JP7366051B2 - 硬化性シリコーン組成物及びその硬化物、積層体及びその製造方法、並びに光学装置又は光学ディスプレイ - Google Patents
硬化性シリコーン組成物及びその硬化物、積層体及びその製造方法、並びに光学装置又は光学ディスプレイ Download PDFInfo
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Description
(A)一分子中に少なくとも2個の炭素原子数2~12のアルケニル基を有するオルガノポリシロキサン、
(B)一分子中に少なくとも2個のケイ素結合水素原子を有するオルガノハイドロジェンポリシロキサン、
(C)ヒドロシリル化反応用触媒、及び
(D)一分子中に2個以上のアルコキシシリル基を有する有機化合物
を含む、硬化性シリコーン組成物であって、
(B)成分の含有量は、(A)成分中の脂肪族不飽和炭素-炭素結合1モルに対して、(B)成分中のケイ素結合水素原子が0.5~2モルとなる量であり、
i)ポリエーテル化合物の含有量が、硬化性シリコーン組成物の合計量に対して0.1質量%以下であり、かつ、
ii)エポキシ基及びアルコキシシリル基を有する化合物の含有量が、硬化性シリコーン組成物の合計量に対して0.1質量%以下である、
硬化性シリコーン組成物によって達成される。
(a1)一分子中に少なくとも2個の炭素原子数2~12のアルケニル基を有する直鎖状又は部分分岐状オルガノポリシロキサン
(a2)平均単位式:(R1 3SiO1/2)a(R1 2SiO2/2)b(R1SiO3/2)c(SiO4/2)d(式中、R1はそれぞれ独立に炭素原子数1~12の一価炭化水素基であり、R1の少なくとも1モル%は炭素原子数2~12のアルケニル基であり、a、b、c及びdは次の条件を全て満たす:a+b+c+d=1、0≦a≦0.8、0≦b≦0.4、0≦c≦0.8、0≦d≦0.6、0.2≦c+d≦0.8)で表される、アルケニル基を有するオルガノポリシロキサン
を含み、
(B)成分は以下の(b1)成分及び(b2)成分:
(b1)分子鎖末端にケイ素結合水素原子を有する直鎖状又は部分分岐状のオルガノハイドロジェンポリシロキサン
(b2)平均単位式:(R2 3SiO1/2)e(R2 2SiO2/2)f(R2SiO3/2)g(SiO4/2)h(式中、R2はそれぞれ独立にアルケニル基を除く炭素原子数1~12の一価炭化水素基又は水素原子であり、R2の少なくとも1モル%は水素原子であり、e、f、g及びhは次の条件を全て満たす:e+f+g+h=1、0≦e≦0.8、0≦f≦0.4、0≦g≦0.7、0≦h≦0.5、0.2≦g+h≦0.7)で表される、オルガノハイドロジェンポリシロキサン
を含むことが好ましい。
(b2)成分の含有量が、硬化性シリコーン組成物の硬化反応により不揮発性の固形分を形成する成分の和に対して0~2.0質量%の範囲であることがより好ましい。
(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化反応用触媒、
(c2)高エネルギー線の照射により活性を示すヒドロシリル化反応用触媒、及び
(c3)(c1)成分と(c2)成分の組み合わせであるヒドロシリル化反応用触媒
からなる群から選択されることが好ましい。
分子鎖末端に2個のアルコキシシリル基を有する有機化合物を含むことが好ましい。
第1の透明又は不透明な光学部材と、第2の透明又は不透明な光学部材との間に配置された本発明の硬化物からなる接着層と、を備える積層体にも関する。
基材と、
前記基材に配置された光学素子と、
前記光学素子の少なくとも一部を封止する本発明の硬化物と、を備える光学装置にも関する。
本発明の積層体を備える光学ディスプレイにも関する。
本発明の高エネルギー線の照射なしで活性を示すヒドロシリル化触媒を少なくとも含有する硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置し、前記二つの光学部材を前記硬化性シリコーン組成物を介して貼り合わせる配置工程、及び放置若しくは加熱して前記組成物のヒドロシリル化反応を進行させて前記組成物を硬化させる硬化工程を含む、積層体の製造方法にも関する。なお、本発明の積層体を構成する光学部材は、平面状の広がりを有する板状部分を備えていることが一般的であり、当該板状部位または部材自身が湾曲していてもよく、部材の用途に由来する三次元的な凹凸を備えていてもよい。また、光学部材の両面に配置された硬化物であって他の光学部材との貼り合わせに使用されない硬化物は、接着面として剥離層や他の部材への接合に用いることができる。
高エネルギー線照射、放置若しくは加熱して前記組成物のヒドロシリル化反応を進行させて前記組成物を硬化させる硬化工程を含む、積層体の製造方法にも関する。
以下、まずは本発明の硬化性シリコーン組成物(以下、「本組成物」と称することがある。)について詳細に説明する。
(a1)一分子中に少なくとも2個の炭素原子数2~12のアルケニル基を有する直鎖状又は部分分岐状のオルガノポリシロキサン
(a2)平均単位式:(R1 3SiO1/2)a(R1 2SiO2/2)b(R1SiO3/2)c(SiO4/2)d(式中、R1はそれぞれ独立に炭素原子数1~12の一価炭化水素基であり、R1の少なくとも1モル%は炭素原子数2~12のアルケニル基であり、a、b、c及びdは次の条件を全て満たす:a+b+c+d=1、0≦a≦0.8、0≦b≦0.4、0≦c≦0.8、0≦d≦0.6、0.2≦c+d≦0.8)で表される、アルケニル基を有するオルガノポリシロキサン
を含む。
(ViMe2SiO1/2)0.1(Me3SiO1/2)0.4(SiO4/2)0.5
(ViMe2SiO1/2)0.1(Me3SiO1/2)0.5(SiO4/2)0.4
(ViMe2SiO1/2)0.05(Me3SiO1/2)0.55(SiO4/2)0.4
(ViMe2SiO1/2)0.1(Me3SiO1/2)0.4(PhSiO3/2)0.1(SiO4/2)0.4
(ViMe2SiO1/2)0.046(Me3SiO1/2)0.394(SiO4/2)0.56
(ViMe2SiO1/2)0.25(PhSiO3/2)0.75
が例示される。なお、上式中Meはメチル基であり、Phはフェニル基であり、Viはビニル基である。
(b1)分子鎖末端にケイ素結合水素原子を有する直鎖状又は部分分岐状オルガノハイドロジェンポリシロキサン
(b2)平均単位式:(R2 3SiO1/2)e(R2 2SiO2/2)f(R2SiO3/2)g(SiO4/2)h(式中、R2はそれぞれ独立にアルケニル基を除く炭素原子数1~12の一価炭化水素基又は水素原子であり、R2の少なくとも1モル%は水素原子であり、e、f、g及びhは次の条件を全て満たす:e+f+g+h=1、0≦e≦0.8、0≦f≦0.4、0≦g≦0.7、0≦h≦0.5、0.2≦g+h≦0.7)で表される、オルガノハイドロジェンポリシロキサン
を含む。
(HMe2SiO1/2)0.6(SiO4/2)0.4
(HMe2SiO1/2)0.3(Me3SiO1/2)0.3(SiO4/2)0.4
(HMe2SiO1/2)0.5(Me3SiO1/2)0.05(SiO4/2)0.4
(HMe2SiO1/2)0.5(PhSiO3/2)0.1(SiO4/2)0.4
(HMe2SiO1/2)0.6(PhSiO3/2)0.4
(HMe2SiO1/2)0.75(PhSiO3/2)0.25
が例示される。なお、上式中Meはメチル基であり、Phはフェニル基である。
(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化反応用触媒、
(c2)高エネルギー線の照射により活性を示すヒドロシリル化反応用触媒、及び
(c3)(c1)成分と(c2)成分の組み合わせであるヒドロシリル化反応用触媒
からなる群から選択されるものを使用することが好ましい。
(MeO)3SiCH2CH2(Me)2Si-O-SiMe(CH2CH2Si(OMe)3)-O-Si(Me)2CH2CH2Si(OMe)3
である(上式中、Meはメチル基である)。
XO-(C2H4O)p(CnH2nO)q(YO)r-X
で表されるポリオキシアルキレン化合物である。
X2O(C2H4O)p[CH2CH(Me)O]qX2
X3O(C2H4O)p[CH2CH(Me)O]qX3
X4O(C2H4O)p[CH2CH(Me)O]qX4
X2O(C2H4O)p[CH2CH(Me)O]qX1
X3O(C2H4O)p[CH2CH(Me)O]qX1
X4O(C2H4O)p[CH2CH(Me)O]qX1
X5O(C2H4O)p[CH2CH(Me)O]qX1
X5O(C2H4O)p[CH2CH(Me)O]qX2
X5O(C2H4O)p[CH2CH(Me)O]qX4
X2O(C2H4O)pX2
X3O(C2H4O)pX3
X4O(C2H4O)pX4
X2O(C2H4O)pX1
X3O(C2H4O)pX1
X4O(C2H4O)pX1
X5O(C2H4O)pX1
X5O(C2H4O)pX2
X5O(C2H4O)pX4
X2O(C2H4O)p-p-C6H4-C9H19
X3O(C2H4O)p-p-C6H4-C9H19
X4O(C2H4O)p-p-C6H4-C9H19
X2O(C2H4O)p-C6H5
X3O(C2H4O)p-C6H5
X4O(C2H4O)p-C6H5
X2O(C2H4O)p-p-C6H4-CMe2-p-C6H4-O(C2H4O)pX2
X3O(C2H4O)p-p-C6H4-CMe2-p-C6H4-O(C2H4O)pX3
X4O(C2H4O)p-p-C6H4-CMe2-p-C6H4-O(C2H4O)pX4
次に、本発明の硬化物について詳細に説明する。
図1は、本発明の実施形態の積層体を示す断面図である。本発明の実施形態の積層体1は、第1の光学部材20と、第2の光学部材21と、2つの光学部材20、21の間に配置された本硬化物からなる接着層15と、を備えている。積層体1では、2つの光学部材20、21が接着層15により接着されている。これらの光学部材は透明であっても、不透明であってもよく、一方又は両方の光学部材が、単独の基材であってもよく、バックライトユニットのようにそれ自体が独立した積層体である光学部材であってもよい。なお、本発明の積層体を構成する光学部材は、平面状の広がりを有する板状部分を備えていることが一般的であり、当該板状部位または部材自身が湾曲していてもよく、部材の用途に由来する三次元的な凹凸を備えていてもよい。
工程i):前記(c2)高エネルギー線の照射により活性を示すヒドロシリル化触媒を少なくとも含有する上記の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置する工程S1
工程ii):工程i)で配置された前記組成物に高エネルギー線照射を行い、当該組成物を非流動性の半硬化状態にする工程S21
工程iii):工程ii)の後、前記二つの光学部材を半硬化状態の前記硬化性シリコーン組成物を介して貼り合わせる工程S3
工程iv):工程iii)で貼り合わせた前記二つの光学部材を、15~80℃の温度範囲で前記組成物のヒドロシリル化反応を進行させ、前記組成物を本硬化させる工程S22
工程i):前記(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化触媒と、前記(c2)の高エネルギー線の照射により活性を示すヒドロシリル化触媒との両方を含有する上記の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置する工程S1であって、少なくとも一方の部材として透明な光学部材を用いる工程
工程ii):工程i)で配置された前記組成物を室温で放置若しくは加熱して前記組成物のヒドロシリル化反応を進行させ、当該組成物を非流動性の半硬化状態にする工程S21
工程iii):工程ii)の後、前記二つの光学部材を半硬化状態の前記硬化性シリコーン組成物を介して貼り合わせる工程S3
工程iv):工程iii)で貼り合わせた前記二つの光学部材について、前記透明な光学部材を通して、前記硬化性シリコーン組成物に高エネルギー線照射を行った後、15~80℃の温度範囲で半硬化状態の前記組成物のヒドロシリル化反応を進行させ、前記組成物を本硬化させる工程S22
工程i):(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化触媒を少なくとも含有する上記の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置する工程S1
工程ii):工程i)で配置された前記組成物を15~80℃の温度範囲で前記組成物のヒドロシリル化反応を進行させ、当該組成物を非流動性の半硬化状態にする工程S21
工程iii):工程ii)の後、前記二つの光学部材を半硬化状態の前記硬化性シリコーン組成物を介して貼り合わせる工程S3
工程iv):工程iii)で貼り合わせた前記二つの光学部材を、さらに、15~80℃の温度範囲で半硬化状態の前記組成物のヒドロシリル化反応を進行させ、前記組成物を本硬化させる工程S22
本発明の実施形態の光学装置(以下、「本光学装置」と称することがある。)は、基材と、基材に配置された光学素子と、光学素子の少なくとも一部を封止する本硬化物と、を備えている。
本組成物を加熱することによりヒドロシリル化反応を進行させた組成物を得てから基材に配置された光学素子上に加熱後の組成物を配置する配置工程S1、又は
基材に配置された光学素子上に本組成物を配置してから本組成物を加熱することによりヒドロシリル化反応を進行させた組成物を得る加熱工程のいずれか1つを含み、
高エネルギー線を照射して加熱後の組成物を硬化させる硬化工程をさらに含む。
図8は、本発明の実施形態の光学ディスプレイを示す断面図である。本発明の実施形態の光学ディスプレイ200は、上記の積層体1と、画像表示パネル201と、を備えている。
前記前面パネルの前記表示面に対向する面に設けられ、透明導電膜が形成された面を有するシールド基板をさらに備え、
前記透明導電膜と前記ベゼルとが導電性材料を介して電気的に接続された構造を備えた表示装置であってよい。
当該表示装置は、前記表示面と前面パネルとの間が実質的に透明な光学弾性体樹脂部材又は光学ゲル状樹脂部材により充填された構造を備えた表示装置であることが好ましい。このような光学弾性体樹脂部材又は光学ゲル状樹脂部材をOCRとして、オプティカルボンディングに用いることで、当該表示装置の表示性能及び耐久性を改善し、高信頼性の表示装置を提供できる。
回転粘度計(トキメック株式会社製のE型粘度計VISCONIC EMD)を使用して、25℃における粘度(mPa・s)を測定した。
厚みが10mm以上の硬化性シリコーン組成物をシャーレ中、25℃で48時間放置して硬化させ、針入度測定装置(離合社製のRPM-201)を使用して、25℃における針入度を測定した。流動性がある場合は、未硬化と判定した。
2枚のガラス板(縦75mm×横25mm×厚さ2mm)の間に、硬化後のシリコーン硬化物の寸法が縦25mm×横25mm×厚さ200μmとなるように硬化性シリコーン組成物を充填し、室温で2時間及び48時間加熱することにより、前記組成物を硬化させ、2枚のガラス板に挟まれた硬化物からなる試験体を作製した。この試験体を、JIS K6850に規定される方法に準じてせん断接着試験を行ない、硬化物のせん断接着強度を測定した。
2枚のガラス板(縦75mm×横25mm×厚さ2mm)の間に、硬化後のシリコーン硬化物の寸法が縦25mm×横25mm×厚さ200μmとなるように硬化性シリコーン組成物を充填した試験体を、25℃で48時間放置した。硬化したものについては、恒温恒湿オーブンで85℃85%相対湿度の条件で500時間試験体を放置し、オーブンから取り出して、24時間室温で放置した後に目視で濁りの有無を判定した。いくつかの例については、着色度b*の測定を同じ試験体で行った。
2枚のガラス板(縦75mm×横25mm×厚さ2mm)の間に、硬化後のシリコーン硬化物の寸法が縦25mm×横25mm×厚さ200μmとなるように硬化性シリコーン組成物を充填し、40℃のオーブン中で1時間加熱することにより、前記組成物を硬化させ、2枚のガラス板に挟まれた硬化物からなる試験体を作製した。この試験体を、JIS K6850に規定される方法に準じてせん断接着試験を行ない、接着強度を測定した。同時に、硬化物の厚みに対する破断時変形量の割合を伸び率(%)として記録した。
いくつかの例について、レオメーターAR550で下記に定義するポットライフ、非流動化時間、ゲル化時間を測定した。
ポットライフ:25℃での2倍粘度到達時間
非流動化時間:25℃での貯蔵弾性率1KPa到達時間
ゲル化時間:25℃での損失正接1到達時間
いくつかの例について、下記条件での耐久性試験を行い、上記の針入度、せん断接着強度、せん断接着伸び率、着色度b*を測定した。
高温保持試験:85℃、1000時間
低温保持試験:-40℃、1000時間
冷熱サイクル試験:-40℃~125℃、500サイクル
温湿度保持試験:60℃、90%RH、1000時間
紫外線試験:1.55W/m2、340nm、300時間
下記の成分を用いて、表1に示す組成(質量部)の硬化性シリコーン組成物を調製した。各構造式において、Meはメチル基であり、Viはビニル基であり、Phはフェニル基であり、Epはエポキシ基である。
a1-1:ViMe2SiO(SiMe2O)232OSiMe2Vi
a1-2:ViMe2SiO(SiMe2O)372OSiMe2Vi
a1-3:ViMe2SiO(SiMe2O)233(SiMePhO)24OSiMe2Vi
a1-4:ViMe2SiO(SiMePhO)31OSiMe2Vi
a2-1:(ViMe2SiO1/2)0.046(Me3SiO1/2)0.394(SiO4/2)0.56
b1-1:HMe2SiO(SiMe2O)24OSiMe2H
b1-2:Ph2Si(OSiMe2H)2
b2-1:(HMe2SiO1/2)0.63(SiO4/2)0.37
b2-2:(HMe2SiO1/2)0.60(PhSiO3/2)0.40
c1-1:白金 1,3―ジビニル-1,1,3,3-テトラメチルジシロキサン錯体
c2-1:(メチルシクロペンタジエニル)トリメチル白金(IV)
d1-1:1,6-ビス(トリメトキシシリル)ヘキサン
d1-2:1,3-ビス(トリメトキシシリルエチル)テトラメチルジシロキサン
d1-1(比較成分):3-グリシドキシプロピルトリメトキシシラン
d1’-2(比較成分):3-メタクリロキシプロピルトリメトキシシラン
d1’-3(比較成分):5-ヘキセニルトリメトキシシラン
d1’-4(比較成分):デシルトリメトキシシラン
d1’-5(比較成分):多摩化学工業(株)製シリケート40(テトラメチルオルトシリケート縮合物)
任意成分-1:Me3SiO(SiMe2O)450(SiMePhO)40OSiMe3
任意成分-2:(ViMe2SiO1/2)0.18(EPMeSiO2/2)0.29(PhSiO3/2)0.53
ポリエーテル成分-1:CH2=C(Me)-CH2O(CH2CH2O)34(CH2CHMeO)26CH2-C(Me)=CH2
15 接着層
20 第1の光学部材
20a 接着面
20b 面
21 第2の光学部材
21a 面
21b 面
100、100A LED
101、101B、101G、101R LED素子(光学素子)
102 リードフレーム(基材)
103 透明層104 ボンディングワイヤ
105 枠材
106 本硬化物
110 表示パネル
111 表示面
120 ベゼル
121 枠部
122 開口端
130 前面パネル
140 樹脂部材(ダム)
150 OCR
170、170A 表示モジュール
171 バックライトユニット
172 間隙
173 空間
200 光学ディスプレイ
201 画像表示パネル
300A 光学ディスプレイ
300B 光学ディスプレイ
301 画像表示パネル
301a 面
302 タッチパネル
400 表示装置(光学ディスプレイ)
Claims (19)
- (A)以下の(a1)成分及び(a2)成分を含む、一分子中に少なくとも2個の炭素原子数2~12のアルケニル基を有するオルガノポリシロキサン:
(a1)一分子中に少なくとも2個の炭素原子数2~12のアルケニル基を有する直鎖状又は部分分岐状オルガノポリシロキサン
(a2)平均単位式:(R 1 3 SiO 1/2 ) a (R 1 2 SiO 2/2 ) b (R 1 SiO 3/2 ) c (SiO 4/2 ) d (式中、R 1 はそれぞれ独立に炭素原子数1~12の一価炭化水素基であり、R 1 の少なくとも1モル%は炭素原子数2~12のアルケニル基であり、a、b、c及びdは次の条件を全て満たす:a+b+c+d=1、0≦a≦0.8、0≦b≦0.4、0≦c≦0.8、0≦d≦0.6、0.2≦c+d≦0.8)で表される、アルケニル基を有するオルガノポリシロキサン、
(B)以下の(b1)成分及び(b2)成分を含む、一分子中に少なくとも2個のケイ素結合水素原子を有するオルガノハイドロジェンポリシロキサン:
(b1)分子鎖末端にケイ素結合水素原子を有する直鎖状又は部分分岐状オルガノハイドロジェンポリシロキサン
(b2)平均単位式:(R 2 3 SiO 1/2 ) e (R 2 2 SiO 2/2 ) f (R 2 SiO 3/2 ) g (SiO 4/2 ) h (式中、R 2 はそれぞれ独立にアルケニル基を除く炭素原子数1~12の一価炭化水素基又は水素原子であり、R 2 の少なくとも1モル%は水素原子であり、e、f、g及びhは次の条件を全て満たす:e+f+g+h=1、0≦e≦0.8、0≦f≦0.4、0≦g≦0.7、0≦h≦0.5、0.2≦g+h≦0.7)で表される、オルガノハイドロジェンポリシロキサン、
(C)ヒドロシリル化反応用触媒、及び
(D)一分子中に2個以上のアルコキシシリル基を有する有機化合物
を含む、硬化性シリコーン組成物であって、
(B)成分の含有量は、(A)成分中の脂肪族不飽和炭素-炭素結合1モルに対して、(B)成分中のケイ素結合水素原子が0.5~2モルとなる量であり、
i)ポリエーテル化合物の含有量が、硬化性シリコーン組成物の合計量に対して0.1質量%以下であり、かつ、
ii)エポキシ基及びアルコキシシリル基を有する化合物の含有量が、硬化性シリコーン組成物の合計量に対して0.1質量%以下であり、
(a2)成分の含有量が、硬化性シリコーン組成物の硬化反応により不揮発性の固形分を形成する成分の和に対して0.5~10.0質量%の範囲であり、かつ、
(b2)成分の含有量が、硬化性シリコーン組成物の硬化反応により不揮発性の固形分を形成する成分の和に対して0.01~1.0質量%の範囲である、
硬化性シリコーン組成物。 - (D)成分の含有量が、硬化性シリコーン組成物の合計量に対して0.01~5質量%の範囲である、請求項1に記載の硬化性シリコーン組成物。
- (C)成分が、
(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化反応用触媒、
(c2)高エネルギー線の照射により活性を示すヒドロシリル化反応用触媒、及び
(c3)(c1)成分と(c2)成分の組み合わせであるヒドロシリル化反応用触媒
からなる群から選択される、請求項1から2のいずれか一項に記載の硬化性シリコーン組成物。 - 前記高エネルギー線が、紫外線、ガンマ線、X線、α線、又は電子線から選択される、請求項3に記載の硬化性シリコーン組成物。
- (D)成分が、
(d1)分子鎖末端に2個のアルコキシシリル基を有する有機化合物を含む、請求項1から4のいずれか一項に記載の硬化性シリコーン組成物。 - 25℃における粘度が100,000mPa以下である、請求項1から5のいずれか一項に記載の硬化性シリコーン組成物。
- 光学用接着剤又は光学用粘着剤である、請求項1から6のいずれか一項に記載の硬化性シリコーン組成物。
- 請求項1から7のいずれか一項に記載の硬化性シリコーン組成物の硬化物。
- 25℃における針入度が5~70の範囲である、請求項8に記載の硬化物。
- 第1の透明又は不透明な光学部材と第2の透明又は不透明な光学部材との間に配置された請求項8又は9に記載の硬化物からなる接着層と、を備える積層体。
- 基材と、
前記基材に配置された光学素子と、
前記光学素子の少なくとも一部を封止する請求項8又は9に記載の硬化物と、を備える光学装置。 - 請求項10に記載の積層体を備える光学ディスプレイ。
- 前記(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化触媒を少なくとも含有する請求項3又は4に記載の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置し、前記二つの光学部材を前記硬化性シリコーン組成物を介して貼り合わせる配置工程、及び放置若しくは加熱して前記組成物のヒドロシリル化反応を進行させて前記組成物を硬化させる硬化工程を含む、積層体の製造方法。
- 前記(c2)高エネルギー線の照射により活性を示すヒドロシリル化触媒を少なくとも含有する請求項3又は4に記載の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置し、前記二つの光学部材を前記硬化性シリコーン組成物を介して貼り合わせる配置工程、及び高エネルギー線照射後、放置若しくは加熱して前記組成物のヒドロシリル化反応を進行させて前記組成物を硬化させる硬化工程を含む、積層体の製造方法。
- 以下の工程を有する積層体の製造方法:
工程i):前記(c2)高エネルギー線の照射により活性を示すヒドロシリル化触媒を少なくとも含有する請求項3又は4に記載の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置する工程
工程ii):工程i)で配置された前記組成物に高エネルギー線照射を行い、当該組成物を非流動性の半硬化状態にする工程
工程iii):工程ii)の後、前記二つの光学部材を半硬化状態の前記硬化性シリコーン組成物を介して貼り合わせる工程
工程iv):工程iii)で貼り合わせた前記二つの光学部材を、15~80℃の温度範囲で半硬化状態の前記組成物のヒドロシリル化反応を進行させ、前記組成物を本硬化させる工程。 - 以下の工程を有する積層体の製造方法:
工程i):前記(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化触媒と、前記(c2)高エネルギー線の照射により活性を示すヒドロシリル化触媒との両方を含有する請求項3又は4に記載の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置する工程であって、少なくとも一方の部材として透明な光学部材を用いる工程
工程ii):工程i)で配置された前記組成物を、15~80℃の温度範囲で前記組成物のヒドロシリル化反応を進行させ、当該組成物を非流動性の半硬化状態にする工程
工程iii):工程ii)の後、前記二つの光学部材を半硬化状態の前記硬化性シリコーン組成物を介して貼り合わせる工程
工程iv):工程iii)で貼り合わせた前記二つの光学部材について、前記透明な光学部材を通して、前記硬化性シリコーン組成物に高エネルギー線照射を行った後、15~80℃の温度範囲で半硬化状態の前記組成物のヒドロシリル化反応を進行させ、前記組成物を本硬化させる工程。 - 以下の工程を有する積層体の製造方法:
工程i):(c1)高エネルギー線の照射なしで活性を示すヒドロシリル化触媒を少なくとも含有する請求項3又は4に記載の硬化性シリコーン組成物を二つの光学部材のうち少なくとも一方の部材の一面又は両面に配置する工程
工程ii):工程i)で配置された前記組成物を、15~80℃の温度範囲で前記組成物のヒドロシリル化反応を進行させ、当該組成物を非流動性の半硬化状態にする工程
工程iii):工程ii)の後、前記二つの光学部材を半硬化状態の前記硬化性シリコーン組成物を介して貼り合わせる工程
工程iv):工程iii)で貼り合わせた前記二つの光学部材を、さらに、15~80℃の温度範囲で半硬化状態の前記組成物のヒドロシリル化反応を進行させ、前記組成物を本硬化させる工程。 - 積層体が光学装置である、請求項14から17いずれか一項に記載の積層体の製造方法。
- 積層体が光学ディスプレイである、請求項14から17いずれか一項に記載の積層体の製造方法。
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| PCT/JP2019/040430 WO2020080348A1 (ja) | 2018-10-18 | 2019-10-15 | 硬化性シリコーン組成物及びその硬化物、積層体及びその製造方法、並びに光学装置又は光学ディスプレイ |
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| CN119790108A (zh) | 2022-09-12 | 2025-04-08 | 陶氏东丽株式会社 | 固化性有机硅组合物及其固化物、层叠体以及光学装置或光学显示器 |
| FI131619B1 (en) * | 2022-10-12 | 2025-08-08 | Pibond Oy | Thin films with low dielectric constant, method for producing the same and use thereof |
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| JP2017161779A (ja) | 2016-03-10 | 2017-09-14 | 富士ゼロックス株式会社 | 定着部材、定着装置、及び画像形成装置 |
| WO2018159725A1 (ja) | 2017-03-02 | 2018-09-07 | 東レ・ダウコーニング株式会社 | 硬化性シリコーン組成物、その硬化物、および光学ディスプレイ |
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| US7588967B2 (en) * | 2005-05-27 | 2009-09-15 | Shin-Etsu Chemical Co., Ltd. | Curable silicone rubber composition and semiconductor device |
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| CN102190890B (zh) * | 2010-01-26 | 2015-06-17 | 横滨橡胶株式会社 | 有机硅树脂组合物及其使用方法、有机硅树脂、含有其的结构体、和光半导体元件密封体 |
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| WO2020080348A1 (ja) | 2020-04-23 |
| EP3868834A1 (en) | 2021-08-25 |
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