JP7267215B2 - 搬送装置、処理システム及び搬送方法 - Google Patents
搬送装置、処理システム及び搬送方法 Download PDFInfo
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- JP7267215B2 JP7267215B2 JP2020008497A JP2020008497A JP7267215B2 JP 7267215 B2 JP7267215 B2 JP 7267215B2 JP 2020008497 A JP2020008497 A JP 2020008497A JP 2020008497 A JP2020008497 A JP 2020008497A JP 7267215 B2 JP7267215 B2 JP 7267215B2
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- 238000000034 method Methods 0.000 title claims description 37
- 238000012545 processing Methods 0.000 title claims description 22
- 238000012546 transfer Methods 0.000 claims description 76
- 230000032258 transport Effects 0.000 claims description 54
- 239000000758 substrate Substances 0.000 claims description 46
- 230000001105 regulatory effect Effects 0.000 claims description 14
- 235000012431 wafers Nutrition 0.000 description 145
- 238000007781 pre-processing Methods 0.000 description 11
- 230000033001 locomotion Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000012805 post-processing Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000013404 process transfer Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 238000012864 cross contamination Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67167—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers surrounding a central transfer chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J11/00—Manipulators not otherwise provided for
- B25J11/0095—Manipulators transporting wafers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/0014—Gripping heads and other end effectors having fork, comb or plate shaped means for engaging the lower surface on a object to be transported
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67784—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations using air tracks
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
- Threshing Machine Elements (AREA)
Description
図1を参照し、実施形態の処理システムについて説明する。図1は、実施形態の処理システムの一例を示す図である。
図3~図6を参照し、前述の処理システム1における搬送装置31の一例について説明する。なお、搬送装置11についても搬送装置31と同様の構成であってよい。図3は、搬送装置31の一例を示す上面図である。図4~図6は、搬送装置31の一例を示す断面図であり、図3における一点鎖線A-Bにおいて切断した断面を示す。
図7を参照し、前述の処理システム1において搬送装置31がウエハWを搬送する動作(以下「搬送方法」という。)の一例について説明する。図7は、実施形態の搬送方法の一例を示すフローチャートである。以下の搬送方法は、例えばロードポート50に搬送容器51が載置された際に制御装置100により実行される。
20 プロセスモジュール
31 搬送装置
100 制御装置
410 多関節アーム
420 ピック
430 規制体
431 規制壁
440 押圧保持部
441 押圧体
442 駆動部
450 弾性体
W ウエハ
Claims (14)
- 基板の端部と接触して前記基板を保持する第1の保持部と、
弾性部材により形成され、前記基板の裏面のみと接触して前記基板を保持する第2の保持部と、
制御装置と、
を有する搬送装置であって、
前記制御装置は、前記第1の保持部により前記基板を保持した状態における搬送速度が前記第2の保持部により前記基板を保持した状態における搬送速度よりも大きくなるよう当該搬送装置を制御するように構成される、
搬送装置。 - 前記第1の保持部は、前記第2の保持部により保持される前記基板と接触しない位置に設けられる、
請求項1に記載の搬送装置。 - 前記第1の保持部は、前記第2の保持部が前記基板を保持する位置よりも高い位置で前記基板を保持する、
請求項1又は2に記載の搬送装置。 - 前記第1の保持部は、
前記基板が水平方向に移動しないように規制する規制体と、
前記規制体から離間して設けられ、前記基板の端部に接触自在に移動する押圧体と、
を含む、
請求項1乃至3のいずれか一項に記載の搬送装置。 - 前記第2の保持部は、前記第1の保持部により保持される前記基板と接触しない位置に設けられる、
請求項1乃至4のいずれか一項に記載の搬送装置。 - 前記第1の保持部に保持される前記基板の水平位置と前記第2の保持部に保持される前記基板の水平位置とが異なる、
請求項1乃至5のいずれか一項に記載の搬送装置。 - 前記第1の保持部に保持される前記基板の鉛直位置と前記第2の保持部に保持される前記基板の鉛直位置とが異なる、
請求項1乃至6のいずれか一項に記載の搬送装置。 - 前記基板を搬送する搬送アームに接続されるピックを更に有し、
前記第2の保持部は、前記ピックの上面に設けられる複数のOリングを含む、
請求項1乃至7のいずれか一項に記載の搬送装置。 - 前記第1の保持部は、前記ピックに設けられる、
請求項8に記載の搬送装置。 - 前記第1の保持部は、前記搬送アーム及び前記ピックに設けられる、
請求項8に記載の搬送装置。 - 制御装置を更に有し、
前記制御装置は、前記基板の種類に応じて該基板を前記第1の保持部又は前記第2の保持部により保持するよう当該搬送装置を制御するように構成される、
請求項1乃至10のいずれか一項に記載の搬送装置。 - 大気搬送室内に設けられる、
請求項1乃至11のいずれか一項に記載の搬送装置。 - 内部に基板を収容して該基板に処理を行う処理室と、
前記処理室に収容する前記基板を搬送する搬送装置と、
制御装置と、
を備え、
前記搬送装置は、
基板の端部と接触して前記基板を保持する第1の保持部と、
弾性部材により形成され、前記基板の裏面のみと接触して前記基板を保持する第2の保持部と、
を有し、
前記制御装置は、前記第1の保持部により前記基板を保持した状態における搬送速度が前記第2の保持部により前記基板を保持した状態における搬送速度よりも大きくなるよう前記搬送装置を制御するように構成される、
処理システム。 - 基板を端部で保持可能か否かの情報と前記基板を高速で搬送可能か否かの情報と含む搬送モードを取得するステップと、
取得した前記搬送モードに基づいて、前記基板の端部と接触して前記基板を保持するか又は前記基板の裏面のみと接触して前記基板を保持するかを判定するステップと、
を有する、搬送方法。
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020008497A JP7267215B2 (ja) | 2020-01-22 | 2020-01-22 | 搬送装置、処理システム及び搬送方法 |
| PCT/JP2021/000816 WO2021149551A1 (ja) | 2020-01-22 | 2021-01-13 | 搬送装置、処理システム及び搬送方法 |
| US17/759,117 US12170216B2 (en) | 2020-01-22 | 2021-01-13 | Transfer device, processing system, and transfer method |
| CN202180010362.7A CN114981948B (zh) | 2020-01-22 | 2021-01-13 | 输送装置、处理系统以及输送方法 |
| KR1020227027367A KR102733415B1 (ko) | 2020-01-22 | 2021-01-13 | 반송 장치, 처리 시스템 및 반송 방법 |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020008497A JP7267215B2 (ja) | 2020-01-22 | 2020-01-22 | 搬送装置、処理システム及び搬送方法 |
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| Publication Number | Publication Date |
|---|---|
| JP2021118203A JP2021118203A (ja) | 2021-08-10 |
| JP7267215B2 true JP7267215B2 (ja) | 2023-05-01 |
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| Country | Link |
|---|---|
| US (1) | US12170216B2 (ja) |
| JP (1) | JP7267215B2 (ja) |
| KR (1) | KR102733415B1 (ja) |
| CN (1) | CN114981948B (ja) |
| WO (1) | WO2021149551A1 (ja) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP7625420B2 (ja) * | 2021-01-14 | 2025-02-03 | キヤノン株式会社 | 基板搬送ハンド、基板搬送システム、コンピュータプログラム及び物品の製造方法 |
| KR102665232B1 (ko) * | 2023-06-27 | 2024-05-10 | 브이엠 주식회사 | 기판 이송 장치 |
Citations (3)
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| JP2008244318A (ja) | 2007-03-28 | 2008-10-09 | Tokyo Electron Ltd | 基板搬送部材の洗浄方法、基板搬送装置及び基板処理システム |
| JP2014099542A (ja) | 2012-11-15 | 2014-05-29 | Tokyo Electron Ltd | 基板受渡機構、基板搬送装置及び基板受渡方法 |
| WO2016166952A1 (ja) | 2015-04-15 | 2016-10-20 | 川崎重工業株式会社 | 基板搬送ロボット及びそのエンドエフェクタ |
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| JP2920454B2 (ja) * | 1993-06-10 | 1999-07-19 | 東京エレクトロン株式会社 | 処理装置 |
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- 2021-01-13 KR KR1020227027367A patent/KR102733415B1/ko active Active
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| JP2008244318A (ja) | 2007-03-28 | 2008-10-09 | Tokyo Electron Ltd | 基板搬送部材の洗浄方法、基板搬送装置及び基板処理システム |
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| WO2016166952A1 (ja) | 2015-04-15 | 2016-10-20 | 川崎重工業株式会社 | 基板搬送ロボット及びそのエンドエフェクタ |
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| US20230038276A1 (en) | 2023-02-09 |
| US12170216B2 (en) | 2024-12-17 |
| CN114981948B (zh) | 2025-05-23 |
| JP2021118203A (ja) | 2021-08-10 |
| CN114981948A (zh) | 2022-08-30 |
| KR102733415B1 (ko) | 2024-11-21 |
| WO2021149551A1 (ja) | 2021-07-29 |
| KR20220124778A (ko) | 2022-09-14 |
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