形状の受光領域R2B)による戻り光LBの撮像を連続的に実行させる。これにより、撮像制御部54は、受光面44a内でY方向に移動する入射領域R1Bに対して受光領域R2Bを追従させながら、受光領域R2Bによる戻り光LBの撮像を連続して実行させる(符号3B参照)。 Specifically, the imaging control unit 54 continuously captures images of the return light LB by a local light receiving area R2B (here, a rectangular light receiving area R2B parallel to the X direction) at a position corresponding to the entrance area R1B on the light receiving surface 44a in response to (synchronization with) the movement of the entrance area R1B in the Y direction on the light receiving surface 44a. As a result, the imaging control unit 54 continuously captures images of the return light LB by the light receiving area R2B while making the light receiving area R2B follow the entrance area R1B moving in the Y direction on the light receiving surface 44a (see symbol 3B).

換言すると眼底Ef内では、Y方向に移動する照明領域R1Aに対して局所的な撮像範囲R2Aを追従させながら、撮像範囲R2Aの撮像が撮像素子44により連続して行われる(符号3A参照)。このようなローリングシャッタ駆動は公知技術であるので、具体的な説明は省略する(上記特許文献1参照)。 In other words, within the fundus Ef, the imaging element 44 continuously captures an image of the local imaging range R2A while tracking the illumination area R1A moving in the Y direction (see symbol 3A). This type of rolling shutter drive is a known technique, so a detailed description will be omitted (see Patent Document 1 above).

なお、眼底Ef内での照明領域R1A及び撮像範囲R2Aの個々の位置形状と、受光面44a内での入射領域R1B及び受光領域R2Bの個々の位置形状とは、図3に示した例に限定されるものではなく適宜変更してもよい。 Note that the individual positional shapes of the illumination area R1A and the imaging range R2A within the fundus Ef, and the individual positional shapes of the entrance area R1B and the light receiving area R2B within the light receiving surface 44a are not limited to the example shown in FIG. 3, and may be changed as appropriate.

信号取得部56は、不図示の通信インタフェースを介して、撮像素子44に対して有線接続或いは無線接続されている。信号取得部56は、光スキャナ30による照明光LSの偏向が行われている間、撮像素子44の受光領域R2Bからの撮像信号(検出信号又は受光信号ともいう)を逐次取得する。 The signal acquisition unit 56 is connected to the image sensor 44 by wire or wirelessly via a communication interface (not shown). The signal acquisition unit 56 sequentially acquires an image signal (also called a detection signal or a light receiving signal) from the light receiving region R2B of the image sensor 44 while the optical scanner 30 is deflecting the illumination light LS.

図4は、画像生成部58により生成される眼底像Dの一例を示した説明図である。図4及び既述の図2に示すように、画像生成部58は、光スキャナ30による照明光LSの偏向が行われている間に信号取得部56が取得した撮像信号に基づき、眼底像Dの生成を行う。 Figure 4 is an explanatory diagram showing an example of a fundus image D generated by the image generating unit 58. As shown in Figure 4 and the above-mentioned Figure 2, the image generating unit 58 generates the fundus image D based on the imaging signal acquired by the signal acquiring unit 56 while the illumination light LS is being deflected by the optical scanner 30.

図2に戻って、画像処理部59は、画像生成部58が生成した眼底像Dに対して、照明系20及び受光系40の歪曲収差による眼底像Dの歪みを補正する補正処理を含む各種の画像処理を施す。表示制御部64は、画像処理部59による画像処理後の眼底像Dを表示部16に表示させたり、或いは眼底カメラ10の各種設定画面などを表示部16に表示させたりする。 Returning to FIG. 2, the image processing unit 59 performs various image processing on the fundus image D generated by the image generating unit 58, including a correction process for correcting distortion of the fundus image D caused by the distortion aberration of the illumination system 20 and the light receiving system 40. The display control unit 64 causes the display unit 16 to display the fundus image D after image processing by the image processing unit 59, or causes the display unit 16 to display various setting screens of the fundus camera 10, etc.

<照明系及び受光系の歪曲収差>
図5は、樽型の歪曲収差(負の歪曲収差)を説明するための説明図である。図6は、糸巻型の歪曲収差(正の歪曲収差)を説明するための説明図である。図7は、図5に示した樽型の歪曲収差に起因する照明領域R1A或いは入射領域R1Bの歪みを説明するための説明図である。図8は、図6に示した糸巻型の歪曲収差に起因する照明領域R1A或いは入射領域R1Bの歪みを説明するための説明図である。
<Distortion in the illumination system and the light receiving system>
Fig. 5 is a diagram for explaining barrel distortion (negative distortion). Fig. 6 is a diagram for explaining pincushion distortion (positive distortion). Fig. 7 is a diagram for explaining distortion of the illumination region R1A or the entrance region R1B caused by the barrel distortion shown in Fig. 5. Fig. 8 is a diagram for explaining distortion of the illumination region R1A or the entrance region R1B caused by the pincushion distortion shown in Fig. 6.

図5から図8と、既述の図1とに示すように、照明系20及び受光系40の光学系(レンズ等)は、一定の歪曲収差(ディストーション)を有している。このような歪曲収差としては、図5に示したような樽型と、図6に示した糸巻型とが例として挙げられる。 As shown in Figures 5 to 8 and in Figure 1, the optical systems (lenses, etc.) of the illumination system 20 and the light receiving system 40 have a certain amount of distortion. Examples of such distortion include a barrel type as shown in Figure 5 and a pincushion type as shown in Figure 6.

例えば図7に示すように、照明系20が樽型の歪曲収差を有する場合には照明光LSの照明領域R1Aが理想状態NDから樽型に歪み、受光系40が樽型の歪曲収差を有する場合には戻り光LBの入射領域R1Bが理想状態NDから樽型に歪んでしまう。また、図8に示すように、照明系20が糸巻型の歪曲収差を有する場合には照明領域R1Aが理想状態NDから糸巻型に歪み、受光系40が糸巻型の歪曲収差を有する場合には入射領域R1Bが理想状態NDから糸巻型に歪んでしまう。 For example, as shown in FIG. 7, when the illumination system 20 has barrel-shaped distortion, the illumination region R1A of the illumination light LS is distorted from the ideal state ND to a barrel shape, and when the light receiving system 40 has barrel-shaped distortion, the incidence region R1B of the return light LB is distorted from the ideal state ND to a barrel shape. Also, as shown in FIG. 8, when the illumination system 20 has pincushion distortion, the illumination region R1A is distorted from the ideal state ND to a pincushion shape, and when the light receiving system 40 has pincushion distortion, the incidence region R1B is distorted from the ideal state ND to a pincushion shape.

このように照明系20が歪曲収差を有していると、光スキャナ30により照明光LSを等速度で偏向(線形に偏向)させた場合に、眼底Ef上の照明領域R1Aが等速度で移動(線形に移動)することなく非線形で動いてしまう。また、受光系40が歪曲収差を有していると、戻り光LBの歪みにより受光面44a上の入射領域R1B(照明光LSのパターン像)が歪んでしまう。 If the illumination system 20 has distortion in this way, when the illumination light LS is deflected at a constant speed (linearly deflected) by the optical scanner 30, the illumination area R1A on the fundus Ef moves nonlinearly and not at a constant speed (linearly). Also, if the light receiving system 40 has distortion, the incident area R1B (pattern image of the illumination light LS) on the light receiving surface 44a will be distorted due to distortion of the return light LB.

さらに、戻り光LBの歪みによって受光面44a上で入射領域R1Bと受光領域R2Bとが一致せず、受光領域R2Bに対する十分な光量が確保されないおそれがある。ここで既述の図11に示したように受光領域R2Bの幅WAを大きく広げてしまうと、S/N比の低下やゴーストフレアの影響により眼底像Dが劣化するため、戻り光LBの歪みを補正する必要がある。また、照明系20及び受光系40の個別の歪曲収差を低減させようとすると、レンズ数を増加させたり、レンズの加工精度を向上させたりする必要があるのでコストが増加してしまう。 Furthermore, due to distortion of the return light LB, the entrance area R1B and the light receiving area R2B do not coincide on the light receiving surface 44a, and there is a risk that a sufficient amount of light will not be secured for the light receiving area R2B. Here, as already shown in FIG. 11, if the width WA of the light receiving area R2B is greatly increased, the fundus image D will deteriorate due to a decrease in the S/N ratio and the effects of ghost flare, so it is necessary to correct the distortion of the return light LB. Furthermore, if an attempt is made to reduce the individual distortion aberrations of the illumination system 20 and the light receiving system 40, it will be necessary to increase the number of lenses and improve the processing accuracy of the lenses, which will increase costs.

そこで、本実施形態では、照明系20の歪曲収差と受光系40の歪曲収差とを同じ種類(特性)にすることで、照明系20の歪曲収差に起因する戻り光LBの歪みを受光系40により低減させる。すなわち、照明系20及び受光系40の個別の歪曲収差を低減させるのではなく、照明系20及び受光系40の全体としての歪曲収差を低減させる。 In this embodiment, the distortion of the illumination system 20 and the distortion of the light receiving system 40 are of the same type (characteristics), so that the distortion of the return light LB caused by the distortion of the illumination system 20 is reduced by the light receiving system 40. In other words, instead of reducing the distortion of the illumination system 20 and the light receiving system 40 individually, the distortion of the illumination system 20 and the light receiving system 40 as a whole is reduced.

図9は、照明系20の歪曲収差と受光系40の歪曲収差との組み合わせを示した説明図である。なお、図9では歪曲収差の種類として「樽型」と「糸巻型」を例に挙げて説明を行う。 Figure 9 is an explanatory diagram showing a combination of distortion aberration of the illumination system 20 and the light receiving system 40. Note that in Figure 9, "barrel type" and "pincushion type" are given as examples of types of distortion aberration.

図9に示すように本実施形態では、照明系20の歪曲収差が「樽型」である場合には受光系40の歪曲収差を「樽型」とし、照明系20の歪曲収差が「糸巻型」である場合には受光系40の歪曲収差を「糸巻型」とすることで、戻り光LB(入射領域R1B)の歪みを低減させる。この場合には、照明系20及び受光系40の歪曲収差の種類を揃えるだけでよいため、照明系20及び受光系40の歪曲収差を個別に低減させる場合と比較して、照明系20及び受光系40の設計が簡単になる。 9, in this embodiment, when the distortion aberration of the illumination system 20 is "barrel-shaped", the distortion aberration of the light receiving system 40 is "barrel-shaped", and when the distortion aberration of the illumination system 20 is "pincushion-shaped", the distortion aberration of the light receiving system 40 is "pincushion-shaped", thereby reducing the distortion of the return light LB (incident region R1B). In this case, it is only necessary to match the types of distortion aberration of the illumination system 20 and the light receiving system 40, so the design of the illumination system 20 and the light receiving system 40 is simplified compared to the case where the distortion aberration of the illumination system 20 and the light receiving system 40 are reduced individually.

この際に、照明系20の歪曲収差と受光系40の歪曲収差との差は、予め定められた閾値以下(例えば4%以下)であることが好ましい。これにより、戻り光LB(入射領域R1B)の歪みをより低減させることができる。なお、眼底カメラ10は、眼底Efに合焦させる(ピント合わせる)ため、被検眼Eの眼屈折度数(Diopter)によって照明系20及び受光系40の収差特性が変わるが、本実施形態では眼底カメラ10が合焦可能な範囲内で両光学系の歪曲収差を略一致させる、すなわち上述の差を閾値以下にしている。 At this time, it is preferable that the difference between the distortion aberration of the illumination system 20 and the distortion aberration of the light receiving system 40 is equal to or less than a predetermined threshold (e.g., 4% or less). This allows the distortion of the return light LB (incident region R1B) to be further reduced. Note that the fundus camera 10 focuses (aligns the focus) on the fundus Ef, and the aberration characteristics of the illumination system 20 and the light receiving system 40 change depending on the ocular refractive power (Diopter) of the subject eye E. In this embodiment, the distortion aberration of both optical systems is approximately matched within the range in which the fundus camera 10 can focus, i.e., the above-mentioned difference is set to or less than a threshold.

このように本実施形態では、照明系20及び受光系40の歪曲収差の種類を同一にすることで、戻り光LB(入射領域R1B)の歪みを低減可能であるが、戻り光LBの歪みを完全に無くすことは困難である。このため本実施形態では、受光面44a上の受光領域R2B内に入射領域R1Bが包含されるように、受光領域R2BのY方向の幅WAを僅かに広げている。 In this manner, in this embodiment, by making the types of distortion aberration of the illumination system 20 and the light receiving system 40 the same, it is possible to reduce the distortion of the return light LB (incident region R1B), but it is difficult to completely eliminate the distortion of the return light LB. For this reason, in this embodiment, the Y-direction width WA of the light receiving region R2B is slightly widened so that the incident region R1B is included within the light receiving region R2B on the light receiving surface 44a.

図10は、本実施形態における受光領域R2Bの幅WAを説明するための説明図である。なお、図10では、図面の煩雑化を防止するため入射領域R1Bを歪みのないスリット状に図示しているが、この入射領域R1Bには歪みが生じている。 Figure 10 is an explanatory diagram for explaining the width WA of the light receiving region R2B in this embodiment. Note that in Figure 10, the entrance region R1B is illustrated as a distortion-free slit shape to avoid complicating the drawing, but distortion does occur in this entrance region R1B.

図10に示すように本実施形態では、戻り光LB(入射領域R1B)の歪みを低減させているので、図11に示した従来例とは異なり、受光領域R2BのY方向の幅WAを大きく広げることなく、受光領域R2B内に入射領域R1Bを包含可能である。例えば本実施形態では、入射領域R1BのY方向の幅WS(1deg相当)に対して、受光領域R2Bの幅WAを2倍(2deg相当)にすることで、入射領域R1Bと受光領域R2Bとの間に0.5deg分のずれが生じても、受光領域R2B内に入射領域R1Bが包含される。これにより、受光領域R2B上で十分な照明光量を確保しつつ、S/N比の劣化、ゴースト及びフレアの影響が抑えられる。 As shown in FIG. 10, in this embodiment, the distortion of the return light LB (incident region R1B) is reduced, so unlike the conventional example shown in FIG. 11, it is possible to include the incident region R1B within the light receiving region R2B without significantly increasing the Y-directional width WA of the light receiving region R2B. For example, in this embodiment, by making the width WA of the light receiving region R2B twice (equivalent to 2 degrees) the Y-directional width WS of the incident region R1B (equivalent to 1 degree), the incident region R1B is included within the light receiving region R2B even if there is a deviation of 0.5 degrees between the incident region R1B and the light receiving region R2B. This ensures a sufficient amount of illumination light on the light receiving region R2B while suppressing deterioration of the S/N ratio and the effects of ghosts and flares.

なお、本実施形態では戻り光LB(入射領域R1B)の歪みを完全に無くすことが困難であるため、画像生成部58により生成される眼底像Dにも一定の歪みが生じるが、この歪みについては画像処理部59による補正処理で容易に修正可能である。 In this embodiment, since it is difficult to completely eliminate distortion of the return light LB (incident region R1B), a certain amount of distortion also occurs in the fundus image D generated by the image generating unit 58, but this distortion can be easily corrected by correction processing by the image processing unit 59.

[本実施形態の効果]
以上のように本実施形態では、照明系20及び受光系40が分かれている場合であっても、照明系20及び受光系40の歪曲収差を同じ種類にすることで、照明系20の歪曲収差に起因する戻り光LBの歪みを受光系40により低減可能である。その結果、従来のように受光領域R2Bの幅WAを大きく広げたり(図11参照)、或いは照明系20及び受光系40のレンズ枚数を増加させたり或いは高い加工精度が要求されるレンズを用いたり組み立て精度を向上させたりすることなく、受光領域R2B内に入射領域R1Bを包含可能である。これにより、低コストで眼底像Dの劣化を低減させることができる。
[Effects of this embodiment]
As described above, in this embodiment, even if the illumination system 20 and the light receiving system 40 are separate, the distortion of the return light LB caused by the distortion of the illumination system 20 can be reduced by the light receiving system 40 by making the distortion of the illumination system 20 the same type as in the conventional case. As a result, the entrance region R1B can be included in the light receiving region R2B without significantly widening the width WA of the light receiving region R2B (see FIG. 11), increasing the number of lenses in the illumination system 20 and the light receiving system 40, using lenses that require high processing accuracy, or improving assembly accuracy. This makes it possible to reduce deterioration of the fundus image D at low cost.

[その他]
上記各実施形態では、眼底カメラ10から眼底Efに対して照明光LSを照射しているが、眼底Efに照射する照明光の形状は特に限定されず、例えばスポット光、ライン光、或いはドット光などの任意形状に変更してもよい。この場合には、受光面44a上の受光領域R2Bの形状を、照明光の形状に合わせて適宜変更してもよい。また、照明光としてスポット光或いはドット光を用いる場合には、光スキャナ30として照明光を2次元偏向可能なものを用いる。
[others]
In each of the above embodiments, the fundus camera 10 irradiates the illumination light LS onto the fundus Ef, but the shape of the illumination light irradiated onto the fundus Ef is not particularly limited and may be changed to any shape, such as spot light, line light, or dot light. In this case, the shape of the light receiving region R2B on the light receiving surface 44a may be appropriately changed to match the shape of the illumination light. In addition, when spot light or dot light is used as the illumination light, an optical scanner 30 capable of two-dimensionally deflecting the illumination light is used.

上記各実施形態では、本発明の検出器としてローリングシャッタ機能を有するCMOS型の撮像素子44を例に挙げて説明したが、公知の各種検出器を用いてもよい。 In each of the above embodiments, a CMOS-type image sensor 44 having a rolling shutter function has been described as an example of a detector of the present invention, but various known detectors may also be used.

上記実施形態では、眼底カメラ10の照明系20、光スキャナ30、受光系40の配置の一例を図1に示したが、これら各部の配置は適宜変更可能である。 In the above embodiment, an example of the arrangement of the illumination system 20, the optical scanner 30, and the light receiving system 40 of the fundus camera 10 is shown in FIG. 1, but the arrangement of each of these parts can be changed as appropriate.

上記各実施形態では、被検眼Eの眼底Efを撮影する眼底カメラ10を例に挙げて説明したが、被検眼Eの他の被観察部位(例えば前眼部Ea)を観察する眼科装置であって且つ照明系20と受光系40とが分かれている各種眼科装置に本発明を適用可能である。 In each of the above embodiments, a fundus camera 10 that photographs the fundus Ef of the subject's eye E has been described as an example, but the present invention can be applied to various ophthalmic devices that observe other observed parts of the subject's eye E (e.g., the anterior segment Ea) and in which the illumination system 20 and the light receiving system 40 are separate.

10 眼底カメラ
12 カメラヘッド
14 操作部
16 表示部
18 制御装置
20 照明系
22 光源
24 虹彩絞り
26 スリット開口絞り
28 照明系レンズ
30 光スキャナ
31 レンズ
34 光路分割材
36 フォーカス光学系
38 対物レンズ
40 受光系
42 受光系レンズ
44 撮像素子
44a 受光面
50 照明制御部
52 偏向制御部
54 撮像制御部
56 信号取得部
58 画像生成部
59 画像処理部
64 表示制御部
D 眼底像
E 被検眼
Ea 前眼部
Ef 眼底
L 赤外光
LB 戻り光
LS 照明光
ND 理想状態
R1A 照明領域
R1B 入射領域
R2A 撮像範囲
R2B 受光領域
10 Fundus camera 12 Camera head 14 Operation unit 16 Display unit 18 Control device 20 Illumination system 22 Light source 24 Iris diaphragm 26 Slit aperture diaphragm 28 Illumination system lens 30 Optical scanner 31 Lens 34 Optical path splitting material 36 Focus optical system 38 Objective lens 40 Light receiving system 42 Light receiving system lens 44 Image sensor 44a Light receiving surface 50 Illumination control unit 52 Deflection control unit 54 Imaging control unit 56 Signal acquisition unit 58 Image generation unit 59 Image processing unit 64 Display control unit D Fundus image E Eye to be examined Ea Anterior eye portion Ef Fundus L Infrared light LB Return light LS Illumination light ND Ideal state R1A Illumination area R1B Incident area R2A Imaging range R2B Light receiving area

Claims (6)

被検眼の被観察部位の一部に照明光を照射する照明系と、
前記照明系から前記被観察部位に照射される前記照明光を偏向して、前記被観察部位内で前記照明光の照明領域を移動させる光スキャナと、
前記光スキャナが前記照明光を偏向している間、前記照明光の偏向に応じて前記被観察部位内で移動する前記照明領域からの戻り光を受光する受光系と、
を備え、
前記照明系及び前記受光系の双方の歪曲収差が同一の種類である眼科装置。
an illumination system for irradiating a part of an observation site of a subject's eye with illumination light;
an optical scanner that deflects the illumination light irradiated from the illumination system onto the observation site to move an illumination area of the illumination light within the observation site;
a light receiving system that receives return light from the illumination area that moves within the subject area in response to the deflection of the illumination light while the optical scanner is deflecting the illumination light;
Equipped with
An ophthalmic apparatus in which the distortion aberration of both the illumination system and the light receiving system is the same type.
前記双方の歪曲収差の差が、予め定められた閾値以下である請求項1に記載の眼科装置。 The ophthalmic device according to claim 1, wherein the difference between the two distortion aberrations is equal to or less than a predetermined threshold value. 前記双方の歪曲収差が、樽型又は糸巻型である請求項1又は2に記載の眼科装置。 The ophthalmic device according to claim 1 or 2, wherein both of the distortions are barrel-shaped or pincushion-shaped. 前記照明系の光軸に垂直で且つ互いに直交する方向を第1方向及び第2方向とした場合に、前記照明系が、前記照明光として前記第1方向に平行なスリット光を前記被観察部位に照射し、
前記光スキャナが、前記スリット光を前記第2方向に偏向する請求項1から3のいずれか1項に記載の眼科装置。
When directions perpendicular to an optical axis of the illumination system and perpendicular to each other are defined as a first direction and a second direction, the illumination system irradiates the observation site with a slit light parallel to the first direction as the illumination light,
The ophthalmic apparatus according to claim 1 , wherein the optical scanner deflects the slit light in the second direction.
前記受光系が、前記戻り光が入射する受光面を有する検出器であって、且つ前記照明領域の移動に応じて前記受光面内で移動する前記スリット光の入射領域に対して、前記受光面内で前記戻り光を検出する局所的な受光領域であって且つ前記第1方向に平行な矩形状の受光領域を追従させながら、前記受光領域での前記戻り光の検出を連続して行う検出器を備え、
前記受光領域の前記第2方向の幅が、前記入射領域の前記第2方向の幅よりも広い請求項4に記載の眼科装置。
the light receiving system includes a detector having a light receiving surface on which the return light is incident, the detector being a local light receiving area that detects the return light within the light receiving surface, the light receiving area being a rectangular light receiving area parallel to the first direction, the light receiving area being tracked by the incident area of the slit light that moves within the light receiving surface in response to the movement of the illumination area, and the detector continuously detects the return light in the light receiving area,
The ophthalmic apparatus according to claim 4 , wherein the width of the light receiving area in the second direction is greater than the width of the incident area in the second direction.
前記受光系が受光した前記戻り光の受光信号に基づき、前記被観察部位の観察像を生成する画像生成部を備える請求項1から5のいずれか1項に記載の眼科装置。 The ophthalmic device according to any one of claims 1 to 5, further comprising an image generating unit that generates an observation image of the observed area based on a light receiving signal of the return light received by the light receiving system.
JP2021061307A 2021-03-31 2021-03-31 Ophthalmic Equipment Active JP7565851B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2021061307A JP7565851B2 (en) 2021-03-31 2021-03-31 Ophthalmic Equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2021061307A JP7565851B2 (en) 2021-03-31 2021-03-31 Ophthalmic Equipment

Publications (2)

Publication Number Publication Date
JP2022157209A JP2022157209A (en) 2022-10-14
JP7565851B2 true JP7565851B2 (en) 2024-10-11

Family

ID=83560114

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021061307A Active JP7565851B2 (en) 2021-03-31 2021-03-31 Ophthalmic Equipment

Country Status (1)

Country Link
JP (1) JP7565851B2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009538697A (en) 2006-05-31 2009-11-12 インディアナ・ユニバーシティ・リサーチ・アンド・テクノロジー・コーポレーション Laser scanning digital camera with simple optical system and multiple scattered light imaging function
WO2020179522A1 (en) 2019-03-04 2020-09-10 株式会社ニデック Scanning ophthalmic imaging device, and ophthalmic imaging program
WO2021049226A1 (en) 2019-09-11 2021-03-18 株式会社トプコン Ophthalmic device and ophthalmic system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2802758B2 (en) * 1988-05-31 1998-09-24 キヤノン株式会社 Ophthalmic image correction device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009538697A (en) 2006-05-31 2009-11-12 インディアナ・ユニバーシティ・リサーチ・アンド・テクノロジー・コーポレーション Laser scanning digital camera with simple optical system and multiple scattered light imaging function
WO2020179522A1 (en) 2019-03-04 2020-09-10 株式会社ニデック Scanning ophthalmic imaging device, and ophthalmic imaging program
WO2021049226A1 (en) 2019-09-11 2021-03-18 株式会社トプコン Ophthalmic device and ophthalmic system

Also Published As

Publication number Publication date
JP2022157209A (en) 2022-10-14

Similar Documents

Publication Publication Date Title
JP5179102B2 (en) Scanning laser ophthalmoscope and wide-angle lens attachment for scanning laser ophthalmoscope
US8545019B2 (en) Fundus camera
JP2018061621A (en) Fundus image capturing apparatus, fundus image capturing method, and fundus image capturing program
EP3856004B1 (en) Slit-scanning fundus imager enhancements
JP5038703B2 (en) Ophthalmic equipment
JP7580450B2 (en) Ophthalmic Equipment
JP7565851B2 (en) Ophthalmic Equipment
JP6102369B2 (en) Fundus photographing device
JP7476857B2 (en) Fundus photography device
JP7098964B2 (en) Fundus photography device
JP7593864B2 (en) Ophthalmic device and control method thereof
JP2022157207A (en) Ophthalmic device and its control method
JP2022022242A (en) Fundus photography device
JP7468162B2 (en) Fundus image processing program and fundus photographing device
JP7667675B2 (en) Ophthalmic Equipment
JP6562731B2 (en) Ophthalmic equipment
KR102852217B1 (en) Scanning laser ophthalmoscope having 2-dimensional image sensor
US20230014194A1 (en) Ophthalmic apparatus, method of controlling same, and recording medium
JP7786915B2 (en) ophthalmology equipment
CN115279255B (en) Ophthalmic device, control method thereof, and recording medium
US20240049962A1 (en) Ophthalmic apparatus and ophthalmic information processing apparatus
WO2024195637A1 (en) Ophthalmic device
WO2025249316A1 (en) Fundus imaging apparatus, vision test apparatus, and image projection apparatus
CN119908650A (en) Ophthalmic device and control method thereof, computer program product and storage medium
JP2021145897A (en) Ophthalmologic apparatus, control method thereof, and program

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20240202

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20240816

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20240909

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20241001

R150 Certificate of patent or registration of utility model

Ref document number: 7565851

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150