JP7553191B2 - 基板搬送システムの制御方法及び基板搬送システム - Google Patents
基板搬送システムの制御方法及び基板搬送システム Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims description 110
- 238000000034 method Methods 0.000 title claims description 21
- 230000005540 biological transmission Effects 0.000 claims description 57
- 230000007723 transport mechanism Effects 0.000 claims description 55
- 238000005259 measurement Methods 0.000 claims description 31
- 230000007246 mechanism Effects 0.000 claims description 30
- 238000001514 detection method Methods 0.000 claims description 21
- 238000006073 displacement reaction Methods 0.000 claims description 15
- 230000001133 acceleration Effects 0.000 claims description 7
- 238000012545 processing Methods 0.000 description 32
- 238000012546 transfer Methods 0.000 description 32
- 230000032258 transport Effects 0.000 description 25
- 238000010586 diagram Methods 0.000 description 12
- 238000012937 correction Methods 0.000 description 10
- 230000008569 process Effects 0.000 description 9
- 239000007787 solid Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000004380 ashing Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
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- 238000005530 etching Methods 0.000 description 1
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- 230000012447 hatching Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
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- H01L21/67718—Changing orientation of the substrate, e.g. from a horizontal position to a vertical position
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- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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Description
一実施形態に係る基板処理システム1の全体構成の一例について、図1を用いて説明する。図1は、一実施形態に係る基板処理システム1の構成を示す平面図の一例である。なお、図1では、基板Wにドットのハッチングを付して図示している。なお、以下の説明において、搬送機構5の第3アーム53に基板Wを保持して、真空搬送室3から処理室4の載置部41に基板Wを搬送するものとして説明する。
次に、搬送機構5について、図2及び図3を用いて更に説明する。図2は、搬送機構5の斜視図の一例である。図3は、搬送機構5の構成を説明する模式図の一例である。
1 基板処理システム
2 ロードロック室
3 真空搬送室
4 処理室
41 載置部
5 搬送機構
50 基台部
51 第1アーム
52 第2アーム
53 第3アーム
54 第4アーム
55,56,57 回転軸
6,6a,6b センサ(計測部)
7 制御装置
71 熱膨張量推定部
72 角度伝達誤差推定部
73 角度誤差方向推定部
74 目標位置補正部
81~84 温度センサ(温度検出部)
91,94,97 モータ
92,93,95,96,98,99 ギア(動力伝達機構)
91a,94a,97a 角度センサ
Claims (5)
- 基板を保持する保持部と、回転可能に連結されたアームと、複数のギアを含む動力伝達機構を介して前記アームを回転させる駆動源と、を有し、前記基板を搬送する搬送機構と、
前記搬送機構によって搬送される前記基板の外縁を検出し、前記基板の中心位置を計測する計測部と、を備え、目標位置に前記基板を搬送する基板搬送システムの制御方法であって、
前記保持部の基準位置と前記計測部で計測された前記基板の中心位置とのずれ量と、前記計測部で前記基板の外縁を検出する計測位置における前記搬送機構の熱膨張による前記保持部の基準位置の熱変位量と、前記基板を搬送する目標位置における前記搬送機構の熱膨張による前記保持部の基準位置の熱変位量と、に基づいて、前記目標位置を補正し、
前記保持部の基準位置が補正された前記目標位置となるように前記搬送機構を制御し、
前記保持部の基準位置の熱変位量は、前記アームの温度に基づいて推定される前記アームの熱膨張量と、前記動力伝達機構の温度に基づいて推定される前記動力伝達機構の角度伝達誤差量と、前記駆動源の加減速状態に基づいて推定される前記角度伝達誤差の方向と、に基づいて推定され、
前記角度伝達誤差量は、基準温度における前記ギアの軸間距離である基準軸間距離に基づいて推定される、
基板搬送システムの制御方法。 - 前記角度伝達誤差量は、前記ギアの温度、前記ギアの熱膨張差分、前記基準軸間距離に基づいて推定される、
請求項1に記載の基板搬送システムの制御方法。 - 前記角度伝達誤差量は、前記ギアのバックラッシュに基づく、
請求項1または請求項2に記載の基板搬送システムの制御方法。 - 前記搬送機構は、
前記搬送機構の温度を検出する温度検出部を有する、
請求項1乃至請求項3のいずれか1項に記載の基板搬送システムの制御方法。 - 基板を保持する保持部と、回転可能に連結されたアームと、複数のギアを含む動力伝達機構を介して前記アームを回転させる駆動源と、を有し、前記基板を搬送する搬送機構と、
前記搬送機構によって搬送される前記基板の外縁を検出し、前記基板の中心位置を計測
する計測部と、
前記搬送機構を制御する制御部と、を備え、
前記制御部は、
前記保持部の基準位置と前記計測部で計測された前記基板の中心位置とのずれ量と、前
記計測部で前記基板の外縁を検出する計測位置における前記搬送機構の熱膨張による前記
保持部の基準位置の熱変位量と、前記基板を搬送する目標位置における前記搬送機構の熱
膨張による前記保持部の基準位置の熱変位量と、に基づいて、前記目標位置を補正し、
前記保持部の基準位置が補正された前記目標位置となるように前記搬送機構を制御し、
前記保持部の基準位置の熱変位量は、前記アームの温度に基づいて推定される前記アームの熱膨張量と、前記動力伝達機構の温度に基づいて推定される前記動力伝達機構の角度伝達誤差量と、前記駆動源の加減速状態に基づいて推定される前記角度伝達誤差の方向と、に基づいて推定され、
前記角度伝達誤差量は、基準温度における前記ギアの軸間距離である基準軸間距離に基づいて推定される、
基板搬送システム。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020146296A JP7553191B2 (ja) | 2020-08-31 | 2020-08-31 | 基板搬送システムの制御方法及び基板搬送システム |
| CN202110949142.2A CN114121740B (zh) | 2020-08-31 | 2021-08-18 | 基板输送系统的控制方法和基板输送系统 |
| KR1020210109379A KR102611093B1 (ko) | 2020-08-31 | 2021-08-19 | 기판 반송 시스템의 제어 방법 및 기판 반송 시스템 |
| US17/410,241 US12211719B2 (en) | 2020-08-31 | 2021-08-24 | Method of controlling substrate transfer system and the substrate transfer system |
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| JP2020146296A JP7553191B2 (ja) | 2020-08-31 | 2020-08-31 | 基板搬送システムの制御方法及び基板搬送システム |
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| JP2022041221A JP2022041221A (ja) | 2022-03-11 |
| JP7553191B2 true JP7553191B2 (ja) | 2024-09-18 |
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| CN115976485B (zh) * | 2022-12-19 | 2025-08-05 | 苏州迈为科技股份有限公司 | 动态镀膜装置及其动态镀膜方法 |
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| Publication number | Publication date |
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| CN114121740A (zh) | 2022-03-01 |
| US20220068683A1 (en) | 2022-03-03 |
| US12211719B2 (en) | 2025-01-28 |
| JP2022041221A (ja) | 2022-03-11 |
| CN114121740B (zh) | 2025-01-14 |
| KR102611093B1 (ko) | 2023-12-08 |
| KR20220029401A (ko) | 2022-03-08 |
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